Switching device diagnostic device, switching device diagnostic system, and switching device diagnostic method

Abstract

The switching device diagnostic device (2) includes a section detection unit (22) that detects a section of a measured waveform that indicates the result of measuring the operation of the switching device, the section having a waveform that differs from a reference waveform that is a waveform standard; a section determination unit (23) that performs section determination to determine which section the detected section corresponds to in a waveform that indicates the time from when the switching device starts operating in accordance with a command input to the switching device to when the operation converges; an analysis unit (24) that, when it is determined that the detected section corresponds to a predetermined specific section, performs a first analysis process that includes analysis of a gradient waveform that indicates the gradient of the measured waveform, and, when it is determined that the detected section does not correspond to the specific section, performs a second analysis process that does not include analysis of the gradient waveform; and a factor determination unit (26) that determines the cause of an abnormality in the switching device based on the result of the section determination and the result of the first analysis process or the second analysis process.

Description

[Technical Field]

[0001] The present disclosure relates to a switching device diagnostic device, a switching device diagnostic system, and a switching device diagnostic method for diagnosing a switching device. [Background technology]

[0002] In switching devices such as circuit breakers and disconnectors, the operating characteristics can change over time due to deterioration of the drive source for switching operations or deterioration of the mechanism for switching operations. If there is a change in the operating characteristics, a change will appear in the waveform that shows the relationship between the position of the operating shaft that controls the opening and closing of the contacts and time.

[0003] Patent Document 1 discloses a preventive maintenance method for detecting circuit breaker failures in advance, in which a pass / fail determination is made by monitoring the differential, integral, and instantaneous values ​​of quantities that fluctuate during circuit breaker operation, such as the stroke of the contacts or the control current of the circuit breaker. The method disclosed in Patent Document 1 determines whether the circuit breaker is normal or abnormal by sampling the waveforms of the differential, integral, and instantaneous values ​​at points where there is a difference from the waveform when the circuit breaker is operating normally. Patent Document 1 also describes that a pass / fail determination is made based on the majority rule from the determination results for each of the differential, integral, and instantaneous values. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Publication No. 54-139044 Summary of the Invention [Problem to be solved by the invention]

[0005] In the conventional method disclosed in Patent Document 1, instantaneous values ​​of quantities that fluctuate during circuit breaker operation are acquired, and differential and integral values ​​are calculated from the instantaneous values. When diagnosing switching devices using this method, the differential and integral values ​​must be constantly calculated in order to monitor them. In this case, the need to constantly calculate the differential and integral values ​​creates a problem of a heavy processing load.

[0006] The present disclosure has been made in view of the above, and has an object to provide a switching device diagnostic device that can reduce the processing load. [Means for solving the problem]

[0007] In order to solve the above-mentioned problems and achieve the objectives, the switching device diagnostic device of the present disclosure comprises: a section detection unit that detects sections of a measured waveform that shows the results of measuring the operation of the switching device, where the waveform differs from a reference waveform that is the basis for the waveform; a section determination unit that performs section determination to determine which section the detected section corresponds to in a waveform that represents the time from when the switching device starts operating in accordance with a command input to the switching device to when the operation converges; an analysis unit that, if it is determined that the detected section corresponds to a predetermined specific section, performs a first analysis process that includes analysis of a gradient waveform that represents the gradient of the measured waveform, and, if it is determined that the detected section does not correspond to a specific section, performs a second analysis process that does not include analysis of the gradient waveform; and a factor determination unit that determines the cause of an abnormality in the switching device based on the result of the section determination and the result of the first analysis process or the second analysis process. [Effects of the Invention]

[0008] The switching device diagnostic device according to the present disclosure has an effect of reducing the processing load. [Brief explanation of the drawings]

[0009] [Figure 1] FIG. 1 is a diagram showing a configuration example of a switching device diagnostic system according to a first embodiment; [Figure 2]FIG. 1 is a diagram showing a configuration example of a switching device diagnosis device according to a first embodiment; [Figure 3] FIG. 10 is a diagram showing an example of a measurement waveform acquired when a first phenomenon is a cause of an abnormality in the switching device diagnostic device according to the first embodiment; [Figure 4] FIG. 10 is a diagram showing an example of a measurement waveform acquired when a second phenomenon is a cause of an abnormality in the switching device diagnostic device according to the first embodiment; [Figure 5] FIG. 10 is a diagram showing an example of a measurement waveform acquired when a third phenomenon is a cause of an abnormality in the switching device diagnostic device according to the first embodiment; [Figure 6] FIG. 10 is a diagram showing an example of a measurement waveform acquired when a fourth phenomenon is a cause of an abnormality in the switching device diagnostic device according to the first embodiment; [Figure 7] FIG. 10 is a diagram showing an example of a gradient waveform calculated by a gradient waveform analysis unit of the switching device diagnostic device according to the first embodiment; [Figure 8] FIG. 1 is a first diagram for explaining determination of a cause of an abnormality by the switching device diagnostic device according to the first embodiment; [Figure 9] FIG. 2 is a second diagram for explaining determination of the cause of an abnormality by the switching device diagnostic device according to the first embodiment; [Figure 10] FIG. 3 is a third diagram for explaining determination of the cause of an abnormality by the switching device diagnostic device according to the first embodiment. [Figure 11] 1 is a flowchart showing an example of a processing procedure performed by the switching device diagnosis device according to the first embodiment; [Figure 12] 1 is a flowchart showing an example of a processing procedure performed by the switching device diagnosis device according to the first embodiment; [Figure 13] FIG. 1 is a diagram showing an example of the configuration of a control circuit according to a first embodiment; DETAILED DESCRIPTION OF THE INVENTION

[0010] Hereinafter, a switching device diagnostic device, a switching device diagnostic system, and a switching device diagnostic method according to embodiments will be described in detail with reference to the drawings.

[0011] Embodiment 1 1 is a diagram showing an example of the configuration of a switching device diagnostic system 1 according to Embodiment 1. The switching device diagnostic system 1 includes a switching device diagnostic device 2 and a GUI (Graphical User Interface) 3.

[0012] The switching device diagnostic device 2 and the GUI 3 communicate with each other via a network such as a LAN (Local Area Network). The GUI 3 is an input / output device provided in a control panel of a facility such as a substation or a switchyard. In the first embodiment, the GUI 3 functions as an output device that outputs the diagnosis result of the switching device diagnostic device 2.

[0013] The switching device diagnostic device 2 diagnoses switching devices. The switching devices are devices such as circuit breakers or disconnecting switches. A circuit breaker 4 shown in FIG. 1 is an example of switching devices that are the subject of diagnosis by the switching device diagnostic device 2.

[0014] The circuit breaker 4 has an operating device 5 that operates the circuit breaker contacts 6. The circuit breaker contacts 6 are contacts provided in a circuit 7 in a facility such as a substation or a switchyard. The circuit 7 is opened by opening the circuit breaker contacts 6, and closed by closing the circuit breaker contacts 6. The operating device 5 performs a tripping operation to open the circuit breaker contacts 6, and a closing operation to close the circuit breaker contacts 6.

[0015] The operating device 5 includes a drive source 11, a mechanism unit 12 that operates by the driving force provided by the drive source 11, an operating shaft 16 that operates the circuit breaker contacts 6, and a braking unit 13 that suppresses the tripping operation and the closing operation.

[0016] The driving source 11 drives the mechanism 12 using air pressure, hydraulic pressure, or spring force. The mechanism 12 moves the operating shaft 16 in a linear direction. The operating shaft 16 operates the circuit breaker contacts 6 by moving in a linear direction. The braking unit 13 absorbs impacts on the operating shaft 16 by braking the operating shaft 16 at the end of the tripping operation and the end of the closing operation. The braking unit 13 can be, for example, a dashpot.

[0017] The tripping operation is controlled by a control signal 14. The control signal 14 is an operation command for the tripping operation. The closing operation is controlled by a control signal 15. The control signal 15 is an operation command for the closing operation. A control panel that controls the operating device 5 outputs the control signals 14 and 15 to the operating device 5. The control signals 14 and 15 are input to the mechanism unit 12. The control panel is not shown in FIG. 1.

[0018] When the circuit 7 is closed, the driving force for the tripping operation is stored in the driving source 11. At this time, the tripping operation of the operating device 5 is prevented by the tripping latch mechanism of the mechanism unit 12. When a control signal 14 is input to the mechanism unit 12, the mechanism unit 12 releases the prevention by the tripping latch mechanism. With the prevention by the tripping latch mechanism released, the operating device 5 performs the tripping operation.

[0019] When the circuit 7 is open, the drive source 11 stores the driving force for the closing operation. At this time, the closing operation of the operating device 5 is prevented by the closing latch mechanism of the mechanism unit 12. When a control signal 15 is input to the mechanism unit 12, the mechanism unit 12 releases the prevention by the closing latch mechanism. With the prevention by the closing latch mechanism released, the operating device 5 performs the closing operation.

[0020] The encoder 17 detects the position of the operating shaft 16. An example of the encoder 17 is a linear encoder. The linear encoder is attached to the operating shaft 16. The linear encoder detects the position of the operating shaft 16 in a linear direction. The encoder 17 outputs a signal indicating the position of the operating shaft 16 to the switching device diagnostic device 2.

[0021] The encoder 17 may be a rotary encoder. In this case, the linear motion of the operating shaft 16 is converted into rotary motion. The rotary encoder is attached to a rotating shaft that rotates along with the rotary motion. The rotary encoder detects the position of the operating shaft 16 by detecting the amount of rotation of the rotating shaft.

[0022] In the first embodiment, the switching device diagnostic device 2 determines the phenomenon that is the cause of the abnormality from among four phenomena that may be the cause of the abnormality in the switching device. Here, the four phenomena are referred to as a first phenomenon, a second phenomenon, a third phenomenon, and a fourth phenomenon.

[0023] The first phenomenon is a decrease in the driving force from the driving source 11. The decrease in driving force, which is the first phenomenon, includes a decrease in air pressure, a decrease in oil pressure, and a decrease in spring force. The second phenomenon is a decrease in the braking capacity of the braking unit 13. The third phenomenon is an insufficient amount of separation when the contacts are opened. The amount of separation is the amount of separation between the movable contact and the fixed contact within the circuit breaker contact 6. An insufficient amount of separation can occur due to improper adjustment when assembling the circuit breaker contact 6, i.e., an initial defect.

[0024] The fourth phenomenon is a delay in the start of operation of the operating shaft 16. A delay in the start of operation of the operating shaft 16 can occur when a moving part of the switching device is stuck. The moving part includes the latch mechanism of the mechanism part 12 and the part of the mechanism part 12 that moves when it receives the driving force from the drive source 11. The moving part also includes the connecting part between the mechanism part 12 and the operating shaft 16, and the connecting part between the operating shaft 16 and the circuit breaker contacts 6. Sticking is a state in which the movement of a moving part is slow. Sticking can include a state in which the moving part is insufficiently lubricated. Insufficient lubrication can occur due to deterioration or insufficient grease applied to the moving part. Sticking can also include a state in which the movement of the moving part is hindered by a component that makes up the moving part getting stuck.

[0025] Next, a description will be given of the configuration of the switching device diagnostic device 2. Fig. 2 is a diagram showing an example of the configuration of the switching device diagnostic device 2 according to the first embodiment.

[0026] The switching device diagnostic device 2 includes an acquisition unit 21, a section detection unit 22, a section determination unit 23, an analysis unit 24, an operation time determination unit 25, a factor determination unit 26, and a diagnostic result output unit 27. The analysis unit 24 includes a gradient waveform analysis unit 31 and a difference analysis unit 32.

[0027] The acquisition unit 21 acquires the signal output from the encoder 17. The acquisition unit 21 generates a measurement waveform based on the acquired signal. The measurement waveform generated by the acquisition unit 21 is a waveform that represents a change in the position of the operating shaft 16. The measurement waveform generated by the acquisition unit 21 can also be said to be the result of measuring the operation of the circuit breaker 4 by the encoder 17. The measurement waveform generated by the acquisition unit 21 is also called a travel waveform. The acquisition unit 21 outputs the acquired measurement waveform to each of the section detection unit 22, the analysis unit 24, and the operation time determination unit 25.

[0028] The section detection unit 22 detects sections of the measured waveform that differ from a reference waveform, which is the basis for the waveform. When the measured waveform is represented on a vertical axis representing the position of the operating axis 16 and a horizontal axis representing time, a section is defined as a portion between two points on the horizontal axis. The section detection unit 22 may detect sections where the measured waveform and the reference waveform differ in waveform in any manner.

[0029] When a section whose waveform differs from the reference waveform is detected, the section detection section 22 outputs information indicating the detected section to the section determination section 23. When a section whose waveform differs from the reference waveform is not detected, the section detection section 22 outputs information indicating that a section whose waveform differs from the reference waveform is not detected to the factor determination section 26.

[0030] As an example, a preset reference waveform is input to the section detection unit 22. The input reference waveform is a waveform that represents the operation of the operating shaft 16 when the circuit breaker 4 is normal. In this case, the section detection unit 22 compares the measured waveform with the reference waveform to determine whether or not the measured waveform has a section whose waveform is different from that of the reference waveform. In this way, the section detection unit 22 detects sections of the measured waveform whose waveform is different from that of the reference waveform.

[0031] The section detection unit 22 may use artificial intelligence (AI) to determine whether or not there is a section in which the measured waveform and the reference waveform have different waveforms. The section detection unit 22 uses, for example, AI to learn the waveform that represents the operation of the operating axis 16. The section detection unit 22 generates a reference waveform through learning. Based on the reference waveform that is the result of learning, the section detection unit 22 determines whether or not there is a section in the measured waveform that has a waveform that is different from the reference waveform. In this way, the section detection unit 22 detects sections in the measured waveform that have a waveform that is different from the reference waveform.

[0032] When a measured waveform is considered as a set of points and each point is compared with a point on a reference waveform, fluctuations in the comparison results for each point on the measured waveform may change the determination result as to whether the measured waveform and the reference waveform differ. The section detection unit 22 uses AI for the determination, comparing the pattern of the measured waveform with the pattern of the reference waveform to determine whether the measured waveform has a section whose waveform differs from that of the reference waveform. By comparing the pattern of the measured waveform with the pattern of the reference waveform, the section detection unit 22 can detect with high accuracy sections of the measured waveform whose waveform differs from that of the reference waveform. This allows the switching device diagnostic device 2 to detect abnormalities in switching devices with high accuracy. The switching device diagnostic device 2 can also detect signs of abnormalities that appear in the differences between the measured waveform and the reference waveform.

[0033] The section detection unit 22 may acquire a measurement waveform at a fixed sampling interval and compare the acquired measurement waveforms to determine whether the waveforms of the measurement waveform and the reference waveform differ. For example, the section detection unit 22 calculates the gradient of the measurement waveform for each small section of the measurement waveform. If the amount of change in gradient between the measurement waveforms exceeds a threshold, the section detection unit 22 determines that the measurement waveform and the reference waveform differ. In this way, the section detection unit 22 detects sections of the measurement waveform that differ from the reference waveform. In this case, instead of setting a reference waveform in advance, the section detection unit 22 considers a previously acquired measurement waveform as a reference waveform and detects sections of the measurement waveform that differ from the previous measurement waveform considered to be the reference waveform.

[0034] In addition, if the measured waveform is shifted in at least one of the vertical and horizontal directions and the measured waveform matches the reference waveform, the section detection unit 22 may determine that the measured waveform does not deviate from the reference waveform.

[0035] The section determination unit 23 performs section determination to determine which section in the waveform representing the period from when the switching device starts operating in accordance with the command input to the switching device to when the operation converges, the section detected by the section detection unit 22 corresponds to.

[0036] The section determination unit 23 determines whether the section detected by the section detection unit 22 corresponds to a first section, which is a predetermined specific section. If the section determination unit 23 determines that the section detected by the section detection unit 22 does not correspond to the first section, the section determination unit 23 determines whether the section detected by the section detection unit 22 corresponds to a predetermined second section. The section determination unit 23 outputs the determination result to the analysis unit 24.

[0037] The analysis unit 24 performs an analysis process on the measured waveform. The gradient waveform analysis unit 31 calculates a gradient waveform that represents the gradient of the measured waveform by differentiating the measured waveform. The gradient waveform analysis unit 31 detects an inflection point of the measured waveform by analyzing the gradient waveform. The difference analysis unit 32 calculates the difference between the measured waveform and a reference waveform. The method used by the difference analysis unit 32 to calculate the difference is arbitrary. The difference analysis unit 32 compares the difference in a predetermined third section with a reference value that is a standard for the difference.

[0038] When detecting a section of the measured waveform that differs from the reference waveform, the section detection unit 22 may output information indicating the difference between the measured waveform and the reference waveform along with the section detection result. As an example, when AI is used to detect the section in the section detection unit 22, the section detection unit 22 outputs information indicating the difference between the measured waveform and the reference waveform. The difference analysis unit 32 may acquire information indicating the difference between the measured waveform and the reference waveform from the section detection unit 22, and compare the difference indicated in the acquired information with a reference value.

[0039] The analysis unit 24 executes one of a first analysis process and a second analysis process depending on the result of the section determination by the section determination unit 23. The first analysis process is a process in which the gradient waveform analysis unit 31 analyzes the gradient waveform, and a process in which the difference analysis unit 32 calculates a difference and compares the difference with a reference value. The second analysis process is a process in which the difference analysis unit 32 calculates a difference and compares the difference with a reference value. The second analysis process does not include a process in which the gradient waveform analysis unit 31 analyzes the gradient waveform. The analysis unit 24 outputs the results of the first analysis process and the second analysis process to the cause determination unit 26.

[0040] The operation time determination unit 25 calculates an operation time, which is the time from when the switching device starts operating in accordance with a command input to the switching device to when the operation is completed, based on the measured waveform. The operation time determination unit 25 compares the calculated operation time with a threshold value. The operation time determination unit 25 outputs the result of comparing the operation time with the threshold value to the factor determination unit 26.

[0041] The factor determination unit 26 determines the cause of the abnormality in the switching device. Based on the result of the section determination by the section determination unit 23 and the result of the first analysis process or the second analysis process by the analysis unit 24, the factor determination unit 26 determines whether or not each of the first phenomenon, the second phenomenon, and the third phenomenon corresponds to a cause of the abnormality. Based on the result of the comparison between the operation time and a threshold by the operation time determination unit 25, the factor determination unit 26 determines whether or not the fourth phenomenon corresponds to a cause of the abnormality. When the factor determination unit 26 determines that at least one of the first phenomenon, the second phenomenon, the third phenomenon, and the fourth phenomenon corresponds to a cause of the abnormality, the factor determination unit 26 outputs information indicating the determined cause of the abnormality to the diagnosis result output unit 27 as a determination result.

[0042] When factor determination unit 26 receives information indicating that no section in which a waveform different from the reference waveform has been detected from section detection unit 22, it determines that there is no abnormality caused by at least one of the first phenomenon, the second phenomenon, and the third phenomenon. When there is no abnormality caused by at least one of the first phenomenon, the second phenomenon, and the third phenomenon, and there is no abnormality caused by the fourth phenomenon, factor determination unit 26 outputs information indicating that no abnormality has been detected to diagnosis result output unit 27 as a determination result.

[0043] When the diagnostic result output unit 27 receives information indicating the cause of the determined abnormality from the cause determination unit 26, it outputs a diagnostic result indicating that an abnormality has been detected together with information indicating the cause of the detected abnormality to the GUI 3. When the diagnostic result output unit 27 receives information indicating that no abnormality has been detected from the cause determination unit 26, it outputs a diagnostic result indicating that no abnormality has been detected to the GUI 3.

[0044] When the GUI 3 receives the diagnostic result from the diagnostic result output unit 27, it displays the diagnostic result. In the first embodiment, the switching device diagnostic system 1 is provided with the GUI 3 that displays the diagnostic result by the switching device diagnostic device 2, but this configuration is merely an example. The output device of the switching device diagnostic system 1 may output the diagnostic result in a manner other than display. In the above, the diagnostic result is displayed by the GUI 3, which is a device external to the switching device diagnostic device 2, but the switching device diagnostic device 2 may be provided with a display device that displays the diagnostic result.

[0045] Next, a detailed description will be given of the process of determining the cause of an abnormality by the switching device diagnostic device 2. When an abnormality occurs in a switching device, a characteristic corresponding to the cause of the abnormality may appear in the measured waveform. The switching device diagnostic device 2 determines the cause of the abnormality based on the characteristic appearing in the measured waveform.

[0046] FIG. 3 is a diagram showing an example of a measured waveform acquired when a first phenomenon is the cause of an abnormality in the switching device diagnostic device 2 according to the first embodiment. In FIG. 3, the solid line graph W1 represents the measured waveform when an abnormality caused by the first phenomenon occurs. The dashed line graph W0 represents the reference waveform. FIG. 3 shows an example of a measured waveform in a tripping operation and an example of the reference waveform in a tripping operation. In FIG. 3, the vertical axis p represents the position of the operating shaft 16. The horizontal axis t represents time. The explanations for W0, the vertical axis, and the horizontal axis shown in FIG. 3 are the same as those for FIGS. 4 to 6, which will be described later.

[0047] As described above, the first phenomenon is a decrease in the driving force of the driving source 11. When the operating axis 16 starts to move, there is no difference between when the driving force is decreased and when it is not. Furthermore, when the driving force is decreased, the operating speed of the operating axis 16 decreases compared to when there is no decrease in the driving force. Therefore, the gradient of W1 from the start of the movement to the convergence of the movement is gentler than the gradient of W0 from the start of the movement to the convergence of the movement. In W1, the time from when the control signal 14 is input until the position p converges is longer than in the case of W0.

[0048] 3, in the section marked T1, the waveforms of W1 and W0 are different. When an abnormality caused by the first phenomenon occurs, the section detection unit 22 detects T1 as a section of the measured waveform where the waveform is different from the reference waveform. T1 represents the above-mentioned first section.

[0049] When the section determination unit 23 determines that the section detected by the section detection unit 22 corresponds to the first section, it outputs a determination result indicating that the detected section corresponds to the first section to the analysis unit 24.

[0050] Fig. 4 is a diagram showing an example of a measured waveform acquired when the second phenomenon is the cause of an abnormality in the switching device diagnostic device 2 according to embodiment 1. In Fig. 4, the solid line graph W2 represents the measured waveform when an abnormality caused by the second phenomenon occurs. Fig. 4 shows an example of a measured waveform in a tripping operation and an example of a reference waveform in a tripping operation.

[0051] As described above, the second phenomenon is a decrease in the braking capacity of the brake unit 13. The start of operation of the operating shaft 16 is the same whether the braking capacity is decreased or not. Furthermore, when the braking capacity is decreased, the reciprocating movement of the operating shaft 16 becomes larger until the operation of the operating shaft 16 converges, compared to when the braking capacity is not decreased. For this reason, in W2, the time from when the control signal 14 is input until the position p converges is longer than in the case of W0.

[0052] 4, in the section marked T2, the waveforms of W2 and W0 are different. When an abnormality caused by the second phenomenon occurs, the section detection unit 22 detects T2 as a section of the measured waveform that is different from the reference waveform. T2 represents the second section.

[0053] If the section determination unit 23 determines that the section detected by the section detection unit 22 corresponds to the second section, it outputs a determination result indicating that the detected section corresponds to the second section to the analysis unit 24.

[0054] Fig. 5 is a diagram showing an example of a measured waveform acquired when the third phenomenon is the cause of an abnormality in the switching device diagnostic device 2 according to embodiment 1. In Fig. 5, the solid line graph W3 represents the measured waveform when an abnormality caused by the third phenomenon occurs. Fig. 5 shows an example of a measured waveform in a tripping operation and an example of a reference waveform in a tripping operation.

[0055] As described above, the third phenomenon is an insufficient amount of separation when the contacts are opened. During the tripping operation, the operation of the operating shaft 16 converges before the movable contact reaches the normal amount of separation. Therefore, in W3, the time from when the control signal 14 is input until the position p converges is shorter than in W0.

[0056] In FIG. 5, in the section marked T3, the waveforms at W3 and W0 are different. When an abnormality caused by the third phenomenon occurs, the difference analyzer 32 determines that the difference d between the measured waveform at T3 and the reference waveform exceeds a reference value. The reference value is a threshold value for determining whether or not a deficiency in the amount of deviation, which is the third phenomenon, has occurred. T3 represents the third section.

[0057] When it is determined that the section detected by the section detection section 22 corresponds to the first section, the difference analysis section 32 determines whether the difference d between the measured waveform at T3 and the reference waveform exceeds a reference value. When the difference d exceeds the reference value, the difference analysis section 32 outputs information indicating that the difference d exceeds the reference value to the factor determination section 26 as the result of the first analysis process. When the difference d does not exceed the reference value, the difference analysis section 32 outputs information indicating that the difference d does not exceed the reference value to the factor determination section 26 as the result of the first analysis process.

[0058] When it is determined that the section detected by the section detection section 22 corresponds to the second section, the difference analysis section 32 determines whether the difference d between the measured waveform at T3 and the reference waveform exceeds a reference value. When the difference d exceeds the reference value, the difference analysis section 32 outputs information indicating that the difference d exceeds the reference value to the factor determination section 26 as the result of the second analysis process. When the difference d does not exceed the reference value, the difference analysis section 32 outputs information indicating that the difference d does not exceed the reference value to the factor determination section 26 as the result of the second analysis process.

[0059] Fig. 6 is a diagram showing an example of a measured waveform acquired when the fourth phenomenon is the cause of an abnormality in the switching device diagnostic device 2 according to embodiment 1. In Fig. 6, the solid line graph W4 represents the measured waveform when an abnormality caused by the fourth phenomenon occurs. Fig. 6 shows an example of a measured waveform in a tripping operation and an example of a reference waveform in a tripping operation.

[0060] As described above, the fourth phenomenon is a delay in the start of movement of the operating axis 16. When a delay occurs in the start of movement of the operating axis 16, the period from when the control signal 14, which is an operation command, is input to the mechanism unit 12 until the operating axis 16 starts moving is longer than when there is no delay in the start of movement of the operating axis 16. Therefore, the start of change in position p is slower in the case of W4 than in the case of W0. There is no change in the operating speed of the operating axis 16 when there is a delay in the start of movement and when there is no delay in the start of movement. Therefore, by shifting W4 along the horizontal axis, W4 becomes equal to W0. In other words, W4 can be said to be the same waveform as W0, but delayed on the time axis. In the case of W4, the time from when the control signal 14 is input until the position p converges is longer than in the case of W0.

[0061] The threshold value that is compared with the calculated operation time in the operation time determination unit 25 is a threshold value for determining whether or not a delay in the start of operation of the operating axis 16, which is the fourth phenomenon, has occurred. If the calculated operation time exceeds the threshold value, the operation time determination unit 25 outputs a comparison result indicating that the calculated operation time has exceeded the threshold value to the factor determination unit 26. If the calculated operation time does not exceed the threshold value, the operation time determination unit 25 outputs a comparison result indicating that the calculated operation time does not exceed the threshold value to the factor determination unit 26.

[0062] Fig. 7 is a diagram showing an example of a gradient waveform calculated by the gradient waveform analysis unit 31 of the switching device diagnostic device 2 according to the first embodiment. In Fig. 7, W2', which is a solid line graph, is a gradient waveform that represents the gradient of the measured waveform shown in Fig. 4. W0', which is a dashed line graph, is a gradient waveform that represents the gradient of the reference waveform. In Fig. 7, g, which is the vertical axis, represents gradient, and t, which is the horizontal axis, represents time.

[0063] When it is determined that the section detected by the section detection section 22 corresponds to the first section, the gradient waveform analysis section 31 calculates the gradient waveform by differentiating the measured waveform. The gradient waveform analysis section 31 detects inflection points of the measured waveform by analyzing the gradient waveform.

[0064] In FIG. 7, the section marked T' is a section after the inflection point of W0, and is a section until operation converges. When an abnormality caused by the second phenomenon occurs, operation converges later than under normal conditions. Therefore, the inflection point when an abnormality caused by the second phenomenon occurs is shifted later than the inflection point under normal conditions. In other words, when an abnormality caused by the second phenomenon occurs, the inflection point of the measured waveform is detected in the predetermined section T'. In FIG. 7, the point marked IF0 is the inflection point of W0, i.e., the inflection point under normal conditions. The point marked IF2 is the inflection point of W2.

[0065] 7 is present at T'. In this case, the gradient waveform analysis unit 31 outputs information indicating that an inflection point has been detected at T' to the cause determination unit 26 as a result of the first analysis process. The detection of an inflection point at T' indicates that the second phenomenon is the cause of the abnormality.

[0066] If no inflection point is detected at T', the gradient waveform analysis unit 31 outputs information indicating that no inflection point is detected at T' to the cause determination unit 26 as the result of the first analysis process. The fact that no inflection point is detected at T' indicates that the second phenomenon is not the cause of the abnormality.

[0067] When it is determined that the section detected by the section detection section 22 corresponds to the first section, the cause determination section 26 determines that the first phenomenon is the cause of the abnormality. The first phenomenon can be said to be a phenomenon that causes a deviation of the waveform from the reference waveform in the first section.

[0068] Furthermore, when it is determined that the section detected by the section detection section 22 corresponds to the first section, the factor determination section 26 determines whether or not there is a factor other than the first phenomenon based on the results of the first analysis process, including the detection result of the inflection point at T' and the calculation result of the difference between the measured waveform and the reference waveform. When the factor determination section 26 receives from the analysis section 24 the result of the first analysis process indicating that an inflection point was detected at T', the factor determination section 26 determines that the second phenomenon is the factor of the abnormality. When the factor determination section 26 receives from the analysis section 24 the result of the first analysis process indicating that an inflection point was not detected at T', the factor determination section 26 determines that the second phenomenon is not the factor of the abnormality. When the factor determination section 26 receives from the analysis section 24 the result of the first analysis process indicating that the difference between the measured waveform and the reference waveform in the third section exceeds a reference value, the factor determination section 26 determines that the third phenomenon is the factor of the abnormality. When the cause determination unit 26 obtains from the analysis unit 24 the result of the first analysis process indicating that the difference between the measured waveform and the reference waveform in the third section does not exceed the reference value, the cause determination unit 26 determines that the third phenomenon is not the cause of the abnormality.

[0069] If it is determined that the section detected by the section detection section 22 does not correspond to the first section, the cause determination section 26 determines that the first phenomenon is not the cause of the abnormality.

[0070] When it is determined that the section detected by the section detection section 22 corresponds to the second section, the cause determination section 26 determines that the second phenomenon is the cause of the abnormality. The second phenomenon can be said to be a phenomenon that causes a deviation of the waveform from the reference waveform in the second section.

[0071] Furthermore, when it is determined that the section detected by section detection section 22 corresponds to the second section, factor determination section 26 determines whether or not there is a factor other than the second phenomenon based on the result of the second analysis process, which includes the calculation result of the difference between the measured waveform and the reference waveform. When factor determination section 26 receives from analysis section 24 the result of the second analysis process indicating that the difference between the measured waveform and the reference waveform in the third section exceeds a reference value, factor determination section 26 determines that the third phenomenon is the factor of the abnormality. When factor determination section 26 receives from analysis section 24 the result of the second analysis process indicating that the difference between the measured waveform and the reference waveform in the third section does not exceed the reference value, factor determination section 26 determines that the third phenomenon is not the factor of the abnormality.

[0072] If it is determined that the section detected by section detection section 22 does not correspond to the second section, then factor determination section 26 determines that the second phenomenon is not the cause of the abnormality. If it is determined that the section detected by section detection section 22 does not correspond to either the first section or the second section, then factor determination section 26 determines that the section detected by section detection section 22 is the third section. In this case, factor determination section 26 determines that the third phenomenon is the cause of the abnormality.

[0073] When the factor determination unit 26 receives a comparison result indicating that the operation time exceeds the threshold from the operation time determination unit 25, the factor determination unit 26 determines that the fourth phenomenon is the cause of the abnormality. When the factor determination unit 26 receives a comparison result indicating that the operation time does not exceed the threshold from the operation time determination unit 25, the factor determination unit 26 determines that the fourth phenomenon is not the cause of the abnormality.

[0074] Here, an example of determining the cause of an abnormality when an abnormality occurs due to two or more factors will be described. Fig. 8 is a first diagram for explaining the determination of the cause of an abnormality by the switching device diagnostic device 2 according to the first embodiment. In Fig. 8, W 11 is an example of a measured waveform when an abnormality due to the first phenomenon and the third phenomenon occurs. The dashed line graph W0 represents a reference waveform. FIG. 8 shows an example of a measured waveform during a tripping operation and an example of a reference waveform during a tripping operation. In FIG. 8, the vertical axis p represents the position of the operating shaft 16. The horizontal axis t represents time. The explanations for W0, the vertical axis, and the horizontal axis shown in FIG. 8 are the same as those for FIGS. 9 and 10, which will be described later.

[0075] In the example shown in FIG. 8, the first section T1 and the third section T3 each have a width W 11 This corresponds to a section where the waveforms of W0 and W1 are different. Since T3 is included in T1, the section detection section 22 detects the first section as a section where the waveforms of the measured waveform and the reference waveform are different.

[0076] When the section detected as a section with different waveforms is determined to be the first section by the section determination section 23, the factor determination section 26 determines that the first phenomenon is the cause of the abnormality. Furthermore, the factor determination section 26 determines whether or not there is a factor other than the first phenomenon based on the results of the first analysis process. In the example shown in FIG. 8, the analysis section 24 determines, through the first analysis process, that the difference between the measured waveform and the reference waveform in the third section exceeds the reference value. The factor determination section 26 determines that the third phenomenon is the cause of the abnormality because the difference between the measured waveform and the reference waveform in the third section exceeds the reference value. As a result of the above, the factor determination section 26 determines that the first phenomenon and the third phenomenon are the causes of the abnormality.

[0077] 9 is a second diagram for explaining the determination of the cause of an abnormality by the switching device diagnostic device 2 according to the first embodiment. In FIG. 9, the solid line graph W 12is an example of a measured waveform when an abnormality occurs due to the second phenomenon and the third phenomenon. Fig. 9 shows an example of a measured waveform in a tripping operation and an example of a reference waveform in a tripping operation.

[0078] In the example shown in FIG. 9, the second section T2 and the third section T3 each have a width W 12 This corresponds to a section where the waveforms of W0 and W1 are different. Since T3 is included in T2, the section detection section 22 detects the second section as a section where the waveforms of the measured waveform and the reference waveform are different.

[0079] When the section detected as a section with different waveforms is determined to be the second section by the section determination section 23, the factor determination section 26 determines that the second phenomenon is the cause of the abnormality. Furthermore, the factor determination section 26 determines whether or not there is a factor other than the second phenomenon based on the results of the second analysis process. In the example shown in FIG. 9, the analysis section 24 determines, through the second analysis process, that the difference between the measured waveform and the reference waveform in the third section exceeds the reference value. The factor determination section 26 determines that the third phenomenon is the cause of the abnormality because the difference between the measured waveform and the reference waveform in the third section exceeds the reference value. As a result of the above, the factor determination section 26 determines that the second phenomenon and the third phenomenon are the causes of the abnormality.

[0080] 10 is a third diagram for explaining the determination of the cause of an abnormality by the switching device diagnostic device 2 according to the first embodiment. In FIG. 10, W 13 is an example of a measured waveform when an abnormality occurs due to the first phenomenon and the second phenomenon. Fig. 10 shows an example of a measured waveform in a tripping operation and an example of a reference waveform in a tripping operation.

[0081] In the example shown in FIG. 10, the first section T1 and the second section T2 are W 13 10, the latter half of the first interval and the former half of the second interval overlap each other, so interval detection unit 22 detects the period from the start point of the first interval to the end point of the second interval as an interval where the waveforms of the measured waveform and the reference waveform are different.

[0082] Here, it is assumed that the section determination unit 23 determines whether or not the section detected by the section detection unit 22 corresponds to a predetermined section in the order of the first section and the second section. In the example shown in Fig. 10, the section determination unit 23 determines that the section detected by the section detection unit 22 corresponds to the first section.

[0083] When the section detected as a section with a different waveform is determined to be the first section by the section determination unit 23, the factor determination unit 26 determines that the first phenomenon is the cause of the abnormality. Furthermore, the factor determination unit 26 determines whether or not there is a factor other than the first phenomenon based on the results of the first analysis process. The analysis unit 24 determines whether or not there is an inflection point in a predetermined section of the gradient waveform through the first analysis process. Here, the predetermined section is the section marked T' in FIG. 7. In other words, the predetermined section is the section after the inflection point of the reference waveform and until the operation converges.

[0084] 10, the first analysis process detects an inflection point of the measured waveform at T'. Based on the result of the first analysis process indicating that an inflection point was detected at T', the cause determination unit 26 determines that the second phenomenon is the cause of the abnormality. As a result, the cause determination unit 26 determines that the first phenomenon and the second phenomenon are the causes of the abnormality.

[0085] As described above, when there are multiple phenomena that could be the cause of an abnormality, the switching equipment diagnostic device 2 can determine whether each of the multiple phenomena is the cause of an abnormality by processing by the section detection unit 22, the section determination unit 23, and the analysis unit 24.

[0086] Next, a description will be given of the procedure of processing by the switching device diagnostic device 2. Here, a description will be given of processing by the switching device diagnostic device 2 to determine whether or not the first phenomenon, the second phenomenon, and the third phenomenon correspond to the cause of an abnormality. In parallel with the processing for the first phenomenon, the second phenomenon, and the third phenomenon, the switching device diagnostic device 2 executes processing to determine whether or not the fourth phenomenon corresponds to the cause of an abnormality.

[0087] 11 and 12 are flowcharts showing an example of a processing procedure performed by the switching device diagnostic device 2 according to the first embodiment.

[0088] The section detection unit 22 acquires the measured waveform from the acquisition unit 21. In step S1, the section detection unit 22 determines whether the measured waveform has a section where the waveform differs from the reference waveform. If the section detection unit 22 determines that the measured waveform does not have a section where the waveform differs from the reference waveform (step S1, No), in step S13, the cause determination unit 26 determines that there is no abnormality caused by at least one of the first phenomenon, the second phenomenon, and the third phenomenon.

[0089] If the section detection unit 22 determines that the measured waveform has a section where the waveform is different from the reference waveform (step S1, Yes), then in step S2, the section determination unit 23 determines whether the section detected by the section detection unit 22 corresponds to the first section. If the section determination unit 23 determines that the detected section corresponds to the first section (step S2, Yes), the switching device diagnostic device 2 proceeds to step S3. If the section determination unit 23 determines that the detected section does not correspond to the first section (step S2, No), the switching device diagnostic device 2 proceeds to step S14.

[0090] In step S3, the gradient waveform analysis unit 31 calculates a gradient waveform that represents the gradient of the measured waveform by differentiating the measured waveform. In step S4, the gradient waveform analysis unit 31 determines whether or not an inflection point of the measured waveform is detected in a predetermined interval T'. If an inflection point of the measured waveform is detected in T' (step S4, Yes), the switching device diagnostic device 2 proceeds to step S5. If an inflection point of the measured waveform is not detected in T' (step S4, No), the switching device diagnostic device 2 proceeds to step S9.

[0091] In step S5, the difference analysis unit 32 calculates the difference between the measured waveform and the reference waveform. In step S6, the difference analysis unit 32 determines whether the difference in the third interval exceeds the reference value. If the difference in the third interval exceeds the reference value (step S6, Yes), in step S7, the factor determination unit 26 determines that an abnormality caused by the first phenomenon, the second phenomenon, and the third phenomenon exists. If the difference in the third interval does not exceed the reference value (step S6, No), in step S8, the factor determination unit 26 determines that an abnormality caused by the first phenomenon and the second phenomenon exists.

[0092] In step S9, the difference analysis unit 32 calculates the difference between the measured waveform and the reference waveform. In step S10, the difference analysis unit 32 determines whether the difference in the third interval exceeds a reference value. If the difference in the third interval exceeds the reference value (step S10, Yes), in step S11, the factor determination unit 26 determines that an abnormality caused by the first phenomenon and the third phenomenon exists. If the difference in the third interval does not exceed the reference value (step S10, No), in step S12, the factor determination unit 26 determines that an abnormality caused by the first phenomenon exists.

[0093] In step S14, the section determination unit 23 determines whether the section detected by the section detection unit 22 corresponds to the second section. If the section determination unit 23 determines that the detected section corresponds to the second section (step S14, Yes), the switching device diagnostic device 2 proceeds to step S15. If the section determination unit 23 determines that the detected section does not correspond to the second section (step S14, No), in step S19, the cause determination unit 26 determines that there is an abnormality caused by a phenomenon that is not the first phenomenon, the second phenomenon, or the third phenomenon.

[0094] In step S15, the difference analysis unit 32 calculates the difference between the measured waveform and the reference waveform. In step S16, the difference analysis unit 32 determines whether the difference in the third interval exceeds the reference value. If the difference in the third interval exceeds the reference value (step S16, Yes), in step S17, the cause determination unit 26 determines that an abnormality caused by the second phenomenon and the third phenomenon exists. If the difference in the third interval does not exceed the reference value (step S16, No), in step S18, the cause determination unit 26 determines that an abnormality caused by the second phenomenon exists. As a result, the switching device diagnostic device 2 ends the process of determining whether the first phenomenon, the second phenomenon, and the third phenomenon correspond to the causes of an abnormality.

[0095] In the above, the switching device diagnostic device 2 determines whether or not the fourth phenomenon corresponds to a cause of the abnormality, separately from the processing procedures shown in Figures 11 and 12. The switching device diagnostic device 2 may include processing for determining whether or not the fourth phenomenon corresponds to a cause of the abnormality in the processing procedures shown in Figures 11 and 12.

[0096] In the first embodiment, the first analysis process includes a process of calculating a gradient waveform by differentiating the measured waveform. Therefore, the first analysis process imposes a greater burden than the processes of detecting a section of the measured waveform that differs from the reference waveform and determining which of the predetermined sections the detected section corresponds to. Furthermore, the second analysis process does not include a process of calculating a gradient waveform, so the second analysis process imposes a smaller burden than the first analysis process.

[0097] The switching device diagnostic device 2 executes a first analysis process when a section of the measured waveform that is different from the reference waveform corresponds to the first section. Also, the switching device diagnostic device 2 executes a second analysis process when a section of the measured waveform that is different from the reference waveform does not correspond to the first section. The switching device diagnostic device 2 can reduce the processing load compared to when processing such as differentiation or integration is required regardless of whether the measured waveform is different from the reference waveform.

[0098] If a switching device abnormality is detected based on the difference between a measured waveform and a reference waveform, a threshold value may be set to determine whether or not an abnormality exists. In this case, an abnormality in the switching device is determined when the difference between the measured waveform and the reference waveform exceeds the threshold value. The threshold value is set to provide a certain degree of tolerance for abnormality determination, taking into account individual differences in switching devices due to manufacturing errors or the influence of materials used in the switching device. Depending on the threshold value setting, abnormalities in the measured waveform caused by a switching device abnormality may be overlooked, making it difficult to accurately determine the abnormality. The switching device diagnostic device 2 compares the pattern of the measured waveform with the pattern of the reference waveform in the section detection unit 22, and detects a section where the waveform differs when behavior in the measured waveform differs from that of the reference waveform. The switching device diagnostic device 2 can detect abnormalities or signs of abnormalities in switching devices with higher accuracy than when detecting an abnormality in switching devices by simply comparing the difference between the measured waveform and the reference waveform with a threshold value.

[0099] Next, a description will be given of a hardware configuration that realizes the switching device diagnostic device 2 according to the embodiment 1. The switching device diagnostic device 2 is realized by a processing circuit. The processing circuit is, for example, a circuit in which a processor executes software.

[0100] When the processing circuit is realized by software, the processing circuit is, for example, a control circuit 40 shown in FIG. 13. FIG. 13 is a diagram showing an example configuration of the control circuit 40 according to the first embodiment. The control circuit 40 includes an input unit 41, a processor 42, a memory 43, and an output unit 44. The input unit 41 is an interface circuit that receives data input from outside the control circuit 40 and provides the data to the processor 42. The output unit 44 is an interface circuit that sends data from the processor 42 or the memory 43 to outside the control circuit 40.

[0101] The processing units of the switching device diagnostic device 2, namely, the section detection unit 22, the section determination unit 23, the analysis unit 24, the operation time determination unit 25, and the factor determination unit 26, are realized by software, firmware, or a combination of software and firmware. The software or firmware is written as a program and stored in the memory 43. In the control circuit 40, the processor 42 reads and executes the program stored in the memory 43, thereby realizing each function of the processing unit. That is, the control circuit 40 includes the memory 43 for storing a program that results in the processing of the switching device diagnostic device 2 being executed. It can also be said that this program causes the computer system to execute the processing procedures and methods of the switching device diagnostic device 2. The memory 43 is also used as a temporary memory when the processor 42 executes various processes.

[0102] The section detection unit 22, the section determination unit 23, the analysis unit 24, the operation time determination unit 25, and the cause determination unit 26 are realized by using a processor 42 and a memory 43. The processor 42 is a central processing unit (CPU). The processor 42 may be a central processing unit, a processing unit, an arithmetic unit, a microprocessor, a microcomputer, or a digital signal processor (DSP). The memory 43 may be, for example, a non-volatile or volatile semiconductor memory such as a random access memory (RAM), a read-only memory (ROM), a flash memory, an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a magnetic disk, a flexible disk, an optical disk, a compact disk, a minidisk, or a digital versatile disk (DVD). The function of the acquisition unit 21 to receive information is realized by using the input unit 41. The function of the diagnosis result output unit 27 to output information is realized by using the output unit 44.

[0103] The program according to the first embodiment may be provided by being stored in a recording medium such as a CD (Compact Disc)-ROM or a DVD-ROM. The program according to the first embodiment may be provided by being stored in a computer connected to a network such as the Internet and downloaded via the network such as the Internet. The program according to the first embodiment may be provided or distributed via a network such as the Internet.

[0104] The functions of the switching device diagnostic device 2 may be realized by a dedicated hardware circuit. The dedicated hardware circuit includes a processing circuit. The processing circuit is a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or a circuit combining these. The functions of the switching device diagnostic device 2 may be realized by the processing circuit separately for each function, or the functions of the switching device diagnostic device 2 may be realized collectively by the processing circuit. Note that the switching device diagnostic device 2 may be realized by combining the control circuit 40 and a hardware circuit.

[0105] The components of the switching device diagnostic device 2 do not need to be physically configured as shown in the figure. The specific form of distribution and integration of the components is not limited to that shown in the figure. The components may be configured to be functionally or physically distributed or integrated in any unit.

[0106] As an example, the switching device diagnostic device 2 is realized by a single computer. The components of the switching device diagnostic device 2 may be distributed among multiple computers. That is, the switching device diagnostic device 2 may be realized by multiple computers.

[0107] According to the first embodiment, the switching device diagnostic device 2 includes a section detection unit 22 that detects a section of a measured waveform that differs from a reference waveform, and a section determination unit 23 that performs section determination to determine which section the detected section corresponds to in a waveform representing the time from when the switching device starts operating in accordance with a command input to the switching device until the operation converges. The switching device diagnostic device 2 also includes an analysis unit 24 that performs a first analysis process including analysis of a gradient waveform representing the gradient of the measured waveform when it is determined that the detected section corresponds to a predetermined specific section, and a second analysis process that does not include analysis of the gradient waveform when it is determined that the detected section does not correspond to the specific section, and a factor determination unit 26 that determines the cause of an abnormality in the switching device based on the result of the section determination and the result of the first analysis process or the second analysis process. The switching device diagnostic device 2 performs gradient waveform analysis, which has a larger processing load than the processing in the section detection unit 22 and the processing in the section determination unit 23, when the detected section corresponds to the specific section. The switching device diagnostic device 2 can reduce the processing load compared to when a process with a heavy processing load is constantly executed. This provides the effect that the switching device diagnostic device 2 can reduce the processing load.

[0108] When it is determined that the detected section corresponds to the first section, the analysis unit 24 may execute a first analysis process that calculates a gradient waveform and detects an inflection point of the measured waveform by analyzing the gradient waveform. When it is determined that the detected section corresponds to the first section, the cause determination unit 26 determines that the first phenomenon is the cause of the abnormality, and determines whether or not there is a cause other than the first phenomenon based on the result of the first analysis process including the detection result of the inflection point. In this way, the switching device diagnostic device 2 can determine whether or not each of a plurality of phenomena that could be the cause of the abnormality is the cause of the abnormality.

[0109] When it is determined that the detected section corresponds to the first section, the analysis section 24 may execute a first analysis process including detecting an inflection point and calculating a difference between the measured waveform and the reference waveform. When it is determined that the detected section corresponds to the first section, the cause determination section 26 determines whether or not there is a cause other than the first phenomenon based on the result of the first analysis process including the detection result of the inflection point and the calculation result of the difference. In this way, when the first phenomenon is one of the causes of the abnormality, the switching device diagnostic device 2 can determine whether or not a phenomenon other than the first phenomenon is a cause of the abnormality.

[0110] The analysis unit 24 may execute a second analysis process when it is determined by the section determination that the detected section corresponds to a predetermined second section. When it is determined that the detected section corresponds to the second section, the cause determination unit 26 determines that the second phenomenon is the cause of the abnormality, and determines whether or not there are any causes other than the second phenomenon based on the results of the second analysis process including the calculation result of the difference. This allows the switching device diagnostic device 2 to determine whether or not each of a plurality of phenomena that could be the cause of an abnormality is the cause of the abnormality.

[0111] The analysis unit 24 may compare the difference in the third interval with a reference value. When it is determined that the detected interval corresponds to the first interval, the cause determination unit 26 may determine whether or not there is a cause other than the first phenomenon based on the result of the first analysis process including the detection result of the inflection point and the comparison result of the difference with the reference value. In this way, when the first phenomenon is one of the causes of the abnormality, the switching device diagnostic device 2 can determine whether or not a phenomenon other than the first phenomenon is a cause of the abnormality.

[0112] The analysis unit 24 may compare the difference in the third interval with a reference value. When it is determined that the detected interval corresponds to the second interval, the cause determination unit 26 may determine whether or not there is a cause other than the second phenomenon based on the result of the second analysis process including the result of comparing the difference with the reference value. In this way, when the second phenomenon is one of the causes of the abnormality, the switching device diagnostic device 2 can determine whether or not a phenomenon other than the second phenomenon is a cause of the abnormality.

[0113] The switching device diagnostic device 2 may include an operation time determination unit 25 that calculates an operation time, which is the time from when the switching device starts operating in accordance with a command input to the switching device to when the operation is completed, based on the measured waveform, and compares the operation time with a threshold. The cause determination unit 26 may determine the cause of the abnormality in the switching device based on the comparison result between the operation time and the threshold. This allows the switching device diagnostic device 2 to determine whether the phenomenon of a delay in the start of operation of the operating shaft 16 is the cause of the abnormality in the switching device.

[0114] The configurations described in the above embodiments are examples of the contents of the present disclosure. The configurations of the embodiments can be combined with other known technologies. Part of the configurations of the embodiments can be omitted or modified without departing from the gist of the present disclosure. [Explanation of symbols]

[0115] 1 Switching equipment diagnostic system, 2 Switching equipment diagnostic device, 3 GUI, 4 Circuit breaker, 5 Operating device, 6 Circuit breaker contacts, 7 Circuit, 11 Drive source, 12 Mechanism, 13 Braking unit, 14, 15 Control signal, 16 Operating shaft, 17 Encoder, 21 Acquisition unit, 22 Section detection unit, 23 Section determination unit, 24 Analysis unit, 25 Operation time determination unit, 26 Cause determination unit, 27 Diagnostic result output unit, 31 Gradient waveform analysis unit, 32 Difference analysis unit, 40 Control circuit, 41 Input unit, 42 Processor, 43 Memory, 44 Output unit.

Claims

1. a section detection unit that detects a section of a measured waveform that indicates a result of measuring the operation of the switching device, the section having a waveform that is different from a reference waveform that is a waveform reference; a section determination unit that performs section determination to determine which section of a waveform representing a time from when the switching device starts operating in accordance with a command input to the switching device to when the operation is completed corresponds to the detected section; an analysis unit that executes a first analysis process including an analysis of a gradient waveform representing a gradient of the measured waveform when it is determined that the detected section corresponds to a predetermined specific section, and executes a second analysis process that does not include an analysis of the gradient waveform when it is determined that the detected section does not correspond to the specific section; a factor determination unit that determines a factor of the abnormality of the switching device based on a result of the section determination and a result of the first analysis process or the second analysis process; Equipped with Switching equipment diagnostic device.

2. when it is determined that the detected section corresponds to a first section that is the specific section, the analysis unit executes the first analysis process of calculating the gradient waveform and detecting an inflection point of the measured waveform by analyzing the gradient waveform; When it is determined that the detected section corresponds to the first section, the factor determination unit determines that a first phenomenon that causes a deviation of the waveform from the reference waveform in the first section is a factor of the abnormality, and determines whether or not there is a factor other than the first phenomenon based on a result of the first analysis process including a detection result of the inflection point. The switching device diagnostic device according to claim 1 .

3. when it is determined that the detected section corresponds to a first section that is the specific section, the analysis section executes the first analysis process, which includes detecting the inflection point and calculating a difference between the measured waveform and the reference waveform; When it is determined that the detected section corresponds to the first section, the factor determination unit determines whether or not there is a factor other than the first phenomenon based on a result of the first analysis process including a detection result of the inflection point and a calculation result of the difference. The switching device diagnostic device according to claim 2.

4. the analysis unit executes the second analysis process when it is determined by the section determination that the detected section corresponds to a predetermined second section; When it is determined that the detected section corresponds to the second section, the factor determination unit determines that a second phenomenon that causes a deviation of the waveform from the reference waveform in the second section is a factor of the abnormality, and determines whether or not there is a factor other than the second phenomenon based on a result of the second analysis process including a calculation result of the difference. The switching device diagnostic device according to claim 3.

5. the analysis unit compares the difference in a predetermined third section with a reference value that is a reference for the difference; When it is determined that the detected section corresponds to the first section, the factor determination unit determines whether or not there is a factor other than the first phenomenon based on a result of the first analysis process including a detection result of the inflection point and a comparison result between the difference and the reference value. The switching device diagnostic device according to claim 4.

6. the analysis unit compares the difference in a predetermined third section with a reference value that is a reference for the difference; When it is determined that the detected section corresponds to the second section, the factor determination unit determines whether or not there is a factor other than the second phenomenon based on a result of the second analysis process including a comparison result between the difference and the reference value. The switching device diagnostic device according to claim 4.

7. an operation time determination unit that calculates an operation time, which is a time from when the switching device starts to operate in accordance with a command input to the switching device to when the operation is completed, based on the measured waveform, and compares the operation time with a threshold value; The factor determination unit determines a factor of the abnormality of the switching device based on a result of comparing the operation time with the threshold value. The switching device diagnostic device according to any one of claims 1 to 6.

8. a switching device diagnostic device for diagnosing the switching device; an output device that outputs a diagnosis result by the switching device diagnosis device, The switching device diagnostic device includes: a section detection unit that detects a section of a waveform that is different from a reference waveform that is a waveform reference, among a measurement waveform that indicates a result of measuring the operation of the switching device; a section determination unit that performs section determination to determine which section of a waveform representing a time from when the switching device starts operating in accordance with a command input to the switching device to when the operation is completed corresponds to the detected section; an analysis unit that executes a first analysis process including an analysis of a gradient waveform representing a gradient of the measured waveform when it is determined that the detected section corresponds to a predetermined specific section, and executes a second analysis process that does not include an analysis of the gradient waveform when it is determined that the detected section does not correspond to the specific section; a factor determination unit that determines a factor of the abnormality of the switching device based on a result of the section determination and a result of the first analysis process or the second analysis process; Equipped with The output device outputs the diagnosis result including the determination result by the factor determination unit. Switching equipment diagnostic system.

9. detecting a section of a measured waveform that indicates a result of measuring the operation of the switching device, the section having a waveform that is different from a reference waveform that is a waveform reference; a step of executing a section determination to determine which section of a waveform representing a time from when the switching device starts to operate in accordance with a command input to the switching device until when the operation is completed corresponds to the detected section; a step of executing a first analysis process including an analysis of a gradient waveform representing a gradient of the measured waveform when it is determined that the detected section corresponds to a predetermined specific section, and executing a second analysis process not including an analysis of the gradient waveform when it is determined that the detected section does not correspond to the specific section; determining a cause of the abnormality in the switching device based on a result of the section determination and a result of the first analysis process or the second analysis process; Contains Switching equipment diagnostic method.

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