Surface condition determination device, surface condition determination method, and surface condition determination program

Abstract

To provide a device that allows a user to set a position of irradiation in irradiating a measuring object with irradiation light and easily determines the presence or absence of an abnormality of a surface state in a non-contact manner.SOLUTION: A surface state determination device includes a light source unit that includes a plurality of light sources that irradiate a surface of a measuring object with irradiation light, an imaging unit that images a plurality of beams of reflection light reflected by the measuring object, and a processing unit that acquires image information including a plurality of reflection light images from the imaging unit. The processing unit includes a measurement unit that measures the magnitude of each of the plurality of reflection light images, a comparison unit that generates comparison information by comparing the magnitude of the reflection light images with each other, and a determination unit that determines the presence or absence of an abnormality of a surface state that is generated on the surface of the measuring object on the basis of the comparison information.SELECTED DRAWING: Figure 3

Description

Technical Field

[0001] The present invention relates to a surface state determination device, a surface state determination method, and a surface state determination program for determining the presence or absence of abnormalities in the surface state of a metal.

Background Art

[0002] Conventionally, the gloss of a metal surface has been used for decoration. For example, it is a stainless steel exterior member called a SUS molding attached to a window frame of a vehicle. The SUS molding undergoes a lot of bending in the molding process, and there is a risk of unevenness on the surface of the metal surface, resulting in a defect called whitening. Currently, the quality determination of the surface state of the SUS molding is performed visually by a person, and it is necessary to adjust the determination criteria among the people who visually inspect so that there is no difference in the result of the quality determination depending on the person who visually inspects, and a lot of man-hours may be required.

[0003] Therefore, the inventors of the present case tried to use the technique disclosed in Patent Document 1 for the quality determination of the surface state of the SUS molding. In the technique disclosed in Patent Document 1, by irradiating a measurement object with an optical frequency comb and imaging the reflected light from the surface of the measurement object, it is possible to accurately measure the size, depth, and shape of the surface structure non-contact.

[0004] However, in the technique disclosed in Patent Document 1, when the measurement object is a curved surface, for example, due to a minute deviation in the position where the irradiation light is applied, the reflected light is affected by the position of the curved surface, resulting in problems such as a large change in the measurement result, and it is difficult to set the position of irradiation when irradiating the object with the irradiation light, and there is a risk that the quality determination of the surface state of the measurement object cannot be correctly performed.

Prior Art Documents

Patent Documents

[0005]

Patent Document 1

Summary of the Invention

[0006] Therefore, the objective is to provide a surface condition determination device, a surface condition determination method, and a surface condition determination program that allow for easy setting of the irradiation position when irradiating an object to be measured with light, and that enable easy, non-contact determination of whether or not there are abnormalities in the surface condition. [Means for solving the problem]

[0007] In other words, the surface condition determination device according to the first embodiment comprises a light source unit equipped with a plurality of light sources that irradiate the surface of an object to be measured with irradiation light, an imaging unit that images a plurality of reflected light reflected by the object to be measured, and a processing unit that acquires image information including a plurality of reflected light images from the imaging unit, wherein the processing unit comprises a measurement unit that measures the size of each of the plurality of reflected light images, a comparison unit that compares the sizes of the reflected light images with each other and generates comparison information, and a determination unit that determines whether or not there is an abnormality in the surface condition that has occurred on the surface of the object to be measured based on the comparison information.

[0008] In a second embodiment, the surface condition determination device according to the first embodiment may have the size of the reflected light image be the area of ​​the reflected light image, the vertical dimension of the reflected light image, or the horizontal dimension of the reflected light image.

[0009] A third embodiment is a surface condition determination device according to the second embodiment, wherein the comparison information is the maximum, minimum, or average value of the area of ​​all or some of the multiple reflected light images included in the image information, and the area of ​​the reflected light image may be calculated based on the total number of pixels contained within the contour of the reflected light image, where the pixels adjacent to the white and black pixels on both the top / bottom or left / right sides after converting the reflected light image to a black and white binary using a brightness threshold are defined as the contour of the reflected light image.

[0010] A fourth embodiment is a surface condition determination device according to the second embodiment, wherein the comparison information is the maximum, minimum, or average value of the vertical dimension of all or some of the multiple reflected light images included in the image information, and the vertical dimension of the reflected light image may be calculated based on the difference between the maximum and minimum values ​​on the vertical axis of the contour, when the white and black pixels obtained after converting the reflected light image to a black and white binary using a brightness threshold are defined as the contour of the reflected light image, with the pixels adjacent to the top and bottom or left and right sides of the white and black pixels being used as the contour.

[0011] A fifth embodiment is a surface condition determination device according to the second embodiment, wherein the comparison information is the maximum, minimum, or average value of the width dimension of all or some of the multiple reflected light images included in the image information, and the width dimension of the reflected light image may be calculated based on the difference between the maximum and minimum values ​​on the horizontal axis of the contour, when the white and black pixels obtained after converting the reflected light image to a black and white binary using a brightness threshold are defined as the contour of the reflected light image, with the pixels adjacent to the top / bottom or left / right sides of the white and black pixels being used as the contour.

[0012] A sixth embodiment is a surface condition determination device according to the first embodiment, wherein in the light source unit, the individual light sources of the multiple light sources may be arranged in a grid pattern.

[0013] A seventh embodiment may be a surface condition determination device according to the first embodiment, wherein the device includes a light source moving unit that moves the light source unit in accordance with the shape of the object to be measured, and the processing unit includes a moving control unit that controls the movement of the light source moving unit.

[0014] The eighth aspect is a surface condition determination device according to the first aspect, in which the multiple light sources may be LEDs.

[0015] A ninth embodiment is a surface condition determination device according to the first embodiment, wherein the light source unit may be equipped with a focusing lens that focuses the light emitted from the light source.

[0016] A surface condition determination method according to the tenth embodiment is a surface condition determination method in a surface condition determination apparatus comprising: a light source unit equipped with a plurality of light sources that irradiate the surface of an object to be measured with irradiation light; an imaging unit that images a plurality of reflected light reflected by the object to be measured; and a processing unit that acquires image information including a plurality of reflected light images from the imaging unit, wherein the processing unit performs a measurement step of measuring the size of each of the plurality of reflected light images; a comparison step of comparing the sizes of the reflected light images with each other to generate comparison information; and a determination step of determining whether or not there is an abnormality in the surface condition that has occurred on the surface of the object to be measured based on the comparison information.

[0017] The surface condition determination program according to the 11th embodiment is a surface condition determination program executed by a surface condition determination device comprising: a light source unit equipped with a plurality of light sources that irradiate the surface of an object to be measured with illumination light; an imaging unit that images a plurality of reflected light reflected by the object to be measured; and a processing unit that acquires image information including a plurality of reflected light images from the imaging unit, wherein the processing unit implements a measurement function that measures the size of each of the plurality of reflected light images; a comparison function that compares the sizes of the reflected light images with each other and generates comparison information; and a determination function that determines whether or not there is an abnormality in the surface condition that has occurred on the surface of the object to be measured based on the comparison information. [Effects of the Invention]

[0018] The surface condition determination device, etc., according to this disclosure comprises a light source unit equipped with multiple light sources that irradiate the surface of an object to be measured with light, an imaging unit that images multiple reflected lights reflected by the object to be measured, and a processing unit that acquires image information including multiple reflected light images from the imaging unit, wherein the processing unit comprises a measurement unit that measures the size of each of the multiple reflected light images, a comparison unit that compares the sizes of the reflected light images with each other and generates comparison information, and a determination unit that determines whether or not there is an abnormality in the surface condition on the surface of the object to be measured based on the comparison information, so that even if the object to be measured is a curved surface, the presence or absence of an abnormality in the surface condition can be easily determined without contact. [Brief explanation of the drawing]

[0019] [Figure 1]This is a diagram for explaining the principle used by the surface state determination device according to the present embodiment. [Figure 2] This is a diagram for explaining the principle used by the surface state determination device according to the present embodiment. [Figure 3] This is a diagram showing an overview of the configuration of the surface state determination device according to the present embodiment. [Figure 4] This is a diagram showing the configuration of the surface state determination device according to the present embodiment by functional blocks. [Figure 5] This is an enlarged view of the light source unit according to the present embodiment. [Figure 6] This is a diagram for explaining the reflected light image (black and white binary) according to the present embodiment. [Figure 7] This is a diagram for explaining the first verification experiment related to the surface state determination device according to the present embodiment. [Figure 8] This is a diagram for explaining the second verification experiment related to the surface state determination device according to the present embodiment. [Figure 9] This is a diagram for explaining the second verification experiment related to the surface state determination device according to the present embodiment. [Figure 10] This is a diagram for explaining the second verification experiment related to the surface state determination device according to the present embodiment. [Figure 11] This is a diagram for explaining the third verification experiment related to the surface state determination device according to the present embodiment. [Figure 12] This is a flowchart of the surface state determination program according to the present embodiment.

Mode for Carrying Out the Invention

[0020] (Regarding the configuration of the surface state determination device) The configuration of the surface condition determination device 10 according to this embodiment will be described with reference to Figures 1 to 5. The object to be measured by the surface condition determination device 10 is a metal exterior member, such as one made of stainless steel, which is used for the decoration of structures and gives the structure a texture such as luster characteristic of metal surfaces. In addition to stainless steel, the metal of the exterior member may also include gold, silver, copper, and aluminum.

[0021] In this embodiment, a SUS molding installed around the glass window of an automobile is used as an example of the object to be measured 14. The SUS molding has the function of protecting the glass window and filling gaps in the glass window, and is also required to have a decorative function.

[0022] As shown in Figure 1, the surface condition determination device 10 irradiates the surface of the object to be measured 14 with light 18 from the light source 16a and uses the imaging unit 17 (described later) to image the reflected light 25 (see Figure 2) from the object to be measured 14. The surface condition determination device 10 analyzes the image of the reflected light 25 to determine whether or not there are any abnormalities such as whitening on the surface of the object to be measured 14.

[0023] The principle used by the surface condition determination device 10 to determine whether or not there is an abnormality in the surface condition of the object to be measured 14 will be explained with reference to Figure 2. The irradiated light 18 strikes the surface (reflective surface) of the object to be measured 14 and is reflected. There are generally two types of reflection: specular reflection and diffuse reflection. The reflected light 25 at the reflective surface of the irradiated light 18 includes the characteristics of both specular reflection and diffuse reflection. Specular reflection has the characteristic of suppressing the spread of the direction of the reflected light angle, resulting in almost no spread, while diffuse reflection has the characteristic of having a spread in the direction of the reflected light angle.

[0024] It is known that the ratio of specular reflection characteristics to diffuse reflection characteristics in the reflected light 25 differs depending on the condition of the reflective surface. For reflected light 25 from a glossy and shiny reflective surface like a mirror, the proportion of specular reflection characteristics is large compared to the diffuse reflection characteristics, and the spread of the beam angle is suppressed (see Figure 2(a)). For reflected light 25 from a rough or non-glossy surface of the object being measured 14, the proportion of diffuse reflection characteristics is large compared to the specular reflection characteristics, and the beam angle is spread (see Figure 2(b)).

[0025] The surface condition determination device 10 clarifies the correlation between the size of the reflected light image 26 and the state of the reflective surface, and determines whether or not there is an abnormality in the surface (reflective surface) of the object to be measured 14 by analyzing the reflected light image 26. The reflected light image 26 is an image obtained by capturing the reflected light 25 projected onto the surface (reflective surface) of the object to be measured 14 with the imaging unit 17 described later.

[0026] The surface condition determination device 10 is a so-called information processing device, and can use general-purpose products such as personal computers (hereinafter referred to as PCs), notebook PCs, and tablet PCs, or it may be a dedicated information processing device specialized for surface condition determination. As shown in Figure 3, the surface condition determination device 10 is equipped with a keyboard 11 and a mouse 13 as input devices and a display 12 as an output device.

[0027] As shown in Figure 3, the surface condition determination device 10 is connected to the light source moving unit 15, the light source unit 16, and the imaging unit 17 by wired or wireless data communication. The light source unit 16 and the imaging unit 17 are attached to the tip 15a of the light source moving unit 15. The light source movement unit 15 moves the light source unit 16 to match the shape of the object to be measured 14.

[0028] The light source movement unit 15 is an arm-type robot that moves its tip 15a along the shape of the object to be measured 14, thereby illuminating the entire area of ​​the object to be measured 14 with the light 18 emitted from the light source unit 16 attached to the tip 15a. The imaging unit 17, which is attached to the tip 15a together with the light source unit 16, captures the reflected light 25 from the object to be measured 14 of the emitted light 18. The light source movement unit 15 is controlled by the movement control unit 30, which is configured in the processing unit 20 and will be described later.

[0029] As shown in Figure 4, the surface condition determination device 10 is configured to include a processing unit 20, a Read Only Memory (ROM) 21, a Random Access Memory (RAM) 22, a storage unit 23, an input / output interface 24, and the like. The processing unit 20, ROM 21, RAM 22, storage unit 23, and input / output interface 24 are interconnected by a bus 19, enabling bidirectional data transmission.

[0030] The processing unit 20 consists of a Central Processing Unit (CPU) and other components, and by executing the surface state determination program described later, it controls the functions of the built-in components and realizes the functions of each component.

[0031] The ROM 21 and the storage unit 23 can be used as storage devices, and store the surface condition determination program, various data for using the surface condition determination program, and applications.

[0032] The surface condition determination device 10 stores the surface condition determination program in the ROM 21 or storage unit 23 and loads the surface condition determination program into the main memory, which is composed of RAM 22 or the like. Then, the processing unit 20 accesses the main memory containing the surface condition determination program and executes the surface condition determination program.

[0033] The surface condition determination device 10 is connected to a keyboard 11, display 12, mouse 13, light source moving unit 15, light source unit 16, imaging unit 17, etc., via an input / output interface 24.

[0034] In this embodiment, the light source moving unit 15 employs an arm-type robot, but is not limited to this; various industrial robots, including parallel link robots, vertical articulated robots, horizontal articulated robots (SCARA robots), and Cartesian robots, may also be used.

[0035] The light source unit 16 includes multiple light sources 16a that irradiate the surface of the object to be measured 14 with irradiation light 18. The light source unit 16 will be described with reference to Figure 5. Figure 5 is an enlarged view of the light source unit 16 according to this embodiment. The light source unit 16 is an LED module in which, for example, 42 LEDs that serve as light sources 16a are mounted in a grid of 6 rows x 7 columns. The external dimensions of the light source unit 16 in this embodiment are 30 mm in height and 40 mm in width. The light sources 16a are surface-mount LEDs called chip LEDs, and each white light source has a total luminous flux of 20 lumens.

[0036] Each light source 16a is equipped with a focusing lens (not shown). The focusing lens concentrates the light 18 emitted from the light source 16a. By passing the light 18 through the focusing lens, the spread of the beam angle of the light 18 can be suppressed, and the outline of the reflected light 25 can be made clearer.

[0037] The imaging unit 17 captures multiple reflected lights 25 reflected by the object to be measured 14. In this embodiment, the imaging unit 17 employs a Raspberry Pi® camera module. The imaging unit 17 is directed towards the object to be measured 14 and acquires an image of the reflected light 25 by imaging the portion of the surface of the object to be measured 14 that is illuminated by the irradiated light 18.

[0038] The processing unit 20 acquires image information, including multiple reflected light images 26, from the imaging unit 17. The reflected light image 26 is an image obtained by capturing the reflected light 25 projected onto the surface of the object to be measured 14 with the imaging unit 17. Image information refers to image data obtained each time the imaging unit 17 takes an image, and this image data includes the surface of the object to be measured 14 and multiple reflected light images 26 reflected on that surface.

[0039] The surface condition determination device 10, by executing a surface condition determination program, includes a movement control unit 30, a measurement unit 31, a comparison unit 32, a determination unit 33, and other components in the processing unit 20.

[0040] The movement control unit 30 controls the movement of the light source movement unit 15. The movement control unit 30 controls the movement of the light source movement unit 15 so that the light 18 emitted from the light source unit 16 attached to the tip 15a of the light source movement unit 15 illuminates the entire area of ​​the surface condition to be measured.

[0041] The measuring unit 31 measures the size of each of the multiple reflected light images 26. The size of the reflected light image 26 is the area of ​​the reflected light image 26, the vertical dimension of the reflected light image 26, or the horizontal dimension of the reflected light image 26. The measuring unit 31 uses the area, vertical dimension, or horizontal dimension of the reflected light image 26 as the size of the reflected light image 26.

[0042] The comparison unit 32 compares the sizes of the reflected light images 26 with each other to generate comparison information. The comparison unit 32 generates comparison information by comparing the area, vertical dimension, or horizontal dimension of each of the multiple reflected light images.

[0043] The comparison information is the maximum, minimum, or average value of the area of ​​all or some of the multiple reflected light images 26 included in the image information. The area of ​​the reflected light image 26 is calculated based on the total number of pixels contained within the contour of the reflected light image 27, where the white and black pixels obtained by converting the reflected light image 26 to a black and white binary using a luminance threshold are adjacent to the pixels on both the top / bottom or left / right sides.

[0044] Alternatively, the comparison information is the maximum, minimum, or average value of the vertical dimension of all or some of the multiple reflected light images 26 included in the image information, and the vertical dimension of the reflected light image 26 is calculated based on the difference between the maximum and minimum values ​​on the vertical axis of the contour, when the white and black pixels that are adjacent to the top and bottom or left and right sides of the white and black pixels after the reflected light image 26 has been converted to a black and white binary using a luminance threshold are used as the contour of the reflected light image 27.

[0045] Alternatively, the comparison information is the maximum, minimum, or average value of the width dimension of all or some of the multiple reflected light images 26 included in the image information, and the width dimension of the reflected light image 26 is calculated based on the difference between the maximum and minimum values ​​on the horizontal axis of the contour, when the pixels adjacent to the white and black pixels on both the top / bottom or left / right sides after converting the reflected light image 26 to a black and white binary using a brightness threshold are used as the contour of the reflected light image 27.

[0046] Therefore, when the size of the reflected light image 26 is expressed using the area of ​​the reflected light image 27, the comparison information refers to the maximum, minimum, or average value of the area of ​​all or some of the multiple reflected light images 26 included in the image information.

[0047] Alternatively, when the size of the reflected light image 26 is expressed using the vertical dimension of the reflected light image 27, the comparison information refers to the maximum, minimum, or average value of the vertical dimension of all or some of the multiple reflected light images 26 included in the image information.

[0048] Alternatively, when the size of the reflected light image 26 is expressed using the width dimension of the reflected light image 27, the comparison information refers to the maximum, minimum, or average value of the width dimension of all or some of the multiple reflected light images 26 included in the image information.

[0049] The reflected light image (black and white binary) 27 according to this embodiment will be described with reference to Figure 6. Figure 6 is a diagram for explaining the reflected light image (black and white binary) 27 according to this embodiment. In this embodiment, the image information acquired by the imaging unit 17 is a color image, and after the color image is converted to an 8-bit grayscale image, it is further converted to a black and white binary image (see Figure 6). In the 8-bit grayscale image, a brightness value of 0 is black and a brightness value of 255 is white.

[0050] The grayscale image according to this embodiment is converted to a black and white binary image using a luminance threshold. For example, if the luminance threshold is set to 200, in the grayscale image, pixels with luminance values ​​from 0 to 199 are converted to black pixels (reference numeral 27a in Figure 6), and pixels with luminance values ​​from 200 to 255 are converted to white pixels (reference numeral 27b in Figure 6).

[0051] The reflected light image (black and white binary) 27 is outlined by pixels that are adjacent to the white (labeled 27b in Figure 6) and black (labeled 27a in Figure 6) pixels on both the top / bottom or left / right sides (hatched areas labeled 27c in Figure 6).

[0052] In this embodiment, the area of ​​the reflected light image 27 is calculated based on the total number of pixels contained within the contour 27c, and is expressed in units of pixels.

[0053] Furthermore, the vertical dimension of the reflected light image 27 in this embodiment is calculated based on the difference between the maximum and minimum values ​​on the vertical axis of the contour 27c, and is expressed in pixels.

[0054] Furthermore, the width dimension of the reflected light image 27 in this embodiment is calculated based on the difference between the maximum and minimum values ​​on the horizontal axis of the contour 27c, and is expressed in pixels.

[0055] If the size of the reflected light image 26 is the area of ​​the reflected light image 27, the comparison information can be the maximum, minimum, or average value of the area of ​​all the reflected light images 27 included in the image information.

[0056] Furthermore, if the size of the reflected light image 26 is the area of ​​the reflected light image 27, the comparison information can be the maximum, minimum, or average value of the area of ​​a portion of the multiple reflected light images 27 included in the image information. For example, a portion of the reflected light image 27 can be the maximum, minimum, or average value of the area of ​​a portion of the multiple reflected light images 27 included in the image information that are in a predetermined column or row.

[0057] If the size of the reflected light image 26 is the vertical dimension of the reflected light image 27, the comparison information can be the maximum, minimum, or average value of the vertical dimension of all the reflected light images 27 included in the image information.

[0058] Furthermore, if the size of the reflected light image 26 is the vertical dimension of the reflected light image 27, the comparison information can be the maximum, minimum, or average value of the vertical dimension of a portion of the multiple reflected light images 27 included in the image information. For example, a portion of the reflected light image 27 can be the maximum, minimum, or average value of the vertical dimension of a portion of the multiple reflected light images 27 included in the image information that are in a predetermined column or row.

[0059] If the size of the reflected light image 26 is the width dimension of the reflected light image 27, the comparison information can be the maximum, minimum, or average value of the width dimension of all the reflected light images 27 included in the image information.

[0060] Furthermore, if the size of the reflected light image 26 is the width dimension of the reflected light image 27, the comparison information can be the maximum, minimum, or average value of the width dimension of a portion of the multiple reflected light images 27 included in the image information. For example, a portion of the reflected light image 27 can be the maximum, minimum, or average value of the width dimension of a portion of the multiple reflected light images 27 included in the image information that are in a predetermined column or row.

[0061] The determination unit 33 determines whether or not there is an abnormality in the surface condition of the object to be measured 14 based on the comparison information. The determination unit 33 derives a threshold value used to determine whether or not there is an abnormality in the surface condition of the object to be measured 14, based on a predetermined number of good items, i.e., surface conditions without abnormalities, and compares the comparison information with the threshold value to determine whether or not there is an abnormality in the surface condition of the object to be measured 14.

[0062] If the comparison information is the maximum, minimum, or average value of the area of ​​all or some of the multiple reflected light images 27 included in the image information, the threshold corresponding to this comparison information is derived from the area of ​​the reflected light images 27 of a predetermined number of good products of the object to be measured 14.

[0063] Furthermore, if the comparison information is the maximum, minimum, or average value of the vertical dimension of all or some of the multiple reflected light images 27 included in the image information, the threshold corresponding to this comparison information is derived from the vertical dimension of a predetermined number of good reflected light images 27 of the object to be measured 14.

[0064] Furthermore, if the comparison information is the maximum, minimum, or average value of the width dimension of all or some of the multiple reflected light images 27 included in the image information, the threshold corresponding to this comparison information is derived from the width dimension of a predetermined number of good reflected light images 27 of the object to be measured 14.

[0065] The demonstration experiments relating to the surface condition determination device 10 will be explained with reference to Figures 7 to 11. Figure 7 is a diagram illustrating the first demonstration experiment relating to the surface condition determination device 10 of this embodiment, Figures 8 to 10 are diagrams illustrating the second demonstration experiment relating to the surface condition determination device 10 of this embodiment, and Figure 11 is a diagram illustrating the third demonstration experiment relating to the surface condition determination device 10 of this embodiment.

[0066] The first demonstration experiment relating to the surface condition determination device 10 will be explained with reference to Figure 7. In the first demonstration experiment, the reflected light images (black and white binary) 27 of the reflected light 25 of reflective surfaces with different roughness and the glossiness of the reflective surfaces were compared. The upper part of Figure 7 shows the differences in the roughness of the reflective surfaces, the middle part of Figure 7 shows the differences in the reflected light shape (range of diffused light) of the reflected light images (black and white binary) 27, and the lower part of Figure 7 shows the differences in the glossiness of the reflective surfaces as bar graphs.

[0067] The roughness of the reflective surface was varied by processing the mirror surface using sandpaper with different grit sizes.

[0068] In the upper part of Figure 7, (a) is a mirror-finish reflective surface that has not been processed with a file, (b) is a reflective surface that has been processed to a mirror finish using a #5000 grit file, (c) is a reflective surface that has been processed to a mirror finish using a #2000 grit file, and (d) is a reflective surface that has been processed to a mirror finish using a #1000 grit file.

[0069] The white dashed circle shown in the middle section of Figure 7 represents the outline of the reflected light image (black and white binary) 27, and the vertical dimension of this outline is shown as the diffuse light range 29. From (e) to (h) in Figure 7, it can be seen that the vertical dimension of the reflected light image (black and white binary) 27, which constitutes the diffuse light range 29, increases from the middle section of Figure 7, and that the glossiness of the reflective surface decreases (see (i) to (l) in Figure 7). Therefore, Figure 7 shows that as the glossiness of the reflective surface decreases, the vertical dimension of the reflected light image (black and white binary) 27 increases, indicating a correlation between the glossiness of the reflective surface and the vertical dimension of the reflected light image (black and white binary) 27.

[0070] Next, a second demonstration experiment relating to the surface condition determination device 10 will be described with reference to Figures 8 to 10. In the second demonstration experiment, SUS moldings that had already undergone whitening testing and for which the results had been obtained were used as the object of measurement 14, and two types of defective products and one type of good product that had undergone whitening testing were compared.

[0071] Figure 8 shows the reflected light 25 at (a) measurement position 1, (b) measurement position 2, and (c) measurement position 3 of the object to be measured 14. Measurement position 1 is at the left edge of the object to be measured 14, measurement position 2 is at the center, and measurement position 3 is at the right edge. The top of Figure 8 shows TP1 (×), which is the first defective product in the whitening judgment, the middle of Figure 8 shows TP2 (×), which is the second defective product in the whitening judgment, and the bottom of Figure 8 shows TP3 (○), which is a good product in the whitening judgment.

[0072] Figure 9 shows the reflected light images (black and white) 27 at each of the measurement positions 1 to 3 of TP1 to 3. Figure 9(a) shows the reflected light image (black and white) at measurement position 1, (b) shows the reflected light image (black and white) at measurement position 2, and (c) shows the reflected light image (black and white) at measurement position 3. Figure 10 is a bar graph showing the area of ​​the reflected light images (black and white) 27 shown in Figure 9. Figure 10(a) shows the area of ​​the reflected light image (black and white) at measurement position 1, (b) shows the area of ​​the reflected light image (black and white) at measurement position 2, and (c) shows the area of ​​the reflected light image (black and white) at measurement position 3.

[0073] As can be seen from Figure 10, the area of ​​the reflected light image (black and white binary) 27 of the two types of defective products (TP1 and TP2) is larger than the area of ​​the reflected light image (black and white binary) 27 of the good product (TP3) at all measurement positions 1 to 3. Therefore, in the whitening judgment, it was found that the area of ​​the reflected light image (black and white binary) 27 of the defective product is larger than the area of ​​the reflected light image (black and white binary) 27 of the good product, indicating a correlation between the presence or absence of whitening on the reflective surface and the area of ​​the reflected light image (black and white binary) 27.

[0074] Next, with reference to Figure 11, a third demonstration experiment relating to the surface condition determination device 10 will be described. Figure 11 shows a reflected light image 26 captured from the reflected light 25 of the illumination light 18 from the 42 light sources 16a mounted on the light source unit 16 according to this embodiment. Figure 11(a) displays the reflected light image 26 of a good product for whitening detection, and Figure 11(b) displays the reflected light image 26 of a defective product for whitening detection.

[0075] As can be seen from Figure 11, the vertical dimension and area of ​​the reflected light image 26 were larger for defective products than for good products, indicating a correlation between the presence or absence of whitening on the reflective surface and the vertical dimension and area of ​​the reflected light image 26.

[0076] Based on the first to third demonstration experiments described above, it was confirmed that there is a correlation between the presence or absence of abnormalities (whitening) on ​​the reflective surface and the size of the reflected light images 26 and 27. It was also confirmed that the presence or absence of abnormalities in the surface condition of the object being measured can be determined by analyzing the size of the reflected light image (black and white binary) 27 using the surface condition determination device 10.

[0077] Next, with reference to Figure 12, the surface state determination method in the surface state determination device 10 of this embodiment will be described along with the surface state determination program executed by the surface state determination device 10. Figure 12 is a flowchart of the surface state determination program according to this embodiment.

[0078] As shown in Figure 12, the surface condition determination program includes a movement control step S30, a measurement step S31, a comparison step S32, and a determination step S33, among others. The surface state program is loaded into the main memory, which consists of RAM 22 and other components, and executed by the processing unit 20, which accesses the main memory. The surface state determination program provides the processing unit 20 with functions such as movement control, measurement, comparison, and determination.

[0079] These functions are shown in the order illustrated in Figure 12, but the order is not limited to this, and the surface condition determination program may be executed with the order changed as appropriate. Note that the above-described functions overlap with the descriptions of the movement control unit 30, measurement unit 31, comparison unit 32, and determination unit 33 of the surface condition determination device 10, so a detailed explanation is omitted.

[0080] The movement control function controls the movement of the light source movement unit 15. (S30: Movement control step). The measurement function measures the size of each of the multiple reflected light images (S31: measurement step).

[0081] The comparison function generates comparison information by comparing the sizes of the reflected light images (S32: Comparison step).

[0082] The judgment function determines whether or not there is an abnormality in the surface condition of the object 14 being measured, based on the comparison information (S33: Judgment step).

[0083] According to the surface condition determination device 10 of this embodiment described above, the light source unit 16 and the imaging unit 17 are attached to the tip 15a of the arm-type robot, which is the light source moving unit 15, so that the light source unit 16 and the imaging unit 17 can be moved in accordance with the shape of the object to be measured 14.

[0084] Furthermore, according to the surface condition determination device 10 of this embodiment described above, a commercially available LED module is used for the light source unit 16 and a commercially available camera module is used for the imaging unit 17, which simplifies the configuration of the device for the light source unit 16 and the imaging unit 17.

[0085] Furthermore, according to the surface condition determination device 10 of this embodiment described above, since the light source unit 16 is equipped with a focusing lens, the spreading of the direction of the irradiated light 18 can be suppressed by the irradiated light 18 passing through the focusing lens, and the contour of the reflected light 25 can be made clearer.

[0086] Furthermore, according to the surface condition determination device 10 of this embodiment described above, the light source unit 16 is equipped with a plurality of light sources 16a, and the surface condition of the reflective surface is determined based on a plurality of reflected lights 25. Therefore, the determination result will not change significantly due to a minute shift in the position where the irradiation light 18 is irradiated, making it easy to set the position when irradiating the object to be measured 14 with the irradiation light 18.

[0087] Furthermore, according to the surface condition determination device 10 of this embodiment described above, the surface condition of the reflective surface is determined by irradiating the object to be measured 14 with irradiation light 18 and analyzing the reflected light 25. Therefore, the surface condition of the reflective surface can be determined without contacting the object to be measured 14.

[0088] This disclosure is not limited to the surface condition determination device 10, surface condition determination method, and surface condition determination program according to the embodiments described above, and can be implemented in various other modifications or applications without departing from the gist of this disclosure as described in the claims. [Explanation of symbols]

[0089] 10 Surface condition determination device 11-key keyboard 12 displays 13 mice 14. Object to be measured 15. Light source movement unit (arm-type robot) 15a Tip 16 Light source section 16a Light source (LED) 17 Imaging Unit 18 Irradiation light 19 bus 20 Processing Units 21 ROM 22 RAM 23 Memory section 24 Input / Output Interfaces 25 Reflected light 26 Reflected light image 27. Reflected light image (black and white binary) 27a Black 27b white 27c contour 28 Image Information 29. Range of diffused light 30 Mobile Control Unit 31 Measuring part 32 Comparison Section 33 Judgment section

Claims

1. A light source unit is mounted on the surface of the object to be measured, with multiple light sources arranged in a grid pattern of multiple rows and multiple columns, and the light source unit is mounted within the external dimensions. An imaging unit that captures multiple reflected lights reflected by the object to be measured, A processing unit that acquires image information including multiple reflected light images from the imaging unit, A surface condition determination device comprising, The aforementioned processing unit, A measuring unit that measures the size of each of the multiple reflected light images, A comparison unit that compares the sizes of the reflected light images and generates comparison information, A determination unit that determines whether or not there is an abnormality in the surface condition of the object to be measured on the surface of the object to be measured based on the comparison information, A surface condition determination device characterized by comprising the following:

2. The surface condition determination device according to Claim 1, characterized in that the light source unit comprises a total of 42 light sources, each light source arranged in a grid pattern of 6 rows x 7 columns, and has external dimensions of 30 mm in height and 40 mm in width.

3. The surface condition determination device according to Claim 1, characterized in that, in the light source section, the plurality of light sources are arranged in a grid pattern with the distance between the centers of adjacent light sources being greater than the external dimensions of each of the light sources.

4. The surface condition determination device according to claim 1, characterized in that the size of the reflected light image is the area of ​​the reflected light image, the vertical dimension of the reflected light image, or the horizontal dimension of the reflected light image.

5. The comparison information is the maximum, minimum, or average value of the area of ​​all or some of the multiple reflected light images included in the image information. The surface condition determination device according to claim 4, characterized in that the area of ​​the reflected light image is calculated based on the total number of pixels contained within the contour of the reflected light image, where the pixels adjacent to the white and black pixels on both the top / bottom or left / right sides after converting the reflected light image to a black / white binary value using a luminance threshold are defined as the contour of the reflected light image.

6. The comparison information is the maximum, minimum, or average value of the vertical dimension of all or some of the multiple reflected light images included in the image information. The surface condition determination device according to claim 4, characterized in that the vertical dimension of the reflected light image is calculated based on the difference between the maximum and minimum values ​​on the vertical axis of the contour, when the pixels adjacent to the white and black pixels on both the top / bottom or left / right sides after the reflected light image has been converted to a black and white binary value using a luminance threshold are defined as the contour of the reflected light image.

7. The comparison information is the maximum, minimum, or average value of the width dimension of all or some of the multiple reflected light images included in the image information. The surface condition determination device according to claim 4, characterized in that the width dimension of the reflected light image is calculated based on the difference between the maximum and minimum values ​​on the horizontal axis of the contour, when the pixels adjacent to the white and black pixels on both the top / bottom or left / right sides after the reflected light image has been converted to a black and white binary value using a luminance threshold are defined as the contour of the reflected light image.

8. The light source unit is further equipped with a light source movement unit that moves the light source unit to match the shape of the object to be measured. The processing unit includes a movement control unit that controls the movement of the light source moving unit. The surface condition determination device according to feature 1.

9. The surface condition determination device according to claim 1, characterized in that the plurality of light sources are LEDs.

10. The surface condition determination device according to claim 1, characterized in that the light source unit comprises a focusing lens for focusing the irradiated light from the light source.

11. A light source unit is mounted on the surface of the object to be measured, with multiple light sources arranged in a grid pattern of multiple rows and multiple columns, and the light source unit is mounted within the external dimensions. An imaging unit that captures multiple reflected lights reflected by the object to be measured, A processing unit that acquires image information including multiple reflected light images from the imaging unit, A surface condition determination method in a surface condition determination apparatus comprising: The aforementioned processing unit, A measurement step of measuring the size of each of the plurality of reflected light images, A comparison step of comparing the sizes of the reflected light images to each other to generate comparison information, A determination step of determining whether or not there is an abnormality in the surface condition of the object to be measured on the surface of the object to be measured based on the comparison information, A surface condition determination method characterized by performing the following.

12. A light source unit is mounted on the surface of the object to be measured, with multiple light sources arranged in a grid pattern of multiple rows and multiple columns, and the light source unit is mounted within the external dimensions. An imaging unit that captures multiple reflected lights reflected by the object to be measured, A processing unit that acquires image information including multiple reflected light images from the imaging unit, A surface condition determination program executed by a surface condition determination device comprising: In the aforementioned processing unit, A measurement function for measuring the size of each of the aforementioned multiple reflected light images, A comparison function that generates comparison information by comparing the sizes of the reflected light images, A determination function that determines whether or not there is an abnormality in the surface condition of the object to be measured, based on the comparison information, A surface condition determination program characterized by achieving this.

Images