Contact probe
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- YOKOWO CO LTD
- Filing Date
- 2021-10-08
- Publication Date
- 2026-06-11
Smart Images

Figure 0007873171000001 
Figure 0007873171000002 
Figure 0007873171000003
Abstract
Claims
1. A barrel having a hollow space, A first plunger having a tip and a base, A spring that biases the first plunger, Equipped with, The surface of the tip portion and the surface of the base portion are formed of different metal materials. The base end is always located within the hollow space of the barrel and is electrically connected to the barrel by the sliding of the first plunger by the spring. The first plunger has a palladium alloy base material or inner layer, A contact probe in which the surface of the base end is a low-contact-resistance outermost layer formed by a surface treatment of electroplating or hot-dip plating with gold on the base material or inner layer of the palladium alloy, and the outermost layer contacts the barrel and is electrically connected.
2. The aforementioned tip portion is no more than 0.1 mm in size from the tip. The contact probe according to claim 1.
3. The base end has the outermost layer of gold, The tip portion is such that the base material or the inner layer of palladium alloy is exposed. The contact probe according to claim 1 or 2.
4. The second plunger that contacts the test substrate, Furthermore, The spring biases the first plunger and the second plunger in a direction that separates them from each other. A contact probe according to any one of claims 1 to 3.