Waveguide connector for Blindmate electrical connection

Abstract

An exemplary waveguide connector is for making a blind-mate electrical connection between a first waveguide and a second waveguide. The waveguide connector includes a male portion connected to a first waveguide including a first conductive channel and a female portion connected to a second waveguide including a second conductive channel. The female portion includes a receiving portion into which the male portion slides to provide a blind-mate electrical connection between the first conductive channel and the second conductive channel. A self-aligning feature is on at least one of the male portion or the female portion. The self-aligning feature is configured to guide the male portion into the receiving portion while correcting for misalignment between the male portion and the female portion.

Description

Technical Field

[0001] This specification relates to an exemplary waveguide connector for making a blind mate electrical connection between two waveguides.

Background Art

[0002] Conventional copper conductors may not be the best way to transmit high - frequency signals. Waveguides can transmit such signals more accurately over a wider frequency range. One exemplary waveguide includes a structure that guides energy transmission in one direction.

Summary of the Invention

Means for Solving the Problems

[0003] One exemplary waveguide connector is for making a blind mate electrical connection between a first waveguide and a second waveguide. This waveguide connector includes a male part connected to a first waveguide including a first conductive channel and a female part connected to a second waveguide including a second conductive channel. The female part includes a receiving part into which the male part slides to effect a blind mate electrical connection between the first conductive channel and the second conductive channel. An auto - alignment mechanism is in at least one of the male part or the female part. The auto - alignment mechanism is configured to guide the male part into the receiving part while correcting misalignment between the male part and the female part. The waveguide connector may include one or more of the following features alone or in combination.

[0004] The conduit connector may include a conductor between the male part and the female part to form an electrical connection between the first conductive channel and the second conductive channel. The conductor may include a conductive elastomer material and / or a flexible disk spring. The conductor may be disk - shaped and may have a central aperture configured to align with the first conductive channel and the second conductive channel.

[0005] A waveguide connector may include a first conductive joint for forming an electrical connection between a male part and a first waveguide, and a second conductive joint for forming an electrical connection between a female part and a second waveguide. The male part may include a substantially rectangular hollow cavity for housing a portion of the first waveguide. The first waveguide may have a substantially rectangular cross-section. The female part may include a substantially rectangular hollow cavity for housing a portion of the second waveguide. The second waveguide may have a substantially rectangular cross-section. The male part may include a substantially circular hollow cavity for housing a portion of the first waveguide. The first waveguide may have a substantially circular cross-section. The female part may include a substantially circular hollow cavity for housing a portion of the second waveguide. The second waveguide may have a substantially circular cross-section.

[0006] The self-aligning mechanism may include an alignment mechanism on the male part and a guide channel on the female part. The guide channel may be configured to receive the alignment mechanism. The alignment mechanism and the guide channel may be at a shared rotational angle about a central axis, so that when the guide channel receives the alignment mechanism, the cross section of the first waveguide is rotationally aligned with the cross section of the second waveguide. The cross sections of the first waveguide and the second waveguide may each be non-circular. The male and female parts may each contain a conductive material. The conductive material may include one or more of silver-plated copper or gold-plated brass. The waveguide connector may include an alignment spring connected to the female part. The alignment spring may be configured to contact the male part and align the male and female parts when a blind-mate electrical connection is made. The first waveguide and the second waveguide may be flexible and configured to bend in one or more dimensions.

[0007] An exemplary test system includes a device interface board (DIB) configured to hold a device under test (DUT), test equipment including an RF test instrument for transmitting a radio frequency (RF) signal to one or more DUTs for testing, a first waveguide between the RF test instrument and the DIB, a second waveguide between the DIB and the DUT, and a connector for making a blindmate electrical connection between the first waveguide and the second waveguide. At least a portion of the connector may be mounted on the DIB. The connector includes a male part connected to the first waveguide, which includes a first conductive channel, and a female part connected to the second waveguide, which includes a second conductive channel. The female part may include a receptacle into which the male part slides in, resulting in a blindmate electrical connection between the first conductive channel and the second conductive channel. The connector also includes a self-aligning mechanism in at least one of the male or female parts. The self-aligning mechanism is configured to guide the male part into the receptacle while correcting any misalignment between the male and female parts. The test system may include one or more of the following features individually or in combination:

[0008] The misalignment between the male and female parts may include at least one of the pitch misalignment around the central axis of the first or second waveguide, the yaw misalignment around the central axis of the first or second waveguide, or the roll misalignment around the central axis of the first or second waveguide. The system may include a test head for holding the test equipment. The DIB may be mounted on the test head. The blindmate electrical connection may be located within the test head. The first and second waveguides may be flexible and configured to bend in one or more dimensions.

[0009] The test system may include a first coaxial cable for electrically connecting the test equipment to a first waveguide and a first antenna system for converting between electromagnetic transverse wave (TEM) signals on the first coaxial cable and electrical transverse wave (TE) signals on the first waveguide. The test system may also include a second coaxial cable for electrically connecting the DUT to a second waveguide and a second antenna system for converting between TE signals on the first waveguide and TEM signals on the second coaxial cable.

[0010] Waveguide connectors may include a conductor between the male and female parts to form an electrical connection between a first conductive channel and a second conductive channel. The conductor may include a conductive elastomer material. The conductor may be substantially disc-shaped and may include a central opening configured to align with the first and second conductive channels. The conductor may include a flexible disc spring.

[0011] The test system may include a first conductive joint for forming an electrical connection between a male connector and a first waveguide, and a second conductive joint for forming an electrical connection between a female connector and a second waveguide. The male connector may include a substantially rectangular hollow cavity for housing a portion of the first waveguide. The first waveguide may have a substantially rectangular cross-section. The female connector may include a substantially rectangular hollow cavity for housing a portion of the second waveguide. The second waveguide may have a substantially rectangular cross-section.

[0012] The self-aligning mechanism may include an alignment mechanism on the male part and a guide channel on the female part. The guide channel may be configured to receive the alignment mechanism. The alignment mechanism and the guide channel may have a shared rotation angle about a central axis, so that when the guide channel receives the alignment mechanism, the cross-section of the first waveguide is rotationally aligned with the cross-section of the second waveguide. The cross-sections of the first waveguide and the second waveguide may each be non-circular. The male part may include a substantially circular hollow cavity for housing a portion of the first waveguide. The first waveguide may have a substantially circular cross-section. The female part may include a substantially circular hollow cavity for housing a portion of the second waveguide. The second waveguide may have a substantially circular cross-section.

[0013] The first and second waveguides may be filled with dielectric plastic material. The male and female parts may include a conductive material. The conductive material may include at least one of silver-plated copper or gold-plated brass. The connector may include an alignment spring connected to the female part. The alignment spring may be configured to contact the male part when a blind-mate electrical connection is made, thereby aligning the male and female parts axially.

[0014] Combining two or more of the features described herein, including this summary section, may form implementations not explicitly stated herein.

[0015] At least part of the test systems described herein may be configured or controlled by executing instructions stored in one or more non-temporary machine-readable storage media on one or more processing units. Examples of non-temporary machine-readable storage media include read-on memory, optical disc drives, memory disk drives, and random-access memory. At least part of the systems and technologies described herein may be configured or controlled using a computing system comprising one or more processing units and memory storing instructions executable by one or more processing units to perform various control operations. The systems, technologies, components, structures and their variations described herein may be configured, for example, through design, construction, sizing, shape, arrangement, installation, programming, operation, starting, stopping, and / or control.

[0016] Details of one or more implementation configurations are shown in the attached drawings and the following description. Other features and advantages will become apparent from the description, drawings, and claims. [Brief explanation of the drawing]

[0017] [Figure 1] This is a block diagram of an exemplary system using waveguide connectors. [Figure 2] This is a perspective view of an exemplary waveguide connector. [Figure 3] This is an exemplary perspective view of a waveguide connector showing its cut components, namely the socket and plug. [Figure 4] Another example is a cross-sectional view of a waveguide connector. [Figure 5] Figure 3 shows a cross-sectional view of the waveguide connector with the socket and plug not connected. [Figure 6] Figure 3 is a cross-sectional view of the waveguide connector showing its socket and plug, which are completely separated in the axial direction. [Figure 7] Figure 3 is a cross-sectional view of the waveguide connector showing the socket and plug partially connected. [Figure 8] This is a perspective view of an exemplary waveguide connector. [Figure 9] FIG. 1 is a block diagram of an exemplary test system that may include a waveguide connector assembly similar to those of FIGS. 1-8. DETAILED DESCRIPTION OF THE INVENTION

[0018] Like reference numerals between the drawings indicate like elements.

[0019] Exemplary waveguides include a structure that restricts the transmission of energy (waves) in one direction. In this specification, an exemplary waveguide connector and variations thereof for making a blind mate electrical connection between two waveguides, each including a conductive channel for transmitting an electromagnetic wave, are described. The waveguide connector includes a male portion, which is referred to herein as a plug and is connected to a first one of the waveguides. The waveguide connector also includes a female portion, which is referred to herein as a socket and is connected to a second one of the waveguides. The socket includes a receiving portion into which the plug slides to effect a blind mate electrical connection between the first and second conductive channels. A group of self-aligning mechanisms are included in the plug, the socket, or both the plug and the socket. The self-aligning mechanism can be configured to guide the plug into the receiving portion while correcting for X-Y-roll-pitch-yaw misalignment of the plug and socket.

[0020] Exemplary blind mate electrical connections can be implemented using the aforementioned slide operation that can be performed without the use of tools in some cases. The mating of such connections is blind in that it has a unique tolerance such that the connector can be mated by inserting the entire unit or module that includes the connector. Thus, the individual connectors can be mated even if not visible to the technician. The self-aligning mechanisms included in the exemplary waveguide connectors and variations thereof (collectively referred to herein as "waveguide connectors") described herein enable such blind mating of the waveguides. Blind mate waveguides can be advantageous in a variety of different systems including, but not limited to, test systems.

[0021] In this regard, the signal loss per meter at a specific frequency of the waveguide is smaller than that of a coaxial cable or other wired transmission medium. For example, the loss of the waveguide can be in the low single digits of decibels (dB) per meter, while the loss of a coaxial cable can be 20 dB to 30 dB at a similar frequency. In some examples, the waveguide can be configured to transmit signals at frequencies from 90 gigahertz (GHz) to 140 GHz, but the systems described herein are not limited to this frequency range. Due to its low loss and high-frequency transmission range, the waveguide can be used in testing high-speed electronic devices. For example, a test system configured to test high-frequency (RF) or millimeter-wave (mm-wave) devices may be advantageous to use a waveguide. In this regard, in one exemplary definition, the frequency range of an RF signal is from about 20 kilohertz (KHz) to about 300 GHz. In one exemplary definition, the frequency range of an mm-wave signal is from about 30 GHz to about 300 GHz. However, the definitions of RF and mm-wave can vary over time and by region. Therefore, the signals referred to as RF or mm-wave in this document are not limited to the numerical ranges of frequencies described above.

[0022] By incorporating a blind mate function into the waveguide connector, it may be possible to use the waveguide in test situations where its use may not have been possible before. As a result, the signal loss or other degradation that occurs during testing can be reduced, especially when the test signal source is far from the device under test (DUT), for example, more than 1 meter away from it.

[0023] Figure 1 is a block diagram showing a system 100 in an exemplary implementation, which includes a waveguide connector 102, as described above, for carrying waves, such as electrical signals, between devices 104a and 104b. Connector 102 is part of the connection between the first waveguide 106a and the first device 104a and between the second waveguide 106b and the second device 104b. In some examples, the first device 104a may be or include a test device, and the second device 104b may be or include a DUT, but the system in Figure 1 is not limited to these devices. Additionally, the connection may include coaxial or other transmission media. For example, there may be a coaxial cable between each waveguide and each device. Connector 102 includes a plug 108a (male) and a socket 108b (female). The connection between waveguides 106a and 106b (collectively 106) is completed when the plug and socket are electrically and physically connected.

[0024] Figure 2 shows an exemplary implementation of the waveguide connector 102. The waveguide connector 102 includes a plug 108a and a socket 108b, which mate together to form an electrical connection between the first and second waveguides 106a and 106b. Each of the plug 108a and the socket 108b includes a self-aligning mechanism having a complementary shape for forming a blind-mate connection. See also Figure 3, the self-aligning mechanism of the plug 108a includes a rectangular projection 502. In this example, the self-aligning mechanism of the socket 108b includes a guide channel 504 for receiving the rectangular projection 502 when the plug 108a and the socket 108b are connected. In this regard, when the plug 108a is connected to the socket 108b, the connector 102 provides an electrical connection between the waveguides 106a and 106b. This electrical connection allows electrical signals transmitted as waves to travel between the waveguides 106a and 106b. To this end, as described later, both the plug 108a and the socket 108b contain conductive material to support the electrical connection between waveguides 16a and 106b when connected. For example, each of the plug 108a and the socket 108b may be formed entirely or partially from a conductive material such as silver-plated copper or gold-plated brass.

[0025] As shown in Figure 3, the plug 108a is configured to fit into the socket 108b and is made, for example, of such size and shape. The socket 108b includes a receiving portion 506, i.e., a “main channel”, configured to receive the body portion 108c of the plug 108a, and a guide channel 504 configured to receive a rectangular projection 502 on the body portion 108c. In this example, the rectangular projection 502 and the guide channel 504 constitute the roll axis self-alignment mechanism of the connector 102 as described above. In this regard, the guide channel 504 is configured to receive the rectangular projection 502 when the parts 108a and 108b are rotated and axially aligned, as shown in Figure 2.

[0026] The rectangular projection 502 and the guide channel 504 are configured with tolerances so that precise mating is not required to connect them, and may be of such size and shape as follows: For example, the rectangular projection 502 and the guide channel 504 may have slightly rounded edges and / or angled edges at their connection point, thereby allowing the rectangular projection 502 and the guide channel 504 to mate without precise axial and rotational alignment. In other examples, the guide channel 504 may be slightly larger than the rectangular projection 502, thereby allowing the rectangular projection 502 and the guide channel 504 to mate without precise axial and rotational alignment. In some examples, combinations of such features allow mating even if the plug and socket have rotational and / or axial misalignments of 1%, 2%, 3%, 4%, or 5% or more.

[0027] In this regard, for example, misalignments of yaw, pitch, or roll degrees of freedom can be automatically corrected during the connection process by the features of the connector 102 described herein. By correcting any misalignment between connector parts 108a and 108b, and thus, as will be described in more detail herein, waveguides 106a and 106b will be ensured to be properly aligned and connected after the plug 108a and socket 108b are mated. The ability to perform blind-mate connections between waveguides 106a and 106b can be particularly advantageous when many waveguide connections are used, for example, when numerous waveguide connections are made between two devices.

[0028] Figure 4 shows longitudinal cross-sectional views of different mounting configurations of the connector 102 along line 110 in Figure 2. Figure 5 shows a perspective cross-sectional view of the waveguide connector 102 with the plug and socket and, accordingly, the waveguide detached. In the examples of Figures 4 and 5, each waveguide 106 (106a, 106b) includes multiple layers. Each waveguide 106 includes a conductive channel 202. The conductive channel 202 may be made of or include a conductive material such as copper. The conductive channel 202 also includes a dielectric material 204 such as air, which fills the conductive channel entirely or partially. An inner liner 206 is placed between the conductive channel and the dielectric material 204 on the inner surface of the conductive channel 202. An outer sheath 208 is outside the conductive channel 202 and protects the conductive channel. In some examples, the inner liner 206 and outer sheath 208 may be or include a dielectric material such as plastic. In some examples, solid structures are wrapped with liner 202 instead of liner 206. In this configuration, the solid structure can be made from a material with extremely low tangent loss, such as ePTFE (stretched polytetrafluoroethylene).

[0029] As shown in Figures 2 and 4, the first waveguide 106a is fitted into the hollow cavity 131 located in the center of the plug 108a. The second waveguide 106b is fitted into the hollow cavity 132 located in the center of the socket 108b. As previously stated, the socket 108b is configured to receive the plug 108a, thereby aligning and electrically connecting the waveguides 106. As shown in Figure 4, the connector 102 includes a conductor 302, for example, a conductive elastomer material, which electrically connects the conductive channel 202 to assist and / or establish the electrical connection between the waveguides 106 (the conductor 302 replaces the spring 702 in Figure 3). In some implementation configurations, a portion of the plug 108a is positioned between the conductive channel 202 of the first waveguide 106a and the conductor, while a portion of the socket 108b is positioned between the conductive channel 202 of the second waveguide 106b and the conductor 302. Additionally or alternatively, as shown in Figure 5, the plug 108a and socket 108b may include a pocket 402 near their respective waveguides 106. The pocket 402 runs along the periphery of the conductive channel 202. The pocket 402 can be filled with conductive paste or solder to assist and / or establish an electrical connection between the conductive channel 202 and the conductor 302. For example, a solder preform or solder paste may be introduced into the gap 402 (Figure 5) and heated to melt it. After the heated solder cools, the resulting structure forms a permanent conductive joint. In this way, the conductive channels 202 are electrically interconnected, thereby enabling the transmission of waves between waveguides 106a and 106b through the connector 102.

[0030] Figures 6 and 7 show cross-sections of the connector 102 when the waveguide 106 is being connected by sliding the plug 108a into the socket 108b. Figure 6 shows the connector 102 at a point where the waveguide 106 is completely separated. Figure 7 shows the connector 102 with part of the plug 108a inside the socket 108b, but the connection is not yet complete. The final completed connection between the waveguides 106 is shown in Figures 2 and 4. The socket 108b includes a receiving portion 506, which is configured to receive the cylindrical end of the plug 108a and is made, for example, of such size and shape. The end of the socket 108b may include an inclined edge portion 508, which may serve to align these parts by assisting in directing the end of the plug 108a into the receiving portion 506. The end of the plug 108a includes a self-aligning mechanism 502, i.e., a tab, which is configured to be received inside a guide channel 504 formed by the end of the socket 108b. As already explained, the guide channel 504 functions as a self-aligning mechanism. Generally, the self-aligning mechanism 502 and the guide channel 504 are positioned at a shared rotational position for their respective parts 108a and 108b. When connection is made, the plug 108a and socket 108b may move toward each other in the axial direction, for example along the X-axis 144. In some implementations, only one of the plug or socket may move during connection.

[0031] In some implementations, the conductor 302 between waveguides may be a disk-shaped conductive structure as shown in the figure, having a central opening positioned around the centers of waveguides 106a and 106b. The conductor 302 can initially be fixed to the surface within the receiving portion 506 at the end of socket 108b. By fixing the conductor 302 to socket 108b, the conductor 302 is positioned between waveguides 106a and 106b when the plug and socket are coupled.

[0032] In some implementations, the waveguide used with the connector 102 may have a circular cross-section. In the example shown in the figure, the waveguide 106 has a substantially rectangular cross-section. In these examples, the waveguide 106 is connected so as to be rotationally aligned at a shared rotational position around a longitudinal central axis X (Figure 6), for example. To achieve this, the alignment mechanism 502 and the guide channel 504 are at the same rotational position around the central axis X during connection. Thus, the alignment mechanism 502 protrudes from the outer circumference of the end of the plug 108a and has a width such that it cannot be received within the receiving portion 506 unless the alignment mechanism 502 is rotationally aligned with the notch formed by the guide channel 504.

[0033] During the connection process, when plug 108a and socket 108b come into contact, they rotate relative to each other so that the guide channel 504 receives the mechanism 502. At this point, waveguides 106a and 106b are properly rotated and aligned, with socket 108b receiving plug 108a. Waveguides 106a and 106b are also in a shared rotational position, and as the alignment mechanism 502 and guide channel 504 rotate and align, waveguides 106a and 106b are also rotated and align. Such a connection ensures alignment between waveguides 106 after plug 108a and socket 108b are connected. In some examples, waveguide 106 is flexible and can bend in one or more dimensions, facilitating operation during the connection process.

[0034] In one example, when the plug 108a and socket 108b are pressed against each other, the axial rotation of the plug 108a and socket 108b causes the projection 502 to be received by the guide channel 504, resulting in blind mate between the plug 108a and socket 108b. At this point, the plug 108a and socket 108b are physically connected to each other as described above, and the waveguides 106 are aligned even though their cross-sections are not circular. The projection 502 positioned within the guide channel 504 also prevents roll misalignment around the central axis X after the connection is formed. Furthermore, once connected, the end of the plug 108a is securely seated within the cylindrical receiving portion 506 of the socket 108b, completely preventing pitch or yaw misalignment.

[0035] Referring again to Figure 3, in some implementations, the waveguide connector 102 may include multiple springs 702. The springs 702 are an alternative method for creating the necessary electrical path between 108a and 108b. In this example, the springs 702 are flexible and engage with the end of plug 108a during connection. Therefore, even if there is a small pitch or yaw misalignment after components 108a and 108b are mated, the springs 702 can provide an electrical connection around the entire outside of waveguides 106a and 106b. In this regard, in this configuration, an electrical path is created between the conductive channel 202 in 106a and the conductive channel 202 in 106b, which is as continuous as possible (see Figure 7). Any obstruction in this path can cause signal loss.

[0036] Referring to Figure 8, another exemplary waveguide connector 802 is shown. Waveguide connector 802 is substantially the same as the waveguide connector of Figure 4, but differs in other respects as illustrated and described herein. In particular, waveguide connector 802 includes different self-aligning mechanisms in plug 808a and socket 808b. On plug 808a, connector 802 includes a self-aligning mechanism 804 in the shape of a cylindrical projection extending radially outward from the side wall of plug 808a. Correspondingly, socket 808b includes a guide channel 806 of a size and shape to receive the self-aligning mechanism 804 while preventing axial rotation of parts 808a and 808b. One advantage of the self-aligning mechanism 804 may be that it is a simple cylindrical shape which can be easily manufactured using known manufacturing techniques and added to plug 808a.

[0037] The exemplary waveguide connectors described herein may be used in a test system such as the Automated Test Apparatus (ATE) 900 shown in Figure 9. The ATE 900 includes a test head 902 and a control system 904. The control system may include a computing system, which includes one or more microprocessors or other suitable processing devices described herein. In Figure 9, the dashed lines conceptually represent possible signal paths between components of the test system.

[0038] The ATE 900 may include a printed circuit board (PCB) that holds the device to be tested. The PCB is a device interface board (DIB) 906. The DIB 906 is directly or indirectly connected to the test head 902 and includes mechanical and electrical interfaces with one or more devices under test (DUTs) being tested or being tested by the ATE 900. For this purpose, the DIB 906 includes points 908 to which the DUTs can be connected, which may include pins, ball grid arrays (BGAs), conductive traces, or other electrical and mechanical connection points. Test signals, response signals, voltage signals, and other signals pass through test channels to points between the DUTs and the test equipment. The DIB 906 may also include connectors, conductive traces, and other electronic circuit configurations for routing signals between the test equipment, the DUTs connected to points 908, and other circuit configurations.

[0039] The control system 904 communicates with the components of the test head 902 to control the test. For example, the control system 904 may download a set of test programs to the test instruments 912A to 912N (collectively referred to as 912) within the test head 902. One or more of the test instruments 912 may be located outside the test head. The test instruments 912 include hardware devices, which may include one or more processing units and other circuit configurations, such as pattern generators, waveform generators, pin electronic components and / or parameter measurement units (PMUs). The test instruments 912 may execute the set of test programs to test the DUT that communicates with the test instruments 912. The control system 904 may also transmit commands, test data and / or other information to the test instruments 912 within the test head 902 that can be used by the test instruments 912 to perform appropriate tests on the DUT that interfaces with the DIB 906. The tests may be performed under different temperature conditions. In some implementations, this information may be transmitted via a computer or other type of network, or via a direct electrical path. In some implementations, this information may be transmitted via a local area network (LAN) or a wide area network (WAN).

[0040] The test program generates a test flow (set of instructions) to be provided to the DUT. The test flow is written to output signals to elicit a response from the DUT, for example. The test flow may be written to output signals including radio frequency (RF) or other radio signals, receive a response to these signals from the DUT, analyze this response to determine whether the device has passed or failed the test.

[0041] In some implementations, one or more test devices 912 may be connected to the DIB 906 through a waveguide assembly 914 as described herein. Waveguides may be connected using waveguide connectors, examples of which include waveguide connectors 102 or 802 as described herein. For example, test device 912A may emit an RF signal to the DIB 906, which may be transmitted through a waveguide assembly 914 having the configuration shown in Figures 1-8. Waveguide connector 102 may be at least partially attached to DIB 906 to connect to a first waveguide such as 106a along the path between the test equipment 912 and DIB 906, and to a second waveguide such as 106b along the path between DIB 906 and DUT. Waveguide connector 102 connects to interface board 910. It's fine to have it. It is connected to a first waveguide such as 106a along the path to the test equipment, and to a second waveguide such as 106b along the path to the DIB.

[0042] In some implementations, a first coaxial cable or other wired transmission line is located between the test equipment and the first waveguide, and a second coaxial cable or other wired transmission line is located between the DIB and the second waveguide. The first antenna system converts between electromagnetic transverse wave (TEM) signals on the first coaxial cable or other wired transmission line and electrical transverse wave (TE) waves on the first waveguide. The second antenna system converts between TEM signals on the second coaxial cable or other wired transmission line and TE waves on the second waveguide. In some implementations, waveguide connectors 102 and 802 may also be used to complete the connections between waveguides within the test head 902.

[0043] As mentioned above, the ATE 900 in Figure 9 includes multiple test instruments 912, each of which may be configured to perform one or more tests and / or other functions as needed. Although only four test instruments 912 are shown, the system may include any appropriate number of test instruments, including those located outside the test head 902. In some implementations, one or more test instruments 912 may be configured to output microwave, RF, or mm wave signals for testing the DUT based on data provided, for example, by a control system, and to receive response signals from the DUT. Different test instruments 912 may be configured to perform different types of tests and / or to test different DUTs. Received signals may include response signals based on test signals and / or signals emitted from the DUT that are not prompted by (e.g., not responses to) test signals. In some implementations, there may be coaxial cables and / or other signal transmission lines between the DUT, DIB 906, and the test instrument interface, through which test and response signals are transmitted.

[0044] Signals may be transmitted to and received from the DUT through multiple test channels. Each of these test channels may include one or more signal transmission lines or other wired or wireless transmission media. In some examples, a test channel may be defined by one or more physical transmission media through which signals are transmitted from the test equipment 912 to the DUT and through which signals are received from the DUT. In some examples, a test channel may be defined by the frequency range through which signals are transmitted on one or more physical transmission media. A test channel may include conductive traces on the DIB.

[0045] All or part of the test systems and processes described herein, and their various variations, may be comprised of or controlled at least partially by one or more computers or one or more information carriers, such as one or more non-temporary machine-readable storage media, and one or more computer programs embodied in substance. The computer programs may be written in any form of programming language, including compiled or interpreted languages, and may be deployed in any form, such as a standalone program, a module, a part, a subroutine, or other unit suitable for use in a computing environment. The computer programs may be deployed to run on one computer, or on multiple computers located in one place or distributed across multiple locations and interconnected by a network.

[0046] The operations relating to configuring or controlling the voltage sources, test systems, and processes described herein may be performed by one or more programmable processors that run one or more computer programs to control all or some of the aforementioned well-forming operations. All or part of the test systems and processes may be configured or controlled by dedicated logic circuit configurations, such as FPGAs (Field-Programmable Gate Arrays) and / or ASICs (Application-Specific Integrated Circuits).

[0047] Processors suitable for executing computer programs include, for example, one or more processors of any kind, both general-purpose and dedicated microprocessors, and digital computers. Generally, a processor receives instructions and data from read-only storage, random-access storage, or both. The elements of a computer include one or more processors for executing instructions and one or more storage devices for storing instructions and data. Generally, a computer includes or may be operationally coupled to one or more machine-readable storage media for storing data, such as magnetic, magneto-optical disks, or optical disks, and may also receive data from or transmit data to or both. Non-temporary, machine-readable media suitable for realizing computer program instructions and data include all forms of non-volatile memory, which include, for example, semiconductor memory devices such as EPROM (Erasable Programmable Read-Only Memory), EEPROM (Electronically Erasable Programmable Read-Only Memory), and flash memory devices, magnetic disks such as internal hard disks or removable disks, magneto-optical disks, CD-ROM (Compact Disc Read-Only Memory), and DVD-ROM (Digital Multipurpose Disc Read-Only Memory).

[0048] Combining elements from the various implementation forms described above may form other implementation forms not explicitly mentioned above. Elements may be omitted from the aforementioned system without adversely affecting their operation or the operation of the system as a whole. Furthermore, various other elements may be combined to form one or more individual elements that perform the functions described herein.

[0049] Other implementations not specified herein are also included in the claims described below.

Claims

1. A waveguide connector for making a blindmate electrical connection between a first waveguide and a second waveguide, A male part connected to the first waveguide which includes a first conductive channel, A female part connected to the second waveguide which includes a second conductive channel, the female part including a receiving portion into which the male part slides in to bring about the blind mate electrical connection between the first conductive channel and the second conductive channel, A self-aligning mechanism in at least one of the male or female portion, the self-aligning mechanism for guiding the male portion to the receiving portion while correcting the misalignment between the male portion and the female portion, In order to form an electrical connection between the first conductive channel and the second conductive channel, a conductor is located between the male and female parts. Waveguide connectors including

2. The waveguide connector according to claim 1, wherein the conductor comprises a conductive elastomer material.

3. The aforementioned conductor is disc-shaped, The waveguide connector according to claim 1, wherein the conductor has a central opening configured to align with the first conductive channel and the second conductive channel.

4. The waveguide connector according to claim 1, wherein the conductor includes a disc-shaped spring.

5. A first conductive joint for forming an electrical connection between the male part and the first waveguide, A second conductive joint for forming an electrical connection between the female part and the second waveguide, The waveguide connector according to claim 1, further comprising:

6. The male portion includes a substantially rectangular hollow cavity for housing a portion of the first waveguide, The first waveguide has a substantially rectangular cross-section, The female portion includes a substantially rectangular hollow cavity for housing a portion of the second waveguide, The waveguide connector according to claim 1, wherein the second waveguide has a substantially rectangular cross-section.

7. The male portion includes a substantially circular hollow cavity for housing a portion of the first waveguide, The first waveguide has a substantially circular cross-section, The female portion includes a substantially circular hollow cavity for housing a portion of the second waveguide, The waveguide connector according to claim 1, wherein the second waveguide has a substantially circular cross-section.

8. The self-aligning mechanism is The alignment mechanism in the male part, Guide channel in the female part, wherein the guide channel is configured to receive the alignment mechanism and A waveguide connector according to claim 1, including the following:

9. The alignment mechanism and the guide channel are located at a shared rotation angle around the central axis, so that when the guide channel receives the alignment mechanism, the cross-section of the first waveguide is aligned with the cross-section of the second waveguide in the rotational direction. The waveguide connector according to claim 8, wherein the cross-section of the first waveguide and the cross-section of the second waveguide are each non-circular.

10. The waveguide connector according to claim 1, wherein the male and female parts each contain a conductive material.

11. The waveguide connector according to claim 10, wherein the conductive material includes one or more silver-plated copper or gold-plated brass.

12. The system further includes an alignment spring connected to the female part, Waveguide connector according to claim 1, wherein the alignment spring is configured to contact the male part when the blindmate electrical connection is made, thereby aligning the male and female parts.

13. The first waveguide and the second waveguide are flexible. The waveguide connector according to claim 1, wherein the first waveguide and the second waveguide are configured to bend in one or more dimensions.

14. A test system comprising a waveguide connector according to any one of claims 1 to 13, A device interface board (DIB) configured to hold the device under test (DUT), Test equipment including RF test equipment for transmitting a high-frequency (RF) signal to one or more of the DUTs for testing, It further includes, The waveguide connector is part of a test system that connects the RF test equipment and the DIB.

15. It is a testing system, A device interface board (DIB) configured to hold the device under test (DUT), Test equipment including RF test equipment for transmitting a high-frequency (RF) signal to one or more of the DUTs for testing, The first waveguide between the RF test equipment and the DIB, A second waveguide between the DIB and the DUT, A connector for making a blindmate electrical connection between the first waveguide and the second waveguide. Includes, At least a portion of the connector is attached to the DIB, The aforementioned connector is A male part connected to the first waveguide which includes a first conductive channel, A female part connected to the second waveguide which includes a second conductive channel, the female part including a receiving portion into which the male part slides in to bring about the blind mate electrical connection between the first conductive channel and the second conductive channel, A self-aligning mechanism in at least one of the male or female part, for guiding the male part to the receiving part while correcting the misalignment between the male part and the female part; A testing system including the following.

16. The positional misalignment between the male and female parts is The pitch displacement around the central axis of the first or second waveguide, Yaw displacement around the central axis of the first or second waveguide, or Roll displacement around the central axis of the first or second waveguide The test system according to claim 15, comprising at least one of the following.

17. Includes a test head for holding the aforementioned test equipment, The DIB is attached to the test head. The test system according to claim 15, wherein the Blindmate electrical connection is located within the test head.

18. A first coaxial cable for electrically connecting the test equipment to the first waveguide, and a first antenna system for performing conversion between electromagnetic transverse wave (TEM) signals on the first coaxial cable and electrical transverse wave (TE) waves on the first waveguide. A second coaxial cable for electrically connecting the DUT to the second waveguide, and a second antenna system for performing conversion between the TE wave on the first waveguide and the TEM signal on the second coaxial cable. The test system according to claim 15, further comprising:

19. The test system according to claim 15, wherein the connector further includes a conductor between the male and female parts to form an electrical connection between the first conductive channel and the second conductive channel.

20. The test system according to claim 15, wherein the first waveguide and the second waveguide are filled with a dielectric plastic material.

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