Control device, optical sensor, control method, control program
The control device and method for optical sensors address accuracy issues by monitoring temperature-dependent correction parameter fluctuations and updating parameters to maintain precision in distance detection.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- DENSO CORP
- Filing Date
- 2023-12-26
- Publication Date
- 2026-07-29
AI Technical Summary
Existing optical sensors face accuracy issues in distance detection due to errors caused by aging deterioration of sensor elements and temperature fluctuations, which are not adequately addressed by existing correction methods.
A control device and method that monitor the fluctuation range of correction parameters dependent on temperature, updating stored parameters when the range exceeds acceptable limits, and correcting detection data with a temperature-dependent correction model to maintain accuracy.
Ensures accurate distance detection by continuously adapting to temperature changes and sensor aging, thereby maintaining detection precision over time.
Smart Images

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Abstract
Description
Technical Field
[0001] This disclosure relates to a technique for controlling an optical sensor.
Background Art
[0002] The optical sensor disclosed in Patent Document 1 is controlled to receive a reflected beam from a target with respect to a light projection beam projected onto a detection area and detect the distance to the target. As one such control technique, Patent Document 1 proposes correcting a measurement time equivalent to a detection distance using a delay time caused by processing in a control unit as a correction amount.
Prior Art Documents
Patent Documents
[0003]
Patent Document 1
Summary of the Invention
Problems to be Solved by the Invention
[0004] However, in the optical sensor disclosed in Patent Document 1, the delay time corresponding to the temperature extracted by another optical sensor in the same moving body is extracted according to a map prepared in advance. However, the error that occurs in the measurement time equivalent to the detection distance is caused not only by the delay time due to processing in the control unit but also by, for example, the aging deterioration of the sensor elements constituting the optical sensor and the resulting abnormalities. Therefore, in the optical sensor disclosed in Patent Document 1, there is a concern that the detection accuracy of the distance corresponding to the measurement time corrected according to the constant map will decrease even if the error changes over time.
[0005] The object of this disclosure is to provide a control device that ensures the accuracy of distance detection by an optical sensor. Another object of this disclosure is to provide an optical sensor equipped with a control device that ensures the accuracy of distance detection. Yet another object of this disclosure is to provide a control method that ensures the accuracy of distance detection by an optical sensor. Yet another object of this disclosure is to provide a control program that ensures the accuracy of distance detection by an optical sensor. [Means for solving the problem]
[0006] The following describes the technical means of solving the problem described in this disclosure. Note that the claims and the reference numerals in parentheses in this section indicate the correspondence with the specific means described in the embodiments detailed later, and do not limit the technical scope of this disclosure.
[0007] The first aspect of this disclosure is, A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), and outputs detection data that detects the distance (L) to the target, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance to the target (L), The processor is, In a correction model (M) for correcting distance detection data in a temperature (T) dependent manner, the fluctuation range (δM) of the correction parameter (Mp), which defines the degree of temperature dependence on the distance correction amount (ΔL), is monitored, and the storage parameter (Mpm) stored as the correction parameter in the storage medium (51a) is updated when the fluctuation range falls outside the acceptable range. It is configured to correct the detection data by a correction amount that matches the temperature at each distance detection, according to a correction model given based on the latest memory parameters.
[0008] A second aspect of this disclosure is, A control method performed by a processor (51b) to control an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), detects the distance (L) to the target, and outputs detection data, wherein the optical sensor (10) outputs detection data, the distance to the target (L), In a correction model (M) for correcting distance detection data in a temperature (T) dependent manner, the fluctuation range (δM) of the correction parameter (Mp), which defines the degree of temperature dependence on the distance correction amount (ΔL), is monitored, and the storage parameter (Mpm) stored as the correction parameter in the storage medium (51a) is updated when the fluctuation range falls outside the acceptable range. A control method that includes correcting the detected data by a correction amount corresponding to the temperature at each distance detection, according to a correction model given according to the latest memory parameters.
[0009] A third aspect of this disclosure is: A control program, which includes instructions to be executed by a processor (51b) and is stored in a storage medium (51a) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA) and detects the distance (L) to the target, and outputs detection data, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and detects the distance (L) to the target, In a correction model (M) for correcting distance detection data in a temperature (T) dependent manner, the fluctuation range (δM) of the correction parameter (Mp), which defines the degree of temperature dependence on the distance correction amount (ΔL), is monitored, and the storage parameter (Mpm) stored as the correction parameter in the storage medium (51a) is updated when the fluctuation range falls outside the acceptable range. The command includes instructions to correct the detected data by a correction amount corresponding to the temperature at each distance detection, according to a correction model given based on the latest memory parameters.
[0010] As described above, according to the first to third embodiments, in the correction model for correcting distance detection data in a temperature-dependent manner, the range of variation of the correction parameter that defines the degree of temperature dependence on the distance correction amount is monitored. If the range of variation of the correction parameter falls outside the acceptable range, the stored parameter in the storage medium is updated as the correction parameter. Therefore, by correcting the detection data with a correction amount that matches the temperature at each distance detection according to the correction model given according to the latest stored parameter, it becomes possible to output detection data that ensures distance detection accuracy regardless of the passage of time.
[0011] The fourth aspect of this disclosure is: A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), and outputs detection data that detects the distance (L) to the target, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance to the target (L), The processor is, In a correction model (M) for correcting distance detection data in a temperature (T) dependent manner, the following is observed: monitoring the variation range (δM) of the correction parameter (Mp) that defines the degree of temperature dependence on the distance correction amount (ΔL), and the failure index (Ir) correlated with the variation range (δM), The system is configured to perform the following actions: when the failure indicator of an optical sensor falls outside the acceptable range, it is considered a failure state, and failure notification information is output to notify the system of that failure state.
[0012] The fifth aspect of this disclosure is, A control method performed by a processor (51b) to control an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), detects the distance (L) to the target, and outputs detection data, wherein the optical sensor (10) outputs detection data, the distance to the target (L), In a correction model (M) for correcting distance detection data in a temperature (T) dependent manner, the failure index (Ir) correlated with the variation range (δM) of the correction parameter (Mp) that defines the degree of temperature dependence on the distance correction amount (ΔL) is monitored, This includes determining the state of an optical sensor where the failure indicator falls outside the acceptable range as a failure state and outputting failure notification information that notifies of that failure state.
[0013] The sixth aspect of this disclosure is: A control program, which includes instructions to be executed by a processor (51b) and is stored in a storage medium (51a) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA) and detects the distance (L) to the target, and outputs detection data, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and detects the distance (L) to the target, In a correction model (M) for correcting distance detection data in a temperature (T) dependent manner, the failure index (Ir) correlated with the variation range (δM) of the correction parameter (Mp) that defines the degree of temperature dependence on the distance correction amount (ΔL) is monitored, The command includes instructions to output fault notification information indicating that an optical sensor has entered a fault state when its fault indicators fall outside the acceptable range.
[0014] In the fourth to sixth embodiments described above, in a correction model for correcting distance detection data in a temperature-dependent manner, a failure index correlated with the fluctuation range of a correction parameter that defines the degree of temperature dependence on the distance correction amount is monitored. When the failure index falls outside the acceptable range of the optical sensor, it is considered a failure state, and failure notification information indicating this failure state is output. In this way, the optical sensor can accurately notify the failure state through the failure notification information. Conversely, in a normal state without such notification, the detection data is corrected according to the temperature at each distance detection according to the correction model, thereby enabling the output of detection data with ensured distance detection accuracy.
[0015] The seventh aspect of this disclosure is: A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), and outputs detection data that detects the distance (L) to the target, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance to the target (L), The processor is, In a correction model (M) for correcting distance detection data depending on temperature (T), monitoring a failure index (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines the temperature dependence of a distance correction amount (ΔL), regarding the state of an optical sensor in which the failure index is outside the allowable range as a failure state, and adjusting a control parameter for controlling the optical sensor to the recovery side of the failure state, are configured to be executed.
[0016] The eighth aspect of the present disclosure is a control method executed by a processor (51b) for controlling an optical sensor (10) that outputs detection data detecting a distance (L) to a target by receiving a reflected beam (RB) from the target with respect to a light projection beam (PB) projected onto a detection area (DA), In a correction model (M) for correcting distance detection data depending on temperature (T), monitoring a failure index (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines the temperature dependence of a distance correction amount (ΔL), regarding the state of an optical sensor in which the failure index is outside the allowable range as a failure state, and adjusting a control parameter for controlling the optical sensor to the recovery side of the failure state, are included.
[0017] The ninth aspect of the present disclosure is a control program stored in a storage medium (51a) and including instructions to be executed by a processor (51b) for controlling an optical sensor (10) that outputs detection data detecting a distance (L) to a target by receiving a reflected beam (RB) from the target with respect to a light projection beam (PB) projected onto a detection area (DA), In a correction model (M) for correcting distance detection data depending on temperature (T), monitoring a failure index (Ir) correlated with a fluctuation range (δM) of a correction parameter (Mp) that defines the temperature dependence of a distance correction amount (ΔL), The method includes an instruction to execute adjusting a control parameter for controlling an optical sensor to a recovery side of a failure state, where the failure state is a state of the optical sensor in which a failure indicator is out of an allowable range.
[0018] As described above, according to the seventh to ninth aspects, in a correction model for correcting distance detection data depending on temperature, a failure indicator correlated with a fluctuation range of a correction parameter that defines a temperature dependency of a distance correction amount is monitored. Therefore, a state of the optical sensor in which the failure indicator is out of the allowable range is defined as a failure state, and a control parameter for controlling the optical sensor is adjusted to the recovery side of the failure state. Thus, in the optical sensor, recovery of the failure state can be achieved by adjusting the control parameter. Under such recovery, detection data can be output with ensured distance detection accuracy by correcting the detection data according to the temperature for each distance detection according to the correction model.
[0019] The tenth aspect of the present disclosure is an optical sensor that outputs detection data obtained by receiving a reflected beam (RB) from a target (Xt) with respect to a light projection beam (PB) projected onto a detection area (DA) and detecting a distance (L) to the target, including a control device according to the first, fourth, or seventh aspect, and including a control unit (51) that generates detection data, a light projection unit (21) that projects a light projection beam according to control by the control unit, and a light reception unit (41) that receives a reflected beam according to control by the control unit.
[0020] Such an optical sensor according to the tenth aspect can exhibit the same operational effects as the control device according to the first, fourth, or seventh aspect.
Brief Description of Drawings
[0021] [Figure 1] It is a cross-sectional view showing an overall configuration of an optical sensor according to a first embodiment. [Figure 2] It is a block diagram showing a functional configuration of an optical sensor according to a first embodiment. [Figure 3] This is a schematic diagram showing a light source unit according to the first embodiment. [Figure 4] This is a schematic diagram showing a light receiving detection unit according to the first embodiment. [Figure 5] This is a flowchart showing the control flow according to the first embodiment. [Figure 6] This is a time chart illustrating the control flow according to the first embodiment. [Figure 7] This is a characteristic diagram illustrating the control flow according to the first embodiment. [Figure 8] This is a characteristic diagram illustrating the control flow according to the first embodiment. [Figure 9] This is a characteristic diagram illustrating the control flow according to the first embodiment. [Figure 10] This is a cross-sectional view showing a modified example of Figure 2. [Figure 11] This is a characteristic diagram illustrating the control flow according to the first embodiment. [Figure 12] This is a characteristic diagram illustrating the control flow according to the second embodiment. [Figure 13] This is a characteristic diagram illustrating the control flow according to the third embodiment. [Figure 14] This is a characteristic diagram illustrating the control flow according to the fourth embodiment. [Modes for carrying out the invention]
[0022] Hereinafter, several embodiments of this disclosure will be described with reference to the drawings. In each embodiment, the same reference numerals will be used for corresponding components, and redundant explanations may be omitted. Furthermore, if only a part of the configuration is described in each embodiment, the configuration of other embodiments described earlier may be applied to the other parts of that configuration. Moreover, not only the combinations of configurations explicitly stated in the description of each embodiment, but also the configurations of multiple embodiments can be partially combined even if not explicitly stated, as long as there are no particular problems with the combination.
[0023] (First Embodiment) As shown in Figure 1, the optical sensor 10 according to the first embodiment of this disclosure is a LiDAR (Light Detection and Ranging / Laser Imaging Detection and Ranging) configured to be mounted on a mobile body 1 for optically detecting the outside world of the mobile body 1. The mobile body 1 to which the optical sensor 10 is applied is, for example, an automobile, which is capable of at least one type of driving from manual driving, automatic driving, and remote driving. In the following description, unless otherwise specified, the directions indicated by front, rear, up, down, left, and right are defined with respect to the mobile body 1 on a horizontal plane. Also, in the following description, the horizontal direction and the vertical direction mean the direction parallel and perpendicular to the horizontal plane of the mobile body 1 on a horizontal plane, respectively. However, in Figure 1, the portion to the left of the dashed line along the vertical direction (the side of the cover panel 12 described later) actually shows a cross-section perpendicular to the portion to the right of the dashed line (the side of the respective parts 21 and 41 described later).
[0024] The optical sensor 10 is positioned at least one location on the moving body 1, such as the front, left and right sides, rear, and upper roof. As shown in Figures 1 and 2, the optical sensor 10 emits a light beam PB towards a detection area DA in the outside world, corresponding to its position on the moving body 1. The optical sensor 10 detects the reflected light RB, which returns when the light beam PB is reflected by the target Xt in the detection area DA in the outside world. The light beam PB that becomes the reflected beam RB is selected to be near-infrared light, which is difficult for humans to see.
[0025] The optical sensor 10 detects a target Xt in the detection area DA of the external environment by receiving a reflected beam RB that has been reflected from the projected light beam PB. This detection of an external target Xt involves detecting one or more types of information, including at least the distance L from the optical sensor 10 to the target Xt, the direction in which the target Xt is located, and the reflection intensity of the reflected beam RB from the target Xt. A typical target Xt to be detected in the optical sensor 10 applied to the moving object 1 may be at least one type of moving object, such as a pedestrian, cyclist, animal other than a human, and other vehicles. A typical target Xt to be detected in the optical sensor 10 applied to the moving object 1 may be at least one type of stationary object, such as a guardrail, road sign, roadside structure, and fallen object on the road.
[0026] As shown in Figure 1, the optical sensor 10 comprises a housing 11, a light-emitting unit 21, a scanning unit 31, a light-receiving unit 41, and a control unit 51. The light-shielding housing 11 is formed in a box shape from, for example, metal or resin. The housing 11 houses the light-emitting unit 21, the scanning unit 31, the light-receiving unit 41, and the control unit 51. Openings in the housing 11 that penetrate from the inside to the outside are closed by a cover panel 12. The light-transmitting cover panel 12 is formed from, for example, resin or glass, and separates the inside and outside of the housing 11.
[0027] As shown in Figures 1 and 2, the light-emitting unit 21 includes a light-emitting light source unit 22 and a light-emitting lens unit 26. As shown in Figure 3, the light-emitting light source unit 22 is constructed by mounting a plurality of light source elements 24 in an array on a substrate. Each light source element 24 is a laser diode arranged in a single row (example in Figure 3) or multiple rows (not shown) along the vertical direction. Each light source element 24 generates pulsed laser light that becomes a part of the light-emitting beam PB according to a control signal from the control unit 51. Each light source element 24 may be an edge emitter laser or a vertical cavity surface-emitting laser (VCSEL).
[0028] The light source unit 22 has a light source window 25 formed on one side of the substrate, which is pseudo-defined by a rectangular contour that is longitudinal in the vertical direction and short in the horizontal direction. The light source window 25 is configured as an aggregate of laser oscillation apertures in each light source element 24. The laser light projected from the laser oscillation aperture of each light source element 24 is projected from the light source window 25 as a light source beam PB that is pseudo-defined as a longitudinal line beam in the vertical direction, at least in the detection region DA of the outside world.
[0029] As shown in Figure 1, the light projection lens unit 26 is constructed such that at least one light projection lens 27 is held in a lens barrel 28. The light-transmitting light projection lens 27 is mainly made of a base material such as resin or glass, and is formed in a lens shape according to the optical function it is to perform. The light projection lens 27 performs at least one type of optical function, such as focusing, collimating, and shaping, on the light projection beam PB from the light projection light source unit 22. The light projection lens 27 is positioned within a light-shielding lens barrel 28 made of, for example, metal or resin. The light projection lens unit 26, with this configuration, is aligned with the light projection light source unit 22 to form a light projection axis PO that guides the light projection beam PB toward the scanning unit 31.
[0030] As shown in Figures 1 and 2, the scanning unit 31 includes a scanning mirror 32 and a scanning motor 35. The scanning mirror 32 is constructed in the form of a plate with a reflective film deposited on a reflective surface 33, which is one side of a base material. The scanning mirror 32 is supported by the housing 11 so that it can be rotated around a rotation centerline along the vertical direction. The scanning mirror 32 oscillates within a finite range of motion determined by a mechanical or electrical stopper.
[0031] The scanning motor 35 is, for example, a voice coil motor, a brushed DC motor, or a stepping motor. The output shaft of the scanning motor 35 is coupled to the scanning mirror 32 directly or indirectly via a drive mechanism such as a reduction gear. The scanning motor 35 is held by the housing 11 so that the scanning mirror 32 can be rotated together with the output shaft. The scanning motor 35 rotates (i.e., oscillates) the scanning mirror 32 within a finite drive range in accordance with a control signal from the control unit 51.
[0032] The scanning mirror 32 reflects the light beam PB incident from the light-emitting unit 21 by its reflective surface 33 and projects it through the cover panel 12 onto the detection area DA, thereby scanning the area DA according to the rotation angle of the scanning motor 35. At this time, the scanning of the detection area DA by the light beam PB is substantially limited to horizontal scanning in this embodiment, according to the rotational drive of the scanning mirror 32.
[0033] The scanning mirror 32 reflects the reflected beam RB, which is incident from the target Xt of the detection region DA through the cover panel 12, toward the light receiving unit 41 side by its reflective surface 33, according to the rotation angle of the scanning motor 35. At this time, the speeds of the emitted beam PB and the reflected beam RB are sufficiently large compared to the rotational speed of the scanning mirror 32. As a result, the reflected beam RB is guided toward the light receiving unit 41 side in the opposite direction to the emitted beam PB by the reflection effect from the scanning mirror 32, which can be simulated to have essentially the same rotation angle as the emitted beam PB.
[0034] The light-receiving unit 41 includes a light-receiving lens unit 42 and a light-receiving detection unit 45. As shown in Figure 1, the light-receiving lens unit 42 is constructed such that at least one light-receiving lens 43 is held by a lens barrel 44. The light-transmitting light-receiving lens 43 is mainly made of a substrate such as resin or glass and is formed in a lens shape corresponding to the optical function it will perform. The light-receiving lens 43 performs an optical function to image the reflected beam RB from the scanning mirror 32 onto the light-receiving detection unit 45. The light-receiving lens 43 is positioned within a light-shielding lens barrel 44 made of, for example, metal or resin. The light-receiving lens unit 42, with this configuration, is aligned with the light-receiving detection unit 45, so that the light-receiving optical axis RO, which guides the reflected beam RB from the scanning unit 31 towards the unit 45, is formed vertically offset from the light-emitting optical axis PO of the light-emitting lens unit 26.
[0035] As shown in Figure 4, the light-receiving detection unit 45 is constructed by mounting a plurality of light-receiving pixels 46 in an array on a substrate. Each light-receiving pixel 46 is arranged at least along the vertical direction. The light-receiving detection unit 45 has a light-receiving surface 450 on one side of the substrate, which has a rectangular contour with its length along the vertical direction and its length along the horizontal direction. The light-receiving surface 450 is composed of an aggregate of the incident surfaces of each light-receiving pixel 46. Here, each light-receiving pixel 46 is further composed of multiple light-receiving elements 460, such as single-photon avalanche diodes. Each of these light-receiving pixels 46 receives the reflected beam RB incident from the light-receiving lens unit 42 onto the light-receiving surface 450, as shown in Figure 1.
[0036] As shown in Figures 1 and 2, the light receiving detection unit 45 is provided with an output circuit 47. The output circuit 47 performs sampling processing for each scanning line according to the rotation angle of the scanning mirror 32, synchronized with the light emission period of the light emission beam PB from the light emission light source unit 22, for each detection cycle according to the control signal from the control unit 51. At this time, the output circuit 47 generates a detection signal by combining the response outputs from the light receiving elements 460 of each light receiving pixel 46 for each detection cycle. The detection signal thus generated is output from the output circuit 47 to the control unit 51 for each scanning line.
[0037] The control unit 51 is composed of a control device mounted on a circuit board, which includes at least one dedicated computer. The dedicated computer constituting the control device as the control unit 51 may be a sensor ECU (Electronic Control Unit) specialized in controlling the optical sensor 10, in which case the sensor ECU is housed in the housing 11 (example in Figure 1). The dedicated computer constituting the control device as the control unit 51 may also be an operation control ECU specialized in controlling the operation of the mobile body 1, in which case the operation control ECU is located outside the housing 11 in the mobile body 1 (not shown).
[0038] The dedicated computer constituting the control unit 51 has at least one memory 51a and one processor 51b, as shown in Figure 1. The memory 51a is at least one type of non-transitory tangible storage medium, such as a semiconductor memory, magnetic medium, and optical medium, which non-temporarily stores programs and data that can be read by the computer. The processor 51b includes at least one type as a core, such as a CPU (Central Processing Unit), GPU (Graphics Processing Unit), RISC (Reduced Instruction Set Computer)-CPU, DFP (Data Flow Processor), and GSP (Graph Streaming Processor).
[0039] The control unit 51, configured in this way, is connected to the light source unit 22, the scanning motor 35, and the light detection unit 45. The control unit 51 controls the light source unit 22 to generate a light beam PB for each light emission period. At the same time, the control unit 51 controls the scanning motor 35 to control scanning and reflection by the scanning mirror 32 in synchronization with the light emission period of the light source unit 22. Furthermore, the control unit 51 processes the detection signal output from the output circuit 47 of the light detection unit 45, which is controlled according to the light emission by the light source unit 22 and the scanning and reflection by the scanning mirror 32. As a result, the control unit 51 generates detection data that at least detects the distance L to the target Xt in the detection region DA.
[0040] To implement this control, the processor 51b executes multiple instructions included in the control program stored in the memory 51a. This allows the control unit 51 to construct multiple functional blocks for controlling the optical sensor 10. These functional blocks constructed by the control unit 51 include, as shown in Figure 2, an update block 100 and a detection block 120.
[0041] Through the combined action of these blocks 100 and 120, the control method by which the control unit 51 controls the optical sensor 10 is executed according to the control flow shown in Figure 5. This control flow is executed repeatedly for each detection cycle during the startup of the mobile body 1. In the control flow, each "S" represents multiple steps executed by multiple instructions included in the control program.
[0042] In S10 shown in Figure 5, the update block 100 (see Figure 2) determines whether the current detection cycle meets the conditions of the monitoring period Pm. Here, the monitoring period Pm is the period for monitoring the fluctuation range δM of the correction parameter Mp in the correction model M described later. The monitoring period Pm is set to the stop period Ps shown in Figure 6, which is at least the period during which the mobile body 1 is stopped. The monitoring period Pm may also be set to a stop period Ps with further conditions, such as when the vehicle is parked in a parking lot. The stop of the mobile body 1, which triggers the setting of such a stop period Ps, may be recognized based on the detection result of the driving speed by, for example, a speed sensor mounted on the mobile body 1. The stop of the mobile body 1 may also be recognized based on the detection result of the road surface by, for example, an optical sensor 10, other LiDAR, or camera mounted on the mobile body 1. The stop of the mobile body 1 may also be recognized by fusion of these driving speed and road surface detection results. In Figure 6, the temperature T°C (particularly the temperature Ta described later), which is an indicator of the state of the optical sensor 10, is used as the vertical axis to schematically illustrate an example of the time progression of the operating state of the optical sensor 10.
[0043] The monitoring period Pm is preferably set during the activation period Pss shown in Figure 6, when the optical sensor 10 is activated, within the stop period Ps of the mobile body 1, if the activation monitoring condition is met. Here, the activation monitoring condition may be defined to be met each time a set time has elapsed since the activation period Pss was previously set in the monitoring period Pm. The activation monitoring condition may also be defined to be met each time the number of occurrences of the activation period Pss reaches a set number since the activation period Pss was previously set in the monitoring period Pm. Note that the activation of the optical sensor 10 is at least one of the following: simultaneous activation of the mobile body 1 and the optical sensor 10 in response to an activation command from the user, and automatic activation of the optical sensor 10 by waking up the sleeping mobile body 1, for example at night, depending on the user command.
[0044] The monitoring period Pm is further set within the stopping period Ps of the mobile body 1, specifically during the steady-state monitoring period Psr shown in Figure 6, when the operation of the optical sensor 10 stabilizes after the startup period Pss and the sensor 10 enters a steady state, and the steady-state monitoring conditions are met. Here, the steady-state monitoring conditions may be defined so that they are met each time a set time has elapsed since the steady-state period Psr was previously set to the monitoring period Pm. The steady-state monitoring conditions may also be defined so that they are met each time the number of occurrences of the steady-state period Psr reaches a set number since the steady-state period Psr was previously set to the monitoring period Pm.
[0045] As shown in Figure 5, if a positive judgment is made in S10, S20 is executed. In S20, the update block 100 monitors the correction model M (see Figures 7 and 8, which will be described in detail later) which determines a correction amount ΔL for correcting the detected distance L data depending on the temperature T. At this time, in S20, the fluctuation range δM of the correction parameter Mp, which defines the degree of dependence of temperature T on the correction amount ΔL of distance L in the correction model M, is monitored. Here, the correction amount ΔL is defined as a positive or negative detection deviation amount that depends on the temperature T, with the detected distance L as the reference. Furthermore, as temperature T, the temperatures Ta, Tb, and Tc (see Numbers 1 and 5 described later) for each of the specific multiple sensor elements constituting the optical sensor 10 are considered.
[0046] Specifically in S20, if the current detection cycle falls within the start period Pss, which is set to the monitoring period Pm within the stop period Ps, the start parameter Mps is monitored as a correction parameter Mp that gives the correction model M for the start period Pss, as shown in Figure 7. At this time, the start parameter Mps is assumed to have coefficient parameters As, Bs, and Cs according to Equation 1, representing the degree of dependence of each temperature Ta, Tb, and Tc, assuming that the amount of detection deviation of the distance L depends on each of the multiple specific sensor elements constituting the optical sensor 10, Ta, Tb, and Tc. Furthermore, the start parameter Mps is assumed to have a constant parameter Ds common to the temperatures Ta, Tb, and Tc, according to Equation 1.
number
[0047] In the above equation 1, the functions Ga, Gb, and Gc are defined as polynomials or monomials of order 1 or higher with respect to the corresponding temperatures Ta, Tb, and Tc, respectively, and without a constant term. In each term of the polynomial or monomial that constitutes the function Ga, a coefficient corresponding to the exponent of temperature Ta is defined as the parameter As. Thus, especially in the case of polynomials, a separate parameter As is defined for each exponent of temperature Ta in each term. The relationship between the parameters Bs and Cs and their corresponding functions Gb and Gc is defined in accordance with the relationship between the parameter As and the function Ga.
[0048] Thus, the initial values of the optical sensor 10 at the time of product shipment, or the updated values described later during the startup period Ps, are stored in memory 51a as the respective parameters As, Bs, Cs, and Ds expected for the startup parameter Mps. Therefore, the stored values of these parameters As, Bs, Cs, and Ds are defined as the stored parameter Mpm related to the startup parameter Mps, as shown in Figure 7.
[0049] Here, the sensor element corresponding to temperature Ta is the light-emitting light source unit 22. The temperature Ta of the light-emitting light source unit 22 is measured by a temperature sensor 29 (see Figure 3) on the same substrate as each light source element 24. On the other hand, the sensor element corresponding to temperature Tb is the light-receiving detection unit 45. The temperature Tb of the light-receiving detection unit 45 is estimated according to the function Fb in Equation 2, since it correlates with the temperature Ta of the light-emitting light source unit 22. Furthermore, the sensor element corresponding to temperature Tc is the control unit 51, or its mounting substrate. The temperature Tc of the control unit or mounting substrate is estimated according to the function Fc in Equation 3, since it correlates with the temperature Ta of the light-emitting light source unit 22.
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[0050] If the current detection cycle corresponds to the activation period Pss set in the monitoring period Pm, in S20 the update block 100 changes the temperatures Ta, Tb, and Tc for each sensor element as the trial temperature Tt shown in Figure 9. At this time, the change points of temperatures Ta, Tb, and Tc as the trial temperature Tt are set at multiple points such that each point corresponds to another point of those temperatures Ta, Tb, and Tc, based on the correlation of equations 2 and 3. The update block 100 may directly set multiple change points of temperature Ta by controlling the emission of light from each light source element 24 of the light source unit 22 and adjusting the emission power, or it may indirectly set multiple change points of temperatures Tb and Tc according to equations 2 and 3. Alternatively, the update block 100 may indirectly set multiple change points of temperature Ta correlated with the ambient temperature Ti in the housing 11 according to the function Fa of equation 4, and multiple change points of temperatures Tb and Tc according to equations 2 and 3, by having the temperature adjustment unit 61, which is additionally connected to the control unit 51, adjust the ambient temperature Ti in the housing 11, as shown in the modified example in Figure 10. Here, the temperature adjustment unit 61 is composed of at least one type, such as a heater unit and a cooling unit.
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[0051] If the current detection cycle corresponds to the activation period Pss set in the monitoring period Pm, in S20 the update block 100 acquires the distance L detected by the optical sensor 10 for each corresponding change point (hereinafter referred to as "corresponding change point") of the temperatures Ta, Tb, and Tc as the trial temperature Tt, as the trial distance Lt, as shown in Figure 9. At this time, the trial distance Lt for each corresponding change point of temperatures Ta, Tb, and Tc may be determined by the optical sensor 10 of the stationary mobile body 1 receiving the reflected beam RB from a stationary target Xt, such as a structure or a stationary vehicle, thereby detecting the distance L to the target Xt. Here, the stationary state of the target Xt may be recognized based on the detection result of the target Xt by, for example, the optical sensor 10, other LiDAR, or camera mounted on the mobile body 1.
[0052] Therefore, in the update block 100 at S20 of the startup period Pss, the startup parameter Mps is obtained as the trial parameter Mpt by, for example, regression analysis, to provide a correction model M to interpolate the amount of detection deviation of the trial distance Lt obtained for each corresponding change point between temperatures Ta, Tb, and Tc, as shown in Figure 7, for the trial distance Lt obtained at specific reference corresponding change points between temperatures Ta, Tb, and Tc. At this time, the startup parameter Mps obtained as the trial parameter Mpt is assumed to have parameters As, Bs, Cs, and Ds according to Equation 1. In Figures 7 and 9, the temperature Ta corresponding to temperatures Tb and Tc according to Equations 2 and 3 is used as the horizontal axis, and an example of the correction model M for the startup parameter Mps and distance detection in the startup period Pss are illustrated, respectively. In addition, in Figures 7 and 9, each corresponding change point between temperatures Ta, Tb, and Tc is shown as a black circle, and the temperature Ta at the reference corresponding change point that serves as the basis for the amount of detection deviation is shown with the sign T0s.
[0053] If the current detection cycle corresponds to the activation period Pss set in the monitoring period Pm, in S20 the update block 100 reads the latest stored parameters Mpm with respect to the activation parameter Mps, namely the parameters As, Bs, and Cs, from the memory 51a. Then, in S20 of the activation period Pss, the update block 100 focuses on the difference between the trial parameter Mpt acquired in the current detection cycle with respect to the activation parameter Mps and the latest stored parameter Mpm read out with respect to the activation parameter Mps, as the fluctuation range δM, and monitors each coefficient parameter As, Bs, and Cs corresponding to each sensor element. At this time, in the function Ga of equation 1 above, the fluctuation range δM is monitored separately for each coefficient parameter As of each term with a different exponent of temperature Ta in the case of a polynomial, or separately for the coefficient parameter As corresponding to the exponent of temperature Ta in the case of a monomial. Accordingly, in the functions Gb and Gc of equation 1 above, the fluctuation range δM is monitored separately for each coefficient parameter Bs and Cs of the polynomial, where the exponents of the corresponding temperatures Tb and Tc are different, or, in the monomial, for each coefficient parameter Bs and Cs corresponding to the exponents of the corresponding temperatures Tb and Tc.
[0054] Through this monitoring, in S20 of the startup period Pss, if the variation range δM corresponding to at least one sensor element among the variation ranges δM for each coefficient parameter As, Bs, and Cs increases beyond the preset allowable range, the memory parameter Mpm related to the startup parameter Mps is updated in memory 51a as shown in Figure 5. In this update of the startup parameter Mps, learning of the memory parameter Mpm using the trial parameter Mpt is performed separately for the coefficient parameters As, Bs, and Cs for each sensor element. At the same time, in the update of the startup parameter Mps, learning of the memory parameter Mpm using the trial parameter Mpt is also performed simultaneously for the constant parameter Ds.
[0055] On the other hand, in S20, if the detection cycle in this case corresponds to the steady-state period Psr, which is set to the monitoring period Pm within the stop period Ps, the steady-state parameter Mpr is monitored as a correction parameter Mp that gives the correction model M for the steady-state period Psr, as shown in Figure 8. At this time, the steady-state parameter Mpr is assumed to depend on the detection deviation amount of distance L for each of the multiple sensor elements, temperature Ta, Tb, and Tc, as in the case of the start period Pss, and coefficient parameters Ar, Br, and Cr representing the degree of dependence of these temperatures Ta, Tb, and Tc are assumed according to Equation 5. Furthermore, the steady-state parameter Mpr is assumed to have a constant parameter Dr common to temperatures Ta, Tb, and Tc, according to Equation 5. Here, as shown in Figure 6, the optical sensor 10 is also in a steady state during the running period Pd of the moving body 1, which has started running after exiting the stop period Ps. Therefore, the steady-state parameter Mpr is also assumed and monitored as a correction parameter Mp that gives the correction model M for the steady-state period Pdr in which it is in a steady state.
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[0056] In equation 5 above, the functions Ha, Hb, and Hc are defined as polynomials or monomials of order 1 or higher with respect to the corresponding temperatures Ta, Tb, and Tc, respectively, and without a constant term. In each term or monomial of the polynomial that constitutes the function Ha, a coefficient corresponding to the exponent of temperature Ta is defined as the parameter Ar. Thus, especially in the case of polynomials, a separate parameter Ar is defined for each exponent of temperature Ta in each term. The relationship between the parameters Br and Cr and their corresponding functions Hb and Hc is defined in accordance with the relationship between the parameter Ar and the function Ha.
[0057] Thus, the parameters Ar, Br, Cr, and Dr, which are assumed to be part of the steady-state parameter Mpr, are stored in memory 51a either as their initial values at the time of product shipment of the optical sensor 10, or as updated values during the steady-state period Psr, as described later. Therefore, the stored values of these parameters Ar, Br, Cr, and Dr are defined as the stored parameter Mpm related to the steady-state parameter Mpr, as shown in Figure 8.
[0058] If the current detection cycle corresponds to the steady-state period Psr set in the monitoring period Pm, in S20 the update block 100 changes the temperatures Ta, Tb, and Tc for each sensor element as the trial temperature Tt shown in Figure 11. At this time, the method of changing the temperatures Ta, Tb, and Tc as the trial temperature Tt is the same as in the case of the startup period Pss.
[0059] If the current detection cycle corresponds to the steady-state period Psr set in the monitoring period Pm, in S20 the update block 100 acquires the distance L detected by the optical sensor 10 for each corresponding change point between the trial temperatures Tt, Ta, Tb, and Tc, as the trial distance Lt, as shown in Figure 11. At this time, the trial distance Lt for each corresponding change point of temperatures Ta, Tb, and Tc should be the distance L to a stationary target Xt, similar to the case of the startup period Pss. Here, the stationary state of target Xt may be recognized based on the detection result of target Xt by, for example, the optical sensor 10, other LiDAR, or camera mounted on the mobile body 1.
[0060] Therefore, in the update block 100 at S20 of the steady period Psr, a steady-state parameter Mpr is obtained as a trial parameter Mpt by, for example, regression analysis, to provide a correction model M that interpolates the amount of detection deviation of the trial distance Lt obtained for each corresponding change point between temperatures Ta, Tb, and Tc, as shown in Figure 8, for the trial distance Lt obtained at specific reference corresponding change points between temperatures Ta, Tb, and Tc. At this time, the steady-state parameter Mpr obtained as the trial parameter Mpt is assumed to be the parameters Ar, Br, Cr, and Dr according to Equation 5. In Figures 8 and 11, the temperature Ta corresponding to temperatures Tb and Tc according to Equations 2 and 3 is used as the horizontal axis, and an example of the correction model M with the steady-state parameter Mpr and distance detection in the steady period Psr are illustrated, respectively. In addition, in Figures 8 and 11, each corresponding change point is shown as a black circle in accordance with the startup period Pss in Figures 7 and 9, while a temperature Ta different from the startup period Pss is shown as a reference corresponding change point with the symbol T0r.
[0061] If the current detection cycle corresponds to the steady-state period Psr set in the monitoring period Pm, in S20 the update block 100 reads the latest stored parameters Mpm for the steady-state parameter Mpr, which are the parameters Ar, Br, and Cr, from the memory 51a. Then, in S20 of the steady-state period Psr, the update block 100 focuses on the difference between the trial parameter Mpt acquired in the current detection cycle and the latest stored parameter Mpm read out for the steady-state parameter Mpr as the fluctuation range δM, and monitors each coefficient parameter Ar, Br, and Cr corresponding to each sensor element. At this time, in the function Ha of equation 5 above, if it is a polynomial, the fluctuation range δM is monitored for each coefficient parameter Ar of each term with a different exponent of temperature Ta, or if it is a monomial, the fluctuation range δM is monitored for the coefficient parameter Ar alone according to the exponent of temperature Ta. Accordingly, in the functions Hb and Hc of equation 5 above, the fluctuation range δM is monitored separately for each coefficient parameter Br and Cr in the polynomial, where the exponents of the corresponding temperatures Tb and Tc are different, or, in the monomial, separately for the coefficient parameters Br and Cr corresponding to the exponents of the corresponding temperatures Tb and Tc.
[0062] Through this monitoring, in S20 of the steady-state period Psr, if the variation range δM corresponding to at least one sensor element among the variation ranges δM for each coefficient parameter Ar, Br, and Cr increases outside the preset tolerance range, the memory parameter Mpm for the steady-state parameter Mpr is updated in memory 51a as shown in Figure 5. In this update of the steady-state parameter Mpr, the memory parameter Mpm is learned using the trial parameter Mpt for each coefficient parameter Ar, Br, and Cr for each sensor element. At the same time, in the update of the steady-state parameter Mpr, the memory parameter Mpm is also learned using the trial parameter Mpt for the constant parameter Dr.
[0063] As shown in Figure 5, if a positive judgment is made in S10, the current execution of the control flow ends with the completion of execution in S20. On the other hand, if a negative judgment is made in S10, S30 and S40 are executed sequentially. First, in S30, the detection block 120 (see Figure 2) controls the light emission unit 22, the scanning motor 35, and the light receiving detection unit 45 to generate detection data for the current detection cycle.
[0064] Next, in S40, the detection block 120 corrects the distance L of the output detection data by a correction amount ΔL that matches the current temperature Tp, which is the temperature T in the current detection cycle, according to the correction model M given according to the latest memory parameter Mpm. Specifically, the current temperature Tp at this time is obtained as the temperature Ta, Tb, and Tc for each sensor element. Then, the temperature Ta is measured by the temperature sensor 29, and the temperatures Tb and Tc are estimated according to equations 2 and 3.
[0065] Therefore, in S40, if the current detection cycle falls within the startup period Pss, which is outside the monitoring period Pm set in the stop period Ps, the detection block 120 reads the memory parameter Mpm related to the startup parameter Mps from memory 51a. As a result, for the startup period Pss, a correction model M including the startup parameter Mps is selected as the input target for the current temperature Tp, and corrected detection data according to the correction model M is output.
[0066] On the other hand, in S40, if the current detection cycle falls within the stop period Ps, specifically the steady-state period Psr which is not set as the monitoring period Pm, the detection block 120 reads the memory parameter Mpm related to the steady-state parameter Mpr from memory 51a. As a result, for the steady-state period Psr, a correction model M including the steady-state parameter Mpr is selected as the input target for the current temperature Tp, and corrected detection data according to the correction model M is output. In this embodiment, the output of corrected detection data corresponding to the steady-state period Psr within the stop period Ps is also performed in S40 when the current detection cycle falls within the steady-state period Pdr (see Figure 6), which substantially coincides with the running period Pd of the mobile body 1 after it has left the stop period Ps.
[0067] In any of these time periods, the output of the detection data in S40 may be stored in the memory 51a of the detection data. The output of the detection data in S40 may be provided to, for example, the driving control ECU. The output of the detection data in S40 may be transmitted to an external center through the communication unit of the mobile body 1.
[0068] With the completion of S40 described above, the current execution of the control flow is finished. Therefore, the control flow will be repeated outside of the monitoring period Pm, and the detected data will be corrected by a correction amount ΔL that corresponds to the temperature T at each detection cycle of distance L.
[0069] (Effects and Benefits) The effects and benefits of the first embodiment described above will be explained below.
[0070] According to the first embodiment, in a correction model M for correcting distance L detection data depending on temperature T, the fluctuation range δM of the correction parameter Mp, which defines the degree of dependence of temperature T on the correction amount ΔL of distance L, is monitored. If the fluctuation range δM of the correction parameter Mp falls outside the acceptable range, the stored parameter Mpm, which is stored in memory 51a as the correction parameter Mp, is updated. Therefore, by correcting the detection data with a correction amount ΔL that matches the current temperature Tp for each detection of distance L, according to the correction model M given according to the latest stored parameter Mpm, it becomes possible to output detection data that ensures the detection accuracy of distance L regardless of the passage of time.
[0071] According to the first embodiment, the trial temperature Tt is changed during the monitoring period Pm, in which the fluctuation range δM of the correction parameter Mp is monitored. During the monitoring period Pm, the fluctuation range δM, which is the difference between the trial parameter Mpt (which is the correction parameter Mp used to provide a correction model M according to the trial distance Lt detected by the optical sensor 10 at each point of change in the trial temperature Tt) and the stored parameter Mpm, is monitored. This allows for accurate determination of the trial parameter Mpt when the monitored fluctuation range δM falls outside the acceptable range, based on the trial distance Lt at multiple temperature points, and enables updating of the stored parameter Mpm. Therefore, by correcting the detected data according to the correction model M provided according to the updated stored parameter Mpm, it becomes possible to output detected data with improved distance detection accuracy.
[0072] According to the first embodiment, during the monitoring period Pm set while the mobile body 1 is stopped, the trial temperature Tt is changed, and the trial distance Lt to the stationary target Xt is detected by the optical sensor 10 at each point where the trial temperature Tt changes. This makes effective use of the stationary target Xt, where the distance L remains virtually unchanged relative to the stopped mobile body 1, and allows for accurate monitoring of the fluctuation range δM in the correction parameter Mp of the correction model M based on the trial distance Lt at multiple temperature points. Therefore, when the monitored fluctuation range δM falls outside the acceptable range, the detection data is corrected according to the correction model M, which includes the correction parameter Mp in the latest stored parameter Mpm, thereby enabling the output of detection data that guarantees high detection accuracy of distance L.
[0073] According to the first embodiment, the temperatures Ta, Tb, and Tc of each sensor element constituting the optical sensor 10 are changed as trial temperatures Tt during the monitoring period Pm. Then, the fluctuation range δM, which is the difference between the trial parameter Mpt and the stored parameter Mpm, is monitored for each sensor element, according to the trial distance Lt detected by the optical sensor 10 at each point of change in the trial temperature Tt. Therefore, if the fluctuation range δM corresponding to at least one sensor element falls outside the acceptable range, the stored parameter Mpm is learned using the trial parameter Mpt for each sensor element, and the detected data can be accurately corrected according to the correction model M which includes the learned stored parameter Mpm. Thus, it becomes possible to output detected data that guarantees high detection accuracy of distance L.
[0074] According to the first embodiment, during the steady-state period Psr after the startup period Pss in which the optical sensor 10 is activated, the fluctuation range δM of the steady-state parameter Mpr, which is used as a correction parameter Mp to provide a correction model M, is monitored. Therefore, the stored parameter Mpm is updated with respect to the steady-state parameter Mpr if the fluctuation range δM monitored during the steady-state period Psr falls outside the acceptable range. Thus, by selecting a correction model M given according to the latest stored parameter Mpm with respect to the steady-state parameter Mpr, it is possible to implement a correction suitable for the steady-state period Psr,Pdr in which the state of the optical sensor 10 becomes steady, on the detection data, thereby improving the detection accuracy of the distance L.
[0075] Furthermore, according to the first embodiment, during the activation period Pss in which the optical sensor 10 is activated, the fluctuation range δM of the activation parameter Mps, which is used as a correction parameter Mp to provide a correction model M, is monitored. Therefore, the stored parameter Mpm is updated with respect to the activation parameter Mps when the fluctuation range δM monitored during the activation period Pss falls outside the acceptable range. Thus, during the activation period Pss, a correction model M corresponding to the latest stored parameter Mpm with respect to the activation parameter Mps is selected, enabling the implementation of a correction specifically tailored to the activation period Pss, in which the state of the optical sensor 10 changes moment by moment, for the detected data, thereby improving the detection accuracy of the distance L.
[0076] (Second embodiment) The second embodiment is a modification of the first embodiment.
[0077] As shown in Figure 12, in the control flow of the second embodiment, S2020 is executed instead of S20. Specifically, in S2020, the update block 100 follows the same procedure as in S20 up to the point that if the current detection cycle falls within the startup period Pss set in the monitoring period Pm, at least one of the fluctuation ranges δM for the coefficient parameters As, Bs, and Cs corresponding to a sensor element falls outside the preset allowable range, and the storage parameter Mpm related to the startup parameter Mps as a correction parameter Mp is updated. However, in updating the startup parameter Mps in S2020, the parameter corresponding to the sensor element whose fluctuation range δM is outside the allowable range among the coefficient parameters As, Bs, and Cs is forcibly set to zero (0) as a fault parameter with respect to any of the temperature indices among the temperatures Ta, Tb, and Tc.
[0078] Therefore, in S2020, for normal parameters other than the faulty parameters among the coefficient parameters As, Bs, and Cs that have been updated to zero, the acquisition of trial parameters Mpt is re-executed, for example, by regression analysis, and the stored parameter Mpm is learned based on the results of this re-execution. At this time, the stored parameter Mpm is also learned for the constant parameter Ds based on the acquired trial parameters Mpt. However, for faulty parameters that have been forcibly set to zero with respect to the startup parameter Mps, the acquisition of trial parameters Mpt, monitoring of the fluctuation range δM, and updating of stored parameters Mpm are skipped until the optical sensor 10 is maintained.
[0079] Similarly, in S2020, if the current detection cycle falls within the steady-state period Psr set in the monitoring period Pm, the update block 100 updates the memory parameter Mpm related to the steady-state parameter Mpr as a correction parameter Mp when at least one of the coefficient parameters Ar, Br, and Cr, whose fluctuation range δM falls outside the preset allowable range, is set to zero (0) as a fault parameter for any of the temperature indices Ta, Tb, and Tc that correspond to the sensor element whose fluctuation range δM falls outside the allowable range.
[0080] Therefore, in S2020, for the normal parameters among the coefficient parameters Ar, Br, and Cr, excluding the faulty parameters that have been updated to zero, the acquisition of trial parameters Mpt is re-executed, for example, by regression analysis, and the stored parameter Mpm is learned based on the results of this re-execution. At this time, the stored parameter Mpm is also learned for the constant parameter Dr based on the acquired trial parameters Mpt. However, for the steady-state parameter Mpr, the faulty parameter that has been forcibly set to zero remains at zero, and the acquisition of trial parameters Mpt, monitoring of the fluctuation range δM, and updating of stored parameters Mpm are skipped until the optical sensor 10 is maintained.
[0081] According to the second embodiment described above, the fault parameter, which is the memory parameter Mpm, of the sensor element whose fluctuation range δM falls outside the acceptable range is updated to zero. As a result, the correction model M can be updated so that it is defined by the memory parameter Mpm of the normal sensor element, along with the zero-value fault parameter. Therefore, by correcting the detection data according to the updated correction model M, it becomes possible to output detection data in which the decrease in detection accuracy of distance L can be suppressed.
[0082] (Third embodiment) The third embodiment is a modification of the first embodiment.
[0083] As shown in Figure 13, in the control flow of the third embodiment, S3010 and S3020 are executed instead of S10 and S20. Specifically, in S3010, the update block 100 skips the success or failure determination of the startup monitoring conditions during the startup period Pss, and sets the steady-state period Psr to the monitoring period Pm only if the steady-state monitoring conditions are met. Accordingly, in S3020, the update block 100 skips the acquisition of the trial parameter Mpt, the monitoring of the fluctuation range δM, and the update of the storage parameter Mpm with respect to the startup parameter Mps as the correction parameter M.
[0084] Furthermore, in S3020, the update block 100 follows the procedure in S20 up to the point of focusing on the fluctuation range δM of the steady-state parameter Mpr, which is the correction parameter M, for each coefficient parameter Ar, Br, and Cr corresponding to each sensor element, when the current detection cycle corresponds to the steady-state period Psr set in the monitoring period Pm. However, in S3020, the update block 100 monitors the failure index Ir, which correlates with the fluctuation range δM of the steady-state parameter Mpr, for each coefficient parameter Ar, Br, and Cr corresponding to each sensor element. That is, in the steady-state period Psr, which is the monitoring period Pm in the third embodiment, the failure index Ir, which correlates with the fluctuation range δM of the steady-state parameter Mpr, which is the correction parameter Mp, is monitored for each sensor element.
[0085] In S3020, in the function Ha of equation 5 described in the first embodiment, the failure probability correlated with the fluctuation range δM is assumed by the function I_n of equation 6, either for each coefficient parameter Ar of each term with a different exponent n of temperature Ta (n: index identifying the exponent) in the polynomial, or for the coefficient parameter Ar alone corresponding to the exponent n of temperature Ta in the monomial. Here, the failure probability function I_n is defined to represent a state in which the probability of failure due to, for example, aging deterioration of the corresponding sensor element increases as the fluctuation range δM of the coefficient parameter Ar increases.
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[0086] Therefore, in S3020, if the function Ha in equation 5 is a polynomial, the calculated values of the failure probability function I_n for each coefficient parameter Ar with different exponents n of temperature Ta are treated as multiple variables in the index function I_N (e.g., a weighted average function) in equation 6, and the failure index Ir of the sensor element corresponding to each of these exponents n coefficient parameters Ar is monitored according to the index function I_N. Alternatively, if the function Ha in equation 5 is a monomial, the calculated value of the failure probability function I_n for a single coefficient parameter Ar corresponding to the exponent n of temperature Ta is treated as a single variable in the index function I_N (e.g., a proportional function with a proportionality constant of 1) in equation 6, and the failure index Ir of the sensor element corresponding to that single coefficient parameter Ar is monitored according to the index function I_N. In either case, the index function I_N that gives the failure index Ir is defined such that its calculated value increases in line with the increase in the failure probability according to function I_n. Accordingly, in the functions Hb and Hc of equation 5 described in the first embodiment, the failure index Ir is monitored from the failure probability correlated with the fluctuation range δM, either for each coefficient parameter Br and Cr of each term with different exponents n of the corresponding temperatures Tb and Tc in the polynomial, or for each coefficient parameter Br and Cr corresponding to the exponent n of the corresponding temperatures Tb and Tc in the monomial.
[0087] Through this monitoring, in S3020, if the failure index Ir corresponding to at least one sensor element among the failure index Ir for each coefficient parameter Ar, Br, and Cr increases outside the preset tolerance range, the update block 100 performs fail-safe processing. In detail, the fail-safe processing of S3020 includes notification processing and control adjustment processing. In the notification processing of S3020, data representing failure notification information, which notifies the mobile body 1 on which the sensor element in the optical sensor 10 has a failure index Ir outside the tolerance range, is output as diagnostic data from the control unit 51.
[0088] Along with this notification process, in the control adjustment process of S3020, the control parameters for controlling the sensor element in the optical sensor 10 whose failure index Ir is outside the acceptable range are adjusted to the recovery side to restore the failure state of the sensor element outside the acceptable range. At this time, if the failure index Ir corresponding to a different exponent n or a single coefficient parameter Ar is outside the acceptable range, the light source unit 22 of the light emission unit 21 which is determined to be a sensor element in a faulty state may be adjusted as a control parameter for each light source element 24, for example, by increasing or decreasing the light emission power to the recovery side of the failure state.
[0089] Furthermore, in this case, if the failure index Ir corresponding to a different exponent n or a single coefficient parameter Br falls outside the acceptable range, the light receiving detection unit 45 of the light receiving unit 41, which is determined to be a faulty sensor element, may be adjusted by the output circuit 47 as a control parameter for each light receiving pixel 46, for example, by raising or lowering the light receiving sensitivity of the light receiving element 460 toward the recovery side of the faulty state. Furthermore, if the control unit 51 determines that a sensor element is in a faulty state when the index n is different or the fault index Ir corresponding to a single coefficient parameter Cr falls outside the acceptable range, the control adjustment process may be skipped and the notification process may be performed independently.
[0090] (Effects and Benefits) The effects and advantages of the third embodiment described above will be explained below.
[0091] According to the third embodiment, in a correction model M for correcting distance L detection data depending on temperature T, a failure index Ir correlated with the fluctuation range δM of a correction parameter Mp that defines the degree of dependence of temperature T on the correction amount ΔL of distance L is monitored. When the failure index Ir falls outside the acceptable range, the state of the optical sensor 10 is considered a failure state, and failure notification information notifying the said failure state is output. In this way, the optical sensor 10 can be accurately notified of the failure state by the failure notification information. Conversely, in a normal state without such notification, the detection data is corrected according to the current temperature Tp for each distance L detection according to the correction model M, thereby enabling the output of detection data in which the detection accuracy of distance L can be ensured.
[0092] Furthermore, according to the third embodiment, the state of the optical sensor 10 in which the failure index Ir is outside the acceptable range is considered a failure state, and the control parameters for controlling the optical sensor 10 are adjusted to the recovery side of the failure state. In this way, the optical sensor 10 can recover from the failure state by adjusting the control parameters, and under this recovery, the detection data is corrected according to the current temperature Tp for each detection of distance L according to the correction model M, so it can be said that it is possible to output detection data in which the detection accuracy of distance L can be ensured.
[0093] According to the third embodiment, the trial temperature Tt is changed during the monitoring period Pm, in which the failure index Ir, which correlates with the fluctuation range δM of the correction parameter Mp, is monitored. In this case, the difference between the trial parameter Mpt, which is the correction parameter Mp that provides the correction model M according to the trial distance Lt detected by the optical sensor 10 at each point of change in the trial temperature Tt during the monitoring period Pm, and the memory parameter Mpm is considered as the fluctuation range δM. With this, when the failure index Ir, which is monitored in correlation with the fluctuation range δM, falls outside the acceptable range, it is possible to appropriately determine whether or not to output failure notification information based on the fluctuation of the trial parameter Mpt based on the trial distance Lt at multiple temperature points.Therefore, since the failure state can be accurately notified by failure notification information, conversely, under normal conditions, the detection data is corrected according to the correction model M, making it possible to output detection data in which the detection accuracy of distance L can be ensured.
[0094] According to the third embodiment, during the monitoring period Pm set while the mobile body 1 is stopped, the trial temperature Tt is changed, and the trial distance Lt to the stationary target Xt is detected by the optical sensor 10 at each point where the trial temperature Tt changes. This makes effective use of the stationary target Xt, where the distance L remains virtually unchanged relative to the stopped mobile body 1, and allows the fluctuation range δM that occurs in the correction parameter Mp of the correction model M to be accurately grasped based on the trial distance Lt at multiple temperature points and reflected in the failure index Ir. Therefore, when the monitored failure index Ir is within an acceptable range, the detected data is corrected according to the correction model M which includes the normal correction parameter Mp, so that the detection accuracy of distance L can be ensured and the output of detected data is possible.
[0095] According to the third embodiment, the temperatures Ta, Tb, and Tc of each sensor element constituting the optical sensor 10 are changed as trial temperatures Tt during the monitoring period Pm. During the monitoring period Pm, a failure index Ir correlated with the fluctuation range δM, which is the difference between the trial parameter Mpt and the memory parameter Mpm, is monitored for each sensor element. Therefore, if the failure index Ir corresponding to at least one sensor element falls outside the acceptable range, the fluctuation of the trial parameter Mpt based on the trial distance Lt at multiple temperature points can be examined for each sensor element to accurately determine whether or not to output failure notification information. Thus, since a sensor element in a faulty state can be accurately notified by failure notification information, conversely, under normal conditions, the detection data is corrected according to the correction model M, making it possible to output detection data in which the detection accuracy of distance L can be ensured.
[0096] (Fourth embodiment) The fourth embodiment is a modified version that combines the third embodiment with the second embodiment.
[0097] As shown in Figure 14, in the control flow of the fourth embodiment, S4020 is executed instead of S3020. Specifically, in S4020, the update block 100 follows the same procedure as in S3020 until it performs a notification process as a fail-safe process if the current detection cycle falls within the steady-state period Psr set in the monitoring period Pm, and at least one of the failure indices Ir for each coefficient parameter Ar, Br, and Cr that corresponds to a sensor element falls outside the preset acceptable range. However, in the fail-safe process in S4020, the update process for the steady-state parameter Mpr, which has been partially modified in the second embodiment, is performed together with the notification process. That is, in the update process of S4020, the parameter corresponding to the sensor element whose failure indice Ir correlated with the fluctuation range δM among the coefficient parameters Ar, Br, and Cr falls outside the acceptable range is forcibly set to zero (0) as a failure parameter for any of the temperature indices among the temperatures Ta, Tb, and Tc that correspond to the temperature.
[0098] Therefore, in the update process of S4020, for the normal parameters among the coefficient parameters Ar, Br, and Cr, excluding the fault parameters that have been updated to zero, the acquisition of trial parameters Mpt by, for example, regression analysis is re-executed, and the stored parameter Mpm is learned based on the results of this re-execution. At this time, the stored parameter Mpm is also learned for the constant parameter Dr based on the acquired trial parameters Mpt. However, for the steady-state parameter Mpr, the fault parameter that has been forcibly set to zero remains at zero, and the acquisition of trial parameters Mpt, monitoring of the fault index Ir, and updating of stored parameters Mpm are skipped until the optical sensor 10 is maintained.
[0099] According to the fourth embodiment described above, the fault parameter, which is the memory parameter Mpm, of a sensor element whose fault index Ir is outside the acceptable range is updated to zero. As a result, the correction model M can be updated so that it is defined by the zero-value fault parameter and the memory parameter Mpm of a normal sensor element. Therefore, even if a sensor element has been initially notified by fault notification information, the detection data is corrected according to the updated correction model M, making it possible to output detection data in which the decrease in detection accuracy of distance L can be suppressed.
[0100] (Other embodiments) Although several embodiments have been described above, this disclosure is not limited to those embodiments and can be applied to various embodiments without departing from the gist of this disclosure.
[0101] In the modified embodiments of the first to fourth embodiments, the dedicated computer constituting the control device as the control unit 51 may have at least one of the digital circuit and the analog circuit as a processor. Here, the digital circuit is at least one of the following: ASIC (Application Specific Integrated Circuit), FPGA (Field Programmable Gate Array), SOC (System on a Chip), PGA (Programmable Gate Array), and CPLD (Complex Programmable Logic Device). Furthermore, such a digital circuit may have a memory that stores a program.
[0102] In the control flow of the modified versions of the first and second embodiments, in S10, the determination of whether the startup period Pss is set in the monitoring period Pm is omitted, and the updating of the startup parameter Mps by monitoring in S20 and S2020 may be omitted. In the control flow of the first and second embodiments to which such modified versions that omit the startup period determination and update are applied, in S40, the correction itself by reading the stored parameter Mpm related to the startup parameter Mps may be omitted. In the control flow of the first and second embodiments to which the modified versions that omit the startup period determination and update are applied, in S40, the correction by reading the stored parameter Mpm related to the startup parameter Mps may be performed instead of the correction by reading the stored parameter Mpm related to the startup parameter Mps.
[0103] In the control flow of the modified versions of the first and second embodiments, in S10, the determination of whether the steady period Psr set in the monitoring period Pm is applicable may be omitted, and the updating of the steady-state parameter Mpr by monitoring in S20 and S2020 may also be omitted. In the control flow of the first and second embodiments to which such modified versions that omit the determination and updating of the steady period are applied, in S40, the correction itself by reading the stored parameter Mpm related to the steady-state parameter Mpr may also be omitted.
[0104] In the control flows of the modified versions of the first and second embodiments, in S20 and S2020, one or two of the coefficient parameters As, Bs, and Cs may be unexpected as startup parameters Mps during the startup period Pss set in the monitoring period Pm. In the control flows of the first and second embodiments to which such unexpected startup parameters Mps are applied, in S20 and S2020, the stored parameter Mpm may be updated according to the variation range δM which is the difference from the trial parameter Mpt for at least one of the coefficient parameters As, Bs, and Cs that is expected to be the startup parameter Mps. Furthermore, in S40 of the control flow to which the modified version with unexpected startup parameters Mps is applied, at least one of the temperatures Ta, Tb, and Tc is acquired as the current temperature Tp corresponding to at least one of the coefficient parameters As, Bs, and Cs that is expected to be the startup parameter Mps, and correction may be performed by reading the stored parameter Mpm related to the startup parameter Mps.
[0105] In the control flows of the modified examples of the first to fourth embodiments, in steps S20, S2020, S3020, and S4020, one or two of the coefficient parameters Ar, Br, and Cr may be unexpected as steady-state parameters Mpr during the steady-state period Psr set in the monitoring period Pm. In the control flows of the first to fourth embodiments to which such modified examples with unexpected steady-state parameters Mpr are applied, in steps S20, S2020, S3020, and S4020, the stored parameter Mpm may be updated according to the fluctuation range δM which is the difference from the trial parameter Mpt, with respect to at least one of the coefficient parameters Ar, Br, and Cr that is assumed to be a steady-state parameter Mpr. Furthermore, in step S40 of the control flows to which the modified examples with unexpected steady-state parameters Mpr are applied, at least one of the temperatures Ta, Tb, and Tc is acquired as the current temperature Tp corresponding to at least one of the coefficient parameters Ar, Br, and Cr that is assumed to be a steady-state parameter Mpr, and correction may be performed by reading the stored parameter Mpm related to the said steady-state parameter Mpr.
[0106] In the control flows of the modified examples according to the first and second embodiments, in S20 and S2020, the distance L to a specific reflector inside the housing 11 may be detected as the trial distance Lt instead of the distance L to a stationary target Xt during the startup period Pss set in the monitoring period Pm. In the control flows of the modified examples according to the first to fourth embodiments, in S20, S2020, S3020, and S4020, the distance L to a specific reflector inside the housing 11 may be detected as the trial distance Lt instead of the distance L to a stationary target Xt during the steady-state period Psr set in the monitoring period Pm.
[0107] In the modified embodiments of the first to fourth embodiments, the control device that executes the control method and control program described above as a control unit 51, and the mobile body 1 to which the optical sensor 10 equipped therewith is applied, may be, for example, an autonomous mobile robot capable of transporting luggage or collecting information by autonomous driving or remote driving. In the modified embodiments of the first to fourth embodiments, the target of application of the control device that executes the control method and control program described above as a control unit 51, and the optical sensor 10 equipped therewith, may be infrastructure equipment such as smart poles, in addition to the mobile body 1.
[0108] In the first and second embodiments, in the control flow S20 and S2020 of the control flow for controlling the optical sensor 10 applied to the infrastructure equipment as described above, the distance L to a specific point on the ground may be detected as the trial distance Lt in the startup period Pss set in the monitoring period Pm, instead of the distance L to a stationary target Xt. In the first to fourth embodiments, in the control flow S20, S2020, S3020, and S4020 of the control flow for controlling the optical sensor 10 applied to the infrastructure equipment, the distance L to a specific point on the ground may be detected as the trial distance Lt in the steady period Psr set in the monitoring period Pm, instead of the distance L to a stationary target Xt.
[0109] In the modifications relating to the third and fourth embodiments, the fluctuation range δM itself may be monitored as a failure index Ir correlated with the fluctuation range δM that is the focus of attention in S3020 and S4020. In the modifications relating to the fourth embodiment, in the update process when the failure index Ir falls outside the acceptable range in S4020, the update of the memory parameter Mpm may be performed in accordance with the first embodiment. In the modifications relating to the third and fourth embodiments, the notification process in S3020 and S4020 may be skipped. In the modifications relating to the third embodiment, the control adjustment process in S3020 may be skipped. In the modifications relating to the third and fourth embodiments, control in accordance with the above description may be performed in addition to or instead of the steady-state period Psr, in the startup period Pss. In addition to the forms described so far, the first to fourth embodiments and each of the above modifications may be implemented in the form of a semiconductor device (e.g., a semiconductor chip) as the control unit 51.
[0110] (Additional note) This specification discloses several technical concepts and several combinations thereof, as listed below. The symbols in parentheses in this supplementary section indicate correspondences with the specific means described in the embodiments detailed above, and do not limit the technical scope of this disclosure.
[0111] (Technical thought 1) A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), and outputs detection data that detects the distance (L) to the target, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance (L) to the target, The aforementioned processor, In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the distance correction amount (ΔL) on temperature is monitored, and the storage parameter (Mpm) stored as the correction parameter in the storage medium (51a) is updated when the fluctuation range falls outside the acceptable range. A control device configured to perform the following actions: correct the detection data by a correction amount corresponding to the temperature at each detection of the distance, according to the correction model given in accordance with the latest memory parameters.
[0112] (Technical thought 2) Updating the memory parameters by monitoring the fluctuation range means When the fluctuation range of the startup parameter (Mps), which is monitored as the correction parameter that gives the correction model for the startup period (Pss) during which the optical sensor is activated, falls outside the acceptable range, the stored parameter related to the startup parameter is updated. This includes updating the memory parameter relating to the steady-state parameter when the fluctuation range of the steady-state parameter (Mpr), which is monitored as the correction parameter that gives the correction model for the steady-state period (Psr, Pdr) during which the optical sensor enters a steady state after the startup period, falls outside the acceptable range. Correcting the aforementioned detection data is Selecting the correction model given according to the latest memory parameter with respect to the startup parameter, and correcting the detection data for the startup period, A control device according to technical idea 1, which includes selecting the correction model given according to the latest memory parameter with respect to the steady-state parameter and correcting the detection data for the steady-state period.
[0113] (Technical Thought 3) Updating the memory parameters by monitoring the fluctuation range means The trial temperature (Tt), which is the temperature during the monitoring period (Pm) for monitoring the aforementioned fluctuation range, is changed. During the monitoring period, the following is done: monitoring the fluctuation range, which is the difference between the trial parameter (Mpt), which is the correction parameter used to provide the correction model according to the distance detected by the optical sensor at each change point of the trial temperature, and the stored parameter; A control device according to technical concept 1 or 2, which includes updating the memory parameter with the trial parameter when the fluctuation range falls outside the acceptable range.
[0114] (Technical Thought 4) An optical sensor configured to be mounted on a mobile body (1), Updating the memory parameters by monitoring the fluctuation range means The trial temperature is changed during the monitoring period set while the moving body is stopped. The control device according to technical concept 3, which includes causing the optical sensor to detect the distance to the stationary target for each point of change in the trial temperature during the monitoring period while the device is stopped.
[0115] (Technical Thought 5) Updating the memory parameters by monitoring the fluctuation range means The temperature of each sensor element constituting the optical sensor is changed during the monitoring period as the trial temperature, During the monitoring period, the variation range, which is the difference between the trial parameter and the stored parameter, is monitored for each sensor element, according to the distance detected by the optical sensor at each point of change in the trial temperature to determine the correction model. A control device according to technical idea 3 or 4, which includes performing learning of the memory parameters using the trial parameters for each sensor element when the variation range corresponding to at least one of the sensor elements falls outside the permissible range.
[0116] (Technical Thought 6) Updating the memory parameters by monitoring the fluctuation range means The control device according to technical concept 5, which includes updating the memory parameter of the sensor element whose fluctuation range has fallen outside the allowable range to a zero value.
[0117] (Technical Thought 7) A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), and outputs detection data that detects the distance (L) to the target, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance (L) to the target, The aforementioned processor, In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the following is performed: monitoring a failure index (Ir) correlated with the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the temperature on the correction amount (ΔL) of the distance; A control device configured to output fault notification information indicating a fault state, where the state of the optical sensor is outside the acceptable range of the fault indicators.
[0118] (Technical Thought 8) Monitoring the aforementioned failure indicators means The trial temperature (Tt), which is the temperature during the monitoring period (Pm) for monitoring the aforementioned failure indicator, is changed. The control device according to technical concept 7, which includes monitoring the failure index that correlates with the fluctuation range, which is the difference between the trial parameter (Mpt) as a correction parameter that gives the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period, and the storage parameter (Mpm) stored in the storage medium (51a) as the correction parameter.
[0119] (Technical Thought 9) Monitoring the aforementioned failure indicators means The temperature of each sensor element constituting the optical sensor is changed during the monitoring period as the trial temperature, This includes monitoring for each sensor element the failure index which correlates with the fluctuation range, which is the difference between the trial parameter and the stored parameter, according to the distance detected by the optical sensor at each change point of the trial temperature during the monitoring period, to which the correction model is applied. Outputting the aforementioned failure notification information means The control device according to technical concept 8, which includes outputting fault notification information that notifies the state of the sensor element in which the fault indicator has fallen outside the acceptable range as the fault state.
[0120] (Technical Thought 10) The aforementioned processor, The control device according to technical concept 9, further configured to update the memory parameter to zero for the sensor element whose failure indicator has fallen outside the acceptable range.
[0121] (Technical Thought 11) The aforementioned processor, A control device according to any one of technical ideas 7 to 9, further configured to adjust control parameters for controlling the optical sensor when the failure indicator falls outside the acceptable range and the failure state of the optical sensor recovers.
[0122] (Technical Thought 12) A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), and outputs detection data that detects the distance (L) to the target, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance (L) to the target, The aforementioned processor, In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the following is performed: monitoring a failure index (Ir) correlated with the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the temperature on the correction amount (ΔL) of the distance; A control device configured to perform the following actions: when the state of the optical sensor in which the failure indicator falls outside the acceptable range is considered a failure state, adjust the control parameters for controlling the optical sensor to the recovery side of the failure state.
[0123] (Technical Thought 13) Monitoring the aforementioned failure indicators means The trial temperature (Tt), which is the temperature during the monitoring period (Pm) for monitoring the aforementioned failure indicator, is changed. A control device according to technical idea 12, which includes monitoring the failure index that correlates with the fluctuation range, which is the difference between the trial parameter (Mpt) as a correction parameter that gives the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period, and the storage parameter (Mpm) stored in the storage medium (51a) as the correction parameter.
[0124] (Technical Thought 14) Monitoring the aforementioned failure indicators means The temperature of each sensor element constituting the optical sensor is changed during the monitoring period as the trial temperature, This includes monitoring for each sensor element the failure index which correlates with the fluctuation range, which is the difference between the trial parameter and the stored parameter, according to the distance detected by the optical sensor at each change point of the trial temperature during the monitoring period, to which the correction model is applied. Adjusting the aforementioned control parameters means A control device according to technical concept 13, which includes adjusting the control parameters for controlling the sensor element whose failure indicator has fallen outside the acceptable range to the recovery side of the failure state.
[0125] (Technical Thought 15) Adjusting the aforementioned control parameters means The control device according to technical concept 14, which includes adjusting the control parameters for controlling the light-emitting unit (21) that emits the light-emitting beam to the recovery side of the fault condition, as the sensor element whose failure indicator has fallen outside the acceptable range.
[0126] (Technical Thought 16) Adjusting the aforementioned control parameters means A control device according to technical concept 14 or 15, which includes adjusting the control parameters for controlling the light receiving unit (41) that receives the reflected beam as the sensor element whose failure indicator has fallen outside the acceptable range, to the side of recovery from the failure state.
[0127] (Technical Thought 17) An optical sensor configured to be mounted on a mobile body (1), Monitoring the aforementioned failure indicators means The trial temperature is changed during the monitoring period set while the moving body is stopped. A control device according to any one of the technical ideas 8-11, 13-16, which includes causing the optical sensor to detect the distance to the stationary target for each point of change in the trial temperature during the monitoring period while stopped. (Technical Thought 18) An optical sensor that receives a reflected beam (RB) from a target (Xt) to a light beam (PB) projected onto a detection area (DA), detects the distance (L) to the target, and outputs detection data, The control device is configured to include any one of the technical concepts described in items 1 to 17, and comprises a control unit (51) that generates the detection data, A light-emitting unit (21) that emits the light-emitting beam according to the control of the control unit, An optical sensor comprising a light-receiving unit (41) that receives the reflected beam according to the control of the control unit.
[0128] Furthermore, the technical concepts 1 to 18 described above may also be understood within the respective technical concepts of the methods and programs. [Explanation of Symbols]
[0129] 1: Moving body, 10: Optical sensor, 21: Light emitter, 41: Light receiver, 51: Control unit, 51a: Memory, 51b: Processor, DA: Detection area, Ir: Fault index, L: Distance, M: Correction model, Mp: Correction parameter, Mpm: Memory parameter, Mpr: Steady-state parameter, Mps: Startup parameter, Mpt: Trial parameter, PB: Light emitter beam, Pm: Monitoring period, Psr, Pdr: Steady-state period, Pss: Startup period, RB: Reflected beam, T: Temperature, Tt: Trial temperature, Xt: Target, ΔL: Correction amount, δM: Variation range
Claims
1. A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), and outputs detection data that detects the distance (L) to the target, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance (L) to the target, The aforementioned processor, In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the distance correction amount (ΔL) on temperature is monitored, and the storage parameter (Mpm) stored as the correction parameter in the storage medium (51a) is updated when the fluctuation range falls outside the acceptable range. A control device configured to perform the following actions: correct the detection data by a correction amount corresponding to the temperature at each detection of the distance, according to the correction model given in accordance with the latest memory parameters.
2. Updating the memory parameters by monitoring the fluctuation range means When the fluctuation range of the startup parameter (MPs), which is monitored as the correction parameter that gives the correction model for the startup period (Pss) during which the optical sensor is activated, falls outside the acceptable range, the stored parameter related to the startup parameter is updated. This includes updating the memory parameter related to the steady-state parameter when the fluctuation range of the steady-state parameter (Mpr), which is monitored as the correction parameter that gives the correction model for the steady-state period (Psr, Pdr) during which the optical sensor enters a steady state after the startup period, falls outside the acceptable range. Correcting the aforementioned detection data is Selecting the correction model given according to the latest memory parameter with respect to the startup parameter, and correcting the detection data for the startup period, The control device according to claim 1, further comprising selecting the correction model given according to the latest memory parameter relating to the steady-state parameter, and correcting the detection data for the steady-state period.
3. Updating the memory parameters by monitoring the fluctuation range means The trial temperature (Tt), which is the temperature during the monitoring period (Pm) for monitoring the aforementioned fluctuation range, is changed. During the monitoring period, the following is done: monitoring the fluctuation range, which is the difference between the trial parameter (Mpt) used as the correction parameter and the stored parameter, according to the distance detected by the optical sensor at each change point of the trial temperature; The control device according to claim 1 or 2, further comprising updating the memory parameter with the trial parameter when the fluctuation range falls outside the acceptable range.
4. The optical sensor is configured to be mounted on the mobile body (1), Updating the memory parameters by monitoring the fluctuation range means The trial temperature is changed during the monitoring period set while the moving body is stopped. The control device according to claim 3, further comprising using the optical sensor to detect the distance to the stationary target for each point of change in the trial temperature during the monitoring period while the device is stopped.
5. Updating the memory parameters by monitoring the fluctuation range means The temperature of each sensor element constituting the optical sensor is changed during the monitoring period as the trial temperature, During the monitoring period, the variation range, which is the difference between the trial parameter and the stored parameter, is monitored for each sensor element, according to the distance detected by the optical sensor at each change point of the trial temperature, to provide the correction model based on that distance. The control device according to claim 3, further comprising learning the memory parameters using the trial parameters for each sensor element when the variation range corresponding to at least one of the sensor elements falls outside the acceptable range.
6. Updating the memory parameters by monitoring the fluctuation range means The control device according to claim 5, which includes updating the memory parameter of the sensor element whose fluctuation range has fallen outside the allowable range to zero.
7. A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), and outputs detection data that detects the distance (L) to the target, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance (L) to the target, The aforementioned processor, In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the following is performed: monitoring a failure index (Ir) correlated with the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the temperature on the correction amount (ΔL) of the distance; A control device configured to output fault notification information indicating a fault state, where the state of the optical sensor is outside the acceptable range of the fault indicators.
8. Monitoring the aforementioned failure indicators means The trial temperature (Tt), which is the temperature during the monitoring period (Pm) for monitoring the aforementioned failure indicator, is changed. The control device according to claim 7, which includes monitoring the failure index that correlates with the fluctuation range, which is the difference between the trial parameter (Mpt) as a correction parameter that gives the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period, and the storage parameter (Mpm) stored in the storage medium (51a) as the correction parameter.
9. Monitoring the aforementioned failure indicators means The temperature of each sensor element constituting the optical sensor is changed during the monitoring period as the trial temperature, This includes monitoring for each sensor element the failure index which correlates with the fluctuation range, which is the difference between the trial parameter and the stored parameter, according to the distance detected by the optical sensor at each change point of the trial temperature during the monitoring period, to which the correction model is applied. Outputting the aforementioned failure notification information means The control device according to claim 8, further comprising outputting fault notification information that notifies the state of the sensor element in which the fault indicator has fallen outside the acceptable range as the fault state.
10. The aforementioned processor, The control device according to claim 9, further configured to update the memory parameter to zero for the sensor element whose failure indicator has fallen outside the acceptable range.
11. The aforementioned processor, The control device according to claim 7, further configured to adjust control parameters for controlling the optical sensor when the failure indicator falls outside the acceptable range and the failure state of the optical sensor is recovered.
12. A control device having a processor (51b) for controlling an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), and outputs detection data that detects the distance (L) to the target, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance (L) to the target, The aforementioned processor, In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the following is performed: monitoring a failure index (Ir) correlated with the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the temperature on the correction amount (ΔL) of the distance; A control device configured to perform the following actions: when the state of the optical sensor in which the failure indicator falls outside the acceptable range is considered a failure state, adjust the control parameters for controlling the optical sensor to the recovery side of the failure state.
13. Monitoring the aforementioned failure indicators means The trial temperature (Tt), which is the temperature during the monitoring period (Pm) for monitoring the aforementioned failure indicator, is changed. The control device according to claim 12, which includes monitoring the failure index that correlates with the fluctuation range, which is the difference between the trial parameter (Mpt) as a correction parameter that gives the correction model according to the distance detected by the optical sensor for each change point of the trial temperature during the monitoring period, and the storage parameter (Mpm) stored in the storage medium (51a) as the correction parameter.
14. Monitoring the aforementioned failure indicators means The temperature of each sensor element constituting the optical sensor is changed during the monitoring period as the trial temperature, This includes monitoring for each sensor element the failure index which correlates with the fluctuation range, which is the difference between the trial parameter and the stored parameter, according to the distance detected by the optical sensor at each change point of the trial temperature during the monitoring period, to which the correction model is applied. Adjusting the aforementioned control parameters means The control device according to claim 13, which includes adjusting the control parameter for controlling the sensor element whose failure indicator has fallen outside the acceptable range to the recovery side of the failure state.
15. Adjusting the aforementioned control parameters means The control device according to claim 14, which includes adjusting the control parameters for controlling the light-emitting unit (21) that emits the light-emitting beam as the sensor element whose failure indicator has fallen outside the acceptable range, to the recovery side of the failure state.
16. Adjusting the aforementioned control parameters means The control device according to claim 14, which includes adjusting the control parameters for controlling the light receiving unit (41) that receives the reflected beam as the sensor element whose failure indicator has fallen outside the acceptable range, to the recovery side of the failure state.
17. The optical sensor is configured to be mounted on a mobile body (1), Monitoring the aforementioned failure indicators means The trial temperature is changed during the monitoring period set while the moving body is stopped. The control device according to claim 8 or 13, further comprising using the optical sensor to detect the distance to the stationary target for each point of change in the trial temperature during the monitoring period while the device is stopped.
18. An optical sensor that receives a reflected beam (RB) from a target (Xt) relative to a projected beam (PB) projected into a detection area (DA), and outputs detection data that detects the distance (L) to the target, A control device according to any one of claims 1, 2, 7, or 12, comprising a control unit (51) that generates the detection data, A light-emitting unit (21) that emits the light-emitting beam according to the control of the control unit, An optical sensor comprising a light receiving unit (41) that receives the reflected beam according to the control of the control unit.
19. A control method performed by a processor (51b) to control an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), detects the distance (L) to the target, and outputs detection data, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance (L) to the target, and In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the distance correction amount (ΔL) on temperature is monitored, and the storage parameter (Mpm) stored as the correction parameter in the storage medium (51a) is updated when the fluctuation range falls outside the acceptable range. A control method comprising correcting the detection data by a correction amount corresponding to the temperature at each detection of the distance, according to the correction model given according to the latest memory parameters.
20. A control method performed by a processor (51b) to control an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), detects the distance (L) to the target, and outputs detection data, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance (L) to the target, and In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the following is performed: monitoring a failure index (Ir) correlated with the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the temperature on the correction amount (ΔL) of the distance; A control method that includes determining the state of the optical sensor when the failure indicator falls outside the acceptable range as a failure state, and outputting failure notification information to notify of said failure state.
21. A control method performed by a processor (51b) to control an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA), detects the distance (L) to the target, and outputs detection data, wherein the optical sensor (10) receives the reflected beam (RB) from a target (Xt) and outputs detection data, the distance (L) to the target, and In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the following is performed: monitoring a failure index (Ir) correlated with the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the temperature on the correction amount (ΔL) of the distance; A control method comprising: defining the state of the optical sensor when the failure indicator falls outside the acceptable range as a failure state, and adjusting the control parameters for controlling the optical sensor to the recovery side of the failure state.
22. A control program is stored in a storage medium (51a) and includes instructions to be executed by a processor (51b) in order to control an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA) and detects the distance (L) to the target, and outputs detection data. In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the distance correction amount (ΔL) on temperature is monitored, and the storage parameter (Mpm) stored as the correction parameter in the storage medium (51a) is updated when the fluctuation range falls outside the acceptable range. A control program including an instruction to perform the following: correct the detected data by a correction amount corresponding to the temperature at each detection of the distance, according to the correction model given according to the latest memory parameters.
23. A control program is stored in a storage medium (51a) and includes instructions to be executed by a processor (51b) in order to control an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA) and detects the distance (L) to the target, and outputs detection data. In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the following is performed: monitoring a failure index (Ir) correlated with the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the temperature on the correction amount (ΔL) of the distance; A control program including the command to cause the optical sensor to output fault notification information indicating a fault state, where the fault indicator falls outside the acceptable range.
24. A control program is stored in a storage medium (51a) and includes instructions to be executed by a processor (51b) in order to control an optical sensor (10) that receives a reflected beam (RB) from a target (Xt) to a light-emitting beam (PB) projected onto a detection area (DA) and detects the distance (L) to the target, and outputs detection data. In a correction model (M) for correcting the detected distance data in a temperature (T) dependent manner, the following is performed: monitoring a failure index (Ir) correlated with the fluctuation range (δM) of a correction parameter (Mp) that defines the degree of dependence of the temperature on the correction amount (ΔL) of the distance; A control program that includes the command to cause the optical sensor to be in a state where the failure indicator is outside the acceptable range, and to adjust the control parameters for controlling the optical sensor to the side that recovers from the failure state.