Method, device and program for diagnosing deterioration of electrical equipment including insulation

Abstract

A technology for improving the accuracy of diagnosing the deterioration state of insulators of high-voltage electrical equipment is disclosed. The processing executed by the processor of the deterioration diagnosis device includes a step of creating a first database (correction coefficient database) (S710), a step of creating a second database (diagnosis database) (S720), a step of acquiring a resistance value of the insulator to be diagnosed (S730), a step of estimating the surface resistivity of the insulator to be diagnosed (S740), a step of creating a deterioration line representing the deterioration of the surface resistivity based on the surface resistivity and the surface resistivity of a new or unused insulator made of the same material as the insulator to be diagnosed (S750), a step of calculating the lifespan of the insulator to be diagnosed from the intersection of the deterioration line and a predetermined threshold value (S760), and a step of calculating the remaining lifespan of the insulator to be diagnosed by subtracting the number of years of use at the time of measurement or the number of years elapsed since the installation of the insulation deterioration sensor from the lifespan (S770).

Description

Technical Field

[0001] The present disclosure relates to a technique for diagnosing deterioration of an insulator, and more particularly to a technique for diagnosing deterioration of an insulator used in an electrical device.

Background Art

[0002] Switch gears, molded transformers, and other high-voltage electrical devices are facilities that play a role in supplying electrical energy to factories and buildings, and are required to operate with reliability and stability ensured over a long period. The insulators used in high-voltage electrical devices deteriorate due to long-term use. When an electrical trouble occurs due to this, the impact on production equipment or buildings, such as production losses or equipment repair, becomes large. Therefore, a technique for accurately diagnosing the deterioration of the insulators used in high-voltage electrical devices is desired.

[0003] The deterioration of the insulators used in high-voltage electrical devices is considered to proceed through the following process. (1) Dust and gases (NOx (nitrogen oxides), SOx (sulfur oxides)) floating in the installation environment of the insulator adhere to the insulator, thereby reducing the surface resistivity of the insulator. Also, when the humidity is high or the temperature is high, the surface resistivity of the insulator decreases. (2) Local dry zones are formed in the insulator due to Joule heat caused by leakage current. (3) Scintillation discharge occurs due to voltage concentration in the dry zones. (4) The organic matter of the insulator is carbonized by the discharge to form a conduction path, leading to insulation breakdown.

[0004] In order to prevent an electrical trouble from occurring due to the occurrence of insulation breakdown, it is necessary to grasp the deterioration state (insulator surface state) of the insulators used in high-voltage electrical devices and to carry out maintenance and renewal planly. Therefore, it is important to quantitatively and accurately grasp the degree of deterioration (insulator surface state) of the insulators used in high-voltage electrical devices and to diagnose the deterioration of high-voltage electrical devices.

[0005] For example, Japanese Patent No. 3078723 (Patent Document 1) discloses a technology relating to "a measurement method and a measuring apparatus for measuring the amount of contaminants adhering to the surface of outdoor structures such as insulators that support electric wires." [Prior art documents] [Patent Documents]

[0006] [Patent Document 1] Patent No. 3078723 [Overview of the project] [Problems that the invention aims to solve]

[0007] According to the technology disclosed in Patent Document 1, when measuring the surface condition (amount of contaminants attached) of an insulator, all ions dissolved in the aqueous solvent affect the measured electrical resistance value. Therefore, it is not possible to evaluate only the influence of ion species that affect the deterioration of the insulator, and there was room for further improvement in order to evaluate the deterioration state of the insulator with higher accuracy.

[0008] This disclosure is made in light of the above-mentioned background, and one of its objectives is to provide a technology for evaluating the degradation state of insulators with higher accuracy. Another objective is to provide a technology for diagnosing degradation with higher accuracy by considering only the influence of ion species that affect insulation degradation. [Means for solving the problem]

[0009] According to one embodiment, a method is provided that is performed by a computer to diagnose the deterioration of electrical equipment including an insulator. The method includes the steps of: accessing a first database having resistance values ​​obtained by applying electrodes to adhesives immersed in an aqueous solvent and attached to insulators of different degrees of deterioration, and correction coefficients that take into account the amount of ions that affect the insulation deterioration from the results of an analysis of the amount of ions dissolved in the adhesive; accessing a second database showing the relationship between a converted value calculated for a previously obtained resistance value, taking into account the amount of ions that affect the insulation deterioration using the correction coefficient obtained from the first database, and the surface resistivity of the insulator; obtaining a resistance value by applying electrodes to an adhesive immersed in an aqueous solvent to the insulator to be diagnosed; deriving the correction coefficient and converted value from the first database based on the obtained resistance value; estimating the surface resistivity of the insulator from the second database based on the derived converted value; and calculating the lifespan of the insulator to be diagnosed based on the estimated surface resistivity, the relationship between the number of years of use of the insulator and its surface resistivity derived from the surface resistivity of the insulator before use, and a predetermined threshold.

[0010] The above and other objects, features, aspects and advantages of this invention will become apparent from the following detailed description relating to this invention, which will be understood in conjunction with the accompanying drawings. [Brief explanation of the drawing]

[0011] [Figure 1] This is a schematic cross-sectional view showing the configuration of a switchgear, which is an example of high-voltage electrical equipment. [Figure 2] This figure shows an overview of the resistance measuring device 200 according to this embodiment 1. [Figure 3] This figure shows an example of an adhesive body 33 used when measuring resistance according to a certain embodiment. [Figure 4] This is a block diagram showing the configuration of a deterioration diagnostic device 400 according to one embodiment. [Figure 5]This is a block diagram illustrating the functions implemented by the control unit 430. [Figure 6] This is a block diagram showing the hardware configuration of a computer 600 that functions as a resistance measuring device 200. [Figure 7] This flowchart shows a portion of the processing performed by the CPU1 of the computer 600, which functions as a degradation diagnosis device 400. [Figure 8] This figure plots the measured values ​​and surface resistivity of insulating materials when using the resistance measuring device 200 for insulating materials with different degrees of degradation. [Figure 9] This diagram shows the relationship between the resistance value and the correction coefficient when using the resistance measuring device 200. [Figure 10] This diagram shows the relationship between the converted value, which considers only the amount of ions that affect the degradation of the insulator, and the surface resistivity of the insulator. [Figure 11] This figure illustrates an adhesive body 1100 with a mark. [Modes for carrying out the invention]

[0012] Embodiments of the present invention will be described below with reference to the drawings. In the following description, identical parts are denoted by the same reference numerals. Their names and functions are also the same. Therefore, detailed descriptions of them will not be repeated.

[0013] Embodiment 1. The method for diagnosing deterioration of high-voltage electrical equipment is, more specifically, a method for diagnosing deterioration of high-voltage electrical equipment equipped with insulators. Examples of high-voltage electrical equipment include switchgears, transformers, control gears such as motor control centers, generators, electric motors, and power supply devices (AC power supplies, DC power supplies, rectifiers).

[0014] High-voltage electrical equipment consists of main circuit components such as circuit breakers, disconnectors, transformers, busbars, and conductors, as well as measuring instruments. An example of high-voltage electrical equipment is described below, but the present invention is not limited to this configuration.

[0015] Referring to FIG. 1, an example of a high-voltage electrical apparatus will be described. FIG. 1 is a cross-sectional view schematically showing the configuration of a switchgear, which is an example of a high-voltage electrical apparatus. The switchgear 49 includes main circuit components such as a circuit breaker, a disconnector, a bus bar and a conductor supported by an insulator, and a measuring instrument.

[0016] As shown in FIG. 1, the switchgear 49 includes operating mechanisms 51a, 51b, circuit breakers 50a, 50b, insulators 58a, 58b, 58c, 58d, connecting conductors 53a, 54a, 53b, 54b, and a bus bar support plate 56. The circuit breakers 50a, 50b each include a molded frame 55a, 55b. The connecting conductors 53a, 54a, 53b, 54b are each supported by the insulators 58a, 58b, 58c, 58d. The bus bar support plate 56 collectively supports three horizontal bus bars 52 corresponding to each phase of a three-phase alternating current.

[0017] The molded frame 55a houses the operating mechanism 51a and the interrupting portion (not shown) of the circuit breaker 50 and is mounted on a carriage 61a. The carriage 61a is arranged to be movable in a bidirectional direction indicated by an arrow 100.

[0018] One end of the upper connecting conductor 53a is electrically connected to a cable 57a. The other end of the connecting conductor 53a is electrically connected to the upper terminal of the circuit breaker 50a.

[0019] One end of the lower connecting conductor 54a is electrically connected to the lower terminal of the circuit breaker 50a. The other end of the connecting conductor 54a is electrically connected to one end of the lower connecting conductor 53b via a horizontal bus bar supported by the bus bar support plate 56. The other end of the connecting conductor 53b is electrically connected to the upper terminal of the circuit breaker 50b.

[0020] One end of the lower connecting conductor 54b is electrically connected to the lower terminal of the circuit breaker 50b. The other end of the connecting conductor 54b is electrically connected to a cable 57b.

[0021] The materials of the insulators subject to deterioration diagnosis in this embodiment, namely the mold frames 55a, 55b, busbar support plates 56, or insulators 58, are, for example, polyester resin, epoxy resin, phenolic resin, etc., but are not limited to these.

[0022] <Resistance measuring device> The resistance measuring device will be described with reference to Figure 2. Figure 2 is a diagram showing an overview of the resistance measuring device 200 according to this embodiment 1.

[0023] As shown in Figure 2, the resistance measuring device 200 comprises a resistance meter 35, a probe 31, and an electrode 32. The probe 31 is connected to the resistance meter 35. The electrode 32 is attached to the tip of the probe 31.

[0024] The adhesive body 33, which has been immersed in an aqueous solvent, is attached to the insulating material 34 to be diagnosed. The probe 31 is pressed against the adhesive body 33. When the electrode 32 comes into contact with the adhesive body 33, the resistance meter 35 measures the resistance value of the insulating material 34 to be diagnosed.

[0025] Figure 2 illustrates an example in which the resistance meter 35 and the probe 31 are separate, but the configuration of the resistance measuring device 200 is not limited to the configuration illustrated in Figure 2. In other aspects, the resistance meter 35 and the probe 31 may be configured as an integrated unit.

[0026] Furthermore, in this embodiment, a four-terminal electrode 332 is exemplified for electrode 32 in order to eliminate the influence of contact resistance, but the configuration of electrode 32 is not limited to that exemplified in Figure 2.

[0027] Furthermore, since the electrode 32 is pressed against the adhesive body 33 with a constant pressure, the shape of the electrode 32 may be an electrode pin shape with any spring pressure, but the shape of the electrode 32 is not limited to this, and other configurations can also be adopted.

[0028] <Adhesive object> The adhesive will be described with reference to Figure 3. Figure 3 shows an example of an adhesive 33 used when measuring resistance according to a certain embodiment.

[0029] The adhesive body 33 is made of a material that can absorb liquids such as water. Typical adhesive bodies 33 include, for example, filter paper (cellulose), but the adhesive body 33 is not limited to filter paper. Any material that can absorb water or other liquids is acceptable. In addition, as the aqueous solvent in which the adhesive body 33 is immersed, in addition to water, alcohol or other organic solvents, or a solvent which is a mixture of water and an organic solvent may be used.

[0030] <Deterioration Diagnosis Device> The configuration of the deterioration diagnostic device will be described with reference to Figure 4. Figure 4 is a block diagram showing the configuration of a deterioration diagnostic device 400 according to a certain embodiment.

[0031] The degradation diagnostic device 400 is implemented in the form of a control board whose operation is controlled by a program recorded on a recording medium such as ROM (Read-Only Memory). Note that the control board is just one example of a degradation diagnostic device, and the hardware configuration of the degradation diagnostic device is not particularly limited. A degradation diagnostic device 400 according to a certain phase comprises an input unit 410, a storage unit 420, a control unit 430, and an output unit 440.

[0032] The input unit 410 is implemented by an input device such as a keyboard and mouse, or a tablet. The input unit 410 receives input of various data necessary for the deterioration diagnosis of the object to be diagnosed 55 (for example, a mold frame 55a) and sends the input data to the storage unit 102. The input data includes, for example, the resistance value obtained by pressing the probe 31 against the adhesive 33 and the surface resistivity of the polyester insulator. This data is input to the deterioration diagnosis device 400 prior to the deterioration diagnosis. In addition, a predetermined voltage (for example, 100V) is applied by the resistance meter 35, and the output value from the probe 31 is measured by the resistance meter 35. The measured value sent from the resistance meter 35 is input to the input unit 410.

[0033] The memory unit 420 stores a program for performing degradation diagnosis, data related to the insulation degradation sensor for calculating surface resistivity from measured values, and other data. The memory unit 420 also stores various data input to the input unit 410. The memory unit 420 is implemented as a memory device, such as a ROM, RAM (Random Access Memory), or hard disk.

[0034] In a given scenario, the memory unit 420 holds a first database 421 and a second database 422. The first database 421 is a database of correction coefficients. The second database 422 is a diagnostic database.

[0035] The control unit 430 is implemented, for example, by a microprocessor (MPU), CPU, or other arithmetic processing unit. The control unit 430 reads a program stored in the memory unit 420 and performs a process to diagnose the deterioration of the insulating material according to the procedure described in the program.

[0036] The output unit 440 outputs the results of the processing performed by the control unit 430. The output destinations are the monitor built into the degradation diagnosis device 400, the output device 470 connected to the degradation diagnosis device 400, or an information processing device (not shown) connected via a communication line.

[0037] The output device 470 outputs the diagnostic results from the degradation diagnostic device 400. The output device 470 may be, for example, a monitor connected to the degradation diagnostic device 400, a monitoring device or other monitor located at a remote location, a wireless device, or a printer.

[0038] In the example shown in Figure 4, the probe 31, the resistance meter 35, and the degradation diagnostic device 400 are connected to each other in a separate state. However, the probe 31, the resistance meter 35, and the degradation diagnostic device 400 can also be configured as an integrated unit. That is, the degradation diagnostic device 400 and the resistance measuring device 200 may be configured as a single device.

[0039] <Department Head> The control unit 430 will be further described with reference to Figure 5. Figure 5 is a block diagram illustrating the functions realized by the control unit 430. The control unit 430 includes an estimation unit 510, a relational expression creation unit 520, a lifespan calculation unit 530, and a remaining lifespan calculation unit 540.

[0040] The estimation unit 510 compares the resistance value obtained by the resistance measuring device 200 with the first database 421 and the second database 422, which have been acquired in advance, to estimate the surface resistivity of the insulating material to be diagnosed 55.

[0041] The relational equation creation unit 520 connects the surface resistivity of the object to be diagnosed 55 with the surface resistivity of the target insulator with 0 years of use (new or unused), and creates a straight line (hereinafter also called the "deterioration line") that represents the relationship between years of use and surface resistivity.

[0042] The lifespan calculation unit 530 calculates the lifespan of the item to be diagnosed 55 by determining the number of years at the intersection of the deterioration line created by the relational formula creation unit 73 and a predetermined threshold.

[0043] The remaining lifespan calculation unit 540 calculates the remaining lifespan of the high-voltage electrical equipment (switchgear 49) by subtracting the number of years that have elapsed from the lifespan calculated by the lifespan calculation unit 530. For example, the remaining lifespan calculation unit 540 calculates the remaining lifespan of the high-voltage electrical equipment by subtracting the number of years the high-voltage electrical equipment has been in use at the time of resistance measurement from the lifespan. Alternatively, the remaining lifespan calculation unit 540 calculates the remaining lifespan of the high-voltage electrical equipment by subtracting the number of years the high-voltage electrical equipment has been in use when the insulation degradation sensor was installed from the lifespan.

[0044] <Hardware Configuration> The specific configuration of the resistance measuring device 200 will be described with reference to Figure 6. Figure 6 is a block diagram showing the hardware configuration of the computer 600 that functions as the resistance measuring device 200.

[0045] The computer 600 includes, as its main components, a CPU (Central Processing Unit) 1 for executing programs, a mouse 2 and keyboard 3 for receiving input instructions from the user of the computer 600, RAM 4 for volatilely storing data generated by the execution of programs by the CPU 1 or data input via the mouse 2 or keyboard 3, a hard disk 5 for non-volatile data storage, an optical disc drive 6, a communication interface (I / F) 7, and a monitor 8. Each component is connected to the others by a data bus. A CD-ROM (Compact Disc - Read Only Memory) 9 or other optical disc is mounted in the optical disc drive 6.

[0046] Processing in computer 600 is realized by each piece of hardware and software executed by CPU 1. Such software may be pre-stored on the hard disk 5. Alternatively, the software may be stored on a CD-ROM 9 or other recording medium and distributed as a computer program. Or, the software may be provided as a downloadable application program by an information provider connected to the so-called Internet. Such software is read from the recording medium by an optical disc drive 6 or other reading device, or downloaded via a communication interface 7, and then temporarily stored on the hard disk 5. The software is then read from the hard disk 5 by CPU 1 and stored in RAM 4 in the form of an executable program. CPU 1 then executes the program.

[0047] The components of the computer 600 shown in Figure 6 are common. Therefore, one essential part of the technical concept of this disclosure is the software stored in the RAM 4, hard disk 5, CD-ROM 9, and other recording media, or software downloadable via a network. The recording media may include non-temporary, computer-readable data recording media. Since the operation of each hardware component of the computer 600 is well known, a detailed explanation will not be repeated.

[0048] The recording medium is not limited to CD-ROMs, FDs (Flexible Disks), and hard disks, but may also include SSDs (Solid State Drives), magnetic tapes, optical discs (MO (Magnetic Optical Disc) / MD (Mini Disc) / DVD (Digital Versatile Disc)), IC (Integrated Circuit) cards (including memory cards), optical cards, mask ROMs, EPROMs (Electronically Programmable Read-Only Memory), EEPROMs (Electronically Erasable Programmable Read-Only Memory), flash ROMs, and other semiconductor memory media that permanently store programs.

[0049] The term "program" as used here includes not only programs that can be directly executed by the CPU, but also programs in source code format, compressed programs, encrypted programs, and so on.

[0050] The CPU1 shown in Figure 6 can function as a control unit 430, but other processors can also function as a control unit 430. These other processors may also be called, for example, processing units, arithmetic units, microprocessors, microcomputers, or DSPs (Digital Signal Processors).

[0051] In other scenarios, a dedicated processing circuit may constitute the resistance measuring device 200 instead of the CPU 1. This dedicated processing circuit may be implemented as, for example, a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, an ASIC (Application Specific Integrated Circuit), an FPGA (Field-Programmable Gate Array), or a combination thereof.

[0052] <Control Structure> The control structure of the degradation diagnostic device 400 will be explained with reference to Figure 7. Figure 7 is a flowchart showing part of the processing performed by the CPU 1 of the computer 600, which functions as the degradation diagnostic device 400.

[0053] In step S710, CPU1 creates a correction coefficient database as the first database 421. More specifically, CPU1 obtains in advance the resistance values ​​obtained by pressing the electrode 32 against an adhesive 33 immersed in an aqueous solvent for insulating materials of different degrees of degradation, and a correction coefficient that takes into account the amount of ions dissolved in the adhesive 33 that affect the insulation degradation. At this time, the method for calculating the correction coefficient that takes into account the amount of ions that affect the insulation degradation is, for example, by dividing the amount of ions that affect the insulation degradation (nitrate ions, sulfate ions) by the total ions, but the calculation method is not necessarily limited to this method.

[0054] In step S720, CPU1 creates a diagnostic database as a second database. More specifically, CPU1 refers to the first database with respect to the previously acquired resistance values, calculates a value (converted value) that takes into account the amount of ions affecting insulation degradation using the obtained correction coefficient, and obtains in advance the relationship between this converted value and the surface resistivity of the insulator. As a method for calculating the converted value, for example, a method of dividing the measured value by the correction coefficient can be used, but this method is not limited to this, and other methods may be adopted.

[0055] In step S730, the CPU 1 controls the resistance measuring device 200 to obtain the resistance value of the insulator to be diagnosed 55. More specifically, the resistance measuring device 200 presses electrodes 32 against the adhesive 33 immersed in an aqueous solvent to obtain the resistance value of the insulator to be diagnosed 55. The resistance value is input to the computer 600.

[0056] In step S740, the CPU1, acting as an estimation unit 510, estimates the surface resistivity of the insulator to be diagnosed 55. More specifically, the CPU1 compares the resistance value of the diagnostic target 55 obtained in step S730 with the first database 421. The CPU1 calculates a correction coefficient and a conversion value. Furthermore, the CPU1 estimates the surface resistivity of the diagnostic target 55 by comparing the obtained conversion value with the second database 422.

[0057] In step S750, the CPU1, acting as a relational expression creation unit 520, creates a degradation line representing the degradation of surface resistivity based on the surface resistivity estimated in step S740 and the surface resistivity of a new or unused insulator made of the same material as the object to be diagnosed 55.

[0058] In step S760, the CPU1, acting as a lifespan calculation unit 530, calculates the lifespan of the diagnostic target 55 from the intersection of the degradation line obtained in step S750 and a predetermined threshold. The threshold is the surface resistivity when discharge occurs in the insulator.

[0059] In step S770, the CPU1, acting as a remaining lifespan calculation unit 540, calculates the remaining lifespan of the diagnostic target 55 by subtracting the number of years of use at the time of measurement from the lifespan calculated in step S760, or by subtracting the number of years elapsed since the installation of the insulation degradation sensor.

[0060] <Relationship between resistance and surface resistivity> The relationship between resistance and surface resistivity will be explained with reference to Figure 8. Figure 8 is a plot of the measured values ​​and surface resistivity of insulators when using the resistance measuring device 200 for insulators with different degrees of degradation.

[0061] As shown in Figure 8, the initial amount of attached ions does not affect the surface resistivity of the insulator, but the measurement values ​​obtained using the resistance measuring device 200 do include the effect of the initial amount of attached ions. Therefore, the higher the surface resistivity of the insulator (i.e., the lower the degree of contamination), the greater the influence of ions attached to the unused (new) product on the measurement value. As a result, as is clear from the data included in region 800, the resistance value and surface resistivity in that region will not correlate. In other words, without correcting the measurement values, the raw data obtained will not correlate with the resistance value.

[0062] Figure 9 shows the relationship between the resistance value and the correction coefficient when using the resistance measuring device 200. The correction coefficient is expressed, for example, as the amount of ions affecting insulation degradation / total ion amount. The relationship shown in Figure 9 conceptually represents the first database 421 (correction coefficient database), which is constructed by obtaining in advance the resistance values ​​measured using the resistance measuring device 200 for insulating materials with different degrees of degradation, and the correction coefficient that takes into account the amount of ions that affect insulation degradation dissolved in the adhesive attached to the insulating material, for use in the degradation diagnosis of high-voltage electrical equipment.

[0063] CPU1 receives input of resistance values ​​measured using the resistance measuring device 200 for insulating materials with different degrees of degradation, and a correction coefficient that takes into account the amount of ions that affect the insulation degradation dissolved in the adhesive 33 during the measurement. This data is then compiled into a first database 421 (correction coefficient database). Based on the calculated correction coefficient, CPU1 can calculate a converted value for the measured value that takes into account only the amount of ions that affect the degradation of the insulating material.

[0064] Figure 10 shows the relationship between the converted value, which considers only the amount of ions affecting the degradation of the insulator, and the surface resistivity of the insulator. This relationship corresponds to the second database 422 (diagnostic database). This converted value is calculated by considering the amount of ions affecting insulation degradation using a correction coefficient obtained by referring to the first database 421 to resistance values ​​previously obtained (measured) from insulators with different degrees of degradation. For example, the converted value is derived from the following formula. Conversion value = Measured value / Correction factor CPU1 can diagnose the object to be diagnosed 55 by using the first database 421 and the second database 422, without being affected by the amount of ions initially attached to the insulator, and considering only the amount of ions that affect insulation degradation. More specifically, CPU1 compares the measured values ​​obtained using the resistance measuring device 200 for the object to be diagnosed 55 of the insulator with the first database 421 and calculates a correction coefficient. Based on the measured value and the correction coefficient, CPU1 calculates a converted value that considers only the amount of ions that affect insulation degradation using a conversion formula (converted value = measured value / correction coefficient).

[0065] CPU1 can accurately estimate the surface resistivity even in regions where the surface resistivity of the insulator is high (low degree of contamination) by comparing the calculated conversion value with the second database 422 (diagnostic database) shown in Figure 10.

[0066] Embodiment 2. Embodiment 2 of the present invention will now be described. In Embodiment 1, a method was exemplified in which the adhesive 33 was immersed in an aqueous solvent. The solvent used is not limited to an aqueous solvent; for example, an organic solvent or a mixture of water and an organic solvent may be used. By using an organic solvent, it is possible to consider the influence of deposits that do not dissolve in water but affect insulation degradation, enabling more accurate degradation diagnosis.

[0067] Furthermore, the resistance measuring device and degradation diagnostic device according to this embodiment have the same hardware configuration as the resistance measuring device 200 and degradation diagnostic device 400 according to the previously described embodiment. The functions of this hardware configuration are also the same. Therefore, the description of the hardware configuration will not be repeated.

[0068] Embodiment 3. Embodiment 3 of the present invention will be described with reference to Figure 11. The adhesive body 33 used in the above-described embodiment does not have a mark. In other aspects, the adhesive body 33 may have a mark. The resistance measuring device and degradation diagnostic device according to this embodiment have the same hardware configuration as the resistance measuring device 200 and degradation diagnostic device 400 according to the above-described embodiment. The functions of the hardware configuration are also the same. Therefore, the description of the hardware configuration will not be repeated.

[0069] Figure 11 illustrates an adhesive body 1100 with markings. The adhesive body 1100 has marks 1101, 1102, 1103, and 1104.

[0070] Marks 1101, 1102, 1103, and 1104 correspond to the shape of electrode 32. Marks 1101, 1102, 1103, and 1104 are pre-printed on adhesive body 1100. If the position where electrode 32 contacts adhesive body 33 shifts, the electric field between the electrodes will also change, which may affect the resistance value.

[0071] Therefore, the adhesive body 1100 according to this embodiment has marks 1101, 1102, 1103, and 1104 corresponding to the shape of the electrode 32 to be contacted. The marks 1101, 1102, 1103, and 1104 can prevent misalignment of the contact position of the electrode 32, thereby eliminating the effect of changes in resistance value due to such misalignment. As a result, variability in measured values ​​can be reduced.

[0072] As described above, several embodiments have been illustrated, but these are merely examples and are not intended to limit the scope of the present invention.

[0073] In the above descriptions of embodiments 1 to 3, a switchgear 49 was used as an example of high-voltage electrical equipment. However, the application of the technical concept embodied in the above embodiments is not limited to the switchgear 49. This technical concept is applicable to all electrical equipment that uses an insulating material for insulation between the energized part of the electrical equipment and the ground or between the phases, and for which the deterioration of the insulating performance of the insulating material is diagnosed, and the same effects as those obtained in embodiments 1 to 3 are achieved.

[0074] As detailed above, the disclosed technology involves attaching an adhesive immersed in an aqueous solvent to the surface of the insulator to be diagnosed. An electrode is pressed against the adhesive, and the resistance value is measured. The degradation diagnostic device 400 calculates a corrected value (converted value) of the resistance value using electrode measurement values ​​for insulators of different degradation levels obtained in advance and a first database 421 that considers only the effect of the amount of ions affecting insulation degradation. The degradation diagnostic device 400 estimates the surface resistivity of the insulator by referring to a second database 422 that summarizes the relationship between the converted value and the surface resistivity of the insulator. The degradation diagnostic device 400 identifies the intersection point between a straight line of surface resistivity of a new or unused insulator and a predetermined threshold, and calculates the lifespan and remaining lifespan from this intersection point.

[0075] In contrast, according to the method described in Patent Document 1, if the degree of deterioration of the insulator is small (for example, if the insulator is unused or nearly new), the fillers contained in the insulator, such as calcium carbonate and aluminum hydroxide, dissolve. Although these ions do not affect the deterioration of the insulator, according to the method described in Patent Document 1, these ions dissolve in the adhesive. Therefore, the value obtained by measuring the insulator (resistance value) is affected by the dissolved ions, and thus the deterioration state of the insulator cannot be evaluated with high accuracy.

[0076] On the other hand, according to the embodiments described above, the degradation diagnostic device 400 corrects the resistance value using a first database 421 that takes into account only the electrode measurement values ​​for insulators with different degrees of degradation acquired in advance and the influence of the amount of ions that affect insulation degradation. Therefore, the degradation diagnostic device 400 can take into account the influence of ion species that contribute to the degradation of the insulator, and can diagnose the degradation state of the insulator with higher accuracy.

[0077] The embodiments disclosed herein should be considered in all respects to be illustrative and not restrictive. The scope of the invention is indicated by the claims rather than the foregoing description, and all modifications within the meaning and scope of equivalents of the claims are intended. [Explanation of Symbols]

[0078] 1 CPU, 2 Mouse, 3 Keyboard, 4 RAM, 5 Hard disk, 6 Optical disc drive, 7 Communication interface, 8 Monitor, 9 ROM, 31 Probe, 32 Electrode, 33, 1100 Adhesive, 34 Insulator to be diagnosed, 35 Resistance meter, 49 Switchgear, 50a, 50b Circuit breaker, 51a, 51b Operating mechanism, 52 Horizontal busbar, 53a, 53b, 54a, 54b Connecting conductor, 55 Item to be diagnosed, 55a, 55b Molded frame, 56 Busbar support plate, 57a, 57b Cable, 58, 58a, 58b, 58c, 58d Insulator, 61a Trolley, 73, 520 Relationship formula creation unit, 100 Arrow, 102, 420 Memory unit, 200 Resistance measuring device, 400 Degradation diagnostic device, 410 Input unit, 421 First database, 422 Second database, 430 Control unit, 440 Output unit, 470 Output device, 510 Estimation unit, 530, 540 Lifespan calculation unit, 600 Computer, 800 Area, 1101, 1102, 1103, 1104 Mark.

Claims

1. 1. A method for diagnosing degradation of an electrical device including insulation, comprising: A step of accessing a first database having resistance values ​​obtained by applying electrodes to the adhesive body immersed in an aqueous solvent and attached to insulating materials with different degrees of deterioration, and a correction coefficient that takes into account the amount of ions that affect insulation deterioration from an analysis result of the amount of ions dissolved in the adhesive body; accessing a second database showing a relationship between a converted value calculated by taking into account an amount of ions that affect insulation deterioration using a correction coefficient obtained from the first database for the resistance value acquired in advance and a surface resistivity of an insulating material; A step of applying an electrode to the adhesive body immersed in an aqueous solvent against an insulating material to be diagnosed and acquiring a resistance value; Deriving a correction coefficient and a conversion value from the first database based on the acquired resistance value; estimating the surface resistivity of the insulator from the second database based on the derived converted value; and calculating the service life of the insulation to be diagnosed based on a relationship between the number of years of use of the insulation and the surface resistivity derived from the estimated surface resistivity and the surface resistivity of the insulation before use, and a predetermined threshold value.

2. The method according to claim 1 , wherein the relationship between the number of years of use and the surface resistivity is represented by a straight line connecting the estimated surface resistivity and the surface resistivity of the insulation before use.

3. The method according to claim 1 or 2, further comprising the step of calculating a remaining life of the insulation to be diagnosed by subtracting a number of years of use of the insulation to be diagnosed from a number of years of life.

4. The method according to claim 1 or 2, wherein the solvent in which the adhesive body is immersed comprises an aqueous solvent, an organic solvent, or a mixture of the aqueous solvent and the organic solvent.

5. The method according to claim 1 or 2, wherein the adhesive body has markings formed thereon corresponding to the shape of the electrodes.

6. The method according to claim 1 or 2, wherein the step of obtaining the resistance value includes the step of applying the electrode to a predetermined position on the adhesive article depending on a position of the electrode.

7. The method according to claim 1 or 2, wherein the electric equipment includes any one of a power receiving and distribution equipment, a transformer, a control gear, a generator, an electric motor, and a power supply unit for supplying power.

8. An apparatus for diagnosing deterioration of an electrical device including an insulating material, comprising: A storage device; a processor electrically connected to the storage device; The storage device includes: A first database including resistance values ​​obtained by applying electrodes to adhesive bodies immersed in an aqueous solvent and attached to insulating materials with different degrees of deterioration, and correction coefficients that take into account the amount of ions that affect insulation deterioration from the analysis results of the amount of ions dissolved in the adhesive bodies; a second database is stored which indicates a relationship between a conversion value calculated for a resistance value previously acquired by using a correction coefficient obtained from the first database, taking into consideration an amount of ions that affect insulation deterioration, and a surface resistivity of an insulating material; The processor, The electrodes are placed on the adhesive immersed in the aqueous solvent to measure the resistance of the insulating material to be diagnosed. Deriving a correction coefficient and a conversion value from the first database based on the acquired resistance value; estimating a surface resistivity of the insulator from the second database based on the derived converted value; An apparatus that calculates the life span of the insulation to be diagnosed based on a relationship between the number of years the insulation has been used and the surface resistivity, which is derived from the estimated surface resistivity and the surface resistivity of the insulation before use, and a predetermined threshold value.

9. The device according to claim 8 , wherein the relationship between the number of years of use and the surface resistivity is represented by a straight line connecting the estimated surface resistivity and the surface resistivity of the insulation before use.

10. The device according to claim 8 or 9, wherein the processor calculates the remaining life of the insulation to be diagnosed by subtracting the number of years of use of the insulation to be diagnosed from the number of years of life.

11. The device according to claim 8 or 9, wherein the solvent in which the adhesive body is immersed includes an aqueous solvent, an organic solvent, or a mixture of the aqueous solvent and the organic solvent.

12. The device according to claim 8 or 9, wherein the adhesive body has markings formed thereon corresponding to the shape of the electrodes.

13. 10. The apparatus of claim 8 or 9, wherein obtaining the resistance value comprises applying the electrode to a predetermined position on the adhesive article depending on the position of the electrode.

14. The apparatus according to claim 8 or 9, wherein the electric equipment includes any one of a power receiving and distribution equipment, a transformer, a control gear, a generator, an electric motor, and a power supply unit for supplying power.

15. 1. A program comprising instructions for causing a processor of a computer to execute a method for diagnosing deterioration of an electrical device including insulation, the program including instructions for causing the processor to: A step of accessing a first database having resistance values ​​obtained by applying electrodes to the adhesive body immersed in an aqueous solvent and attached to insulating materials with different degrees of deterioration, and a correction coefficient that takes into account the amount of ions that affect insulation deterioration from an analysis result of the amount of ions dissolved in the adhesive body; accessing a second database showing a relationship between a converted value calculated by taking into account an amount of ions that affect insulation deterioration using a correction coefficient obtained from the first database for the resistance value acquired in advance and a surface resistivity of an insulating material; receiving an input of a resistance value obtained by applying an electrode to the adhesive body immersed in an aqueous solvent to an insulating material to be diagnosed; Deriving a correction coefficient and a conversion value from the first database based on the acquired resistance value; estimating the surface resistivity of the insulator from the second database based on the derived converted value; and calculating the life span of the insulator to be diagnosed based on a relationship between the number of years of use of the insulator and the surface resistivity, which is derived from the estimated surface resistivity and the surface resistivity of the insulator before use, and a predetermined threshold value.

16. 16. The program according to claim 15, wherein the relationship between the number of years of use and the surface resistivity is represented by a straight line connecting the estimated surface resistivity and the surface resistivity of the insulating material before use.

17. 17. The program according to claim 15, further causing the computer to execute a step of calculating a remaining life of the insulation material to be diagnosed by subtracting a number of years of use of the insulation material to be diagnosed from a number of years of life.

18. The program according to claim 15 or 16, wherein the solvent in which the adhesive body is immersed includes an aqueous solvent, an organic solvent, or a mixture of the aqueous solvent and the organic solvent.

19. The program according to claim 15 or 16, wherein the adhesive body has marks formed thereon that correspond to the shapes of the electrodes.

20. The program according to claim 15 or 16, wherein the resistance value is a resistance value obtained by applying the electrode to a position on the adhesive body that is predetermined depending on a position of the electrode.

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