Apparatus for controlling beam line and synchrotron radiation accelerator including apparatus for controlling beam line

Abstract

In one embodiment, a device for controlling a beamline positioned between a storage ring of a synchrotron accelerator and a laboratory may include an alternating current supply unit that converts an alternating current supplied from an external power source into an alternating current; a high-voltage supply unit that converts an alternating current supplied from the alternating current supply unit into a first high voltage or a second high voltage; an ion pump gauge driven by the first high voltage or the second high voltage supplied by the high-voltage supply unit; a high-speed circuit breaker driving circuit that drives a high-speed circuit breaker installed on the path of synchrotron radiation passing through the beamline using an output voltage output from the ion pump gauge; and a controller that controls the operation of the alternating current supply unit, the high-voltage supply unit, and the high-speed circuit breaker driving circuit.

Description

Technology Field

[0001] This specification relates to a beamline control device for controlling a beamline included in a synchrotron accelerator and a synchrotron accelerator including the beamline control device. Background Technology

[0003] Synchrotron radiation can penetrate materials that visible light cannot. For example, X-rays used in hospitals can penetrate skin or muscles, which are impermeable to visible light, to obtain images of bones. In particular, next-generation synchrotron X-rays can image a beating heart. Not only can the movement of the heart and the minute vibrations of the muscles be captured as video, but the resolution is on the order of 1 / 1000th of a µm, which is 1,000 times better than ultrasound.

[0004] A synchrotron accelerator is a device designed to generate synchrotron radiation using electrons. Synchrotron radiation is produced when light charged particles undergoing relativistic motion are accelerated in a transverse direction relative to their direction of motion. When electrons are fed into an accelerator and accelerated to the speed of light, they rotate at high speed and their direction is deflected by a magnetic field. At this point, the electrons emit synchrotron radiation in a tangential direction. Synchrotron radiation can have various wavelengths and brightness levels depending on the energy and speed of the accelerated electrons. Therefore, the performance of a synchrotron accelerator can vary depending on the energy and focusing of the electron beam, as well as the brightness and coherence (unity of light) of the synchrotron radiation.

[0005] Electrons generated by an electron gun at the starting point of a linear accelerator can be accelerated to the speed of light by an acceleration tube. Electrons that have reached the speed of light at the end of the linear accelerator are incident on a storage ring through a transmission tube and an incident device. The storage ring may include an electromagnet that creates a circular orbit for the electrons, a vacuum device that provides an ultra-high vacuum environment, and a high-frequency resonance device that replenishes energy lost due to the radiation of synchrotron rays.

[0006] Synchrotron radiation generated in the storage ring can be supplied to a laboratory (hutch) where experiments utilizing synchrotron radiation are performed, via a beamline. The beamline is a space positioned between the storage ring and the laboratory and may include optical systems for focusing and transporting light. To minimize light absorption and scattering by air, the beamline must be maintained under a vacuum, just like the storage ring. Therefore, devices such as ion pumps to expel gases from within the beamline and devices such as vacuum gauges to measure the vacuum level within the beamline are installed within the beamline.

[0007] If the vacuum level within the beamline decreases during the operation of the synchrotron accelerator, the vacuum level of the storage ring can be prevented by separating the storage ring from the beamline. To this end, a blocker may be installed within the beamline along the path of the synchrotron radiation to shield the beamline. If the vacuum level within the beamline decreases, the blocker must be activated rapidly to prevent the vacuum level of the storage ring from dropping. The problem to be solved

[0009] The purpose of this specification is to provide a beamline control device capable of rapidly driving a circuit breaker when the vacuum level within the beamline decreases, and a synchrotron accelerator including the beamline control device.

[0010] The purpose of this specification is to provide a beamline control device and a synchrotron accelerator including the beamline control device that can reduce the time and cost required for maintenance of the synchrotron accelerator by reducing the number of equipment installed within the beamline control device.

[0011] The purpose of this specification is not limited to the purposes mentioned above, and other purposes and advantages of this specification not mentioned will be more clearly understood by the embodiments of this specification described below. Furthermore, the purposes and advantages of this specification may be realized by the components and combinations thereof described in the claims. means of solving the problem

[0013] In one embodiment, a device for controlling a beamline positioned between a storage ring of a synchrotron accelerator and a laboratory may include an alternating current supply unit that converts an alternating current supplied from an external power source into an alternating current; a high-voltage supply unit that converts an alternating current supplied from the alternating current supply unit into a first high voltage or a second high voltage; an ion pump gauge driven by the first high voltage or the second high voltage supplied by the high-voltage supply unit; a high-speed circuit breaker driving circuit that drives a high-speed circuit breaker installed on the path of synchrotron radiation passing through the beamline using an output voltage output from the ion pump gauge; and a controller that controls the operation of the alternating current supply unit, the high-voltage supply unit, and the high-speed circuit breaker driving circuit.

[0014] In one embodiment, the alternating current supply unit may include a first rectifier that rectifies a current supplied from the external power source, a smoothing unit that smooths a voltage output from the first rectifier, and an inverter that converts a voltage output from the smoothing unit into the alternating current.

[0015] In one embodiment, the high voltage supply unit may include a transformer unit that boosts the alternating current supplied from the alternating current supply unit to output a high-voltage alternating voltage, a second rectifier unit that rectifies the high-voltage alternating voltage, and a voltage converter unit that outputs the first high voltage or the second high voltage based on the high-voltage alternating voltage rectified by the second rectifier unit.

[0016] In one embodiment, the voltage converter may include a first capacitor and a second capacitor connected in series to both ends of the second rectifier and a connection node of the first capacitor and the second capacitor, and a second relay connected to one end of the second rectifier.

[0017] In one embodiment, the high-speed circuit breaker driving circuit can supply a driving voltage for driving the high-speed circuit breaker to the high-speed circuit breaker when the output voltage exceeds a predetermined reference voltage.

[0018] In one embodiment, the high-speed circuit breaker driving circuit may include a power supply unit, a driving capacitor that stores a voltage supplied by the power supply unit, a switching element whose one end is connected to the driving capacitor and whose other end is connected to the high-speed circuit breaker, and a comparator that supplies a switching signal to the switching element according to the result of comparing the output voltage with a predetermined reference voltage.

[0019] In one embodiment, when the output voltage exceeds a predetermined reference voltage, the switching element is turned on so that the voltage stored in the driving capacitor can be supplied to the high-speed circuit breaker.

[0020] In one embodiment, when the first high voltage is supplied to the ion pump gauge, the ion pump gauge discharges the gas within the beamline to the outside, and when the second high voltage is supplied to the ion pump gauge, it can output the output voltage corresponding to the vacuum level within the beamline.

[0021] A synchrotron accelerator according to one embodiment may include a storage ring, a beamline positioned between the storage ring and a laboratory, and a beamline control device for controlling the beamline.

[0022] In one embodiment, the beamline control device may include an alternating current supply unit that converts an alternating current supplied from an external power source into an alternating current; a high voltage supply unit that converts an alternating current supplied from the alternating current supply unit into a first high voltage or a second high voltage; an ion pump gauge driven by the first high voltage or the second high voltage supplied by the high voltage supply unit; a high-speed circuit breaker driving circuit that drives a high-speed circuit breaker installed on the path of synchrotron radiation passing through the beamline using an output voltage output from the ion pump gauge; and a controller that controls the operation of the alternating current supply unit, the high voltage supply unit, and the high-speed circuit breaker driving circuit.

[0023] In one embodiment, the alternating current supply unit may include a first rectifier that rectifies a current supplied from the external power source, a smoothing unit that smooths a voltage output from the first rectifier, and an inverter that converts a voltage output from the smoothing unit into the alternating current.

[0024] In one embodiment, the high voltage supply unit may include a transformer unit that boosts the alternating current supplied from the alternating current supply unit to output a high-voltage alternating voltage, a second rectifier unit that rectifies the high-voltage alternating voltage, and a voltage converter unit that outputs the first high voltage or the second high voltage based on the high-voltage alternating voltage rectified by the second rectifier unit.

[0025] In one embodiment, the voltage converter may include a first capacitor and a second capacitor connected in series to both ends of the second rectifier and a connection node of the first capacitor and the second capacitor, and a second relay connected to one end of the second rectifier.

[0026] In one embodiment, the high-speed circuit breaker driving circuit can supply a driving voltage for driving the high-speed circuit breaker to the high-speed circuit breaker when the output voltage exceeds a predetermined reference voltage.

[0027] In one embodiment, the high-speed circuit breaker driving circuit may include a power supply unit, a driving capacitor that stores a voltage supplied by the power supply unit, a switching element whose one end is connected to the driving capacitor and whose other end is connected to the high-speed circuit breaker, and a comparator that supplies a switching signal to the switching element according to the result of comparing the output voltage with a predetermined reference voltage.

[0028] In one embodiment, when the output voltage exceeds a predetermined reference voltage, the switching element is turned on so that the voltage stored in the driving capacitor can be supplied to the high-speed circuit breaker.

[0029] In one embodiment, when the first high voltage is supplied to the ion pump gauge, the ion pump gauge discharges the gas within the beamline to the outside, and when the second high voltage is supplied to the ion pump gauge, it can output the output voltage corresponding to the vacuum level within the beamline. Effects of the invention

[0031] According to the embodiments, additional damage can be prevented in the event of a vacuum accident in the beamline by rapidly operating the circuit breaker when the vacuum level in the beamline decreases.

[0032] According to the embodiments, the number of equipment installed within the beamline control device is reduced, thereby reducing the time and cost required for the maintenance of the synchrotron accelerator. Brief explanation of the drawing

[0034] Figure 1 shows the configuration of a synchrotron accelerator according to one embodiment. FIG. 2 is a circuit diagram of a beamline control device according to one embodiment. FIG. 3 is a circuit diagram of a high-voltage supply unit according to one embodiment. Figure 4 shows the configuration of a synchrotron accelerator according to another embodiment. FIG. 5 is a circuit diagram of a beamline control device according to another embodiment. Specific details for implementing the invention

[0035] The aforementioned objectives, features, and advantages are described in detail below with reference to the attached drawings, and accordingly, a person skilled in the art to which this specification pertains will be able to easily implement the embodiments of this specification. In describing this specification, detailed descriptions of known technologies related to this specification are omitted if it is determined that such descriptions would unnecessarily obscure the gist of this specification. Hereinafter, preferred embodiments of this specification will be described in detail with reference to the attached drawings. In the drawings, the same reference numerals indicate the same or similar components.

[0036] Figure 1 shows the configuration of a synchrotron accelerator according to one embodiment.

[0037] Referring to FIG. 1, a synchrotron accelerator according to one embodiment may include a storage ring (101), a beamline (102), and a laboratory (103).

[0038] The storage ring (101) is a circular structure, and its interior can be maintained in a vacuum state. Electrons (11) generated and accelerated by a linear accelerator (not shown) can be incident on the storage ring (101). Electrons incident on the storage ring (101) can move at the speed of light inside the storage ring (101) and emit radiation (12) in a tangential direction.

[0039] A bending magnet (201) may be placed in the storage ring (101) to control the movement path of the electron (11) so that the electron (11) can move in a circular motion.

[0040] The laboratory (hutch) (103) is a sealed space into which synchrotron radiation (12) emitted from the storage ring (101) can be incident. Experiments using the incident synchrotron radiation (12) can be performed in the laboratory (103).

[0041] A beamline (102) may be positioned between the storage ring (101) and the laboratory (103). The beamline (102) may be maintained in a vacuum state as a space through which synchrotron radiation (12) emitted from the storage ring (101) travels toward the laboratory (103).

[0042] In one embodiment, an ion pump (202) may be disposed in the beamline (102) to create a vacuum in the beamline (102) and maintain the vacuum in the beamline (102). The ion pump (202) can create a vacuum inside the beamline (102) by exhausting gas inside the beamline (102) to the outside.

[0043] The ion pump (202) may include positive cells, also called penning cells. A negative plate made of a highly active material (getter material), such as titanium (Ti) or tantalum (Ta), may be placed on one side of the positive cells. Magnets may be placed on the outside of the positive and negative cells to form a magnetic field. When voltage is applied to both negative plates inside the ion pump (202), electrons are ejected from the electrodes and collide with gases inside the positive cells to ionize the gases. At this time, a magnetic field is formed by the magnets, and the electrons move in a spiral motion rather than a straight line within the magnetic field, colliding with surrounding gas molecules to ionize them.

[0044] Since ionized gases are electrically positive, they are accelerated toward the cathode cell at both ends and collide with the surface to be removed; this is called primary removal. During primary removal, the collision energy of the ions causes titanium atoms on the cathode surface to break their bonds and pop out. Since metals are highly reactive substances with a strong tendency to bond with other materials, they combine with gas molecules such as oxygen, hydrogen, and nitrogen that were adsorbed on the anode or other walls to form a film; this is called secondary removal.

[0045] The ion pump (202) uses this principle to create a vacuum state, so there is no mechanical movement, so it does not generate much noise or vibration and can achieve exhaust performance of up to 10-9 Torr, so it is used in places where high vacuum is required.

[0046] In one embodiment, a vacuum gauge (203) for measuring the vacuum level inside the beamline (102) may be disposed in the beamline (102). The vacuum gauge (203) may output a current value (or voltage value) according to the vacuum level inside the beamline (102).

[0047] In one embodiment, the vacuum gauge (203) may be a cold cathode ionization gauge (CCG). However, the type of vacuum gauge (203) is not limited to this. An anode cell and a cathode cell may be disposed inside the cold cathode ionization gauge. A magnet may be disposed outside the anode cell and the cathode cell to form a magnetic field. Additionally, a current (or voltage) measuring device for measuring current (or voltage) may be disposed in the cold cathode ionization gauge.

[0048] When power is applied to the negative plate of a cold cathode ionization gauge, electrons are ejected from the electrode and collide with gases inside the positive cell, ionizing the gases. At this time, a magnetic field is formed by a magnet, and the electrons move in a helical motion rather than a straight line within the magnetic field, colliding with surrounding gas molecules and ionizing them. The current (or voltage) flowing through the positive ions among the ionized molecules can be measured by a current (or voltage) measuring device. Since the current (or voltage) measured by the current (or voltage) measuring device is proportional (or inversely proportional) to the number of molecules inside the cold cathode ionization gauge, the vacuum level inside the beamline (102) can be measured based on the current (or voltage) measured by the current (or voltage) measuring device.

[0049] In one embodiment, a high-speed blocker (204) may be placed in the beamline (102). The high-speed blocker (204) may be placed in the path of the synchrotron radiation within the beamline (102). The high-speed blocker (204) is a blocker equipped with a shutter, so that the synchrotron radiation can pass through the high-speed blocker (204). When the high-speed blocker (204) is driven by the beamline control device (30), the shutter closes, and the movement of the synchrotron radiation is blocked by the shutter of the high-speed blocker (204), and the beamline (102) can be shielded so that the vacuum state of the storage ring (101) can be maintained.

[0050] An example of a fast closing shutter (204) is a fast closing shutter (FCS), but the types of fast closing shutters (204) are not limited to this. When a driving voltage is supplied to the FCS by the beamline control device (30), the shutter of the FCS can be closed within 25 msec from the time the driving voltage is supplied.

[0051] In one embodiment, a low-speed blocker (205) may be placed in the beamline (102). A high-speed blocker (205) may be placed in the path of the synchrotron radiation within the beamline (102). The low-speed blocker (205) is a blocker equipped with a shutter, so that the synchrotron radiation can pass through the low-speed blocker (205). When the low-speed blocker (205) is driven by the beamline control device (30), the shutter closes, and the movement of the synchrotron radiation is blocked by the shutter of the low-speed blocker (205), and the beamline (102) can be shielded so that the vacuum state of the storage ring (101) can be maintained.

[0052] An example of a low-speed circuit breaker (205) may be a solenoid-type gate valve, but the type of low-speed circuit breaker (205) is not limited to this. When a driving voltage is supplied to the gate valve by the beamline control device (30), the shutter of the gate valve can be closed within 2 seconds from the time the driving voltage is supplied.

[0053] The beamline control device (30) can control the operation of devices (202, 203, 204, 205) installed in the beamline (102). The beamline control device (30) can control the operation of the ion pump (202) to maintain a vacuum state inside the beamline (102). Additionally, the beamline control device (30) can measure the vacuum level inside the beamline (102) using a vacuum gauge (203), and if an abnormality occurs in the vacuum level inside the beamline (102), it can shield the beamline (102) by driving the high-speed circuit breaker (204) and the low-speed circuit breaker (205) so that the vacuum state of the storage ring (101) can be maintained.

[0054] FIG. 2 is a circuit diagram of a beamline control device according to one embodiment.

[0055] Referring to FIG. 2, a beamline control device (30) according to one embodiment may include an alternating current supply unit (350) that converts an alternating current supplied from an external power source (PS) into an alternating current, a high voltage supply unit (360) that converts an alternating current supplied from the alternating current supply unit (350) into a first high voltage or a second high voltage and supplies it to an ion pump (202) or a vacuum gauge (203), a switch unit (307) that controls the supply path of the high voltage output from the high voltage supply unit (360), a high-speed circuit breaker driving circuit (370) that drives a high-speed circuit breaker (204) using the output voltage output from the vacuum gauge (203), and a controller (308) that controls the operation of the alternating current supply unit (350), the high voltage supply unit (360), and the high-speed circuit breaker driving circuit (370).

[0056] The alternating current supply unit (350) may include a first rectifier (301) that rectifies the current supplied from an external power source (PS), a smoothing unit (302) that smooths the voltage output from the first rectifier (301), and an inverter (303) that converts the voltage output from the smoothing unit (302) into alternating current.

[0057] The first rectifier (301) may include a plurality of diodes. An example of the first rectifier (301) may be a bridge circuit, but the type of the first rectifier (301) is not limited to this.

[0058] The smoothing part (302) may include a DC link capacitor.

[0059] The inverter (303) may include a plurality of switching elements that are alternately turned on and turned off. The controller (308) may determine the driving frequency of the inverter (303) and supply a driving signal corresponding to the determined driving frequency to the inverter (303). When the driving signal is supplied, the plurality of switching elements included in the inverter (303) are alternately and repeatedly turned on and turned off, and the voltage output from the smoothing unit (302) can be converted into an alternating current.

[0060] The high voltage supply unit (360) may include a transformer unit (304) that boosts the alternating current supplied from the alternating current supply unit (350) to output a high-voltage alternating voltage, a second rectifier unit (305) that rectifies the high-voltage alternating voltage, and a voltage converter unit (306) that outputs a first high voltage or a second high voltage based on the high-voltage alternating voltage rectified by the second rectifier unit (305).

[0061] FIG. 3 is a circuit diagram of a high-voltage supply unit according to one embodiment.

[0062] Referring to FIG. 3, the high voltage supply unit (360) may include a transformer unit (304), a second rectifier unit (305), and a voltage converter unit (306).

[0063] The transformer unit (304) can boost the alternating current supplied from the alternating current supply unit (350) to output a high-voltage alternating current. The boosting ratio of the transformer unit (304) may be set differently depending on the embodiment.

[0064] The second rectifier (305) can rectify the high-voltage AC voltage output from the transformer (304). As shown in FIG. 3, the second rectifier (305) may be configured as a bridge circuit, but the type of the second rectifier (305) is not limited to this.

[0065] The voltage converter (306) may include a first capacitor (C1) and a second capacitor (C2) connected in series to both ends of the second rectifier (305). Additionally, the voltage converter (306) may include a second relay (320) connected to one end of the second rectifier (305) and a connection node (N) of the first capacitor (C1) and the second capacitor (C2).

[0066] The second relay (320) can be opened or closed by the control of the controller (308). When the second relay (320) is closed, a first high voltage (e.g., 5000 to 6000 V) can be output from the voltage converter (306). When the second relay (320) is opened, a second high voltage (e.g., 2000 to 3000 V) having a smaller magnitude than the first high voltage can be output from the voltage converter (306). The magnitudes of the first high voltage and the second high voltage may be set differently depending on the embodiment.

[0067] Referring again to FIG. 2, the controller (308) can control the output path of the first high voltage or the second high voltage output from the high voltage supply unit (360) by controlling the connection path of the switch unit (307). For example, the controller (308) can control the open / closed state of the switch unit (307) so that the first high voltage output from the high voltage supply unit (360) is supplied to the ion pump (202) and the second high voltage output from the high voltage supply unit (360) is supplied to the vacuum gauge (203).

[0068] The vacuum gauge (203) can output a voltage (or current) corresponding to the vacuum level within the beamline (102). The high-speed circuit breaker driving circuit (370) can supply a driving voltage to the high-speed circuit breaker (204) based on the output voltage output from the vacuum gauge (203). The high-speed circuit breaker driving circuit (370) may include a power supply unit (310), a driving capacitor (CR) that stores the voltage supplied by the power supply unit (310), a switching element (311) with one end connected to the driving capacitor (CR) and the other end connected to the high-speed circuit breaker (204), and a comparator (309) that supplies a switching signal to the switching element (311) based on the result of comparing the output voltage of the vacuum gauge (203) with a predetermined reference voltage (VR).

[0069] The power supply unit (310) can supply the voltage required to drive the high-speed circuit breaker (204) (e.g., DC voltage of 48V). In one embodiment, the power supply unit (310) may be a Switching Mode Power Supply (SMPS), but the type of power supply unit (310) is not limited to this.

[0070] The controller (308) can supply a charging signal (SC) to the power supply unit (310). When the charging signal (SC) is supplied, the power supply unit (310) is driven, and voltage can be charged to the driving capacitor (CR). The controller (308) supplies the charging signal (SC) only when the high-speed circuit breaker (204) is not driven, and may not supply the charging signal (SC) when the high-speed circuit breaker (204) is driven.

[0071] The vacuum gauge (203) can measure the vacuum level inside the beamline (102) and output a voltage (Vout) corresponding to the vacuum level inside the beamline (102). The output voltage (Vout) of the vacuum gauge (203) can be input to a comparator (309). The comparator (309) can compare the output voltage (Vout) of the vacuum gauge (203) with a predetermined reference voltage (VR) provided by the controller (308), and supply a switching signal to the switching element (311) to turn on the switching element (311) according to the comparison result.

[0072] If a switching signal is not supplied, the switching element (311) may remain in a turned-off state. In one embodiment, when the output voltage (Vout) of the vacuum gauge (203) exceeds the reference voltage (VR), a switching signal may be output from the comparator (309). When the switching signal is supplied to the switching element (311), the switching element (311) is turned on, and the voltage stored in the driving capacitor (CR) may be supplied to the high-speed circuit breaker (204) as the driving voltage.

[0073] When the driving voltage is supplied, the high-speed circuit breaker (204) is driven, and the shutter equipped in the high-speed circuit breaker (204) can be closed. Accordingly, the beamline (102) is shielded and the vacuum state of the storage room (101) can be maintained.

[0074] Figure 4 shows the configuration of a synchrotron accelerator according to another embodiment.

[0075] Referring to FIG. 4, a synchrotron accelerator according to another embodiment may include a storage ring (101), a beamline (102), and a laboratory (103).

[0076] The storage ring (101) is a circular structure, and its interior can be maintained in a vacuum state. Electrons (11) generated and accelerated by a linear accelerator (not shown) can be incident on the storage ring (101). Electrons incident on the storage ring (101) can move at the speed of light inside the storage ring (101) and emit radiation (12) in a tangential direction.

[0077] A bending magnet (201) may be placed in the storage ring (101) to control the movement path of the electron (11) so that the electron (11) can move in a circular motion.

[0078] The laboratory (hutch) (103) is a sealed space into which synchrotron radiation (12) emitted from the storage ring (101) can be incident. Experiments using the incident synchrotron radiation (12) can be performed in the laboratory (103).

[0079] A beamline (102) may be positioned between the storage ring (101) and the laboratory (103). The beamline (102) may be maintained in a vacuum state as a space through which synchrotron radiation (12) emitted from the storage ring (101) travels toward the laboratory (103).

[0080] In one embodiment, an ion pump gauge (206) may be disposed in the beamline (102) to create a vacuum in the beamline (102), maintain the vacuum in the beamline (102), and measure the degree of vacuum inside the beamline (102).

[0081] The ion pump gauge (206) can create a vacuum inside the beamline (102) by expelling gas inside the beamline (102) to the outside. Additionally, the ion pump gauge (206) can output a current value (or voltage value) according to the degree of vacuum inside the beamline (102). That is, the ion pump gauge (206) can have both the function of an ion pump (202) and the function of a vacuum gauge (203) according to one embodiment.

[0082] The ion pump gauge (206) may include positive cells, also called penning cells. A negative plate made of a highly active material (getter material), such as titanium (Ti) or tantalum (Ta), may be placed on one side of the positive cells. Magnets may be placed on the outside of the positive and negative cells to form a magnetic field. When voltage is applied to both negative plates inside the ion pump gauge (206), electrons are ejected from the electrodes and collide with the gases inside the positive cells to ionize the gases. At this time, a magnetic field is formed by the magnets, and the electrons move in a spiral motion rather than a straight line within the magnetic field, colliding with surrounding gas molecules and ionizing them.

[0083] Since ionized gases are electrically positive, they are accelerated toward the cathode cell at both ends and collide with the surface to be removed; this is called primary removal. During primary removal, the collision energy of the ions causes titanium atoms on the cathode surface to break their bonds and pop out. Since metals are highly reactive substances with a strong tendency to bond with other materials, they combine with gas molecules such as oxygen, hydrogen, and nitrogen that were adsorbed on the anode or other walls to form a film; this is called secondary removal.

[0084] Additionally, a current (or voltage) measuring device for measuring current (or voltage) may be installed in the cold cathode type ionization gauge of the ion pump gauge (206). When power is applied to the cathode plate of the ion pump gauge (206), electrons are ejected from the electrode and collide with gases inside the anode cell to ionize the gases. At this time, a magnetic field is formed by a magnet, and the electrons move in a helical motion rather than a straight line within the magnetic field, colliding with surrounding gas molecules and ionizing them. The current (or voltage) flowing through the positive ions among the molecules thus ionized can be measured by the current (or voltage) measuring device. Since the current (or voltage) measured by the current (or voltage) measuring device is proportional (or inversely proportional) to the number of molecules inside the cold cathode type ionization gauge, the vacuum level inside the beamline (102) can be measured based on the current (or voltage) measured by the current (or voltage) measuring device.

[0085] In one embodiment, a high-speed blocker (204) may be placed in the beamline (102). The high-speed blocker (204) may be placed in the path of the synchrotron radiation within the beamline (102). The high-speed blocker (204) is a blocker equipped with a shutter, so that the synchrotron radiation can pass through the high-speed blocker (204). When the high-speed blocker (204) is driven by the beamline control device (30), the shutter closes, and the movement of the synchrotron radiation is blocked by the shutter of the high-speed blocker (204), and the beamline (102) can be shielded so that the vacuum state of the storage ring (101) can be maintained.

[0086] An example of a fast closing shutter (204) is a fast closing shutter (FCS), but the types of fast closing shutters (204) are not limited to this. When a driving voltage is supplied to the FCS by the beamline control device (30), the shutter of the FCS can be closed within 25 msec from the time the driving voltage is supplied.

[0087] In one embodiment, a low-speed blocker (205) may be placed in the beamline (102). A high-speed blocker (205) may be placed in the path of the synchrotron radiation within the beamline (102). The low-speed blocker (205) is a blocker equipped with a shutter, so that the synchrotron radiation can pass through the low-speed blocker (205). When the low-speed blocker (205) is driven by the beamline control device (30), the shutter closes, and the movement of the synchrotron radiation is blocked by the shutter of the low-speed blocker (205), and the beamline (102) can be shielded so that the vacuum state of the storage ring (101) can be maintained.

[0088] An example of a low-speed circuit breaker (205) may be a solenoid-type gate valve, but the type of low-speed circuit breaker (205) is not limited to this. When a driving voltage is supplied to the gate valve by the beamline control device (30), the shutter of the gate valve can be closed within 2 seconds from the time the driving voltage is supplied.

[0089] The beamline control device (30) can control the operation of devices (202, 203, 204, 205) installed in the beamline (102). The beamline control device (30) can control the operation of the ion pump (202) to maintain a vacuum state inside the beamline (102). Additionally, the beamline control device (30) can measure the vacuum level inside the beamline (102) using a vacuum gauge (203), and if an abnormality occurs in the vacuum level inside the beamline (102), it can shield the beamline (102) by driving the high-speed circuit breaker (204) and the low-speed circuit breaker (205) so that the vacuum state of the storage ring (101) can be maintained.

[0090] FIG. 5 is a circuit diagram of a beamline control device according to another embodiment.

[0091] Referring to FIG. 5, a beamline control device (30) according to another embodiment may include an alternating current supply unit (350) that converts an alternating current supplied from an external power source (PS) into an alternating current, a high voltage supply unit (360) that converts an alternating current supplied from the alternating current supply unit (350) into a first high voltage or a second high voltage and supplies it to an ion pump (202) or a vacuum gauge (203), a high-speed circuit breaker driving circuit (370) that drives a high-speed circuit breaker (204) using an output voltage output from the vacuum gauge (203), and a controller (308) that controls the operation of the alternating current supply unit (350), the high voltage supply unit (360), and the high-speed circuit breaker driving circuit (370).

[0092] The alternating current supply unit (350) may include a first rectifier (301) that rectifies the current supplied from an external power source (PS), a smoothing unit (302) that smooths the voltage output from the first rectifier (301), and an inverter (303) that converts the voltage output from the smoothing unit (302) into alternating current.

[0093] The first rectifier (301) may include a plurality of diodes. An example of the first rectifier (301) may be a bridge circuit, but the type of the first rectifier (301) is not limited to this.

[0094] The smoothing part (302) may include a DC link capacitor.

[0095] The inverter (303) may include a plurality of switching elements that are alternately turned on and turned off. The controller (308) may determine the driving frequency of the inverter (303) and supply a driving signal corresponding to the determined driving frequency to the inverter (303). When the driving signal is supplied, the plurality of switching elements included in the inverter (303) are alternately and repeatedly turned on and turned off, and the voltage output from the smoothing unit (302) can be converted into an alternating current.

[0096] The high voltage supply unit (360) may include a transformer unit (304) that boosts the alternating current supplied from the alternating current supply unit (350) to output a high-voltage alternating voltage, a second rectifier unit (305) that rectifies the high-voltage alternating voltage, and a voltage converter unit (306) that outputs a first high voltage or a second high voltage based on the high-voltage alternating voltage rectified by the second rectifier unit (305).

[0097] Referring to FIG. 3, the high voltage supply unit (360) may include a transformer unit (304), a second rectifier unit (305), and a voltage converter unit (306).

[0098] The transformer unit (304) can boost the alternating current supplied from the alternating current supply unit (350) to output a high-voltage alternating current. The boosting ratio of the transformer unit (304) may be set differently depending on the embodiment.

[0099] The second rectifier (305) can rectify the high-voltage AC voltage output from the transformer (304). As shown in FIG. 3, the second rectifier (305) may be configured as a bridge circuit, but the type of the second rectifier (305) is not limited to this.

[0100] The voltage converter (306) may include a first capacitor (C1) and a second capacitor (C2) connected in series to both ends of the second rectifier (305). Additionally, the voltage converter (306) may include a second relay (320) connected to one end of the second rectifier (305) and a connection node (N) of the first capacitor (C1) and the second capacitor (C2).

[0101] The second relay (320) can be opened or closed by the control of the controller (308). When the second relay (320) is closed, a first high voltage (e.g., 5000 to 6000 V) can be output from the voltage converter (306). When the second relay (320) is opened, a second high voltage (e.g., 2000 to 3000 V) having a smaller magnitude than the first high voltage can be output from the voltage converter (306). The magnitudes of the first high voltage and the second high voltage may be set differently depending on the embodiment.

[0102] Referring again to FIG. 5, the ion pump gauge (206) can receive a first high voltage or a second high voltage from the high voltage supply unit (360).

[0103] When a first high voltage is supplied from the high voltage supply unit (360), the ion pump-gauge (206) can be driven as an ion pump. Accordingly, the ion pump-gauge (206) can discharge gas within the beamline (102) to the outside.

[0104] When a second high voltage is supplied from the high voltage supply unit (360), the ion pump gauge (206) can be driven as a vacuum gauge. Accordingly, the ion pump gauge (206) can output a voltage (or current) corresponding to the vacuum level within the beamline (102).

[0105] The high-speed circuit breaker driving circuit (370) can supply a driving voltage to the high-speed circuit breaker (204) based on the output voltage output from the ion pump gauge (206). The high-speed circuit breaker driving circuit (370) may include a power supply unit (310), a driving capacitor (CR) that stores the voltage supplied by the power supply unit (310), a switching element (311) whose one end is connected to the driving capacitor (CR) and whose other end is connected to the high-speed circuit breaker (204), and a comparator (309) that supplies a switching signal to the switching element (311) according to the result of comparing the output voltage of the ion pump gauge (206) with a predetermined reference voltage (VR).

[0106] The power supply unit (310) can supply the voltage required to drive the high-speed circuit breaker (204) (e.g., DC voltage of 48V). In one embodiment, the power supply unit (310) may be a Switching Mode Power Supply (SMPS), but the type of power supply unit (310) is not limited to this.

[0107] The controller (308) can supply a charging signal (SC) to the power supply unit (310). When the charging signal (SC) is supplied, the power supply unit (310) is driven, and voltage can be charged to the driving capacitor (CR). The controller (308) supplies the charging signal (SC) only when the high-speed circuit breaker (204) is not driven, and may not supply the charging signal (SC) when the high-speed circuit breaker (204) is driven.

[0108] The ion pump gauge (206) can measure the vacuum level inside the beamline (102) and output a voltage (Vout) corresponding to the vacuum level inside the beamline (102). The output voltage (Vout) of the vacuum gauge (203) can be input to a comparator (309). The comparator (309) can compare the output voltage (Vout) of the vacuum gauge (203) with a predetermined reference voltage (VR) provided by the controller (308), and supply a switching signal to the switching element (311) to turn on the switching element (311) according to the comparison result.

[0109] If a switching signal is not supplied, the switching element (311) may remain in a turned-off state. In one embodiment, when the output voltage (Vout) of the ion pump gauge (206) exceeds the reference voltage (VR), a switching signal may be output from the comparator (309). When the switching signal is supplied to the switching element (311), the switching element (311) is turned on, and the voltage stored in the driving capacitor (CR) may be supplied to the high-speed circuit breaker (204) as the driving voltage.

[0110] When the driving voltage is supplied, the high-speed circuit breaker (204) is driven, and the shutter equipped in the high-speed circuit breaker (204) can be closed. Accordingly, the beamline (102) is shielded and the vacuum state of the storage room (101) can be maintained.

[0111] Although the present specification has been described above with reference to the illustrative drawings, the present specification is not limited by the embodiments and drawings disclosed herein, and various modifications may be made by those skilled in the art. Furthermore, even if the effects according to the configuration of the present specification were not explicitly described while explaining the embodiments of the present specification above, the effects predictable by said configuration should also be acknowledged.

Claims

Claim 1 A beamline control device for controlling a beamline positioned between a storage ring of a synchrotron accelerator and a laboratory, comprising: an alternating current supply unit that converts an alternating current supplied from an external power source into an alternating current; a high voltage supply unit that converts an alternating current supplied from the alternating current supply unit into a first high voltage or a second high voltage; an ion pump gauge driven by the first high voltage or the second high voltage supplied by the high voltage supply unit; a high-speed circuit breaker driving circuit that drives a high-speed circuit breaker installed on the path of synchrotron radiation passing through the beamline using an output voltage output from the ion pump gauge; and a controller that controls the driving of the alternating current supply unit, the high voltage supply unit, and the high-speed circuit breaker driving circuit, wherein the high-speed circuit breaker driving circuit comprises: a power supply unit; a driving capacitor that stores a voltage supplied by the power supply unit; a switching element, one end of which is connected to the driving capacitor and the other end of which is connected to the high-speed circuit breaker; and a comparator that supplies a switching signal to the switching element according to the result of comparing the output voltage with a predetermined reference voltage. Claim 2 A beamline control device according to claim 1, wherein the alternating current supply unit comprises: a first rectifier that rectifies a current supplied from the external power source; a smoothing unit that smooths a voltage output from the first rectifier unit; and an inverter that converts a voltage output from the smoothing unit into the alternating current. Claim 3 A beamline control device according to claim 1, wherein the high voltage supply unit comprises: a transformer unit that boosts the alternating current supplied from the alternating current supply unit to output a high-voltage alternating voltage; a second rectifier unit that rectifies the high-voltage alternating voltage; and a voltage converter unit that outputs the first high voltage or the second high voltage based on the high-voltage alternating voltage rectified by the second rectifier unit. Claim 4 A beamline control device according to paragraph 3, wherein the voltage converter comprises a first capacitor and a second capacitor connected in series to both ends of the second rectifier; and a second relay connected to one end of the second rectifier and the connection node of the first capacitor and the second capacitor. Claim 5 In claim 1, the high-speed circuit breaker driving circuit is a beamline control device that supplies a driving voltage for driving the high-speed circuit breaker to the high-speed circuit breaker when the output voltage exceeds a predetermined reference voltage. Claim 6 delete Claim 7 A beamline control device according to claim 1, wherein when the output voltage exceeds a predetermined reference voltage, the switching element is turned on and the voltage stored in the driving capacitor is supplied to the high-speed circuit breaker. Claim 8 A beamline control device according to claim 1, wherein when the first high voltage is supplied to the ion pump gauge, the ion pump gauge discharges gas within the beamline to the outside, and when the second high voltage is supplied to the ion pump gauge, outputs an output voltage corresponding to the vacuum level within the beamline. Claim 9 A storage ring; a beamline disposed between the storage ring and a laboratory; and a beamline control device for controlling the beamline, wherein the beamline control device comprises: an alternating current supply unit that converts a current supplied from an external power source into an alternating current; a high voltage supply unit that converts an alternating current supplied from the alternating current supply unit into a first high voltage or a second high voltage; an ion pump gauge driven by the first high voltage or the second high voltage supplied by the high voltage supply unit; a high-speed circuit breaker driving circuit that drives a high-speed circuit breaker installed on the path of synchrotron radiation passing through the beamline using an output voltage output from the ion pump gauge; and a controller that controls the operation of the alternating current supply unit, the high voltage supply unit, and the high-speed circuit breaker driving circuit, wherein the high-speed circuit breaker driving circuit comprises: a power supply unit; a driving capacitor that stores a voltage supplied by the power supply unit; and a switching element, one end of which is connected to the driving capacitor and the other end of which is connected to the high-speed circuit breaker. A synchrotron accelerator comprising a comparator that supplies a switching signal to a switching element based on the result of comparing the output voltage and a predetermined reference voltage. Claim 10 In claim 9, the above-mentioned alternating current supply unit comprises: a first rectifier that rectifies a current supplied from the external power source; a smoothing unit that smooths a voltage output from the first rectifier unit; and an inverter that converts a voltage output from the smoothing unit into the alternating current. Claim 11 In claim 9, the high-voltage supply unit comprises: a transformer unit that boosts the alternating current supplied from the alternating current supply unit to output a high-voltage alternating voltage; a second rectifier unit that rectifies the high-voltage alternating voltage; and a voltage converter unit that outputs the first high voltage or the second high voltage based on the high-voltage alternating voltage rectified by the second rectifier unit. Claim 12 A synchrotron accelerator according to claim 11, wherein the voltage converter comprises a first capacitor and a second capacitor connected in series to both ends of the second rectifier; and a second relay connected to one end of the second rectifier and the connection node of the first capacitor and the second capacitor. Claim 13 In claim 9, the high-speed circuit breaker driving circuit supplies a driving voltage for driving the high-speed circuit breaker to the high-speed circuit breaker when the output voltage exceeds a predetermined reference voltage. Claim 14 delete Claim 15 A synchrotron accelerator according to claim 9, wherein when the output voltage exceeds a predetermined reference voltage, the switching element is turned on and the voltage stored in the driving capacitor is supplied to the high-speed circuit breaker. Claim 16 A synchrotron accelerator according to claim 9, wherein when the first high voltage is supplied to the ion pump-gauge, the ion pump-gauge discharges gas within the beamline to the outside, and when the second high voltage is supplied to the ion pump-gauge, outputs the output voltage corresponding to the vacuum level within the beamline.

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