Display substrate and detection method therefor, and display apparatus

Abstract

Provided are a display substrate and a detection method therefor, and a display apparatus. A display unit of the display substrate comprises a plurality of sub-pixels (100) and a sense signal line (SENSE). A control end of a sense sub-circuit (14) is configured to receive a scan signal (G2), and a first end (141) of the sense sub-circuit (14) is electrically connected to a first end of one drive sub-circuit (12) and a first electrode (151) of one light-emitting element (15). In response to the sense scan signal (G2), the sense sub-circuit (14) tests, by means of the sense signal line (SENSE), the electrical characteristics of the sub-pixel (100) to which the sense sub-circuit belongs. A pixel circuit of at least one sub-pixel (100) among the plurality of sub-pixels (100) of the display unit comprises a detection control sub-circuit, wherein a control end of the detection control sub-circuit is electrically connected to a detection scan signal line to receive a detection scan signal (G2), a first end of the detection control sub-circuit is electrically connected to a second end of the sense sub-circuit (14), and a second end of the detection control sub-circuit is electrically connected to the sense signal line (SENSE).

Description

Display substrate, detection method thereof, and display device Technical Field

[0001] At least one embodiment of the present disclosure relates to a display substrate, a detection method thereof, and a display device. Background Art

[0002] Organic light-emitting diode (OLED) displays are gaining widespread attention due to their wide viewing angles, high contrast, fast response speed, higher brightness, and lower driving voltage compared to inorganic light-emitting devices. These advantages make OLEDs suitable for display devices such as mobile phones, monitors, laptops, digital cameras, and instruments.

[0003] The pixel circuits in OLED displays generally utilize a matrix drive scheme, which is categorized as either active matrix (AM) or passive matrix (PM) depending on whether switching components are incorporated into each pixel unit. While PMOLEDs offer simpler manufacturing processes and lower costs, they suffer from drawbacks such as crosstalk, high power consumption, and a short lifespan, making them unsuitable for high-resolution, large-size displays. In contrast, AMOLEDs integrate a set of thin-film transistors and storage capacitors within each pixel circuit. By controlling the drive of these thin-film transistors and storage capacitors, the current flowing through the OLED is controlled, allowing the OLED to emit light as needed. Compared to PMOLEDs, AMOLEDs require less drive current, consume less power, and have a longer lifespan, meeting the requirements for high-resolution, multi-grayscale, large-size displays. Furthermore, AMOLEDs offer significant advantages in viewing angle, color reproduction, power consumption, and response time, making them suitable for high-information, high-resolution displays.

[0004] Summary of the Invention

[0005] At least one embodiment of the present disclosure relates to a display substrate, which includes a display unit, which is located in a display area and performs a display function. The display unit includes a plurality of sub-pixels, and each of the plurality of sub-pixels includes a pixel circuit; the pixel circuit includes: a driving sub-circuit, a light-emitting element, and a sensing sub-circuit; the first end of the sensing sub-circuit is electrically connected to the first end of the driving sub-circuit and the first electrode of the light-emitting element; the display substrate includes a sensing signal line, a sensing scan signal line, and a detection scan signal line, the control end of the sensing sub-circuit is electrically connected to the sensing scan signal line, and the sensing sub-circuit is configured to detect electrical characteristics of the sub-pixel to which it belongs through the sensing signal line in response to a sensing scan signal; among the plurality of sub-pixels of the display unit, the pixel circuit of at least one sub-pixel includes a detection control sub-circuit, wherein the control end of the detection control sub-circuit is electrically connected to the detection scan signal line to receive the detection scan signal, the first end of the detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit, and the second end of the detection control sub-circuit is electrically connected to the sensing signal line.

[0006] For example, in the display substrate provided in at least one embodiment of the present disclosure, the multiple detection control sub-circuits included in the multiple sub-pixels in the display unit are electrically connected to the same sensing signal line, and the control ends of the multiple detection control sub-circuits are respectively electrically connected to different detection scanning signal lines.

[0007] For example, in the display substrate provided in at least one embodiment of the present disclosure, the pixel circuit further includes a storage subcircuit and a data writing subcircuit, the data writing subcircuit being configured to write a data signal into the control end of the driving subcircuit in response to a data scanning signal; the driving subcircuit includes a driving transistor, the gate of the driving transistor being electrically connected to the first end of the storage subcircuit, the first electrode of the driving transistor being electrically connected to the second end of the storage subcircuit and being electrically connected to the light-emitting element, the second electrode of the driving transistor being configured to receive a first power supply voltage, and the driving transistor being configured to control a current for driving the light-emitting element under the control of the voltage of the gate of the driving transistor; the sensing subcircuit includes a sensing transistor, the detection control subcircuit includes a detection control transistor, the gate of the sensing transistor being electrically connected to a sensing scanning signal line, the first electrode of the sensing transistor being electrically connected to the first electrode of the driving transistor and the second end of the storage subcircuit, the second electrode of the sensing transistor being electrically connected to the first electrode of the detection control transistor, the second electrode of the detection control transistor being electrically connected to the sensing signal line, and the gate of the detection control transistor being electrically connected to the detection scanning signal line.

[0008] For example, in the display substrate provided in at least one embodiment of the present disclosure, the multiple sub-pixels of the display unit include a first sub-pixel and a second sub-pixel; the detection control sub-circuit includes a first detection control sub-circuit and a second detection control sub-circuit; the second end of the sensing sub-circuit of the first sub-pixel is electrically connected to the sensing signal line through the first detection control sub-circuit; the second end of the sensing sub-circuit of the second sub-pixel is electrically connected to the sensing signal line through the second detection control sub-circuit; the detection scan signal line includes a first detection scan signal line and a second detection scan signal line, the control end of the first detection control sub-circuit is electrically connected to the first detection scan signal line to receive a first detection scan signal, the first end of the first detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit of the first sub-pixel, and the second end of the first detection control sub-circuit is electrically connected to the sensing signal line; the control end of the second detection control sub-circuit is electrically connected to the second detection scan signal line to receive a second detection scan signal, the first end of the second detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit of the second sub-pixel, and the second end of the second detection control sub-circuit is electrically connected to the same sensing signal line.

[0009] For example, in the display substrate provided in at least one embodiment of the present disclosure, the first detection control subcircuit includes a first detection control transistor, and the second detection control subcircuit includes a second detection control transistor; the first electrode of the first detection control transistor is electrically connected to the second electrode of the sensing transistor of the first sub-pixel, and the first electrode of the second detection control transistor is electrically connected to the second electrode of the sensing transistor of the second sub-pixel, and the second electrode of the first detection control transistor and the second electrode of the second detection control transistor are respectively electrically connected to the same sensing signal line; the gate of the first detection control transistor is electrically connected to the first detection scan signal line to receive a first detection scan signal, and the gate of the second detection control transistor is electrically connected to the second detection scan signal line to receive a second detection scan signal.

[0010] For example, in the display substrate provided in at least one embodiment of the present disclosure, the multiple sub-pixels of the display unit further include a third sub-pixel, and the second end of the sensing sub-circuit of the third sub-pixel is electrically connected to the first end of the first detection control sub-circuit.

[0011] For example, in the display substrate provided in at least one embodiment of the present disclosure, the multiple sub-pixels of the display unit also include a third sub-pixel, and the pixel circuit of the third sub-pixel also includes a third detection control sub-circuit; the detection scan signal line includes a third detection scan signal line, the control end of the third detection control sub-circuit is electrically connected to the third detection scan signal line to receive a third detection scan signal, the first end of the third detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit of the third sub-pixel, and the second end of the third detection control sub-circuit is electrically connected to the sensing signal line.

[0012] For example, in the display substrate provided in at least one embodiment of the present disclosure, the third detection control sub-circuit includes a third detection control transistor, a gate of the third detection control transistor is electrically connected to the third detection scanning signal line, a first electrode of the third detection control transistor is electrically connected to the second electrode of the sensing transistor of the third sub-pixel, and a second electrode of the third detection control transistor is electrically connected to the sensing signal line.

[0013] For example, in the display substrate provided in at least one embodiment of the present disclosure, the multiple sub-pixels of the display unit also include a third sub-pixel, and the pixel circuit of the third sub-pixel also includes a third detection control sub-circuit; the detection scan signal line includes a third detection scan signal line, the control end of the third detection control sub-circuit is electrically connected to the third detection scan signal line to receive a third detection scan signal, the first end of the third detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit of the third sub-pixel, and the second end of the third detection control sub-circuit is electrically connected to the first end of the first detection control sub-circuit.

[0014] For example, in the display substrate provided in at least one embodiment of the present disclosure, the third detection control sub-circuit includes a third detection control transistor, the gate of the third detection control transistor is electrically connected to the third detection scan signal line, and is configured to receive the third detection scan signal, the first electrode of the third detection control transistor is electrically connected to the second electrode of the sensing transistor of the third sub-pixel, and the second electrode of the third detection control transistor is electrically connected to the first electrode of the first detection control transistor.

[0015] For example, in the display substrate provided in at least one embodiment of the present disclosure, the multiple sub-pixels of the display unit also include a fourth sub-pixel, the second end of the sensing sub-circuit of the fourth sub-pixel is electrically connected to the first end of the second detection control sub-circuit, and the second end of the second detection control sub-circuit is electrically connected to the sensing signal line.

[0016] For example, in the display substrate provided in at least one embodiment of the present disclosure, the multiple sub-pixels of the display unit also include a fourth sub-pixel, and the pixel circuit of the fourth sub-pixel also includes a fourth detection control sub-circuit; the detection scan signal line includes a fourth detection scan signal line, the control end of the fourth detection control sub-circuit is electrically connected to the fourth detection scan signal line to receive a fourth detection scan signal, the first end of the fourth detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit of the fourth sub-pixel, and the second end of the fourth detection control sub-circuit is electrically connected to the sensing signal line.

[0017] For example, in the display substrate provided in at least one embodiment of the present disclosure, the fourth detection control sub-circuit includes a fourth detection control transistor, a gate of the fourth detection control transistor is electrically connected to the fourth detection scan signal line to receive the fourth detection scan signal, a first electrode of the fourth detection control transistor is electrically connected to the second electrode of the sensing transistor of the fourth sub-pixel, and a second electrode of the fourth detection control transistor is electrically connected to the sensing signal line.

[0018] For example, in the display substrate provided in at least one embodiment of the present disclosure, the multiple sub-pixels of the display unit also include a fourth sub-pixel, and the pixel circuit of the fourth sub-pixel also includes a fourth detection control sub-circuit; the detection scan signal line includes a fourth detection scan signal line, the control end of the fourth detection control sub-circuit is electrically connected to the fourth detection scan signal line to receive a fourth detection scan signal, the first end of the fourth detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit of the fourth sub-pixel, and the second end of the fourth detection control sub-circuit is electrically connected to the first end of the second detection control sub-circuit.

[0019] For example, in the display substrate provided in at least one embodiment of the present disclosure, the fourth detection control sub-circuit includes a fourth detection control transistor, the gate of the fourth detection control transistor is configured to receive the fourth detection scan signal, the first electrode of the fourth detection control transistor is electrically connected to the second electrode of the sensing transistor of the fourth sub-pixel, and the second electrode of the fourth detection control transistor is electrically connected to the first electrode of the second detection control transistor.

[0020] At least one embodiment of the present disclosure also provides a detection method applied to any one of the above-mentioned display substrates provided in the embodiments of the present disclosure, the detection method comprising: performing at least two detections on at least one sub-pixel of the display unit, and performing at least two detections on the electrical signal on the sensing signal line, specifically comprising: in one detection, turning on the detection control transistors of all sub-pixels contained in the display unit, and if the electrical signal on the sensing signal line is abnormal, performing the next detection; in the next detection, turning off the detection control transistor of at least one sub-pixel in the display unit to re-detect other sub-pixels; judging whether the multiple sub-pixels are abnormal based on the electrical signals on the sensing signal line obtained from the two detections; and for the abnormal sub-pixel, obtaining the threshold voltage of the driving sub-circuit of the sub-pixel of the same color without abnormality in other display units as the threshold voltage of the driving sub-circuit of the abnormal sub-pixel to compensate for the abnormal sub-pixel.

[0021] For example, in the detection method provided in at least one embodiment of the present disclosure, the pixel circuit also includes a data writing sub-circuit, which is configured to write a data signal into the control end of the driving sub-circuit in response to a data scanning signal; the at least two detections of at least one sub-pixel of the display unit include: performing two detections with at least one sub-pixel among the multiple sub-pixels of the display unit as a test sub-pixel, and in the process of performing the two detections on the test sub-pixel, writing the data signal to the test sub-pixel and not writing the data signal to other sub-pixels except the test sub-pixel, and controlling the first detection scanning signal and the second detection scanning signal in the first detection of the two detection processes to be not completely the same as the first detection scanning signal and the second detection scanning signal in the second detection.

[0022] For example, the detection method provided by at least one embodiment of the present disclosure includes: in a first detection, turning on the detection control transistors of all sub-pixels included in the display unit, and performing a first detection on the electrical signal on the sensing signal line; if the detected signal of the sensing signal line is abnormal, it indicates that at least one sub-pixel in the display unit has a sensing transistor short-circuit problem; then, the detection control transistor of at least one sub-pixel in the display unit is randomly turned off, and a second detection is performed with the non-turned-off sub-pixel as the test sub-pixel; and in the second detection, if the detected signal of the sensing signal line is abnormal, it indicates that the sensing transistor short-circuit problem exists in the sub-pixels other than the sub-pixels whose detection control transistors are turned off; if the detected signal of the sensing signal line is normal, it indicates that the sensing transistor short-circuit problem exists in at least one sub-pixel among the sub-pixels whose detection control transistors are turned off.

[0023] For example, in the detection method provided by at least one embodiment of the present disclosure, the plurality of sub-pixels of the display unit include a first sub-pixel and a second sub-pixel, the first sub-pixel includes a first detection control transistor, the second sub-pixel includes a second detection control transistor, a first electrode of the first detection control transistor is electrically connected to a second electrode of a sensing transistor of the first sub-pixel, a first electrode of the second detection control transistor is electrically connected to a second electrode of a sensing transistor of the second sub-pixel, the second electrode of the first detection control transistor and the second electrode of the second detection control transistor are electrically connected to the same sensing signal line, the gate of the first detection control transistor is electrically connected to a first detection scan signal line to receive a first detection scan signal, and the gate of the second detection control transistor is electrically connected to a first detection scan signal line to receive a first detection scan signal. When the gate of the detection control transistor is electrically connected to the second detection scanning signal line to receive the second detection scanning signal, the detection method includes: during the first detection, the first detection control transistor and the second detection control transistor are both turned on, and when the detected detection signal of the sensing signal line is abnormal, the first detection control transistor or the second detection control transistor is randomly turned off, and then the sub-pixel that is not turned off is used as the test sub-pixel for the second detection; and during the second detection, if the detected detection signal of the sensing signal line is abnormal, it means that the sensing transistor of the test sub-pixel is abnormal, and if the detected detection signal of the sensing signal line is normal, it means that the sensing transistors of sub-pixels other than the test sub-pixel are abnormal.

[0024] For example, in the detection method provided by at least one embodiment of the present disclosure, the multiple sub-pixels of the display unit also include a third sub-pixel, the pixel circuit of the third sub-pixel also includes a third detection control sub-circuit, the detection scan signal line includes a third detection scan signal line, the control end of the third detection control sub-circuit is electrically connected to the third detection scan signal line to receive a third detection scan signal, the first end of the third detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit of the third sub-pixel, and the second end of the third detection control sub-circuit is electrically connected to the sensing signal line, the detection method includes: using a sub-pixel of the display unit as the test sub-pixel, and performing two detections on the electrical signal on the sensing signal line, specifically including: in the first detection, Turning on the detection control transistors of all sub-pixels included in the display unit, performing a first detection on the electrical signal on the sensing signal line, if the measured detection signal of the sensing signal line is abnormal, it indicates that at least one sub-pixel in the display unit has a sensing transistor short-circuit problem, then turning off the detection control transistors of two sub-pixels in the display unit except the test sub-pixel, and performing a second detection on the electrical signal on the sensing signal line; and in the second detection, if the measured detection signal of the sensing signal line is normal, it indicates that at least one of the two sub-pixels with the turned-off detection control transistor has a sensing transistor short-circuit problem, and if the measured detection signal of the sensing signal line is abnormal, it indicates that the test sub-pixel has a sensing transistor short-circuit problem.

[0025] For example, in the detection method provided in at least one embodiment of the present disclosure, the data signal written to the other sub-pixels is a voltage signal of 0V.

[0026] At least one embodiment of the present disclosure further provides a display substrate, which includes a display unit, which is located in a display area and performs a display function. The display unit includes a plurality of sub-pixels, and each of the plurality of sub-pixels includes a pixel circuit; the pixel circuit includes: a driving sub-circuit, a light-emitting element, and a sensing sub-circuit, the driving sub-circuit is configured to control the magnitude of the driving current flowing through the light-emitting element; the control end of the sensing sub-circuit is configured to receive a sensing scan signal, and the first end of the sensing sub-circuit is electrically connected to the first end of the driving sub-circuit and the first electrode of the light-emitting element; the display substrate includes a plurality of sensing signal lines, the second end of the sensing sub-circuit is electrically connected to a corresponding sensing signal line, and the sensing sub-circuit is electrically connected to the first electrode of the light-emitting element. The circuit is configured to detect the electrical characteristics of the sub-pixel to which it belongs through the sensing signal line electrically connected thereto in response to the received sensing scanning signal; the multiple sub-pixels of the display unit include a first sub-pixel, a second sub-pixel and a third sub-pixel; the second end of the sensing sub-circuit of the first sub-pixel and the second end of the sensing sub-circuit of the second sub-pixel are electrically connected to the same sensing signal line, the second end of the sensing sub-circuit of the third sub-pixel and the second end of the sensing sub-circuit of the first sub-pixel are electrically connected to different sensing signal lines, and the control end of the sensing sub-circuit of the first sub-pixel and the control end of the sensing sub-circuit of the second sub-pixel are electrically connected to different sensing scanning signal ends to receive different sensing scanning signals.

[0027] For example, in the display substrate provided in at least one embodiment of the present disclosure, the control end of the third sensing sub-circuit and the control end of the sensing sub-circuit of the first sub-pixel are electrically connected to the same sensing scan signal end to receive the same sensing scan signal, or the control end of the sensing sub-circuit of the third sub-pixel and the control end of the sensing sub-circuit of the first sub-pixel are respectively electrically connected to different sensing scan signal ends to receive different sensing scan signals.

[0028] For example, in the display substrate provided in at least one embodiment of the present disclosure, the multiple sub-pixels of the display unit also include a fourth sub-pixel, the second end of the sensing sub-circuit of the fourth sub-pixel and the second end of the sensing sub-circuit of the third sub-pixel are electrically connected to the same sensing signal line, and the control end of the sensing sub-circuit of the third sub-pixel and the control end of the sensing sub-circuit of the fourth sub-pixel are respectively electrically connected to different sensing scan signal ends to receive different sensing scan signals.

[0029] For example, in the display substrate provided in at least one embodiment of the present disclosure, the control end of the sensing sub-circuit of the second sub-pixel and the control end of the sensing sub-circuit of the fourth sub-pixel are respectively electrically connected to the same sensing scan signal end to receive the same sensing scan signal.

[0030] At least one embodiment of the present disclosure also provides a detection method applied to the above-mentioned display substrate provided by the embodiment of the present disclosure, the detection method comprising: applying different sensing scanning signals to the control end of the sensing subcircuit of the first sub-pixel and the control end of the sensing subcircuit of the second sub-pixel, respectively, so that the sensing subcircuit of the first sub-pixel and the sensing subcircuit of the second sub-pixel are electrically conductive in different time periods; and detecting the electrical signal on the same sensing signal line electrically connected to the second end of the sensing subcircuit of the first sub-pixel and the second end of the sensing subcircuit of the second sub-pixel during the time period when the sensing subcircuit of the first sub-pixel is electrically conductive and during the time period when the sensing subcircuit of the first sub-pixel is electrically conductive.

[0031] At least one embodiment of the present disclosure further provides a display device, which includes any one of the display substrates provided in the embodiments of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings of the embodiments will be briefly introduced below. Obviously, the drawings in the following description only relate to some embodiments of the present disclosure, rather than limiting the present disclosure.

[0033] FIG1 is a block diagram of a display substrate provided by an embodiment of the present disclosure;

[0034] FIG2A is a schematic block diagram of a pixel circuit of a display unit provided in an embodiment of the present disclosure;

[0035] FIG2B is a circuit diagram of an implementation example of the pixel circuit shown in FIG2A ;

[0036] FIG2C is a timing diagram of the pixel circuit of one sub-pixel shown in FIG2B during the display process;

[0037] 2C and 2D are signal timing diagrams showing a process of detecting electrical characteristics of a driving transistor, such as a threshold voltage, in the pixel circuit of one sub-pixel shown in FIG. 2B ;

[0038] 2E-2F are examples of signal timing diagrams when detecting an abnormality in the pixel circuit shown in FIG. 2B ;

[0039] FIG3A is a schematic block diagram of a pixel circuit of another display unit provided in an embodiment of the present disclosure;

[0040] FIG3B is a circuit diagram of an implementation example of the pixel circuit shown in FIG3A ;

[0041] FIG4A is a schematic block diagram of a pixel circuit of another display unit provided in an embodiment of the present disclosure;

[0042] FIG4B is a circuit diagram of an implementation example of the pixel circuit shown in FIG4A ;

[0043] FIG4C is an example of a signal timing diagram when detecting an abnormality in the pixel circuit shown in FIG4B ;

[0044] FIG5A is a schematic block diagram of a pixel circuit of another display unit provided in an embodiment of the present disclosure;

[0045] FIG5B is a circuit diagram of an implementation example of the pixel circuit shown in FIG5A ;

[0046] FIG6A is a schematic block diagram of a pixel circuit of another display unit provided in an embodiment of the present disclosure;

[0047] FIG6B is a circuit diagram of an implementation example of the pixel circuit shown in FIG6A ;

[0048] FIG6C is an example of a signal timing diagram when detecting an abnormality in the pixel circuit shown in FIG6B ;

[0049] FIG7A is a schematic block diagram of a pixel circuit of another display unit provided in an embodiment of the present disclosure;

[0050] FIG7B is a circuit diagram of an implementation example of the pixel circuit shown in FIG7A ;

[0051] FIG8A is a schematic block diagram of a pixel circuit of another display unit provided in an embodiment of the present disclosure;

[0052] FIG8B is a circuit diagram of an implementation example of the pixel circuit shown in FIG8A ;

[0053] FIG8C is an example of a signal timing diagram when detecting an abnormality in the pixel circuit shown in FIG8B ;

[0054] FIG9A is a schematic block diagram of a pixel circuit of another display unit provided in an embodiment of the present disclosure;

[0055] FIG9B is a circuit diagram of an implementation example of the pixel circuit shown in FIG9A ;

[0056] 9C-9D are examples of signal timing diagrams when detecting an abnormality in the pixel circuit shown in FIG. 9B ;

[0057] FIG10A is a schematic block diagram of a pixel circuit of another display unit provided in an embodiment of the present disclosure;

[0058] FIG10B is a circuit diagram of an implementation example of the pixel circuit shown in FIG10A ;

[0059] FIG11 is a schematic block diagram of a display device provided by an embodiment of the present disclosure. DETAILED DESCRIPTION

[0060] To make the purpose, technical solutions, and advantages of the embodiments of the present disclosure more clear, the technical solutions of the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings of the embodiments of the present disclosure. The embodiments described below are part of the embodiments of the present disclosure, not all of the embodiments. Based on the described embodiments of the present disclosure, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present disclosure.

[0061] Unless otherwise defined, the technical or scientific terms used herein should have the usual meanings understood by persons of ordinary skill in the field to which the invention belongs. The words "first", "second" and similar terms used in this disclosure do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, words such as "include" or "comprise" mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Words such as "connect" or "connected" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the object being described changes, the relative positional relationship may also change accordingly.

[0062] In the pixel circuits of some OLED display devices, an external compensation circuit is used to compensate for the pixel circuit to improve the short-term afterimage problem that may be caused by the hysteresis effect of the display device. This requires detecting the threshold voltage of the driving transistor and performing compensation based on the threshold voltage value. However, during the manufacturing process of high-resolution display substrates, some transistors are prone to short circuits. When the transistor through which the detected signal needs to pass shorts during the process of detecting the threshold of the driving transistor, the detected signal will be erroneous, or even have a large deviation, resulting in an erroneous threshold voltage value of the measured driving transistor. Normal compensation cannot be performed for the pixel circuit where the abnormality occurs, resulting in abnormal display of the pixel where the pixel circuit is located, forming dotted lines on the display panel.

[0063] At least one embodiment of the present disclosure provides a display substrate, which includes a display unit, which is located in a display area and performs a display function. The display unit includes a plurality of sub-pixels, and each of the plurality of sub-pixels includes a pixel circuit; the pixel circuit includes: a driving sub-circuit, a light-emitting element, and a sensing sub-circuit; the first end of the sensing sub-circuit is electrically connected to the first end of the driving sub-circuit and the first electrode of the light-emitting element; the display substrate includes a sensing signal line, a sensing scan signal line, and a detection scan signal line, the control end of the sensing sub-circuit is electrically connected to the sensing scan signal line, and the sensing sub-circuit is configured to detect electrical characteristics of the sub-pixel to which it belongs through the sensing signal line in response to a sensing scan signal; among the plurality of sub-pixels of the display unit, the pixel circuit of at least one sub-pixel includes a detection control sub-circuit, wherein the control end of the detection control sub-circuit is electrically connected to the detection scan signal line to receive the detection scan signal, the first end of the detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit, and the second end of the detection control sub-circuit is electrically connected to the sensing signal line.

[0064] At least one embodiment of the present disclosure also provides a detection method applied to the above-mentioned display substrate provided by the embodiment of the present disclosure, the detection method comprising: performing at least two detections on at least one sub-pixel of the display unit, and performing at least two detections on the electrical signal on the sensing signal line, specifically comprising: in one detection, turning on the detection control transistors of all sub-pixels contained in the display unit, and if the electrical signal on the sensing signal line is abnormal, performing the next detection; in the next detection, turning off the detection control transistor of at least one sub-pixel in the display unit to re-detect other sub-pixels; judging whether the multiple sub-pixels are abnormal based on the electrical signals on the sensing signal line obtained from the two detections; and for the abnormal sub-pixel, obtaining the threshold voltage of the driving sub-circuit of the sub-pixel of the same color without abnormality in other display units as the threshold voltage of the driving sub-circuit of the abnormal sub-pixel to compensate for the abnormal sub-pixel.

[0065] At least one embodiment of the present disclosure further provides a display substrate, which includes a display unit, which is located in a display area and performs a display function. The display unit includes a plurality of sub-pixels, and each of the plurality of sub-pixels includes a pixel circuit; the pixel circuit includes: a driving sub-circuit, a light-emitting element, and a sensing sub-circuit, the driving sub-circuit is configured to control the magnitude of the driving current flowing through the light-emitting element; the control end of the sensing sub-circuit is configured to receive a sensing scan signal, and the first end of the sensing sub-circuit is electrically connected to the first end of the driving sub-circuit and the first electrode of the light-emitting element; the display substrate includes a plurality of sensing signal lines, the second end of the sensing sub-circuit is electrically connected to a corresponding sensing signal line, and the sensing sub-circuit is electrically connected to the first electrode of the light-emitting element. The circuit is configured to detect the electrical characteristics of the sub-pixel to which it belongs through the sensing signal line electrically connected thereto in response to the received sensing scanning signal; the multiple sub-pixels of the display unit include a first sub-pixel, a second sub-pixel and a third sub-pixel; the second end of the sensing sub-circuit of the first sub-pixel and the second end of the sensing sub-circuit of the second sub-pixel are electrically connected to the same sensing signal line, the second end of the sensing sub-circuit of the third sub-pixel and the second end of the sensing sub-circuit of the first sub-pixel are electrically connected to different sensing signal lines, and the control end of the sensing sub-circuit of the first sub-pixel and the control end of the sensing sub-circuit of the second sub-pixel are electrically connected to different sensing scanning signal ends to receive different sensing scanning signals.

[0066] At least one embodiment of the present disclosure also provides a detection method applied to the above-mentioned display substrate provided by the embodiment of the present disclosure, the detection method comprising: applying different sensing scanning signals to the control end of the sensing subcircuit of the first sub-pixel and the control end of the sensing subcircuit of the second sub-pixel, respectively, so that the sensing subcircuit of the first sub-pixel and the sensing subcircuit of the second sub-pixel are electrically conductive in different time periods; and detecting the electrical signal on the same sensing signal line electrically connected to the second end of the sensing subcircuit of the first sub-pixel and the second end of the sensing subcircuit of the second sub-pixel during the time period when the sensing subcircuit of the first sub-pixel is electrically conductive and during the time period when the sensing subcircuit of the first sub-pixel is electrically conductive.

[0067] At least one embodiment of the present disclosure further provides a display device, which includes any one of the display substrates provided in the embodiments of the present disclosure.

[0068] FIG1 is a block diagram of a display substrate provided by at least one embodiment of the present disclosure. As shown in FIG1 , the display substrate 10 includes a display area DR and a non-display area NR that at least partially surrounds the display area DR. The display substrate 10 includes a plurality of display units PU located in the display area DR and distributed in an array, and the display unit PU performs a display function. Each display unit PU includes a plurality of sub-pixels 100. For example, FIG1 takes an example in which a display unit PU includes three sub-pixels 100. Of course, there is no limitation on the number of sub-pixels included in a display unit PU, and it may be less than three or more than three. Each sub-pixel 100 includes a light-emitting element and a pixel circuit for driving the light-emitting element. As shown in FIG1 , the display substrate 10 also includes a plurality of scan lines GL and a plurality of data lines DL. The plurality of scan lines GL and the plurality of data lines DL intersect with each other to define a plurality of pixel areas distributed in an array in the display area DR, and a pixel circuit for a sub-pixel 100 is provided in each pixel area. The pixel circuit is, for example, a conventional pixel circuit, such as a 3T1C (i.e., two transistors and one capacitor) pixel circuit, a 4T2C, a 5T1C, or an nTmC (n, m are positive integers) pixel circuit, and in different embodiments, the pixel circuit may further include a compensation subcircuit, which includes an internal compensation subcircuit or an external compensation subcircuit, and the compensation subcircuit may include a transistor, a capacitor, etc. For example, as needed, the pixel circuit may further include a reset circuit, a light emitting control subcircuit, a detection circuit, etc. For example, the display substrate 10 may also include a scan drive circuit SC and a data drive circuit DC located in the non-display area NR. The scan drive circuit SC is, for example, a gate drive circuit (e.g., a GOA drive circuit). The scan drive circuit SC is connected to the pixel circuit via a scan line GL to provide various scan signals, and the data drive circuit DC is connected to the pixel circuit via a data line DL to provide data signals. The positional relationship of the scan drive circuit SC and the data drive circuit DC, the scan line GL, and the data line DL in the display substrate shown in FIG. 1 is only an example, and the actual arrangement position can be designed as needed.

[0069] For example, the display substrate 10 may further include a control circuit (not shown). For example, the control circuit is configured to control the data drive circuit DC to apply the data signal and control the gate drive sub-circuit to apply the scan signal. An example of the control circuit is a timing control circuit (T-con). The control circuit may be in various forms, for example, including a processor and a memory, the memory including executable code, and the processor running the executable code to perform the above-mentioned detection method.

[0070] For example, the processor may be a central processing unit (CPU) or other forms of processing devices with data processing capabilities and / or instruction execution capabilities, such as a microprocessor, a programmable logic controller (PLC), etc.

[0071] For example, the storage device may include one or more computer program products, which may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. Volatile memory may include, for example, random access memory (RAM) and / or cache memory. Non-volatile memory may include, for example, read-only memory (ROM), a hard disk, flash memory, etc. One or more computer program instructions may be stored on the computer-readable storage medium, and the processor may execute the functions desired by the program instructions. Various application programs and various data may also be stored in the computer-readable storage medium.

[0072] As needed, the pixel circuit may include a driving subcircuit, a data writing subcircuit, a compensation subcircuit and a storage subcircuit, and may also include a light emitting control subcircuit, a reset circuit, etc. as needed.

[0073] FIG2A shows a schematic block diagram of a pixel circuit of a display unit provided by at least one embodiment of the present disclosure. As shown in FIG2A , the pixel circuit includes: a driving subcircuit 12, a light-emitting element 15, and a sensing subcircuit 14. The driving subcircuit 12 is configured to control the magnitude of a driving current flowing through the light-emitting element 15. In each sub-pixel including the pixel circuit, a control terminal of the sensing subcircuit 14 is electrically connected to a sensing scan signal line to receive a sensing scan signal G2, and a first terminal 141 of the sensing subcircuit 14 is electrically connected to a first terminal of the driving subcircuit 12 and a first electrode 151 of the light-emitting element 15. The display substrate 10 includes a sensing signal line SENSE, a sensing scan signal line, and a detection scan signal line. For example, the plurality of scan lines GL include a sensing scan signal line and a detection scan signal line. The sensing subcircuit 14 is configured to detect electrical characteristics of the sub-pixel 100 to which it belongs through the sensing signal line SENSE in response to the sensing scan signal G2. For example, the control terminals of the sensing sub-circuits 14 of the plurality of sub-pixels 100 of the display unit PU are electrically connected to the same sensing scan signal line to receive the same sensing scan signal G2 .

[0074] Among the multiple sub-pixels 100 of the display unit PU, the pixel circuit of at least one sub-pixel 100 includes a detection control sub-circuit, wherein a control terminal of the detection control sub-circuit is electrically connected to a detection scan signal line to receive a detection scan signal G2, a first terminal of the detection control sub-circuit is electrically connected to a second terminal of the sensing sub-circuit, and the second terminal of the detection control sub-circuit is electrically connected to a sensing signal line SENSE. For example, in FIG2A , a display unit PU includes two sub-pixels 100, namely a first sub-pixel P1 and a second sub-pixel P2. Taking the first sub-pixel P1 as an example, for example, the first sub-pixel P1 includes a first detection control sub-circuit O1, and the detection scan signal line includes a first detection scan signal line. In the first sub-pixel P1, the control terminal of the first detection control sub-circuit O1 is electrically connected to the first detection scan signal line to receive a first detection scan signal G3, a first terminal O11 of the first detection control sub-circuit O1 is electrically connected to a second terminal 142 of the sensing sub-circuit 14, and a second terminal O12 of the first detection control sub-circuit O1 is electrically connected to the sensing signal line SENSE.

[0075] For example, each of the multiple sub-pixels 100 of the display unit PU includes multiple detection control sub-circuits. For example, the multiple detection control sub-circuits included in the multiple sub-pixels in the display unit PU are electrically connected to the same sensing signal line SENSE, and the control terminals of the multiple detection control sub-circuits are electrically connected to different detection scanning signal lines. In this case, the multiple sub-pixels 100 share the same sensing signal line SENSE.

[0076] For example, as shown in Figure 2A, the second sub-pixel P2 also includes a detection control sub-circuit, that is, the second sub-pixel P2 includes a second detection control sub-circuit 02; the detection scanning signal line also includes a second detection scanning signal line, the control end of the second detection control sub-circuit 02 is electrically connected to the second detection scanning signal line to receive the second detection scanning signal G4, the first end 011 of the first detection control sub-circuit 01 is electrically connected to the second end 142 of the sensing sub-circuit 14, and the second end 012 of the first detection control sub-circuit 01 is electrically connected to the sensing signal line SENSE. For example, as shown in Figure 2A, the pixel circuit of the first sub-pixel P1 includes a first detection control sub-circuit 01, and the second end 142 of the sensing sub-circuit 14 of the first sub-pixel P1 is electrically connected to the sensing signal line SENSE through the first detection control sub-circuit 01; the pixel circuit of the second sub-pixel P2 includes a second detection control sub-circuit 02, and the second end 142 of the sensing sub-circuit 14 of the second sub-pixel P2 is electrically connected to the sensing signal line SENSE through the second detection control sub-circuit 02, and the second end 012 of the first detection control sub-circuit 01 and the second end 022 of the second detection control sub-circuit 02 are electrically connected to the same sensing signal line SENSE.

[0077] The electrical characteristics of the sub-pixel 100 include, for example, the threshold voltage and / or carrier mobility of a driving transistor (described below) included in the driving sub-circuit 12 , or the threshold voltage and driving current of the light-emitting element.

[0078] In the pixel circuit of the display unit PU, the first sub-pixel P1 and the second sub-pixel P2 share the same sensing signal line SENSE. In the process of detecting the electrical signal on the sensing signal line SENSE, the first sub-pixel P1 and the second sub-pixel P2 are detected respectively by controlling whether the first detection control sub-circuit 01 and the second detection control sub-circuit 02 are electrically conductive, and the electrical signal from the first sub-pixel P1 and the electrical signal from the second sub-pixel P2 are obtained respectively to avoid interference caused by superposition of the two, so as to judge whether the sensing sub-circuit 14 of the first sub-pixel P1 and the sensing sub-circuit 14 of the second sub-pixel P2 are abnormal, so as to determine the sub-pixel or sub-pixel column where the abnormality occurs, and thus solve the abnormality problem of the sub-pixel or sub-pixel column in a targeted manner.

[0079] For example, the control end of the first detection control subcircuit 01 is configured to receive a first detection scan signal G3, the first end 011 of the first detection control subcircuit 01 is electrically connected to the second end 142 of the sensing subcircuit 14 of the first subpixel P1, and the second end 012 of the first detection control subcircuit 01 is electrically connected to the sensing signal line SENSE. The control end of the first detection control subcircuit 01 is configured to receive a second detection scan signal G4, the first end 021 of the second detection control subcircuit 02 is electrically connected to the second end 142 of the sensing subcircuit 14 of the second subpixel P2, and the second end 022 of the second detection control subcircuit 02 is electrically connected to the sensing signal line SENSE. The second scan signal G4 can be different from the first scan signal G3, for example, they can come from different scan signal lines and can be independently controlled. Thus, the first detection control subcircuit 01 and the second detection control subcircuit 02 can be independently controlled to determine whether they are electrically conductive by controlling the first detection scan signal G3 and the second detection scan signal G4. When the first detection control sub-circuit 01 is electrically conductive, the electrical signal passing through the sensing sub-circuit 14 of the first sub-pixel P1 is allowed to reach the sensing signal line SENSE through the first detection control sub-circuit 01, otherwise it is not allowed to reach the sensing signal line SENSE; when the second detection control sub-circuit 02 is electrically conductive, the electrical signal passing through the sensing sub-circuit 14 of the second sub-pixel P2 is allowed to reach the sensing signal line SENSE through the second detection control sub-circuit 02, otherwise it is not allowed to reach the sensing signal line SENSE.

[0080] For example, as shown in FIG2A , the pixel circuit further includes a data write subcircuit 11 and a storage subcircuit 13. A first terminal of the storage subcircuit 13 is electrically connected to the driving terminal 120 of the driver subcircuit 12, and a second terminal of the storage subcircuit 13 is electrically connected to the first electrode 151 of the light-emitting element 15. The second electrode of the light-emitting element 15 receives, for example, a second power supply voltage ELVSS. The data write subcircuit 11 is configured to write a data signal Vd1 (taking the first subpixel as an example, and labeled Vd2, Vd3, and Vd4 in the second, third, and fourth subpixels, respectively) to the control terminal of the driver subcircuit 12 in response to the data scan signal G1. The driver subcircuit 12 is configured to control the magnitude of the drive current flowing through the light-emitting element 15 based on the data signal.

[0081] Figure 2B is a circuit diagram of an exemplary implementation of the pixel circuit shown in Figure 2A. As shown in Figure 2B , for example, the storage sub-circuit 13 includes a storage capacitor Cst, and the driver sub-circuit 12 includes a driver transistor T3. The gate of the driver transistor T3 is electrically connected to the first electrode of the storage capacitor Cst. The first electrode of the driver transistor T3 is electrically connected to the second electrode of the storage capacitor Cst and to the light-emitting element 15. The second electrode of the driver transistor T3 is configured to receive a first power supply voltage ELVDD. The driver transistor T3 is configured to control the current used to drive the light-emitting element 15 under the control of the voltage at the gate of the driver transistor T3. For example, the sensing sub-circuit 14 includes a sensing transistor T2, wherein a first electrode of the sensing transistor T2 is electrically connected to a first electrode of the driving transistor T3 and a second end of the storage sub-circuit 13, a second electrode of the sensing transistor T2 is electrically connected to a sensing signal line SENSE, and the sensing signal line SENSE is electrically connected to a detection circuit. The gate of the sensing transistor T2 is configured to receive a sensing scan signal G2, and the sensing transistor T2 is configured to detect the electrical characteristics of the sub-pixel 100 to which it belongs through the detection circuit in response to the sensing scan signal G2 to achieve electrical compensation. The electrical characteristics may include, for example, the threshold voltage and / or carrier mobility of the driving transistor T3, or the threshold voltage and drive current of the light-emitting element. Here, the electrical characteristic is described as the threshold voltage of the driving transistor T3. The detection circuit may be, for example, an external detection circuit of the pixel circuit, i.e., the sensing signal line SENSE is connected to the external detection circuit to detect the electrical signal on the sensing signal line SENSE. For example, it may be a conventional circuit including a digital-to-analog converter (DAC) and an analog-to-digital converter (ADC), and the embodiments of the present disclosure are not described in detail.

[0082] For example, in a sub-pixel having a detection control transistor, a second electrode of the detection control transistor is electrically connected to a sensing signal line, and a gate of the detection control transistor is electrically connected to a corresponding detection scanning signal line.

[0083] Continuing with reference to FIG2B , for example, the first detection control sub-circuit 01 includes a first detection control transistor T4, whose gate is configured to receive a first detection scan signal G3, a first electrode of the first detection control transistor T4 being electrically connected to the second electrode of the sensing transistor T2 of the first sub-pixel P1, and a second electrode of the first detection control transistor T4 being electrically connected to the sensing signal line SENSE. The second detection control sub-circuit 02 includes a second detection control transistor T5, whose gate is configured to receive a second detection scan signal G4, a first electrode of the second detection control transistor T5 being electrically connected to the second electrode of the sensing transistor T2 of the second sub-pixel P2, and a second electrode of the second detection control transistor T5 being electrically connected to the sensing signal line SENSE. That is, the second electrodes of the first detection control transistor T4 and the second electrodes of the second detection control transistor T5 are electrically connected to the same sensing signal line SENSE. The gate of the first detection control transistor T4 is electrically connected to the first detection scan signal line to receive the first detection scan signal G3, and the gate of the second detection control transistor T5 is electrically connected to the second detection scan signal line to receive the second detection scan signal G4. Thus, whether the first detection control transistor T4 and the second detection control transistor T5 are turned on can be independently controlled by controlling the first detection scan signal G3 and the second detection scan signal G4. When the first detection control transistor T4 is turned on, the electrical signal passing through the sensing transistor T2 of the first sub-pixel P1 is allowed to pass through the first detection control transistor T4 to reach the sensing signal line SENSE and be detected. When the first detection control transistor T4 is turned off, the electrical signal is not allowed to reach the sensing signal line SENSE. When the second detection control transistor T5 is turned on, the electrical signal passing through the sensing transistor T2 of the second sub-pixel P2 is allowed to pass through the second detection control transistor T5 to reach the sensing signal line SENSE. When the second detection control transistor T5 is turned off, the electrical signal is not allowed to reach the sensing signal line SENSE.

[0084] The transistors used in the embodiments of the present disclosure can all be thin film transistors or field effect transistors or other switching devices with the same characteristics. The embodiments of the present disclosure are all described by taking thin film transistors as examples. The source and drain of the transistors used here can be symmetrical in structure, so their source and drain can be structurally indistinguishable. In the embodiments of the present disclosure, in order to distinguish the two poles of the transistor other than the gate, one of the poles is directly described as the first pole and the other pole as the second pole, that is, the first pole of the transistor can be the source and the second pole of the transistor is the drain, or the first pole of the transistor is the drain and the second pole of the transistor is the source. In addition, transistors can be divided into N-type and P-type transistors according to the characteristics of the transistor. When the transistor is a P-type transistor, the turn-on voltage is a low-level voltage (for example, 0V, -5V, -10V or other suitable voltages), and the turn-off voltage is a high-level voltage (for example, 5V, 10V or other suitable voltages); when the transistor is an N-type transistor, the turn-on voltage is a high-level voltage (for example, 5V, 10V or other suitable voltages), and the turn-off voltage is a low-level voltage (for example, 0V, -5V, -10V or other suitable voltages). It should be noted that in the following description, the transistors in the pixel circuit are N-type transistors as an example, but this is not a limitation to the present disclosure.

[0085] The working principle of the pixel circuit of a sub-pixel shown in Figure 2B is explained below in conjunction with the signal timing diagrams shown in Figures 2C to 2E, where Figure 2B shows a signal timing diagram of the pixel circuit during the display process, and Figures 2C and 2D show signal timing diagrams of the pixel circuit during the process of detecting the electrical characteristics of the driving transistor T3, such as the threshold voltage.

[0086] For example, as shown in FIG2C , the display process of each frame of image includes a data writing and resetting phase 1 and a light emitting phase 2. FIG2C shows the timing waveforms of each signal in each phase. One operation process of the pixel circuit includes:

[0087] In the data writing and resetting phase 1, the data scanning signal G1 and the sensing scanning signal G2 are both on signals, the data transistor T1 and the sensing transistor T2 are turned on, and the data signal Vd1 is transmitted to the gate of the driving transistor T3 via the data transistor T1. At the same time, the first detection scanning signal G3 is an on signal, the first detection control transistor T4 is turned on, and the detection circuit (for example, an external detection circuit connected to the sensing signal line SENSE) writes a reset signal to the first electrode 151 of the light-emitting element 15 (for example, the anode of the OLED) through the sensing signal line SENSE, the first detection control transistor T4, and the sensing transistor T2. The driving transistor T3 is turned on and generates a driving current to charge the first electrode 151 of the light-emitting element 15 to the operating voltage.

[0088] During light-emitting phase 2, both the data scan signal G1 and the sensing scan signal G2 are off signals. Due to the bootstrap effect of the storage capacitor Cst, the voltage across the storage capacitor Cst remains unchanged, the driving transistor T3 operates in a saturated state, and drives the light-emitting element to emit light. At the same time, during light-emitting phase 2, the first detection scan signal G3 is an off signal, so that the first detection control transistor T4 remains off. The operation process of the pixel circuit of each sub-pixel during the display process is similar, and reference can be made to the description above using the first sub-pixel P1 as an example. For the first detection control transistor T4 and the second detection control transistor T5, similar to the first sub-pixel P1, during the data writing and reset phase 1 of the second sub-pixel P2, the second detection scan signal G4 is an on signal, and the second detection control transistor T5 is turned on. During the light-emitting phase 2 of the second sub-pixel P2, the second detection scan signal G4 is an off signal, so that the second detection control transistor T5 remains off.

[0089] For example, FIG2D shows a signal timing diagram when the threshold voltage of the driving transistor T3 is detected when the pixel circuit does not have the first detection control transistor T4. For example, the threshold voltage detection process can be performed when the display device is turned off. One operation process of the pixel circuit includes:

[0090] The data scan signal G1 and the sensing scan signal G2 are both on signals, the data transistor T1 and the sensing transistor T2 are turned on, and the data signal Vd1 is transmitted to the gate of the driving transistor T3 via the data transistor T1. The detection circuit writes a reset signal to the first electrode 151 (node ​​S) of the light-emitting element 15 via the sensing signal line SENSE and the sensing transistor T2, turning on the driving transistor T3 and charging the node S until the driving transistor T3 is turned off. For example, the voltage signal on the sensing signal line SENSE is detected and sampled by a digital-to-analog converter in the detection circuit to obtain the threshold voltage of the driving transistor T3. The measured threshold voltage is recorded and the pixel circuit of the corresponding sub-pixel is compensated according to the threshold voltage. For example, the threshold voltage can be added to the data signal Vd of the pixel circuit, and the data signal Vd is the data voltage, thereby achieving compensation for the driving transistor T3.

[0091] During the process of detecting and sampling the voltage on the sensing signal line SENSE, the electrical signal of the node S needs to be transmitted to the sensing signal line SENSE through the sensing transistor T2. Therefore, if an abnormality occurs in the sensing transistor T2 of the sub-pixel, such as a short circuit occurs between the gate and the source or the drain of the sensing transistor T2, the voltage of the node S actually measured will deviate from the actual voltage, and the threshold voltage of the driving transistor will be incorrectly judged to be larger, resulting in incorrect compensation, so that the sub-pixel or the sub-pixel column where the sub-pixel is located is incorrectly compensated, thereby causing an abnormal display problem on the display panel using the display substrate.

[0092] The display substrate 10 provided in the embodiments of the present disclosure can perform abnormality detection on sub-pixels to identify abnormal sub-pixels. For example, abnormality detection can be performed on sub-pixels column by column. For example, when a problem occurs, abnormality detection can be performed on a column of sub-pixels near the location of the display abnormality. The sub-pixels in a column share the sensing signal line SENSE shown in Figures 1B-1C.

[0093] For example, at least one embodiment of the present disclosure provides a method for detecting a display substrate, including: performing at least two detections on at least one sub-pixel of a display unit PU, and performing two detections on an electrical signal on a sensing signal line, wherein, in one detection, the detection control transistors of all sub-pixels included in the display unit are turned on, and if the electrical signal on the sensing signal line is abnormal, a next detection is performed; in the next detection, the detection control transistors of at least one sub-pixel in the display unit are turned off to detect other sub-pixels again; and determining whether multiple sub-pixels are abnormal based on the electrical signals on the sensing signal line obtained from the two detections. For example, for an abnormal sub-pixel, the threshold voltage of the driving sub-circuit of a non-abnormal sub-pixel of the same color in other display units is obtained as the threshold voltage of the driving sub-circuit of the abnormal sub-pixel to compensate for the abnormal sub-pixel.

[0094] In this way, it is possible to detect abnormal sub-pixels among the multiple sub-pixels of the display unit, and correctly compensate for the abnormal sub-pixels during the display process, thereby solving the problem of incorrect detection of the threshold voltage of the sub-pixel driving sub-circuit due to the abnormality of the sub-pixel sensing sub-circuit. For example, the threshold voltage of the driving sub-circuit of the normal sub-pixel column closest to the abnormal sub-pixel is selected as the normal threshold voltage to reduce the impact on the display effect. For example, the threshold voltage of the driving sub-circuit of the sub-pixel column adjacent to the abnormal sub-pixel is obtained as the normal threshold voltage to reduce the impact on the display effect. If the sensing transistor of the adjacent sub-pixel column also has an abnormality, the threshold voltage of the driving sub-circuit of the next sub-pixel column is selected as the normal threshold voltage.

[0095] The detection mentioned in the present disclosure refers to the detection of the electrical signal on the sensing signal line SENSE, which is described uniformly here.

[0096] For example, specifically, taking the above two detections as an example, the detection method includes: during the first detection, turning on the detection control transistors of all sub-pixels included in the display unit PU, and performing the first detection on the electrical signal on the sensing signal line SENSE, that is, detecting the sub-pixels included in the display unit as a whole. If the measured signal is abnormal (the detected signal is obviously too high), the display unit PU is detected. There is a short circuit in the sensing transistor of at least one sub-pixel in the display unit PU; in this case, in the second detection, the detection control transistor of at least one sub-pixel in the display unit PU is randomly turned off, and a sub-pixel whose detection control transistor is not turned off is used as a test sub-pixel to perform a second detection on the electrical signal on the sensing signal line SENSE to determine the abnormal sub-pixel in the display unit PU; in the second detection, if the detection signal of the measured sensing signal line is abnormal (for example, the detected signal is obviously too high), it means that there is a short circuit in the sensing transistor of other sub-pixels except the sub-pixel with the turned-off detection control transistor, including the abnormality of the test sub-pixel, and also including the abnormality of other sub-pixels except the test sub-pixel and the sub-pixel with the turned-off detection control transistor. If the detection signal of the measured sensing signal line is normal, it means that there is a short circuit in the sensing transistor of the sub-pixel with the turned-off detection control transistor.

[0097] For example, detecting a certain sub-pixel means: using a certain sub-pixel 100 among the multiple sub-pixels 100 of the display unit PU as a test sub-pixel and detecting the electrical signal on the sensing signal line SENSE twice, that is, detecting at least one sub-pixel 100 of the display unit PU at least twice includes: using at least one sub-pixel among the multiple sub-pixels 100 of the display unit PU as a test sub-pixel and detecting the electrical signal on the sensing signal line SENSE twice, during the two detection processes, writing a data signal to the test sub-pixel and not writing a data signal to other sub-pixels 100 except the test sub-pixel, for example, the data signal written to other sub-pixels 100 except the test sub-pixel is a 0V voltage signal. Thus, during the two detection processes, in the test subpixel, the storage capacitor Cst is charged by the data signal, thereby charging the S node. When there is no abnormality in the subpixel and the sensing transistor of the test subpixel is normal, the potential of the S node can be transmitted to the corresponding sensing signal line SENSE through the sensing transistor and the corresponding detection transistor, such as the first detection control transistor T4, and detected as a normal threshold voltage. If the sensing transistor of the test subpixel is short-circuited, the voltage signal detected from the sensing signal line SENSE will be too large. For subpixels other than the test subpixel in the display unit, the written data signal is a 0V voltage signal. If the sensing transistor T2 of the subpixel is normal and the corresponding detection transistor, such as the first detection control transistor T4, is turned on, no voltage signal is transmitted from the S node to the corresponding sensing signal line SENSE. In the embodiment shown in FIG2B , since the sensing signal line SENSE in FIG2B is shared by the first subpixel P1 and the second subpixel P2, at this time, only the electrical signal from the S node of the test subpixel reaches the shared sensing signal line SENSE and is detected. Therefore, in this case, it is possible to prevent the detected result from being the superposition of signals from the S nodes of the first sub-pixel P1 and the second sub-pixel P2 electrically connected to the same sensing signal line SENSE. If the sensing transistor T2 of the sub-pixel is short-circuited, even if the written data signal is a 0V voltage signal, when the corresponding detection transistor, such as the first detection control transistor T4, is turned on, a short-circuit electrical signal will be transmitted to the corresponding sensing signal line SENSE.

[0098] For example, in the process of performing two detections on the electrical signal on the sensing signal line SENSE using at least one sub-pixel among the multiple sub-pixels of the display unit PU as a test sub-pixel, the first detection scan signal and the second detection scan signal in the first detection of the two detection processes are controlled to be not completely the same as the first detection scan signal and the second detection scan signal in the second detection.

[0099] In the case where the first sub-pixel P1 includes a first detection control sub-circuit 01 and the second pixel P2 includes a second detection control sub-circuit 02, when abnormality detection is performed on the sub-pixels of the display substrate 10, the detection method includes: applying a first detection scan signal G3 to the first detection control sub-circuit 01, the first detection control sub-circuit 01 allows the electrical signal of the second end 142 of the sensing sub-circuit 14 of the first sub-pixel P1 to be transmitted to the sensing signal line SENSE in response to the first detection scan signal G3, and detects the electrical signal on the sensing signal line SENSE; and applying a second detection scan signal G4 to the second detection control sub-circuit 02, the second detection control sub-circuit 02 allows the electrical signal of the second end 142 of the sensing sub-circuit 14 of the second sub-pixel P2 to be transmitted to the sensing signal line SENSE in response to the second detection scan signal G4, and detects the electrical signal on the sensing signal line SENSE.

[0100] The detection method of the display substrate 10 provided in the embodiment of the present disclosure includes: performing two consecutive detections on different sub-pixels to be detected (e.g., a first sub-pixel P1 and a second sub-pixel P2) as test sub-pixels, wherein in the first detection, the detection control transistors of all sub-pixels included in the display unit PU are turned on, allowing the electrical signals of the S nodes of multiple sub-pixels electrically connected to the same sensing signal line to be transmitted to the same sensing signal line, and in the second detection, the detection control transistor of at least one sub-pixel in the display unit PU is turned off, thereby not allowing the electrical signal of the S node of the sub-pixel with the detection control transistor turned off to be transmitted to the same sensing signal line. The order of these two detections can be interchanged.

[0101] For example, the detection method includes: sequentially performing the above two detections on the electrical signal on the sensing signal line using each sub-pixel of all sub-pixels of the display unit PU as the test sub-pixel, and determining the sub-pixel in which the sensing transistor is short-circuited based on the results of the two detections.

[0102] For example, the detection method of the display substrate 10 provided in the embodiment of the present disclosure also includes: obtaining the threshold voltage of the driving transistor T3 of the sub-pixel of the same color without abnormalities in other display units PU as the normal threshold voltage, and using the normal threshold voltage as the threshold voltage of the driving transistor T3 of the abnormal sub-pixel to compensate for the abnormal sub-pixel during the display process.

[0103] For example, the display substrate 10 includes multiple subpixel columns extending along the extension direction of the sensing signal line SENSE in FIG. 2B , each subpixel column including multiple subpixels. For example, the subpixel column in which the first subpixel P1 is located includes multiple subpixels, each of which has a pixel circuit identical to the pixel circuit of the first subpixel P1. The detection method is described using the detection of a single subpixel as an example. For example, when detecting an abnormality on the display substrate 10, the detection can be performed subpixel by subpixel, and the threshold voltage of the driving transistor T3 of a subpixel of the same color that is normal and in other display units PU is used as the threshold voltage of the subpixel to compensate for the abnormality. Alternatively, the detection can be performed column by column, where a column of subpixels is detected simultaneously, and the threshold voltages of the driving transistors T3 of the multiple subpixels in the abnormal subpixel column are replaced with the threshold voltages of the driving transistors T3 of a normal subpixel column of the same color. That is, each time a column of subpixels is detected, the replacement signal is also a signal for replacing the subpixels in the column, so as to accurately detect a particular column of subpixels in the pixel array.

[0104] Next, a method for detecting abnormalities on a display substrate is introduced with respect to pixel circuits of sub-pixels of several different display units provided in the embodiments of the present disclosure.

[0105] For example, when the plurality of sub-pixels of the display unit include a first sub-pixel and a second sub-pixel, wherein the first sub-pixel includes the first detection control transistor and the second sub-pixel includes the second detection transistor, the detection method includes:

[0106] During the first detection, the first detection control transistor and the second detection control transistor are both turned on. When the detection signal of the sensing signal line is abnormal, the first detection control transistor or the second detection control transistor is randomly turned off, and then the sub-pixel that is not turned off is used as the test sub-pixel for the second detection; and

[0107] During the second detection, if the detection signal of the sensing signal line is abnormal, it means that the sensing transistor of the test sub-pixel is abnormal; if the detection signal of the sensing signal line is normal, it means that the sensing transistors of other sub-pixels except the test sub-pixel are abnormal.

[0108] For example, the above detection method is specifically described using the detection of the pixel circuit shown in Figure 2B as an example. For example, Figures 2E-2F are example signal timing diagrams when detecting an abnormality in the pixel circuit shown in Figure 2B. Referring to Figure 2E, for example, the detection method for the display substrate shown in Figure 2B includes: using the first subpixel P1 as the test subpixel, performing two detections on the electrical signal on the sensing signal line SENSE. In both detections, the first detection scan signal G3 is an on signal, and the second detection scan signal G4 is an on signal and an off signal, respectively. t1 represents the first detection, and t2 represents the second detection.

[0109] For example, referring to FIG2E , the first detection includes the following four stages.

[0110] 1. In the first stage, i.e., the data writing stage, the data scanning signal G1, the sensing scanning signal G2, the first detection scanning signal G3, and the second detection scanning signal G4 are all at high potentials at the same time. The data transistor T1, the sensing transistor T2, the driving transistor T3, the first detection control transistor T4, and the second detection control transistor T5 are all turned on. The data signal Vd1 (e.g., a data voltage signal) and the reset signal (e.g., a reset voltage signal) are respectively written to the first sub-pixel P1. For details, please refer to the previous description of the data writing stage and the reset stage. At the same time, a data signal of 0V is written to the remaining sub-pixels of the display unit except the first sub-pixel P1.

[0111] 2. In the second stage, i.e., the charging stage, the data scan signal G1 is at a low potential, the sensing scan signal G2, the first detection scan signal G3, and the second detection scan signal G4 are all at a high potential at the same time, the data transistor T1 is turned off, the sensing transistor T2, the first detection control transistor T4, the second detection control transistor T5, and the driving transistor T3 are all turned on to charge the S node. At this time, the sensing signal line SENSE is floating (i.e., no electrical signal is connected).

[0112] 3. In the third stage, i.e., the sampling stage, when the S node is charged until the driving transistor T3 is cut off, the voltage on the sensing signal line SENSE is sampled by the ADC electrically connected to the sensing signal line SENSE to measure the S node potential. The measured S node potential is recorded as the first detection result.

[0113] 4. In the fourth phase, i.e., the reset phase, the data scan signal G1, the sensing scan signal G2, the first detection scan signal G3, and the second detection scan signal G4 are all high, and both the data transistors T1 and the sensing transistors T2 are turned on, writing the data signal Vd1 and the reset signal, respectively. For example, in some embodiments, the fourth phase may not be included in the first and second detection phases. The same applies to the detection processes of other pixel circuits, and will not be repeated here.

[0114] For example, in the embodiment of the present disclosure, during the process of abnormality detection on the display substrate, each detection can include the above four stages, namely the data writing stage, the charging stage, the sampling stage and the reset stage, or include the above three stages 1 to 3, that is, removing the reset stage, which will not be repeated below. Moreover, in the embodiment of the present disclosure, in the two detections performed with each sub-pixel as a test sub-pixel, the order of the first detection and the second detection can be interchanged; the order of detection with each sub-pixel as a sub-pixel can also be interchanged. The embodiment of the present disclosure does not limit the order of which sub-pixel is used as the test sub-pixel. In this regard, it will not be repeated in the following embodiments.

[0115] Referring to FIG2E , the second test also includes four phases. The difference from the first test is that the second test scan signal G4 remains low, keeping the first test control transistor T4 off. This prevents the S node potential of the first subpixel P1 from reaching the sensing signal line SENSE. In the third phase, the voltage on the sensing signal line SENSE is sampled and recorded as the second test result. As shown in FIG2E , if the first test result is not equal to the second test result, or even if the first test result is significantly higher than the second test result, i.e., the first test result is abnormal and the second test result is normal, then the potential transmitted to the sensing signal line SENSE via the sensing transistor T2 of the first subpixel P1 during the first test was too high, causing a short circuit in the sensing transistor T2, i.e., detecting an abnormality in the first subpixel P1. The threshold voltage of the driving transistor T3 of a non-abnormal subpixel of the same color as the first subpixel P1 in other display units PU is obtained as the normal threshold voltage. This normal threshold voltage is then used as the threshold voltage of the driving transistor T3 of the first subpixel P1 to compensate for the first subpixel P1 during the display process. If both the first and second detection results are abnormal (the electrical signal is too large), it proves that the short circuit problem of the sensing transistor T2 of the first sub-pixel P1 does not exist, but the short circuit problem of the sensing transistor T2 of the second sub-pixel P2 occurs.

[0116] Referring to FIG2F , the inspection method for the display substrate shown in FIG2B further includes: using the second subpixel P2 as a test subpixel and performing two inspections on the electrical signal on the sensing signal line SENSE. The difference between these two inspections and the aforementioned inspection using the first subpixel P1 as the test subpixel is that, in both inspections, the second inspection scan signal G4 is an on signal, while the first inspection scan signal G3 is an on signal and an off signal, respectively. Similarly, if the first inspection result is not substantially equal to the second inspection result, or even if the voltage signal of the first inspection result is significantly higher than that of the second inspection result, it indicates that the potential transmitted to the sensing signal line SENSE via the sensing transistor T2 of the second subpixel P2 during the first inspection was too high. This is likely due to a short circuit in the sensing transistor T2, i.e., an abnormality in the second subpixel P2 is detected. The threshold voltage of the driving transistor T3 of a non-abnormal subpixel of the same color as the second subpixel P2 in other display units PU is obtained as the normal threshold voltage, and the normal threshold voltage is used as the threshold voltage of the driving transistor T3 of the second subpixel P2 to compensate for the second subpixel P2 during the display process. If the first detection result is not substantially equal to the second detection result, it is proved that the second sub-pixel P2 is normal, or at least there is no short circuit problem.

[0117] It should be noted that the order of performing the test using the first sub-pixel P1 as the test sub-pixel and the order of performing the test using the second sub-pixel P2 as the test sub-pixel can be interchanged, and the order of these two steps is not limited.

[0118] For example, on the basis that the display unit includes the above-mentioned first sub-pixel and second sub-pixel, the multiple sub-pixels of the display unit also include a third sub-pixel, and the second end of the sensing sub-circuit of the third sub-pixel is electrically connected to the same sensing signal line through the first detection control sub-circuit, during the first detection, the detection control transistors of all the sub-pixels contained in the display unit (that is, the first sub-pixel, the second sub-pixel and the third sub-pixel) are turned on, and the first detection is performed on the electrical signal on the sensing signal line, that is, the sub-pixels contained in the display unit are detected as a whole. If the measured signal is abnormal (the detected signal is obviously too high), there is a short circuit in the sensing transistor of at least one sub-pixel in the display unit; in this case, in the second detection, the detection control transistor of at least one sub-pixel in the display unit is randomly turned off. The control transistor is tested, and a sub-pixel whose detection control transistor is not turned off is used as a test sub-pixel to perform a second test on the electrical signal on the same sensing signal line to determine the abnormal sub-pixel in the display unit; in the second test, if the detection signal of the measured sensing signal line is abnormal (for example, the detected signal is obviously too high), it means that the sensing transistors of other sub-pixels except the sub-pixel whose detection control transistor is turned off have a short-circuit problem, including the case where the test sub-pixel is abnormal, and also including the case where other sub-pixels except the test sub-pixel and the sub-pixel whose detection control transistor is turned off are abnormal; if the detection signal of the measured sensing signal line is normal, it means that the sensing transistor of at least one sub-pixel in the sub-pixels whose detection control transistor is turned off has a short-circuit problem.

[0119] For example, Figure 3A is a schematic block diagram of a pixel circuit of another display unit provided by at least one embodiment of the present disclosure; Figure 3B is a circuit diagram of an implementation example of the pixel circuit shown in Figure 3A. The structures of the first subpixel P1 and the second subpixel P2 of the display unit shown in Figure 3A are the same as those in Figure 2A. The pixel circuit of the display unit shown in Figure 3A differs from the embodiment shown in Figure 2A in the following ways. Referring to Figure 3A, for example, the multiple subpixels 100 of the display unit PU also include a third subpixel P3. The second terminal 142 of the sensing subcircuit 14 of the third subpixel P3 is electrically connected to the sensing signal line SENSE via the first detection control subcircuit O1. In this embodiment, the first subpixel P1, the second subpixel P2, and the third subpixel P3 share a single sensing signal line SENSE. For example, the second terminal 142 of the sensing subcircuit 14 of the third subpixel P3 is electrically connected to the first terminal 011 of the first detection control subcircuit O1. In this way, in the case of three subpixels, it is possible to detect whether all three subpixels have an abnormality. For example, the connection relationship among the data sub-circuit 11 , the driving sub-circuit 12 , the storage sub-circuit 13 , the sensing sub-circuit 14 and the light-emitting element 15 of the three sub-pixels is the same, and reference may be made to the description in the previous embodiment.

[0120] For example, the 3T1C circuit structures of the three sub-pixels in FIG3B are identical, and reference can be made to the description in FIG2B . Referring to FIG3B , the second electrode of the sensing transistor T2 of the third sub-pixel P3 is electrically connected to the second electrode of the sensing transistor T2 of the first sub-pixel P1 and the first electrode of the first detection control transistor T4 of the first sub-pixel P1.

[0121] For example, the inspection method for the display panel shown in FIG. 3B differs from the inspection method for the display substrate shown in FIG. 2B in the following ways.

[0122] The detection method for the display substrate shown in Figure 3B includes: taking at least one of the first sub-pixel P1 and the third sub-pixel P3 as the test sub-pixel, and performing two detections on the electrical signal on the sensing signal line SENSE. In the two detections, the first detection scanning signal G3 is an on signal, and the second detection scanning signal G4 is an on signal and an off signal, respectively.

[0123] For example, with the first subpixel P1 as the test subpixel, the electrical signal on the sensing signal line SENSE is tested twice. In the first test, the first detection scan signal G3 and the second detection scan signal G4 are both on signals, so that the first detection control transistor T4 and the second detection control transistor T5 are both turned on. Then, during the sampling phase, the voltage on the sensing signal line SENSE is sampled, and the S node potential is measured. This measured S node potential is recorded as the first test result. In the second test, the first detection scan signal G3 is an on signal, and the second detection scan signal G4 is an off signal, so that the first detection control transistor T4 is turned on and the second detection control transistor T5 is turned off. Then, during the sampling phase, the voltage on the sensing signal line SENSE is sampled, and the S node potential is measured. This measured S node potential is recorded as the second test result. In the first test, the electrical signal at the S node of the first subpixel P1 is measured, and in the second test, the potential at the S node of the second subpixel is measured. If the first detection result is not equal to the second detection result, or even the voltage signal of the first detection result is obviously much higher than that of the second detection result, that is, the first detection result is abnormal and the second detection result is normal, it proves that in the first detection, the potential transmitted to the sensing signal line SENSE through the sensing transistor T2 of the second sub-pixel P2 is too high, which proves that the sensing transistor T2 of the second sub-pixel P2 is short-circuited, that is, the second sub-pixel P2 is detected to be abnormal. Then, the threshold voltage of the driving transistor T3 of the sub-pixel with the same color as the second sub-pixel P2 that is normal in other display units PU is obtained as the threshold voltage of the driving transistor T3 of the second sub-pixel P2 to compensate the second sub-pixel P2 during the display process. If both the first and second test results are abnormal (the electrical signal is too large), it proves that the second sub-pixel P2 does not have a short-circuit problem with the sensing transistor T2, and the first sub-pixel P1 and the third sub-pixel P3 may have a short-circuit problem with the sensing transistor T2. This is because regardless of whether the first sub-pixel P1 or the third sub-pixel P3 has a short-circuit problem with the sensing transistor T2, an excessively large short-circuit signal from the corresponding sensing transistor T2 will be transmitted to the sensing signal line SENSE through the conductive first detection control transistor T4. Of course, here, the third sub-pixel P3 can also be used as the detection sub-pixel for two tests. The method for determining abnormal sub-pixels based on the two test results is similar to the above-mentioned method for determining the abnormal sub-pixel by performing two tests with the first sub-pixel P1 as the detection sub-pixel, and the principle is the same.

[0124] The inspection method for the display substrate shown in FIG3B further includes: using the second subpixel P2 as a test subpixel, and performing two inspections on the electrical signal on the sensing signal line SENSE. In both inspections, the second inspection scan signal G4 is an on signal, and the first inspection scan signal G3 is an on signal and an off signal, respectively. For example, in the first inspection, the first inspection scan signal G3 and the second inspection scan signal G4 are both on signals, so that the first inspection control transistor T4 and the second inspection control transistor T5 are both turned on. Then, during a sampling phase, the voltage on the sensing signal line SENSE is sampled to measure the S node potential, and the measured S node potential is recorded as the first inspection result. In the second inspection, the first inspection scan signal G3 is an off signal, and the second inspection scan signal G4 is an on signal, so that the first inspection control transistor T4 is turned off and the second inspection control transistor T5 is turned on. Then, during a sampling phase, the voltage on the sensing signal line SENSE is sampled to measure the S node potential, and the measured S node potential is recorded as the second inspection result. If the first detection result is not equal to the second detection result, or even if the voltage signal of the first detection result is significantly higher than that of the second detection result, it proves that in the first detection, the potential transmitted to the sensing signal line SENSE via the sensing transistor T2 of the first subpixel P1 and / or the third subpixel P3 is too high. This is likely due to a short circuit in the sensing transistor T2 of the first subpixel P1 and / or the third subpixel P3, i.e., an abnormality is detected in the first subpixel P1 and / or the third subpixel P3. Then, the threshold voltages of the driving transistors T3 of the normal subpixels of the same color as the first subpixel P1 and the third subpixel P3 in other display units PU are obtained as the threshold voltages of the driving transistors T3 of the first subpixel P1 and the third subpixel P3, respectively, to compensate for the display of the first subpixel P1 and the third subpixel P3. If the first detection result is substantially equal to the second detection result, it proves that the first subpixel P1 and the third subpixel P3 are normal, or at least there is no short circuit problem between them. In this way, abnormal sub-pixels among the multiple sub-pixels of the display unit can be detected, and the abnormal sub-pixels can be correctly compensated during the display process, thereby solving the above-mentioned problem of incorrect threshold voltage detection of the sub-pixel driving transistor T3 caused by the abnormality of the sub-pixel sensing transistor T2.

[0125] For each detection, for the working states of other transistors in each sub-pixel except the first detection control transistor T4 and the second detection control transistor T5 at each stage, please refer to the description of FIG. 2E .

[0126] For example, on the basis that the display unit includes the above-mentioned first sub-pixel and the second sub-pixel, the plurality of sub-pixels of the display unit further includes a third sub-pixel, the pixel circuit of the third sub-pixel further includes a third detection control sub-circuit, the detection scan signal line includes a third detection scan signal line, the control end of the third detection control sub-circuit is electrically connected to the third detection scan signal line to receive a third detection scan signal, the first end of the third detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit of the third sub-pixel, and the second end of the third detection control sub-circuit is electrically connected to the sensing signal line,

[0127] The detection method comprises:

[0128] Using one sub-pixel of the display unit as the test sub-pixel, the electrical signal on the sensing signal line is tested twice.

[0129] In a first detection, the detection control transistors of all sub-pixels included in the display unit are turned on, and the electrical signal on the sensing signal line is detected for the first time. If the detection signal of the sensing signal line is abnormal, it indicates that a short circuit problem exists in the sensing transistor of at least one sub-pixel in the display unit. Then, the detection control transistors of two sub-pixels in the display unit other than the test sub-pixel are turned off, and the electrical signal on the sensing signal line is detected for the second time.

[0130] In the second detection, if the detection signal of the sensing signal line is normal, it means that at least one of the two sub-pixels whose detection control transistors are turned off has a sensing transistor short-circuit problem; if the detection signal of the sensing signal line is abnormal, it means that the test sub-pixel has a sensing transistor short-circuit problem.

[0131] For example, Figure 4A is a schematic block diagram of a pixel circuit of another display unit provided by at least one embodiment of the present disclosure; Figure 4B is a circuit diagram of an implementation example of the pixel circuit shown in Figure 4A. The structures of the first sub-pixel P1 and the second sub-pixel P2 of the display unit shown in Figure 4A are the same as those in Figure 3A, and the pixel circuit of the display unit shown in Figure 4A has the following differences from the embodiment shown in Figure 3A. For example, referring to Figure 4A, the multiple sub-pixels 100 of the display unit PU also include a third sub-pixel P3, and the pixel circuit of the third sub-pixel P3 also includes a third detection control sub-circuit 03, and the second end 142 of the sensing sub-circuit 14 of the third sub-pixel P3 is electrically connected to the sensing signal line SENSE through the third detection control sub-circuit 03. In this embodiment, the first sub-pixel P1, the second sub-pixel P2 and the third sub-pixel P3 share a sensing signal line SENSE. For example, the detection scan signal line includes a third detection scan signal line, a control terminal of the third detection control subcircuit 03 is electrically connected to the third detection scan signal line to receive a third detection scan signal G5, a first terminal of the third detection control subcircuit 03 is electrically connected to the second terminal 142 of the sensing subcircuit 14 of the third subpixel P3, and a second terminal of the third detection control subcircuit 03 is electrically connected to the sensing signal line SENSE. In the pixel circuit of the display unit provided in this embodiment, the potentials of the S nodes of the first subpixel P1, the second subpixel P2, and the third subpixel P3 are respectively transmitted to the sensing signal line SENSE via the first detection control subcircuit 01, the second detection control subcircuit 02, and the third detection control subcircuit 03. The control of transmitting the potentials of the S nodes of these three subpixels to the sensing signal line SENSE is independent of each other, thereby enabling independent detection of whether these three subpixels are abnormal.

[0132] Referring to Figure 4B, for example, the third detection control sub-circuit 03 includes a third detection control transistor T6, the gate of the third detection control transistor T6 is electrically connected to the third detection scan signal line to receive the third detection scan signal G5, the first electrode of the third detection control transistor T6 is electrically connected to the second electrode of the sensing transistor T2 of the third sub-pixel P3, and the second electrode of the third detection control transistor T6 is electrically connected to the sensing signal line SENSE.

[0133] For example, the method for inspecting the display panel shown in FIG4B differs from the method for inspecting the display substrate shown in FIG3B in the following ways. FIG4C is an example of a signal timing diagram for inspecting an abnormality in the pixel circuit shown in FIG4B . Referring to FIG4C , the method for inspecting the display substrate shown in FIG4B includes: using the first subpixel P1 as a test subpixel, performing two inspections of the electrical signal on the sensing signal line SENSE, wherein the first inspection scan signal G3 is always an on signal, the second inspection scan signal G4 is respectively an on signal and an off signal, and the third inspection scan signal G5 is respectively an on signal and an off signal. For example, in a first detection, the first detection scan signal G3, the second detection scan signal G4, and the third detection scan signal G5 are all on signals, so that the first detection control transistor T4, the second detection control transistor T5, and the third detection control transistor T6 are all turned on. Then, in a sampling phase, the voltage on the sensing signal line SENSE is sampled, and the measured potential result is recorded as the first detection result. In a second detection, the first detection scan signal G3 is an on signal, and the second detection scan signal G4 and the third detection scan signal G5 are all off signals, so that the first detection control transistor T4 is turned on and the second detection control transistor T5 and the third detection control transistor T6 are all turned off. Then, in a sampling phase, the voltage on the sensing signal line SENSE is sampled, and the measured potential result is recorded as the second detection result. In the first detection, the potentials of the S nodes of the first sub-pixel P1, the second sub-pixel P2, and the third sub-pixel P3 are all transmitted to the sensing signal line SENSE. In the second detection, only the potential of the S node of the first sub-pixel P1 is transmitted to the sensing signal line SENSE. Therefore, if the first test result is not equal to the second test result, for example, if the voltage signal of the first test result is significantly higher than that of the second test result, that is, the first test result is abnormal and the second test result is normal, then it is proved that a short-circuit signal was transmitted to the sensing signal line SENSE during the first test, while the second test result is normal, which proves that the first subpixel P1 is normal. Therefore, the second subpixel P2 and / or the third subpixel P3 are abnormal. Subsequently, the second subpixel P2 and the third subpixel P3 are used as test subpixels for testing, and similar methods can be used to detect whether the second subpixel P2 and the third subpixel P3 are abnormal. If the first test result is substantially equal to the second test result and neither is a significantly high voltage signal, that is, both test results are normal, then all three subpixels are normal. If the first test result is substantially equal to the second test result and both are excessively high voltage signals, that is, both test results are abnormal, then the first subpixel P1 is abnormal, and both measurements have relatively high short-circuit signals. By combining subsequent testing with the second sub-pixel P2 and the third sub-pixel P3 as test sub-pixels and comparing multiple test results, it can be determined whether each test result is a voltage signal that is obviously too high.Thus, it is possible to determine whether an abnormal sub-pixel exists and identify the abnormal sub-pixel.

[0134] Then, the detection method for the display substrate shown in Figure 4B also includes: using the second sub-pixel P2 as the test sub-pixel, in two detections of the electrical signal on the sensing signal line SENSE, the second detection scanning signal G4 is an on signal, the first detection scanning signal G3 is an on signal and an off signal, respectively, and the third detection scanning signal G5 is an on signal and an off signal, respectively. Similar to the detection with the first sub-pixel P1 as the test sub-pixel, for example, in the first detection, the first detection scan signal G3, the second detection scan signal G4 and the third detection scan signal G5 are all turn-on signals, so that the first detection control transistor T4, the second detection control transistor T5 and the third detection control transistor T6 are all turned on, and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is recorded as the first detection result; in the second detection, the second detection scan signal G4 is the turn-on signal, the first detection scan signal G3 and the third detection scan signal G5 are both turn-off signals, so that the second detection control transistor T5 is turned on, and the first detection control transistor T4 and the third detection control transistor T6 are both turned off, and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is recorded as the second detection result. In the first test, the potentials of the S nodes of the first, second, and third subpixels P1, P2, and P3 are all transmitted to the sensing signal line SENSE. In the second test, only the potential of the S node of the second subpixel P2 is transmitted to the sensing signal line SENSE. Therefore, if the first test result is not equal to the second test result, for example, if the voltage signal of the first test result is significantly higher than that of the second test result, that is, the first test result is abnormal and the second test result is normal, then it is confirmed that a short-circuit signal was transmitted to the sensing signal line SENSE during the first test, while the second test result is normal, thus proving that the second subpixel P2 is normal and at least one of the other subpixels in the display unit PU is abnormal. If the first and second test results are substantially equal and neither has a significantly high voltage signal, that is, both test results are normal, then all three subpixels are normal. If the first and second test results are substantially equal and both have an excessively high voltage signal, that is, both test results are abnormal, then the second subpixel P2 is abnormal, with both measured short-circuit signals being relatively high. By combining the test results using the first subpixel P1 as the test subpixel and comparing multiple test results, it is possible to determine whether each test result represents a significantly overly high voltage signal. Subpixels corresponding to significantly higher potential signals that can transmit their S node signals to the sensing signal line SENSE are abnormal subpixels. This allows the presence of abnormal subpixels to be determined and identified.

[0135] For example, the inspection method for the display substrate shown in FIG4B further includes: using the third subpixel P3 as a test subpixel, and performing two inspections on the electrical signal on the sensing signal line SENSE, wherein the third inspection scan signal G5 is always an on signal, the first inspection scan signal G3 is an on signal and an off signal, respectively, and the second inspection scan signal G4 is an on signal and an off signal, respectively. The principle is the same as the above-mentioned method using the first subpixel P1 and the second subpixel P2 as test subpixels. Reference can be made to the previous description to determine whether the third subpixel P3 is abnormal. Combining the inspection results using the first subpixel P1, the second subpixel P2, and the third subpixel P3 as test subpixels, it is possible to determine whether the three subpixels are abnormal and identify the abnormal subpixel. If no significantly larger potential detection results are obtained during the tests using the first, second, and third subpixels P1, P2, and P3 as test subpixels, then all three subpixels are normal. If one or two subpixels are abnormal, then the results of the two tests using the abnormal subpixel as the test subpixel are unequal, for example, significantly different, representing a significant difference between the two test results as described above. The abnormal subpixel can then be identified using the above method. If all three subpixels are abnormal, then regardless of which subpixel is used as the test subpixel, each test result will be a significantly larger electrical signal.

[0136] Figure 5A is a schematic block diagram of a pixel circuit of another display unit provided by at least one embodiment of the present disclosure; Figure 5B is a circuit diagram of an implementation example of the pixel circuit shown in Figure 5A. The structures of the first sub-pixel P1 and the second sub-pixel P2 of the display unit shown in Figure 5A are the same as those in Figure 4A, and the pixel circuit of the display unit shown in Figure 5A has the following differences from the embodiment shown in Figure 4A. For example, referring to Figure 5A, for example, the pixel circuit of the third sub-pixel P3 also includes a third detection control sub-circuit 03, and the second end 142 of the sensing sub-circuit 14 of the third sub-pixel P3 is electrically connected to the sensing signal line SENSE through the third detection control sub-circuit 03 and the first detection control sub-circuit 01 in sequence. In this embodiment, the first sub-pixel P1, the second sub-pixel P2 and the third sub-pixel P3 share a sensing signal line SENSE. For example, the detection scan signal line includes a third detection scan signal line. The control terminal of the third detection control sub-circuit 03 is electrically connected to the third detection scan signal line to receive the third detection scan signal G5. The first terminal of the third detection control sub-circuit 03 is electrically connected to the second terminal 142 of the sensing sub-circuit 14 of the third sub-pixel P3. The second terminal of the third detection control sub-circuit 03 is electrically connected to the first terminal 011 of the first detection control sub-circuit 01. The pixel circuit of this display unit can also be used to detect whether the three sub-pixels of the display unit have abnormalities.

[0137] Referring to Figure 5B, for example, the third detection control sub-circuit 03 includes a third detection control transistor T6, the gate of the third detection control transistor T6 is configured to receive a third detection scan signal G5, the first electrode of the third detection control transistor T6 is electrically connected to the second electrode of the sensing transistor T2 of the third sub-pixel P3, and the second electrode of the third detection control transistor T6 is electrically connected to the first electrode of the first detection control transistor T4.

[0138] For example, the inspection method for the display panel shown in FIG5B differs from the inspection method for the display substrate shown in FIG4B in the following ways: The inspection method for the display substrate shown in FIG5B includes: in two inspections of the electrical signal on the sensing signal line SENSE using the first subpixel P1 as the test subpixel, the first inspection scan signal G3 is always an on signal, and accordingly, the second inspection scan signal G4 and the third inspection scan signal G5 are both simultaneously an on signal and simultaneously an off signal, respectively. For example, in a first detection, the first detection scan signal G3, the second detection scan signal G4, and the third detection scan signal G5 are all on signals, so that the first detection control transistor T4, the second detection control transistor T5, and the third detection control transistor T6 are all turned on. Then, in a sampling phase, the voltage on the sensing signal line SENSE is sampled, and the measured potential result is recorded as the first detection result. In a second detection, the first detection scan signal G3 is an on signal, and the second detection scan signal G4 and the third detection scan signal G5 are all off signals, so that the first detection control transistor T4 is turned on and the second detection control transistor T5 and the third detection control transistor T6 are all turned off. Then, in a sampling phase, the voltage on the sensing signal line SENSE is sampled, and the measured potential result is recorded as the second detection result. In the first detection, the potentials of the S nodes of the first sub-pixel P1, the second sub-pixel P2, and the third sub-pixel P3 are all transmitted to the sensing signal line SENSE. In the second detection, only the potential of the S node of the first sub-pixel P1 is transmitted to the sensing signal line SENSE. Therefore, if the first test result is not equal to the second test result, for example, if the voltage signal of the first test result is significantly higher than that of the second test result, that is, the first test result is abnormal and the second test result is normal, then it is proved that a short circuit signal was transmitted to the sensing signal line SENSE during the first test, while the second test result is normal, then it is proved that the first subpixel P1 is normal, and the second subpixel P2 and / or the third subpixel P3 are abnormal. Subsequently, the second subpixel P2 and the third subpixel P3 are used as test subpixels for testing, and similar methods can be used to detect whether the second subpixel P2 and the third subpixel P3 are abnormal. If the first test result is substantially equal to the second test result and neither is a significantly high voltage signal, that is, both test results are normal, then it is proved that all three subpixels are normal. If the first test result is substantially equal to the second test result and both are excessively high voltage signals, and both measurements are relatively high short circuit signals, that is, both test results are abnormal, then it is proved that the first subpixel P1 is abnormal. By subsequently testing the second and third sub-pixels P2 and P3 as test sub-pixels and comparing the test results multiple times, it is possible to determine whether each test result is a significantly overly high voltage signal. Thus, it is possible to determine whether there are any abnormal sub-pixels and identify the abnormal sub-pixels.

[0139] The detection method for the display substrate shown in Figure 5B also includes: using the second sub-pixel P2 as the test sub-pixel, in two detections of the electrical signal on the sensing signal line SENSE, the second detection scanning signal G4 is an on signal, and the first detection scanning signal G3 is an on signal and an off signal respectively. Accordingly, in the sensing when the first detection scanning signal G3 is an on signal, the third detection scanning signal G5 is an on signal. For example, in the first detection, the first detection scan signal G3, the second detection scan signal G4 and the third detection scan signal G5 are all on signals, so that the first detection control transistor T4, the second detection control transistor T5 and the third detection control transistor T6 are all turned on, and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is recorded as the first detection result; in the second detection, the first detection scan signal G3 is an off signal, the second detection scan signal G4 is an on signal, and the third detection scan signal G5 is an off signal or an on signal, so that the first detection control transistor T4 is turned off, the second detection control transistor T5 is turned on, and the third detection control transistor T6 is turned off or turned on (because the first detection control transistor T4 is turned off at this time, no matter whether the third detection control transistor T6 is turned off or turned on, the electrical signal in the third sub-pixel P3 will not be transmitted to the sensing signal line SENSE), and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is the second detection result. In the first test, the potentials of the S nodes from the first sub-pixel P1, the second sub-pixel P2 and the third sub-pixel P3 are all conducted to the sensing signal line SENSE, and in the second test, only the potential of the S node of the second sub-pixel P2 is conducted to the sensing signal line SENSE. Therefore, if the first detection result is not equal to the second detection result, for example, if the voltage signal of the first detection result is significantly higher than that of the second detection result, that is, the first detection result is abnormal and the second detection result is normal, then it is confirmed that a short-circuit signal was transmitted to the sensing signal line SENSE during the first detection, while the second detection result is normal, which proves that the second subpixel P2 is normal and the first subpixel P1 and / or the third subpixel P3 are abnormal, but it is not possible to accurately identify whether the first subpixel P1 or the third subpixel P3 is abnormal. In this case, the threshold voltages of the driving transistors T3 of the subpixels of the same color as the first subpixel P1 and the third subpixel P3 in other display units PU that are normal are respectively obtained as the threshold voltages of the driving transistors T3 of the first subpixel P1 and the third subpixel P3 to compensate for the first subpixel P1 and the third subpixel P3 during the display process. If the first detection result is substantially equal to the second detection result and both are excessive electrical signals, that is, both detection results are abnormal, then it is confirmed that the sensing transistor T2 of the second subpixel P2 is short-circuited.Thus, it is possible to determine whether there is an abnormal sub-pixel, identify the abnormal sub-pixel, and perform compensation and correction.

[0140] The detection method for the display substrate shown in Figure 5B also includes: using the third sub-pixel P3 as the test sub-pixel, in two detections of the electrical signal on the sensing signal line SENSE, the first detection scanning signal G3 and the third detection scanning signal G5 are both on signals, and the second detection scanning signal G4 is respectively an on signal and an off signal. For example, in the first detection, the first detection scan signal G3, the second detection scan signal G4, and the third detection scan signal G5 are all turn-on signals, so that the first detection control transistor T4, the second detection control transistor T5, and the third detection control transistor T6 are all turned on, and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is recorded as the first detection result; in the second detection, the first detection scan signal G3 is an turn-on signal, the second detection scan signal G4 is an off signal, and the third detection scan signal G5 is an turn-on signal, so that the first detection control transistor T4 is turned on (because the first detection control transistor T4 remains turned on, the signal of the S node of the third sub-pixel P3 can be transmitted to the sensing signal line SENSE through the sensing transistor T2, the third detection control transistor T6, and the first detection control transistor T4 of the third sub-pixel P3 in sequence), the second detection control transistor T5 is turned off, and the third detection control transistor T6 is turned on, and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is the second detection result. In the first detection, the potentials of the S nodes of the first subpixel P1, the second subpixel P2, and the third subpixel P3 are all transmitted to the sensing signal line SENSE. In the second detection, the potentials of the S nodes of the first subpixel P1 and the S nodes of the third subpixel P3 are all transmitted to the sensing signal line SENSE. Therefore, in the embodiment shown in FIG5B , if the first subpixel P1 is normal, that is, if the sensing transistor T2 of the first subpixel P1 is not short-circuited, it is possible to determine whether the third subpixel P3 is normal, that is, whether the sensing transistor T2 of the third subpixel P3 is short-circuited. If the first subpixel P1 is normal, if the first detection result is different from the second detection result, for example, if the voltage signal of the first detection result is significantly higher than that of the second detection result, that is, the first detection result is abnormal and the second detection result is normal, then it is confirmed that a short-circuit signal was transmitted to the sensing signal line SENSE during the first detection, while the second detection result is normal, indicating that the first subpixel P1 and the third subpixel P3 are both normal, and the sensing transistor T2 of the second subpixel P2 is short-circuited.If the test results of both times are obviously too high potential signals, that is, the test results of both times are abnormal, it proves that at least one of the first sub-pixel P1 and the third sub-pixel P3 is abnormal. At this time, if the first sub-pixel P1 has been judged to be normal in the previous "twice testing of the electrical signal on the sensing signal line SENSE with the first sub-pixel P1 as the test sub-pixel", then it can be proved that the third sub-pixel P3 has a short-circuit problem of the sensing transistor T2, which makes the potential on the sensing signal line SENSE too large. At this time, the normal threshold voltage of other sub-pixel columns with the same color as the third sub-pixel is independently used as the threshold voltage of the third sub-pixel P3 to perform display compensation for the third sub-pixel P3, without replacing the threshold voltage of the first sub-pixel P1. If the first subpixel P1 is determined to be abnormal in the previous "twice testing the electrical signal on the sensing signal line SENSE using the first subpixel P1 as the test subpixel", and in the case of the first subpixel P1 being abnormal, that is, in the case of the sensing transistor T2 of the first subpixel P1 being short-circuited, then, regardless of whether the third subpixel P3 is normal, the electrical signal transmitted to the sensing signal line SENSE through the first detection control transistor T4 is an abnormal electrical signal. Therefore, in this case, it is impossible to determine whether the third subpixel P3 is normal. At this time, the threshold voltages of the first subpixel P1 and the third subpixel P3 are replaced at the same time, that is, the threshold voltages of the driving transistors T3 of the subpixels of the same color as the first subpixel P1 and the third subpixel P3 in other display units PU that are normal are respectively obtained as the threshold voltages of the driving transistors T3 of the first subpixel P1 and the third subpixel P3, so as to compensate the first subpixel P1 and the third subpixel P3 during the display process, so as to ensure that the first subpixel P1 and the third subpixel P3 are correctly compensated.

[0141] Figure 6A is a schematic block diagram of a pixel circuit of another display unit provided by at least one embodiment of the present disclosure; Figure 6B is a circuit diagram of an implementation example of the pixel circuit shown in Figure 6A. The pixel circuit of the display unit shown in Figure 6A has the following differences from the embodiment shown in Figure 3A. For example, referring to Figure 6A, the multiple sub-pixels 100 of the display unit PU also include a fourth sub-pixel P4, and the second end 142 of the sensing sub-circuit 14 of the fourth sub-pixel P4 is electrically connected to the sensing signal line SENSE through the second detection control sub-circuit 02. For example, the second end 142 of the sensing sub-circuit 14 of the fourth sub-pixel P4 is electrically connected to the first end 021 of the second detection control sub-circuit 02, and the second end 012 of the second detection control sub-circuit 02 is electrically connected to the sensing signal line SENSE. In this way, the first sub-pixel P1, the second sub-pixel P2, the third sub-pixel P3, and the fourth sub-pixel P4 share a sensing signal line SENSE. Based on principles similar to the previous embodiment, when a display unit PU includes four sub-pixels, it is possible to detect whether abnormalities occur in the four sub-pixels, for example, whether the sensing transistors of the four sub-pixels are short-circuited.

[0142] The inspection method for the display substrate shown in FIG6B includes: using at least one of the first subpixel P1 and the third subpixel P3 as a test subpixel, and performing two inspections on the electrical signal on the sensing signal line SENSE, wherein the first inspection scan signal G3 is always an on signal, and the second inspection scan signal G4 is respectively an on signal and an off signal. The specific inspection method is the same as the method for FIG3B , "using at least one of the first subpixel P1 and the third subpixel P3 as a test subpixel, and performing two inspections on the electrical signal on the sensing signal line SENSE," and please refer to the previous description.

[0143] The inspection method for the display substrate shown in FIG6B further includes: using at least one of the second subpixel P2 and the fourth subpixel P4 as a test subpixel, and performing two inspections of the electrical signal on the sensing signal line SENSE, wherein the second inspection scan signal G4 is always an on signal, and the fourth inspection scan signal G6 is respectively an on signal and an off signal. The specific inspection method of this step is similar to the method of the step "using at least one of the first subpixel P1 and the third subpixel P3 as a test subpixel," and the principles are the same, except that the first subpixel P1 and the third subpixel P3 in the step "using at least one of the first subpixel P1 and the third subpixel P3 as a test subpixel" are replaced with the second subpixel P2 and the fourth subpixel P4, respectively. FIG6C uses the timing sequence of the two inspections performed using the second subpixel P2 as the test subpixel as an example. In this way, abnormal subpixels among the four subpixels of the display unit can be detected and correctly compensated for during the display process.

[0144] Figure 7A is a schematic block diagram of a pixel circuit of another display unit provided by at least one embodiment of the present disclosure; Figure 7B is a circuit diagram of an implementation example of the pixel circuit shown in Figure 7A. The pixel circuit of the display unit shown in Figure 7A has the following differences from the embodiment shown in Figure 4A. For example, referring to Figure 7A, for example, the multiple sub-pixels 100 of the display unit PU also include a fourth sub-pixel P4, and the pixel circuit of the fourth sub-pixel P4 also includes a fourth detection control sub-circuit 04, and the second end 142 of the sensing sub-circuit 14 of the fourth sub-pixel P4 is electrically connected to the sensing signal line SENSE through the fourth detection control sub-circuit 04. In this embodiment, the first sub-pixel P1, the second sub-pixel P2, the third sub-pixel P3 and the fourth sub-pixel P4 share a sensing signal line SENSE. For example, the detection scan signal line includes a fourth detection scan signal line, a control terminal of the fourth detection control subcircuit 04 is electrically connected to the fourth detection scan signal line to receive a fourth detection scan signal G6, a first terminal of the fourth detection control subcircuit 04 is electrically connected to the second terminal 142 of the sensing subcircuit 14 of the fourth subpixel P4, and a second terminal of the fourth detection control subcircuit 04 is electrically connected to the sensing signal line SENSE. In the pixel circuit of the display unit provided in this embodiment, the potentials of the S nodes of the first subpixel P1, the second subpixel P2, the third subpixel P3, and the fourth subpixel P4 are respectively transmitted to the sensing signal line SENSE via the first detection control subcircuit 01, the second detection control subcircuit 02, the third detection control subcircuit 03, and the fourth detection control subcircuit 04. The control of transmitting the potentials of the S nodes of these four subpixels to the sensing signal line SENSE is independent of each other, thereby enabling independent detection of whether these four subpixels are abnormal.

[0145] Referring to Figure 7B, for example, the fourth detection control sub-circuit 04 includes a fourth detection control transistor T7, the gate of the fourth detection control transistor T7 is electrically connected to the fourth detection scan signal line to receive the fourth detection scan signal G6, the first electrode of the fourth detection control transistor T7 is electrically connected to the second electrode of the sensing transistor T2 of the fourth sub-pixel P4, and the second electrode of the fourth detection control transistor T7 is electrically connected to the sensing signal line SENSE.

[0146] For example, the inspection method for the display substrate shown in FIG7B differs from the inspection method for the display substrate shown in FIG4B in the following ways: The inspection method for the display substrate shown in FIG7B includes: using the first subpixel P1 as a test subpixel, and performing two inspections on the electrical signal on the sensing signal line SENSE, wherein the first inspection scan signal G3 is an on signal, and correspondingly, the second inspection scan signal G4, the third inspection scan signal G5, and the fourth inspection scan signal G6 are each an on signal and an off signal, respectively. For example, in the first detection, the first detection scan signal G3, the second detection scan signal G4, the third detection scan signal G5 and the fourth detection scan signal G6 are all turn-on signals, so that the first detection control transistor T4, the second detection control transistor T5, the third detection control transistor T6 and the fourth detection control transistor T7 are all turned on, and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is recorded as the first detection result; in the second detection, the first detection scan signal G3 is the turn-on signal, the second detection scan signal G4, the third detection scan signal G5 and the fourth detection scan signal G6 are all turn-off signals, so that the first detection control transistor T4 is turned on, and the second detection control transistor T5, the third detection control transistor T6 and the fourth detection control transistor T7 are all turned off, and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is recorded as the second detection result. In the first test, the potentials of the S nodes of the first, second, third, and fourth subpixels P1, P2, P3, and P4 are all transmitted to the sensing signal line SENSE. In the second test, only the potential of the S node of the first subpixel P1 is transmitted to the sensing signal line SENSE. Therefore, if the first test result is different from the second test result, for example, if the voltage signal of the first test result is significantly higher than that of the second test result, i.e., the first test result is abnormal and the second test result is normal, then it is confirmed that a short-circuit signal was transmitted to the sensing signal line SENSE during the first test, while the second test result is normal. This indicates that the first subpixel P1 is normal, and therefore, at least one of the second, third, and fourth subpixels P2, P3, and P4 is abnormal. Subsequently, the second, third, and fourth subpixels P2, P3, and P4 are used as test subpixels for testing, and similar methods can be used to detect whether the second, third, and fourth subpixels P2, P3, and P4 are abnormal. If the first test result is basically equal to the second test result and neither is a significantly overly high voltage signal, that is, both test results are normal, then the three sub-pixels are normal; if the first test result is basically equal to the second test result and both are overly high voltage signals, that is, both test results are abnormal, then the first sub-pixel P1 is abnormal, and both measurements show a relatively high short-circuit signal.By subsequently performing tests using the second, third, and fourth subpixels P2, P3, and P4 as test subpixels and comparing the test results, it is possible to determine whether each test result is a significantly overly high voltage signal. Thus, it is possible to determine whether an abnormal subpixel exists and identify the abnormal subpixel.

[0147] The inspection method for the display substrate shown in FIG7B further includes: using the second subpixel P2 as a test subpixel, and performing two inspections of the electrical signal on the sensing signal line SENSE, wherein the second inspection scan signal G4 is always an on signal, and accordingly, the first inspection scan signal G3, the third inspection scan signal G5, and the fourth inspection scan signal G6 are each an on signal and an off signal, respectively. The specific method of this step is similar in principle to the method using the first subpixel P1 as the test subpixel, and reference can be made to the previous description to determine whether the second subpixel P2 is abnormal.

[0148] The inspection method for the display substrate shown in FIG7B further includes: using the fourth subpixel P4 as a test subpixel, and performing two inspections of the electrical signal on the sensing signal line SENSE, wherein the fourth inspection scan signal G6 is an on signal in both inspections. Accordingly, the first inspection scan signal G3, the second inspection scan signal G4, and the third inspection scan signal G5 are each an on signal and an off signal, respectively. The specific method of this step is the same as the principle of the above-mentioned method using the first subpixel P1 as the test subpixel. Reference can be made to the previous description to determine whether the second subpixel P2 is abnormal. Combining the inspection results using the first subpixel P1, the second subpixel P2, the third subpixel P3, and the fourth subpixel P4 as the test subpixels, it is possible to determine whether the four subpixels are abnormal and identify the abnormal subpixel. If no significantly larger potential detection results are obtained during the tests using the first, second, third, and fourth subpixels P1, P2, P3, and P4 as test subpixels, then all four subpixels are normal. If one, two, or three subpixels are abnormal, then the results of the two tests using the abnormal subpixel as the test subpixel are unequal, for example, significantly different, representing a significant difference between the two test results as described above. The abnormal subpixel can then be identified using the above method. If all four subpixels are abnormal, then regardless of which subpixel is used as the test subpixel, each test result will be a significantly larger electrical signal.

[0149] Figure 8A is a schematic block diagram of a pixel circuit of another display unit provided by at least one embodiment of the present disclosure; Figure 8B is a circuit diagram of an implementation example of the pixel circuit shown in Figure 8A. The pixel circuit of the display unit shown in Figure 8A has the following differences from the embodiment shown in Figure 8A. Referring to Figure 8A, the multiple sub-pixels 100 of the display unit PU also include a fourth sub-pixel P4, and the pixel circuit of the fourth sub-pixel P4 also includes a fourth detection control sub-circuit 04. The second end 142 of the sensing sub-circuit 14 of the fourth sub-pixel P4 is electrically connected to the sensing signal line SENSE through the fourth detection control sub-circuit 04 and the second detection control sub-circuit 02 in sequence. In this embodiment, the first sub-pixel P1, the second sub-pixel P2, the third sub-pixel P3 and the fourth sub-pixel P4 share a sensing signal line SENSE. For example, the detection scan signal line includes a fourth detection scan signal line. The control terminal of the fourth detection control sub-circuit 04 is electrically connected to the fourth detection scan signal line to receive the fourth detection scan signal G6. The first terminal of the fourth detection control sub-circuit 04 is electrically connected to the second terminal 142 of the sensing sub-circuit 14 of the fourth sub-pixel P4. The second terminal of the fourth detection control sub-circuit 04 is electrically connected to the first terminal 021 of the second detection control sub-circuit 02. The pixel circuit of this display unit can also be used to detect whether the four sub-pixels of the display unit have abnormalities.

[0150] Referring to Figure 8B, for example, the fourth detection control sub-circuit 04 includes a fourth detection control transistor T7, the gate of the fourth detection control transistor T7 is configured to receive a fourth detection scan signal G6, the first electrode of the fourth detection control transistor T7 is electrically connected to the second electrode of the sensing transistor T2 of the fourth sub-pixel P4, and the second electrode of the fourth detection control transistor T7 is electrically connected to the first electrode of the second detection control transistor T5.

[0151] Figure 8C is an example of a signal timing diagram for detecting an abnormality in the pixel circuit shown in Figure 8B. Figure 8C uses the timing diagram for performing two tests using the second sub-pixel P2 shown in Figure 8B as a test sub-pixel as an example. The timing diagram for performing two tests using other sub-pixels as test sub-pixels is similar and can be understood with reference to Figure 8C. For example, the detection method for the display panel shown in Figure 8B differs from the detection method for the display substrate shown in Figure 5B in the following ways.

[0152] The detection method for the display substrate shown in FIG8B includes: using the first sub-pixel P1 as the test sub-pixel to detect the electrical signal on the sensing signal line SENSE twice, in which the first detection scan signal G3 is an on signal, and correspondingly, the second detection scan signal G4 and the third detection scan signal G5 are both on signals and off signals at the same time, respectively. In the detection where the second detection scan signal G4 is an on signal, the fourth detection scan signal G6 is an on signal. For example, in the first detection, the first detection scan signal G3, the second detection scan signal G4, the third detection scan signal G5 and the fourth detection scan signal G6 are all on signals, so that the first detection control transistor T4, the second detection control transistor T5, the third detection control transistor T6 and the fourth detection control transistor T7 are all turned on, and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is recorded as the first detection result; in the second detection, the first detection scan signal G3 is an on signal, and the second detection scan signal G4 and the third detection scan signal G5 are all on signals. The fourth detection scanning signal G6 is an off signal or an on signal, so that the first detection control transistor T4 is turned on, the second detection control transistor T5 is turned off, the third detection control transistor T6 is turned off, and the fourth detection control transistor T7 is turned on or off (because the second detection control transistor T5 is turned off at this time, no matter whether the fourth detection control transistor T7 is turned off or on, the electrical signal in the fourth sub-pixel P4 will not be transmitted to the sensing signal line SENSE). Then, in the sampling phase, the voltage on the sensing signal line SENSE is sampled, and the measured potential result is the second detection result. In the first detection, the potentials of the S nodes from the first sub-pixel P1, the second sub-pixel P2, the third sub-pixel P3 and the fourth sub-pixel P4 are all transmitted to the sensing signal line SENSE. In the second detection, only the potential of the S node of the first sub-pixel P1 is transmitted to the sensing signal line SENSE. Therefore, if the first detection result is not equal to the second detection result, for example, if the voltage signal of the first detection result is obviously much higher than that of the second detection result, that is, the first detection result is abnormal and the second detection result is normal, it proves that a short-circuit signal is transmitted to the sensing signal line SENSE in the first detection, and the second detection result is normal, which proves that the first sub-pixel P1 is normal. Therefore, at least one of the second sub-pixel P2, the third sub-pixel P3 and the fourth sub-pixel P4 is abnormal. Subsequently, the second sub-pixel P2, the third sub-pixel P3 and the fourth sub-pixel P4 are respectively used as test sub-pixels for detection, and a similar method can be used to detect whether the second sub-pixel P2, the third sub-pixel P3 and the fourth sub-pixel P4 are abnormal.If the first and second test results are essentially the same and neither shows a significantly high voltage signal, meaning both test results are normal, then all four sub-pixels are normal. If the first and second test results are essentially the same and both show an excessively high voltage signal, and both measurements produce a relatively high short-circuit signal, meaning both test results are abnormal, then first sub-pixel P1 is abnormal. Subsequent tests using the second, third, and fourth sub-pixels P2, P3, and P4 as test sub-pixels, and comparing multiple test results, can determine whether each test result shows a significantly high voltage signal. This allows the presence of abnormal sub-pixels to be determined and identified.

[0153] The inspection method for the display substrate shown in FIG8B further includes: using the second subpixel P2 as a test subpixel, performing two inspections on the electrical signal on the sensing signal line SENSE. In both inspections, the second inspection scan signal is an on signal. Accordingly, the first inspection scan signal G3 and the fourth inspection scan signal G6 are simultaneously an on signal and simultaneously an off signal, respectively. During the inspection in which the first inspection scan signal G3 is an on signal, the third inspection scan signal G5 is an on signal. The specific inspection and judgment method is similar to the aforementioned "performing two inspections on the electrical signal on the sensing signal line SENSE using the first subpixel P1 as a test subpixel," and the principles are the same. Reference may be made to the aforementioned principles and inspection process.

[0154] Referring to Figure 8C, the detection method for the display substrate shown in Figure 8B also includes: using the third sub-pixel P3 as the test sub-pixel, performing two detections on the electrical signal on the sensing signal line SENSE, in which the first detection scan signal G3 and the third detection scan signal G5 are both on signals, and accordingly, the second detection scan signal G4 is respectively an on signal and an off signal, and in the detection where the second detection scan signal G4 is an on signal, the fourth detection scan signal G6 is an on signal. For example, in the first detection, the first detection scanning signal G3, the second detection scanning signal G4, the third detection scanning signal G5 and the fourth detection scanning signal G6 are all on signals, so that the first detection control transistor T4, the second detection control transistor T5, the third detection control transistor T6 and the fourth detection control transistor T7 are all turned on, and then the voltage on the sensing signal line SENSE is sampled in the sampling stage, and the measured potential result is recorded as the first detection result; in the second detection, the first detection scanning signal G3 is an on signal, the second detection scanning signal G4 is an off signal, the third detection scanning signal G5 is an on signal, and the fourth detection scanning signal G6 is an off signal or an on signal, so that the first detection control transistor T4 is turned on ( Because the first detection control transistor T4 remains on, the signal at the S node of the third sub-pixel P3 is transmitted to the sensing signal line SENSE in sequence through the sensing transistor T2, the third detection control transistor T6, and the first detection control transistor T4 of the third sub-pixel P3. The second detection control transistor T5 is turned off, the third detection control transistor T6 is turned on, and the fourth detection control transistor T7 is turned on or off (because the second detection control transistor T5 is turned off at this time, the electrical signal in the fourth sub-pixel P4 will not be transmitted to the sensing signal line SENSE regardless of whether the fourth detection control transistor T7 is turned off or on). Then, in the sampling phase, the voltage on the sensing signal line SENSE is sampled, and the measured potential result is the second detection result. In the first detection, the potentials of the S nodes from the first sub-pixel P1, the second sub-pixel P2, the third sub-pixel P3, and the fourth sub-pixel P4 are all transmitted to the sensing signal line SENSE. In the second detection, the potentials of the S nodes of the first sub-pixel P1 and the S nodes of the third sub-pixel P3 are both transmitted to the sensing signal line SENSE. Therefore, in the embodiment shown in FIG8B , when the first sub-pixel P1 is normal, that is, the sensing transistor T2 of the first sub-pixel P1 is not short-circuited, it is possible to determine whether the third sub-pixel P3 is normal, that is, whether the sensing transistor T2 of the third sub-pixel P3 is short-circuited.When the first sub-pixel P1 is normal, if the first detection result is not equal to the second detection result, for example, if the voltage signal of the first detection result is obviously much higher than that of the second detection result, that is, the first detection result is abnormal and the second detection result is normal, it proves that a short-circuit signal is transmitted to the sensing signal line SENSE in the first detection, and the second detection result is normal, it proves that the first sub-pixel P1 and the third sub-pixel P3 are both normal, and the second sub-pixel P2 and / or the fourth sub-pixel P4 has a short-circuit problem in the sensing transistor T2. If the test results of both times are obviously too high potential signals, that is, the test results of both times are abnormal, it proves that at least one of the first sub-pixel P1 and the third sub-pixel P3 is abnormal. At this time, if the first sub-pixel P1 has been judged to be normal in the previous "twice testing of the electrical signal on the sensing signal line SENSE with the first sub-pixel P1 as the test sub-pixel", then it can be proved that the third sub-pixel P3 has a short-circuit problem of the sensing transistor T2, which makes the potential on the sensing signal line SENSE too large. At this time, the normal threshold voltage of other sub-pixel columns with the same color as the third sub-pixel is independently used as the threshold voltage of the third sub-pixel P3 to perform display compensation for the third sub-pixel P3, without replacing the threshold voltage of the first sub-pixel P1. If the first subpixel P1 is determined to be abnormal in the previous "twice testing the electrical signal on the sensing signal line SENSE with the first subpixel P1 as the test subpixel", that is, the sensing transistor T2 of the first subpixel P1 is short-circuited, then, regardless of whether the third subpixel P3 is normal, the electrical signal transmitted to the sensing signal line SENSE through the first detection control transistor T4 is an abnormal electrical signal. Therefore, in this case, it is impossible to determine whether the third subpixel P3 is normal. At this time, the threshold voltages of the first subpixel P1 and the third subpixel P3 are replaced at the same time, that is, the threshold voltages of the driving transistors T3 of the subpixels of the same color as the first subpixel P1 and the third subpixel P3 in other display units PU that are normal are respectively obtained as the threshold voltages of the driving transistors T3 of the first subpixel P1 and the third subpixel P3, so as to compensate the first subpixel P1 and the third subpixel P3 during the display process, so as to ensure that the first subpixel P1 and the third subpixel P3 are correctly compensated.

[0155] The inspection method for the display substrate shown in FIG8B further includes: using the fourth subpixel P4 as a test subpixel and performing two inspections on the electrical signal on the sensing signal line SENSE. In the two inspections, the second inspection scan signal G4 and the fourth inspection scan signal G6 are both on signals, and accordingly, the first inspection scan signal G3 is respectively on and off. In the inspections where the first inspection scan signal G3 is on, the third inspection scan signal G5 is on. The relationship between the second subpixel P2 and the fourth subpixel P4 is similar to the relationship between the first subpixel P1 and the third subpixel P3. The method for determining and replacing the threshold voltage can refer to the specific determination method described above for "using the third subpixel P3 as a test subpixel and performing two inspections on the electrical signal on the sensing signal line SENSE." However, the first subpixel P1 and the third subpixel P3 in the above "using the third subpixel P3 as a test subpixel and performing two inspections on the electrical signal on the sensing signal line SENSE" are replaced by the second subpixel P2 and the fourth subpixel P4, respectively. In this way, abnormal sub-pixels among the multiple sub-pixels of the display unit can be detected, and the abnormal sub-pixels can be correctly compensated during the display process, thereby solving the above-mentioned problem of incorrect threshold voltage detection of the sub-pixel driving transistor T3 caused by the abnormality of the sub-pixel sensing transistor T2.

[0156] For example, in the embodiment of the present disclosure, the potential or electric signal detected on the sensing signal line SENSE is a voltage signal.

[0157] For example, for the display substrate provided in each embodiment of the present disclosure, the colors of the multiple sub-pixels of a display unit PU are different from each other. The color of a sub-pixel refers to the color of the light emitted by the sub-pixel. For example, the first sub-pixel, the second sub-pixel, and the third sub-pixel emit red light, green light, and blue light, respectively. For example, the first sub-pixel, the second sub-pixel, the third sub-pixel, and the fourth sub-pixel emit white light, blue light, red light, and green light, respectively.

[0158] For example, the display substrate is an organic light emitting diode (OLED) display substrate, and each sub-pixel that performs a display function includes an OLED device, for example, the light emitting element is an OLED device.

[0159] Figure 9A is a schematic block diagram of a pixel circuit for another display unit provided in at least one embodiment of the present disclosure. The display unit, subpixels, each subpixel's driver subcircuit, data subcircuit, sensing subcircuit, and light-emitting element structures shown in Figure 9A are identical to those in the previous embodiments, and reference is made to the previous description. The display substrate shown in Figure 9A differs from the previous embodiments in the following ways.

[0160] 9A , a plurality of sub-pixels 100 of a display unit PU include a first sub-pixel P1, a second sub-pixel P2, and a third sub-pixel P3. The second terminal 142 of the sensing sub-circuit 14 of the first sub-pixel P1 and the second terminal 142 of the sensing sub-circuit 14 of the second sub-pixel P2 are electrically connected to the same sensing signal line SENSE. For example, the second terminal 142 of the sensing sub-circuit 14 of the first sub-pixel P1 and the second terminal 142 of the sensing sub-circuit 14 of the second sub-pixel P2 are both electrically connected to the first sensing signal line SENSE. The second terminal 142 of the sensing sub-circuit 14 of the third sub-pixel P3 and the second terminal 142 of the sensing sub-circuit 14 of the first sub-pixel P1 are respectively electrically connected to different sensing signal lines SENSE. For example, the second terminal 142 of the sensing sub-circuit 14 of the third sub-pixel P3 is electrically connected to the second sensing signal line SENSE. Furthermore, the control terminal of the sensing sub-circuit 14 of the first sub-pixel P1 and the control terminal of the sensing sub-circuit 14 of the second sub-pixel P2 are respectively electrically connected to different sensing scan signal terminals to receive different sensing scan signals. The control terminal of the sensing sub-circuit 14 of the first sub-pixel P1 is configured to receive a first sensing scan signal G2, and the control terminal of the sensing sub-circuit 14 of the second sub-pixel P2 is configured to receive a second sensing scan signal G7. The second sensing scan signal G7 is different from the first sensing scan signal G2 and is an independent scanning signal from each other, for example, from different scanning signal lines. The sensing sub-circuit 14 of the first sub-pixel P1 is configured to detect the electrical characteristics of the first sub-pixel P1 via the first sensing signal line SENSE in response to the first sensing scan signal G2, and the sensing sub-circuit 14 of the second sub-pixel P2 is configured to detect the electrical characteristics of the second sub-pixel P2 via the first sensing signal line SENSE in response to the second sensing scan signal G7. The electrical characteristics of the sub-pixels may include, for example, the threshold voltage and / or carrier mobility of the driving transistor included in the driving sub-circuit 12, or the threshold voltage and driving current of the light-emitting element. Since the first sensing scan signal G2 and the second sensing scan signal G7 are independent of each other, it is possible to control whether the sensing sub-circuit 14 of the first sub-pixel P1 and the sensing sub-circuit 14 of the second sub-pixel P2 are turned on by controlling the first sensing scan signal G2 and the second sensing scan signal G7, thereby independently controlling whether the electrical signal of the second end 142 of the sensing sub-circuit 14 of the first sub-pixel P1 and the electrical signal of the second end 142 of the sensing sub-circuit 14 of the second sub-pixel P2 are allowed to be transmitted to the first detection signal line SENSE1. The third sub-pixel P3 and the first sub-pixel P1 are connected to different sensing signal lines, respectively. The electrical signal of the second end 142 of the sensing sub-circuit 14 of the first sub-pixel P1 and the electrical signal of the second end 142 of the sensing sub-circuit 14 of the third sub-pixel P3 can be detected through different sensing signal lines, respectively. Therefore, it is possible to independently determine whether the three sub-pixels are abnormal, for example, the abnormality of the sub-pixel includes whether the sensing transistor T2 is short-circuited.

[0161] For example, referring to FIG9A , the control terminal of the third sensing sub-circuit 14 and the control terminal of the sensing sub-circuit 14 of the first sub-pixel P1 are electrically connected to the same sensing scan signal terminal to receive the same sensing scan signal, and are both configured to receive the second sensing scan signal G7. This reduces the number of wires providing sensing scan signals while enabling detection of short circuit anomalies in each sub-pixel, thereby simplifying the display substrate structure, reducing manufacturing complexity, and improving the yield of display substrate products.

[0162] FIG9B is a circuit diagram of an implementation example of the pixel circuit shown in FIG9A . Referring to FIG9B , for example, the second end of the sensing transistor T2 of the first subpixel P1 and the second end of the sensing transistor T2 of the second subpixel P2 are both electrically connected to the first detection signal line SENSE1, and the second end of the sensing transistor T2 of the third subpixel P3 is electrically connected to the second detection signal line SENSE2. Furthermore, the gate of the sensing transistor T2 of the first subpixel P1 and the gate of the sensing transistor T2 of the second subpixel P2 are respectively configured to receive different sensing scan signals. For example, the gate of the sensing transistor T2 of the first subpixel P1 is configured to receive the second sensing scan signal G7, and the gate of the sensing transistor T2 of the second subpixel P2 is respectively configured to receive the first sensing scan signal G3. For example, the gate of the sensing transistor T2 of the third subpixel P3 is also configured to receive the second sensing scan signal G7, i.e., it receives the same sensing scan signal as the gate of the sensing transistor T2 of the first subpixel P1. In this way, by controlling the first sensing scan signal G2 and the second sensing scan signal G7, it is possible to control whether the sensing transistor T2 of the first sub-pixel P1 and the sensing transistor T2 of the second sub-pixel P2 are turned on, thereby independently controlling whether the electrical signal of the second end of the sensing transistor T2 of the first sub-pixel P1 and the electrical signal of the second end of the sensing transistor T2 of the second sub-pixel P2 are allowed to be transmitted to the first detection signal line SENSE1, and the third sub-pixel P3 and the first sub-pixel P1 are connected to different sensing signal lines, respectively. The electrical signal of the second end of the sensing transistor T2 of the first sub-pixel P1 and the electrical signal of the second end of the sensing transistor T2 of the third sub-pixel P3 can be detected through different sensing signal lines, respectively. Therefore, it is possible to independently determine whether the three sub-pixels are abnormal, for example, the abnormality of the sub-pixel includes whether the sensing transistor T2 is short-circuited.

[0163] The detection method for the display substrate shown in Figure 9A includes: applying different sensing scanning signals to the control end of the sensing subcircuit of the first subpixel and the control end of the sensing subcircuit of the second subpixel, respectively, so that the sensing subcircuit of the first subpixel and the sensing subcircuit of the second subpixel are electrically conductive in different time periods; detecting the electrical signals on the same sensing signal line electrically connected to the second end of the sensing subcircuit of the first subpixel and the second end of the sensing subcircuit of the second subpixel during the time period when the sensing subcircuit of the first subpixel is electrically conductive and during the time period when the sensing subcircuit of the first subpixel is electrically conductive; and judging whether the first subpixel and the second subpixel are abnormal based on the measured electrical signals on the sensing signal lines.

[0164] The detection method for the display substrate shown in Figure 9A also includes: applying the same sensing scan signal to the control end of the sensing subcircuit of the first subpixel and the control end of the sensing subcircuit of the third subpixel, so that the sensing subcircuit of the first subpixel and the sensing subcircuit of the third subpixel are electrically conductive during the same period; and detecting the electrical signals on different sensing signal lines that are electrically connected to the second end of the sensing subcircuit of the first subpixel and the second end of the sensing subcircuit of the third subpixel respectively during the same period; and judging whether the first subpixel and the second subpixel are abnormal based on the measured electrical signals on the different sensing signal lines.

[0165] The following describes in detail the detection method of the pixel circuit of the display unit shown in FIG. 9B in conjunction with the timing diagram.

[0166] Figures 9C-9D are examples of signal timing diagrams for detecting an abnormality in the pixel circuit shown in Figure 9B. Figure 9C is a signal timing diagram for detecting the first sub-pixel P1 and / or the third sub-pixel P3 as the test sub-pixel. Referring to Figure 9C, the first sub-pixel P1 and the third sub-pixel P3 can be used as test sub-pixels for detection at the same time. By performing a single detection on the electrical signal (e.g., voltage signal) on the sensing signal line electrically connected to the first sub-pixel P1 and the third sub-pixel P3, it is possible to determine whether the test sub-pixel is abnormal and obtain the threshold voltage of the sensing transistor of the sub-pixel. The first stage is the data writing stage, the second stage is the charging stage, the third stage is the sampling stage, and the fourth stage is the reset stage. For the data scanning signal G1 and the corresponding working process in the data writing stage, the data writing stage, the sampling stage, and the reset stage, please refer to the previous description. During the entire detection process, the first sensing scan signal G2 is at a low level, which is a shutdown signal, so that the sensing transistor T2 of the second sub-pixel P2 is turned off, so that the electrical signal of the second end of the sensing transistor T2 of the second sub-pixel P2 will not be transmitted to the first detection signal line SENSE1. At the same time, the second sensing scan signal G7 is at a high level, which is a turn-on signal, so that the sensing transistor T2 of the first sub-pixel P1 and the sensing transistor T2 of the third sub-pixel P3 are both turned on, so that the electrical signal of the second end of the sensing transistor T2 of the first sub-pixel P1 is transmitted to the first detection signal line SENSE1, and the electrical signal of the second end of the sensing transistor T2 of the third sub-pixel P3 is transmitted to the second detection signal line SENSE2. In this case, during the sampling phase, the voltages on the first detection signal line SENSE1 and the second detection signal line SENSE2 are sampled separately. If the measured voltage on the corresponding detection signal line is a significantly excessive voltage signal, the sub-pixel is abnormal, most likely due to a short circuit in the sensing transistor of the sub-pixel, resulting in the measured short-circuit signal. In this case, the threshold voltage of the driving transistor T3 of a normal sub-pixel of the same color in other display units PU is obtained as the normal threshold voltage, and the normal threshold voltage is used as the threshold voltage of the driving transistor T3 of the abnormal sub-pixel to compensate for the abnormal sub-pixel during the display process. If the measured voltage on the corresponding detection signal line is not a significantly excessive voltage signal, the sub-pixel is normal and there is no abnormality, at least no short circuit problem. During this detection process, the first sub-pixel P1 and the third sub-pixel P3 can operate simultaneously without interfering with each other, and are respectively provided with normal data signals Vd1 and Vd3. Therefore, the first sub-pixel P1 and the third sub-pixel P3 can be detected simultaneously to determine whether they are abnormal, thereby improving detection efficiency and making the detection method simple and easy to operate.

[0167] FIG9D is a signal timing diagram for testing using the second sub-pixel P2 as the test sub-pixel. Referring to FIG9D , during testing using the second sub-pixel P2 as the test sub-pixel, the second sensing scan signal G7 is at a low level, serving as a shutdown signal, so that the sensing transistor T2 of the second sub-pixel P2 is turned on, while the sensing transistor T2 of the first sub-pixel P1 and the sensing transistor T2 of the third sub-pixel P3 are both turned off. Consequently, the electrical signal at the second terminal of the sensing transistor T2 of the second sub-pixel P2 is transmitted to the first detection signal line SENSE1, while the electrical signal at the second terminal of the sensing transistor T2 of the first sub-pixel P1 is not transmitted to the first detection signal line SENSE1. In this case, the voltage on the first detection signal line SENSE1 is sampled during the sampling phase. If the measured voltage on the first detection signal line SENSE1 is a significantly excessive voltage signal, the second sub-pixel P2 is abnormal, most likely due to a short circuit in the sensing transistor of the second sub-pixel P2, resulting in the measured short-circuit signal. In this case, the threshold voltage of the driving transistor T3 of a normal sub-pixel of the same color as the second sub-pixel P2 in other display units PU is obtained as the normal threshold voltage, and the normal threshold voltage is used as the threshold voltage of the driving transistor T3 of the abnormal second sub-pixel P2 to compensate for the abnormal second sub-pixel P2 during the display process. If the measured voltage on the first detection signal line SENSE1 is not a significantly excessive voltage signal, the second sub-pixel P2 is normal and there is no abnormality, at least there is no short circuit problem. In this way, abnormal sub-pixels among the multiple sub-pixels of the display unit can be detected, and the abnormal sub-pixels can be correctly compensated during the display process, thereby solving the above-mentioned problem of incorrect detection of the threshold voltage of the sub-pixel driving transistor T3 due to the abnormality of the sub-pixel sensing transistor T2. In addition, the number of abnormal detections on the display substrate is small, the abnormal sub-pixel can be quickly determined, and the detection efficiency is high, thereby solving the above-mentioned problem of incorrect detection of the threshold voltage of the sub-pixel driving transistor T3 due to the abnormality of the sub-pixel sensing transistor T2.

[0168] In the embodiment shown in Figure 9B, since the gate of the sensing transistor T2 of the third sub-pixel P3 and the gate of the sensing transistor T2 of the first sub-pixel P1 receive the same sensing scan signal, the sensing transistor T2 of the third sub-pixel P3 and the sensing transistor T2 of the first sub-pixel P1 are turned on or turned off at the same time. Therefore, in the above-mentioned detection process using the second sub-pixel P2 as the test sub-pixel, the electrical signal of the second end of the sensing transistor T2 of the third sub-pixel P3 will not be transmitted to the first detection signal line SENSE2.

[0169] Of course, in other embodiments, the control terminal of the sensing sub-circuit 14 of the third sub-pixel P3 and the control terminal of the sensing sub-circuit 14 of the first sub-pixel P1 can be electrically connected to different sensing scan signal terminals to receive different sensing scan signals. Thus, the conduction of the sensing sub-circuit 14 of the third sub-pixel P3 and the sensing sub-circuit 14 of the first sub-pixel P1 can be independently controlled, and abnormalities in the three sub-pixels can be independently detected. Accordingly, in a specific implementation example of a pixel circuit including a 3T1C circuit, the gate of the sensing transistor T2 of the first sub-pixel P1 and the gate of the sensing transistor T2 of the third sub-pixel P3 each receive the same sensing scan signal. In this way, the sensing transistors of the three sub-pixels receive different sensing scan signals. By independently controlling the three different sensing scan signals, the sensing transistors of the three sub-pixels can be independently controlled to open and close, thereby individually measuring the voltage signal transmitted by the sensing transistor of each sub-pixel to the sensing signal line electrically connected to the sub-pixel, thereby determining whether each sub-pixel has an abnormality.

[0170] Figure 10A is a schematic block diagram of a pixel circuit of another display unit provided by an embodiment of the present disclosure; Figure 10B is a circuit diagram of an implementation example of the pixel circuit shown in Figure 10A. The embodiment shown in Figure 10A has the following differences from the embodiment shown in Figure 9A. Referring to Figure 10A, on the basis of the pixel circuit of the display unit PU shown in Figure 9B, the multiple sub-pixels 100 of the display unit PU also include a fourth sub-pixel P4, the second end 142 of the sensing sub-circuit 14 of the fourth sub-pixel P4 and the second end 142 of the sensing sub-circuit 14 of the third sub-pixel P3 are electrically connected to the same sensing signal line SENSE, and the control end of the sensing sub-circuit 14 of the third sub-pixel P3 and the control end of the sensing sub-circuit 14 of the fourth sub-pixel P4 are respectively electrically connected to different sensing scan signal ends to receive different sensing scan signals. Therefore, the principle is the same as that of individually detecting whether the first sub-pixel P1 and the second sub-pixel P2 are abnormal. For the display substrate shown in FIG10A , it is possible to individually detect whether the fourth sub-pixel P4 is abnormal, thereby being able to individually detect whether the four sub-pixels of the display unit PU are abnormal, and correctly compensate for the abnormal sub-pixels during the display process. At the same time, it avoids setting up too many different sensing scanning signal terminals and sensing scanning signal lines, simplifies the circuit, and reduces the difficulty of production and the error rate during the production process.

[0171] For example, referring to FIG10B , the control terminal of the sensing sub-circuit 14 of the second sub-pixel P2 and the control terminal of the sensing sub-circuit 14 of the fourth sub-pixel P4 are electrically connected to the same sensing scan signal G2 terminal to receive the same sensing scan signal. Thus, similar to the principle of separately detecting whether the first sub-pixel P1 and the second sub-pixel P2 are abnormal, the abnormal sub-pixel is correctly compensated during the display process, resolving the aforementioned issue of incorrectly measured threshold voltage of the sub-pixel's driving transistor T3 due to an abnormality in the sub-pixel's sensing transistor T2. Furthermore, the number of abnormality detections on the display substrate is reduced, allowing for rapid identification of the abnormal sub-pixel, resulting in high detection efficiency, and resolving the aforementioned issue of incorrectly measured threshold voltage of the sub-pixel's driving transistor T3 due to an abnormality in the sub-pixel's sensing transistor T2.

[0172] Figure 11 is a schematic block diagram of a display device provided in accordance with one embodiment of the present disclosure. Referring to Figure 11, at least one embodiment of the present disclosure further provides a display device 1000, comprising any one of the display substrates 10 provided in accordance with the present disclosure. The display device may be, for example, a display panel, or any product or component with a display function, such as a monitor, an OLED panel, an OLED television, electronic paper, a mobile phone, a tablet computer, a laptop computer, a digital photo frame, or a navigation system.

[0173] The above description is merely an exemplary embodiment of the present disclosure and is not intended to limit the scope of protection of the present disclosure. The scope of protection of the present disclosure is determined by the scope defined in the claims.

Claims

1. A display substrate, comprising a display unit, wherein: The display unit is located in the display area and performs a display function, the display unit includes a plurality of sub-pixels, and each of the plurality of sub-pixels includes a pixel circuit; The pixel circuit comprises: a driving subcircuit, a light emitting element and a sensing subcircuit, wherein a first end of the sensing subcircuit is electrically connected to a first end of the driving subcircuit and a first electrode of the light emitting element; The display substrate comprises a sensing signal line, a sensing scanning signal line and a detection scanning signal line, the control end of the sensing sub-circuit is electrically connected to the sensing scanning signal line, and the sensing sub-circuit is configured to detect the electrical characteristics of the sub-pixel through the sensing signal line in response to the sensing scanning signal; Among the multiple sub-pixels of the display unit, the pixel circuit of at least one sub-pixel includes a detection control sub-circuit, wherein the control end of the detection control sub-circuit is electrically connected to the detection scanning signal line to receive the detection scanning signal, the first end of the detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit, and the second end of the detection control sub-circuit is electrically connected to the sensing signal line.

2. The display substrate according to claim 1, wherein: The plurality of detection control subcircuits included in the plurality of sub-pixels in the display unit are electrically connected to the same sensing signal line, and the control ends of the plurality of detection control subcircuits are electrically connected to different detection scanning signal lines respectively.

3. The display substrate according to claim 1, wherein: The pixel circuit further includes a storage subcircuit and a data writing subcircuit, wherein the data writing subcircuit is configured to write a data signal into a control terminal of the driving subcircuit in response to a data scanning signal; The driving subcircuit comprises a driving transistor, a gate of the driving transistor is electrically connected to a first end of the storage subcircuit, a first electrode of the driving transistor is electrically connected to a second end of the storage subcircuit and is electrically connected to a light emitting element, a second electrode of the driving transistor is configured to receive a first power supply voltage, and the driving transistor is configured to control a current for driving the light emitting element under the control of a voltage of the gate of the driving transistor; The sensing subcircuit includes a sensing transistor, the detection control subcircuit includes a detection control transistor, the gate of the sensing transistor is electrically connected to the sensing scan signal line, the first electrode of the sensing transistor is electrically connected to the first electrode of the driving transistor and the second end of the storage subcircuit, The second electrode of the sensing transistor is electrically connected to the first electrode of the detection control transistor, the second electrode of the detection control transistor is electrically connected to the sensing signal line, and the gate of the detection control transistor is electrically connected to the detection scanning signal line.

4. The display substrate according to claim 3, wherein: The plurality of sub-pixels of the display unit include a first sub-pixel and a second sub-pixel; the detection control sub-circuit includes a first detection control sub-circuit and a second detection control sub-circuit; The second end of the sensing subcircuit of the first subpixel is electrically connected to the sensing signal line through the first detection control subcircuit; the second end of the sensing subcircuit of the second subpixel is electrically connected to the sensing signal line through the second detection control subcircuit; The detection scanning signal line includes a first detection scanning signal line and a second detection scanning signal line, the control end of the first detection control subcircuit is electrically connected to the first detection scanning signal line to receive a first detection scanning signal, the first end of the first detection control subcircuit is electrically connected to the second end of the sensing subcircuit of the first subpixel, and the second end of the first detection control subcircuit is electrically connected to the sensing signal line; The control end of the second detection control subcircuit is electrically connected to the second detection scanning signal line to receive a second detection scanning signal, the first end of the second detection control subcircuit is electrically connected to the second end of the sensing subcircuit of the second sub-pixel, and the second end of the second detection control subcircuit is electrically connected to the same sensing signal line.

5. The display substrate according to claim 4, wherein: The first detection control subcircuit includes a first detection control transistor, and the second detection control subcircuit includes a second detection control transistor; a first electrode of the first detection control transistor is electrically connected to a second electrode of a sensing transistor of the first subpixel, a first electrode of the second detection control transistor is electrically connected to a second electrode of a sensing transistor of the second subpixel, and a second electrode of the first detection control transistor and a second electrode of the second detection control transistor are electrically connected to the same sensing signal line respectively; The gate of the first detection control transistor is electrically connected to the first detection scanning signal line to receive a first detection scanning signal, and the gate of the second detection control transistor is electrically connected to the second detection scanning signal line to receive a second detection scanning signal.

6. The display substrate according to claim 4, wherein: The plurality of sub-pixels of the display unit further include a third sub-pixel, and a second end of a sensing sub-circuit of the third sub-pixel is electrically connected to a first end of the first detection control sub-circuit.

7. The display substrate according to claim 4, wherein: The plurality of sub-pixels of the display unit further include a third sub-pixel, and the pixel circuit of the third sub-pixel further includes a third detection control sub-circuit; The detection scanning signal line includes a third detection scanning signal line, the control end of the third detection control subcircuit is electrically connected to the third detection scanning signal line to receive a third detection scanning signal, the first end of the third detection control subcircuit is electrically connected to the second end of the sensing subcircuit of the third sub-pixel, and the second end of the third detection control subcircuit is electrically connected to the sensing signal line.

8. The display substrate according to claim 7, wherein: The third detection control subcircuit includes a third detection control transistor, a gate of the third detection control transistor is electrically connected to the third detection scanning signal line, a first electrode of the third detection control transistor is electrically connected to the second electrode of the sensing transistor of the third sub-pixel, and a second electrode of the third detection control transistor is electrically connected to the sensing signal line.

9. The display substrate according to claim 4, wherein: The plurality of sub-pixels of the display unit further include a third sub-pixel, and the pixel circuit of the third sub-pixel further includes a third detection control sub-circuit; The detection scanning signal line includes a third detection scanning signal line, the control end of the third detection control subcircuit is electrically connected to the third detection scanning signal line to receive a third detection scanning signal, the first end of the third detection control subcircuit is electrically connected to the second end of the sensing subcircuit of the third sub-pixel, and the second end of the third detection control subcircuit is electrically connected to the first end of the first detection control subcircuit.

10. The display substrate according to claim 9, wherein: The third detection control subcircuit includes a third detection control transistor, a gate of the third detection control transistor is electrically connected to the third detection scan signal line, and is configured to receive the third detection scan signal, a first electrode of the third detection control transistor is electrically connected to the second electrode of the sensing transistor of the third sub-pixel, and a second electrode of the third detection control transistor is electrically connected to the first electrode of the first detection control transistor.

11. The display substrate according to any one of claims 4 to 10, wherein: The multiple sub-pixels of the display unit further include a fourth sub-pixel, a second end of the sensing sub-circuit of the fourth sub-pixel is electrically connected to a first end of the second detection control sub-circuit, and a second end of the second detection control sub-circuit is electrically connected to the sensing signal line.

12. The display substrate according to any one of claims 4 to 10, wherein: The plurality of sub-pixels of the display unit further include a fourth sub-pixel, and the pixel circuit of the fourth sub-pixel further includes a fourth detection control sub-circuit; The detection scanning signal line includes a fourth detection scanning signal line, the control end of the fourth detection control subcircuit is electrically connected to the fourth detection scanning signal line to receive a fourth detection scanning signal, the first end of the fourth detection control subcircuit is electrically connected to the second end of the sensing subcircuit of the fourth sub-pixel, and the second end of the fourth detection control subcircuit is electrically connected to the sensing signal line.

13. The display substrate according to claim 12, wherein: The fourth detection control subcircuit includes a fourth detection control transistor, a gate of the fourth detection control transistor is electrically connected to the fourth detection scan signal line to receive the fourth detection scan signal, a first electrode of the fourth detection control transistor is electrically connected to the second electrode of the sensing transistor of the fourth sub-pixel, and a second electrode of the fourth detection control transistor is electrically connected to the sensing signal line.

14. The display substrate according to any one of claims 4 to 10, wherein: The plurality of sub-pixels of the display unit further include a fourth sub-pixel, and the pixel circuit of the fourth sub-pixel further includes a fourth detection control sub-circuit; The detection scanning signal line includes a fourth detection scanning signal line, the control end of the fourth detection control subcircuit is electrically connected to the fourth detection scanning signal line to receive a fourth detection scanning signal, the first end of the fourth detection control subcircuit is electrically connected to the second end of the sensing subcircuit of the fourth sub-pixel, and the second end of the fourth detection control subcircuit is electrically connected to the first end of the second detection control subcircuit.

15. The display substrate according to claim 14, wherein: The fourth detection control subcircuit includes a fourth detection control transistor, the gate of the fourth detection control transistor is configured to receive the fourth detection scanning signal, the first electrode of the fourth detection control transistor is electrically connected to the second electrode of the sensing transistor of the fourth sub-pixel, and the second electrode of the fourth detection control transistor is electrically connected to the first electrode of the second detection control transistor.

16. The method for detecting a display substrate according to any one of claims 1 to 15, comprising: Performing at least two tests on at least one sub-pixel of the display unit and performing at least two tests on the electrical signal on the sensing signal line specifically includes: In one detection, the detection control transistors of all sub-pixels included in the display unit are turned on, and if the electrical signal on the sensing signal line is abnormal, the next detection is performed; In the next detection, turning off the detection control transistor of at least one sub-pixel in the display unit to detect other sub-pixels again; Determining whether the plurality of sub-pixels are abnormal according to the electrical signals on the sensing signal line obtained by the two detections; and For the abnormal sub-pixel, the threshold voltage of the driving sub-circuit of the sub-pixel of the same color without abnormality in other display units is obtained as the threshold voltage of the driving sub-circuit of the abnormal sub-pixel to compensate for the abnormal sub-pixel.

17. The method for detecting a display substrate according to claim 16, wherein: The pixel circuit further includes a data writing subcircuit, wherein the data writing subcircuit is configured to write a data signal into a control terminal of the driving subcircuit in response to a data scanning signal; The at least two detections on at least one sub-pixel of the display unit include: performing two detections on at least one sub-pixel among the multiple sub-pixels of the display unit as a test sub-pixel, writing the data signal to the test sub-pixel and not writing the data signal to other sub-pixels except the test sub-pixel during the two detections, and controlling the first detection scan signal and the second detection scan signal in the first detection of the two detections to be not completely the same as the first detection scan signal and the second detection scan signal in the second detection.

18. The method for detecting a display substrate according to claim 17, wherein: The detection method comprises: In the first detection, the detection control transistors of all sub-pixels included in the display unit are turned on, and the electrical signal on the sensing signal line is detected for the first time. If the detection signal of the sensing signal line is abnormal, it means that there is a short circuit problem of the sensing transistor in at least one sub-pixel in the display unit. Then, the detection control transistor of at least one sub-pixel in the display unit is randomly turned off, and the sub-pixel that is not turned off is used as the test sub-pixel for the second detection; and In the second detection, if the detection signal of the sensing signal line is abnormal, it means that the sensing transistors of sub-pixels other than the sub-pixels whose detection control transistors are turned off have short-circuit problems. If the detection signal of the sensing signal line is normal, it means that at least one of the sub-pixels whose detection control transistors are turned off has a short-circuit problem in the sensing transistors.

19. The method for detecting a display substrate according to claim 17 or 18, wherein: In the case where the plurality of sub-pixels of the display unit include a first sub-pixel and a second sub-pixel, the first sub-pixel includes a first detection control transistor, the second sub-pixel includes a second detection control transistor, a first electrode of the first detection control transistor is electrically connected to a second electrode of a sensing transistor of the first sub-pixel, a first electrode of the second detection control transistor is electrically connected to a second electrode of a sensing transistor of the second sub-pixel, a second electrode of the first detection control transistor and a second electrode of the second detection control transistor are electrically connected to the same sensing signal line, a gate of the first detection control transistor is electrically connected to a first detection scanning signal line to receive a first detection scanning signal, and a gate of the second detection control transistor is electrically connected to a second detection scanning signal line to receive a second detection scanning signal, the detection method includes: During the first detection, the first detection control transistor and the second detection control transistor are both turned on, and when the detected detection signal of the sensing signal line is abnormal, the first detection control transistor or the second detection control transistor is randomly turned off, and then the sub-pixel that is not turned off is used as the test sub-pixel for the second detection; and During the second detection, if the detection signal of the sensing signal line is abnormal, it means that the sensing transistor of the test sub-pixel is abnormal. If the detection signal of the sensing signal line is normal, it means that the sensing transistors of other sub-pixels except the test sub-pixel are abnormal.

20. The method for detecting a display substrate according to claim 19, wherein: In the case where the plurality of sub-pixels of the display unit further include a third sub-pixel, the pixel circuit of the third sub-pixel further includes a third detection control sub-circuit, the detection scan signal line includes a third detection scan signal line, the control end of the third detection control sub-circuit is electrically connected to the third detection scan signal line to receive a third detection scan signal, the first end of the third detection control sub-circuit is electrically connected to the second end of the sensing sub-circuit of the third sub-pixel, and the second end of the third detection control sub-circuit is electrically connected to the sensing signal line, The detection method comprises: Using a sub-pixel of the display unit as the test sub-pixel, detecting the electrical signal on the sensing signal line twice specifically includes: In the first detection, the detection control transistors of all sub-pixels included in the display unit are turned on, and the electrical signal on the sensing signal line is detected for the first time. If the detected signal of the sensing signal line is abnormal, it means that there is a sensing crystal fault in at least one sub-pixel in the display unit. The problem of short circuit of the tube is solved, and then the detection control transistors of the two sub-pixels in the display unit except the test sub-pixel are turned off, and the electrical signal on the sensing signal line is detected for the second time; and In the second detection, if the detection signal of the sensing signal line is normal, it means that at least one of the two sub-pixels whose detection control transistors are turned off has a sensing transistor short-circuit problem; if the detection signal of the sensing signal line is abnormal, it means that the test sub-pixel has a sensing transistor short-circuit problem.

21. The method for detecting a display substrate according to any one of claims 17 to 20, wherein: The data signal written to the other sub-pixels is a voltage signal of 0V.

22. A display substrate, comprising a display unit, wherein: The display unit is located in the display area and performs a display function, the display unit includes a plurality of sub-pixels, and each of the plurality of sub-pixels includes a pixel circuit; The pixel circuit comprises: a driving subcircuit, a light emitting element and a sensing subcircuit, wherein the driving subcircuit is configured to control the magnitude of a driving current flowing through the light emitting element; The control end of the sensing subcircuit is configured to receive a sensing scan signal, and the first end of the sensing subcircuit is electrically connected to the first end of the driving subcircuit and the first electrode of the light-emitting element; the display substrate includes a plurality of sensing signal lines, and the second end of the sensing subcircuit is electrically connected to a corresponding sensing signal line, and the sensing subcircuit is configured to detect the electrical characteristics of the sub-pixel through the sensing signal line electrically connected thereto in response to the received sensing scan signal; The plurality of sub-pixels of the display unit include a first sub-pixel, a second sub-pixel and a third sub-pixel; The second end of the sensing subcircuit of the first subpixel and the second end of the sensing subcircuit of the second subpixel are electrically connected to the same sensing signal line, the second end of the sensing subcircuit of the third subpixel and the second end of the sensing subcircuit of the first subpixel are electrically connected to different sensing signal lines, respectively, and, The control end of the sensing sub-circuit of the first sub-pixel and the control end of the sensing sub-circuit of the second sub-pixel are respectively electrically connected to different sensing scan signal ends to receive different sensing scan signals.

23. The display substrate according to claim 22, wherein: The control end of the third sensing sub-circuit and the control end of the sensing sub-circuit of the first sub-pixel are electrically connected to the same sensing scan signal end to receive the same sensing scan signal, or, The control end of the sensing sub-circuit of the third sub-pixel and the control end of the sensing sub-circuit of the first sub-pixel are respectively electrically connected to different sensing scan signal ends to receive different sensing scan signals.

24. The display substrate according to claim 22 or 23, wherein: The plurality of sub-pixels of the display unit further include a fourth sub-pixel, a second end of the sensing sub-circuit of the fourth sub-pixel and a second end of the sensing sub-circuit of the third sub-pixel are electrically connected to the same sensing signal line, and, The control end of the sensing sub-circuit of the third sub-pixel and the control end of the sensing sub-circuit of the fourth sub-pixel are electrically connected to different sensing scan signal ends respectively to receive different sensing scan signals.

25. The display substrate according to claim 24, wherein: The control end of the sensing sub-circuit of the second sub-pixel and the control end of the sensing sub-circuit of the fourth sub-pixel are respectively electrically connected to the same sensing scan signal end to receive the same sensing scan signal.

26. A method for detecting a display substrate according to any one of claims 22 to 25, comprising: Applying different sensing scan signals to the control end of the sensing sub-circuit of the first sub-pixel and the control end of the sensing sub-circuit of the second sub-pixel, respectively, so that the sensing sub-circuit of the first sub-pixel and the sensing sub-circuit of the second sub-pixel are electrically conductive in different time periods; as well as The electrical signal on the same sensing signal line electrically connected to the second end of the sensing subcircuit of the first subpixel and the second end of the sensing subcircuit of the second subpixel is detected during the period when the sensing subcircuit of the first subpixel is electrically conductive and during the period when the sensing subcircuit of the first subpixel is electrically conductive.

27. A display device comprising the display substrate according to any one of claims 1 to 15 and 22 to 25.

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