Control device, control method, and control program
The control device and method streamline non-destructive inspections by using processor-based image processing to align and score inspection targets according to JIS or ISO standards, addressing inefficiencies in existing methods and improving evaluation accuracy and efficiency.
Patent Information
- Application Number
- PCT/JP2024/026033
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-07-21
- Filing Date
- 2024-07-19
- Publication Date
- 2025-01-30
AI Technical Summary
Current non-destructive inspection methods using image-based evaluations are inefficient due to the burden on users in adjusting inspection gauges and poor inspection efficiency, particularly when evaluating multiple targets with complex geometries.
A control device and method that includes a processor to display and overlay frames corresponding to specified gauges (JIS or ISO standards) on images of inspection targets, allowing for relative movement and rotation, with auxiliary lines and scoring based on predetermined dimensions and relationships, to facilitate the evaluation of inspection targets.
Enhances user efficiency by simplifying the evaluation process, ensuring accurate alignment and scoring of inspection targets, thereby improving the overall inspection efficiency and reducing user burden.
Smart Images

Figure JP2024026033_30012025_PF_FP_ABST
Abstract
Description
Control device, control method, and control program
[0001] The present disclosure relates to a control device, a control method, and a control program.
[0002] Conventionally, non-destructive inspection has been performed using an inspection target image obtained by photographing the inspection target. In the technique described in International Publication WO2022 / 014019, the position and size of a flaw in a weld of an inspection target are detected from image data showing the distribution of transmitted radiation intensity.
[0003]
[0003] Meanwhile, a known non-destructive testing method is to evaluate defects in an object to be inspected based on defects present within a predetermined gauge. For example, in inspections based on standards such as JIS (Japanese Industrial Standards) and ISO (International Organization for Standardization), an image of the object to be inspected is captured by photographing the object, and the image is superimposed on a gauge that defines the test range, and defects in the object are evaluated based on defects within the gauge. In such evaluations, adjusting the position of the gauge is a detailed task, which can increase the burden on the user performing the evaluation and reduce the efficiency of the inspection.
[0004] The present disclosure has been made in consideration of the above circumstances, and aims to provide a control device, a control method, and a control program that can assist in the evaluation of flaws in an inspection object.
[0005] A control device of a first aspect of the present disclosure includes at least one processor, which displays an image of an object to be inspected for non-destructive testing on a display device, and when the displayed image of the object to be inspected contains two or more defects of the object to be inspected, displays a frame for inspecting the defects superimposed on the image of the object to be inspected, and displays the frame at a size according to predetermined dimensions so that the frame can be moved or rotated at least one time relative to the image of the object to be inspected.
[0006] A control device according to a second aspect of the present disclosure is the control device according to the first aspect, wherein the frame is a graphic corresponding to a gauge.
[0007] A control device according to a third aspect of the present disclosure is the control device according to the first aspect, wherein the frame is a graphic conforming to a gauge defined in a JIS or ISO standard relating to non-destructive testing.
[0008] A control device of a fourth aspect of the present disclosure is the control device of the first aspect, in which the processor moves the frame relatively to a position where a first auxiliary line set according to the position of the flaw and a second auxiliary line set according to the position of the frame have a predetermined positional relationship.
[0009] A control device according to a fifth aspect of the present disclosure is the control device according to the fourth aspect, wherein the first auxiliary line is a line segment connecting the centers of gravity of the two flaws.
[0010] A control device of a sixth aspect of the present disclosure is the control device of the fourth aspect, wherein the first auxiliary line is a line segment connecting points within the two flaw areas, and if there are multiple line segments, the longest line segment among the multiple line segments is the first auxiliary line.
[0011] A seventh aspect of the control device of the present disclosure is the control device of the fourth aspect, wherein, when the shape of the frame is rectangular, the second auxiliary line is at least one of the diagonal lines of the rectangular frame, and when the shape of the frame is circular, the second auxiliary line is at least one line corresponding to the diameter of the circular frame.
[0012] A control device of an eighth aspect of the present disclosure is the control device of the first aspect, wherein, for a flaw at least a portion of which is within the frame, if there is an area that overlaps with the frame, the processor presents information indicating this.
[0013] A control device of a ninth aspect of the present disclosure is the control device of the eighth aspect, in which the processor, as information presentation, displays the portion of the frame that overlaps when not all of the portion is within the frame in a more emphasized manner than the other portions.
[0014] A control device of a tenth aspect of the present disclosure is a control device of the first aspect, in which, when there are three or more flaws, the processor extracts two flaws as a pair, displays a straight line connecting the two flaws of the extracted pair, accepts user input corresponding to the line, associates it with the line, and displays according to the accepted input.
[0015] A control device of an eleventh aspect of the present disclosure is a control device of the first aspect, in which the processor displays, as the image to be inspected, an image to be inspected that shows most of the photographed area of the object to be inspected and an enlarged image to be inspected that is an enlarged portion of the image to be inspected, and when one of the frames displayed superimposed on the image to be inspected that shows most of the object to be inspected and the frame displayed superimposed on the enlarged image to be inspected moves or rotates relative to the image to be inspected, the other frame also moves or rotates in conjunction.
[0016] A control device of a twelfth aspect of the present disclosure is a control device described in the first aspect, in which a correspondence between at least one of the type, size, and length of the flaw and a score is predetermined, and the processor derives a score based on the correspondence for a flaw at least partially existing within the frame, and if there are multiple flaws at least partially existing within the frame, further derives a total score.
[0017] A control device of a thirteenth aspect of the present disclosure is a control device described in the twelfth aspect, in which a processor records the frame and an area of the image to be inspected that includes at least a flaw that is at least partially within the frame, in association with a total score, as displayed on the display device.
[0018] Furthermore, in order to achieve the above-mentioned object, the control method of the fourteenth aspect of the present disclosure includes a processor provided in a control device that displays an image of an object to be inspected for non-destructive testing on a display device, and if the displayed image of the object to be inspected contains two or more defects of the object to be inspected, a frame for inspecting the defects is superimposed on the image of the object to be inspected, and the frame is displayed at a size according to a predetermined dimension so that it can be moved or rotated at least relative to the image of the object to be inspected.
[0019] In addition, in order to achieve the above-mentioned object, the control program of the fifteenth aspect of the present disclosure causes a processor provided in a control device to execute a process of displaying an image of an object to be inspected for non-destructive testing on a display device, and if the displayed image of the object to be inspected contains two or more defects of the object to be inspected, superimposing a frame for inspection of the defects on the image of the object to be inspected, and displaying the frame at a size according to predetermined dimensions so that the frame can be moved or rotated at least one time relative to the image of the object to be inspected.
[0020] According to the present disclosure, it is possible to assist in the evaluation of flaws in an inspection target.
[0021] FIG. 1 is a diagram for explaining an inspection target and an inspection target image of an embodiment. FIG. 2 is a block diagram showing an example of the hardware configuration of a control device of an embodiment. FIG. 3 is a functional block diagram showing an example of the functional configuration of a control device of an embodiment. FIG. 4 is a diagram for explaining an example of a display state of an inspection target image and a frame. FIG. 5 is a diagram for explaining a frame displayed by a frame display control unit of an embodiment. FIG. 6 is a diagram for explaining auxiliary lines displayed by an auxiliary line display control unit of an embodiment. FIG. 7 is a flowchart showing an example of the flow of control processing executed in a control device of an embodiment. FIG. 8 is a diagram for explaining an example of a display form for clarifying pairs of confirmed flaws. FIG. 9 is a diagram for explaining other forms of frames. FIG. 10 is a diagram for explaining other forms of a method for deriving a frame and a total score.
[0022] Hereinafter, embodiments of the technology of the present disclosure will be described in detail with reference to the drawings. Note that the present invention is not limited to these embodiments.
[0023] 1, in this embodiment, as an example, an inspection object 10 is a cylindrical object formed by welding two pipes, such as a natural gas pipeline, and a defect in a welded portion 10B of the inspection object 10 is evaluated. In this disclosure, the term "discontinuity" includes a possible defect.
[0024] The radiographic imaging device 16 captures a radiographic image having an imaging range that includes at least the welded portion 10B of the inspection object 10. In this embodiment, the radiographic image of the inspection object 10 captured by the radiographic imaging device 16 is referred to as an inspection object image. Therefore, the inspection object image includes an image of the piping portion 10A of the inspection object 10 and an image of the welded portion 10B.
[0025] The radiographic imaging device 16 of this embodiment captures an image of the object of inspection, with an area obtained by dividing the entire welded portion 10B into a plurality of parts as the imaging range 15 for each imaging. That is, in this embodiment, a plurality of images of the object of inspection are obtained for the object of inspection 10, and a series of the plurality of images of the object of inspection are joined together to form a radiographic image of an area including one circumference of the welded portion 10B. Note that, unlike the radiographic imaging device 16 of this embodiment, a radiographic imaging device 16 capable of capturing an area including one circumference of the welded portion 10B as a single radiographic image may be used, and defects may be evaluated using a single image of the object of inspection.
[0026] The inspection object image obtained by the radiographic imaging device 16 is output to the control device 18. The control device 18 is a device for providing support for evaluation of flaws in the inspection object 10 using the inspection object image obtained by photographing the inspection object 10 for non-destructive testing.
[0027] Fig. 2 is a block diagram showing an example of the hardware configuration of the control device 18 of this embodiment. As shown in Fig. 2, the control device 18 includes a CPU (Central Processing Unit) 20, a memory 21 as a temporary storage area, a non-volatile storage unit 22, a display 26 such as a liquid crystal display, an input unit 27, and a network I / F (Interface) 28. The CPU 20, the memory 21, the storage unit 22, the display 26, the input unit 27, and the network I / F 28 are connected via a bus 29 such as a system bus or a control bus so as to be able to exchange various information with each other.
[0028] The CPU 20 controls the entire control device 18. The CPU 20 also reads out the control processing program 23 from the storage unit 22, loads it into the memory 21, and executes the loaded control processing program 23. The CPU 20 of the present embodiment is an example of a processor of the present disclosure, and the control processing program 23 is an example of a control program of the present disclosure.
[0029] The storage unit 22 stores a control processing program 23 executed by the CPU 20 and an inspection object image 50 obtained by the radiographic imaging device 16. The storage unit 22 also stores frame information 25A and score information 25B, the details of which will be described later. Specific examples of the storage unit 22 include storage media such as a hard disk drive (HDD), a solid state drive (SSD), and a flash memory.
[0030] The input unit 27 is for accepting user operations and is, for example, a touch panel, buttons, a mouse, a keyboard, etc. Note that a touch panel display integrating the display 26 and the input unit 27 may be employed. The network I / F 28 performs wired or wireless communication with the radiographic imaging device 16 via a network. Note that the display 26 of the present embodiment is an example of a display device of the present disclosure.
[0031] 3 is a functional block diagram showing an example of the functional configuration of the control device 18. As shown in Fig. 3, the control device 18 of this embodiment includes an inspection object image acquisition unit 30, a display control unit 32, a flaw detection unit 34, a score derivation unit 36, and a report generation unit 38. In the control device 18, the CPU 20 executes the control processing program 23, so that the CPU 20 functions as the inspection object image acquisition unit 30, the display control unit 32, the flaw detection unit 34, the score derivation unit 36, and the report generation unit 38.
[0032] The inspection object image acquisition unit 30 has a function of acquiring an inspection object image 50. When a series of multiple inspection object images 50 exists for one inspection object 10 as described above, the inspection object image acquisition unit 30 of this embodiment acquires the series of inspection object images 50 one by one in sequence.
[0033] As an example, the inspection object image acquisition unit 30 of the present embodiment acquires the inspection object image 50 stored in the storage unit 22, but may also acquire the inspection object image 50 from the radiographic imaging device 16. The inspection object image acquisition unit 30 outputs the acquired inspection object image 50 to the display control unit 32 and the flaw detection unit 34.
[0034] The flaw detection unit 34 has a function of detecting flaws in the inspection target 10, specifically, images corresponding to flaws in the inspection target 10, from the inspection target image 50. The method by which the flaw detection unit 34 detects flaws from the inspection target image 50 is not particularly limited. For example, the flaw detection unit 34 may detect flaws from the inspection target image 50 using a machine learning model that has been trained to detect flaws from inspection target images that include various types of flaws. Alternatively, for example, the flaw detection unit 34 may detect flaws from the inspection target image 50 using a known image analysis method that detects an area that is different from the surrounding area as a flaw area.
[0035] In this embodiment, the flaw detection unit 34 assigns a value indicating whether each pixel in the inspection target image 50 is a flaw or not as a detection result. For example, for a pixel, a value of "1" is assigned if the pixel is a flaw, and a value of "0" is assigned if the pixel is not a flaw. The flaw detection unit 34 outputs the detection result to the display control unit 32 and the score derivation unit 36.
[0036] The display control unit 32 includes an inspection object image display control unit 32A, a frame display control unit 32B, and an auxiliary line display control unit 32C. The functions of the inspection object image display control unit 32A, the frame display control unit 32B, and the auxiliary line display control unit 32C will be described with reference to FIGS.
[0037] The inspection target image display control unit 32A has a function of displaying the inspection target image on the display 26. As shown in Fig. 4, the inspection target image display control unit 32A displays the inspection target image 50 and the enlarged inspection target image 50e side by side on the display 26. Note that, here, when the inspection target image display control unit 32A "displays the inspection target image 50 and the enlarged inspection target image 50e on the display 26," this also includes a state in which the inspection target image display control unit 32A holds the inspection target image 50 and the enlarged inspection target image 50e in order to display them on the display 26.
[0038] In this embodiment, the inspection object image 50 displayed on the display 26 corresponds to one inspection object image 50 captured by the radiographic imaging device 16. On the other hand, the enlarged inspection object image 50e is an inspection object image obtained by enlarging a portion of the inspection object image 50. Each of the inspection object image 50 and the enlarged inspection object image 50e shown in FIG. 4 includes a piping portion 50A that is an image of the piping portion 10A and a welding portion 50B that is an image of the welding portion 10B.
[0039] 4 , the inspection target image display control unit 32A of this embodiment displays an enlargement range frame 59, which indicates the range of the enlarged inspection target image 50e in the inspection target image 50, on the inspection target image 50. The enlargement range and enlargement rate in the inspection target image 50 may each be determined in advance, or may be able to be specified by the user via the input unit 27.
[0040] On the other hand, the frame display control unit 32B has a function of superimposing a frame 60 of a size corresponding to predetermined dimensions for flaw inspection on each of the inspection target image 50 and the enlarged inspection target image 50 e, and displaying the frame 60 so that it can be moved and rotated relative to each of the inspection target image 50 and the enlarged inspection target image 50 e. Note that, here, "displaying" the frame 60 by the frame display control unit 32B also includes a state in which the frame display control unit 32B holds the frame 60 in order to display it.
[0041] The frame 60 is a graphic corresponding to a gauge. As a specific example, the frame 60 in this embodiment is a graphic conforming to a gauge defined in a JIS standard related to non-destructive testing. Examples of such JIS standards include JIS Z 3104-1995 "Radiation Testing Method for Steel Welded Joints," JIS Z 3105-2003 "Radiation Testing Method for Aluminum Welded Joints," and JIS G 0581-1999 "Radiation Testing Method for Steel Castings." The frame 60 may also be a graphic conforming to a gauge defined in an ISO standard corresponding to these JIS standards. In the control device 18 of this embodiment, information regarding the size and shape of the gauge used in these standards is stored in the memory unit 22 as frame information 25A. As an example, the frame information 25A in this embodiment includes information regarding the size and shape of multiple types of gauges.
[0042] The frame display control unit 32B refers to the frame information 25A and determines the size and shape of the frame 60 to be displayed on each of the inspection target image 50 and the enlarged inspection target image 50e based on the size and shape of the gauge to be used, the size of the inspection target 10, the correspondence between the sizes of the inspection target 10, and the enlargement ratio of the enlarged inspection target image 50e.Then, the frame 60 of the determined size and shape is displayed superimposed on each of the inspection target image 50 and the enlarged inspection target image 50e.
[0043] The frame display control unit 32B displays the frame 60 when two or more flaws in the inspection object 10 are included in the inspection object image 50. In the present embodiment, as an example, when two or more flaws in the inspection object 10 are included in the enlarged inspection object image 50e, the frame 60 is displayed superimposed on each of the inspection object image 50 and the enlarged inspection object image 50e.
[0044] In the control device 18 of this embodiment, the user can move and rotate the displayed frame 60. For example, by clicking on the displayed frame 60 and operating to move or rotate it using the input unit 27, the displayed frame 60 moves or rotates in response to the operation. Note that when one of the frame 60 displayed while superimposed on the inspection target image 50 and the frame 60 displayed while superimposed on the enlarged inspection target image 50e is moved or rotated, the other frame 60 is also moved or rotated in conjunction with the movement.
[0045] Furthermore, based on the detection results of the flaw detection unit 34, if there is an area that overlaps with the frame 60 for a flaw 52 at least a portion of which is present within the frame 60, the frame display control unit 32B presents information indicating this. In the example shown in FIG. 5 , among the flaws 52-1, 52-2, and 52-3 included in the enlarged inspection target image 50e, at least a portion of the flaws 52-1 and 52-2 are present within the frame 60. In the example shown in FIG. 5 , the flaws 52-1 and 52-2 are not entirely present within the frame 60, so the frame display control unit 32B displays the portion 60A of the frame 60 that overlaps each of the flaws 52-1 and 52-2 in a more emphasized manner than the other portions. The method by which the frame display control unit 32B emphasizes the portion 60A of the frame 60 is not limited. For example, the frame display control unit 32B may display the portion 60A in a color that stands out more than the other portions, or may blink the portion 60A. Note that the case where there is an area of the flaw 52 (52-1, 52-2) that overlaps with the frame 60 also includes a state where the outer edge of the flaw 52 overlaps with the frame 60. In other words, there may be a case where the flaw 52 does not exist outside the frame 60. Furthermore, "overlapping" here can mean a case where coordinates in the original data overlap, or a case where pixels on the screen of the display 26 overlap.
[0046] This allows the user to easily check whether or not the entire flaw 52 (the flaws 52-1 and 52-2 in FIG. 5) is present within the frame 60.
[0047] On the other hand, as shown in FIG. 6 , the auxiliary line display control unit 32C displays a first auxiliary line 64 provided according to the position of the flaw 52 and a second auxiliary line 66 provided according to the position of the frame 60 on the enlarged inspection target image 50e. In the example shown in FIG. 6 , the auxiliary line display control unit 32C displays a line segment connecting the center of gravity of the flaw 52-1, at least a portion of which exists within the frame 60, and the center of gravity of the flaw 52-2 as the first auxiliary line 64 on the enlarged inspection target image 50e. Note that the first auxiliary line 64 displayed by the auxiliary line display control unit 32C is not limited to the above-described form. The first auxiliary line 64 may be any line segment that connects points within the areas of the two flaws 52. For example, if there are multiple line segments, the longest line segment among the multiple line segments may be the first auxiliary line 64. Furthermore, the two flaws 52 connected by the first auxiliary line 64 may be, for example, two flaws 52 that exist close to each other. Here, "close" can be set as within a predetermined distance, etc. Furthermore, the distance between the two flaws 52 is preferably close to the diagonal of the frame 60 so that the two flaws are sufficiently included in the frame 60, and may be, for example, within ±10% of the length of the diagonal of the frame 60. Therefore, for example, the two flaws 52 that are within a predetermined distance and closest to the frame 60 may be used. Furthermore, for example, the two flaws 52 may be specified by the user, or the user may be able to select which two flaws 52 are connected by the first auxiliary line 64. Furthermore, when three or more flaws 52 exist within the close range, the pair of flaws 52 may be suggested in order of the distance between them closest to the length of the diagonal of the frame 60, and the user may be allowed to select the most preferred pair of flaws 62, and the first auxiliary line 64 may be provided for the selected pair.
[0048] Furthermore, the auxiliary line display control unit 32C displays one of the two diagonal lines of the frame 60 in the enlarged inspection target image 50e as the second auxiliary line 66. Note that the second auxiliary line 66 displayed by the auxiliary line display control unit 32C is not limited to the above-described form, and for example, the second auxiliary line 66 may be both of the two diagonal lines. In other words, the second auxiliary line 66 displayed by the auxiliary line display control unit 32C is not limited to one, and may be multiple.
[0049] When the first auxiliary line 64 and the second auxiliary line 66 are provided in this manner, the frame display control unit 32B moves the frame 60 relatively to a state in which the first auxiliary line 64 and the second auxiliary line 66 have a predetermined positional relationship. Note that the movement of the frame 60 may be performed in response to an instruction from the user using the input unit 27, or may be performed automatically.
[0050] The predetermined positional relationship between the first auxiliary line 64 and the second auxiliary line 66 is a positional relationship between the flaw 52 and the frame 60 so that the flaw 52 is appropriately placed within the frame 60 when evaluating the flaw 52. In the example shown in FIG. 6 , the frame display control unit 32B moves the frame 60 so that the first auxiliary line 64 and the second auxiliary line 66 overlap, more specifically, so that the first auxiliary line 64 and the second auxiliary line 66 are on the same line, as the predetermined positional relationship. As a result, in the example shown in FIG. 6 , the flaws 52-1 and 52-2 become the flaws 52 to be evaluated. Note that, unlike the form shown in FIG. 6 , the frame display control unit 32B may move the frame 60 so that the first auxiliary line 64 and the second auxiliary line 66 are positioned orthogonal to each other.
[0051] 4 , the display control unit 32 further displays an auxiliary line display instruction button 70, an image change instruction button 71, and a report output instruction button 72 on the display 26. The auxiliary line display instruction button 70 is a button that the user operates via the input unit 27 when causing the auxiliary line display control unit 32C to display the above-described first auxiliary lines 64 and second auxiliary lines 66. In the present embodiment, by switching the auxiliary line display instruction button 70 on / off, it is possible to switch between displaying the first auxiliary lines 64 and the second auxiliary lines 66 and not displaying them.
[0052] On the other hand, the image change instruction button 71 is a button that the user operates via the input unit 27 when switching the inspection object image 50 to be displayed on the display 26. As described above, when a series of multiple inspection object images 50 exist for one inspection object 10, the inspection object image 50 displayed on the display 26 can be switched sequentially among the series of inspection object images 50 by operating the image change instruction button 71. Furthermore, the report output instruction button 72 is a button that the user operates via the input unit 27 when outputting the inspection object image 50, i.e., a report related to the inspection of the inspection object 10.
[0053] The score derivation unit 36 derives scores for flaws 52 at least partially present within the frame 60 based on the score information 25B stored in the memory unit 22. The score information 25B is information that represents a correspondence between the score and at least one of the type, size, and length of the flaw 52, and the score, and the correspondence is predetermined. In this embodiment, the score information 25B uses a correspondence based on the above-mentioned standards such as JIS and ISO. For example, such a correspondence can be a method for deriving flaw types and scores used in the method for classifying flaw images using radiographs in JIS Z 3104-1995. Furthermore, when there are multiple flaws 52 at least partially present within the frame 60, the score derivation unit 36 further derives a total score.
[0054] In addition, the score derivation unit 36 is not limited to this embodiment, and may, for example, derive scores for all flaws 52 present in the inspection target image 50 or the enlarged inspection target image 50e based on the score information 25B.
[0055] The report generation unit 38 records the frame 60 and the region of the enlarged inspection target image 50e that includes at least the flaws 52 (defects 52-1 and 52-2 in FIG. 6 ) at least a portion of which is within the frame 60, in association with the total score derived by the score derivation unit 36, while the region is displayed on the display 26. Specifically, the report generation unit 38 captures the screen of the display 26 in which the enlarged inspection target image 50e is displayed, and records the captured image in association with the total score. Hereinafter, the information recorded in this manner will be referred to as "evaluation information." Furthermore, upon receiving operation of the report output instruction button 72, the report generation unit 38 uses the recorded evaluation information to generate a report based on a predetermined format.
[0056] Next, the operation of the control device 18 of this embodiment will be described with reference to the drawings. Fig. 7 shows a flowchart illustrating an example of the flow of control processing executed by the control device 18. The control processing shown in Fig. 7 is executed by the CPU 20 executing the control processing program 23.
[0057] 7, as described above, the inspection object image acquisition unit 30 acquires one inspection object image 50. When a series of multiple inspection object images 50 exists for one inspection object 10, one of the inspection object images 50 is acquired sequentially.
[0058] In the next step S102, the frame display control unit 32B accepts a user's designation of a gauge to be used for evaluation. As described above, in this embodiment, since the frame information 25A includes information on multiple types of gauges, the user selects a gauge to be used for evaluation from the multiple types of gauges whose information is included in the frame information 25A.
[0059] In the next step S104, the defect detection unit 34 detects flaws 52 from the inspection target image 50 as described above, and as a detection result, assigns a value to each pixel of the inspection target image 50 indicating whether it is a flaw or not.
[0060] In the next step S106, the inspection object image display control unit 32A starts displaying the inspection object image 50 and the enlarged inspection object image 50e on the display 26, as described above.
[0061] In the next step S108, the frame display control unit 32B determines whether or not to display the frame 60. In this embodiment, as described above, if the enlarged inspection target image 50e contains two or more flaws 52, the frame display control unit 32B displays the frame 60. Therefore, the frame display control unit 32B determines whether or not the enlarged inspection target image 50e contains two or more flaws 52 based on the detection result of step S104. If the enlarged inspection target image 50e does not contain two or more flaws 52, in other words, if the enlarged inspection target image 50e does not contain any flaws 52 or contains one flaw 52, the determination in step S108 is negative, and the process proceeds to step S128. On the other hand, if the enlarged inspection target image 50e contains two or more flaws 52, the determination in step S108 is positive, and the process proceeds to step S110.
[0062] In step S110, the frame display control unit 32B refers to the frame information 25A and begins displaying a frame 60 corresponding to the gauge specified in step S102 above, superimposed on each of the inspection target image 50 and the enlarged inspection target image 50e, so that it can be moved and rotated.
[0063] In the next step S112, as described above, the frame display control unit 32B determines whether or not the flaw 52, at least a portion of which is within the frame 60, has an area that overlaps with the frame 60. If no area overlaps with the frame 60, the determination in step S112 is negative, and the process proceeds to step S116. On the other hand, if an area overlaps with the frame 60, the determination in step S112 is positive, and the process proceeds to step S114.
[0064] In step S114, the frame display control unit 32B highlights the portion 60A of the frame 60 that overlaps the flaw 52, as described above with reference to FIG.
[0065] In the next step S116, the auxiliary line display control unit 32C determines whether to display the first auxiliary lines 64 and the second auxiliary lines 66. As described above, the auxiliary line display control unit 32C switches between displaying and hiding the first auxiliary lines 64 and the second auxiliary lines 66 in response to a user operation of the auxiliary line display instruction button 70 displayed on the display 26. Therefore, the auxiliary line display control unit 32C detects the operation state of the auxiliary line display instruction button 70 and determines whether to display the first auxiliary lines 64 and the second auxiliary lines 66. If the first auxiliary lines 64 and the second auxiliary lines 66 are not to be displayed, the determination in step S116 is negative, and the process proceeds to step S122. On the other hand, if the first auxiliary lines 64 and the second auxiliary lines 66 are to be displayed, the determination in step S116 is positive, and the process proceeds to step S118.
[0066] In step S118, the auxiliary line display control unit 32C displays the first auxiliary line 64 and the second auxiliary line 66 as described above with reference to FIG.
[0067] In the next step S120, the frame display control unit 32B moves the frame 60 so that the first auxiliary line 64 and the second auxiliary line 66 overlap, as described above with reference to FIG.
[0068] In the next step S122, the score derivation unit 36 derives scores for the flaws 52 at least a portion of which is present within the frame 60 based on the score information 25B, as described above, and further derives the total score. The score derivation unit 36 outputs the derived scores for each flaw 52 and the total score to the display control unit 32.
[0069] In the next step S124, the display control unit 32 displays the score for each flaw 52 and the total score calculated in step S122 near each flaw 52 and the frame 60.
[0070] In the next step S126, the frame display control unit 32B determines whether the user has moved or rotated the frame 60. If the user has not moved or rotated the frame 60, the determination in step S126 is negative, and the process proceeds to step S128.
[0071] In step S128, the report generating unit 38 determines whether or not to output the above-described report. As described above, if the user's operation of the report output instruction button 72 has not been accepted, the determination in step S128 is negative, and the process proceeds to step S130.
[0072] In step S130, the inspection object image acquisition unit 30 determines whether or not an instruction has been received to change the inspection object image 50 to be displayed. As described above, if the user's operation of the image change instruction button 71 has been received, the determination in step S130 is affirmative, the process returns to step S100, and when the inspection object image acquisition unit 30 acquires the next inspection object image 50, the processing from step S102 onwards is repeated. On the other hand, if the user's operation of the image change instruction button 71 has not been received, the determination in step S130 is negative, the process returns to step S126, and the processing in steps S126 and S128 is repeated.
[0073] On the other hand, if the user's operation of the report output instruction button 72 is accepted in step S128, the determination is affirmative and the process proceeds to step S132. In step S132, the report generation unit 38 records, as described above, the state of the frame 60 and the region of the enlarged inspection target image 50e including at least the flaw 52, at least a portion of which is present within the frame 60, displayed on the display 26 in association with the total score derived by the score derivation unit 36 as evaluation information. The report generation unit 38 also creates a report using the evaluation information and outputs the created report. The report may be output to any suitable destination; for example, the report may be output to the storage unit 22 and stored therein, or may be output to an external device via the network I / F 28. The display control unit 32 may also display the report on the display 26.
[0074] In the next step S134, the inspection object image display control unit 32A terminates the display of the inspection object image 50 and the enlarged inspection object image 50e, and the frame display control unit 32B terminates the display of the frame 60. When the processing of step S134 ends, the control processing shown in FIG. 7 ends.
[0075] As described above, according to the control device 18 of each of the above embodiments, the inspection object image display control unit 32A displays the inspection object image 50, which is a photograph of the inspection object 10 for non-destructive testing, on the display 26. Furthermore, when the displayed inspection object image 50 includes two or more flaws in the inspection object 10, the frame display control unit 32B displays a frame 60 for flaw inspection superimposed on the inspection object image 50 and the enlarged inspection object image 50e, and displays the frame 60 at a size according to predetermined dimensions so that the frame 60 can be moved and rotated relatively to the inspection object image 50 and the enlarged inspection object image 50e.
[0076] In this way, according to the control device 18 of this embodiment, the positional relationship between the frame 60 for inspection regarding defects and the defect 52 contained in the inspection object image 50 (enlarged inspection object image 50e) can be easily adjusted to an appropriate state, thereby assisting in the evaluation of defects in the inspection object 10.
[0077] In the above embodiment, the case where the shape of the frame 60 is rectangular has been described, but the shape of the frame 60 is not limited to a rectangle. For example, the shape of the frame 60 may be circular, as in the frame 60-1 shown in FIG. 9. In this case, the second auxiliary line 66-1 is a line segment corresponding to the diameter of the circle. Furthermore, the frame 60 does not have to be in a form that covers the entire internal area, and the frame 60 may be formed of partially interrupted line segments, as in the frame 60-2 shown in FIG. 9. In the case of the frame 60-2 shown in FIG. 9, the second auxiliary line 66-2 is a diagonal line of the rectangle defined by the frame 60-2, similar to the second auxiliary line 66 of the frame 60 described above (see FIG. 6, etc.).
[0078] Furthermore, when three or more flaws 52 are present, the display control unit 32 may be configured to display on the display 26 information indicating whether or not the user has visually judged and confirmed the score for each of the flaws 52. For example, when three or more flaws 52 are present, the display control unit 32 may extract two flaws 52 as a pair, display a line connecting the two flaws 52 of the extracted pair, accept user input corresponding to the line, and display the information according to the accepted input. FIG. 8 shows an example of a display format in this case. In the example shown in FIG. 8, a line 80-1 and a check box 82-1 corresponding to the line 80-1 are displayed for the pair of flaws 52-1 and 52-2. Furthermore, a line 80-2 and a check box 82-2 corresponding to the line 80-2 are displayed for the pair of flaws 52-2 and 52-3. 8 shows a state in which the pair of flaws 52-1 and 52-2 has been confirmed, but the pair of flaws 52-2 and 52-3 has not yet been confirmed. After the user confirms the pair of flaws 52-1 and 52-2, the user checks the check box 82-1 using the input unit 27. By clarifying the pairs of flaws 52 for which confirmation has been completed in this way, it is possible to comprehensively evaluate the flaws.
[0079] Furthermore, in the above embodiment, when the first auxiliary line 64 and the second auxiliary line 66 are displayed, the auxiliary line display control unit 32C automatically moves the frame 60 so that the first auxiliary line 64 and the second auxiliary line 66 overlap, but the means for moving the frame 60 is not limited to the auxiliary line display control unit 32C. For example, the user may manually move the frame 60 using the input unit 27 so that the first auxiliary line 64 and the second auxiliary line 66 overlap. Furthermore, the frame 60 may be moved in a manner that combines automatic movement by the auxiliary line display control unit 32C with manual movement by the user.
[0080] Furthermore, although the form in which the first auxiliary line 64 and the second auxiliary line 66 are displayed on the display 26 has been described, if the frame display control unit 32B automatically moves the frame 60 based on the first auxiliary line 64 and the second auxiliary line 66, the first auxiliary line 64 and the second auxiliary line 66 do not need to be displayed on the display 26.
[0081] Furthermore, the frame 60 used for evaluation may be changeable during the control process (see FIG. 7 ). For example, the frame 60 shown in FIG. 5 may be changed to a frame of a different size, such as changing to the frame 60-3 shown in FIG. 10 . When the frame 60-3 shown in FIG. 10 is used, the score derivation unit 36 may derive the total score by adding up the scores of the flaws 52-1, 52-2, and 52-3 included in the frame 60-3, or may derive the total score by converting the sum of the scores of the flaws 52-1, 52-2, and 52-3 into the size of the frame 60. In the latter case, for example, if the area of the rectangle defined by the frame 60-3 is twice the area of the rectangle defined by the frame 60, the score derivation unit 36 derives the total score by dividing the sum of the scores of the flaws 52-1, 52-2, and 52-3 by 2.
[0082] Further, the display control unit 32 may be configured to display the score of each flaw 52 derived by the score derivation unit 36 and the total score on the display 26 .
[0083] Furthermore, in the above embodiment, the flaw detection unit 34 automatically detects flaws 52 from the inspection target image 50, but the user may check the inspection target image 50 or the enlarged inspection target image 50e displayed on the display 26, and specify the area of the flaw 52 in the displayed inspection target image 50 or the enlarged inspection target image 50e using the input unit 27, and the flaw detection unit 34 may detect the area specified by the user as the flaw 52.
[0084] In the above embodiment, the inspection object image display control unit 32A and the frame display control unit 32B use the display 26 provided in the control device 18 as the display device that displays the inspection object image 50 and the frame 60, but the display device is not limited to the display 26. For example, the display device that displays the inspection object image 50 and the frame 60 may be a display device provided outside the control device 18.
[0085] In each of the above embodiments, the following various processors can be used as the hardware structure of processing units that perform various processes, such as the inspection object image acquisition unit 30, the display control unit 32, the flaw detection unit 34, the score derivation unit 36, and the report generation unit 38. As described above, the various processors include a CPU, which is a general-purpose processor that executes software (programs) and functions as various processing units, as well as dedicated electrical circuits, such as a programmable logic device (PLD), a processor whose circuit configuration can be changed after manufacture, such as an FPGA (Field Programmable Gate Array), and an ASIC (Application Specific Integrated Circuit), which is a processor having a circuit configuration designed specifically for performing specific processes.
[0086] A single processing unit may be configured with one of these various processors, or may be configured with a combination of two or more processors of the same or different types (for example, a combination of multiple FPGAs or a combination of a CPU and an FPGA).Furthermore, multiple processing units may be configured with a single processor.
[0087] Examples of configuring multiple processing units with a single processor include: first, a configuration in which one processor is configured with a combination of one or more CPUs and software, as typified by computers such as client and server computers, and this processor functions as multiple processing units; second, a configuration in which a processor is used to realize the functions of an entire system including multiple processing units with a single IC (Integrated Circuit) chip, as typified by systems on chips (SoCs); and thus, various processing units are configured using one or more of the above-mentioned various processors as a hardware structure.
[0088] Furthermore, more specifically, the hardware structure of these various processors can be an electric circuit that combines circuit elements such as semiconductor elements.
[0089] In the above embodiments, the control processing program 23 is pre-stored (installed) in the storage unit 22 of the control device 18, but this is not limiting. The control processing program 23 may be provided in a form recorded on a recording medium such as a CD-ROM (Compact Disc Read Only Memory), a DVD-ROM (Digital Versatile Disc Read Only Memory), or a USB (Universal Serial Bus) memory. The control processing program 23 may also be downloaded from an external device via a network.
[0090] The present disclosure can also be applied to programs and program products. Specifically, the control processing program 23 in each of the above embodiments may be provided as a program product. The program product includes any type of product for providing a program. For example, the program product includes a program provided via a network such as the Internet, and a non-transitory computer-readable recording medium such as a CD-ROM or DVD on which the program is stored.
[0091] Furthermore, the configurations and operations of the radiographic imaging device 16 and the control device 18 described in the above embodiments are merely examples, and may be modified depending on the circumstances without departing from the spirit of the present disclosure. Furthermore, it goes without saying that the above embodiments may be combined as appropriate.
[0092] The following additional notes are provided regarding the above-described embodiment.
[0093] (Supplementary Note 1) A control device comprising at least one processor, the processor causes a display device to display an image of an object to be inspected for non-destructive testing, the image being a photograph of the object to be inspected; and, when the displayed image of the object to be inspected includes two or more flaws in the object to be inspected, causes a frame for inspecting flaws to be superimposed on the image of the object to be inspected, the frame being displayed at a size according to a predetermined dimension and capable of being moved or rotated at least one time relative to the image of the object to be inspected.
[0094] (Supplementary Note 2) The control device according to Supplementary Note 1, wherein the frame is a graphic corresponding to a gauge.
[0095] (Supplementary Note 3) The control device according to Supplementary Note 1, wherein the frame is a graphic conforming to a gauge defined in a JIS or ISO standard relating to non-destructive testing.
[0096] (Appendix 4) The control device described in any one of Appendices 1 to 3, wherein the processor relatively moves the frame to a state where a first auxiliary line provided according to the position of the flaw and a second auxiliary line provided according to the position of the frame have a predetermined positional relationship.
[0097] (Supplementary Note 5) The control device according to Supplementary Note 4, wherein the first auxiliary line is a line segment connecting the centers of gravity of the two flaws.
[0098] (Supplementary Note 6) The control device according to Supplementary Note 4, wherein the first auxiliary line is a line segment connecting points within the two flaw areas, and when there are multiple line segments, the longest line segment among the multiple line segments is set as the first auxiliary line.
[0099] (Supplementary Note 7) The control device described in Supplementary Note 4, wherein, when the shape of the frame is rectangular, the second auxiliary line is at least one of the diagonal lines of the rectangular frame, and when the shape of the frame is circular, the second auxiliary line is at least one line corresponding to the diameter of the circular frame.
[0100] (Supplementary Note 8) The control device described in any one of Supplementary Note 1 to Supplementary Note 7, wherein the processor presents information indicating that, for the flaw at least a portion of which exists within the frame, there is an area that overlaps with the frame.
[0101] (Supplementary Note 9) The control device according to Supplementary Note 8, wherein the processor, as the presentation of the information, displays a portion of the frame that overlaps the flaw that is not entirely within the frame in a more emphasized manner than other portions.
[0102] (Supplementary Note 10) The control device described in any one of Supplementary Note 1 to Supplementary Note 9, wherein the processor: when there are three or more flaws, extracts two flaws as a pair; displays a straight line connecting the two flaws of the extracted pair; accepts user input corresponding to the straight line; and performs display according to the accepted input in association with the straight line.
[0103] (Supplementary Note 11) The processor displays, as the inspection object image, an inspection object image showing most of the photographed area of the inspection object and an enlarged inspection object image obtained by enlarging a portion of the inspection object image, and when one of the frame displayed superimposed on the inspection object image showing most of the inspection object and the frame displayed superimposed on the enlarged inspection object image moves or rotates relative to the inspection object image, the other frame also moves or rotates in conjunction with the frame displayed superimposed on the enlarged inspection object image. (Supplementary Note 11) The processor displays, as the inspection object image, an inspection object image showing most of the inspection object and an enlarged inspection object image,
[0104] (Appendix 12) A control device described in any one of Appendices 1 to 11, wherein a correspondence between at least one of the type, size, and length of the flaw and a score is predetermined, and the processor derives a score for the flaw that has at least a portion located within the frame based on the correspondence, and if there are multiple flaws that have at least a portion located within the frame, further derives a total score.
[0105] (Appendix 13) The control device described in Appendix 12, wherein the processor records the frame and an area of the image to be inspected that includes at least the flaw, at least a portion of which is located within the frame, in association with the total score while displayed on the display device.
[0106] (Supplementary Note 14) A control method in which a processor provided in a control device displays an image of an object to be inspected for non-destructive testing on a display device, and when the displayed image of the object to be inspected contains two or more flaws in the object to be inspected, displays a frame for flaw inspection superimposed on the image of the object to be inspected, the frame being movable or rotatable at least one time relative to the image of the object to be inspected, and at a size according to a predetermined dimension.
[0107] (Supplementary Note 15) A control program for causing a processor provided in a control device to execute the following process: displaying, on a display device, an image of an object to be inspected for non-destructive testing, and, if the displayed image of the object to be inspected contains two or more flaws in the object to be inspected, displaying a frame for flaw inspection superimposed on the image of the object to be inspected, the frame being capable of being moved or rotated at least one time relative to the image of the object to be inspected, at a size according to a predetermined dimension.
[0108] The disclosure of Japanese Patent Application No. 2023-119447, filed on July 21, 2023, is incorporated herein by reference in its entirety. All documents, patent applications, and technical standards mentioned herein are incorporated herein by reference to the same extent as if each individual document, patent application, and technical standard was specifically and individually indicated to be incorporated by reference.
Claims
1. A control device having at least one processor, which displays an image of an object to be inspected for non-destructive testing on a display device, and when the displayed image of the object to be inspected contains two or more defects on the object to be inspected, displays a frame for inspection for defects superimposed on the image of the object to be inspected, the frame being capable of being moved or rotated at least one of relative to the image of the object to be inspected, and at a size according to a predetermined dimension.
2. The control device according to claim 1, wherein the frame is a graphic corresponding to a gauge.
3. The control device according to claim 1, wherein the frame is a figure conforming to a gauge defined in a JIS or ISO standard relating to non-destructive testing.
4. The control device according to claim 1, wherein the processor relatively moves the frame so that a first auxiliary line provided in accordance with the position of the flaw and a second auxiliary line provided in accordance with the position of the frame have a predetermined positional relationship.
5. The control device according to claim 4, wherein the first auxiliary line is a line segment connecting the centers of gravity of the two flaws.
6. The control device according to claim 4, wherein the first auxiliary line is a line segment connecting points within the two flaw areas, and when there are multiple line segments, the longest line segment among the multiple line segments is set as the first auxiliary line.
7. The control device according to claim 4, wherein, when the shape of the frame is rectangular, the second auxiliary line is at least one of the diagonal lines of the rectangular frame, and, when the shape of the frame is circular, the second auxiliary line is at least one line corresponding to a diameter of the circular frame.
8. The control device according to claim 1, wherein the processor, when there is an area that overlaps with the frame for the flaw, at least a portion of which is present within the frame, presents information to that effect.
9. The control device according to claim 8, wherein the processor, as the presentation of the information, displays a portion of the frame that overlaps with the defect that is not entirely within the frame in a more emphasized manner than other portions.
10. The control device according to claim 1, wherein the processor: when three or more defects are present, extracts two defects as a pair, displays a straight line connecting the two extracted defects of the pair, accepts user input corresponding to the line, and performs display according to the received input in association with the line.
11. The control device according to claim 1, wherein the processor displays, as the inspection object image, an inspection object image showing most of the photographed area of the inspection object and an enlarged inspection object image obtained by enlarging a portion of the inspection object image, and when one of the frame displayed superimposed on the inspection object image showing most of the inspection object and the frame displayed superimposed on the enlarged inspection object image moves or rotates relative to the inspection object image, the other frame also moves or rotates in tandem.
12. The control device as described in claim 1, wherein a correspondence between at least one of the type, size, and length of the flaw and a score is predetermined, and the processor derives a score for the flaw at least a portion of which exists within the frame based on the correspondence, and when there are multiple flaws at least a portion of which exists within the frame, further derives a total score.
13. The control device according to claim 12, wherein the processor records the frame and an area of the image to be inspected that includes at least the flaw, at least a portion of which is within the frame, in association with the total score as displayed on the display device.
14. A control method in which a processor provided in a control device displays an image of an object to be inspected for non-destructive testing on a display device, and when the displayed image of the object to be inspected contains two or more defects of the object to be inspected, displays a frame for inspection for defects superimposed on the image of the object to be inspected, and displays the frame at a size according to a predetermined dimension so that the frame can be moved or rotated at least one of relative to the image of the object to be inspected.
15. A control program for causing a processor equipped in a control device to execute a process of displaying, on a display device, an image of an object to be inspected for non-destructive testing, and, if the displayed image of the object to be inspected contains two or more defects on the object to be inspected, displaying a frame for inspection of defects superimposed on the image of the object to be inspected, the frame being capable of being moved or rotated at least one of relative to the image of the object to be inspected, and at a size according to a predetermined dimension.
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