Apparatus and method for measuring high-temperature resistivity of tin oxide electrode of glass substrate kiln

Abstract

An apparatus and method for measuring the high-temperature resistivity of a tin oxide electrode of a glass substrate kiln. The present apparatus installs platinum terminals (3) at two ends of a columnar tin oxide electrode sample; then a platinum wire (4) is used to connect to a direct-current double-arm bridge (6); fixing and insulating gaskets made of an aluminum oxide material are disposed at the top and bottom of a base portion of the columnar tin oxide electrode; then the measuring apparatus is placed in a high-temperature pit furnace, and a heating program is configured to measure corresponding direct-current double-arm bridge (6) values at different temperatures; on the basis of a resistivity calculation principle, the corresponding volume resistivity of the tin oxide electrode at different temperatures is calculated, to provide an electrical parameter reference basis for power supply for electrode glass melting of advanced-generation glass substrate.

Description

Device and method for measuring high temperature resistivity of tin oxide electrodes in glass furnaces Technical Field

[0001] The present invention relates to the field of high-temperature resistivity testing of tin oxide electrodes of heating elements in high-generation substrate glass furnaces, and in particular to a device and method for measuring the high-temperature resistivity of tin oxide electrodes in substrate glass furnaces. Background Art

[0002] Glass products have always been widely used in the display field. Without the support of the glass industry, the development of the display device industry is unimaginable. Although other materials can replace glass materials in some applications, they still cannot replace the excellent performance of glass. From the traditional color picture tube industry to the current flat panel display industry, glass has always played a key role as a key component in display devices. Glass is actually the frame and carrier of the entire device, and is also an optical element. When it is used as the upper and lower substrates of flat panel display devices, it requires sophisticated microscopic semiconductor process processing. However, with the increase in the amount of high-generation substrate glass output, higher challenges and requirements are placed on the melting capacity of the kiln. Therefore, by accurately measuring the high-temperature volume resistivity of the tin oxide electrode of the kiln heating element at different temperatures, it can provide strong theoretical support and basis for the current and power setting when the electrode is energized.

[0003] During the manufacturing process of substrate glass, the glass batch material must be fed smoothly and stably into the furnace feed port through a feeding system. Within the furnace, it is melted, clarified, and homogenized to provide qualified, homogeneous glass liquid for the next process. The glass melted in the furnace is alkali-free, high-aluminum borosilicate glass, primarily used as substrate glass for flat panel displays. The increased output of high-generation, high-feed, and ultra-fine substrate glass inevitably places more stringent demands on the furnace's melting capacity and the electrical heating parameters of the tin oxide electrodes. Therefore, only by accurately measuring the volume resistivity of the tin oxide electrodes at different temperatures can we provide more reliable technical support for optimizing the electrical parameter distribution of the furnace's heating elements.

[0004] Summary of the Invention

[0005] This invention provides a device and method for measuring the high-temperature resistivity of tin oxide electrodes in glass substrate furnaces. This approach addresses the difficulty in accurately controlling the electrical parameters of tin oxide electrodes in furnaces during the glass melting process. Based on the principle of resistivity measurement, this invention provides strong theoretical support for the application and precise calculation of electrical parameters for tin oxide electrodes within the production line's process temperature range.

[0006] In order to achieve the above object, the present invention adopts the following technical solutions:

[0007] A device for measuring the high-temperature resistivity of tin oxide electrodes in a substrate glass kiln is characterized by comprising: a DC double-arm bridge, one end of the DC double-arm bridge being connected to one end of a first platinum wire, the other end of the first platinum wire being connected to a first platinum terminal, and a first insulating gasket being provided on the upper side of the first platinum terminal; the other end of the DC double-arm bridge being connected to one end of a second platinum wire, the other end of the second platinum wire being connected to a second platinum terminal, and a second insulating gasket being provided on the lower side of the second platinum terminal.

[0008] Furthermore, the first insulating gasket and the second insulating gasket are both made of alumina material.

[0009] Furthermore, the resistivity of the alumina material at 1200°C or above is greater than 1×10 3 Ω.cm, and the aluminum oxide purity of the aluminum oxide material is not less than 99.99%.

[0010] Furthermore, the first platinum terminal and the second platinum terminal are symmetrically arranged.

[0011] Furthermore, a preset distance is maintained between the first platinum terminal and the second platinum terminal, and the preset distance is greater than the height of the columnar tin oxide electrode to be measured.

[0012] A method for measuring the high-temperature resistivity of a tin oxide electrode in a glass furnace substrate comprises the following steps:

[0013] S1: After measuring the height and cross-sectional diameter of the columnar tin oxide electrode to be tested, connect the two ends of the columnar tin oxide electrode to be tested to the first platinum terminal and the second platinum terminal respectively, and connect them to the DC double-arm bridge through the first platinum wire and the second platinum wire;

[0014] S2: After fixing both ends of the columnar tin oxide electrode to be measured with a first insulating gasket and a second insulating gasket, the measuring device is placed in a high-temperature pit furnace and, at a preset temperature, a double-arm DC bridge is used to measure the resistance value of the columnar tin oxide electrode to be measured;

[0015] S3: according to the height, cross-sectional diameter and resistance value of the columnar tin oxide electrode to be measured, the resistivity of the columnar tin oxide electrode to be measured is obtained by resistivity calculation principle.

[0016] Furthermore, in S2, the preset temperature is 400°C to 1600°C.

[0017] Furthermore, in S2, the heating rate of the preset temperature is 4°C / min to 6°C / min.

[0018] Furthermore, in S2, the resistance value of the columnar tin oxide electrode to be measured is obtained by using a double-arm DC bridge (6) at a preset temperature, which specifically includes the following steps: at the preset temperature, the double-arm DC bridge (6) is used to measure once every 100° C., and the resistance value of the columnar tin oxide electrode to be measured is recorded.

[0019] Furthermore, in S3, the resistivity calculation principle includes:

[0020] Among them, ρT is the resistivity of the columnar tin oxide electrode to be measured, R is the resistance value of the tin oxide electrode to be measured, and S is the column to be measured.

[0021] where is the cross-sectional area of ​​the tin oxide electrode to be measured, and D is the cross-sectional diameter of the tin oxide electrode to be measured.

[0022] Compared with the prior art, the present invention has the following beneficial effects:

[0023] The present invention provides a device for measuring the high-temperature resistivity of tin oxide electrodes in a substrate glass furnace. The device uses a DC double-arm bridge to measure the resistance value of the tin oxide electrodes, and connects platinum terminals at both ends through platinum wires. Insulating gaskets are provided on the sides of the platinum terminals. The device has a simple measurement principle and a very low structural cost. It can use production line process data for repeated comparison verification and multiple reproduction tests, which can save high equipment costs and outsourcing testing costs and reduce production costs.

[0024] Furthermore, the first insulating gasket and the second insulating gasket of the present invention are both made of alumina material with a purity of not less than 99.99%, thereby ensuring stability during the test process.

[0025] The present invention provides a method for measuring the high-temperature resistivity of tin oxide electrodes in a substrate glass furnace. The method comprises the following steps: first, measuring the height and diameter of a columnar tin oxide electrode to be measured; then, using the above-mentioned measuring device, measuring the resistance value of the columnar tin oxide electrode to be measured at different temperatures; and finally, obtaining the resistivity of the columnar tin oxide electrode to be measured at different temperatures based on the resistivity calculation principle. The measurement method can provide strong theoretical support for the setting, application and precise calculation of electrical parameters of tin oxide electrodes within the process temperature range of a production line. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] FIG1 is a device for measuring the high-temperature resistivity of tin oxide electrodes in a glass furnace substrate provided by the present invention.

[0027] Among them, 1. first insulating gasket; 2. cylindrical tin oxide electrode to be measured; 3. first platinum terminal; 4. first platinum wire; 5. second platinum wire; 6. DC double-arm bridge; 7. second insulating gasket; 8. second platinum terminal. DETAILED DESCRIPTION

[0028] Hereinafter, only certain exemplary embodiments are briefly described, and the described embodiments may be modified in various different ways without departing from the spirit or scope of the present invention. Therefore, the drawings and description are to be regarded as illustrative in nature and not restrictive.

[0029] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed or operate in a specific orientation, and therefore should not be understood as limiting the present invention.

[0030] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0031] In the present invention, unless otherwise expressly specified or limited, terms such as "install," "connect," "connected," and "fixed" should be understood in a broad sense. For example, the terms "install," "connect," "connect," and "fixed" may refer to fixed connections, detachable connections, or integration; mechanical connections, electrical connections, or communication; direct connections or indirect connections through an intermediate medium; and internal connections between two components or interactions between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0032] The embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0033] Example 1

[0034] In a preferred embodiment of the present invention, a device for measuring the high-temperature resistivity of tin oxide electrodes in a glass furnace is provided based on the resistivity measurement principle.

[0035] It includes: a DC double-arm bridge 6, a first platinum wire 4, a second platinum wire 5, a first insulating gasket 1, a second insulating gasket 7, a first platinum terminal 3 and a second platinum terminal 8;

[0036] The two ends of the DC double-arm bridge 6 are connected to the first platinum terminal 3 and the second platinum terminal 8 through the first platinum wire 4 and the second platinum wire 5 respectively;

[0037] The first insulating gasket 1 is installed on the upper side of the first platinum terminal 3 , and the second insulating gasket 7 is installed on the upper side of the second platinum terminal 8 .

[0038] Specifically, in order to ensure the accuracy of the resistivity measurement of the tin oxide electrode in the high-temperature pit furnace, the first insulating gasket 1 and the second insulating gasket 7 are both made of high-purity alumina, which has a resistivity of more than 1×10 3 Ω.cm, alumina purity ≥99.99%, ensuring stability during the test process.

[0039] Specifically, the first platinum terminal 3 and the second platinum terminal 8 should be symmetrically arranged in the vertical direction and a certain distance should be maintained between them. The distance should be greater than the height of the tin oxide electrode to be tested.

[0040] In order to ensure the reliability of the above-mentioned measuring device, the present invention provides a method for measuring the high-temperature resistivity of the tin oxide electrode of the substrate glass furnace, comprising the following steps:

[0041] (1) First, the height and bottom diameter of the columnar tin oxide electrode are measured. Then, a first platinum terminal 3 and a second platinum terminal 8 are connected to both ends of the columnar tin oxide electrode, respectively. The first platinum wire 4 and the second platinum wire 5 are connected to a DC double-arm bridge 6. The upper and lower ends of the columnar tin oxide electrode are fixed with a first insulating gasket 1 and a second insulating gasket 7.

[0042] (2) The measuring device in (1) is placed in a high-temperature pit furnace to test the high-temperature volume resistivity of the tin oxide electrode at different temperatures.

[0043] Specifically, the temperature measurement range of the high-temperature pit furnace is 400°C to 1600°C, and the set heating rate is 4°C / min to 6°C / min, which fully meets the temperature measurement range requirements.

[0044] Specifically, during the heating process, the resistance value R displayed by the DC double-arm bridge 6 is recorded every 100°C. T .

[0045] Based on the resistivity calculation principle, the present invention processes the tin oxide electrode material used in the production line kiln into a cylindrical shape. Utilizing the aforementioned measuring device, the volume resistivity of the tin oxide electrode at different temperatures can be calculated by measuring the resistance R at different temperatures. The temperature measurement principle is simple, the device structure is low-cost, and production line process data can be used for repeated comparison verification and multiple reproducible tests, saving high equipment costs and outsourcing testing fees. This provides strong theoretical support for the application and precise calculation of electrical parameters for tin oxide electrodes within the production line process temperature range.

[0046] The resistivity calculation principle based on the present invention is specifically: Wherein, L is the height of the columnar tin oxide electrode sample, D is the cross-sectional diameter of the columnar tin oxide electrode sample, and S is the cross-sectional area of ​​the columnar tin oxide electrode sample. By measuring the resistance R of the columnar tin oxide electrode sample at different temperatures, the volume resistivity of the tin oxide electrode at different temperatures can be calculated. The specific test results are shown in Table 1.

[0047] Table 1 Volume resistivity ρ of sample 1 and sample 2 at different temperatures T

[0048] Compared with the existing technology, the present invention is simple, reliable and easy to operate. It adopts the tin oxide electrode material used in the production line kiln, processes it into a cylindrical shape, connects platinum terminals and platinum wires at both ends, and then connects to a DC double-arm bridge. Then, a laboratory high-temperature pit furnace is used to set the temperature program. The measurement results use the resistivity calculation principle to calculate the high-temperature volume resistivity of the tin oxide electrode at different temperatures. Its temperature measurement principle is simple, the device structure cost is low, and the production line process data can be used for repeated comparison verification and multiple reproduction tests, saving high equipment costs and outsourcing testing costs, and providing strong theoretical support for the electrical parameter setting application and accurate calculation of the tin oxide electrode within the production line process temperature range.

[0049] It is known from common technical knowledge that the present invention can be implemented by other embodiments that do not deviate from its spirit or essential features. Therefore, the embodiments disclosed above are merely illustrative in all respects and are not exclusive. All modifications within the scope of the present invention or equivalent to the scope of the present invention are intended to be encompassed by the present invention.

Claims

1. A device for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace substrate, characterized in that: include: A direct current double-arm bridge (6), wherein one end of the direct current double-arm bridge (6) is connected to one end of a first platinum wire (4), the other end of the first platinum wire (4) is connected to a first platinum terminal (3), and a first insulating gasket (1) is arranged on the upper side of the first platinum terminal; the other end of the direct current double-arm bridge (6) is connected to one end of a second platinum wire (5), the other end of the second platinum wire (5) is connected to a second platinum terminal (8), and a second insulating gasket (7) is arranged on the lower side of the second platinum terminal (8).

2. The device for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace according to claim 1, characterized in that: The first insulating gasket (1) and the second insulating gasket (7) are both made of aluminum oxide material.

3. The device for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace according to claim 2, characterized in that: The resistivity of the aluminum oxide material at 1200°C or above is greater than 1×10 3 Ω.cm, and the aluminum oxide purity of the aluminum oxide material is not less than 99.99%.

4. The device for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace according to claim 1, characterized in that: The first platinum terminal (3) and the second platinum terminal (8) are symmetrically arranged.

5. The device for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace according to claim 1, characterized in that: A preset distance is maintained between the first platinum terminal (3) and the second platinum terminal (8), and the preset distance is greater than the height of the columnar tin oxide electrode to be tested.

6. A method for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace substrate, based on the measuring device according to any one of claims 1 to 5, characterized in that: The following steps are involved: S1: After measuring the height and cross-sectional diameter of the columnar tin oxide electrode to be tested, the two ends of the columnar tin oxide electrode to be tested are respectively connected to the first platinum terminal (3) and the second platinum terminal (8), and connected to a DC double-arm bridge (6) through the first platinum wire (4) and the second platinum wire (5); S2: After fixing the two ends of the columnar tin oxide electrode to be measured by using a first insulating gasket (1) and a second insulating gasket (7), the measuring device is placed in a high-temperature pit furnace, and at a preset temperature, a double-arm DC bridge (6) is used to measure the resistance value of the columnar tin oxide electrode to be measured; S3: according to the height, cross-sectional diameter and resistance value of the columnar tin oxide electrode to be measured, the resistivity of the columnar tin oxide electrode to be measured is obtained by resistivity calculation principle.

7. The method for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace according to claim 6, characterized in that: In S2, the preset temperature is 400°C to 1600°C.

8. The method for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace according to claim 6, characterized in that: In S2, the heating rate of the preset temperature is 4°C / min to 6°C / min.

9. The method for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace according to claim 6, characterized in that: In S2, the resistance value of the columnar tin oxide electrode to be measured is obtained by using a double-arm DC bridge (6) at a preset temperature, which specifically includes the following steps: at a preset temperature, the double-arm DC bridge (6) is used to measure once every 100° C., and the resistance value of the columnar tin oxide electrode to be measured is recorded.

10. The method for measuring the high temperature resistivity of tin oxide electrodes in a glass furnace according to claim 6, characterized in that: In S3, the resistivity calculation principle includes: Among them, ρ T is the resistivity of the columnar tin oxide electrode to be measured, R is the resistance value of the tin oxide electrode to be measured, S is the cross-sectional area of ​​the columnar tin oxide electrode to be measured, and D is the cross-sectional diameter of the tin oxide electrode to be measured.

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