Test device and test method

Abstract

A test device according to an embodiment disclosed in the present document may comprise: a voltage application unit for applying a first voltage and a surge voltage to a relay of a battery; a voltage acquisition unit for acquiring a second voltage applied to both ends of the relay in response to an input of the first voltage; a voltage detection unit for detecting a transient section indicating a transient state of the second voltage; and a controller for controlling the voltage application unit to apply the surge voltage in the transient section.

Description

Test apparatus and test method

[0001] Cross-citation with related applications

[0002] This application claims the benefit of priority to Republic of Korea Patent Application No. 10-2024-0016809, filed February 2, 2024, the entire disclosure of which is incorporated herein by reference.

[0003] Technology field

[0004] The embodiments disclosed in this document relate to a test device and a test method.

[0005] Recently, research and development on secondary batteries has been actively underway. Here, secondary batteries are defined as rechargeable and dischargeable batteries, encompassing both conventional Ni / Cd and Ni / MH batteries, as well as more recent lithium-ion batteries. Recently, their use has expanded to include power sources for electric vehicles, attracting attention as a next-generation energy storage medium.

[0006] Additionally, secondary batteries are typically used in battery packs comprising battery modules in which multiple battery cells are connected in series and / or parallel. The battery pack's status and operation are managed and controlled by a battery management system.

[0007] Because of the potential risk of fire when using lithium-ion batteries, safety testing is essential. These safety tests include overcharge testing, discharge testing, internal short-circuit testing, and electromagnetic compatibility testing.

[0008] Electromagnetic compatibility testing is a test to evaluate the electromagnetic wave immunity of a device under test (e.g., a battery). For example, an electromagnetic compatibility test can test the device's surge immunity by applying a surge voltage to the device under test (e.g., a battery). When configuring the circuit for electromagnetic compatibility testing, the test device is connected to a relay included in the device under test. In this case, electrical noise, or chattering, occurs during the relay's contact connection stage.

[0009] One purpose of the embodiments disclosed in this document is to provide a test device and test method capable of testing the surge resistance of a battery pack or battery unit.

[0010] One purpose of the embodiments disclosed in this document is to provide a test device and a test method capable of controlling the timing of applying a surge depending on the state of a device under test in a surge test of a battery pack or a battery unit.

[0011] The technical problems of the embodiments disclosed in this document are not limited to the technical problems mentioned above, and other technical problems not mentioned will be clearly understood by those skilled in the art from the descriptions below.

[0012] A test device according to one embodiment disclosed in the present document may include a voltage application unit that applies a first voltage and a surge voltage to a relay of a battery; a voltage acquisition unit that acquires a second voltage applied to both ends of the relay in response to an input of the first voltage; a voltage detection unit that detects a transient section indicating a transient state of the second voltage; and a controller that controls the voltage application unit to apply the surge voltage in the transient section.

[0013] According to an embodiment, the voltage detection unit can calculate a change amount of the second voltage per unit time and compare the change amount with a first threshold value to detect the transient section.

[0014] According to an embodiment, the voltage detection unit can determine a section in which the amount of change is greater than the first threshold value as the transient section.

[0015] According to an embodiment, the voltage detection unit can calculate a difference value, which is a difference between the first voltage and the second voltage, and compare the difference value with a second threshold value to detect the transient section.

[0016] According to an embodiment, the voltage detection unit can determine a section in which the difference value is greater than the second threshold value as the transient section.

[0017] According to an embodiment, the controller can control at least one of the magnitude of the surge voltage, the timing of application of the surge voltage, and the number of times the surge voltage is applied.

[0018] According to an embodiment, the first voltage may be a DC voltage.

[0019] A test method according to one embodiment disclosed in the present document may include the steps of: applying a first voltage to a relay of a battery; obtaining a second voltage applied to both terminals of the relay in response to input of the first voltage; detecting a transient section indicating a transient state of the second voltage; and applying a surge voltage in the transient section.

[0020] According to an embodiment, the step of detecting the transient section may include the step of calculating a change amount per unit time of the second voltage; and the step of detecting the transient section by comparing the change amount with a first threshold value.

[0021] According to an embodiment, the method may include a step of determining a section in which the amount of change is greater than the first threshold value as the excessive section.

[0022] According to an embodiment, the step of detecting the transient section may include the step of calculating a difference value which is a difference between the first voltage and the second voltage; and the step of detecting the transient section by comparing the difference value with a second threshold value.

[0023] According to an embodiment, a test method may include a step of determining a section in which the difference value is greater than the second threshold value as the excessive section.

[0024] According to an embodiment, the step of applying the surge voltage may include a step of determining at least one of the magnitude of the surge voltage, the time point of applying the surge voltage, and the number of times of applying the surge voltage.

[0025] According to an embodiment, the first voltage may be a DC voltage.

[0026] The test device and test method according to the embodiment disclosed in this document can test the surge resistance of a battery pack or a battery unit.

[0027] The test device and test method according to the embodiment disclosed in this document can control the timing of applying a surge depending on the state of the device under test in a surge test of a battery pack or a battery unit.

[0028] In addition, various effects may be provided, either directly or indirectly, through this document.

[0029] FIG. 1 is a block diagram showing a battery pack according to one embodiment disclosed in this document.

[0030] Figure 2 is a graph showing the voltage of a battery according to the operation of a conventional test device.

[0031] FIG. 3 is a block diagram showing a test device according to one embodiment disclosed in this document.

[0032] FIG. 4 is a graph showing a first voltage and a second voltage according to one embodiment disclosed in this document.

[0033] FIG. 5 is a graph showing a surge voltage and a second voltage according to one embodiment disclosed in this document.

[0034] Figure 6 is a flowchart showing the operation of a test device according to one embodiment disclosed in this document.

[0035] FIG. 7 is a block diagram showing the hardware configuration of a computing system for performing a test method according to one embodiment disclosed in this document.

[0036] Hereinafter, various embodiments of the present invention will be described with reference to the accompanying drawings. However, this is not intended to limit the present invention to specific embodiments, and it should be understood that the present invention encompasses various modifications, equivalents, and / or alternatives of the embodiments.

[0037] The various embodiments and terminology used in this document are not intended to limit the technical features described in this document to specific embodiments, but should be understood to encompass various modifications, equivalents, or alternatives of the embodiments. In connection with the description of the drawings, similar reference numerals may be used to refer to similar or related components. The singular form of a noun corresponding to an item may include one or more of the items, unless the context clearly indicates otherwise.

[0038] In this document, the phrases "A or B", "at least one of A and B", "at least one of A or B", "A, B, or C", "at least one of A, B, and C", and "at least one of A, B, or C" can each include any one of the items listed together in that phrase, or all possible combinations thereof. Terms such as "first", "second", "first", "second", "A", "B", "(a)", or "(b)" may be used merely to distinguish the corresponding element from other corresponding elements, and do not limit the corresponding elements in any other respect (e.g., importance or order) unless specifically stated otherwise.

[0039] In this document, whenever a component (e.g., a first component) is referred to as being “connected,” “coupled,” or “connected,” with or without the terms “functionally” or “communicatively,” or “coupled” or “connected,” it means that the component can be connected to the other component directly (e.g., wired), wirelessly, or via a third component.

[0040] According to one embodiment, the method according to various embodiments disclosed in this document may be provided as a computer program product. The computer program product may be traded as a commodity between a seller and a buyer. The computer program product may be distributed in the form of a machine-readable storage medium (e.g., compact disc read-only memory (CD-ROM)), or may be distributed online (e.g., downloaded or uploaded) through an application store or directly between two user devices. In the case of online distribution, at least a portion of the computer program product may be temporarily stored or temporarily generated in a machine-readable storage medium, such as the memory of a manufacturer's server, an application store's server, or an intermediary server.

[0041] According to various embodiments, each component (e.g., a module or a program) of the above-described components may include one or more entities, and some of the entities may be separated and placed in other components. According to various embodiments, one or more components or operations of the aforementioned components may be omitted, or one or more other components or operations may be added. Alternatively or additionally, a plurality of components (e.g., a module or a program) may be integrated into a single component. In such a case, the integrated component may perform one or more functions of each of the plurality of components identically or similarly to those performed by the corresponding component among the plurality of components prior to the integration. According to various embodiments, the operations performed by a module, program, or other component may be executed sequentially, in parallel, iteratively, or heuristically, or one or more of the operations may be executed in a different order, omitted, or one or more other operations may be added.

[0042] FIG. 1 is a block diagram showing a battery pack according to one embodiment disclosed in this document.

[0043] Referring to FIG. 1, a battery pack (1) may include a battery unit (10), a sensor unit (14), a switching unit (16), and a battery management system (BMS) (20). At this time, the battery pack (1) may be equipped with a plurality of battery units (10), sensor units (14), switching units (16), and battery management systems (20).

[0044] According to an embodiment, the battery unit (10) can supply power to a target device (not shown). To this end, the battery unit (10) can be electrically connected to the target device. Here, the target device can include an electrical, electronic, or mechanical device that operates by receiving power from the battery pack (1). For example, the target device can be, but is not limited to, an electric vehicle (EV) or an energy storage system (ESS).

[0045] According to an embodiment, the battery unit (10) may include at least one rechargeable battery cell (12). Here, the battery cell (12) may be a basic unit of a battery cell that can charge and discharge electric energy. For example, the battery cell (12) may be a lithium-ion (Li-ion) battery, a lithium-ion polymer (Li-ion polymer) battery, a nickel-cadmium (Ni-Cd) battery, a nickel-metal hydride (Ni-MH) battery, etc., but is not limited thereto.

[0046] According to an embodiment, a plurality of battery units (10) may be connected in series or parallel. For example, the battery unit (10) may be a battery module, a battery bank, or a collection of battery cells (cell-to-pack structure).

[0047] According to an embodiment, the sensor unit (14) can obtain information related to the battery unit (10). According to an embodiment, the sensor unit (14) can obtain values ​​(or information) related to the status of each battery unit (10). In one embodiment, the values ​​related to the status may include one or more values ​​for voltage, current, resistance, state of charge (SOC), state of health (SOH), or temperature of the battery cell, or a combination thereof.

[0048] According to an embodiment, the sensor unit (14) can provide information on each of a plurality of battery units (10) to the battery management system (20).

[0049] According to an embodiment, the switching unit (16) can switch the connection between the battery pack (1) and an external device (e.g., a test device (100)). For example, the switching unit (16) can switch the electrical connection between the battery pack (1) and an external device (e.g., a port (not shown) provided in the battery pack (1) for connection to the test device (100)) and other components included in the battery pack (1) (e.g., a battery unit (10), a battery cell (12), a sensor unit (14), and a BMS (20)). Here, the port provided in the battery pack (1) may include a power port for applying power and a signal port for transmitting an electrical signal.

[0050] According to an embodiment, the switching unit (16) may include a device for controlling the current flow for charging or discharging the battery unit (10). For example, the switching unit (16) may include at least one relay and / or magnetic contactor, etc., depending on the specifications of the battery pack (1).

[0051] According to an embodiment, a battery management system (BMS (Battery Management System) (20) can control or manage the battery pack (1) to prevent overcharge, overdischarge, etc. by monitoring the voltage, current, temperature, etc. of the battery pack (1). For example, the battery management system (20) may include a plurality of terminals as an interface for receiving values ​​measured from the various parameters described above, and a circuit connected to these terminals to process the input values. In addition, the battery management system (20) may control the sensor unit (14) and / or the switching unit (16). For example, the battery management system (20) may be connected to a plurality of battery units (10) to monitor the status of each of the plurality of battery units (10) and control ON / OFF of a relay or a contactor, etc.

[0052] According to an embodiment, the operation of the battery management system (20) may be performed by a BMS (Battery Management System) in the vehicle, as well as by various devices such as a server, cloud, charger, or charger / discharger.

[0053] The upper controller (2) can transmit control signals for multiple battery units (10) to the battery management system (20). Accordingly, the battery management system (20) can be controlled for operation based on signals received from the upper controller (2).

[0054] According to an embodiment, the test device (100) can test the operation and / or state of the device under test. Here, the device under test may include a battery pack (1) or a battery unit (10). For example, the test device (100) may mean a surge test device for testing the surge resistance of the device under test. Here, a surge may mean a sudden voltage change, and a surge may occur when a fuse blows, lightning strikes, switching, noise, or excessive electromagnetic load occurs in an electronic device.

[0055] The test device (100) according to various embodiments may include a test device specified in the international standard IEC 61000-4-5. For example, the test device (100) may test the surge resistance of the device under test by applying a voltage and current of a predetermined standard to the device under test.

[0056] According to an embodiment, the test device (100) may be connected to a power port or a signal port of a device under test. For example, the test device (100) may apply a surge to a power port or a signal port provided in a battery pack (1).

[0057] Figure 2 is a graph showing the voltage of a battery according to the operation of a conventional test device.

[0058] Referring to FIG. 2, the test device (100) can apply a surge voltage (S) to the device under test. Here, the surge voltage (S) can mean a rapid voltage fluctuation (e.g., high voltage).

[0059] According to an embodiment, since there is no established international standard regarding the timing and method of applying a surge to a device under test (e.g., a battery pack (1) or a battery unit (10)), a tester generally applies a surge voltage (S) using a surge test device when the device under test is in a normal state. Here, the normal state may mean a state in which the voltage (V) of the device under test is in a steady state. For example, the normal state may include a first section (t1 to t2) and a second section (t3 to t4). Accordingly, the test device (100) may apply the surge voltage (S) in at least one section among the first section (t1 to t2) and the second section (t3 to t4) in which the voltage (V) of the device under test is in a normal state.

[0060] However, in actual operating conditions of a device under test, surges may occur in non-normal conditions (e.g., transient conditions). In particular, surges occurring in a transient condition of the device under test may have a greater impact on the device under test than surges occurring in a normal condition. Therefore, the test device (100) according to the embodiment can apply a surge to the device under test in a transient condition to test the device under test in a more severe test environment. Through this, the test device (100) can increase the reliability of the surge test.

[0061] FIG. 3 is a block diagram showing a test device according to one embodiment disclosed in this document. FIG. 4 is a graph showing a first voltage and a second voltage according to one embodiment disclosed in this document. FIG. 5 is a graph showing a surge voltage and a second voltage according to one embodiment disclosed in this document.

[0062] Referring to FIGS. 3, 4, and 5, the test device (100) may include a voltage application unit (110), a voltage acquisition unit (120), a voltage detection unit (130), and a controller (140). However, the present invention is not limited thereto, and some components may be omitted from the test device (100), and other general-purpose components may be further included in the test device (100).

[0063] According to an embodiment, a voltage application unit (110) can apply voltage to a device under test. Here, the device under test may refer to a battery pack (1, see FIG. 1) or a battery unit (10, see FIG. 1). Hereinafter, for convenience of explanation, the device under test, the battery pack (1), and the battery unit (10) may be collectively referred to as a battery.

[0064] According to an embodiment, the voltage application unit (110) can apply voltage to the relay of the battery. Here, the relay is a device that switches the electrical connection between the battery and the test device (100), and may mean, for example, the switching unit (16) illustrated in FIG. 1.

[0065] According to an embodiment, the voltage application unit (110) may apply at least one of a first voltage (V1) and a surge voltage to the battery. Here, the first voltage (V1) may refer to a voltage that operates the battery, and the surge voltage (S) may refer to a rapid voltage fluctuation (e.g., high voltage). For example, the surge voltage (S) may refer to a voltage of a surge waveform having an amplitude and phase specified in Ed3.1 of the international standard IEC 61000-4-5.

[0066] According to an embodiment, the first voltage (V1) may mean a DC (Direct Current) voltage. If the first voltage (V1) is an AC (Alternating Current) voltage, the test device (100) may apply a surge voltage (S) at a point in time when the phase of the first voltage (V1) is 0, 90, 180, or 270, according to Ed3.1 of the international standard IEC 61000-4-5. However, when the first voltage (V1) is a DC (Direct Current) voltage, there may not be a regulation in the international standard regarding the method and timing of applying the surge voltage (S). Therefore, the test device (100) according to the embodiment can optimize the suitability and reliability of the test by controlling the timing of applying the first voltage (V1) and the surge voltage to the device under test when the first voltage (V1) is a DC voltage.

[0067] According to an embodiment, the voltage application unit (110) can apply voltages of different specifications depending on the port type of the device under test. Here, the port type of the device under test can include a power port for applying power and a signal port for transmitting an electrical signal. For example, when the voltage application unit (110) is connected to the power port of the battery pack (1), it can apply a first voltage (V1) of the power specification to the battery pack (1). In addition, when the voltage application unit (110) is connected to the signal port of the battery pack (1), it can apply a first voltage (V1) of the signal specification to the battery pack (1).

[0068] According to an embodiment, the voltage application unit (110) may be electrically connected to the device under test (e.g., a battery) via a switching unit (16, see FIG. 1) of the device under test. Here, the switching unit (16) may include elements such as an electronic or mechanical switch, a relay, and a field effect transistor (FET).

[0069] According to an embodiment, the voltage application unit (110) may include a surge protection circuit. Here, the surge protection circuit may prevent damage to the test device (100) due to a surge voltage (S) (or signal) and protect the voltage application unit (110). For example, the voltage application unit (110) may include a coupling circuit (Coupling IC). Through this, the test device (100) may be protected from overvoltage or voltage fluctuation due to a surge.

[0070] According to an embodiment, the relay of the battery can be short-circuited by the first voltage (V1) applied by the voltage application unit (110). Here, when the first voltage (V1) is applied to the battery, the relay included in the switching unit (16) can repeat short-circuiting and opening in units of microseconds (ms). In another aspect, when the first voltage (V1) is applied to the battery, a chattering or bouncing phenomenon may occur in the relay. According to an embodiment, the section in which the chattering or bouncing phenomenon occurs in the relay may include a transient section in which the device under test (e.g., the battery) is in a transient state.

[0071] According to an embodiment, the voltage acquisition unit (120) can acquire the voltage of a device under test (e.g., a battery). Here, the voltage of the device under test (e.g., a battery) may refer to a second voltage (V2) applied to both terminals of the relay in response to the input of a first voltage (V1). Accordingly, the second voltage (V2) may be different from the first voltage (V1).

[0072] According to an embodiment, the second voltage (V2) may include a transient period in which the device under test (e.g., a battery) is in a transient state and a normal period in which the device under test (e.g., a battery) is in a normal state. Here, the transient period may refer to a period immediately after the first voltage (V1) is applied to the battery. For example, in the graph of FIG. 4, the period (t2 to t3) between the time point (t2) at which the first voltage (V1) is applied and the time point (t3) at which the second voltage (V2) converges to the first voltage (V1) may refer to a transient period. This transient period (t2 to t3) may be accurately detected by the voltage detection unit (130) described below.

[0073] According to an embodiment, the voltage detection unit (130) can detect a transient section (t2 to t3) indicating a transient state of the second voltage (V2). Here, the transient state can mean a section between a specific steady state (t1 to t2) of the second voltage (V2) and another steady state (t3 to t4).

[0074] According to an embodiment, the voltage detection unit (130) can detect a transient section based on the amount of change in the second voltage (V2). For example, the voltage detection unit (130) can calculate the amount of change in the second voltage (V2) per unit time. Here, the amount of change in the second voltage (V2) per unit time can mean the slope of the second voltage (V2) graph. In addition, the voltage detection unit (130) can detect a transient section by comparing the amount of change in the second voltage (V2) with a first threshold value.

[0075] According to an embodiment, the voltage detection unit (130) can determine a section in which the amount of change in the second voltage (V2) is greater than a first threshold value as a transient section. Here, the first threshold value may mean a reference value for distinguishing whether the amount of change in the second voltage (V2) is a normal state or a transient state. For example, the first threshold value may be smaller than 0.1 [unit: V / ms]. According to an embodiment, the smaller the first threshold value, the more accurately the voltage detection unit (130) can detect the transient section. Through this, the voltage detection unit (130) can determine the transient state of the device under test based on the second voltage (V2) measured at both ends of the relay.

[0076] According to an embodiment, the voltage detection unit (130) can detect a transient section based on a first voltage (V1) and a second voltage (V2). For example, the voltage detection unit (130) can calculate a difference value which is a difference between the first voltage (V1) and the second voltage (V2). Then, the voltage detection unit (130) can detect a transient section by comparing the difference value with a second threshold value. Through this, the voltage detection unit (130) can detect a section in which a voltage (first voltage (V1)) applied to a relay of a device under test (e.g., a battery) and a voltage (second voltage (V2)) measured from the relay are different as a transient section.

[0077] According to an embodiment, the voltage detection unit (130) may determine a section in which the difference value is greater than a second threshold value as a transient section. Here, the second threshold value may mean a reference value for distinguishing whether the difference value between the first voltage (V1) and the second voltage (V2) is a normal state or a transient state. For example, the second threshold value may be smaller than 0.1 [unit: V]. According to an embodiment, the smaller the second threshold value, the more accurately the voltage detection unit (130) can detect the transient section.

[0078] According to an embodiment, the controller (140) can control the operation of the test device (100). For example, the controller (140) can control the operation of the voltage application unit (110), the voltage acquisition unit (120), and the voltage detection unit (130).

[0079] According to an embodiment, the controller (140) can control the voltage application unit (110) to control the timing of applying the first voltage (V1) and the timing of applying the surge voltage (S) to the device under test. For example, the controller (140) can control the voltage application unit (110) to apply the surge voltage (S) in the normal section (t1 to t2 or t3 to t4) or the transient section (t2 to t3) of the second voltage (V2).

[0080] According to the embodiment of FIG. 5, the controller (140) can control the voltage application unit (110) to apply a surge voltage (S) in the transient period (t2 to t3). In this case, the test device (100) can test the reliability of the device under test under more severe test conditions than when the surge voltage (S) is applied in the normal period (t1 to t2 or t3 to t4). Therefore, the test device (100) can test whether the device under test operates even under harsh test conditions, and can increase the reliability of the surge test.

[0081] According to an embodiment, the controller (140) can control the voltage application unit (110) to change the surge test conditions. Here, the surge test conditions may include the magnitude of the surge voltage (S), the application time of the surge voltage (S), and the number of times the surge voltage (S) is applied. Here, the magnitude of the surge voltage (S) may mean the amplitude of the surge voltage (S), the application time of the surge voltage (S) may mean whether the surge voltage (S) is applied in a transient section or a normal section, and the number of times the surge voltage (S) is applied may mean the number of times N (N is a natural number greater than or equal to 1). Through this, the controller (140) can test the device under test under various test conditions.

[0082] According to an embodiment, a test device (100) including a controller (140) can diagnose the status of a device under test by analyzing voltage data of the device under test according to the application of a surge voltage (S). Then, if the diagnosis results confirm that the device under test (e.g., a battery) is abnormal, the controller (140) can provide information about the abnormal battery to a user. For example, the controller (140) can provide information about the abnormal battery to a user terminal through a communication unit (not shown), and can also provide information about the abnormal battery through a display equipped in a vehicle or a charger.

[0083] According to an embodiment, the controller (140) can control the operation of the surge protection circuit included in the voltage application unit (110). According to an embodiment, the controller (140) can control whether the surge protection circuit operates based on the port type of the device under test. For example, when the voltage application unit (110) applies a first voltage (V1) (e.g., a signal) to the signal port of the battery, the controller (140) can control the surge protection circuit to operate. In addition, when the voltage application unit (110) applies a first voltage (V1) (e.g., a power voltage) to the power port of the battery, the controller (140) can control the surge protection circuit not to operate. Through this, the controller (140) can prevent a surge voltage (S) applied to the signal port of the device under test (e.g., a battery) from being transmitted backward to the test device (100). Therefore, the controller (140) can protect the test device (100) from overvoltage or voltage fluctuation due to surge.

[0084] Figure 6 is a flowchart showing the operation of a test device according to one embodiment disclosed in this document.

[0085] The operations illustrated in FIG. 6 can be performed via the test device (100) of FIG. 3. While the operations in the following embodiments may be performed sequentially, they are not necessarily performed sequentially. For example, the order of the operations may be changed, and at least two operations may be performed in parallel. Furthermore, at least one of the operations below may be omitted depending on the embodiment.

[0086] Referring to FIG. 6, the test device can apply a first voltage to a relay of a battery (S101), obtain a second voltage applied to both ends of the relay in response to the input of the first voltage (S102), detect a transient section indicating a transient state of the second voltage (S103), and apply a surge voltage in the transient section (S104).

[0087] In operation S101, the voltage application unit (110) of the test device (100) can apply a first voltage to the relay of the battery (S101).

[0088] In operation S102, the voltage acquisition unit (120) of the test device (100) can acquire a second voltage applied to both ends of the relay in response to input of the first voltage (S102).

[0089] In operation S103, the voltage detection unit (130) of the test device (100) can detect a transient section indicating a transient state of the second voltage (S103). According to an embodiment, the voltage detection unit (130) can calculate the amount of change in the second voltage per unit time, and detect a section in which the amount of change is greater than a first threshold value as a transient section. In addition, the voltage detection unit (130) can calculate a difference value, which is the difference between the first voltage and the second voltage, and determine a section in which the difference value is greater than the second threshold value as a transient section.

[0090] In operation S104, the controller (140) of the test device (100) can control the voltage application unit (110) to apply a surge voltage in the detected transient section (S104).

[0091] FIG. 7 is a block diagram showing the hardware configuration of a computing system for performing a test method according to one embodiment disclosed in this document.

[0092] Referring to FIG. 7, a computing system (200) according to one embodiment disclosed in the present document may include an MCU (210), a memory (220), an input / output I / F (230), and a communication I / F (240).

[0093] The MCU (210) may be a processor that executes various programs (e.g., a battery data collection program, a data analysis program, a data processing program, etc.) stored in the memory (220), processes various information including battery data through these programs, and performs the functions of the test device (100) shown in the aforementioned FIGS. 1 to 6.

[0094] The memory (220) can store various programs such as a battery data collection program, a data analysis program, and a data processing program.

[0095] Such memories (220) may be provided in multiple numbers as needed. The memories (220) may be volatile memories or non-volatile memories. As volatile memories (220), RAM, DRAM, SRAM, etc. may be used. As non-volatile memories (220), ROM, PROM, EAROM, EPROM, EEPROM, flash memories, etc. may be used. The examples of the memories (220) listed above are merely examples and are not limited to these examples.

[0096] The input / output I / F (230) can provide an interface that enables data transmission and reception between an input device (not shown) such as a keyboard, mouse, or touch panel, and an output device (not shown) such as a display and the MCU (210).

[0097] The communication I / F (240) is a component capable of transmitting and receiving various data with the server, and may be any device capable of supporting wired or wireless communication. For example, the test device (100) can transmit and receive various information, including battery data, from a separately provided external server via the communication I / F (240).

[0098] In this way, a computer program according to one embodiment disclosed in this document may be implemented as a module that performs each function illustrated in FIG. 2, for example, by being recorded in a memory (220) and processed by an MCU (210).

[0099] Although all components constituting the embodiments disclosed in this document have been described as being combined or operating in combination as one, the embodiments disclosed in this document are not necessarily limited to such embodiments. That is, within the scope of the purpose of the embodiments disclosed in this document, all of the components may be selectively combined and operated one or more times.

[0100] In addition, terms such as "include," "comprise," or "have" described above, unless specifically stated otherwise, mean that the corresponding component can be included, and therefore should be interpreted to include other components rather than excluding other components. All terms, including technical or scientific terms, have the same meaning as commonly understood by a person of ordinary skill in the art to which the embodiments disclosed in this document belong, unless otherwise defined. Commonly used terms, such as terms defined in a dictionary, should be interpreted to be consistent with the contextual meaning of the relevant technology, and shall not be interpreted in an idealized or overly formal sense, unless explicitly defined in this document.

[0101] The foregoing disclosure outlines features of several embodiments to enable those skilled in the art to better understand the aspects of the present disclosure. Those skilled in the art will readily appreciate that the present disclosure can be readily used as a basis for designing or modifying other structures to achieve the same purposes or advantages of the embodiments introduced herein. Furthermore, those skilled in the art will recognize that such equivalent structures do not depart from the scope of the present disclosure, and that various changes, substitutions, and modifications can be made herein without departing from the scope of the present disclosure.

[0102] [Explanation of symbols]

[0103] 1: Battery pack

[0104] 2: Upper controller

[0105] 10: Battery unit

[0106] 12: Battery cell

[0107] 14: Sensor section

[0108] 16: Switching section

[0109] 20: Battery Management System (BMS)

[0110] 100: Test device

[0111] 110: Voltage application part

[0112] 120: Voltage acquisition unit

[0113] 130: Voltage detection unit

[0114] 140: Controller

[0115] 200: Computing Systems

[0116] 210: MCU

[0117] 220: Memory

[0118] 230: Input / Output I / F

[0119] 240: Communication I / F

Claims

1. A voltage application unit that applies the first voltage and surge voltage to the battery relay; A voltage acquisition unit that acquires a second voltage applied to both ends of the relay in response to input of the first voltage; A voltage detection unit that detects a transient section indicating a transient state of the second voltage; and A test device including a controller that controls the voltage application unit to apply the surge voltage in the above-mentioned transient period.

2. In claim 1, The above voltage detection unit, The above second voltage calculates the amount of change per unit time, A test device that detects the transient section by comparing the above change amount with a first threshold value.

3. In claim 2, The above voltage detection unit, A test device that determines a section in which the above change amount is greater than the first threshold value as the above transition section.

4. In claim 1, The above voltage detection unit, Calculate the difference value, which is the difference between the first voltage and the second voltage, A test device that detects the transient section by comparing the above difference value with a second threshold value.

5. In claim 4, The above voltage detection unit, A test device that determines a section in which the difference value is greater than the second threshold value as the excessive section.

6. In claim 1, The above controller, A test device that controls at least one of the magnitude of the surge voltage, the timing of application of the surge voltage, and the number of times the surge voltage is applied.

7. In claim 1, A test device wherein the first voltage is a DC voltage.

8. Step of applying first voltage to the battery relay; A step of obtaining a second voltage applied to both ends of the relay in response to input of the first voltage; A step of detecting a transient section indicating a transient state of the second voltage; and A test method comprising a step of applying a surge voltage in the above transient section.

9. In claim 8, The step of detecting the above-mentioned excessive section is: A step of calculating the amount of change in the second voltage per unit time; and A test method comprising a step of detecting the transient section by comparing the above change amount with a first threshold value.

10. In claim 9, A test method including a step of determining a section in which the change amount is greater than the first threshold value as the excessive section.

11. In claim 8, The step of detecting the above-mentioned excessive section is: A step of calculating a difference value which is the difference between the first voltage and the second voltage; and A test method comprising a step of detecting the transient section by comparing the difference value with a second threshold value.

12. In claim 11, A test method including a step of determining a section in which the difference value is greater than the second threshold value as the excessive section.

13. In claim 8, The step of applying the above surge voltage is: A test method comprising a step of determining at least one of the magnitude of the surge voltage, the time point of application of the surge voltage, and the number of times of application of the surge voltage.

14. In claim 8, A test method wherein the first voltage is a DC voltage.

Images