Three-dimensional scanning system

By introducing automatic scanning mode switching and user mode selection in the three-dimensional scanning system, complex configuration and high dependency problems in the prior art are solved, and a more efficient three-dimensional scanning process is achieved.

WO2025167383A1PCT designated stage Publication Date: 2025-08-14SCANTECH (HANGZHOU) CO LTD
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Patent Information

Application Number
PCT/CN2024/143624
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-02-05
Filing Date
2024-12-30
Publication Date
2025-08-14

AI Technical Summary

Technical Problem

The existing three-dimensional scanning system requires complex configuration and debugging before use, and has high technical and experience requirements for the operator, resulting in low scanning efficiency and poor results.

Method used

The automatic scanning mode matching and switching mechanism is adopted, and the first and second scanning modes are preset by the controller, and the scanning configuration parameters are compared with the preset threshold, and a variety of user selections are provided in combination with the user mode module to simplify operation.

Benefits of technology

Reliance on operator technology and experience is reduced, the degree of automation and scanning efficiency of scanning systems is improved, and the scanning needs of different objects and scenarios are met.

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Abstract

The present application relates to a three-dimensional scanning system. The three-dimensional scanning system comprises: a pattern projector, comprising a light source device configured to project a feature pattern onto a surface of an object being scanned; an image acquisition device, comprising one or more cameras configured to acquire a two-dimensional image of the object that contains the feature pattern; and a controller, preconfigured with a first scanning mode and a second scanning mode, wherein each scanning mode has corresponding scanning configuration parameters, and the scanning configuration parameters comprise at least one of: a scanning distance D between the scanning system and the object; Mn, which denotes the number of marker points; and image information. The controller is configured to: acquire scanning configuration parameters of the three-dimensional scanning system in the first scanning mode; compare the scanning configuration parameters with preset thresholds; and when the acquired scanning configuration parameters satisfy the preset thresholds, control the three-dimensional scanning system to switch to the second scanning mode to perform three-dimensional scanning on the object.
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Description

3D scanning system Technical Field

[0001] The present application relates to the field of three-dimensional scanning technology, and in particular to a system and method for performing three-dimensional scanning on an object. Background Art

[0002] A three-dimensional scanning system usually includes a projector, a camera, a controller, and a computer. The projector projects light onto the surface of the object to be measured. The camera continuously takes pictures of the object to be measured after setting internal and external parameters and transmits them to the computer. The controller is used to control devices such as the projector and the camera. After processing the pictures obtained by the camera, the computer reconstructs a three-dimensional model of the object to be measured through configuration, fusion and other splicing steps.

[0003] Prior to use, existing 3D scanning systems require configuration and debugging based on the object being measured and the scanning scenario, resulting in low scanning efficiency. In particular, configuration and debugging of existing scanning systems require a high level of user skill and experience, often resulting in unsatisfactory scanning results. Summary of the Invention

[0004] The purpose of this application is to propose an improvement to existing 3D scanning technology, reducing the scanning process's reliance on the operator's subjective skills and experience. In particular, the scanning system of the present invention automatically matches and switches scanning modes to best meet the needs of the object being measured, the scanning scenario, and the user.

[0005] In one aspect, the present application relates to a three-dimensional scanning system, comprising:

[0006] a pattern projector comprising a light source device configured to project a characteristic pattern onto a surface of a scanned object;

[0007] an image collector comprising one or more cameras configured to acquire a two-dimensional image of the scanned object containing the characteristic pattern; and

[0008] a controller having a first scanning mode and a second scanning mode, each scanning mode having corresponding scanning configuration parameters, the scanning configuration parameters including at least one of a scanning distance D between the scanning system and the scanned object, a number of marking points Mn, and image information;

[0009] Wherein, the controller is configured to:

[0010] Obtaining scanning configuration parameters of the three-dimensional scanning system in a first scanning mode,

[0011] comparing the scan configuration parameters with a preset threshold, and

[0012] When the acquired scanning configuration parameters meet the preset threshold, the three-dimensional scanning system is controlled to switch to the second scanning mode to perform three-dimensional scanning on the scanned object.

[0013] In another aspect, the present application relates to another three-dimensional scanning system, comprising:

[0014] A user mode module, which has multiple preset user modes for users to choose from, and each user mode has a corresponding projection mode and splicing mode; and

[0015] The execution module is configured to automatically execute the scanning mode under the user mode to complete the scanning after receiving the user's instruction on selecting the specific user mode.

[0016] Other details and advantages of the present application will be further described in the following drawings and description. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Hereinafter, some specific embodiments of the present application will be described in detail in an exemplary and non-limiting manner with reference to the accompanying drawings. The same reference numerals in the accompanying drawings designate the same or similar components or parts.

[0018] FIG1 shows a schematic block diagram of the composition of a three-dimensional scanning system.

[0019] FIG2 shows a flow chart of a scanning mode switching method.

[0020] FIG3 shows a flow chart of an exemplary projection mode switching control method.

[0021] FIG. 4 shows a flow chart of another exemplary projection mode switching control method.

[0022] FIG5 shows a flow chart of another exemplary projection mode switching control method.

[0023] FIG6 shows a flow chart of another exemplary projection mode switching control method.

[0024] FIG7 shows a flow chart of an exemplary splicing mode switching control method.

[0025] FIG8 shows a schematic block diagram of another three-dimensional scanning system. DETAILED DESCRIPTION

[0026] The terms involved in this application should have the general meaning understood by people with ordinary skills in the technical field to which this application belongs. Among them, the terms "comprise", "include", "have" and any variants thereof involved in this application are intended to cover non-exclusive inclusion. For example, a process, method and system, product or equipment comprising a series of steps or modules (units) is not limited to the listed steps or modules (units), but may include unlisted steps or modules (units), or may include other steps or modules (units) inherent to these processes, methods, products or equipment. Similar words such as "connect", "connected", "coupled" involved in this application are not limited to physical or mechanical connections, but may include electrical, wired, wireless and other connection modes, whether directly or indirectly connected. "Multiple" involved in this application refers to two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships can exist, for example, "A and / or B" can represent the three situations of A existing alone, A and B existing at the same time, and B existing alone. Typically, the character " / " indicates an "or" relationship between related objects, and the characters "+" and "-" indicate the simultaneous existence of two or more related items. The terms "first," "second," and "third," etc., used in this application, are used only to distinguish between similar objects and do not imply a specific ordering of the objects.

[0027] Figure 1 shows a schematic block diagram of a 3D scanning system 100. The system is used to perform 3D scanning of an object and includes a pattern projector 110, an image collector 120, a controller 130, and a display 140. The pattern projector projects a characteristic pattern 111 onto the surface of the object being scanned; the image collector captures a 2D image 121 of the object's surface containing the characteristic pattern; and the display displays a 3D modeled image of the object being reconstructed in real time or afterward. The controller 130 is connected to the pattern projector 110, image collector 120, and display 140 via wired or wireless communication to enable data and information communication and interaction.

[0028] The pattern projector 110 includes one or more light source devices 112 for projecting light toward the surface of the scanned object. For example, the light source device is configured to project a speckle pattern toward the surface of the scanned object, such as a VCSEL projector. For another example, the light source device is configured to project a preset light toward the surface of the scanned object, such as a laser projector that projects various types of visible or invisible light. For another example, the light source device is configured to emit a laser beam toward the surface of the scanned object, such as various laser emitters used for laser ranging. In addition, the pattern projector can be configured as a red light device, an infrared VCSEL, a blue light device, and combinations thereof.

[0029] The pattern projector 110 is connected to the controller 130 and activates a corresponding projection function or projection mode in response to a control signal from the controller. The projection modes include, for example, at least one of a parallel laser mode, a multi-line cross laser mode, a speckle mode, a laser scanning mode, and a speckle-laser hybrid mode. For example, in the parallel laser mode, the pattern projector, under the control of the controller, projects multiple parallel laser lines toward the surface of the scanned object. For another example, in the multi-line cross laser mode, the pattern projector, under the control of the controller, projects multiple intersecting laser beams toward the surface of the scanned object. For another example, in the speckle mode, the pattern projector, under the control of the controller, projects one or more speckle patterns toward the surface of the scanned object. For another example, in the speckle-laser hybrid mode, the pattern projector, under the control of the controller, simultaneously projects both laser lines and speckle patterns toward the surface of the scanned object.

[0030] The image acquisition device 120 includes one or more cameras 121 for acquiring a two-dimensional image 122 of the surface of the scanned object. The image acquisition device 120 is connected to a controller 130 and activates corresponding camera functions or acquisition modes in response to control signals from the controller. The image acquisition device selects a corresponding camera in response to the control signals from the controller and calibrates the camera's internal parameters, distortion coefficients, and spatial relative position. For example, the image acquisition device may include one or more black and white cameras or color cameras, or a combination thereof. In another example, the image acquisition device may also include a synchronization trigger unit connected to at least the camera and projector to synchronously trigger the projector and camera. When the projector projects a characteristic pattern toward the scanned object, the image acquisition device synchronously acquires a two-dimensional image of the scanned object containing the characteristic pattern. In another example, the image acquisition device may also include a bandpass filter, which is configured for the camera and has a bandpass wavelength corresponding to the projector.

[0031] In one instance, the image acquisition device includes at least one black and white camera and at least one color camera. When the light source device of the pattern projector projects a characteristic pattern formed by invisible light onto the scanned object, the color camera and the black and white camera synchronously obtain a two-dimensional image of the surface of the scanned object; when the light source device of the pattern projector projects a characteristic pattern formed by visible light onto the scanned object, the black and white camera obtains a two-dimensional image of the surface of the scanned object.

[0032] In another embodiment, the image collector includes at least one black and white camera and at least one color camera, and the color camera and the black and white camera synchronously acquire a two-dimensional image of the surface of the scanned object.

[0033] The controller 130 includes, for example, a processor, a memory, a bus, and a communication interface, and the processor, the communication interface, and the memory are connected via a bus. The memory is used to store programs, data, and information, and may include high-speed random access memory (RAM), and may also include non-volatile memory. The processor may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc., or a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gates or transistor logic devices, or discrete hardware components. The controller may be a single control unit or multiple independent control units. For example, in the scenario of a three-dimensional scanning system including a handheld scanner, the system may include a control unit provided in the handheld scanner, and may also include a controller independent of the handheld scanner, such as a computer, a mobile phone, etc.

[0034] The controller is preset with at least a first scanning mode and a second scanning mode for completing one or more steps of a three-dimensional scanning program, and each scanning mode is provided with corresponding scanning configuration parameters, the parameters including at least one of a scanning distance D between the scanning system and the scanned object, a number of marking points Mn, and image information.

[0035] For example, a scanning mode includes a projection mode for controlling the corresponding light source devices in the pattern projector to project a characteristic pattern onto the scanned object. The projection modes include at least one of a parallel laser mode, a multi-line crossed laser mode, a speckle mode, and a laser-speckle hybrid mode. As known to those skilled in the art, in a speckle mode, for example, a VCSEL projector can project a speckle pattern onto the surface of the scanned object. In a speckle and laser hybrid mode, multiple light source devices simultaneously project a speckle pattern and a laser pattern onto the surface of the scanned object, allowing both speckle information and laser information to be simultaneously visible on the scanned object surface or captured in a single photograph. Parallel blue light mode and multi-line crossed laser mode are not speckle or hybrid modes. Light source devices are controlled to project parallel blue light or a multi-line crossed laser pattern onto the surface of the scanned object and are generally referred to as non-speckle modes.

[0036] For another example, the parameters of the acquisition mode are adjusted according to different projection modes, and the parameters may include one or more of the camera's gain, exposure, GAMMA value, black level, fill light exposure, and the like.

[0037] For another example, the scanning mode includes a stitching mode for stitching the two-dimensional image, and the stitching mode includes, for example, at least one of a marker point mode, a geometric mode, a texture mode, a marker point-geometry hybrid mode, a marker point-texture mode, a marker point-geometry-texture hybrid mode, and a texture-geometry hybrid mode. As known to those skilled in the art, when the stitching mode is the marker point mode, the geometric mode, or the texture mode, the controller extracts marker point information, geometric feature information, or surface texture information from the two-dimensional image, reconstructs the marker points, geometric features, or surface texture using triangulation or the epipolar principle, and obtains a conversion relationship between the previous and next frame point clouds based on the matching information of the existing marker points, geometric features, or surface textures, thereby obtaining a surface point cloud of the scanned object in the same coordinate system. When the stitching mode is a marker point-geometry hybrid mode, a marker point-texture mode hybrid, a marker point-geometry-texture hybrid mode, or a texture-geometry hybrid mode, the marker points, geometric features, or surface textures are reconstructed simultaneously or successively, and the conversion relationship between the previous and next frame point clouds is obtained based on the matching information of the existing marker points, geometric features, or surface textures, thereby obtaining the surface point cloud of the scanned object in the same coordinate system.

[0038] The controller is configured to automatically determine and switch to a second scanning mode based on the current scanning configuration parameters of the first scanning mode to complete one or more steps of the 3D scanning process and achieve the best scanning purpose. FIG2 shows a flowchart of a scanning mode switching method 200 .

[0039] S201: Acquire scanning configuration parameters of a scanning system in a first scanning mode.

[0040] The scanning configuration parameters are preset parameters of the scanning system when scanning using a specific scanning mode or specific characteristics of the scanned object, for example, one or more of the scanning distance D between the scanning system and the scanned object, the number of marking points Mn, image information, and splicing features.

[0041] For example, the first scanning mode may be a system default scanning mode, such as one or more of the pattern projection mode, image acquisition mode, or image stitching mode that the system uses by default when it is turned on or after a long period of standby. For another example, the first scanning mode is one or more of the pattern projection mode, image acquisition mode, or image stitching mode implemented for the target frame image during the use of the system, so the first scanning mode can be obtained by analyzing the most recently captured image. Specifically, the controller may be configured to obtain the scanning configuration parameters of the scanning system in the first scanning mode in the following manner: obtain a first two-dimensional image acquired by the image acquirer of the scanning system in the first scanning mode, and calculate the scanning configuration parameters of the first scanning mode based on the first two-dimensional image.

[0042] S202: Compare the scanning configuration parameter with a preset threshold.

[0043] The preset threshold is a scanning configuration parameter value or value range preset for different scanning modes, which is, for example, one or more of the scanning distance range between the scanning system and the scanned object, the number of marking points or the number range of marking points, image information, and splicing features.

[0044] The scanning configuration parameters can be compared with preset thresholds by, for example, looking up a table one by one. For example, preset thresholds are set for multiple scanning configuration parameters to form a threshold table, and the scanning configuration parameters of the first scanning mode are checked and compared with each item in the threshold table.

[0045] S203: When the scanning configuration parameter meets the preset threshold, the scanning system is controlled to switch to a corresponding second scanning mode to perform a three-dimensional scan on the scanned object.

[0046] For example, after comparing the scanning configuration parameters with preset thresholds, if one or more specific scanning configuration parameters are found to meet the corresponding preset thresholds, the scanning system is controlled to switch to a second scanning mode corresponding to the preset thresholds to perform a three-dimensional scan of the scanned object. For example, based on whether the preset thresholds have been met, the controller controls the pattern projector to control different light source devices to project patterns, automatically sets image acquisition parameters for a camera in the image acquisition unit, or selects corresponding stitching features to perform stitching.

[0047] S204: When the scanning configuration parameter does not meet the preset threshold, control the scanning system to maintain the first scanning mode to perform three-dimensional scanning on the scanned object.

[0048] For example, the controller can be set to: when the scanning configuration parameters meet a specific preset threshold, abandon the first two-dimensional image and use the second two-dimensional image obtained in the second scanning mode as the stitched photo; when the scanning configuration parameters do not meet any preset threshold, use the first two-dimensional image as the stitched photo.

[0049] FIG3 illustrates a flowchart of an exemplary projection mode switching control method 300 for a scanning system according to the present invention, wherein the first mode is, for example, a non-speckle projection mode. The controller first obtains a scanning distance D from the scanning configuration parameters of the system in the first scanning mode (step 310), and then compares the scanning distance D with a plurality of preset thresholds YD0, YD1, and YD2 (step 320), where YD0 < YD1 < YD2. For example, YD0 can be 100 mm, 200 mm, or other suitable values, YD1 can be 600 mm, 1500 mm, or other suitable values, and YD2 can be 2000 mm, or other suitable values.

[0050] When the scanning distance D in the first scanning mode is less than a preset mode threshold YD0, the system switches to parallel laser mode (if enabled) to project a characteristic pattern onto the scanned object (step 330). When the scanning distance D in the first scanning mode is greater than or equal to YD0 and less than a preset threshold YD1, the system switches to multi-line cross laser mode (if enabled) to project a characteristic pattern onto the scanned object (step 340). When the scanning distance D in the first scanning mode is greater than or equal to YD1 and less than a preset threshold YD2, the system switches to speckle mode (if enabled) to project a characteristic pattern onto the scanned object (step 350). If the scanning distance D in the first scanning mode is greater than or equal to YD2, the system maintains non-speckle mode to project the preset pattern onto the scanned object (step 360). It will be appreciated that D generally does not exceed YD2.

[0051] FIG4 illustrates a flowchart 400 of another exemplary projection mode switching control method for a scanning system according to the present invention, wherein the first mode is, for example, a non-speckle projection mode. The controller first obtains the scanning distance D and the number of marker points Mn from the system's scanning configuration parameters for the first scanning mode (step 410). The controller then compares the scanning configuration parameters for the first scanning mode with multiple preset thresholds (step 420). If the number of marker points in the first scanning mode is less than three, the system switches to speckle mode (if enabled) to project a characteristic pattern onto the scanned object (step 430). If the number of marker points in the first scanning mode is greater than or equal to three, the system proceeds to step S, further controlling the system's projection mode according to the flowchart illustrated in FIG3. Furthermore, if the speckle mode is not enabled, the system maintains non-speckle mode to project a preset pattern onto the scanned object.

[0052] FIG5 illustrates a flowchart of another exemplary projection mode switching control method 500 for a scanning system according to the present invention, wherein the first mode is, for example, a speckle projection mode. The controller first obtains the scanning distance D and the number of markers Mn from the system's scanning configuration parameters for the first scanning mode (step 510). The controller then compares the scanning configuration parameters for the first scanning mode with multiple preset thresholds (e.g., steps 520 and 530). If the number of markers in the first scanning mode is greater than or equal to 3, the system proceeds to step S, further controlling the system's projection mode according to the process illustrated in FIG3. If the number of markers in the first scanning mode is less than 3 and the scanning distance D is less than a preset threshold YD3, the system switches to a hybrid mode combining speckle and laser (if enabled) projection, projecting a characteristic pattern onto the scanned object (step 540). Furthermore, if the laser fast scan mode is not enabled, the system maintains speckle mode to project the preset pattern onto the scanned object.

[0053] FIG6 illustrates a flowchart of another exemplary projection mode switching control method 600 for a scanning system according to the present invention, wherein the first mode is, for example, a speckle and laser hybrid mode. The controller first obtains the scanning distance D and the number of marker points Mn from the system's scanning configuration parameters for the first scanning mode (step 610). The controller then compares the scanning configuration parameters for the first scanning mode with multiple preset thresholds (e.g., steps 620 and 630). If the number of marker points in the first scanning mode is greater than or equal to 3, the system proceeds to step S, further controlling the system's projection mode according to the process illustrated in FIG3. If the number of marker points in the first scanning mode is less than 3 and the scanning distance D is greater than or equal to a preset threshold value YD3, the system switches to speckle mode to project a characteristic pattern onto the scanned object (step 640). Furthermore, if the laser fast scan mode is not enabled, the system maintains the speckle and laser hybrid mode to project the preset pattern onto the scanned object.

[0054] As described above with respect to Figures 4-6, when the number of marking points in the first scanning mode is greater than or equal to 3, the process proceeds to step S. Specifically, when the number of marking points in the first scanning mode is greater than or equal to 3 and the scanning distance D is less than a preset threshold value YD0, the process switches to the parallel laser mode to project a characteristic pattern onto the scanned object; when the number of marking points in the first scanning mode is greater than or equal to 3 and the scanning distance D is greater than or equal to YD0 and less than YD1, the process switches to the multi-line cross laser mode to project a characteristic pattern onto the scanned object; and when the number of marking points in the first scanning mode is greater than or equal to 3 and the scanning distance D is greater than or equal to YD1 and less than YD2, the process switches to the speckle mode to project a characteristic pattern onto the scanned object.

[0055] In Figures 3-6 above, after acquiring a two-dimensional image of the scanned object surface after projection in a suitable projection mode, the controller implements step M, stitching the two-dimensional image as the current frame two-dimensional image with the corresponding target frame. To this end, the controller is configured to: receive the current frame two-dimensional image of the scanned object acquired by the image collector; determine stitching features in the current frame two-dimensional image, wherein the stitching features include at least one of a marker feature, a texture feature, and a geometric feature; and based on the calculated stitching features, select at least one stitching mode to stitch the current frame two-dimensional image with the target frame two-dimensional image.

[0056] FIG7 shows a flow chart of an exemplary stitching mode switching control method 700. As shown in the figure, after entering step M, if the controller determines that the system has enabled marker information or that marker information exists in the current frame image, the following processing is performed: for the current frame two-dimensional image, when the number of markers is greater than or equal to 3, if the geometric feature is enabled, the marker-geometric feature hybrid mode is selected for stitching (step 710); if the geometric feature is not enabled, the marker mode is selected for stitching (step 720). For the current frame two-dimensional image, when the number of markers is greater than 0 but less than 3, if the texture feature is also present and enabled, the marker-texture hybrid mode or the marker-texture-geometry hybrid mode is selected for stitching (step 730); if the texture feature is present and is not enabled or does not exist, the marker-geometry hybrid mode is selected for stitching (step 740).

[0057] If the controller determines that the number of marker points in the current frame of the two-dimensional image is zero or that no marker point information exists, and if texture features are present and enabled, the controller selects the geometry-texture hybrid mode for stitching (step 750). If neither marker point information nor texture features exist, or if no marker point information exists but texture features are present and disabled, the controller determines whether point cloud feature information is enabled. If point cloud feature information is enabled and the geometric features meet a preset threshold, the controller selects the geometry feature mode (step 760). If the geometric features do not meet the preset threshold, the stitched photo is discarded (step 770).

[0058] FIG8 illustrates a schematic block diagram of another scanning system 800 according to the present invention. Scanning system 800 includes a user mode module 810, which includes multiple preset user modes for user selection. Each user mode has a corresponding preset projection mode and stitching mode. Scanning system 800 also includes an execution module 820, which, upon receiving a user instruction to select a specific user mode, automatically executes the scanning mode, including the projection mode and / or stitching mode, in that user mode to complete the scan.

[0059] In one embodiment, the multiple user modes include:

[0060] A first user mode, wherein the first user mode is preset with a laser projection mode and a marking point stitching mode;

[0061] The second user mode is preset with a speckle scanning mode and a texture marker point geometric feature mixed splicing mode.

[0062] The third user mode is preset with a laser scanning mode and a texture marker point geometric feature mixed splicing mode.

[0063] In another embodiment, the multiple user modes may further include a fourth user mode, and the execution module may include, for example, the system structure shown in FIG1 , including:

[0064] A pattern projector, which is used to project a characteristic pattern onto the scanned object;

[0065] an image collector for acquiring a two-dimensional image of the scanned object containing the characteristic pattern; and

[0066] a controller having a first scanning mode and a second scanning mode, each scanning mode having corresponding scanning configuration parameters, the scanning configuration parameters including at least one of a scanning distance D between the scanning system and the scanned object, a number of marking points Mn, and image information;

[0067] The controller is configured to, when executing the fourth user mode:

[0068] Obtaining scanning configuration parameters of the system in a first scanning mode,

[0069] comparing the scan configuration parameters with a preset threshold, and

[0070] When the scanning configuration parameter meets the preset threshold, the scanning system is controlled to switch to the second scanning mode to perform three-dimensional scanning on the scanned object.

[0071] The embodiments described above are for illustrative purposes only and are not intended to limit specific embodiments. Based on the embodiments provided in this application, all other embodiments obtained by persons of ordinary skill in the art without inventive effort are within the scope of protection of this application. A specific embodiment described above may be combined with other embodiments unless there is a conflict.

Claims

1. A three-dimensional scanning system, characterized in that: The three-dimensional scanning system includes: a pattern projector comprising a light source device configured to project a characteristic pattern onto a surface of a scanned object; an image collector comprising one or more cameras configured to acquire a two-dimensional image of the scanned object containing the characteristic pattern; and a controller having a first scanning mode and a second scanning mode, each scanning mode having corresponding scanning configuration parameters, the scanning configuration parameters including at least one of a scanning distance D between the scanning system and the scanned object, a number of marking points Mn, and image information; Wherein, the controller is configured to: Obtaining scanning configuration parameters of the three-dimensional scanning system in a first scanning mode, comparing the scan configuration parameters with a preset threshold, and When the acquired scanning configuration parameters meet the preset threshold, the three-dimensional scanning system is controlled to switch to the second scanning mode to perform three-dimensional scanning on the scanned object.

2. The system according to claim 1, wherein: The second scanning mode includes a projection mode for controlling the pattern projector to project a characteristic pattern onto the surface of the scanned object, and the projection mode includes one or more of a parallel laser mode, a multi-line cross laser mode, and a speckle mode.

3. The system according to claim 2, characterized in that The controller is configured to: When the scanning distance D of the first scanning mode is less than the preset mode threshold YD0, the laser is switched to the parallel laser mode to project a characteristic pattern onto the surface of the scanned object. When the scanning distance D of the first scanning mode is greater than or equal to YD0 and less than the preset threshold value YD1, the multi-line cross laser mode is switched to project a characteristic pattern onto the surface of the scanned object. When the scanning distance D of the first scanning mode is greater than or equal to YD1 and less than the preset threshold value YD2, the scanning mode is switched to the speckle mode to project a characteristic pattern onto the surface of the scanned object. Wherein, the preset threshold value YD0<YD1<YD2.

4. The system according to claim 2, wherein: The controller is configured to: When the number of marking points in the first scanning mode is less than 3, the mode is switched to the speckle mode to project a characteristic pattern onto the surface of the scanned object.

5. The system according to claim 2, wherein: The controller is configured to: When the number of marking points in the first scanning mode is less than 3 and the scanning distance D is less than a preset threshold value YD3, the mode is switched to the speckle laser hybrid mode to project a characteristic pattern onto the surface of the scanned object.

6. The system according to claim 2, wherein: The controller is configured to: When the number of marking points in the first scanning mode is less than 3 and the scanning distance D is greater than or equal to a preset threshold value YD3, the mode is switched to the speckle mode to project a characteristic pattern onto the surface of the scanned object.

7. The system according to any one of claims 3 to 6, characterized in that The controller is configured to: When the number of marking points in the first scanning mode is greater than or equal to 3 and the scanning distance D is less than the preset threshold value YD0, the parallel laser mode is switched to project a characteristic pattern onto the surface of the scanned object. When the number of marking points in the first scanning mode is greater than or equal to 3 and the scanning distance D is greater than or equal to YD0 and less than YD1, switch to the multi-line cross laser mode to project a characteristic pattern to the scanned object. When the number of marking points in the first scanning mode is greater than or equal to 3 and the scanning distance D is greater than or equal to YD1 and less than YD2, switch to the speckle mode to project a characteristic pattern to the scanned object. Wherein, the preset threshold value YD0<YD1<YD2.

8. The system according to claim 2, wherein: The scanning configuration parameters for the first scanning mode are obtained as follows: The acquisition system acquires a first two-dimensional image by the image collector in the first scanning mode; and Based on the first two-dimensional image, scanning configuration parameters of a first scanning mode are calculated.

9. The method according to claim 8, characterized in that When the scanning configuration parameter meets the preset threshold, the first two-dimensional image is discarded, and the second two-dimensional image obtained in the second scanning mode is used as the stitched photo, When the scanning configuration parameter does not meet the preset threshold, the first two-dimensional image is used as a stitched photo.

10. The system according to claim 1, wherein: The image collector includes at least one black and white camera and at least one color camera, wherein: When the light source device of the pattern projector projects a characteristic pattern formed by invisible light onto the scanned object, the color camera and the black and white camera synchronously acquire a two-dimensional image of the surface of the scanned object; When the light source device of the pattern projector projects a characteristic pattern formed by visible light onto the scanned object, the black and white camera acquires a two-dimensional image of the surface of the scanned object.

11. The system according to claim 1, wherein: The image collector includes at least one black-and-white camera and at least one color camera, and the color camera and the black-and-white camera synchronously acquire a two-dimensional image of the surface of the scanned object.

12. The system according to claim 1, wherein: The second scanning mode includes an acquisition mode for controlling the image acquirer to acquire a two-dimensional image of the scanned object.

13. The system according to claim 1, wherein: The second scanning mode includes a stitching mode for stitching the two-dimensional image, and the stitching mode includes one or more of a marker point mode, a geometry mode, a texture mode, a marker point-geometry mixed mode, a marker point-texture mixed mode, a marker point-geometry-texture mixed mode, and a texture-geometry mixed mode.

14. The system according to claim 13, wherein: The controller is configured to: receiving a two-dimensional image of a current frame of the scanned object acquired by the image collector; Determining a splicing feature in the two-dimensional image of the current frame, where the splicing feature includes at least one of a marker feature, a texture feature, and a geometric feature; and Based on the calculated stitching features, at least one stitching mode is determined to stitch the current frame two-dimensional image with the target frame two-dimensional image.

15. The system according to claim 14, wherein: For the current frame two-dimensional image, when the number of marker points in the stitching feature is greater than or equal to 3, if the geometric feature is enabled, the marker point-geometry hybrid mode is selected for stitching; if the geometric feature is not enabled, the marker point mode is selected for stitching.

16. The system according to claim 14, wherein: For the current frame two-dimensional image, when the number of marker points in the stitching feature is greater than 0 and less than 3, if there is a texture feature, the marker point-geometry-texture hybrid mode is selected to implement stitching; if there is no texture feature, the marker point-geometry hybrid mode is selected to implement stitching.

17. The system according to claim 14, wherein: For the two-dimensional image of the current frame, when the number of marker points in the splicing feature is 0, if texture features still exist, a geometry-texture hybrid mode is selected to implement the splicing.

18. The system according to claim 17, wherein: For the current frame two-dimensional image, when there is no texture feature in the splicing feature, If the geometric features meet the preset threshold, the geometric feature mode is selected, and If the geometric features do not meet the preset threshold, the stitched photo is discarded.

19. A three-dimensional scanning system, characterized in that: The system comprises: A user mode module, which has multiple preset user modes for users to choose from, and each user mode has a corresponding projection mode and splicing mode; and The execution module is configured to automatically execute the scanning mode under the user mode to complete the scanning after receiving the user's instruction on selecting the specific user mode.

20. The system according to claim 19, wherein: The multiple user modes in the user mode module include: A first user mode, the first user mode being a combination of a laser projection mode and a marker point stitching mode; The second user mode is a combination of a speckle scanning mode and a texture+marker+geometric feature mixed stitching mode. The third user mode is a combination of a laser scanning mode and a texture+marker point+geometric feature mixed stitching mode.

21. The system according to claim 19, wherein: The user mode module further includes a fourth user mode, The execution module includes: a pattern projector comprising a light source device configured to project a characteristic pattern onto a surface of a scanned object; an image collector comprising one or more cameras configured to acquire a two-dimensional image of the scanned object containing the characteristic pattern; and a controller having a first scanning mode and a second scanning mode, each scanning mode having corresponding scanning configuration parameters, the scanning configuration parameters including at least one of a scanning distance D between the scanning system and the scanned object, a number of marking points Mn, and image information; The controller is configured to, when executing the fourth user mode: Obtaining scanning configuration parameters of the three-dimensional scanning system in a first scanning mode, comparing the scan configuration parameters with a preset threshold, and When the acquired scanning configuration parameters meet the preset threshold, the three-dimensional scanning system is controlled to switch to the second scanning mode to perform three-dimensional scanning on the scanned object.

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