Automatic testing method for secondary system of intelligent substation and related apparatus

Abstract

An automatic testing method for a secondary system of an intelligent substation and a related apparatus, which are applied to a test system consisting of a secondary system test module, a network performance test module, a clock test module, and a virtual simulation module. The method comprises: when an IED under test is tested, setting basic parameters for testing and device parameters of said IED; setting SV and GOOSE parameters of said IED and importing a test file, wherein the test file is generated by means of text editing on the basis of test content of test items, and at the same time, setting test SV and GOOSE channel and hard-wired contact mappings; adjusting the SV and GOOSE parameters and setting values, and testing the test file; and monitoring a test process, analyzing whether a test result meets a preset requirement, obtaining the test result, and generating a test report on the basis of a preset report template. Therefore, the problems of low efficiency and poor reliability in the prior art are solved.

Description

An automated detection method and related device for secondary systems of intelligent substations

[0001] This application claims priority to Chinese Patent Application No. 202411039098.1, filed on July 31, 2024, entitled "An Automated Detection Method and Related Device for Secondary Systems of Intelligent Substations", the entire contents of which are incorporated herein by reference. Technical Field

[0002] This application relates to the field of intelligent substation testing technology, and in particular to an automated testing method and related apparatus for the secondary system of an intelligent substation. Background Technology

[0003] Substations are an indispensable and crucial component of the power system, undertaking the heavy tasks of power conversion and redistribution. Smart substations are a measure to build a digital power grid, in line with the technological development trend of substation digitalization. However, to ensure the reliability of smart substation operation, many problems need to be solved in its testing, commissioning, and operation and maintenance. Among these, the comprehensive testing of the relay protection system of the smart substation is crucial to ensuring its safe and stable operation.

[0004] As the control center of intelligent substations, relay protection plays a crucial role in the safe and reliable operation of these substations. Compared to conventional substations, the input and output forms of relay protection have undergone significant changes. The required switching quantities are transmitted via a network in the form of process-level network data, and the output information after the protection device operates is also sent to the process-level network in the form of digital frames. Upon receiving the command, the intelligent equipment executes the corresponding tripping and closing operations. The digital and networked characteristics of intelligent substations make traditional testing methods insufficient, posing new requirements for testing methods. Currently, the testing of the entire relay protection system is mainly done manually, which is prone to errors and consumes significant manpower and resources. Summary of the Invention

[0005] This application provides an automated detection method and related device for the secondary system of an intelligent substation, which solves the problems of low efficiency and poor reliability in the prior art.

[0006] In view of the above, the first aspect of this application provides an automated detection method for the secondary system of an intelligent substation, the method comprising:

[0007] This system is applied to a testing system consisting of a secondary system testing module, a network performance testing module, a clock testing module, and a virtual simulation module. The secondary system testing module provides testing methods for the IED device under test. The network performance testing module detects the network performance of the IED device under test. The clock testing module provides time synchronization testing schemes and methods for the secondary devices, which include: a substation clock synchronization device, a smart terminal, and a merging unit. The virtual simulation module provides visualization of SCD files and monitoring of protection information.

[0008] The detection methods include:

[0009] When testing the IED device under test, set the basic parameters for testing and the device parameters of the IED device under test;

[0010] Set the SV and GOOSE parameters of the IED device to be tested, and import the test file. The test file is generated by text editing according to the test content of the test project. At the same time, set the test SV and GOOSE channels and hard contact mapping.

[0011] Adjust the parameters and settings of SV and GOOSE, and then test the test file.

[0012] The testing process is monitored, the test results are analyzed to see if they meet the preset requirements, the test results are obtained, and a test report is generated based on the preset report template.

[0013] Optionally, the step of setting the basic parameters for testing and the device parameters of the IED device under test when testing the IED device under test further includes:

[0014] By parsing the SCD file, the information and relationships of the IED device under test are extracted. Combined with the ICD model files of IED devices from different manufacturers and models, as well as the protection configuration information template library, and based on the reference address, the signal description of the IED device under test is automatically matched.

[0015] Optionally, the testing system further includes: a hardware interface module;

[0016] The hardware interface module includes: analog voltage and current inputs and outputs, conventional digital inputs and outputs, an electrical Ethernet interface, an optical Ethernet interface, and a clock synchronization interface.

[0017] Optionally, the testing system further includes: a communication analysis module;

[0018] The communication analysis module includes: parameter setting function, GOOSE sending and receiving function, MMS-client function, MMS-Server function, message analysis function, and communication monitoring function.

[0019] Optionally, the device parameters of the IED device to be tested specifically include:

[0020] SV sampling rate, ASRU project;

[0021] GOOSE interval parameter;

[0022] Contact anti-jitter time and circuit breaker trip delay parameters;

[0023] Types of IED protection devices: line protection, transformer protection, reactor protection, and busbar protection;

[0024] Voltage converter current ratio.

[0025] Optionally, the SV and GOOSE parameters specifically include:

[0026] SV transmission control block and parameters, SV signal type;

[0027] GOOSE sends control blocks and parameters;

[0028] GOOSE receives control blocks and parameters;

[0029] SV and GOOSE transmit optical ports.

[0030] Optionally, the setting of test SV and GOOSE channels and hard contact mapping specifically includes:

[0031] Configure the mapping between the SV channel and the voltage and current displayed on the interface;

[0032] Configure the mapping between the GOOSE channel and the input and output signals displayed on the interface;

[0033] Configure the mapping between hard-connect inputs and outputs;

[0034] Intelligent control box settings.

[0035] A second aspect of this application provides an automated detection system for the secondary system of an intelligent substation, the system comprising:

[0036] The matching unit is used to extract the information and correlation of the IED device under test by parsing the SCD file, and combine the ICD model files of IED devices from different manufacturers and models, as well as the protection configuration information template library, and at the same time, based on the reference address, to realize the automatic matching of the signal description of the IED device under test.

[0037] The first setting unit is used to set the basic parameters for testing and the device parameters of the IED device under test when testing the IED device under test.

[0038] The second setting unit is used to set the SV and GOOSE parameters of the IED device under test, and import the test file. The test file is generated by text editing according to the test content of the test item. At the same time, the test SV and GOOSE channels and hard contact mapping are set.

[0039] The adjustment unit is used to adjust the parameters and settings of SV and GOOSE, and to test the test file.

[0040] The test analysis unit is used to monitor the test process, analyze whether the test results meet the preset requirements, obtain the test results, and generate a test report based on the preset report template.

[0041] A third aspect of this application provides an automated detection device for the secondary system of an intelligent substation, the device comprising a processor and a memory:

[0042] The memory is used to store program code and transmit the program code to the processor;

[0043] The processor is configured to execute the steps of the automated detection method for the secondary system of an intelligent substation as described in the first aspect above, according to the instructions in the program code.

[0044] The fourth aspect of this application provides a computer-readable storage medium for storing program code for executing the automated detection method for the secondary system of an intelligent substation as described in the first aspect.

[0045] As can be seen from the above technical solutions, this application has the following advantages:

[0046] This application provides an automated testing method for the secondary system of an intelligent substation, applied to a testing system consisting of a secondary system testing module, a network performance testing module, a clock testing module, and a virtual simulation module. The testing method includes: setting basic parameters for testing and device parameters for the IED device under test when testing it; setting the SV and GOOSE parameters of the IED device under test and importing a test file, which is generated by text editing based on the test content of the test items; simultaneously setting the test SV and GOOSE channels and hard contact mappings; adjusting the SV and GOOSE parameters and setting values, and testing the test file; monitoring the testing process, analyzing whether the test results meet the preset requirements, obtaining the test results, and generating a test report based on a preset report template. This solves the problems of low efficiency and poor reliability in existing technologies. Attached Figure Description

[0047] Figure 1 is a flowchart illustrating an automated detection method for a secondary system of an intelligent substation provided in an embodiment of this application;

[0048] Figure 2 shows the hardware and software architecture of the test system provided in the embodiments of this application;

[0049] Figure 3 shows the architecture of the SV sampling smart substation test system provided in the embodiments of this application;

[0050] Figure 4 shows the architecture of the analog sampling intelligent station test system provided in the embodiments of this application;

[0051] Figure 5 illustrates the automatic matching of signal descriptions provided in the embodiments of this application;

[0052] Figure 6 illustrates the principle of the automated testing technology for the configuration method provided in the embodiments of this application;

[0053] Figure 7 illustrates the closed-loop automatic testing principle provided in the embodiments of this application;

[0054] Figure 8 is a structural schematic diagram of an automated detection system for a secondary system of an intelligent substation provided in an embodiment of this application. Detailed Implementation

[0055] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0056] Please refer to Figure 1. An automated testing method for the secondary system of an intelligent substation is provided in this embodiment of the application. It is applied to a test system consisting of a secondary system test module, a network performance test module, a clock test module, and a virtual simulation module.

[0057] As shown in Figure 2; the secondary system test module is used to provide test methods for the IED device under test.

[0058] It should be noted that the secondary system testing module provides testing methods for message monitoring and analysis, protection function testing, and virtual circuit checking of IED devices such as relay protection devices, merging units, and intelligent terminals, solving problems encountered in on-site installation, commissioning, and fault diagnosis in smart substations. IED is short for Intelligent Electronic Device. Intelligent Electronic Device, full name: Intelligent Electronic Device, abbreviated as IED.

[0059] The network performance testing module is used to test the network performance of the IED device under test.

[0060] It should be noted that the network performance testing module provides testing methods for network equipment in smart substations, detects the performance indicators of network equipment, and helps to identify and eliminate potential hidden dangers and threats to IED equipment in smart substations as early as possible.

[0061] The clock test module is used to provide time synchronization test schemes and test methods for secondary equipment, including: substation clock synchronization devices, smart terminals, and merging units.

[0062] It should be noted that the clock testing module provides testing solutions and methods for secondary equipment such as substation clock synchronization devices, smart terminals, and merging units, solving the problems of difficult time synchronization and time accuracy testing of field devices.

[0063] The virtual simulation module provides visualization of SCD files and monitoring of protection information, as well as display of the connection relationships and protection device information between various IED devices.

[0064] It should be noted that the SCD file is the core of the intelligent substation configuration file management system. It contains the substation's functional structure, equipment connections, data types, and communication parameters. The virtual simulation module enables the visualization of the SCD file and the monitoring of protection information, and can intuitively display the connection relationships between various IEDs and the relevant information of the protection devices.

[0065] Furthermore, in one embodiment, the test system further includes: a hardware interface module and a communication analysis module;

[0066] The hardware interface module includes: analog voltage and current inputs and outputs, conventional inputs and outputs, electrical Ethernet interface, optical Ethernet interface, and clock synchronization interface.

[0067] The communication analysis module includes: parameter setting function, GOOSE sending and receiving function, MMS-client function, MMS-Server function, message analysis function, and communication monitoring function.

[0068] It should be noted that, as shown in Figure 2, the test system in the specific system development includes: hardware components: hardware interface module testing; and software components: secondary system testing module, network performance testing module, clock testing module, virtual simulation module, and communication analysis module. The specific functions of each module in the software component are shown in Figure 2 and will not be elaborated here. Among them, the MMS-client function and the MMS-Server function are communication functions. Client / Server communication is used for point-to-point data transmission verification in IEC61850 digital substations.

[0069] It should be further noted that the software portion of the aforementioned test system can be applied to the station control layer, bay layer, and process layer of intelligent substations. The architectures of the SV sampling intelligent substation test system and the analog sampling intelligent substation test system are shown in Figures 3 and 4, respectively. GOOSE and SV common-port transmission is a new technology that utilizes a transmission medium (such as optical fiber or cable) for data transmission. The core concept of GOOSE and SV common-port transmission is to share a single transmission medium for GOOSE and SV signals, thereby achieving efficient network transmission. The basic principle of GOOSE and SV common-port transmission is that GOOSE signals can be used to transmit control signals, while SV signals can be used to transmit status signals. In this way, control signals and status signals can be placed in a single transmission medium, thus achieving efficient network transmission.

[0070] The methods include:

[0071] Step 101: When testing the IED device to be tested, set the basic parameters for testing and the device parameters of the IED device to be tested.

[0072] In one embodiment, before step 101, the method further includes: extracting the information and association of the IED device under test by parsing the SCD file, and combining the ICD model files of IED devices from different manufacturers and models, as well as the protection configuration information template library, and simultaneously achieving automatic matching of the signal description of the IED device under test based on the reference address.

[0073] It should be noted that, as shown in Figure 5, by parsing the SCD file to extract IED device information and related relationships, and by matching signals based on reference paths and descriptions, combined with ICD model files of IED devices from different manufacturers and models, a protection device configuration information template library is established to achieve automatic matching and verification of secondary device signal descriptions. The entire process is completed automatically and has high reliability.

[0074] Regarding step 101, it should be noted that in specific implementation, the parameters set in step 101 include: SV sampling rate, ASRU items; GOOSE interval parameters; contact anti-jitter time, circuit breaker tripping delay parameters; protection IED device type; line protection, transformer protection, reactor protection, and bus protection; voltage transformer ratio. Those skilled in the art can set the parameters according to the actual situation, which will not be elaborated here.

[0075] Step 102: Set the SV and GOOSE parameters of the IED device to be tested, and import the test file. The test file is generated by text editing according to the test content of the test project. At the same time, set the test SV and GOOSE channels and hard contact mapping.

[0076] It should be noted that, in specific implementation, the parameters set in step 102 include: SV transmit control block and parameters, SV signal type; GOOSE transmit control block and parameters; GOOSE receive control block and parameters; SV and GOOSE transmit optical ports.

[0077] After setting the above parameters, import the test file. Regarding test file generation, as shown in Figure 6, this application generates test templates through flexible editing, eliminating the need for fixed debugging templates on testing instruments. This ensures that the debugging templates can be applied to different testing purposes and scenarios. Based on possible test items and tasks, the required digital signals are identified and uniformly modeled according to device type, forming an intermediate database with devices as objects. For specific test items or tasks, the key test requirements are identified, analyzing the prerequisites, signal states, and action results to be checked for each specific test sub-item. Then, the corresponding test case configurations are completed using the signals in the intermediate database, ultimately forming complete test cases and generating test files. These test cases are not based on specific SCD file information or fixed algorithms, ensuring the scalability and universality of the test cases.

[0078] Next, configure the test SV and GOOSE channels and hard contact mappings, specifically including: setting the mapping between the SV channel and the voltage and current displayed on the interface; setting the mapping between the GOOSE channel and the input and output terminals displayed on the interface; setting the mapping between the hard contact input and output terminals; and configuring the intelligent control box. Those skilled in the art can configure the parameters according to the actual situation, which will not be elaborated here.

[0079] Step 103: Adjust the parameters and settings of SV and GOOSE, and test the test file.

[0080] It should be noted that the parameters and tuning values ​​of SV and GOOSE need to be adjusted before testing. After the adjustment is completed, the test file is tested.

[0081] Regarding the specific implementation of the testing system, as shown in Figure 7, it is necessary to explain that, based on the MMS server and client, data simulation at the station control layer and process layer is achieved. It can output corresponding analog voltage and current quantities or SMV digital quantities according to the specific test content, and collect SMV, GOOSE digital quantities or trip signals to realize closed-loop testing of protection functions. Test items can be spaced at certain intervals. For each test item, various operations are executed sequentially, and each type of operation has its own execution judgment. After each test item is completed, relevant result information is automatically recorded.

[0082] Step 104: Monitor the testing process, analyze whether the test results meet the preset requirements, obtain the test results, and generate a test report based on the preset report template.

[0083] It should be noted that the testing process is monitored visually; the test results are analyzed to determine whether they meet the requirements; after the test, a test report is generated according to the user-defined report template format, and the test report and test results are managed.

[0084] The above is an automated detection method for the secondary system of an intelligent substation provided in the embodiments of this application. The following is an automated detection system for the secondary system of an intelligent substation provided in the embodiments of this application.

[0085] Please refer to Figure 8. An automated detection system for a smart substation secondary system, as provided in this embodiment, includes:

[0086] The matching unit 201 is used to extract the information and correlation of the IED device under test by parsing the SCD file, and combine the ICD model files of IED devices from different manufacturers and models, as well as the protection configuration information template library, and at the same time, based on the reference address, to realize the automatic matching of the signal description of the IED device under test.

[0087] The first setting unit 202 is used to set the basic parameters for testing and the device parameters of the IED device under test when testing the IED device under test.

[0088] The second setting unit 203 is used to set the SV and GOOSE parameters of the IED device to be tested, and import the test file. The test file is generated by text editing according to the test content of the test item. At the same time, the test SV and GOOSE channels and hard contact mapping are set.

[0089] Adjustment unit 204 is used to adjust the parameters and settings of SV and GOOSE, and to test the test file.

[0090] The test analysis unit 205 is used to monitor the test process, analyze whether the test results meet the preset requirements, obtain the test results, and generate a test report according to the preset report template.

[0091] Furthermore, this application embodiment also provides an automated detection device for the secondary system of an intelligent substation, the device including a processor and a memory:

[0092] The memory is used to store program code and transmit the program code to the processor;

[0093] The processor is used to execute the steps of the automated detection method for the secondary system of an intelligent substation as described in the above method embodiments, according to the instructions in the program code.

[0094] Furthermore, this application embodiment also provides a computer-readable storage medium for storing program code for executing the methods described in the above method embodiments.

[0095] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the system and unit described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0096] The terms “first,” “second,” “third,” “fourth,” etc. (if present) in the specification and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented, for example, in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0097] It should be understood that in this application, "at least one (item)" means one or more, and "more than" means two or more. "And / or" is used to describe the relationship between related objects, indicating that three relationships can exist. For example, "A and / or B" can represent three cases: only A exists, only B exists, and both A and B exist simultaneously, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one (item) of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one (item) of a, b, or c can represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0098] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection between apparatuses or units through some interfaces, and may be electrical, mechanical, or other forms.

[0099] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0100] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0101] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes: USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, optical disks, and other media capable of storing program code.

[0102] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. An automated detection method for the secondary system of an intelligent substation, characterized in that, Be applied to the test system that constitutes by secondary system test module, network performance test module, clock test module and virtual simulation module, wherein, the secondary system test module, for providing test means to the IED device to be tested, the network performance test module, for detecting the network performance of the IED device to be tested, the clock test module, for providing the secondary device with time test scheme and test means, the secondary device includes: substation clock synchronization device, intelligent terminal, merging unit, the virtual simulation module, for providing the visual display of SCD file and protection information monitoring function; The detection method comprises: When testing the IED device to be tested, set the basic parameters for testing and the device parameters of the IED device to be tested; Set the SV and GOOSE parameters of the IED device to be tested, and import the test file, the test file is generated by text editing according to the test content of the test project, at the same time, set the test SV and GOOSE channel and hard point mapping; Adjust the parameters and setting value of SV and GOOSE, and test the test file; Monitor the test process, analyze whether the test result meets the preset requirement, obtain the test result and generate the test report according to the preset report template.

2. The method of claim 1, wherein, Before the setting basic parameters for testing and the device parameters of the IED device to be tested when testing the IED device to be tested, it further comprises: Extract the IED device information and associated relationship of the IED device to be tested by analyzing the SCD file, and combine the ICD model file of IED device of different manufacturers and different models, and the protection configuration information template library, and realize the automatic matching of signal description of the IED device to be tested based on the reference address.

3. The method of claim 1, wherein, The test system further comprises a hardware interface module. The hardware interface module comprises analog voltage and current, conventional input and output, Ethernet interface, optical Ethernet interface and clock synchronization interface.

4. The method of claim 3, wherein, The test system further comprises a communication analysis module. The communication analysis module comprises parameter setting function, GOOSE sending and receiving function, MMS-client function, MMS-Server function, message analysis function and communication monitoring function.

5. The method of claim 4, wherein, The device parameters of the IED device to be tested specifically comprise: SV sampling rate, ASRU project; GOOSE interval parameter; Contact anti-shake time, circuit breaker tripping delay parameter; Protection IED device type; Line protection, transformer protection, reactor protection and bus protection; Voltage conversion ratio.

6. The method of claim 4, wherein, The SV and GOOSE parameters specifically comprise: SV sending control block and parameter, SV signal type; GOOSE sending control block and parameter; GOOSE receiving control block and parameter; SV, GOOSE sending optical port.

7. The method of claim 4, wherein the method further comprises: The setting test SV and GOOSE channel and hard point mapping specifically comprises: Set the mapping between the voltage and current of the interface display and the SV channel; Set the mapping between the input and output of the interface display and the GOOSE channel; Set the mapping between the hard point input and output; Intelligent control box settings.

8. An intelligent substation secondary system automation detection system, characterized in that, include: The matching unit is used to extract the information and correlation of the IED device under test by parsing the SCD file, and combine the ICD model files of IED devices from different manufacturers and models, as well as the protection configuration information template library, and at the same time, based on the reference address, to realize the automatic matching of the signal description of the IED device under test. The first setting unit is used to set the basic parameters for testing and the device parameters of the IED device under test when testing the IED device under test. The second setting unit is used to set the SV and GOOSE parameters of the IED device under test, and import the test file. The test file is generated by text editing according to the test content of the test item. At the same time, the test SV and GOOSE channels and hard contact mapping are set. The adjustment unit is used to adjust the parameters and settings of SV and GOOSE, and to test the test file. The test analysis unit is used to monitor the test process, analyze whether the test results meet the preset requirements, obtain the test results, and generate a test report based on the preset report template.

9. An intelligent substation secondary system automation detection device, characterized in that, The device includes a processor and a memory: The memory is used to store program code and transmit the program code to the processor; The processor is used to execute the automated detection method for the secondary system of an intelligent substation according to any one of the instructions in the program code.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium is used to store program code for executing the automated detection method for the secondary system of an intelligent substation as described in any one of claims 1-7.

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