Defect detection method and apparatus, computer device, and storage medium

By constructing an AI-based defect detection model, defects on the inner wall of pin holes can be automatically detected, solving the problems of low efficiency and low accuracy in existing technologies. This achieves efficient and accurate defect detection and improves the safety of nuclear power plants.

WO2026044961A1 Publication Date: 2026-03-05CHINA GENERAL NUCLEAR POWER OPERATION +1
6 Cites 5 Cited by

Patent Information

Application Number
PCT/CN2024/134907
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-08-26
Filing Date
2024-11-27
Publication Date
2026-03-05

AI Technical Summary

Technical Problem

In existing technologies, the detection efficiency and accuracy of pin hole defects corresponding to the cotter pin of the control rod guide cylinder are low, and they mainly rely on manual operation.

Method used

An artificial intelligence-based defect detection method is adopted. By acquiring training sample data, a defect region extraction model and an image defect detection model are constructed and jointly trained to generate a target defect detection model for automated detection of defects on the inner wall of pin holes.

Benefits of technology

This significantly improves the efficiency and accuracy of pin hole inner wall defect detection, ensures the quality status of the control rod during the insertion of the guide tube, and enhances the reliability and safety of nuclear power plants.

✦ Generated by Eureka AI based on patent content.
Patent Text Reader

Abstract

Embodiments of the present application relate to the technical field of defect detection, and provide a defect detection method and apparatus, a computer device, and a storage medium. The method comprises: acquiring training sample data; performing extraction on a sample defect image on the basis of a defect region extraction model to obtain a sample defect positioning image; performing detection on the sample defect positioning image on the basis of an image defect detection model to obtain a sample detection result; calculating a first loss value on the basis of sample defect mask data and predicted defect mask data, and calculating a second loss value on the basis of a sample defect category, a predicted defect category, a sample bounding box and a predicted bounding box, so as to determine a model loss value; updating model parameters of the defect region extraction model and the image defect detection model on the basis of the model loss value, so as to construct a target defect detection model; and performing detection on a target detection image on the basis of the target defect detection model to obtain a target detection result. The embodiments of the present application can improve the defect detection efficiency and accuracy of objects to be detected.
Need to check novelty before this filing date? Find Prior Art