Measurement device

Abstract

A measurement device (10) is provided with: a measurement unit capable of measuring the electrical characteristics of an electronic component (100) to be measured by coming into contact with the electronic component (100); a drive unit (40) capable of supporting and moving the measurement unit; a displacement sensor (50) capable of detecting a change in the position of the measurement unit; and a control unit (60) for acquiring the change in the position detected by the displacement sensor (50). The control unit (60) is capable of executing a process for calculating the movement speed of the measurement unit on the basis of the change in the position.

Description

Measuring equipment

[0001] The present disclosure relates to a measurement device.

[0002] The measuring device described in Patent Document 1 includes a holder, a drive unit, and a measurement unit. The holder has an opening. The holder can hold an electronic component so that a specific surface of the electronic component is exposed from the opening. The drive unit is generally rod-shaped. The drive unit is rotatable around a drive shaft. The measurement unit is connected to one end of the drive unit. The measurement unit rotates together with the drive unit as the drive unit rotates. The opening of the holder is located on the rotation trajectory of the measurement unit. When the drive unit rotates, the measurement unit comes into contact with the electronic component held by the holder. In this state, the measuring device can measure the electrical characteristics of the electronic component.

[0003] Japanese Patent Application Laid-Open No. 2001-201540

[0004] In a measuring device such as that described in Patent Document 1, when a measuring unit measures the electrical characteristics of an electronic component, the measuring unit collides with the electronic component. Depending on the magnitude of the impact force, there is a risk of cracks, breaks, chips, etc. occurring in the electronic component. However, if the time the measuring unit is in contact with the electronic component is short, it is difficult to accurately calculate the impact force.

[0005] In order to solve the above problems, the present disclosure provides a measuring device comprising: a measuring unit capable of measuring the electrical characteristics of an electronic component by contacting the electronic component to be measured; a driving unit supporting the measuring unit and capable of moving the measuring unit; a displacement sensor capable of detecting a change in position of the measuring unit; and a control unit acquiring the change in position detected by the displacement sensor, wherein the control unit is capable of executing a process to calculate the movement speed of the measuring unit based on the change in position.

[0006] The impact that the measuring part exerts on electronic components can be compared.

[0007] Fig. 1 is a schematic diagram of the measuring device, and Fig. 2 is a flowchart of the process performed by the control unit.

[0008] <One embodiment of the measuring device> One embodiment of the measuring device will be described below. Note that the drawings are schematic diagrams for ease of understanding, and components may be enlarged or omitted. Therefore, the dimensional ratios of the components may differ from those of the actual components.

[0009] (Overall Configuration) As shown in FIG. 1, the measuring device 10 includes a holding unit 20, a first measuring unit 30A, a second measuring unit 30B, a driving unit 40, a displacement sensor 50, and a control unit 60.

[0010] The holding unit 20 is shaped like a roughly rectangular box. That is, the holding unit 20 has a hollow space inside. The holding unit 20 is fixed to the floor or the like of a factory via a support member (not shown). Hereinafter, the direction in which the floor or the like is positioned relative to the holding unit 20, i.e., the direction of gravity, is referred to as the downward direction DD. The direction opposite to the downward direction DD is referred to as the upward direction UD. The holding unit 20 has an opening 21 facing the downward direction DD. The electronic component 100 to be measured is stored inside the holding unit 20. The holding unit 20 also holds the electronic component 100 so that it does not move.

[0011] The electronic component 100 is, for example, a multilayer inductor component. The electronic component 100 includes an element body 101, a first external electrode 110, and a second external electrode 111. The element body 101 is substantially rectangular. Of the outer surfaces of the element body 101, a specific surface is defined as a mounting surface 102, and a specific surface substantially perpendicular to the mounting surface 102 is defined as a first end surface 103. Furthermore, a surface substantially parallel to the first end surface 103 is defined as a second end surface 104. The first external electrode 110 is an L-shaped electrode that covers a portion of the first end surface 103 and a portion of the mounting surface 102. The second external electrode 111 is an L-shaped electrode that covers a portion of the second end surface 104 and a portion of the mounting surface 102. Although not shown, the first external electrode 110 and the second external electrode 111 are electrically connected by wiring extending inside the element body 101.

[0012] The electronic component 100 is held by the holding portion 20 so that the mounting surface 102 faces downward direction DD. When the electronic component 100 is held by the holding portion 20, the first external electrode 110 and the second external electrode 111 are exposed to the outside of the holding portion 20 through the opening 21 of the holding portion 20.

[0013] First measuring unit 30A is located in downward direction DD of opening 21 of holding unit 20. More specifically, first measuring unit 30A is located in downward direction DD of first external electrode 110 when electronic component 100 is held by holding unit 20. First measuring unit 30A includes first housing 31A, first buffer unit 32A, and first measurement terminal 33A.

[0014] The first housing 31A is substantially cylindrical. Therefore, the first housing 31A has a hollow space inside. The end of the first housing 31A on the upward direction UD side is open. The end of the first housing 31A on the downward direction DD side is closed. Note that the first housing 31A is indicated by a two-dot chain line in FIG. 1 .

[0015] The first buffer 32A is a so-called helical spring and is stored inside the first housing 31A. The end of the first buffer 32A on the downward direction DD side is connected to the end of the first housing 31A on the downward direction DD side inside the first housing 31A.

[0016] The first measurement terminal 33A is rod-shaped. One end of the first measurement terminal 33A is inserted through an opening in the first housing 31A. In other words, a portion of the first measurement terminal 33A, including one end, is covered by the first housing 31A. This end of the first measurement terminal 33A is connected to the end of the first buffer section 32A on the upward direction UD side inside the first housing 31A. Therefore, the first measurement terminal 33A can move relative to the first housing 31A in the upward direction UD and downward direction DD as the first buffer section 32A expands and contracts. The other end of the first measurement terminal 33A is pointed. This end of the first measurement terminal 33A faces the upward direction UD. In other words, this end of the first measurement terminal 33A faces the opening 21 of the holding section 20. The first measurement terminal 33A is made of a conductive metal. The first measurement terminal 33A is brought into contact with the electronic component 100 to be measured, thereby enabling measurement of the electrical characteristics of the electronic component 100. Note that the first housing 31A may be connected to a measuring instrument or the like via a cable or the like in order to measure the desired electrical characteristics.

[0017] Second measurement unit 30B is located in downward direction DD of opening 21 of holding unit 20. More specifically, second measurement unit 30B is located in downward direction DD of second external electrode 111 when electronic component 100 is held by holding unit 20. Second measurement unit 30B includes second housing 31B, second buffer unit 32B, and second measurement terminal 33B.

[0018] The second housing 31B is generally cylindrical. Therefore, the interior of the second housing 31B is hollow. The end of the second housing 31B on the upward direction UD side is open. The end of the second housing 31B on the downward direction DD side is closed. Note that the second housing 31B is indicated by a two-dot chain line in FIG. 1 .

[0019] The second buffer portion 32B is a so-called helical spring and is stored inside the second housing 31B. The end of the second buffer portion 32B on the downward direction DD side is connected to the end of the second housing 31B on the downward direction DD side inside the second housing 31B.

[0020] The second measurement terminal 33B is rod-shaped. One end of the second measurement terminal 33B is inserted into an opening in the second housing 31B. In other words, a portion of the second measurement terminal 33B, including its one end, is covered by the second housing 31B. This end of the second measurement terminal 33B is connected to the end of the second buffer section 32B on the upward direction UD side inside the second housing 31B. Therefore, the second measurement terminal 33B can move relative to the second housing 31B in the upward direction UD and downward direction DD as the second buffer section 32B expands and contracts. The other end of the second measurement terminal 33B is pointed. This end of the second measurement terminal 33B faces the upward direction UD. In other words, this end of the second measurement terminal 33B faces the opening 21 of the holding section 20. The second measurement terminal 33B is made of a conductive metal. The second measurement terminal 33B is brought into contact with the electronic component 100 to be measured, thereby enabling measurement of the electrical characteristics of the electronic component 100. Note that the second housing 31B may be connected to a measuring instrument or the like via a cable or the like in order to measure the desired electrical characteristics.

[0021] The drive unit 40 supports the first measurement unit 30A and the second measurement unit 30B. The drive unit 40 can move the first measurement unit 30A and the second measurement unit 30B in accordance with the rotation of the attachment unit 43. Specifically, the drive unit 40 includes a drive shaft 41, an actuator 42, and an attachment unit 43.

[0022] The drive shaft 41 is fixed to the floor of a factory or the like via a support member (not shown). The drive shaft 41 is connected to an actuator 42 such as a servo motor. Therefore, the drive shaft 41 can be rotated by the torque from the actuator 42.

[0023] The mounting portion 43 is generally rod-shaped. One end of the mounting portion 43 is connected to the drive shaft 41. Therefore, the mounting portion 43 can rotate around the drive shaft 41 as a rotation axis. The first measuring unit 30A is connected to the other end of the mounting portion 43. The second measuring unit 30B is connected to the other end of the mounting portion 43, closer to the drive shaft 41 than the first measuring unit 30A. Therefore, the first measuring unit 30A and the second measuring unit 30B can rotate together with the mounting portion 43 around the drive shaft 41 as a rotation axis. Then, suppose that the mounting portion 43 rotates so that the other end of the mounting portion 43 approaches the holding portion 20. At this time, the first measuring terminal 33A of the first measuring unit 30A contacts the first external electrode 110 of the electronic component 100. The second measuring terminal 33B of the second measuring unit 30B contacts the second external electrode 111 of the electronic component 100.

[0024] The displacement sensor 50 is fixed to the factory floor or the like via a support member (not shown). The displacement sensor 50 is located on the upward direction UD side relative to the mounting portion 43. The displacement sensor 50 is, for example, a laser displacement meter. The displacement sensor 50 can detect a change in distance from the mounting portion 43 as a position change of the mounting portion 43. As described above, the first measurement unit 30A and the second measurement unit 30B are attached to the mounting portion 43. Therefore, the displacement sensor 50 can detect position changes of the first measurement unit 30A and the second measurement unit 30B by detecting a position change of the mounting portion 43. Note that, hereinafter, the term "position of the first measurement unit 30A" refers to a portion of the first measurement unit 30A whose relative position with respect to the mounting portion 43 does not change, specifically, the position of the first housing 31A. The same applies to the second measurement unit 30B.

[0025] Depending on the mounting position of the displacement sensor 50, the detected position change may deviate from the position change of the first measurement unit 30A and the position change of the second measurement unit 30B. For example, assume that the location where the displacement sensor 50 detects the position is closer to the drive shaft 41 than the first measurement unit 30A and the second measurement unit 30B. In this case, the position change of the mounting unit 43 detected by the displacement sensor 50 will be smaller than the position change of the first measurement unit 30A and the position change of the second measurement unit 30B. In this case, the distances from the drive shaft 41 of the first measurement unit 30A, the second measurement unit 30B, and the displacement sensor 50 are measured in advance. Then, by multiplying these distances by a correction value according to the distances, the position change of the mounting unit 43 detected by the displacement sensor 50 can be converted into the position change of the first measurement unit 30A and the position change of the second measurement unit 30B. In this way, the displacement sensor 50 may indirectly measure the positions of the first measurement unit 30A and the second measurement unit 30B rather than directly.

[0026] The control unit 60 is stored in a housing or the like (not shown). The control unit 60 includes a storage unit 61 and an execution unit 62. The storage unit 61 stores various programs and measurement data (described later). One of the programs is a program for executing a process for determining a moving speed (described later). Note that the storage unit 61 here includes a volatile storage device such as a RAM and a non-volatile storage device such as a hard disk. The execution unit 62 executes predetermined processes based on the various programs stored in the storage unit 61. Note that, hereinafter, the execution of various processes by the execution unit 62 may be described as control by the control unit 60.

[0027] The control unit 60 can control the rotation angle, rotation speed, etc. of the attachment unit 43. Specifically, the control unit 60 can control the rotation of the drive unit 40 by controlling the actuator 42. The control unit 60 can acquire the position change of the attachment unit 43 detected by the displacement sensor 50. The control unit 60 can then acquire the position changes of the first measurement unit 30A and the second measurement unit 30B based on the position change. The control unit 60 can at least measure the position before and after the tip of the first measurement terminal 33A on the upward direction UD side comes into contact with the first external electrode 110 of the electronic component 100.

[0028] The control unit 60 can acquire the measurement results of the electrical characteristics of the electronic component 100 measured by the first measurement terminal 33A and the second measurement terminal 33B as measurement data. The control unit 60 can also store in the memory unit 61 the electronic component 100 whose electrical characteristics have been measured by each measurement unit and the measurement data relating to the measurement results of the electrical characteristics of the electronic component 100 in association with each other.

[0029] The control unit 60 can execute a process to calculate the movement speed of the first measuring unit 30A based on the position change of the first measuring unit 30A. Specifically, the control unit 60 acquires the position change of the first measuring unit 30A from the displacement sensor 50. Next, the control unit 60 acquires the movement time required for the position change of the first measuring unit 30A. The control unit 60 calculates the movement speed by dividing the position change by the movement time. The position change is, for example, several hundred micrometers. The movement time is several microseconds to several milliseconds. Using a similar method, the control unit 60 can execute a process to calculate the movement speed of the second measuring unit 30B based on the position change of the second measuring unit 30B. The calculation of these movement speeds is executed each time the electrical characteristics of the electronic component 100 are measured.

[0030] (Processing Based on Movement Speed) Each time the control unit 60 calculates the movement speed of the first measuring unit 30A and the second measuring unit 30B, the control unit 60 executes a process of determining the movement speed based on the calculated movement speed. Note that the control unit 60 executes this process for each of the movement speeds of the first measuring unit 30A and the second measuring unit 30B.

[0031] As shown in FIG. 2 , after calculating the moving speed, the control unit 60 performs the process of step S10. In step S10, the control unit 60 determines whether the moving speed is greater than a first stop threshold, which is a predetermined threshold. The first stop threshold is determined as a moving speed value at which damage to the electronic component 100 may occur when each measuring unit collides with the electronic component 100 at the moving speed of the first stop threshold. The first stop threshold is determined in advance, for example, through various experiments, simulations, etc. The value of the first stop threshold is stored in advance in the storage unit 61. If the moving speed is greater than the first stop threshold (S10: YES), the control unit 60 performs the process of step S11.

[0032] In step S11, the control unit 60 stops the operation of the measuring device 10. Specifically, the control unit 60 stops the operation of the drive unit 40 by stopping the actuator 42. Note that stopping the operation of the drive unit here means that the drive unit 40 does not operate and remains stopped until, for example, a process to manually return the measuring device 10 to operation is performed. Thereafter, the control unit 60 ends the process of determining the movement speed.

[0033] In step S10, if the movement speed is equal to or less than the first stop threshold (S10: NO), the control unit 60 executes the process of step S12. In step S12, the control unit 60 determines whether the movement speed is greater than the second stop threshold. The second stop threshold is set as a value less than the first stop threshold. For example, the second stop threshold is a value that is several percent to several tens of percent smaller than the first stop threshold. The value of the first stop threshold is stored in advance in the storage unit 61. If the movement speed is greater than the second stop threshold (S12: YES), the control unit 60 executes the process of step S13.

[0034] In step S13, the control unit 60 determines whether the number of times the moving speed exceeds the second stop threshold exceeds a predetermined number of times within a predetermined period. The predetermined period is, for example, the period immediately preceding 100 reciprocations between the top dead center and the bottom dead center of the first measuring unit 30A and the second measuring unit 30B. The predetermined number of times is determined as a predetermined ratio of the number of measurements within the predetermined period. Therefore, for example, it is assumed that the electrical characteristics of the electronic component 100 are measured 100 times during 100 reciprocations between the top dead center and the bottom dead center of the measuring unit. In this case, the predetermined period is the period of 100 reciprocations. If the predetermined number of times is 60%, then it is 60 times. The values ​​of the predetermined period and the predetermined number of times are stored in the memory unit 61 in advance. Here, the top dead center of the first measuring unit 30A refers to the position furthest upward in the UD direction within the range of movement of the first measuring unit 30A. The bottom dead center of the first measuring unit 30A refers to the position furthest downward in the direction DD within the range of movement of the first measuring unit 30A. This also applies to the second measuring unit 30B.

[0035] In the process of step S13, if the number of times that the movement speed exceeds the second stop threshold within a specified period exceeds a specified number of times (S13: YES), the control unit 60 executes the process of step S11. That is, the control unit 60 stops the actuator 42, thereby stopping the drive unit 40. If the number of times that the movement speed exceeds the second stop threshold within a specified period is equal to or less than the specified number of times (S13: NO), the control unit 60 executes the process of step S15, which will be described later.

[0036] If the moving speed is equal to or less than the second stop threshold in step S12 (S12: NO), the control unit 60 executes the process of step S14. In step S14, the control unit 60 determines whether the moving speed is greater than the sorting threshold. The sorting threshold is set as a value less than the second stop threshold. The value of the sorting threshold is stored in advance in the storage unit 61. If the moving speed is greater than the sorting threshold (S14: YES), the control unit 60 executes the process of step S15.

[0037] In step S15, control unit 60 stores data indicating that the moving speed is greater than the sorting threshold value as part of the measurement data of electronic component 100 whose electrical characteristics have been measured, in storage unit 61. After executing the process of step S15, control unit 60 executes the process of step S16.

[0038] The data stored in memory unit 61 in step S15 is output to a control device or the like of the sorting device (not shown). The sorting device sorts the electronic components 100 based on the data. Specifically, the electronic components 100 whose electrical characteristics have been measured by holding unit 20 are placed on a linear feeder or the like of the sorting device. The electronic components 100 on the linear feeder are transported along a predetermined conveying line. Of the electronic components 100 on the linear feeder, those associated with data indicating that their moving speed is greater than the sorting threshold are removed from the conveying line by air blowing or the like from the sorting device. In other words, the electronic components 100 associated with data indicating that their moving speed is greater than the sorting threshold are sorted out as defective products.

[0039] 2, in step S16, the control unit 60 controls the drive unit 40 so as to slow down the movement speed of the drive unit 40. Specifically, the control unit 60 controls the average voltage applied to the actuator 42 connected to the drive unit 40. The smaller the average voltage, the lower the rotation speed of the actuator 42. In other words, the movement speed of the drive unit 40 becomes slower. For example, when power is supplied to the actuator 42 as a PWM signal, the control unit 60 reduces the on-duty ratio of the PWM signal.

[0040] When slowing down the movement speed of the drive unit 40, the control unit 60 controls the drive unit 40 so that the movement speed of the drive unit 40 is equal to or less than a correction threshold value, which will be described later. At this time, the control unit 60 reduces the movement speed by a larger amount the greater the movement speed of the drive unit 40 relative to the correction threshold value. After executing the process of step S16, the control unit 60 ends the movement speed determination process.

[0041] In step S14, if the moving speed is equal to or less than the selection threshold (S14: NO), the control unit 60 executes the process of step S17. In step S17, the control unit 60 determines whether the moving speed is greater than the switching threshold. The switching threshold is set as a value less than the selection threshold. The value of the switching threshold is stored in advance in the storage unit 61. If the moving speed is greater than the switching threshold (S17: YES), the control unit 60 executes the process of step S18.

[0042] In step S18, control unit 60 stores data indicating that the moving speed is greater than the switching threshold value in storage unit 61 as part of the measurement data of electronic component 100 whose electrical characteristics have been measured. After executing the process of step S18, control unit 60 executes the process of step S16 described above.

[0043] The data stored in the memory unit 61 in step S18 is output to the control equipment of the sorting device, etc. Among the electronic components 100 on the conveying line of the sorting device, those associated with data indicating that the moving speed is greater than the switching threshold are collected to a predetermined location by air blowing, etc. The collected electronic components 100 are subjected to a visual inspection. In other words, the electronic components 100 associated with data indicating that the moving speed is greater than the switching threshold are subjected to an additional inspection to re-determine whether they are good or bad.

[0044] In step S17, if the moving speed is equal to or less than the switching threshold (S17: NO), the control unit 60 executes the process of step S19. In step S19, the control unit 60 determines whether the moving speed is greater than the correction threshold. The correction threshold is set as a value less than the switching threshold. The value of the correction threshold is stored in advance in the storage unit 61. If the moving speed is greater than the correction threshold (S19: YES), the control unit 60 executes the process of step S16 described above. On the other hand, if the moving speed is equal to or less than the correction threshold (S19: NO), the control unit 60 ends the series of processes.

[0045] (Operation of this embodiment) In the above embodiment, the control unit 60 can execute a process to calculate the moving speed of each measurement unit based on the position change of each measurement unit. Then, a predetermined judgment process is performed by comparing the moving speed with a threshold value. Here, the impact force that each measurement terminal applies to the electronic component 100 is calculated using the following (Equation 1). Here, F is the impact force. m is the mass of the measurement terminal. v1 is the moving speed of the measurement terminal. v2 is the moving speed at which the measurement terminal stops after contact with the electronic component 100, and is 0. t1 is the time when the measurement terminal comes into contact with the electronic component 100 at moving speed v1. t2 is the time when the moving speed of the measurement terminal becomes v2.

[0046] F = m × (v1 - v2) / (t1 - t2) ... (Equation 1) In the above equation (1), the time (t1 - t2), i.e., the time from when the measurement terminal contacts electronic component 100 until it stops, is a smaller value than the value of the movement time when calculating the movement speed of the measurement terminal. Therefore, in the above equation (1), F has a large value. Furthermore, the value of F changes significantly with slight changes in the values ​​of t1 and t2. Therefore, calculating the impact force using equation (1) and then comparing the impact force with a predetermined threshold value is inappropriate from the perspective of accurately determining the magnitude of the impact force.

[0047] In the above (Equation 1), the value of v2 is 0, so the impact force is proportional to v1. Therefore, in this configuration, by calculating the moving speed of the measurement terminal, it is possible to indirectly handle the impact force that the measurement terminal applies to electronic component 100.

[0048] (Effects of this embodiment) The above embodiment provides the following effects (1) to (5). Note that although the following describes the effects of the first measurement unit 30A, the same effects can also be obtained with the second measurement unit 30B.

[0049] (1) In the above embodiment, the control unit 60 can execute a process of calculating the moving speed of the first measuring unit 30A based on the change in position of the first measuring unit 30A. This allows the control unit 60 to accurately, albeit indirectly, grasp the magnitude of the impact force that the first measuring terminal 33A applies to the electronic component 100 in the form of the moving speed of the first measuring unit 30A.

[0050] (2) In the above embodiment, when the movement speed of the first measuring unit 30A is greater than the first stop threshold, the control unit 60 stops the operation of the drive unit 40. If the movement speed is greater than the first stop threshold, there is a possibility that some abnormality has occurred in the drive unit 40, and if measurement is continued in this state, there is a risk of damage to the electronic component 100 being measured. In such a case, the control unit 60 stops the operation of the drive unit 40, thereby preventing cracks, breaks, and chips from occurring in the electronic component 100.

[0051] (3) In the above embodiment, if the number of times the movement speed of the first measuring unit 30A exceeds the second stop threshold exceeds a predetermined number of times within a predetermined period, the control unit 60 stops the operation of the drive unit 40. If the movement speed is greater than the second stop threshold, this may indicate an abnormality in the drive unit 40 or an accidental increase in the operating speed of the drive unit 40. If an abnormality occurs in the drive unit 40, the number of times the movement speed exceeds the second stop threshold is likely to exceed the predetermined number. Therefore, with this configuration, if the operating speed of the drive unit 40 accidentally increases, the control unit 60 does not need to immediately stop the drive unit 40. On the other hand, if an abnormality occurs in the drive unit 40, the control unit 60 can stop the drive unit 40.

[0052] (4) In the above embodiment, if the moving speed is greater than the sorting threshold, the control unit 60 stores data indicating that the moving speed is greater than the sorting threshold in the memory unit 61 as measurement data for the electronic component 100 whose electrical characteristics have been measured. Electronic components 100 measured when the moving speed is greater than the sorting threshold may have cracks, breaks, or chips due to the impact of contact with the first measuring unit 30A. Therefore, by associating data indicating that the moving speed is greater than the sorting threshold with the measurement data, it is possible to exclude electronic components 100 associated with the measurement data or perform a visual inspection.

[0053] (5) In the above embodiment, when the movement speed of first measuring unit 30A is greater than the correction threshold, control unit 60 changes the operation of drive unit 40 so that the movement speed is equal to or less than the correction threshold. This reduces the impact that first measuring unit 30A imparts to electronic component 100. Furthermore, even if the movement speed of first measuring unit 30A gradually increases for some reason, the movement speed of first measuring unit 30A can be maintained at or less than the correction threshold.

[0054] <Modifications> The above embodiment can be modified as follows: The above embodiment and the following modifications can be combined with each other within the scope of technical compatibility.

[0055] In the above embodiment, the opening 21 of the holding unit 20 does not have to face the downward direction DD. For example, the opening 21 of the holding unit 20 may face the upward direction UD, or may face a direction intersecting the downward direction DD. Note that, for example, when the opening 21 of the holding unit 20 faces the upward direction UD, the first measurement unit 30A and the second measurement unit 30B only need to be located on the upward direction UD side of the holding unit 20. In this way, the positional relationship between the first measurement unit 30A and the second measurement unit 30B can be adjusted depending on the orientation of the opening 21 of the holding unit 20.

[0056] In the above embodiment, the measuring device 10 does not need to include the holding unit 20. For example, the measuring device 10 may be an instrument that measures the electrical characteristics of the electronic component 100 placed on a linear feeder of a conveying device or the like.

[0057] In the above embodiment, the measuring device 10 only needs to include at least one measuring unit. That is, the measuring device 10 does not need to include the second measuring unit 30B, or may include three or more measuring units. The number of measuring units in the measuring device 10 may be changed as appropriate depending on the type of electronic component 100 to be measured, the measured characteristics, etc.

[0058] The shape of each component of the first measurement unit 30A can be changed as appropriate. For example, the first housing 31A is not limited to a substantially cylindrical shape, but may be a substantially rectangular tube shape or other shapes. The shape of the first measurement terminal 33A is also not limited to a rod shape. For example, if the first housing 31A is a rectangular tube shape, the first measurement terminal 33A may be a rectangular pillar shape corresponding to the shape of the first housing 31A. This also applies to the second measurement unit 30B.

[0059] The configuration of the first measuring unit 30A is not limited to the example of the above embodiment. For example, the first measuring unit 30A does not have to include the first buffer unit 32A. The end of the first measuring unit 30A on the upward direction UD side does not have to be sharp. This also applies to the second measuring unit 30B.

[0060] The first measuring unit 30A may not include the first housing 31A and the first buffer unit 32A, and the first measuring terminal 33A may be directly fixed to the holding unit 20. In this case, it is preferable to select a material for the first measuring terminal 33A so that the first measuring terminal 33A can bend when it comes into contact with the electronic component 100. This also applies to the second measuring unit 30B.

[0061] The configuration of the drive unit 40 is not limited to the example of the above embodiment. For example, the drive unit 40 may be a mechanism that moves linearly in the upward direction UD and the downward direction DD instead of a rotating type. The displacement sensor 50 is not limited to the example of the above embodiment. The displacement sensor 50 is not limited to those that detect positional changes of the measurement unit in a non-contact manner, such as laser, magnetic, or camera imaging. For example, the displacement sensor 50 may be an inertial sensor fixed to the mounting portion 43.

[0062] The control unit 60 only needs to be able to execute a process for calculating the movement speed of the measurement unit based on at least a change in position. Therefore, the control unit 60 does not need to be able to execute a process for determining the movement speed, and the control unit 60 does not need to be able to control the drive unit 40. The control unit 60 may also be composed of multiple IC chips, etc.

[0063] The control unit 60 may execute the series of processes in steps S10 to S19 based on the average value of the movement speed of the first measuring unit 30A and the movement speed of the second measuring unit 30B. Alternatively, the control unit 60 may execute the series of processes for only one of the movement speed of the first measuring unit 30A and the movement speed of the second measuring unit 30B.

[0064] When the movement speed is greater than the first stop threshold, the control unit 60 may perform processing to notify the user, etc., in conjunction with stopping the operation of the drive unit 40. In this case, the notification method may include lighting a warning lamp, sound warning, or text or image warning on the display.

[0065] The control unit 60 may not stop the operation of the drive unit 40 when the movement speed is greater than the first stop threshold. Also, the control unit 60 may not stop the operation of the drive unit 40 when the number of times the movement speed becomes greater than the second stop threshold exceeds a predetermined specified number of times within a predetermined specified period. For example, the measuring device 10 may display a warning message, and the user of the measuring device 10 may stop the device.

[0066] When the moving speed is greater than the sorting threshold, the control unit 60 may not store data indicating that the moving speed is greater than the sorting threshold as measurement data of the electronic component 100 whose electrical characteristics have been measured in the storage unit 61. For example, after making this determination (S14: YES), the measuring device 10 may immediately remove the electronic component 100 without storing the measurement data.

[0067] When the movement speed is greater than the correction threshold, the control unit 60 does not need to change the operation of the drive unit 40 so that the movement speed is equal to or less than the correction threshold. In other words, the processes of steps S19 and S16 may be omitted.

[0068] <Supplementary Notes> The technical ideas that can be understood from the above embodiments and modified examples will be described below. [1] A measuring device comprising: a measuring unit capable of measuring electrical characteristics of an electronic component by contacting the electronic component to be measured; a drive unit supporting the measuring unit and capable of moving the measuring unit; a displacement sensor capable of detecting a change in position of the measuring unit; and a control unit acquiring the change in position detected by the displacement sensor, wherein the control unit is capable of executing a process of calculating a moving speed of the measuring unit based on the change in position.

[0069] [2] The measurement device according to [1], wherein the control unit stops the operation of the drive unit when the movement speed is greater than a predetermined stop threshold. [3] The measurement device according to [2], wherein the stop threshold is a first stop threshold, and the control unit stops the operation of the drive unit when the number of times the movement speed becomes greater than a second stop threshold, which is a value less than the first stop threshold, exceeds a predetermined specified number of times within a predetermined specified period.

[0070] [4] A measuring device according to any one of [1] to [3], further comprising a memory unit that stores the electronic component whose electrical characteristics have been measured by the measurement unit in association with measurement data relating to the measurement results of the electrical characteristics of the electronic component, and the control unit stores, in the memory unit, data indicating that the moving speed is greater than a predetermined sorting threshold as the measurement data of the electronic component whose electrical characteristics have been measured, when the moving speed is greater than a predetermined sorting threshold.

[0071] [5] A measuring device described in any one of [1] to [4], wherein the control unit changes the operation of the drive unit when the movement speed is greater than a predetermined correction threshold value so that the movement speed is equal to or less than the correction threshold value.

[0072] REFERENCE SIGNS LIST 10... Measuring device 20... Holding section 21... Opening 30A... First measuring section 30B... Second measuring section 40... Driving section 41... Driving shaft 42... Actuator 43... Mounting section 50... Displacement sensor 60... Control section 61... Storage section 62... Execution section 100... Electronic component UD... Upward direction DD... Downward direction

Claims

1. A measuring device comprising: a measuring unit capable of measuring the electrical characteristics of an electronic component by contacting the electronic component to be measured; a drive unit supporting the measuring unit and capable of moving the measuring unit; a displacement sensor capable of detecting a change in position of the measuring unit; and a control unit acquiring the change in position detected by the displacement sensor, wherein the control unit is capable of executing a process of calculating the movement speed of the measuring unit based on the change in position.

2. The measuring device according to claim 1, wherein the control unit stops the operation of the drive unit when the moving speed is greater than a predetermined stop threshold value.

3. The measuring device of claim 2, wherein when the stop threshold is a first stop threshold, the control unit stops the operation of the drive unit when the number of times the movement speed becomes greater than a predetermined second stop threshold, which is a value less than the first stop threshold, exceeds a predetermined specified number of times within a predetermined specified period.

4. A measuring device as claimed in any one of claims 1 to 3, further comprising a memory unit that stores the electronic component whose electrical characteristics have been measured by the measurement unit in association with measurement data relating to the measurement results of the electrical characteristics of the electronic component, and wherein when the moving speed is greater than a predetermined sorting threshold, the control unit stores in the memory unit data indicating that the moving speed is greater than the sorting threshold as the measurement data of the electronic component whose electrical characteristics have been measured.

5. A measuring device as described in any one of claims 1 to 4, wherein the control unit changes the operation of the drive unit when the movement speed is greater than a predetermined correction threshold value so that the movement speed becomes equal to or less than the correction threshold value.

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