Method and system for locating fault in secondary circuit of voltage transformer

Abstract

A method and system for locating a fault in a secondary circuit of a voltage transformer. The method comprises: applying a low voltage to a secondary circuit of a voltage transformer, monitoring a circuit current, and determining the state of the secondary circuit of the voltage transformer on the basis of the circuit current; when it is determined that a fault is present, performing sectionalization on the secondary circuit to be inspected of the voltage transformer; and repeatedly applying the low voltage and monitoring the current, and locating a fault point by means of a sectional search method. By means of an accurate detection method, a fault of a secondary circuit of a voltage transformer can be effectively identified, thereby reducing misdiagnoses and missed diagnoses, shortening fault handling time, reducing power outage time, and improving the reliability of a power system. By detecting and locating a fault in time, equipment damage on a larger scale caused by fault expansion can be avoided, thereby reducing the costs of equipment maintenance and replacement.

Description

A method and system for locating faults in the secondary circuit of a voltage transformer

[0001] This application claims priority to Chinese Patent Application No. 202411532712.8, filed on October 30, 2024, entitled "A Method and System for Locating Faults in the Secondary Circuit of a Voltage Transformer", the entire contents of which are incorporated herein by reference. Technical Field

[0002] This application relates to the field of power system fault diagnosis technology, and in particular to a method and system for locating faults in the secondary circuit of a voltage transformer. Background Technology

[0003] Voltage transformers play a crucial role in power system measurement and protection. They transform high voltage into low voltage, enabling high-voltage measurement, and the standardized values ​​of their secondary voltages facilitate the manufacture of standard electrical measuring instruments and devices. Ideally, a voltage transformer is a low-resistance voltage source, and short circuits in its secondary circuit are prohibited. Therefore, fuses are installed on the secondary side of the voltage transformer to protect it.

[0004] In power system applications, voltage transformers typically connect numerous voltmeters, energy meters, voltage relays, insulation monitoring devices, and voltage busbars in their secondary circuits. Short circuits or grounding faults in the secondary circuit can cause the secondary fuses of the voltage transformer to blow. If the fault cannot be eliminated, the voltage transformer cannot be restored to normal operation. Some literature reviewed lacks a clear method for fault location in the secondary circuit of voltage transformers. Fault location often involves taking the voltage transformer out of service and implementing safety isolation measures, which makes fault location difficult. Due to the large number of devices connected in the secondary circuit, insulation tests or multimeter resistance tests often fail to detect grounding faults because the circuit contains mostly inductive loads with low DC resistance, sometimes measuring only a few ohms. This makes it difficult to distinguish between inductive and grounding faults, further complicating fault location. Locating the fault by disassembling the devices in the secondary circuit and then re-energizing the voltage transformer is also inefficient and subject to stress on the transformer. Summary of the Invention

[0005] This application provides a method and system for locating faults in the secondary circuit of a voltage transformer, which solves the problem of difficulty in locating fault points caused by the inability to effectively distinguish between test data and fault data in the secondary circuit of a voltage transformer; it overcomes the problem of not being able to identify fault points using test data, and uses the application of low voltage (safe voltage below 36V) and segmented search method to determine the circuit status and finally locate the fault point.

[0006] To solve the above-mentioned technical problems, this application provides the following technical solution:

[0007] One objective of this application is to provide a method for locating faults in the secondary circuit of a voltage transformer, comprising: applying a low voltage to the secondary circuit of the voltage transformer, monitoring the circuit current, and determining the state of the secondary circuit of the voltage transformer based on the circuit current; when a fault is determined to exist, segmenting the secondary circuit of the voltage transformer to be investigated; repeatedly applying the low voltage and monitoring the current, and locating the fault point through the segmented search method.

[0008] Another objective of this application is to provide a fault location system for the secondary circuit of a voltage transformer, which can effectively detect and locate faults in the secondary circuit of a voltage transformer while maintaining the simplicity and ease of use of the system.

[0009] As a preferred embodiment of the voltage transformer secondary circuit fault location system described in this application, it includes a low-voltage generator module, a current monitoring unit, a control logic unit, and a fault indication unit. The low-voltage generator module provides a safe low-voltage output for application to the voltage transformer secondary circuit, detecting faults without causing damage. The current monitoring unit measures the current value after the low voltage is applied to determine whether a short circuit or grounding fault exists in the circuit. The control logic unit controls the operation of the low-voltage generator based on the data from the current monitoring unit and executes a segmented search algorithm to gradually narrow down the fault location. The fault indication unit provides a visual or audible indication signal when a fault is detected, informing the operator of the existence and location of the fault.

[0010] Another object of this application is to provide a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of a method for locating faults in the secondary circuit of a voltage transformer.

[0011] Another object of this application is to provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of a method for locating faults in the secondary circuit of a voltage transformer. Attached Figure Description

[0012] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. Wherein:

[0013] Figure 1 is a schematic flowchart of a method for locating faults in the secondary circuit of a voltage transformer according to one or more embodiments.

[0014] Figure 2 is an expanded diagram of the secondary circuit of a voltage transformer according to one or more embodiments of a voltage transformer secondary circuit fault location method.

[0015] Figure 3 shows an example of a voltage transformer secondary circuit fault in a voltage transformer secondary circuit fault location method according to one or more embodiments.

[0016] Figure 4 is a schematic diagram of the AC voltage signal generator determining the branch fault status in a voltage transformer secondary circuit fault location method according to one or more embodiments.

[0017] Figure 5 is a schematic diagram of the working module of a voltage transformer secondary circuit fault location system according to one or more embodiments. Detailed Implementation

[0018] To make the objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without inventive effort should fall within the protection scope of this application.

[0019] Many specific details are set forth in the following description in order to provide a full understanding of this application. However, this application may also be implemented in other ways different from those described herein. Those skilled in the art can make similar extensions without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0020] Secondly, the term "an embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of this application. The phrase "in one embodiment" appearing in different places in this specification does not necessarily refer to the same embodiment, nor is it a single or selective embodiment that excludes other embodiments.

[0021] This application is described in detail with reference to the schematic diagrams. When detailing the embodiments of this application, for ease of explanation, the cross-sectional views illustrating the device structure may be partially enlarged, not according to the usual scale. Furthermore, the schematic diagrams are merely examples and should not limit the scope of protection of this application. In actual fabrication, the three-dimensional spatial dimensions of length, width, and depth should be included.

[0022] Furthermore, it should be noted in the description of this application that the terms "upper," "lower," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are used solely for the convenience of describing this application and for simplification, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. In addition, the terms "first," "second," or "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0023] Unless otherwise expressly specified and limited, the terms "installation," "connection," and "joining" in this application should be interpreted broadly. For example, they can refer to fixed connections, detachable connections, or integral connections; similarly, they can refer to mechanical connections, electrical connections, or direct connections, or indirect connections through an intermediate medium, or internal connections between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0024] In an exemplary embodiment, referring to FIG1, a method for locating faults in the secondary circuit of a voltage transformer is provided, including the following steps S1-S3.

[0025] S1: Apply a low voltage to the secondary circuit of the voltage transformer, monitor the circuit current, and determine the state of the secondary circuit of the voltage transformer based on the circuit current.

[0026] To address the issue of voltage transformer secondary circuit faults where test instruments cannot effectively distinguish between normal and fault states, a voltage generator with protection function is used to provide a method of applying low voltage to the voltage transformer secondary circuit. The normal rated voltage of the voltage transformer secondary circuit is typically AC 100V. When a short circuit fault occurs in the voltage transformer secondary circuit, its circuit resistance is extremely low; in the case of a metallic short circuit fault, the circuit resistance is only the resistance of the conductor (less than 2Ω). If a normal 100V voltage is applied to the voltage transformer secondary circuit, the circuit current will reach 50A, causing the voltage transformer secondary circuit breaker to trip. The principle of applying low voltage involves using a safe voltage below 36V, such as 10V. When applied to the secondary circuit, the short-circuit current in the circuit is reduced to only 5A, protecting both the secondary circuit and the test instruments.

[0027] Regarding the monitoring of circuit current, the method includes: when a short circuit or ground fault is detected in the secondary circuit of the voltage transformer, the voltage generator automatically cuts off power and issues an alarm. In one embodiment, if a short circuit or ground fault exists in the secondary circuit of the voltage transformer and the circuit current is greater than 1A, the protection function of the voltage generator will be triggered, and the voltage generator will automatically cut off power and issue an alarm, thereby solving the problem that test meters cannot effectively determine the fault status of the secondary circuit.

[0028] Regarding the status of the secondary circuit of a voltage transformer, the following criteria are considered: during the application of low voltage, if the circuit current is greater than 1A, it is determined that there is a short circuit or grounding fault in the secondary circuit of the voltage transformer; if the circuit current is less than 0.1A after applying low voltage, it is determined that the secondary circuit of the voltage transformer is in a normal state. In one embodiment, if the secondary circuit of the voltage transformer is in a normal state and the insulation is normal, then when low voltage is applied to the secondary circuit, the circuit current will be less than 0.1A, and the voltage generator will work normally. This is the principle behind the low voltage application method for determining the status of the secondary circuit of the voltage transformer.

[0029] S2: When a fault is detected, the secondary circuit of the voltage transformer to be investigated is segmented. The segmentation process includes: using a binary search method, the circuit to be investigated is split into two parts from the middle of the small busbar, a low voltage is applied again to the split small busbar, and the current is monitored. The faulty part is determined based on the magnitude of the current.

[0030] In one embodiment, when a fault is detected in the secondary circuit of a voltage transformer using the low voltage application method, a segmented search method is adopted when there are a large number of secondary circuit devices of the voltage transformer, especially when there is a small voltage bus. In this example, a bisection method can be used, that is, the circuit to be investigated is split into two parts in the middle of the small bus, and the low voltage application method is applied again on one of the small voltage buses. The criterion is the same as in S1.

[0031] In one embodiment, the voltage busbar is divided into two segments using a bisection method, not by simply dividing it in the middle, but by selecting the dividing point according to the following model:

[0032] Where P0 is the dividing point, N is the total length of the small busbar, and α is an adjustment coefficient less than 1, used to adjust the dividing point based on historical data or experience to optimize search efficiency.

[0033] The segmented fault location method includes: after applying a low voltage, if the circuit current is less than 0.1A, it is determined that the faulty part has been isolated; the segmented fault location method is continued to be used on the isolated faulty part to narrow down the fault location range. By repeatedly performing segmented fault location, the fault point of the voltage transformer secondary circuit is finally accurately located.

[0034] In one embodiment, a low voltage is applied at the break point, and the current is monitored. The faulty segment is determined based on the following criterion: if the current I... 阈值1 (For example, 0.1A), then the faulty section is isolated in another segment; if the current I>I 阈值2 If so, the faulty part is in the current test segment.

[0035] ​Scenario 1: If the faulty section is isolated, the voltage generator will operate normally (loop current will be less than 0.1A). In this case, the segmented search method can be used again on the isolated faulty section to narrow down the fault location. For the isolated faulty section, a recursive binary search method is used to continue segmenting, with the segmentation points selected at each step as follows:

[0036] Among them, P k It is the current split point, N k P is the length of the currently faulty section; β is a dynamic adjustment coefficient that is adjusted based on the previous current value and the preset optimization strategy. k+1 This is the next dividing point.

[0037] The second scenario: The voltage generator automatically trips the circuit and issues an alarm (loop current greater than 1A), indicating that the other part of the circuit is normal, while this part has a short circuit or ground fault. The segmented search method can be used to continue testing this part of the circuit, repeatedly narrowing down the fault location. For the unisolated faulty section, the recursive binary search method can continue to be used, but with a dynamic adjustment mechanism introduced:

[0038] Here, γ is a proportionality coefficient calculated based on current deviation and preset parameters, used to more accurately locate the fault point. After each segmentation, the segmentation point is adjusted according to the current monitoring results to gradually narrow the fault point range.

[0039] By recursively calling the above segmentation formula, the fault area is continuously refined until the preset minimum segmentation distance is reached.

[0040] S3: Repeatedly apply low voltage and monitor the current to locate the fault point using a segmented search method. By combining a voltage generator with segmented search, the fault point in the secondary circuit of the voltage transformer can be accurately located and eliminated.

[0041] The voltage generator applies voltages in a preset stepped voltage sequence, instead of a single low voltage. After each voltage application, the current change is monitored and the voltage-current pair is recorded. For each voltage step, the current response I(V) is recorded. k ), where V k Given the voltage at the k-th step, analyze the current response and use the following model to calculate the fault probability density function P. f (R k ):

[0042] Among them, I normal (V k I is the expected current under normal conditions. max (V k ) is the maximum expected current.

[0043] Through integration P f (R k The cumulative failure probability F(R) is obtained and used to locate the failure point.

[0044] Where R0 is the initial resistance value, and R is the current segment resistance; when F(R) exceeds the preset fault threshold F threshold At that time, it is assumed that the fault point is located in the current segment.

[0045] Once the fault point is located, the fault is eliminated by gradually reducing the voltage and monitoring the current. The following model is used to monitor the fault elimination process:

[0046] Among them, Q(V) k ) is a troubleshooting quality indicator, I initial (V k I is the fault current. final (V k ) is the current after the fault has been cleared.

[0047] Referring to Figures 2-4, in another exemplary embodiment, a method for locating faults in the secondary circuit of a voltage transformer is provided. To verify the beneficial effects of this application, scientific demonstration is conducted through experiments.

[0048] 1) Figure 2 is a typical unfolded diagram of the secondary wiring of a voltage transformer. Taking the voltage transformer wiring method of a 6kV system, the secondary side of the three-phase voltage transformer adopts a star connection method. Its secondary side is equipped with fuses, voltage busbars YMa, YMb, YMc, YMn, voltage measuring meter V, and voltage relays 1KV and 2KV.

[0049] 2) In Figure 3, a ground fault occurs in the n-branch of the voltage busbar in the secondary circuit of the voltage transformer. Since the voltage busbar has numerous branches, many of which contain voltage meters, energy meters, and integrated measuring devices, these devices are mostly inductive loads. When tested against ground using an insulation tester or multimeter, their DC resistance is typically very small, ranging from 1Ω to 2Ω in actual systems. In this situation, it is impossible to distinguish between the normal and faulty circuit states by measuring the resistance data of the fault-free and faulty branches. After a fault occurs in the secondary circuit of the voltage transformer, the fuse of the faulty phase will blow. Figure 3 illustrates the state after safety isolation measures are taken following a voltage transformer fault.

[0050] 3) Figure 4 shows the use of an AC voltage signal generator to determine the fault status. For situations where the resistance test method cannot distinguish faults, an AC voltage signal generator (in this example, a microprocessor-based relay protection tester) with output short-circuit protection alarm function is used. The output terminals UX and UY of the AC voltage signal generator are connected to the YMc and YMn circuits. YMn is in a grounded condition. The AC voltage signal generator outputs a small AC voltage signal (10V, 50Hz in this example). By using a segmented search method, a grounding fault can be located in the nth branch of the third segment of the YMc busbar. The voltage UXY application path is shown by the dashed line in Figure 4. This circuit is in a short-circuit state. The AC voltage signal generator will power off and trigger an alarm due to the output short circuit, thus indicating a fault on the YMc busbar.

[0051] 4) After identifying the faulty circuit using the above method, the equipment connected to the circuit can be checked step by step using the segmented search method. After disconnecting some branches, the method of applying a low voltage to the AC voltage signal generator in 3) is applied repeatedly. When a faultless branch is subjected to a low voltage, the circuit state will remain normal and will not trigger a power failure alarm. However, if a faulty branch is subjected to a low voltage, it will still trigger a power failure alarm. Using this method, the fault point can be gradually narrowed down until it is located.

[0052] In summary, the beneficial effects of this application are as follows: The testing process of this method is highly safe. It employs an AC voltage signal generator with protection functions, utilizing its short-circuit voltage protection function to accurately determine the state of the secondary circuit of the voltage transformer, eliminating reliance on test data and making fault state judgment simple and accurate. The combination of applying low voltage and a segmented search method improves work efficiency and the purposefulness of fault location, quickly narrowing down the fault range and ultimately accurately pinpointing the fault point. The operating principle is simple and highly universal, especially for complex wiring conditions, where it can improve work efficiency.

[0053] It should be noted that the above embodiments are only used to illustrate the technical solutions of this application and are not intended to limit it. Although this application has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this application without departing from the spirit and scope of the technical solutions of this application, and all such modifications and substitutions should be covered within the scope of the claims of this application.

[0054] In another exemplary embodiment, which differs from the preceding embodiments, the function, if implemented as a software functional unit and sold or used as an independent product, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, essentially, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0055] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device.

[0056] More specific examples of computer-readable media (a non-exhaustive list) include: electrical connections (electronic devices) having one or more wires, portable computer disk drives (magnetic devices), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Furthermore, computer-readable media can even be paper or other suitable media on which the program can be printed, because the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in computer memory.

[0057] It should be understood that various parts of this application can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented using software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented using any one or a combination of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0058] Referring to Figure 5, this application also provides a fault location system for the secondary circuit of a voltage transformer, including a low-voltage generator module 1, a current monitoring unit 2, a control logic unit 3, and a fault indication unit 4. The low-voltage generator module 1 provides a safe low-voltage output for application to the secondary circuit of the voltage transformer to detect faults without causing damage. The current monitoring unit 2 measures the current value after the low voltage is applied to determine whether a short circuit or ground fault exists in the circuit. The control logic unit 3 controls the operation of the low-voltage generator based on the data from the current monitoring unit and executes a segmented search algorithm to gradually narrow down the fault location. The fault indication unit 4 provides a visual or audible indication signal when a fault is detected, informing the operator of the existence and location of the fault.

[0059] It should be noted that the above embodiments are only used to illustrate the technical solutions of this application and are not intended to limit it. Although this application has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this application without departing from the spirit and scope of the technical solutions of this application, and all such modifications and substitutions should be covered within the scope of the claims of this application.

[0060] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0061] This document uses specific examples to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the methods and core ideas of this application. Furthermore, those skilled in the art will recognize that, based on the ideas of this application, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A method for locating faults in the secondary circuit of a voltage transformer, wherein, include: Apply a low voltage to the secondary circuit of the voltage transformer, monitor the circuit current, and determine the state of the secondary circuit of the voltage transformer based on the circuit current. If a fault is detected, the secondary circuit of the voltage transformer to be investigated shall be segmented and processed. By repeatedly applying low voltage and monitoring the current, the fault point can be located through a segmented search method.

2. The method for locating faults in the secondary circuit of a voltage transformer as described in claim 1, wherein, The application of low voltage includes: using the principle of low voltage application, using a safe voltage of less than 36V, when applied to the secondary circuit, the short-circuit current in the circuit is reduced, thus protecting the safety of the secondary circuit and the test instrument.

3. The method for locating faults in the secondary circuit of a voltage transformer as described in claim 2, wherein, The monitoring circuit current includes: when a short circuit or grounding fault is detected in the secondary circuit of the voltage transformer, the voltage generator automatically cuts off power and issues an alarm.

4. The method for locating faults in the secondary circuit of a voltage transformer as described in claim 3, wherein, The states of the secondary circuit of the voltage transformer include: If the circuit current is greater than 1A during the application of low voltage, it is determined that there is a short circuit or grounding fault in the secondary circuit of the voltage transformer; if the circuit current is less than 0.1A after the low voltage is applied, it is determined that the secondary circuit of the voltage transformer is in normal condition.

5. A method for locating faults in the secondary circuit of a voltage transformer as described in claim 4, wherein, The segmentation process includes: the segmentation search method is the binary search method, which splits the circuit to be investigated into two parts in the middle of the small busbar, applies a low voltage again to the small busbar after the split, monitors the current, and judges the faulty part based on the current magnitude.

6. A method for locating faults in the secondary circuit of a voltage transformer as described in claim 5, wherein, The segmented fault location method includes: if the circuit current is less than 0.1A after applying a low voltage, it is determined that the faulty part has been isolated.

7. A method for locating faults in the secondary circuit of a voltage transformer as described in claim 6, wherein, The segmented search method for locating fault points also includes: continuing to use the segmented search method on the isolated faulty parts to narrow down the fault point range, and finally accurately locating the fault point in the secondary circuit of the voltage transformer by repeatedly performing segmented searches.

8. A system employing a fault location method for a voltage transformer secondary circuit as described in any one of claims 1 to 7, wherein, Includes a low voltage generator module, a current monitoring unit, a control logic unit, and a fault indication unit; The low-voltage generator module provides a safe low-voltage output for application to the secondary circuit of a voltage transformer to detect faults without causing damage. The current monitoring unit measures the current value after a low voltage is applied, and is used to determine whether there is a short circuit or grounding fault in the circuit. The control logic unit controls the operation of the low voltage generator based on the data from the current monitoring unit, and executes a segmented search algorithm to gradually narrow down the fault location. When a fault is detected, the fault indication unit provides a visual or audible indication signal to inform the operator of the existence and location of the fault.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein, When the processor executes the computer program, it implements the steps of the method for locating faults in the secondary circuit of a voltage transformer as described in any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, wherein, When the computer program is executed by the processor, it implements the steps of the method for locating faults in the secondary circuit of a voltage transformer as described in any one of claims 1 to 7.

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