Method for a measuring device, and measuring device

Abstract

The invention relates to a method for automatically selecting an imaging function (AF) from a set (MAF) of at least two predefined imaging functions for a measuring device, wherein the measuring device is designed to record a measurement value of a process measurement variable of a medium (ME), wherein the imaging function (AF) describes a functional relationship between at least one auxiliary measurement variable (HG) and a measurement variable derived from the process measurement variable; wherein the method comprises at least the following steps: determining at least one first measurement value (ME1) of a first decision variable (E1); determining at least one first measurement value (ME2) of a second decision variable (E2); determining a relationship (B) between the measurement values (ME1, ME2) of the decision variables (E1, E2); selecting an imaging function (AF) on the basis of the relationship (B).

Description

[0001] Procedure for a measuring instrument and measuring instrument

[0002] This invention relates to a method for automatically selecting an imaging function for a measuring instrument, a method for creating a set of imaging functions for a measuring instrument, and a measuring instrument that applies the methods.

[0003] In automation technology, particularly in process automation, field devices are frequently used to detect and / or control process variables. Sensors, such as those integrated into level gauges, flow meters, pressure and temperature gauges, pH / ORP meters, conductivity meters, etc., are used to detect process variables, measuring levels, flow rates, pressure, temperature, pH, ORP, and conductivity. Actuators, such as valves or pumps, are used to control process variables, changing the flow rate of a liquid in a pipe section or the fill level in a container. In principle, field devices are all those devices used close to the process that provide or process process-relevant information.

[0004] In the context of the invention, field devices are also understood to include remote I / Os, radio adapters, and electronic components in general that are arranged at the field level. A large number of such field devices are manufactured and distributed by Endress+Hauser.

[0005] Determining the dielectric constant (also known as the relative permittivity or simply permittivity) of a medium is of great interest for solids, liquids (such as fuels), and mixtures of liquids and solids (such as wastewater, chemicals, or foodstuffs), as this value can provide a reliable indicator of impurities and / or quality. According to current technology, the capacitive measurement principle can be used to determine the dielectric constant of liquid media. This principle utilizes the effect that the capacitance of a capacitor changes proportionally with the dielectric constant of the medium between the two electrodes of the capacitor.

[0006] Another method for determining the dielectric constant of a medium is a sensor array designed to interact with the medium using electromagnetic waves. German patent DE102019131504A1 describes, among other things, the measurement of dielectric constant to determine the solids content. In this method, electromagnetic signals in the form of signal sequences of varying frequencies (in the gigahertz range) are transmitted via an antenna array into a medium located in a measuring tube and then received. Based on the transit time and attenuation of the signal sequences, medium properties such as the solids content can be determined.

[0007] The measurement of the dielectric constant of a medium can be distorted if there is a (possibly small) admixture of another substance, possibly in a different state of matter than the medium. For example, air inclusions in granular materials, moisture content in granular or powdered materials, air bubbles, or suspended particles in a liquid medium can lead to changes in the measured dielectric constant that are difficult to predict. In these cases, according to the state of the art, an average dielectric constant of the mixture is determined and mapped to a known measurement value of the desired quantity, which is determined, for example, by a reference measuring instrument independently of the dielectric constant measurement.In this process, a mapping function (or transfer function) is formed, which makes it possible to map a dielectric value determined by a measuring instrument to a corrected measured value of a specific measured quantity.

[0008] Determining a measured value of a process parameter in a process with a mixed process medium containing variable proportions by mapping a permittivity measurement has the disadvantage that the mapping function used to map a mean value to the process parameter is generally dependent on the variable proportions of the process medium. For processes with a process medium containing variable proportions, the mapping function must therefore be manually adjusted for every variation in the process medium. The challenge lies in simplifying or even eliminating this necessary manual adjustment of the mapping function to the process medium.

[0009] The invention solves the problem with a method according to claim 1, with a method according to claim 9, and a measuring device according to claim 12.

[0010] The inventive method for automatically selecting a mapping function from a set of at least two predefined mapping functions for a measuring instrument, wherein the measuring instrument is configured to acquire a measured value of a process measurement of a medium, wherein the mapping function describes a functional relationship between at least one auxiliary measurement and a measurement derived from the process measurement; wherein the method comprises at least the following steps: determining at least one first measured value of a first decision measurement; determining at least one first measured value of a second decision measurement; determining a relationship between the measured values ​​of the decision measurements; selecting a mapping function depending on the relationship.

[0011] The invention has the advantage that a measuring device applying the method according to the invention can automatically determine and select a mapping function for mapping a measured value of a process quantity to a reference measured value of a reference quantity. A measuring device configured to apply the method according to the invention acquires measured values ​​of a quantity, with the mapping function being automatically selected, wherein the measured values ​​mapped by the automatically set mapping function correspond (within tolerances) to measured values ​​that a reference measuring device would display when acquiring the same quantity.

[0012] Here, the mapping function, which can also be referred to as the transfer function or system function, describes a mathematical relationship between an input and an output signal of a measuring device, and in particular maps a measured value, a measured quantity, a decision quantity, or similar, acquired by the measuring device to a reference measured value of a reference measured quantity. In a further development of the method according to the invention, at least a first decision quantity is a specific measured quantity; wherein at least a first auxiliary measured quantity is the specific measured quantity.

[0013] The advantage of this further development is that the decision parameters and the auxiliary parameters are derived from the same set of parameters, and in particular, comprise the same parameters. In one embodiment of the invention, the first decision parameter corresponds exactly to the first auxiliary parameter, and the second decision parameter corresponds exactly to the second auxiliary parameter.

[0014] In a further embodiment of the method, a mapping function from the set of at least two predefined mapping functions includes an auxiliary measurement relationship between at least one measured value of the first auxiliary measurement and at least one measured value of a second auxiliary measurement.

[0015] The advantage of this design is that each mapping function from the set of at least two predefined mapping functions can be assigned to a relationship between the measured values ​​of the auxiliary quantities, whereby a given relationship between the auxiliary quantities makes it possible to uniquely assign a mapping function. In this context, different media can exhibit the same relationship between the auxiliary quantities and the same assigned mapping function.

[0016] In a further refinement of the procedure, the procedure continues to include the following steps: Determining a decision metric relationship between the at least one first measured value of the first decision metric and the at least one second measured value of the second decision metric; Comparing the decision metric relationship between the at least one first measured value of the first decision metric and the at least one first measured value of the second decision metric with the auxiliary metric relationship between the at least one measured value of the first auxiliary metric and the at least one measured value of the second auxiliary metric.

[0017] This design has the advantage that a relationship between the decision-making variables can be transferred to a relationship between the auxiliary variables, thus enabling the assignment of a mapping function. The comparison between the relationship of the decision-making variable and the relationship of the auxiliary variables can be mathematical in nature.

[0018] In a further embodiment of the procedure, the relationship between the decision parameters is a straight line; where the straight line includes a slope and an intercept.

[0019] This design has the advantage that the comparison of a relationship between auxiliary measurements parameterized by a straight line and a set of measured values ​​of decision-making variables arranged in data tuples can be easily digitized. Furthermore, the measuring device itself can determine the straight line and its parameters, for example, through linear regression.

[0020] In a further development of the procedure, the relationship between the measured values ​​of the decision parameters, on the basis of which the selection of the mapping function takes place, includes the slope and / or the y-intercept.

[0021] This design has the advantage that a mathematical comparison of measured values ​​of the decision parameters arranged in data tuples with the slope and / or the y-intercept enables a determination of the mapping function to be assigned.

[0022] In a further embodiment of the procedure, determining the at least one measured value of the first decision parameter and / or the at least one measured value of the second decision parameter includes applying, in particular, various mathematical models to a measurement signal.

[0023] This design has the advantage that different mathematical models can be used to differentiate between different media using different and / or complementary components of the measurement signal.

[0024] In a further embodiment of the method, the measuring device generates a measurement signal based on a microwave signal; the first and second decision parameters are generated based on, in particular, different portions of a permittivity spectrum of the measurement signal. This refinement has the advantage that a measurement signal originating from a microwave signal can encompass several frequency ranges, which interact differently with different media and therefore contain different information about the medium. This advantage can be exploited, for example, by using two (or more) models, each of which bases the calculation of a measurement value on at least one sub-range of the frequency spectrum of the measurement signal, with the sub-range being used not at all or only to a limited extent by the other model.

[0025] The inventive method for creating a set of mapping functions for a measuring instrument comprises a procedure that is performed for each medium from a set of at least two media, wherein the procedure comprises the following steps: acquiring several data tuples, wherein a data tuple comprises a measured value of a first auxiliary quantity of the medium acquired by the measuring instrument, a measured value of a second auxiliary quantity of the medium acquired by the measuring instrument, and a reference measured value of a reference measured quantity; determining a mapping function from the data tuples, wherein the mapping function comprises the functional relationship between the measured values ​​of the first auxiliary quantity and the reference measured values; determining a relationship between the measured values ​​of the first auxiliary quantity and the measured values ​​of the second auxiliary quantity.

[0026] The method according to the invention has the advantage that a mapping function is created for each medium of a specific selection of media using the measuring device, which mapping function makes it possible to map a measured value acquired with the measuring device to a reference measured value. Furthermore, it has the advantage that the mapping functions are assigned to a relationship between the auxiliary measured variables, whereby determining a relationship between auxiliary measured variables enables the assignment of a mapping function.

[0027] In a further development of the method according to the invention, determining the relationship between the auxiliary measured variables includes a compensation calculation.

[0028] A least squares adjustment in this sense is a mathematical optimization method for adjusting parameters of a given mathematical function to measured values, in this context given by the measured values ​​of the first and second auxiliary quantities contained in the data tuples.

[0029] This design has the advantage that the least-squares calculation can be executed by a program running on a microcontroller, so that a measuring device with suitable hardware is itself capable of performing this procedure. A further advantage is that the relationship between the auxiliary measured variables can be expressed in the form of the function's parameters.

[0030] In a further embodiment of the method, the relationship between auxiliary measurements includes a regression line with a slope and an intercept. The advantage of this embodiment is that a regression line is the simplest form of function that can be determined by least squares calculations, and that it has only two fundamental parameters. (Additional parameters of the regression line can include uncertainties in the fundamental parameters and / or the accuracy of a mathematical method.)

[0031] The measuring device according to the invention for detecting a measured quantity of a medium, configured for automatically selecting a mapping function based on a detected measurement signal of the medium, comprises: A sensor configured to generate a measurement signal; A data storage device configured to contain a set of at least two predefined mapping functions for a measuring device and an auxiliary measurement relationship between the first auxiliary measurement and the second auxiliary measurement according to an embodiment of the method according to the invention for creating a set of mapping functions for a measuring device;A measuring and operating circuit, wherein the measuring and operating circuit is configured to determine a measured value of a first decision-making variable based on the measuring signal, wherein the measuring and operating circuit is configured to determine a measured value of a second decision-making variable based on the measuring signal, wherein the measuring and operating circuit is configured to perform an embodiment of the inventive method for automatically selecting a mapping function from a set of at least two predetermined mapping functions for a measuring device. In a further development of the measuring device according to the invention, the measuring and operating circuit is configured to detect a mapping function and to include the detected mapping function in the data set and / or to store it in the data memory.

[0032] This further development has the advantage that the data set, which contains the set of at least two predefined mapping functions, can be generated using the measuring device according to the invention. For example, the measuring device can be used to create and save the data set for different media using the inventive method for generating a set of mapping functions for the measuring device.

[0033] The invention is further explained using the following figures. It shows:

[0034] Fig. 1 shows an embodiment of the inventive method for the automatic selection of an imaging function;

[0035] Fig. 2 shows an embodiment of the inventive method for creating a set of mapping functions;

[0036] Fig. 3 shows an embodiment of an imaging function;

[0037] Fig. 4 shows an illustration of the relationship between decision metrics;

[0038] Fig. 5 shows a schematic representation of an embodiment of the inventive method for the automatic selection of an imaging function;

[0039] Fig. 6 shows an embodiment of the measuring device according to the invention.

[0040] The embodiment of the inventive method for the automatic selection of a mapping function AF, shown in Fig. 1, illustrates the first step, determining at least one first measured value ME1 of a first decision metric E1; the second step, determining at least one first measured value ME2 of a second decision metric E2; the third step, determining a relationship B between the measured values ​​ME1 and ME2 of the decision metrics E1 and E2; and the fourth step, selecting a mapping function AF depending on the relationship B. In this embodiment, the relationship B between the decision metrics E1 and E2 comprises a functional, in particular linear, decision metric relationship ZE between the decision metrics E1 and E2.The determined decision metric relationship ZE is compared with an auxiliary metric relationship ZH, where a comparison involves the mathematical comparison of parameters of a mathematical function, and each auxiliary metric relationship ZH is assigned a mapping function AF from the set MAF of mapping functions AF. In this specific example, automatic selection means determining the auxiliary metric relationship ZH that best matches the determined decision metric relationship ZE, and selecting the mapping function AF assigned to the best-matching auxiliary metric relationship ZH.

[0041] The embodiment of the inventive method for creating a set of MAF mapping functions AF for a number of different media ME, ME', ME" shown in Fig. 2 comprises a first step, acquiring several data tuples DT, with measured values ​​MH1, MH2 of the auxiliary measured quantities H1, H2 and the measured value MR of the reference measured quantity R; a second step, determining a mapping function AF from an auxiliary measured quantity H1, H2 to a reference measured quantity R; and a third step, determining an auxiliary measured quantity relationship ZH between the measured values ​​MH1, MH2 of the auxiliary measured quantities H1, H2. In this embodiment, a mapping function AF and a uniquely assigned auxiliary measured quantity relationship ZH are created for each medium, both of which are stored, for example, in a data set.In this context, subsets of the different media ME, ME', ME" can have the same mapping function AF if they have the same auxiliary measurement relationship ZH (within tolerances).

[0042] The configuration of a mapping function AF shown in Fig. 3 depicts a coordinate system with a first axis, on which measured values ​​ME1 of the first decision variable E1 are plotted, and a second axis, on which the reference measured values ​​MR are plotted. Also shown as points are tuples (ME1, MR), each containing a measured value ME1 of the first decision variable E1 and a reference measured value MR. In this configuration, the measured values ​​ME1, MR were acquired within a predetermined time interval and are thus correlated. A tuple (ME1, MR) represents a mapping of a measured value ME1 of the decision variable to a reference measured value MR of the reference variable R. From the set of tuples (ME1, MR), a functional relationship between the measured values ​​ME1, MR can be determined using a mathematical procedure, for example, least-squares analysis.In this example, the relationship is linear and can be parameterized by a regression line G with a y-intercept GA and a slope GS. The regression line G is therefore a mathematical parameterization of the mapping function AF of the first decision-making variable E1 onto the reference variable R. The entire description of Fig. 3 can be transferred to the first auxiliary variable H1 and the associated measured values ​​MH1, where EH1 is replaced by MH1 and E1 by H1.

[0043] The configuration of the relationship between decision parameters E1 and E2 shown in Fig. 4 depicts a coordinate system with a first axis and a second axis. The first axis represents measured values ​​ME1 of the first decision parameter E1, and the second axis represents measured values ​​ME2 of the second decision parameter E2. The tuples (ME1, ME2) are represented as points in the coordinate system, each containing one measured value ME1 of the first decision parameter E1 and one measured value ME2 of the second decision parameter E2 for a medium ME. In this configuration, the measured values ​​ME1 and ME2 of a tuple are generated by different models based on the same measurement signal MS (not shown here).From the set of tuples (ME1, ME2), a functional relationship between the measured values ​​ME1, ME2 can be determined using a mathematical procedure, such as least squares. In this example, the relationship is linear and allows for a mathematical parameterization of the decision-measurement relationship ZE. The figure contains further tuples (ME1', ME2') which comprise measured values ​​MET, ME2' acquired in a different medium ME'. Based on these additional tuples (MET, ME2'), another decision-measurement relationship ZE' is determined, which in this example is also linear and can be mathematically parameterized accordingly. This figure illustrates how a decision-measurement relationship ZE, ZE' enables a differentiation between media ME, ME'. The complete description of the figure...4 can be applied to the auxiliary measured quantities H1 , H2 and the associated measured values ​​MH1 , MH2, where EH1 is replaced by MH1 , EH2 by MH2 , E1 by H1 , and E2 by H2 .

[0044] The schematic embodiment of the inventive method for the automatic selection of a mapping function, shown in Fig. 5, illustrates how, based on a captured decision measurement variable E1, two, in particular different, measured values ​​ME11 and ME22 are determined using a model 1 and a model 2. These measured values ​​exhibit a decision measurement variable relationship ZE1, which is automatically determined, for example, by a measuring and operating circuit of a measuring device. Based on the determined decision measurement variable relationship ZE1, a mapping function AF1 associated with the decision measurement variable relationship ZE1 is automatically selected from a set of mapping functions MAF with at least two predefined mapping functions AF for a measuring device. Using the mapping function AF1, the measuring device can map one, in particular any, of the measured values ​​ME11 and ME12 to a reference measurement value MR1.

[0045] Similarly, for a second decision metric E2, the measured values ​​ME21, ME22 are determined using Model 1 and Model 2, whereby a decision metric relationship ZE2 is determined based on the measured values ​​ME21, ME22, whereby an associated mapping function AF2 is determined based on the decision metric relationship ZE2 using the set of mapping functions MAF with at least two predefined mapping functions AF for a measuring device, whereby one of the measured values ​​ME21, ME22 is mapped to a reference measurement MR2 based on the mapping function AF2.

[0046] Fig. 5 further shows an exemplary embodiment of the set of mapping functions MAF for a measuring device, which is presented here as a table, wherein the first row comprises the decision-measurement relationships ZE1, ZE2, and wherein the second row comprises the associated mapping functions AF1, AF2. According to the method of the invention, for example, a measuring and operating circuit can access this table and, after determining a decision-measurement relationship ZE1, ZE1, ZE2, select the associated mapping function AF1, AF2 from the table. In this example, the measuring and operating circuit identifies the determined decision-measurement relationship ZE1, ZE2 and identifies it with one of the entries in the first row. The associated mapping function AF1, AF2 is then determined as the mapping function AF1, AF2 which is in the same column as the determined decision-measurement relationship ZE1, ZE2.

[0047] The embodiment of the measuring device according to the invention shown in Fig. 6 depicts the medium ME guided in the measuring tube MR, and the sensor MA arranged in the measuring tube MR, which is configured to generate a measurement signal MS (not shown here) and transmit it to the measuring and operating circuit MB. The measuring and operating circuit MB is configured to determine a first measured value (ME1) of a first decision-measurement variable E1 and a second measured value (ME2) of a second decision-measurement variable E2 based on the measurement signal MS. Based on the measured values ​​ME1 and ME2, as well as on the set MAF of at least two predefined mapping functions AF for a measuring device and an auxiliary measurement variable relationship ZH contained in a data storage device DS connected to the measuring and operating circuit MB, the measuring and operating circuit MB performs a method according to the invention for automatically selecting a mapping function AF and selects a mapping function.Specifically, this means that the measuring device uses the measured values ​​ME1 and ME2 to determine which mapping function AF from the data memory DS should be used to map the decision measured values ​​ME1 to reference measured values ​​MR. This version of the measuring device also features an input-output module IO, which allows information to be transmitted to the measurement and operating circuit MB, for example, by a user. This transmission enables, for instance, the input of a reference measured value MR of a reference measured quantity R, so that it is possible to store data tuples comprising measured values ​​ME1 and ME2 and reference measured values ​​MR in the data memory DS. Based on these tuples, the measurement and operating circuit MB can then determine a mapping function AF and include it in a data record and / or store it in the data memory DS. Reference symbol list.

[0048] AF, AF1, AF2 Image function

[0049] MAF: Set of at least two predefined mapping functions

[0050] ME Medium

[0051] HG auxiliary measurement

[0052] E1 first decision metric

[0053] E2 second decision metric

[0054] ME1, ME11, ME12 Measured value of the first decision parameter

[0055] ME2, ME21, ME22 Measured value of the second decision metric

[0056] B relationship

[0057] H1 first auxiliary measurement

[0058] H2 second auxiliary measurement

[0059] MH1 Measured value of the first auxiliary measurement

[0060] MH2 measured value of the second auxiliary measurement

[0061] ZH Auxiliary Measurement Variable Relationship

[0062] ZE, ZE1, ZE2 Decision Metric Relationship

[0063] G Straight

[0064] GS incline

[0065] GA axis section

[0066] MS measurement signal

[0067] MME quantity of at least two media

[0068] DT data tuples

[0069] R Reference measurement

[0070] MR, MR1, MR2 reference measurement value

[0071] MA sensor

[0072] DS Data Storage

[0073] MB measuring and operating circuit

Claims

Patent claims 1. A method for automatically selecting a mapping function (MF) from a set (MMF) of at least two predefined mapping functions for a measuring instrument, wherein the measuring instrument is configured to acquire a measured value of a process measurement of a medium (M), wherein the mapping function (MF) describes a functional relationship between at least one auxiliary measurement (AM) and a measurement derived from the process measurement; wherein the method comprises at least the following steps: - Determining at least one first measured value (ME1 ) of a first decision metric (E1 ); - Determining at least one first measured value (ME2) of a second decision metric (E2); - Determining a relationship (B) between the measured values ​​(ME1 , ME2) of the decision metrics (E1 , E2); - Selecting a mapping function (AF) depending on the relationship (B).

2. Method according to claim 1 , - where at least one first decision measure (E1 ) is a specific measure; - where at least one first auxiliary quantity (H1 ) is the determined quantity.

3. Method according to one of claims 1 or 2, - wherein a mapping function (AF) from the set (MAF) of at least two given mapping functions includes an auxiliary measurement relationship (ZH) between at least one measurement (MH1) of the first auxiliary measurement (H1) and at least one measurement (MH2) of a second auxiliary measurement (H2).

4. The method of claim 3, further comprising the following steps: - Determining a decision metric relationship (ZE) of at least one first measured value (ME1 ) of the first decision metric (E1 ) and at least one second measured value (ME2) of the second decision metric (E2); - Comparing the decision measure relationship (ZE) of the at least one first measured value (ME1 ) of the first decision variable (E1 ) and the at least one first measured value (ME2) of the second decision variable (E2) with the auxiliary measure relationship (ZH) between the at least one measured value (MH1 ) of the first auxiliary measure (H1 ) and the at least one measured value (MH2) of the second auxiliary measure (H2).

5. Method according to any one of claims 1 to 4, - where the decision measure relationship (ZE) is a straight line (G); - where the straight line (G) includes a slope (GS) and an y-intercept (GA).

6. Method according to claim 5, - where the relationship of the measured values ​​(ME1 , ME2) of the decision variables (E1 , E2) on the basis of which the selection of the mapping function (AF) takes place includes the slope (GS) and / or the y-intercept (GA).

7. Method according to any one of claims 1 to 6, - wherein determining the at least one measured value (ME1 ) of the first decision measure (E1 ) and / or the at least one measured value (ME2) of the second decision measure (E2) involves applying, in particular, different mathematical models to a measurement signal (MS).

8. Method according to any one of claims 1 to 7, - wherein the measuring device generates a measurement signal (MS) based on a microwave signal; - wherein the first decision measure (E1 ) and the second decision measure (E2) are generated from, in particular different, parts of a permittivity spectrum of the measurement signal (MS).

9. Method for creating a set (MAF) of mapping functions for a measuring instrument, comprising a procedure that, for each medium (ME), selects from a set is performed by at least two media (MME), the procedure comprising the following steps: - Acquisition of multiple data tuples (DT), o Where a data tuple (DT) comprises a measured value (MH1 ) of a first auxiliary quantity (H1 ) of the medium (ME) acquired by the measuring instrument, a measured value (MH2) of a second auxiliary quantity (H2) of the medium (ME) acquired by the measuring instrument and a reference measured value (MR) of a reference quantity (R); - Determining a mapping function based on the data tuples (DT), o where the mapping function (DT) includes the functional relationship between the measured values ​​(MH1 ) of the first auxiliary quantity (H1 ) and the reference measured values ​​(MR) of a reference quantity (R); - Determining a relationship (ZH) between the measured values ​​(MH1 ) of the first auxiliary quantity (H1 ) and the measured values ​​(MH2) of the second auxiliary quantity (H2).

10. Method according to claim 9, - where determining the auxiliary measurement relationship (ZH) includes a reconciliation calculation.

11. Method according to one of claims 9 or 10, - where the auxiliary measurement relationship (APR) includes a regression line with a slope and an y-intercept.

12. Measuring instrument for detecting a measured quantity of a medium (ME), configured for automatically selecting an imaging function (AF) based on a detected measurement signal (MS) of the medium (ME), comprising: - A measuring sensor (MA) configured to generate a measurement signal (MS); - A data storage device (DS), or set up with a set (MAF) of at least two predefined mapping functions for a measuring device and an auxiliary measurement relationship (ZH) between the first auxiliary measurement (H1) and the to include a second auxiliary measurement variable (H2) according to one of claims 9 to 12; - A measuring and operating circuit (MB), o wherein the measuring and operating circuit is configured to determine a measured value (ME1 ) of a first on the basis of the measuring signal (MS). to determine decision measurement variable (E1), o wherein the measuring and operating circuit (MB) is configured to determine a measured value (ME2) of a second decision measurement variable (E2) based on the measuring signal (MS), o wherein the measuring and operating circuit (MB) is configured to To carry out a method according to any one of claims 1 to 8.

13. Measuring device according to claim 10, - wherein the measuring and operating circuit is configured to detect an imaging function and to input the detected imaging function into the to record the data and / or store it in the data storage.

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