Element device and abnormality-coping method

Abstract

Provided is an element device capable of appropriately coping with an abnormality that has occurred, in accordance with the importance degree of the abnormality. An element device according to the present technology comprises: an element unit; a determination unit that detects an abnormality in the element unit and determines the importance degree of the abnormality; and a processing unit that executes a process corresponding to the determination result of the determination unit. With the element device according to the present technology, it is possible to provide an element device capable of appropriately coping with an abnormality that has occurred, in accordance with the importance degree of the abnormality.

Description

Element device and abnormality handling method 【0001】 The technology according to the present disclosure (hereinafter also referred to as "the present technology") relates to an element device and an abnormality handling method. 【0002】 For example, Patent Document 1 discloses a circuit noise determination system that detects and classifies a target circuit for noise analysis and outputs a target circuit that exceeds a noise upper limit reference value. 【0003】 For example, Patent Document 2 discloses a semiconductor device that causes a current to flow through a fuse provided between first and second external power supply terminals to cut off the circuit when a specific abnormal phenomenon occurs. 【0004】 Japanese Patent Application Laid-Open No. 2023-181830, Japanese Patent Application Laid-Open No. 2015-88803 【0005】 However, in Patent Documents 1 and 2, there is room for improvement regarding appropriately dealing with the importance of the generated abnormality. 【0006】 Therefore, the main object of the present technology is to provide an element device capable of appropriately dealing with the importance of the generated abnormality. 【0007】This technology provides an element device comprising: an element unit; a determination unit that detects an abnormality in the element unit and determines the severity of the abnormality; and a processing unit that performs processing according to the determination result of the determination unit. The severity may be based on the functional safety of the element unit. The element unit may output a plurality of monitor signals to the determination unit that individually indicate the status of a plurality of drive parameters of the element unit, and the determination unit may monitor the plurality of monitor signals to detect the abnormality. When the determination unit detects the abnormality, it may identify the type of abnormality from the plurality of monitor signals, classify the identification result into a class according to the severity, output the classification result to the processing unit, and the processing unit may perform processing according to the classification result. The determination unit may have a plurality of output terminals for outputting the plurality of classified classes. The determination unit may output the classification result to the processing unit after multi-leveling. The determination unit may output the classification result to the processing unit as a continuous value. The element device may be provided with a storage unit for storing the classification result. The determination unit may transmit the data with the classification result attached to it to the processing unit via a transmission line, and the processing unit may obtain the classification result from the data. The processing unit may stop driving the element unit if the determination result indicates a high importance. The processing unit has a counter that counts the number of times the determination unit has detected the abnormality, and if the determination result indicates a low importance of the abnormality, it may stop driving the element unit if the count value of the counter is above a threshold, and continue driving the element unit or issue an error notification if the count value is below the threshold. The processing unit has an adjustment unit that adjusts each of the plurality of drive parameters, and if the determination result indicates a medium importance of the abnormality, the adjustment unit may adjust the drive parameter related to the abnormality. The processing unit may stop driving the element unit or issue an error notification if the determination result after adjusting the drive parameters indicates a medium importance.This technology also provides an object device comprising: an element unit; a determination unit that detects an abnormality in the element unit and determines the severity of the abnormality; and a processing unit that performs processing according to the determination result of the determination unit; and an object on which the element device is mounted. This technology also provides an abnormality handling method comprising: a step of determining the severity of an abnormality when an abnormality in the element unit is detected; and a step of performing processing according to the determination result of the determination step. The abnormality may be detected by monitoring a plurality of monitor signals output by the element unit, which individually indicate the status of a plurality of drive parameters of the element unit. In the determination step, the type of abnormality may be identified from the plurality of monitor signals, and the identification result may be classified into a class according to the severity, and in the execution step, processing may be performed according to the classification result of the class. In the execution step, if the determination result indicates a high severity, the driving of the element unit may be stopped. In the execution step, the number of times the abnormality is detected is counted, and if the determination result indicates that the severity of the abnormality is low, the operation of the element unit may be stopped when the number of detections is equal to or greater than a threshold, and the operation of the element unit may be continued or an error notification may be issued when the number of detections is less than the threshold. In the execution step, if the determination result indicates that the severity of the abnormality is medium, the drive parameters related to the abnormality may be adjusted. 【0008】This is a block diagram showing the schematic configuration of an element device according to Example 1 of the first embodiment of this technology. This is a block diagram showing the configuration of an element device according to Example 1 of the first embodiment of this technology. This is a block diagram showing the configuration of the element section of an element device according to Example 1 of the first embodiment of this technology. This is a block diagram showing in detail a part of the configuration of the determination section of an element device according to Example 1 of the first embodiment of this technology. This is a diagram showing a specific example of class classification by the determination section of an element device according to Example 1 of the first embodiment of this technology. This is a block diagram showing an example of the configuration of the classification result output section of the determination section of an element device according to Example 1 of the first embodiment of this technology. This is a diagram showing output method 1 of the classification result output section of the determination section of an element device according to Example 1 of the first embodiment of this technology. This is a diagram showing output method 2 of the classification result output section of the determination section of an element device according to Example 1 of the first embodiment of this technology. This is a diagram showing an example of the configuration of the input and output of class classification results in an element device according to Example 1 of the first embodiment of this technology. This is a diagram showing an example of the configuration of the adjustment section of the processing unit of an element device according to Example 1 of the first embodiment of this technology. This is a flowchart for explaining the operation of an element device according to Example 1 of the first embodiment of this technology. This is a flowchart for explaining the class classification process in Figure 11. This is a block diagram showing the configuration of an element device according to Example 2 of the first embodiment of this technology. This is a flowchart for explaining the operation of the element device according to Example 2 of the first embodiment of this technology. This is a block diagram showing the configuration of the element device according to Example 3 of the first embodiment of this technology. This is a flowchart for explaining the operation of the element device according to Example 3 of the first embodiment of this technology. This is a block diagram showing the configuration of the element device according to Example 4 of the first embodiment of this technology. This is a flowchart for explaining the operation of the element device according to Modification 1 of Example 1 of the first embodiment of this technology. This is a flowchart for explaining the operation of the element device according to Modification 1 of Example 1 of the first embodiment of this technology. This is a block diagram showing the configuration of the element device according to Modification 1 of Example 2 of the first embodiment of this technology. This is a flowchart for explaining the operation of the element device according to Modification 1 of Example 2 of the first embodiment of this technology. This is a block diagram showing the configuration of the element device according to Modification 3 of the first embodiment of this technology.This is a flowchart for explaining the operation of an element device according to a modified example of Example 3 of the first embodiment of this technology. This is a block diagram showing the configuration of an element device according to modified example 1 of Example 4 of the first embodiment of this technology. This is a flowchart for explaining the operation of an element device according to modified example 1 of Example 4 of the first embodiment of this technology. This is a block diagram showing the configuration of an element device according to modified example 2 of Example 1 of the first embodiment of this technology. This is a block diagram showing the configuration of an element device according to modified example 3 of Example 1 of the first embodiment of this technology. This is a flowchart for explaining the operation of an element device according to modified example 2 of Example 2 of the first embodiment of this technology. This is a flowchart for explaining the operation of an element device according to modified example 2 of Example 4 of the first embodiment of this technology. This is a block diagram showing an example of the configuration of an element device according to the second embodiment of this technology. This is a diagram showing an example of the configuration of a mobile device according to the third embodiment of this technology. This is a diagram showing an example of the use of an element device to which this technology is applied. This is a functional block diagram of an example of an electronic device equipped with an element device to which this technology is applied. This is a block diagram showing an example of the schematic configuration of a vehicle control system. This is an explanatory diagram showing an example of the installation position of an external information detection unit and an imaging unit. This is a diagram showing an example of the schematic configuration of an endoscopic surgery system. This is a block diagram showing an example of the functional configuration of a camera head and a CCU. 【0009】 Preferred embodiments of this technology will be described in detail below with reference to the attached drawings. In this specification and the drawings, components having substantially the same functional configuration are denoted by the same reference numerals, and redundant explanations will be omitted. The embodiments described below represent typical embodiments of this technology, and this will not be interpreted as narrowing the scope of this technology. Even if this specification describes that the element device and abnormality handling method related to this technology have multiple effects, the element device and abnormality handling method related to this technology only need to have at least one effect. The effects described in this specification are merely examples and are not limiting, and other effects may also exist. 【0010】Furthermore, the explanation will proceed in the following order: 0. Introduction 1. Element device according to Example 1 of the first embodiment of this technology 2. Element device according to Example 2 of the first embodiment of this technology 3. Element device according to Example 3 of the first embodiment of this technology 4. Element device according to Example 4 of the first embodiment of this technology 5. Element device according to Modification 1 of Example 1 of the first embodiment of this technology 6. Element device according to Modification 1 of Example 2 of the first embodiment of this technology 7. Element device according to Modification 3 of Example 3 of the first embodiment of this technology 8. Element device according to Modification 1 of Example 4 of the first embodiment of this technology 9. Element device according to Modification 2 of Example 1 of the first embodiment of this technology 10. Element device according to Modification 3 of Example 1 of the first embodiment of this technology 11. Element device according to Modification 2 of Example 2 of the first embodiment of this technology 12. Element device according to Modification 2 of Example 4 of the first embodiment of this technology 13. Element device according to the second embodiment of this technology 14. Mobile device according to the third embodiment of this technology 15. Examples of use of element devices to which this technology is applied 16. Other examples of applications of this technology to element devices: 17. Applications to objects 18. Applications to endoscopic surgical systems 【0011】 ≪0. Introduction≫ Some device components, such as semiconductor devices, have a fault notification function that responds to their own behavior. This fault notification function is activated when a device malfunctions. Methods for notifying a fault in this function include outputting a voltage to a specific terminal or changing the value of a specific register. 【0012】 In the prior art for notifying of such failures (for example, Japanese Patent No. 7098346), the status of the analog and digital circuits inside the IC chip is monitored, and if any abnormal operation occurs, a voltage signal is sent to the outside of the chip. However, in this prior art, since the means of external notification is the voltage of a specific terminal, it is not possible to identify which circuit block is operating abnormally. Furthermore, there is no way to determine the degree of the abnormality that has occurred. 【0013】 Furthermore, in the circuit noise detection system described in Patent Document 1 (prior art), for example, the types of abnormalities that can be dealt with are limited to noise, and the only method of dealing with them is to output (notify) the target circuit where the abnormality is significant. 【0014】 Furthermore, in the semiconductor device described in Patent Document 2 (prior art), for example, the only way to deal with a specific abnormal phenomenon is to break the fuse provided between the first and second external power terminals to stop the operation of the device. 【0015】 In other words, in all of the above conventional technologies, there was room for improvement in dealing appropriately with the severity of the anomalies that occurred. 【0016】 Therefore, after diligent study, the inventors developed an element device related to this technology that can appropriately deal with abnormalities according to their severity. Furthermore, the inventors developed an abnormality handling method related to this technology that can appropriately deal with various abnormalities. 【0017】 The element device according to the first embodiment of this technology will be described in detail below with reference to several examples. 【0018】 ≪1. Element device according to Example 1 of the first embodiment of this technology≫ 【0019】 <Configuration of the Element Device> Figure 1 is a block diagram showing the schematic configuration of the element device according to Example 1 of the first embodiment of this technology. Figure 2 is a block diagram showing the configuration of the element device according to Example 1 of the first embodiment of this technology. Figure 3 is a block diagram showing the configuration of the element part of the element device according to Example 1 of the first embodiment of this technology. Figure 4 is a block diagram showing in detail a part of the configuration of the determination unit of the element device according to Example 1 of the first embodiment of this technology. Figure 5 is a diagram showing a specific example of class classification by the determination unit of the element device according to Example 1 of the first embodiment of this technology. 【0020】The element device 10 according to Example 1 of the first embodiment of this technology includes, as an example, an element unit 100, a determination unit 200 that detects abnormalities in the element unit 100 and determines the severity of the abnormality, and a processing unit 300 that executes processing according to the determination result of the determination unit 200, as shown in Figure 1. The element device 10 further includes a CPU (Central Processing Unit) that provides overall control of the entire device. The CPU is shared by the determination unit 200 and the processing unit 300. However, the determination unit 200 and the processing unit 300 may each have their own CPU. 【0021】 [Element section] The element section 100 includes, as an example, an element 101 and a control circuit 102, as shown in Figure 2. 【0022】 (Element) Examples of element 101 include an image sensor, a light-emitting element, a light-receiving element, and an image display element. Hereinafter, an image sensor (for example, an image sensor) will be used as an example of element 101. The image sensor converts incident light into an electrical signal (analog signal) using a photoelectric conversion unit and outputs it. 【0023】 (Control circuit) The control circuit 102 processes the output signal of the element 101 and outputs a plurality of monitor signals (e.g., monitor signals 1 to 7) to the determination unit 200 that individually indicate the status of a plurality of (e.g., seven) drive parameters of the element unit 100. 【0024】 Multiple drive parameters include, for example, the power supply voltage for driving element 101 and control circuit 102, the frequency of the clock signal (analog signal), circuit operation evaluation by BIST (Built In Self Test), memory read / write operation, and the presence or absence of application lock. 【0025】As an example, the control circuit 102 includes, as shown in Figure 3, an analog circuit 102a that processes the output signal (analog signal) of the element 101, an A / D converter 102b that converts the analog signal processed by the analog circuit 102a into a digital signal, a logic circuit 102c (digital circuit) that processes the digital signal converted by the A / D converter 102b, a memory 102d that temporarily stores the signal value of the digital signal output from the logic circuit 102c, a monitor signal output unit 102e that outputs a plurality of monitor signals (for example, monitor signals 1 to 7), and a power supply circuit 102f that supplies power to these. 【0026】 The monitor signal output unit 102e outputs, for example, an analog signal showing the waveform of the terminal voltage (power supply voltage) of the power supply circuit 102f, or a digital signal showing the voltage level, as monitor signal 1. 【0027】 The monitor signal output unit 102e outputs, for example, a clock signal (analog signal) or a digital signal obtained by digitizing the frequency of the clock signal as the monitor signal 2. 【0028】 The monitor signal output unit 102e outputs a digital signal as the monitor signal 3 that indicates, for example, whether the circuit operation evaluation of the analog circuit by BIST is good or bad. 【0029】 The monitor signal output unit 102e outputs a digital signal as a monitor signal 4 that indicates, for example, whether the circuit operation evaluation of the logic circuit by BIST is good or bad. 【0030】 The monitor signal output unit 102e outputs a digital signal 5 as a monitor signal, for example, that indicates whether the memory read / write operation is successful or not. 【0031】 The monitor signal output unit 102e outputs a digital signal 6 as a monitor signal that indicates, for example, whether or not there are data errors such as data transmission failures between each component of the element unit 100. 【0032】 The monitor signal output unit 102e outputs, for example, a digital signal indicating whether or not an application lock is active as the monitor signal 7. 【0033】The monitor signal output unit 102e may include an A / D converter and / or a D / A converter. The monitor signal output unit 102e can output analog monitor signals as they are. If the monitor signal output unit 102e has an A / D converter, it can convert analog monitor signals to digital signals and output them. The monitor signal output unit 102e can output digital monitor signals as they are. If the monitor signal output unit has a D / A converter, it can convert digital monitor signals to analog signals and output them. 【0034】 [Determination Unit] The determination unit 200, as an example, includes an anomaly detection unit 201, an anomaly type identification unit 202, a class classification unit 203, and a classification result output unit 204, as shown in Figure 2. 【0035】 (Anomaly Detection Unit) The anomaly detection unit 201 monitors multiple (for example, seven) monitor signals (for example, monitor signals 1 to 7) from the element unit 100 to detect an anomaly, and when it detects the anomaly, it transfers the multiple monitor signals to the anomaly type identification unit 202. 【0036】 The abnormality detection unit 201 detects an abnormality when there is a change from the normal state in at least one of the multiple monitor signals (for example, monitor signals 1 to 7). 【0037】 Specifically, the abnormality detection unit 201 detects an abnormality when the waveform (analog waveform) of the input monitor signal changes from the reference waveform (the waveform of the monitor signal when the drive parameters corresponding to the monitor signal are normal) when the input monitor signal is an analog signal. The abnormality detection unit 201 also detects an abnormality when the signal value (digital value) of the monitor signal changes from the reference value (the signal value of the monitor signal when the drive parameters corresponding to the monitor signal are normal) when the input monitor signal is a digital signal. 【0038】 (Anomaly Type Identification Unit) As shown in Figure 4, when the anomaly detection unit 201 detects an anomaly, the anomaly type identification unit 202 identifies the type of anomaly from a plurality of monitor signals (for example, monitor signals 1 to 7) (more specifically, from the presence or absence of changes in each monitor signal) and sends the identification result to the class classification unit 203. 【0039】 Specifically, when the detection of an abnormality is due to a change in the monitor signal 1, the abnormality type specifying unit 202 specifies the type of the abnormality as a power supply function abnormality, and sends the specified result to the class classification unit 203 as a power supply error. 【0040】 When the detection of an abnormality is due to a change in the monitor signal 2, the abnormality type specifying unit 202 specifies the type of the abnormality as a clock function abnormality, and sends the specified result to the class classification unit 203 as a clock error. 【0041】 When the detection of an abnormality is due to a change in the monitor signal 3, the abnormality type specifying unit 202 specifies the type of the abnormality as an analog function abnormality, and sends the specified result to the class classification unit 203 as an analog error. 【0042】 When the detection of an abnormality is due to a change in the monitor signal 4, the abnormality type specifying unit 202 specifies the type of the abnormality as a logic function abnormality, and sends the specified result to the class classification unit 203 as a logic error. 【0043】 When the detection of an abnormality is due to a change in the monitor signal 5, the abnormality type specifying unit 202 specifies the type of the abnormality as a memory function abnormality, and sends the specified result to the class classification unit 203 as a memory error. 【0044】 When the detection of an abnormality is due to a change in the monitor signal 6, the abnormality type specifying unit 202 specifies the type of the abnormality as a data function abnormality, and sends the specified result to the class classification unit 203 as a data error. 【0045】 When the detection of an abnormality is due to a change in the monitor signal 7, the abnormality type specifying unit 202 specifies the type of the abnormality as an application function abnormality, and sends the specified result to the class classification unit 203 as an application error. 【0046】 (Class Classification Unit) The class classification unit 203 classifies the specified result in the abnormality type specifying unit 202 into classes according to the importance. The class classification unit 203 includes, for example, a logic circuit implemented based on a truth table prepared in advance. 【0047】The importance is based on the functional safety of the element unit 100. That is, the importance corresponds to the level of functional safety (the required level regarding functional safety). That is, the higher the importance, the higher the level of functional safety. 【0048】 Specifically, in FIG. 5, Class A, Class B, Class C, and Class D are listed in descending order of importance (level of functional safety) from top to bottom (however, here the importance of Class B and Class C is the same). 【0049】 Class A corresponds to high importance and is a device function stop or a possible failure (abnormality). The class classification unit 203 determines, for example, that at least one of a power error and a clock error from the abnormality type specifying unit 202 corresponds to Class A and classifies it as Class A (see FIG. 4). 【0050】 Class B corresponds to medium importance and is a failure (abnormality) that affects performance while the device is operating, for example, corresponding to a picture distortion error. Class C corresponds to medium importance and is a failure (abnormality) in which the device is operating but a behavior exceeding the normal operation SPEC is confirmed, for example, corresponding to various BIST errors. The class classification unit 203 determines, for example, that at least one of an analog error, a logic error, and a memory error from the abnormality type specifying unit 202 corresponds to Class B or Class C and classifies it as Class B or Class C (see FIG. 4). Whether to classify an abnormality with medium importance into either Class B or Class C can be determined, for example, by the degree of change of the monitor signal corresponding to the abnormality with medium importance from the reference signal. For example, if the degree of change of the monitor signal corresponding to the abnormality with medium importance from the reference signal is large, the abnormality may be classified as Class B, and if it is small, the abnormality may be classified as Class C. 【0051】Class D corresponds to low severity, and the device appears to be operating normally, but there is a malfunction (abnormality) that triggers an error report, such as a data transmission error or an application lock error. The class classification unit 203 determines that at least one of a data error and an application error is corresponding to Class D when it receives such an error from the abnormality type identification unit 202, and classifies it as Class D (see Figure 4). 【0052】 (Classification Result Output Unit) As shown in Figure 2, the classification result output unit 204 outputs the class classification result (for example, one of classes A to D), which is the classification result from the class classification unit 203, to the processing unit 300. 【0053】 When the classification result output unit 204 outputs Class A as the class classification result to the processing unit 300, the CPU sends a stop trigger signal to the stop signal generation unit 301 of the processing unit 300. 【0054】 When the classification result output unit 204 outputs Class B or C due to an analog error as the class classification result to the processing unit 300, the CPU transmits an analog adjustment trigger signal to the adjustment unit 302 of the processing unit 300. 【0055】 When the classification result output unit 204 outputs a class B or C due to a logic error as the class classification result to the processing unit 300, the CPU sends a logic adjustment trigger signal to the adjustment unit 302 of the processing unit 300. 【0056】 When the classification result output unit 204 outputs a class B or C due to a memory error as the class classification result to the processing unit 300, the CPU sends a memory adjustment trigger signal to the adjustment unit 302 of the processing unit 300. 【0057】 When the classification result output unit 204 outputs class D due to a data error as the class classification result to the processing unit 300, the CPU sends a data error count trigger signal to the counter 303 of the processing unit 300. 【0058】When the classification result output unit 204 outputs Class D due to an application error as the class classification result to the processing unit 300, the CPU sends an application error count trigger signal to the counter 303 of the processing unit 300. 【0059】 Figure 6 is a block diagram showing an example configuration of the classification result output unit 204 of the determination unit 200 of the element device 10 according to Embodiment 1 of the first embodiment of this technology. In the example of Figure 6, the classification result output unit 204 has a plurality of (for example, four) output terminals (for example, output terminals 1 to 4) for outputting a plurality of classified classes. In this case, the classification result output unit 204 can, for example, output an output signal (stop request signal) from output terminal 1 to the processing unit 300 when the class classification result is class A, for example output an output signal (adjustment request signal) from output terminal 2 to the processing unit 300 when the class classification result is class B, for example output an output signal (adjustment request signal) from output terminal 3 to the processing unit 300 when the class classification result is class C, for example output an output signal (count request signal) from output terminal 4 to the processing unit 300 when the class classification result is class D. 【0060】 Figure 7 shows the output method 1 of the classification result output unit 204 of the determination unit 200 of the element device 10 according to Embodiment 1 of the first embodiment of this technology. In the example shown in Figure 7, the classification result output unit 204 outputs the class classification result to the processing unit 300 after multi-leveling (digitizing) it. Specifically, classes A to D can be multi-leveled at four different levels (for example, stop request level, adjustment request level 1, adjustment request level 2, and count request level) and output to the processing unit 300. 【0061】 Figure 8 shows the output method 2 of the classification result output unit 204 of the determination unit 200 of the element device 10 according to Embodiment 1 of the first embodiment of this technology. In the example shown in Figure 8, the classification result output unit 204 outputs the class classification result as a continuous value (analog output signal) to the processing unit 300. Specifically, classes A to D can be associated with four different output ranges of output signals. 【0062】Figure 9 shows an example of the configuration of the input and output of class classification results in an element device 10 according to Embodiment 1 of the first embodiment of this technology. In the example shown in Figure 9, the classification result output unit 204 transmits the data with the class classification result attached to the processing unit 300 (more specifically, the receiver 304 of the processing unit 300) via a transmission line (i.e., transmits it using a data transmission interface), and the processing unit 300 obtains the class classification result from the data. 【0063】 More specifically, in the example shown in Figure 9, the classification result output unit 204 is a driver that transmits the output data of the element unit 100, and the processing unit 300 has a receiver 304 that receives the data transmitted from the driver via a transmission line. The link layer on the driver side is configured to receive a control signal to add class information (class classification result) to the data (the output data) when an abnormality is detected. The link layer on the receiver side is configured to receive a control signal to acquire class information from the data with class information when an abnormality is detected and data with class information is input. Each control signal is input synchronously. Each control signal may be generated within the driver or may be input manually from an external source. 【0064】 In the driver, which acts as the classification result output unit 204, when an abnormality is detected and a control signal is input to the link layer, class information is added to the data input to the link layer, and the data with class information is sent to the physical layer. The data with class information sent to the physical layer is sent to the physical layer on the receiver 304 side via the transmission line. In the receiver 304, the class information is obtained from the data with class information sent from the physical layer at the link layer where the control signal was input. 【0065】 (Processing Unit) As shown in Figure 2, the processing unit 300 performs processing according to the class classification result from the determination unit 200 (specifically, the classification result output unit 204). The processing unit 300 includes the stop signal generation unit 301, the adjustment unit 302, and the counter 303 mentioned above. 【0066】When the stop signal generation unit 301 receives a stop trigger signal from the CPU, it generates a stop signal and outputs it to the element unit 100, thereby stopping the operation of the element unit 100. 【0067】 The adjustment unit 302 has adjustment functions for the analog circuit 102a and the logic circuit 102c. 【0068】 When the adjustment unit 302 receives an analog adjustment trigger signal from the CPU, it sends an analog adjustment signal as a drive parameter adjustment signal to the element unit 100 and adjusts the drive parameters of the analog circuit 102a. Specifically, the adjustment unit 302 may have a switching regulator, for example, as shown in Figure 10, which is a circuit that adjusts the output voltage (drive parameter) of the analog circuit 102a to a desired value when it fluctuates due to external noise or the like. The adjustment unit 302 may also have an input gain adjustment circuit that adjusts the gain of the input voltage (drive parameter) to the analog circuit 102a (analog gain adjustment), or a delay adjustment circuit that adjusts the delay (drive parameter) of the analog processing in the analog circuit 102a. 【0069】 When the adjustment unit 302 receives a logic adjustment trigger signal from the CPU, it sends a logic adjustment signal as a drive parameter adjustment signal to the element unit 100 and performs adjustment of the logic circuit 102c. Specifically, the adjustment unit 302 may have a switching regulator, for example, as shown in Figure 10, which is a circuit that adjusts the output level (drive parameter) of the logic circuit 102c to a desired value when it fluctuates due to external noise or the like. The adjustment unit 302 may also have a gain adjustment circuit that performs gain adjustment (digital gain adjustment) of the input level (drive parameter) to the logic circuit 102c, or a delay adjustment circuit that adjusts the delay (drive parameter) of the digital processing in the logic circuit 102c. 【0070】 When the adjustment unit 302 receives a memory adjustment trigger signal from the CPU, it sends a memory adjustment signal as a drive parameter adjustment signal to the element unit 100 and performs adjustment of the memory 102d. Specifically, the adjustment unit 302 performs adjustments to improve the memory's read / write operation. 【0071】When the counter 303 receives a data error count trigger signal from the CPU, it counts the number of times the determination unit 200 (specifically the anomaly detection unit 201) has detected a data error (specifically, it counts up). 【0072】 When the counter 303 receives an application error count trigger signal from the CPU, it counts the number of times the determination unit 200 (specifically the anomaly detection unit 201) has detected an application error (specifically, it counts up). 【0073】 <Operation of the Element Device> The operation of the element device 10 will be explained below with reference to the flowchart in Figure 11. The flowchart in Figure 11 (excluding step S1) also shows an example of an abnormality handling method related to this technology. The flowchart in Figure 11 is based on a processing algorithm performed by the CPU. 【0074】 In the first step S1, the CPU determines whether or not an abnormality has been detected by the determination unit 200 (specifically, the abnormality detection unit 201). If the determination in step S1 is affirmative, the process moves to step S2; otherwise, the same determination is repeated. 【0075】 In step S2, the determination unit 200 (specifically the abnormality type identification unit 202, the class classification unit 203, and the classification result output unit 204) performs a class classification process. Specifically, the determination unit 200 classifies the type of abnormality into a class according to the severity of the abnormality and outputs the classification result (class classification result). Details of the class classification process will be described later. 【0076】 In the next step, S3, the CPU determines whether the severity of the anomaly is high or not. Specifically, if the processing result (classification result) in the class classification process in step S2 is Class A, the determination in step S3 is affirmed, and a stop trigger signal is sent from the CPU to the stop signal generation unit 301. If the processing result (classification result) in the class classification process in step S2 is anything other than Class A, the determination in step S3 is denied. If the determination in step S3 is affirmed, the process proceeds to step S7; if it is denied, the process proceeds to step S4. 【0077】In step S4, the CPU determines whether the severity of the anomaly is moderate. Specifically, if the processing result (classification result) in the class classification process in step S2 is class B or class C, the determination in step S4 is affirmed. If the processing result (classification result) in the class classification process in step S2 is anything other than class A, class B, or class C (for example, class D due to a data error), the determination in step S4 is denied, and a data error count trigger signal is sent from the CPU to the counter 303. If the processing result (classification result) in the class classification process in step S2 is anything other than class A, class B, or class C (for example, class D due to an application error), the determination in step S4 is denied, and an application error count trigger signal is sent from the CPU to the counter 303. If the determination in step S4 is affirmed, the process proceeds to step S8; otherwise, the process proceeds to step S5. 【0078】 In step S5, the counter 303 increments the count (adds 1 to the count value) the number of times anomalies with low severity (for example, Class D due to a data error or Class D due to an application error) have been detected. Once step S5 is performed, the process proceeds to step S6. 【0079】 In step S6, the CPU determines whether the number of detected anomalies of low severity (e.g., Class D due to data errors or Class D due to application errors) is equal to or greater than a threshold (e.g., one or more times). If the determination is affirmative, the process proceeds to step S7; otherwise, it returns to step S1 (i.e., the operation of the element unit 100 continues). 【0080】 In step S7, the CPU stops the operation of the element unit 100. Specifically, the CPU sends a stop trigger signal to the stop signal generation unit 301. Upon receiving the stop trigger signal, the stop signal generation unit 301 generates a stop signal and stops the operation of the element unit 100. Once step S7 is performed, the flow ends. 【0081】In step S8, the CPU determines whether the drive parameters have been adjusted by the adjustment unit 302. Specifically, the CPU determines whether the same drive parameters as those of the analog circuit 102a, logic circuit 102c, or memory 102d related to an abnormality of medium severity (e.g., Class B or Class C) have been adjusted by the adjustment unit 302. If the determination is affirmative, the CPU sends a stop trigger signal to the stop signal generation unit 301, and the process proceeds to step S7. If the determination is negative, the CPU sends an adjustment trigger signal to the adjustment unit 302 to adjust the drive parameters related to the abnormality, and the process proceeds to step S9. 【0082】 In step S9, the adjustment unit 302 adjusts the drive parameters of the analog circuit 102a, logic circuit 102c, or memory 102d that are related to the abnormality of medium importance. At this time, the adjustment unit 302 determines the method of adjusting the drive parameters from the state of change of the monitor signal corresponding to the abnormality of medium importance from the reference signal. Once step S9 is performed, the process returns to step S1. That is, the operation of the element unit 100 continues. 【0083】 (Classification Process) The classification process (step S2 in Figure 11) will be explained below with reference to the flowchart in Figure 12. 【0084】 In the first step S2-1, the abnormality type identification unit 202 identifies the type of abnormality detected by the abnormality detection unit 201. Specifically, the abnormality type identification unit 202 extracts a monitor signal corresponding to the abnormality detected by the abnormality detection unit 201 and identifies the type of abnormality from the monitor signal. 【0085】 In the next step S2-2, the class classification unit 203 classifies the abnormality identified by the abnormality type identification unit 202 into a class (for example, one of classes A to D) according to the severity of the abnormality. 【0086】 In the final step S2-3, the class classification unit 203 outputs the class classification result to the processing unit 300. 【0087】 <Effects of the Element Device and Troubleshooting Method> The effects of the element device 10 and the troubleshooting method are described below. 【0088】 The element device 10 comprises an element unit 100, a determination unit 200 that detects abnormalities in the element unit 100 and determines the severity of the abnormality, and a processing unit 300 that executes processing according to the determination result of the determination unit 200. 【0089】 The element device 10 can perform processing according to the severity of the abnormality that occurs, thus providing an element device that can appropriately deal with various abnormalities. 【0090】 The importance level is based on the functional safety of the element unit 100. This allows the importance level to correspond to the level of functional safety, and enables processing according to the level of functional safety. 【0091】 The element unit 100 outputs multiple monitor signals to the determination unit 200, each indicating the status of multiple drive parameters of the element unit 100. The determination unit 200 monitors these multiple monitor signals to detect abnormalities. This allows for efficient and reliable detection of various abnormalities in the element unit 100. 【0092】 When the determination unit 200 detects an anomaly, it identifies the type of anomaly from multiple monitor signals, classifies the identification result into a class according to the severity of the anomaly, and outputs the classification result (class classification result) to the processing unit 300. The processing unit 300 then executes processing according to the classification result. This makes it possible to appropriately classify anomalies according to their severity and to perform processing according to the severity of the anomaly. 【0093】 The determination unit 200 may have multiple output terminals for outputting a plurality of classified classes. This allows the processing unit 300 to determine whether a corresponding class has been output based on the presence or level of signals from each output terminal. 【0094】 The determination unit 200 may output the class classification result to the processing unit 300 after converting it to a multi-level classification. This simplifies the input configuration on the processing unit 300 side. 【0095】 The determination unit 200 may output the class classification result as a continuous value to the processing unit 300. This simplifies the output configuration on the determination unit 200 side. 【0096】The determination unit 200 may transmit data with the classification result attached to it to the processing unit 300 via a transmission line, and the processing unit 300 may obtain the classification result from the data. This eliminates the need for a dedicated signal line to transmit the classification result. 【0097】 The processing unit 300 stops the operation of the element unit 100 if the determination result from the determination unit 200 indicates a high level of importance. This allows for maintenance and repair of the element unit 100 when a serious abnormality is detected in the element unit 100. 【0098】 The processing unit 300 has a counter that counts the number of times an abnormality is detected by the determination unit 200. When the determination result of the determination unit 200 indicates that the severity of the abnormality is low, the operation of the element unit 100 is stopped when the count value of the counter 303 is above a threshold, and the operation of the element unit 100 is continued when the count value is below the threshold. This allows for prioritizing the continued operation of the element unit 100 when the severity of an abnormality in the element unit 100 is low, and then performing maintenance and upkeep of the element unit 100 without underestimating the abnormality once it becomes somewhat frequent. 【0099】 The processing unit 300 has an adjustment unit 302 that adjusts each of a plurality of drive parameters. When the determination result from the determination unit 200 indicates that the severity of the abnormality is medium, the adjustment unit 302 adjusts the drive parameter related to the abnormality. This allows the device to drive the device 100 in a normal or near-normal state by adjusting the drive parameter when a not-so-serious abnormality in the device 100 is detected. 【0100】 The processing unit 300 stops the operation of the element unit 100 if the determination result from the determination unit 200 after adjusting the drive parameters indicates that the severity of the abnormality is medium. This allows for maintenance and repair of the element unit 100 if the abnormality cannot be resolved by adjusting the drive parameters. 【0101】 The abnormality handling method includes the steps of: determining the severity of an abnormality when an abnormality in the element unit 100 is detected; and executing processing according to the determination result in the determination step. 【0102】According to the anomaly handling method, processing can be performed according to the severity of the anomaly that occurs, making it possible to deal with various anomalies appropriately. 【0103】 The abnormality is detected by monitoring multiple monitor signals output by the element unit 100, which individually indicate the status of multiple drive parameters of the element unit 100. This allows for efficient and reliable detection of various abnormalities in the element unit 100. 【0104】 In the above determination process, the type of anomaly is identified from multiple monitor signals, the identification result is classified into a class according to the severity of the anomaly, and in the execution process, processing is performed according to the classification result of the class. This makes it possible to appropriately classify anomalies according to their severity and to perform processing according to the severity of the anomaly. 【0105】 In the above execution process, if the judgment result in the judgment process indicates a high degree of abnormality, the operation of the element unit 100 is stopped. This allows maintenance and repair of the element unit 100 to be performed when a serious abnormality is detected in the element unit 100. 【0106】 In the above execution process, the number of times an anomaly is detected is counted, and if the judgment result in the judgment process indicates that the severity of the anomaly is low, the operation of the element unit 100 is stopped when the number of times an anomaly is detected is above a threshold, and the operation of the element unit 100 is continued when the number of times an anomaly is detected is below the threshold. This allows for prioritizing the continued operation of the element unit 100 when the severity of an anomaly in the element unit 100 is low, and then performing maintenance and upkeep of the element unit 100 without underestimating the anomaly once it becomes somewhat frequent. 【0107】 In the execution process, if the determination result by the determination unit 200 indicates that the severity of the abnormality is medium, the drive parameters related to the abnormality are adjusted. This allows the drive parameters to be adjusted when a not-so-serious abnormality in the element unit 100 is detected, thereby resolving the abnormality and enabling the element unit 100 to be driven in a normal or near-normal state. 【0108】In the above execution process, if the determination result in the step of determining the drive parameters after adjustment indicates that the severity of the abnormality is medium, the drive of the element unit 100 is stopped. This allows maintenance and repair of the element unit 100 to be performed even if the abnormality is not resolved by adjusting the drive parameters. 【0109】 ≪2. Element device according to Example 2 of the first embodiment of this technology≫ Figure 13 is a block diagram showing the configuration of the element device 20 according to Example 2 of the first embodiment of this technology. 【0110】 The element device 20 has the same configuration as the element device 10 according to Embodiment 1, except that the processing unit 300 does not have an adjustment unit 302. 【0111】 In the element device 20, when the determination unit 200 transmits the classification results of Class A, Class B, and Class C to the processing unit 300, the CPU transmits a stop trigger signal to the stop signal generation unit 301 of the processing unit 300. 【0112】 In the element device 20, when the determination unit 200 transmits the classification result of Class D to the processing unit 300, the CPU transmits a count trigger signal (data error count trigger signal or application error count trigger signal) to the counter 303 of the processing unit 300. 【0113】 The operation of the element device 20 will be described below with reference to the flowchart in Figure 14. The flowchart in Figure 14 (excluding step S11) also shows an example of an abnormality handling method related to this technology. The flowchart in Figure 14 is based on a processing algorithm performed by the CPU. 【0114】 In the first step S11, the CPU determines whether or not an abnormality has been detected by the determination unit 200 (specifically, the abnormality detection unit 201). If the determination in step S11 is affirmative, the process proceeds to step S12; otherwise, the same determination is repeated. 【0115】In step S12, the determination unit 200 (specifically the abnormality type identification unit 202, the class classification unit 203, and the classification result output unit 204) performs a class classification process. Specifically, the determination unit 200 classifies the type of abnormality into a class according to the severity of the abnormality and outputs the classification result (class classification result). The details of the class classification process are as described above. 【0116】 In the next step, S13, the CPU determines whether the severity of the anomaly is high or medium. Specifically, if the processing result (classification result) in the class classification process in step S12 is Class A, Class B, or Class C, the determination in step S13 is affirmed, and a stop trigger signal is sent from the CPU to the stop signal generation unit 301. If the processing result (classification result) in the class classification process in step S12 is anything other than Class A, Class B, or Class C (i.e., Class D), the determination in step S13 is denied, and a count trigger signal (data error count trigger signal or application error count trigger signal) is sent from the CPU to the counter 303. If the determination in step S13 is affirmed, the process proceeds to step S16; otherwise, the process proceeds to step S14. 【0117】 In step S14, the counter 303 counts up the number of times anomalies with low severity (for example, Class D due to a data error or Class D due to an application error) have been detected (by adding 1 to the count value). Once step S14 is performed, the process proceeds to step S15. 【0118】 In step S15, the CPU determines whether the number of detected anomalies of low severity (e.g., Class D due to data errors or Class D due to application errors) is equal to or greater than a threshold (e.g., one or more times). If the determination is affirmative, the process proceeds to step S16; otherwise, it returns to step S11 (i.e., the operation of the element unit 100 continues). 【0119】In step S16, the CPU stops the operation of the element unit 100. Specifically, the CPU sends a stop trigger signal to the stop signal generation unit 301. Upon receiving the stop trigger signal, the stop signal generation unit 301 generates a stop signal and stops the operation of the element unit 100. Once step S16 is performed, the flow ends. 【0120】 According to the element device 20 described above, although it does not have an adjustment unit 302 and therefore cannot adjust the drive parameters related to abnormalities of medium importance to continue driving the element unit 100, the configuration and processing can be simplified. 【0121】 ≪3. Element device according to Example 3 of the first embodiment of this technology≫ Figure 15 is a block diagram showing the configuration of the element device 30 according to Example 3 of the first embodiment of this technology. 【0122】 The element device 30 has the same configuration as the element device 10 according to Embodiment 1, except that the processing unit 300 does not have a counter 303. 【0123】 In the element device 30, when the determination unit 200 transmits the classification result of Class D to the processing unit 300, no processing is performed (the element unit 100 continues to operate). 【0124】 The operation of the element device 30 will be described below with reference to the flowchart in Figure 16. The flowchart in Figure 16 (excluding step S21) also shows an example of an abnormality handling method related to this technology. The flowchart in Figure 16 is based on a processing algorithm performed by the CPU. 【0125】 In the first step S21, the CPU determines whether or not an abnormality has been detected by the determination unit 200 (specifically, the abnormality detection unit 201). If the determination in step S21 is affirmative, the process proceeds to step S22; otherwise, the same determination is repeated. 【0126】In step S22, the determination unit 200 (specifically the abnormality type identification unit 202, the class classification unit 203, and the classification result output unit 204) performs a class classification process. Specifically, the determination unit 200 classifies the type of abnormality into a class according to the severity of the abnormality and outputs the classification result (class classification result). The details of the class classification process are as described above. 【0127】 In the next step, S23, the CPU determines whether the severity of the anomaly is high or not. Specifically, if the processing result (classification result) in the class classification process in step S22 is Class A, the determination in step S23 is affirmed, and a stop trigger signal is sent from the CPU to the stop signal generation unit 301. If the processing result (classification result) in the class classification process in step S22 is anything other than Class A, the determination in step S23 is denied. If the determination in step S23 is affirmed, the process proceeds to step S26; if it is denied, the process proceeds to step S24. 【0128】 In step S24, the CPU determines whether the severity of the anomaly is moderate. Specifically, if the processing result (classification result) in the class classification process in step S22 is class B or class C, the determination in step S24 is affirmed. If the processing result (classification result) in the class classification process in step S22 is anything other than class A, class B, or class C (for example, class D due to a data error), the determination in step S24 is denied. If the processing result (classification result) in the class classification process in step S22 is anything other than class A, class B, or class C (for example, class D due to an application error), the determination in step S24 is denied. If the determination in step S24 is affirmed, the process proceeds to step S25; otherwise, it returns to step S21 (i.e., the operation of the element unit 100 continues). 【0129】 In step S26, the CPU stops the operation of the element unit 100. Specifically, the CPU sends a stop trigger signal to the stop signal generation unit 301. Upon receiving the stop trigger signal, the stop signal generation unit 301 generates a stop signal and stops the operation of the element unit 100. Once step S26 is performed, the flow ends. 【0130】In step S25, the CPU determines whether the drive parameters have been adjusted by the adjustment unit 302. Specifically, the CPU determines whether the same drive parameters as those of the analog circuit 102a, logic circuit 102c, or memory 102d related to an abnormality of medium severity (for example, class B or class C) have been adjusted by the adjustment unit 302. If the determination is affirmative, the CPU sends a stop trigger signal to the stop signal generation unit 301, and the process proceeds to step S26. If the determination is negative, the CPU sends an adjustment trigger signal to the adjustment unit 302 to adjust the drive parameters related to the abnormality, and the process proceeds to step S27. 【0131】 In step S27, the adjustment unit 302 adjusts the drive parameters of the analog circuit 102a or logic circuit 102c related to the abnormality of medium importance. At this time, the adjustment unit 302 determines the method of adjusting the drive parameters from the state of change of the monitor signal corresponding to the abnormality of medium importance from the reference signal. Once step S27 is performed, the process returns to step S21. That is, the drive of the element unit 100 continues. 【0132】 As described above, the element device 30 does not have a counter 303, and therefore cannot count the number of times anomalies of low importance are detected and perform processing according to that count value, but the configuration and processing can be simplified. 【0133】 ≪4. Element device according to Example 4 of the first embodiment of this technology≫ Figure 17 is a block diagram showing the configuration of the element device 40 according to Example 4 of the first embodiment of this technology. 【0134】 The element device 40 has the same configuration as the element device 10 according to Embodiment 1, except that the processing unit 300 does not have an adjustment unit 302 and a counter 303. 【0135】 In the element device 40, when the determination unit 200 transmits a classification result of Class A, Class B, or Class C to the processing unit 300, the CPU stops driving the element unit 100, and when the determination unit 200 transmits a classification result of Class D to the processing unit 300, the CPU maintains driving the element unit 100. 【0136】The operation of the element device 40 will be described below with reference to the flowchart in Figure 18. The flowchart in Figure 18 (excluding step S31) also shows an example of an abnormality handling method related to this technology. The flowchart in Figure 18 is based on a processing algorithm performed by the CPU. 【0137】 In the first step S31, the CPU determines whether or not an abnormality has been detected by the determination unit 200 (specifically, the abnormality detection unit 201). If the determination in step S31 is affirmative, the process proceeds to step S32; otherwise, the same determination is repeated. 【0138】 In step S32, the determination unit 200 (specifically the abnormality type identification unit 202, the class classification unit 203, and the classification result output unit 204) performs a class classification process. Specifically, the determination unit 200 classifies the type of abnormality into a class according to the severity of the abnormality and outputs the classification result (class classification result). The details of the class classification process are as described above. 【0139】 In the next step, S33, the CPU determines whether the severity of the anomaly is high or medium. Specifically, if the processing result (classification result) in the class classification process in step S32 is Class A, Class B, or Class C, the determination in step S33 is affirmed, and a stop trigger signal is sent from the CPU to the stop signal generation unit 301. If the processing result (classification result) in the class classification process in step S32 is anything other than Class A, Class B, or Class C (i.e., Class D), the determination in step S33 is denied. If the determination in step S33 is affirmed, the process proceeds to step S34; if denied, it returns to step S31 (i.e., the operation of the element unit 100 continues). 【0140】 In step S34, the CPU stops the operation of the element unit 100. Specifically, the CPU sends a stop trigger signal to the stop signal generation unit 301. Upon receiving the stop trigger signal, the stop signal generation unit 301 generates a stop signal and stops the operation of the element unit 100. Once step S34 is performed, the flow ends. 【0141】As described above, the element device 40 does not have an adjustment unit 302 and a counter 303, and therefore cannot adjust the drive parameters or perform processing according to the count value, but its configuration and processing can be greatly simplified. 【0142】 ≪5. Element device according to modification 1 of Example 1 of the first embodiment of this technology≫ Figure 19 is a block diagram showing the configuration of element device 10-1 according to modification 1 of Example 1 of the first embodiment of this technology. 【0143】 As shown in Figure 19, the element device 10-1 has the same configuration as the element device 10 according to Embodiment 1, except that the processing unit 300 has a stop / error signal generation unit 305 and an error notification unit 306 instead of a stop signal generation unit 301. 【0144】 In the element device 10-1, when the determination unit 200 outputs a Class A classification result to the processing unit 300, the CPU sends a stop trigger signal to the stop / error signal generation unit 305. Upon receiving the stop trigger signal, the stop / error signal generation unit 305 generates a stop signal and stops the operation of the element unit 100. 【0145】 In the element device 10-1, when the determination unit 200 outputs a classification result of Class B or Class C to the processing unit 300, the CPU sends an adjustment trigger signal (analog adjustment trigger signal, logic adjustment trigger signal, or memory adjustment trigger signal) to the adjustment unit 302. 【0146】 In the element device 10-1, when the determination unit 200 outputs a Class D classification result to the processing unit 300, the CPU sends a count trigger signal (data error count trigger signal or application error count trigger signal) to the counter 303. 【0147】Figure 20 is a flowchart illustrating the operation of the element device 10-1 according to Modification 1 of Example 1 of the First Embodiment of this Technology. As shown in Figure 20, when the judgment in step S6 is rejected, the CPU sends an error notification trigger signal to the stop / error signal generation unit 305, the stop / error signal generation unit 305 sends an error signal to the error notification unit 306, and the process proceeds to step S6.5. In step S6.5, the error notification unit 306, which has received the error signal from the stop / error signal generation unit 305, notifies the error. As a method of notifying the error, for example, an error display may be shown on the display unit, or an error notification sound may be output from the audio output unit including a speaker. When step S6.5 is performed, the flowchart ends. 【0148】 According to the element device 10-1 described above, when the number of detections of a specific abnormality of low severity is below a threshold, the element unit 100 is not driven and an error notification is issued. Therefore, even if the severity of the detected specific abnormality is low, the element device 10-1 can be maintained and preserved with utmost care. 【0149】 6. Element device according to modification 1 of Example 2 of the first embodiment of this technology. Figure 21 is a block diagram showing the configuration of the element device 20-1 according to modification 1 of Example 2 of the first embodiment of this technology. 【0150】 As shown in Figure 21, the element device 20-1 has the same configuration as the element device 20 according to Embodiment 2, except that the processing unit 300 has a stop / error signal generation unit 305 and an error notification unit 306 instead of a stop signal generation unit 301. 【0151】 In the element device 20-1, when the determination unit 200 outputs a classification result of Class A, Class B, or Class C to the processing unit 300, the CPU sends a stop trigger signal to the stop / error signal generation unit 305. Upon receiving the stop trigger signal, the stop / error signal generation unit 305 generates a stop signal and stops the operation of the element unit 100. 【0152】In the element device 20-1, when the determination unit 200 outputs a Class D classification result to the processing unit 300, the CPU sends a count trigger signal (data error count trigger signal or application error count trigger signal) to the counter 303. 【0153】 Figure 22 is a flowchart illustrating the operation of the element device 20-1 according to Modification 1 of Example 2 of the First Embodiment of this Technology. As shown in Figure 22, when the judgment in step S15 is rejected, the CPU sends an error notification trigger signal to the stop / error signal generation unit 305, the stop / error signal generation unit 305 sends an error signal to the error notification unit 306, and the process proceeds to step S17. In step S17, the error notification unit 306, which has received the error signal from the stop / error signal generation unit 305, notifies the error. As a method of notifying the error, for example, an error may be displayed on the display unit, or an error notification sound may be output from the audio output unit including a speaker. When step S17 is executed, the flowchart ends. 【0154】 According to the element device 20-1 described above, when the number of detections of a specific abnormality of low severity is below a threshold, the element unit 100 is not driven and an error notification is issued. Therefore, even if the severity of the detected specific abnormality is low, the element device 20-1 can be maintained and preserved with utmost care. 【0155】 7. Element device according to a modified example of Example 3 of the first embodiment of this technology. Figure 23 is a block diagram showing the configuration of element device 30-1 according to a modified example of Example 3 of the first embodiment of this technology. 【0156】 As shown in Figure 23, the element device 30-1 has the same configuration as the element device 30 according to Embodiment 3, except that the processing unit 300 has a stop / error signal generation unit 305 and an error notification unit 306 instead of a stop signal generation unit 301. 【0157】In the element device 30-1, when the determination unit 200 outputs a Class A classification result to the processing unit 300, the CPU sends a stop trigger signal to the stop / error signal generation unit 305. Upon receiving the stop trigger signal, the stop / error signal generation unit 305 generates a stop signal and stops the operation of the element unit 100. 【0158】 In the element device 30-1, when the determination unit 200 outputs a classification result of Class B or Class C to the processing unit 300, the CPU sends an adjustment trigger signal (analog adjustment trigger signal, logic adjustment trigger signal, or memory adjustment trigger signal) to the adjustment unit 302. 【0159】 In the element device 30-1, when the determination unit 200 outputs a classification result of Class D to the processing unit 300, the CPU sends an error notification trigger signal to the stop / error signal generation unit 305. 【0160】 Figure 24 is a flowchart illustrating the operation of the element device 30-1 according to a modified example of Embodiment 3 of the first embodiment of this technology. As shown in Figure 24, when the judgment in step S24 is rejected, the CPU sends an error notification trigger signal to the stop / error signal generation unit 305, the stop / error signal generation unit 305 sends an error signal to the error notification unit 306, and the process proceeds to step S25.5. In step S25.5, the error notification unit 306, which has received the error signal from the stop / error signal generation unit 305, notifies the error. As a method of notifying the error, for example, an error may be displayed on the display unit, or an error notification sound may be output from the audio output unit including a speaker. When step S25.5 is executed, the flowchart ends. 【0161】 According to the element device 30-1 described above, when a low-grade abnormality is detected, the element unit 100 is not driven and an error notification is issued. Therefore, even if the detected abnormality is of low severity, the element device 30-1 can be maintained and serviced with utmost care. 【0162】 ≪8. Element device according to modification 1 of Example 4 of the first embodiment of this technology≫ Figure 25 is a block diagram showing the configuration of the element device 40-1 according to modification 1 of Example 4 of the first embodiment of this technology. 【0163】 As shown in Figure 25, the element device 40-1 has the same configuration as the element device 40 according to Embodiment 4, except that the processing unit 300 has a stop / error signal generation unit 305 and an error notification unit 306 instead of a stop signal generation unit 301. 【0164】 In the element device 40-1, when the determination unit 200 outputs a classification result of Class A, Class B, or Class C to the processing unit 300, the CPU sends a stop trigger signal to the stop / error signal generation unit 305. Upon receiving the stop trigger signal, the stop / error signal generation unit 305 generates a stop signal and stops the operation of the element unit 100. 【0165】 In the element device 40-1, when the determination unit 200 outputs a classification result of Class D to the processing unit 300, the CPU sends an error notification trigger signal to the stop / error signal generation unit 305. 【0166】 Figure 26 is a flowchart illustrating the operation of the element device 40-1 according to Modification 1 of Example 4 of the First Embodiment of this Technology. As shown in Figure 26, when the judgment in step S33 is rejected, the CPU sends an error notification trigger signal to the stop / error signal generation unit 305, the stop / error signal generation unit 305 sends an error signal to the error notification unit 306, and the process proceeds to step S35. In step S35, the error notification unit 306, which has received the error signal from the stop / error signal generation unit 305, notifies the error. As a method of notifying the error, for example, an error may be displayed on the display unit, or an error notification sound may be output from the audio output unit including a speaker. When step S35 is executed, the flowchart ends. 【0167】 According to the element device 40-1 described above, when a low-grade abnormality is detected, the element unit 100 is not driven and an error notification is issued. Therefore, even if the detected abnormality is of low severity, the element device 40-1 can be maintained and serviced with utmost care. 【0168】 9. Element device according to modified example 2 of the first embodiment of this technology. Figure 27 is a block diagram showing the configuration of the element device 10-2 according to modified example 2 of the first embodiment of this technology. 【0169】 As shown in Figure 27, the element device 10-2 has the same configuration as the element device 10 according to Embodiment 1, except that the determination unit 200 has a storage unit 205 for storing the class classification results. 【0170】 In the device 10-2, the class classification unit 203 stores the class classification result (for example, one of classes A to D) in the storage unit 205, and the classification result output unit 204 reads the class classification result from the storage unit 205 and outputs it to the processing unit 300. 【0171】 Alternatively, instead of providing the memory unit 205, the CPU may temporarily store the class classification results in a register and then read them. 【0172】 ≪10. Element device according to modification 3 of Example 1 of the first embodiment of this technology≫ Figure 28 is a block diagram showing the configuration of element device 10-3 according to modification 3 of Example 1 of the first embodiment of this technology. 【0173】 As shown in Figure 28, the element device 10-3 has the same configuration as the element device 10 according to Embodiment 1, except that the processing unit 300 has a storage unit 307 for storing class classification results. 【0174】 In the device 10-3, the CPU can store the class classification result (for example, one of classes A to D) from the determination unit 200 in the storage unit 307, and the CPU can read the class classification result from the storage unit 307 and perform processing according to the class classification result. 【0175】 Alternatively, instead of providing the memory unit 307, the CPU may temporarily store the class classification results in a register and then read them. 【0176】 ≪11. Element device according to modified example 2 of the first embodiment of this technology≫ Figure 29 is a block diagram showing the configuration of the element device 20-2 according to modified example 2 of the first embodiment of this technology. 【0177】As shown in Figure 29, the element device 20-2 has the same configuration as the element device 20-1 according to the modified example 1 of Embodiment 2, except that the CPU sends an error notification trigger signal to the stop / error signal generation unit 305 when the class classification result is Class B or Class C. 【0178】 In the device 20-2, the stop / error signal generation unit 305, upon receiving an error notification trigger signal from the CPU, transmits an error signal to the error notification unit 306. Upon receiving the error signal, the error notification unit 306 issues an error notification. 【0179】 According to the element device 20-2, if the class classification result is Class B or Class C, an error notification can be issued without stopping the operation of the element unit 100, and the maintenance and upkeep of the element unit 100 can be entrusted to the user. 【0180】 ≪12. Element device according to modification 2 of Example 4 of the first embodiment of this technology≫ Figure 30 is a block diagram showing the configuration of the element device 40-2 according to modification 2 of Example 4 of the first embodiment of this technology. 【0181】 As shown in Figure 30, the element device 40-2 has the same configuration as the element device 40-1 according to the modification 1 of Embodiment 4, except that the CPU sends an error notification trigger signal to the stop / error signal generation unit 305 when the class classification result is Class B or Class C. 【0182】 In the device 40-2, the stop / error signal generation unit 305, upon receiving an error notification trigger signal from the CPU, transmits an error signal to the error notification unit 306. Upon receiving the error signal, the error notification unit 306 issues an error notification. 【0183】 According to the element device 40-2, if the class classification result is Class B or Class C, an error notification can be issued without stopping the operation of the element unit 100, and maintenance and upkeep of the element unit 100 can be entrusted to the user. <13. Element device according to the second embodiment of this technology> Figure 31 is a block diagram showing the configuration of the element device 5 according to the second embodiment of this technology. 【0184】As an example, the element device 5 constitutes a camera monitoring system comprising a camera module 171 and a display device 172. The element device 5 is an application example of the input / output configuration shown in Figure 9. 【0185】 The camera module 171 and the display device 172 are located remotely, and video data is transmitted serially from the camera module 171 to the display device 172 via a serial transmission path. For example, GVIF2 (Non-patent document: JEITA CP-6101B) is used as the format of the serial transmission signal transmitted via the serial transmission path. 【0186】The camera module 171 has a mixed-signal integrated circuit 160 that includes an oscillator 161. The output of the oscillator 161 is divided by a frequency divider circuit 168 and supplied as a camera clock from the mixed-signal integrated circuit 160 to the image sensor 1712 (element) and the element section including the monitor signal output unit. The image sensor 1712 generates video data based on the image formed by the lens 1711 and sends it to the encoder 1713, which is part of the logic circuit 169 of the mixed-signal integrated circuit 160. The video signal encoded by the encoder 1713 is converted into a serial bit sequence by a parallel-to-serial converter 165 driven by a high-speed transmission clock obtained by multiplying the output of the oscillator 161 by a frequency multiplier circuit 164, and output as a transmission signal from the camera module 171 by a driver 1714 of the determination unit. At this time, when the determination unit detects an abnormality from the monitor signal from the monitor signal output unit, it adds class information (class classification result) to the transmission signal at the driver 1714 using a control signal and outputs a transmission signal with class information. The transmission signal or transmission signal with class information output from the camera module 171 is input to the receiver 1721 of the processing unit in the display device 172. If it is a transmission signal, it is used as is; if it is a transmission signal with class information, the class information is acquired by a control signal, and then the serial bit sequence and high-speed transmission clock are reproduced. The high-speed transmission clock is converted to a video clock by the frequency divider circuit 1722 and supplied to the serial-parallel converter 1723, decoder 1724, and LCD panel 1725. The serial bit sequence is converted back into video data by the serial-parallel converter 1723 and decoder 1724 and supplied to the LCD panel 1725. The LCD panel 1725 displays the monitoring image based on the video clock and video data. When the processing unit acquires class information (class classification result), it performs processing according to the class information. Examples of this processing include sending an error signal to the LCD panel 1725 to display an error, sending a stop signal to the element unit to stop the operation of the element unit, and sending an adjustment signal to the element unit to adjust the operation parameters of the element unit. 【0187】According to the element device 5 described above, a camera monitoring system can be realized that can appropriately deal with the severity of the abnormality that occurs. 【0188】 ≪14. Mobile device according to the third embodiment of this technology≫ 【0189】 Figure 32 shows an example configuration of a mobile device 1 (object device) according to the third embodiment of this technology. The mobile device 1 includes, as an example, a plurality of cameras and a vehicle (e.g., an automobile) as a mobile body on which the plurality of cameras are mounted. 【0190】 The mobile device 1 includes a mobile control system that includes a camera monitoring system similar to the element device 5 according to the second embodiment. Reference numeral 181 denotes a side monitoring camera, reference numeral 182 denotes a rear monitoring camera, reference numeral 183 denotes an electronic side mirror, reference numeral 184 denotes a front monitoring and distance measuring camera, reference numeral 185 denotes a relay and video integration device, and reference numeral 186 denotes a display device. Images captured by cameras 181 to 184 are selected or integrated by the video integration device 185. If necessary, alert figures indicating hazardous materials obtained from distance measuring information are superimposed and displayed on the display device 186. This mobile control system can be used for automated driving, including, for example, auto braking, auto steering, and auto acceleration. 【0191】 Although the first to third embodiments have been described above, this technology is not limited to these embodiments and can be modified as appropriate. 【0192】 For example, classification may be done by importance level (so that there is a one-to-one correspondence between class and importance). The number of classifications is not limited to four and can be changed as appropriate. The degree of importance is not limited to three levels (high, medium, low) and can be changed as appropriate. 【0193】 For example, some of the configurations of the element devices according to each embodiment of the first and second embodiments described above may be combined within a range that is not contradictory to one another. 【0194】In the first to third embodiments described above, an image sensor was used as an example of element 101, but other elements such as light-emitting elements, light-receiving elements, and image display elements may also be used. In this case as well, the control circuit may include a power supply circuit, an analog circuit (processing circuit or drive circuit), a logic circuit, a memory (memory circuit), a monitor signal output unit, etc., as appropriate. 【0195】 ≪15. Examples of Use of Element Devices Applying This Technology≫ Figure 33 shows an example of use when an element device relating to this technology (for example, an element device according to the first and second embodiments) includes a solid-state imaging device (image sensor). 【0196】 Each of the embodiments described above can be used in various cases of sensing light such as visible light, infrared light, ultraviolet light, and X-rays, for example, as shown below. That is, as shown in Figure 33, it can be used in devices used in fields such as the field of viewing images for viewing purposes, the field of transportation, the field of home appliances, the field of medical care and healthcare, the field of security, the field of beauty, the field of sports, and the field of agriculture. 【0197】 Specifically, in the field of appreciation, for example, the element device according to this technology can be used in devices for capturing images intended for appreciation, such as digital cameras, smartphones, and mobile phones with camera functions. 【0198】 In the field of transportation, for example, the element device relating to this technology can be used in devices used for traffic purposes, such as in-vehicle sensors that photograph the front, rear, surroundings, and interior of a vehicle for safe driving such as automatic stopping, and for recognizing the driver's condition; surveillance cameras that monitor moving vehicles and roads; and distance measuring sensors that measure the distance between vehicles. 【0199】 In the field of home appliances, for example, the element device related to this technology can be used in devices used in home appliances such as television sets, refrigerators, and air conditioners to capture user gestures and perform device operations according to those gestures. 【0200】In the medical and healthcare fields, for example, the element device related to this technology can be used in devices used for medical and healthcare purposes, such as endoscopes and devices that perform angiography using infrared light reception. 【0201】 In the field of security, for example, the element device related to this technology can be used in security devices such as surveillance cameras for crime prevention and cameras for person authentication. 【0202】 In the field of beauty, for example, the element device related to this technology can be used in devices used for beauty purposes, such as skin measuring devices for photographing skin or microscopes for photographing the scalp. 【0203】 In the field of sports, for example, the element device according to this technology can be used in devices used for sports, such as action cameras and wearable cameras for sports applications. 【0204】 In the field of agriculture, for example, the element device according to this technology can be used in devices used for agricultural purposes, such as cameras for monitoring the condition of fields and crops. 【0205】 Next, specific examples of the use of the element device (for example, the element device according to the first and second embodiments) related to this technology will be described. For example, the element device according to the first and second embodiments described above can be applied as a solid-state imaging device 501 to any type of electronic device equipped with an imaging function, such as a camera system such as a digital still camera or a video camera, or a mobile phone with an imaging function. Figure 34 shows a schematic configuration of an electronic device 510 (camera) as an example. This electronic device 510 is, for example, a video camera capable of shooting still images or moving images, and includes a solid-state imaging device 501, an optical system (optical lens) 502, a shutter device 503, a drive unit 504 that drives the solid-state imaging device 501 and the shutter device 503, and a signal processing unit 505. 【0206】The optical system 502 guides the image light (incident light) from the subject to the pixel area of ​​the solid-state imaging device 501. This optical system 502 may be composed of multiple optical lenses. The shutter device 503 controls the light irradiation period and the light shielding period for the solid-state imaging device 501. The drive unit 504 controls the transfer operation of the solid-state imaging device 501 and the shutter operation of the shutter device 503. The signal processing unit 505 performs various signal processing on the signal output from the solid-state imaging device 501. The processed video signal Dout is stored in a storage medium such as memory, or output to a monitor or the like. 【0207】 ≪16. Other Use Examples of Devices Applying This Technology≫ Devices relating to this technology (for example, devices according to the first and second embodiments) can also be applied to other electronic devices that detect light, such as TOF (Time Of Flight) sensors (for example, distance measuring devices). When applied to TOF sensors, for example, it can be applied to distance image sensors using the direct TOF measurement method and distance image sensors using the indirect TOF measurement method. In distance image sensors using the direct TOF measurement method, since the arrival timing of photons is directly determined in the time domain at each pixel, a short pulse width optical pulse is transmitted and an electrical pulse is generated by a receiver that responds quickly. This disclosure can be applied to the receiver in that case. In the indirect TOF method, the time of flight of light is measured using a semiconductor device structure in which the detection and storage amount of carriers generated by light change depending on the arrival timing of the light. This disclosure can also be applied as such a semiconductor structure. When applied to TOF sensors, the provision of a color filter and a microlens array is optional and they do not need to be provided. 【0208】≪17. Examples of Application to Objects≫ The technology relating to this disclosure (this technology) can be applied to various products (objects). For example, the technology relating to this disclosure may be realized as a device mounted on any of the above-mentioned types of mobile objects such as automobiles, electric vehicles, hybrid electric vehicles, motorcycles, bicycles, personal mobility devices, airplanes, drones, ships, and robots, or on low-power devices (e.g., smartphones, smartwatches, tablets, laptops, eyewear (e.g., head-mounted displays), etc.). 【0209】 Figure 35 is a block diagram showing a schematic configuration example of a vehicle control system, which is an example of a mobile control system to which the technology described herein may be applied. 【0210】 The vehicle control system 12000 comprises a plurality of electronic control units connected via a communication network 12001. In the example shown in Figure 35, the vehicle control system 12000 includes a drive system control unit 12010, a body system control unit 12020, an external information detection unit 12030, an internal information detection unit 12040, and an integrated control unit 12050. The functional configuration of the integrated control unit 12050 is shown in the figure, which includes a microcomputer 12051, an audio / image output unit 12052, and an in-vehicle network interface 12053. 【0211】 The drivetrain control unit 12010 controls the operation of devices related to the vehicle's drivetrain according to various programs. For example, the drivetrain control unit 12010 functions as a control device for a drivetrain generating device that generates driving force for the vehicle, such as an internal combustion engine or a drive motor; a drivetrain transmission mechanism that transmits driving force to the wheels; a steering mechanism that adjusts the steering angle of the vehicle; and a braking device that generates braking force for the vehicle. 【0212】The body system control unit 12020 controls the operation of various devices mounted on the vehicle body according to various programs. For example, the body system control unit 12020 functions as a control device for a keyless entry system, a smart key system, a power window system, or various lamps such as headlights, reverse lights, brake lights, turn signals, or fog lights. In this case, the body system control unit 12020 may receive radio waves transmitted from a portable device that replaces a key or signals from various switches. The body system control unit 12020 receives these radio waves or signals and controls the vehicle's door lock system, power window system, lamps, etc. 【0213】 The external information detection unit 12030 detects information from outside the vehicle equipped with the vehicle control system 12000. For example, an imaging unit 12031 is connected to the external information detection unit 12030. The external information detection unit 12030 causes the imaging unit 12031 to capture images of the outside of the vehicle and receives the captured images. Based on the received images, the external information detection unit 12030 may perform object detection processing such as detecting people, cars, obstacles, signs, or characters on the road surface, or distance detection processing. 【0214】 The imaging unit 12031 is a light sensor that receives light and outputs an electrical signal corresponding to the amount of light received. The imaging unit 12031 can output the electrical signal as an image or as distance measurement information. The light received by the imaging unit 12031 may be visible light or invisible light such as infrared light. 【0215】 The in-vehicle information detection unit 12040 detects information inside the vehicle. The in-vehicle information detection unit 12040 is connected to, for example, a driver status detection unit 12041 that detects the driver's state. The driver status detection unit 12041 includes, for example, a camera that captures images of the driver, and the in-vehicle information detection unit 12040 may calculate the driver's level of fatigue or concentration, or determine whether the driver is drowsy, based on the detection information input from the driver status detection unit 12041. 【0216】The microcomputer 12051 can calculate control target values ​​for the drive force generator, steering mechanism, or braking device based on information inside and outside the vehicle acquired by the external information detection unit 12030 or the internal information detection unit 12040, and output control commands to the drive system control unit 12010. For example, the microcomputer 12051 can perform cooperative control aimed at realizing ADAS (Advanced Driver Assistance System) functions, including vehicle collision avoidance or impact mitigation, following driving based on distance between vehicles, maintaining vehicle speed, vehicle collision warning, or vehicle lane departure warning. 【0217】 Furthermore, the microcomputer 12051 can perform cooperative control for purposes such as autonomous driving, where the vehicle drives autonomously without driver intervention, by controlling the drive force generating device, steering mechanism, or braking device, etc., based on information about the vehicle's surroundings acquired by the external information detection unit 12030 or the internal information detection unit 12040. 【0218】 Furthermore, the microcomputer 12051 can output control commands to the body system control unit 12020 based on external information acquired by the external information detection unit 12030. For example, the microcomputer 12051 can control the headlights according to the position of a preceding or oncoming vehicle detected by the external information detection unit 12030, and perform coordinated control aimed at reducing glare, such as switching from high beams to low beams. 【0219】 The audio-image output unit 12052 transmits at least one of audio and image output signals to an output device capable of visually or audibly notifying information to the vehicle's occupants or to those outside the vehicle. In the example shown in Figure 35, the output devices are exemplified as an audio speaker 12061, a display unit 12062, and an instrument panel 12063. The display unit 12062 may include, for example, at least one of an onboard display and a head-up display. 【0220】 Figure 36 shows an example of the installation position of the imaging unit 12031. 【0221】In Figure 36, the vehicle 12100 has imaging units 12101, 12102, 12103, 12104, and 12105 as the imaging unit 12031. 【0222】 The imaging units 12101, 12102, 12103, 12104, and 12105 are installed, for example, on the front nose, side mirrors, rear bumper, back door, and the upper part of the windshield inside the vehicle 12100. The imaging unit 12101 installed on the front nose and the imaging unit 12105 installed on the upper part of the windshield inside the vehicle mainly acquire images of the front of the vehicle 12100. The imaging units 12102 and 12103 installed on the side mirrors mainly acquire images of the sides of the vehicle 12100. The imaging unit 12104 installed on the rear bumper or back door mainly acquires images of the rear of the vehicle 12100. The forward images acquired by imaging units 12101 and 12105 are mainly used for detecting preceding vehicles, pedestrians, obstacles, traffic lights, traffic signs, or lanes. 【0223】 Figure 36 shows an example of the imaging ranges of imaging units 12101 to 12104. Imaging range 12111 indicates the imaging range of imaging unit 12101 located on the front nose, imaging ranges 12112 and 12113 indicate the imaging ranges of imaging units 12102 and 12103 located on the side mirrors, respectively, and imaging range 12114 indicates the imaging range of imaging unit 12104 located on the rear bumper or back door. For example, by superimposing the image data captured by imaging units 12101 to 12104, an overhead view image of the vehicle 12100 can be obtained. 【0224】 At least one of the imaging units 12101 to 12104 may have a function for acquiring distance information. For example, at least one of the imaging units 12101 to 12104 may be a stereo camera consisting of multiple image sensors, or an image sensor having pixels for phase difference detection. 【0225】For example, the microcomputer 12051, based on distance information obtained from the imaging units 12101 to 12104, can determine the distance to each object within the imaging range 12111 to 12114 and the temporal change of this distance (relative speed to the vehicle 12100). In particular, it can extract the closest object on the vehicle 12100's path that is traveling in approximately the same direction as the vehicle 12100 at a predetermined speed (e.g., 0 km / h or more) as the preceding vehicle. Furthermore, the microcomputer 12051 can set a predetermined distance to be maintained before the preceding vehicle and perform automatic braking control (including follow-and-stop control) and automatic acceleration control (including follow-and-start control), etc. In this way, cooperative control aimed at autonomous driving, etc., that drives autonomously without driver operation, can be performed. 【0226】 For example, the microcomputer 12051 can use distance information obtained from imaging units 12101 to 12104 to classify and extract three-dimensional object data related to three-dimensional objects, such as motorcycles, passenger cars, large vehicles, pedestrians, utility poles, and other three-dimensional objects, and use this data for automatic obstacle avoidance. For example, the microcomputer 12051 identifies obstacles around the vehicle 12100 into obstacles that are visible to the driver of the vehicle 12100 and obstacles that are difficult to see. The microcomputer 12051 then determines the collision risk, which indicates the degree of risk of collision with each obstacle. If the collision risk is above a set value and there is a possibility of collision, the microcomputer 12051 can provide driving assistance to avoid collisions by outputting a warning to the driver via the audio speaker 12061 or the display unit 12062, or by performing forced deceleration or evasive steering via the drive system control unit 12010. 【0227】At least one of the imaging units 12101 to 12104 may be an infrared camera that detects infrared light. For example, the microcomputer 12051 can recognize pedestrians by determining whether or not pedestrians are present in the images captured by the imaging units 12101 to 12104. Such pedestrian recognition is performed, for example, by a procedure to extract feature points from the images captured by the imaging units 12101 to 12104 as infrared cameras, and a procedure to perform pattern matching on a series of feature points that indicate the contour of an object to determine whether or not it is a pedestrian. When the microcomputer 12051 determines that a pedestrian is present in the images captured by the imaging units 12101 to 12104 and recognizes a pedestrian, the audio-image output unit 12052 controls the display unit 12062 to superimpose a rectangular contour line for emphasis on the recognized pedestrian. The audio-image output unit 12052 may also control the display unit 12062 to display an icon indicating a pedestrian at a desired position. 【0228】 The above describes an example of a vehicle control system to which the technology relating to this disclosure (this technology) may be applied. The technology relating to this disclosure can be applied to, for example, the imaging unit 12031, among the configurations described above. Specifically, the solid-state imaging device 501 of this disclosure can be applied to the imaging unit 12031. By applying the technology relating to this disclosure to the imaging unit 12031, it is possible to improve yield and reduce manufacturing costs. 【0229】 ≪18. Application Examples to Endoscopic Surgical Systems≫ This technology can be applied to various products. For example, the technology disclosed herein (this technology) may be applied to an endoscopic surgical system. 【0230】 Figure 37 is a diagram showing an example of a schematic configuration of an endoscopic surgical system to which the technology described herein (the technology) may be applied. 【0231】Figure 37 illustrates a surgeon (physician) 11131 performing surgery on a patient 11132 on a patient bed 11133 using an endoscopic surgical system 11000. As shown in the figure, the endoscopic surgical system 11000 consists of an endoscope 11100, other surgical instruments 11110 such as an insufflation tube 11111 and an energy treatment device 11112, a support arm device 11120 for supporting the endoscope 11100, and a cart 11200 equipped with various devices for endoscopic surgery. 【0232】 The endoscope 11100 consists of a barrel 11101, the tip of which is inserted into the body cavity of the patient 11132 for a predetermined length, and a camera head 11102 connected to the base end of the barrel 11101. In the illustrated example, the endoscope 11100 is shown as a so-called rigid endoscope having a rigid barrel 11101, but the endoscope 11100 may also be configured as a so-called flexible endoscope having a flexible barrel. 【0233】 An opening into which an objective lens is fitted is provided at the tip of the microscope tube 11101. A light source device 11203 is connected to the endoscope 11100, and the light generated by the light source device 11203 is guided to the tip of the microscope tube by a light guide extending inside the microscope tube 11101, and is irradiated through the objective lens towards the object to be observed inside the body cavity of the patient 11132. The endoscope 11100 may be a straight-viewing endoscope, an oblique-viewing endoscope, or a side-viewing endoscope. 【0234】 The camera head 11102 contains an optical system and an image sensor. Reflected light from the object being observed (observation light) is focused onto the image sensor by the optical system. The image sensor converts the observation light into electrical signals, generating an electrical signal corresponding to the observation light, i.e., an image signal corresponding to the observed image. This image signal is transmitted as RAW data to the camera control unit (CCU) 11201. 【0235】The CCU 11201 is composed of a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), and other components, and comprehensively controls the operation of the endoscope 11100 and the display device 11202. Furthermore, the CCU 11201 receives an image signal from the camera head 11102 and performs various image processing operations on that image signal, such as development processing (demosaic processing), to display the image based on that image signal. 【0236】 The display device 11202 displays an image based on an image signal that has been processed by the CCU 11201, under control from the CCU 11201. 【0237】 The light source device 11203 consists of a light source such as an LED (Light Emitting Diode) and supplies illumination light to the endoscope 11100 when photographing the surgical area, etc. 【0238】 The input device 11204 is an input interface for the endoscopic surgical system 11000. The user can input various types of information and instructions to the endoscopic surgical system 11000 via the input device 11204. For example, the user can input instructions to change the imaging conditions (type of light, magnification, focal length, etc.) of the endoscope 11100. 【0239】 The treatment instrument control device 11205 controls the drive of the energy treatment instrument 11112 for purposes such as tissue cauterization, incision, or blood vessel sealing. The insufflation device 11206 injects gas into the body cavity of the patient 11132 via the insufflation tube 11111 to inflate the body cavity for the purpose of securing a field of view by the endoscope 11100 and securing the operator's workspace. The recorder 11207 is a device capable of recording various information related to the surgery. The printer 11208 is a device capable of printing various information related to the surgery in various formats such as text, images, or graphs. 【0240】The light source device 11203 that supplies illumination light to the endoscope 11100 when photographing the surgical area can be configured as a white light source consisting of, for example, an LED, a laser light source, or a combination thereof. When the white light source is configured as a combination of RGB laser light sources, the output intensity and output timing of each color (each wavelength) can be controlled with high precision, so the white balance of the captured image can be adjusted in the light source device 11203. In this case, it is also possible to capture images corresponding to each of the RGB colors in time-division by irradiating the observation target with laser light from each of the RGB laser light sources in time-division and controlling the drive of the image sensor of the camera head 11102 in synchronization with the irradiation timing. According to this method, a color image can be obtained without providing a color filter on the image sensor. 【0241】 Furthermore, the light source device 11203 may be controlled to change the intensity of the light it outputs at predetermined time intervals. By controlling the drive of the image sensor of the camera head 11102 in synchronization with the timing of the change in light intensity, images can be acquired in time-division order, and these images can be combined to generate high dynamic range images without so-called black crushing and white clipping. 【0242】Furthermore, the light source device 11203 may be configured to supply light in a predetermined wavelength band corresponding to special light observation. In special light observation, for example, by utilizing the wavelength dependence of light absorption in body tissue and irradiating with narrow-band light compared to the irradiation light used in normal observation (i.e., white light), so-called narrow-band imaging is performed to image predetermined tissues such as blood vessels on the surface of mucosa with high contrast. Alternatively, in special light observation, fluorescence observation may be performed to obtain an image from fluorescence generated by irradiation with excitation light. In fluorescence observation, excitation light is irradiated onto body tissue and fluorescence from the body tissue is observed (autofluorescence observation), or a reagent such as indocyanine green (ICG) is injected into body tissue and excitation light corresponding to the fluorescence wavelength of the reagent is irradiated onto the body tissue to obtain a fluorescence image. The light source device 11203 may be configured to supply narrow-band light and / or excitation light corresponding to such special light observation. 【0243】 Figure 38 is a block diagram showing an example of the functional configuration of the camera head 11102 and CCU 11201 shown in Figure 37. 【0244】 The camera head 11102 includes a lens unit 11401, an imaging unit 11402, a drive unit 11403, a communication unit 11404, and a camera head control unit 11405. The CCU 11201 includes a communication unit 11411, an image processing unit 11412, and a control unit 11413. The camera head 11102 and the CCU 11201 are connected to each other via a transmission cable 11400 so that they can communicate with each other. 【0245】 The lens unit 11401 is an optical system provided at the connection point with the lens barrel 11101. Observation light taken in from the tip of the lens barrel 11101 is guided to the camera head 11102 and then incident on the lens unit 11401. The lens unit 11401 is composed of a combination of multiple lenses, including a zoom lens and a focus lens. 【0246】The imaging unit 11402 is composed of image sensors. The imaging unit 11402 may consist of one image sensor (a so-called single-chip type) or multiple image sensors (a so-called multi-chip type). If the imaging unit 11402 is composed of multiple chips, for example, each image sensor may generate image signals corresponding to RGB, and these may be combined to obtain a color image. Alternatively, the imaging unit 11402 may be configured to have a pair of image sensors for acquiring image signals for the right eye and left eye, respectively, corresponding to 3D (Dimensional) display. By performing 3D display, the surgeon 11131 can more accurately grasp the depth of the biological tissue in the surgical area. In addition, if the imaging unit 11402 is composed of multiple chips, multiple lens units 11401 may also be provided corresponding to each image sensor. 【0247】 Furthermore, the imaging unit 11402 does not necessarily have to be located on the camera head 11102. For example, the imaging unit 11402 may be located inside the lens barrel 11101, directly behind the objective lens. 【0248】 The drive unit 11403 is composed of actuators and, under control from the camera head control unit 11405, moves the zoom lens and focus lens of the lens unit 11401 along the optical axis by a predetermined distance. This allows the magnification and focus of the image captured by the imaging unit 11402 to be adjusted as appropriate. 【0249】 The communication unit 11404 is composed of communication devices for sending and receiving various types of information with the CCU 11201. The communication unit 11404 transmits the image signal obtained from the imaging unit 11402 as RAW data to the CCU 11201 via the transmission cable 11400. 【0250】 Furthermore, the communication unit 11404 receives a control signal from the CCU 11201 to control the drive of the camera head 11102 and supplies it to the camera head control unit 11405. The control signal includes information about imaging conditions, such as information to specify the frame rate of the captured image, information to specify the exposure value at the time of imaging, and / or information to specify the magnification and focus of the captured image. 【0251】 The imaging conditions such as frame rate, exposure value, magnification, and focus may be specified by the user as appropriate, or they may be automatically set by the control unit 11413 of the CCU 11201 based on the acquired image signal. In the latter case, the endoscope 11100 will be equipped with so-called AE (Auto Exposure), AF (Auto Focus), and AWB (Auto White Balance) functions. 【0252】 The camera head control unit 11405 controls the driving of the camera head 11102 based on the control signal received from the CCU 11201 via the communication unit 11404. 【0253】 The communication unit 11411 is comprised of a communication device for sending and receiving various types of information with the camera head 11102. The communication unit 11411 receives image signals transmitted from the camera head 11102 via the transmission cable 11400. 【0254】 Furthermore, the communication unit 11411 transmits control signals to the camera head 11102 to control the driving of the camera head 11102. Image signals and control signals can be transmitted by telecommunications, optical communications, etc. 【0255】 The image processing unit 11412 performs various image processing operations on the image signal, which is RAW data transmitted from the camera head 11102. 【0256】 The control unit 11413 performs various controls related to imaging the surgical area, etc., by the endoscope 11100, and the display of the images obtained from imaging the surgical area, etc. For example, the control unit 11413 generates a control signal to control the driving of the camera head 11102. 【0257】Furthermore, the control unit 11413 displays the captured image showing the surgical area, etc., on the display device 11202 based on the image signal processed by the image processing unit 11412. At this time, the control unit 11413 may recognize various objects in the captured image using various image recognition technologies. For example, the control unit 11413 can recognize surgical instruments such as forceps, specific biological sites, bleeding, mist when using the energy treatment device 11112, etc., by detecting the shape and color of the edges of objects included in the captured image. When the control unit 11413 displays the captured image on the display device 11202, it may use the recognition results to superimpose various surgical support information onto the image of the surgical area. By superimposing the surgical support information and presenting it to the surgeon 11131, the burden on the surgeon 11131 can be reduced, and the surgeon 11131 can proceed with the surgery reliably. 【0258】 The transmission cable 11400 connecting the camera head 11102 and the CCU 11201 is an electrical signal cable compatible with electrical signal communication, an optical fiber compatible with optical communication, or a composite cable thereof. 【0259】 In the illustrated example, communication was performed via a wired connection using a transmission cable 11400, but communication between the camera head 11102 and the CCU 11201 may be performed wirelessly. 【0260】 The above describes an example of an endoscopic surgical system to which the technology relating to this disclosure may be applied. The technology relating to this disclosure can be applied to the endoscope 11100, the camera head 11102 (and its imaging unit 11402), etc., among the configurations described above. Specifically, the solid-state imaging device 111 of this disclosure can be applied to the imaging unit 10402. By applying the technology relating to this disclosure to the endoscope 11100, the camera head 11102 (and its imaging unit 11402), etc., it is possible to improve yield and reduce manufacturing costs. 【0261】 Here, an endoscopic surgical system has been described as an example, but the technology relating to this disclosure may also be applied to other systems, such as microsurgical systems. 【0262】Furthermore, this technology can also take the following configurations: (1) An element device comprising: an element unit; a determination unit that detects an abnormality in the element unit and determines the severity of the abnormality; and a processing unit that performs processing according to the determination result of the determination unit. (2) The element device according to (1), wherein the severity is based on the functional safety of the element unit. (3) The element device according to (1) or (2), wherein the element unit outputs a plurality of monitor signals that individually indicate the status of a plurality of drive parameters of the element unit, and the determination unit monitors the plurality of monitor signals to detect the abnormality. (4) The element device according to (3), wherein when the determination unit detects the abnormality, it identifies the type of abnormality from the plurality of monitor signals, classifies the identification result into a class according to the severity, outputs the classification result to the processing unit, and the processing unit performs processing according to the classification result. (5) The element device according to (4), wherein the determination unit has a plurality of output terminals for outputting the plurality of classified classes. (6) The element device according to (4) or (5), wherein the determination unit outputs the classification result to the processing unit after converting it to a multi-level value. (7) The element device according to (4) or (5), wherein the determination unit outputs the classification result to the processing unit as a continuous value. (8) The element device according to any one of (4) to (7), wherein a storage unit for storing the classification result is provided. (9) The element device according to any one of (4) to (8), wherein the determination unit transmits data with the classification result attached to it to the processing unit via a transmission line, and the processing unit obtains the classification result from the data. (10) The element device according to any one of (1) to (9), wherein the processing unit stops driving the element unit if the determination result indicates a high importance. (11) The device according to any one of (1) to (10), wherein the processing unit has a counter that counts the number of times the determination unit has detected the abnormality, and when the determination result indicates that the severity of the abnormality is low, the device stops driving the element unit when the count value of the counter is equal to or greater than a threshold, and continues driving the element unit or issues an error notification when the count value is less than the threshold.(12) The element device according to any one of (3) to (11), wherein the processing unit has an adjustment unit that adjusts each of the plurality of drive parameters, and when the determination result is that the severity of the abnormality is medium, the adjustment unit adjusts the drive parameter related to the abnormality. (13) The element device according to (12), wherein the processing unit stops the driving of the element unit or issues an error notification when the determination result after the adjustment of the drive parameters is that the severity is medium. (14) An object device comprising: an element unit; a determination unit that detects an abnormality in the element unit and determines the severity of the abnormality; and a processing unit that performs processing according to the determination result in the determination unit; and an object on which the element device is mounted. (15) An abnormality handling method comprising: a step of determining the severity of the abnormality when an abnormality in the element unit is detected; and a step of performing processing according to the determination result in the determination step. (16) The abnormality is detected by monitoring a plurality of monitor signals output by the element unit, each indicating the status of a plurality of drive parameters of the element unit individually, as described in (15). (17) The abnormality is detected by monitoring a plurality of monitor signals output by the element unit, each indicating the status of a plurality of drive parameters of the element unit individually, as described in (15). (18) The abnormality is detected by monitoring a plurality of monitor signals output by the element unit, each indicating the status of a plurality of drive parameters of the element unit individually, as described in (15). (19) The abnormality is detected by monitoring a plurality of monitor signals output by the element unit individually, as described in (15). (16) The abnormality is detected by monitoring a plurality of monitor signals output by the element unit, each indicating the status of a plurality of drive parameters of the element unit individually, as described in (15). (17) The abnormality is detected by monitoring a plurality of monitor signals output by the element unit, each indicating the status of a plurality of drive parameters of the element unit individually, as described in (15). (18) (20) The abnormality handling method according to any one of (15) to (19), wherein in the step of execution, if the determination result is that the severity of the abnormality is medium, the drive parameter related to the abnormality is adjusted.(21) The abnormality handling method according to (20), wherein in the execution step, if the determination result after adjusting the drive parameters is of medium importance, the drive of the element is stopped. (22) The abnormality handling method according to (17) to (21), wherein in the determination step, at least two of the classified plurality of classes are output from different output terminals. (23) The abnormality handling method according to any one of (17) to (22), wherein in the determination step, the classification result is output as a multi-level value. (24) The abnormality handling method according to any one of (17) to (22), wherein in the determination step, the classification result is output as a continuous value. (25) The abnormality handling method according to any one of (17) to (24), wherein in the determination step, the classification result is saved, and in the execution step, the saved classification result is read. (26) The abnormality handling method according to any one of (17) to (25), wherein in the determination step, data to which the classification result has been added is transmitted, and in the execution step, the classification result is obtained from the data. 【0263】 1: Mobile device (object device) 5, 10, 10-1, 10-2, 10-3, 20, 20-1, 20-2, 30, 30-1, 40-1, 40-2: Element device 100: Element unit 200: Determination unit 300: Processing unit 302: Adjustment unit 303: Counter 205, 307: Memory unit

Claims

1. An element device comprising: an element unit; a determination unit that detects an abnormality in the element unit and determines the severity of the abnormality; and a processing unit that performs processing according to the determination result of the determination unit.

2. The element device according to claim 1, wherein the importance is based on the functional safety of the element portion.

3. The element unit outputs a plurality of monitor signals to the determination unit that individually indicate the status of a plurality of drive parameters of the element unit, and the determination unit monitors the plurality of monitor signals to detect the abnormality, as described in claim 1.

4. The element device according to claim 3, wherein when the determination unit detects the abnormality, it identifies the type of abnormality from the plurality of monitor signals, classifies the identification result into a class according to its severity, outputs the classification result to the processing unit, and the processing unit performs processing according to the classification result.

5. The device according to claim 4, wherein the determination unit has a plurality of output terminals for outputting a plurality of classified classes.

6. The element device according to claim 4, wherein the determination unit converts the classification result into a multi-level and outputs it to the processing unit.

7. The element device according to claim 4, wherein the determination unit outputs the classification result as a continuous value to the processing unit.

8. The element device according to claim 4, further comprising a storage unit for storing the classification results.

9. The element device according to claim 4, wherein the determination unit transmits the data to which the classification result has been added to the processing unit via a transmission line, and the processing unit obtains the classification result from the data.

10. The element device according to claim 1, wherein the processing unit stops driving the element unit when the determination result indicates high importance.

11. The device according to claim 1, wherein the processing unit has a counter that counts the number of times the determination unit has detected the abnormality, and when the determination result indicates that the severity of the abnormality is low, the device stops driving the element unit when the count value of the counter is equal to or greater than a threshold, and continues driving the element unit or issues an error notification when the count value is less than the threshold.

12. The element device according to claim 3, wherein the processing unit has an adjustment unit that adjusts each of the plurality of drive parameters, and when the determination result indicates that the severity of the abnormality is medium, the adjustment unit adjusts the drive parameter related to the abnormality.

13. The element device according to claim 12, wherein the processing unit stops the driving of the element or issues an error notification when the determination result after adjusting the driving parameters is of medium importance.

14. An object device comprising: an element unit; a determination unit that detects an abnormality in the element unit and determines the severity of the abnormality; and a processing unit that performs processing according to the determination result of the determination unit; and an object on which the element device is mounted.

15. An abnormality handling method comprising: a step of determining the severity of an abnormality when an abnormality in an element is detected; and a step of performing processing according to the determination result in the determination step.

16. The abnormality is detected by monitoring a plurality of monitor signals output by the element unit, which individually indicate the status of a plurality of drive parameters of the element unit, the method for dealing with abnormalities according to claim 15.

17. The abnormality handling method according to claim 15, wherein in the determination step, the type of abnormality is identified from the plurality of monitor signals, the identification result is classified into a class according to the severity, and in the execution step, processing is performed according to the classification result of the class.

18. The abnormality handling method according to claim 15, wherein in the step of execution, if the determination result is of high importance, the driving of the element is stopped.

19. The abnormality handling method according to claim 15, wherein in the step of execution, the number of times the abnormality is detected is counted, and if the determination result is that the severity of the abnormality is low, the operation of the element unit is stopped when the number of detections is equal to or greater than a threshold, and the operation of the element unit is continued or an error notification is issued when the number of detections is less than the threshold.

20. The abnormality handling method according to claim 15, wherein in the step of execution, if the determination result indicates that the severity of the abnormality is medium, the drive parameter related to the abnormality is adjusted.

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