An n-type SiC and AlGaN heterojunction suppresses leakage current by optimizing the aluminum composition ratio in the second semiconductor layer.
An oxide current blocking layer stabilizes operating voltage and prevents current concentration in vertical LEDs, ensuring reliable light emission.
A light emitting element uses a light-transmissive reinforcing portion on the semiconductor layer upper face to increase edge strength.
Patterned electron blocking regions prevent electron overflow while hole injection regions facilitate carrier transport, resolving efficiency trade-offs.
Anisotropic conductive adhesive film replaces high-pressure wafer bonding, resolving heat dissipation trade-offs while ensuring uniform current distribution.
Segmented AlN and SiN dielectrics in trench gates resolve MOCVD PECVD processing incompatibility while maintaining low on-resistance.
A semiconductor light emitting element uses a segmented reflection layer with varying thicknesses to optimize optical performance.
A super junction semiconductor device employs a shallow trench gate structure to reduce gate charge density.
A silicon carbide guard ring uses higher p-type impurity concentration at corner portions to suppress charge trapping.
Segmenting the gate into a trench region and an independent field plate reduces gate-to-source leakage and device variability in silicon carbide substrates.
Triangular GaN chip geometry reduces total internal reflection at sidewalls to increase light extraction efficiency.
Localized P-type doping enhances breakdown voltage for N-type devices and reduces ON resistance for P-type variants without adding process masks.
Lateral lightly doped drift regions merge with vertical trench structures to reduce gate-to-drain capacitance and on-resistance in power MOSFETs.
A semiconductor light emitting apparatus uses a reflective n-side electrode layer overlapping the p-side electrode to redirect emitted light.
Embed optoelectronic semiconductor chips into mold compounds using recessed carriers and film-assisted transfer molding to maintain electrical connectivity.
A nitride semiconductor component uses a growth substrate with three-dimensional surface structures to direct epitaxial layer deposition.
A metasurface with nanostructures bends near-infrared light at high angles to increase absorption in thin silicon pixels.
Oblique insulating surfaces on silicon carbide regions suppress electric field concentration to improve breakdown voltage and mobility.
Internal metallic wiring in resin layers replaces external bonding wires, reducing device volume while maintaining mechanical strength for reliable mounting.
Deep recesses with specific depth ratios improve crystal quality and reduce sodium impurities in nitride semiconductors.
A unipolar heterojunction transistor uses a graphene base layer to transport electrons with high mobility and low resistance.
Pre-bake processes reshape FinFET spacers to facilitate horizontal epitaxial growth, preventing etch-through during contact plug formation.
Segmenting phosphor layers reduces mutual absorption losses, improving conversion efficiency and color rendering in luminescence conversion LEDs.