A TIS fast test method for multi-probe OTA test system

Abstract

The application discloses a kind of TIS fast test methods for multi-probe OTA test system.It includes the following steps: in the process of testing the TIS of first antenna probe, the TIS value of each antenna probe is obtained;And as the estimated EIS value of each antenna probe in the TIS of second antenna probe, the estimated EIS value of first antenna issued by the instrument through antenna probe;According to the difference between the final EIS value of first antenna probe and EIS1, further compensation is obtained to obtain the estimated EIS value data closer to the real EIS, and the EIS of each antenna is obtained according to EIS2 test;According to the EIS of each antenna probe, spherical area integration and average are obtained to final TIS.The application tests the TIS value of first antenna probe first, estimates all antenna probes according to the difference between the estimated EIS value of first antenna probe and the EIS value of second antenna probe, reduces the number of test error rate, improves test efficiency, and improves the test speed of TIS in OTA test.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of terminal testing, in particular relates to a TIS rapid testing method for a multi-probe OTA testing system. BACKGROUND

[0002] In the prior art, the process of testing TIS is as follows: 1. After the terminal and the instrument establish connection through the antenna probe, the EIS value of each antenna probe is tested first; 2. Then the EIS values of the antenna probes are integrated and averaged; 3. The process of testing the EIS value of each antenna probe is as follows: the instrument sends a large level value through the antenna probe, and the terminal feeds back the bit error rate; 4. According to the size of the bit error rate, the instrument reduces or increases the level value, and sends it to the terminal again through the antenna probe; 5-6 steps are required to reduce and increase the level value to obtain the level value that meets the bit error rate of the terminal, and the level value is taken as the final EIS value of the antenna probe; 5. In the 5-6 steps, the time of testing the bit error rate of each step is relatively long, which leads to a long testing time and a slow testing speed of the EIS value of each antenna probe, and finally a long testing time and a slow testing speed of TIS. SUMMARY

[0003] The present application aims to provide a TIS rapid testing method for a multi-probe OTA testing system, which tests the TIS value of the first antenna probe first, estimates all the antenna probes according to the difference between the estimated EIS value of the first antenna probe and the EIS value of the second antenna probe, reduces the number of testing bit error rates, improves the testing efficiency, and improves the testing speed of TIS in OTA testing.

[0004] To solve the above technical problems, the present application is realized by the following technical scheme:

[0005] The present application is a TIS rapid testing method for a multi-probe OTA testing system, which comprises the following steps:

[0006] Stp1, testing the TIS of the first antenna probe, comprising the following sub-steps:

[0007] SS01, the instrument and the terminal establish connection through the antenna probe and then perform testing;

[0008] SS02, the instrument sends a level value through the antenna probe, and the terminal feeds back the bit error rate;

[0009] SS03, according to the size of the bit error rate, the instrument reduces or increases the level value, and sends it to the terminal again through the antenna probe;

[0010] SS04, repeat step SS03 until the terminal satisfies the bit error rate level value, and take the value as the final EIS value of the antenna probe;

[0011] Stp2, obtain the estimated EIS value of the antenna probe;

[0012] In the process of testing the TIS of the first antenna probe, the EIS value of each antenna probe is obtained; the data is extracted and taken as the estimated EIS value of each antenna probe in the TIS of the second antenna probe, denoted as EIS1;

[0013] Stp3, obtain the final EIS value of the first antenna according to the test of EIS1;

[0014] The instrument sends the estimated EIS value of the first antenna, i.e. the level value of EIS1, through the antenna probe; the terminal feedback bit error rate is tested, and the level is lowered or raised according to the size of the bit error rate until the terminal feedback satisfies the bit error rate level value, i.e. the final EIS value of the first antenna is obtained;

[0015] Stp4, further correct the estimated EIS value of each antenna probe;

[0016] According to the difference between the final EIS value of the first antenna probe and EIS1, the estimated EIS value data closer to the real EIS is further compensated, i.e. EIS2 of each antenna probe;

[0017] Stp5, obtain the EIS of each antenna according to EIS2;

[0018] The instrument sends the estimated EIS value of each antenna probe, i.e. the level of EIS2, through the antenna probe; the terminal feedback bit error rate is tested; and the level is lowered or raised according to the size of the bit error rate until the terminal feedback satisfies the bit error rate level value, i.e. the EIS value of each antenna is obtained;

[0019] Stp6, obtain TIS;

[0020] According to the EIS of each antenna probe, the spherical area is divided and averaged to obtain the final TIS.

[0021] Preferably, the terminal device adopts a computer or a single-chip microcomputer.

[0022] The present application has the following beneficial effects:

[0023] The present application tests the TIS value of the first antenna probe first, estimates all the antenna probes according to the difference between the estimated EIS value of the first antenna probe and the EIS value of the second antenna probe, reduces the number of bit error rate tests, improves the test efficiency, and improves the test speed of TIS in OTA test.

[0024] Of course, implementing any product of the application does not necessarily require achieving all the advantages described above at the same time. BRIEF DESCRIPTION OF DRAWINGS

[0025] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without any creative effort based on these drawings.

[0026] Figure 1 A flow chart of a TIS fast test method for a multi-probe OTA test system of the present application. DETAILED DESCRIPTION

[0027] The technical solutions in the embodiments of the present application will be described clearly and completely in the following with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without any creative effort belong to the protection scope of the present application.

[0028] Please refer to Figure 1 The present application is a TIS fast test method for a multi-probe OTA test system, which comprises the following steps:

[0029] Stp1, testing TIS of a first antenna probe, comprising the following sub-steps:

[0030] SS01, the instrument and the terminal establish connection through the antenna probe and then perform testing;

[0031] SS02, the instrument issues a level value through the antenna probe, and the terminal feeds back a bit error rate;

[0032] SS03, according to the size of the bit error rate, the instrument reduces or increases the level value, and then issues the level value to the terminal through the antenna probe again;

[0033] SS04, repeating step SS03 until the level value satisfying the bit error rate of the terminal is obtained, and the level value is taken as the final EIS value of the antenna probe;

[0034] Stp2, obtaining the estimated EIS value of the antenna probe;

[0035] In the process of testing TIS of the first antenna probe, the EIS value of each antenna probe is obtained; the data is extracted and taken as the estimated EIS value of each antenna probe in the TIS of the second antenna probe, which is recorded as EIS1;

[0036] Stp3, the final EIS value of the first antenna is obtained according to the EIS1 test;

[0037] The instrument sends the estimated EIS value of the first antenna, i.e. the level value of EIS1, through the antenna probe, tests the error rate feedback of the terminal, and then lowers or raises the level according to the size of the error rate until the terminal feedback satisfies the level value of the error rate, i.e. the final EIS value of the first antenna is obtained. Since the estimated EIS is close to the real EIS, only 3 times of error rate test are generally required.

[0038] Stp4, the estimated EIS value of each antenna probe is further corrected;

[0039] According to the difference between the final EIS value of the first antenna probe and EIS1, the estimated EIS value data closer to the real EIS is further compensated, i.e. EIS2 of each antenna probe; the computer is calculated synchronously, and the system test time is not counted.

[0040] Stp5, the EIS of each antenna is obtained according to EIS2;

[0041] The instrument sends the estimated EIS value of each antenna probe, i.e. the level of EIS2, through the antenna probe, tests the error rate feedback of the terminal, and then lowers or raises the level according to the size of the error rate until the terminal feedback satisfies the level value of the error rate, i.e. the EIS value of each antenna is obtained. Generally, only 3 times of error rate test are required. The error rate test time of each antenna probe is reduced by 2-3 times. Since the estimated EIS is close to the real EIS, only 2-3 times of error rate test are generally required. The error rate test time of each antenna probe is reduced by 3 times on average.

[0042] Stp6, TIS is obtained;

[0043] According to the EIS of each antenna probe, the final TIS is obtained by spherical area integration and averaging.

[0044] The terminal device adopts a computer or a single-chip microcomputer.

[0045] One specific application of the embodiment is:

[0046] It is worth noting that in the above system embodiment, each unit included is only divided according to the function logic, but is not limited to the above division, as long as the corresponding function can be realized. In addition, the specific names of each functional unit are only for easy mutual differentiation, and do not limit the protection scope of the present application.

[0047] In addition, those skilled in the art can understand that all or part of the steps in the above-mentioned method of each embodiment can be completed by a program instructing relevant hardware, and the corresponding program can be stored in a computer readable storage medium, such as ROM / RAM, magnetic disk or optical disk, etc.

[0048] The preferred embodiments of the application disclosed above are only used to help explain the application. The preferred embodiments do not describe all the details and limit the application to the specific embodiments described. Obviously, many modifications and variations can be made according to the content of the specification. The specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the application, so that those skilled in the art can well understand and utilize the application. The application is limited only by the claims and their full scope and equivalents.

Claims

1. A rapid TIS testing method for a multi-probe OTA testing system, characterized in that, Includes the following steps: Stp1, Test the TIS of the first antenna probe, including the following sub-steps: SS01. The instrument and terminal establish a connection through the antenna probe and then conduct the test; SS02: The instrument sends a level value through the antenna probe, and the terminal feeds back the bit error rate. SS03. Depending on the bit error rate, the instrument lowers or raises the voltage level and transmits it to the terminal again through the antenna probe. SS04. Repeat step SS03 until the terminal obtains a level value that meets the bit error rate, and use it as the final EIS value of the first antenna probe; Stp2, obtain the estimated EIS value of the antenna probe; During the TIS test of the first antenna probe, the EIS value of each first antenna probe is obtained; the EIS value of each first antenna probe is taken as the estimated EIS value in the TIS test of each second antenna probe, and is denoted as EIS1; Stp3, Obtain the final EIS value of the first antenna based on the EIS1 test; The instrument transmits the estimated EIS value of the first antenna, i.e., the level value of EIS1, through the antenna probe. The test obtains the bit error rate from the terminal feedback. Then, based on the magnitude of the bit error rate, the level is lowered or raised until the terminal feedback level value meets the bit error rate, which is the final EIS value of the first antenna. Stp4, further refine the estimated EIS value for each antenna probe; Based on the difference between the final EIS value of the first antenna probe and EIS1, further compensation is made to obtain the predicted EIS value data that is closer to the true EIS, namely the EIS2 of each antenna probe. Stp5, obtain the EIS of each antenna based on the EIS2 test; The instrument sends the estimated EIS value (i.e., the EIS2 level) of each antenna probe through the antenna probe, and tests to obtain the terminal feedback bit error rate; then, according to the magnitude of the bit error rate, the level is lowered or raised; until the terminal feedbacks a level value that meets the bit error rate, that is, the EIS value of each antenna is obtained; Stp6, obtain TIS; Based on the EIS of each antenna probe, the spherical surface integral and average are used to obtain the final TIS.

2. The TIS rapid testing method for a multi-probe OTA testing system according to claim 1, characterized in that, The terminal is a computer or a microcontroller.

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