Contact probe debugging device and debugging method thereof

Abstract

The present invention provides a contact probe debugging device and debugging method thereof. The contact probe includes a probe body, a stylus, and a stylus ball. The contact probe debugging device comprises: a clamping mechanism comprising a fixed end and a lifting end, the fixed end being used to horizontally fix the contact probe; the lifting end being connected to the fixed end and being used to adjust the height of the fixed end and the contact probe; a measuring mechanism comprising a debugging platform, a displacement sensor, and a sensor adjustment member. The debugging platform is disposed below the stylus ball with its debugging end positioned relative to the stylus ball and being used to drive the stylus ball to move vertically; the displacement sensor is disposed above the stylus ball and relative to the stylus ball, the measurement direction of the displacement sensor being parallel to the movement direction of the stylus ball; and the sensor adjustment member is connected to the displacement sensor. The contact probe debugging device of the present invention can detect the stability of the stylus signal triggering when the stylus ball is installed at different angles relative to the probe body, thereby selecting an appropriate angle for installing the stylus ball.

Description

Technical Field

[0001] The present invention relates to the technical field of contact probes, and in particular to a contact probe debugging device and a debugging method thereof. Background Art

[0002] In-situ measurement eliminates the need for secondary clamping of parts, avoiding installation errors and deformation errors caused by secondary clamping. This significantly shortens the part processing cycle and significantly improves production efficiency while ensuring machine tool processing accuracy. As a precision measuring instrument, the contact probe is a key component of in-situ measurement technology, and its accuracy directly affects the accuracy of in-situ measurement. Therefore, the contact probe needs to be debugged before use to select the appropriate installation angle for the probe to trigger the stability signal.

[0003] For example, patent CN101750005A develops an automatic flexible inspection system based on a contact probe, which includes an adjustable tooling, a probe holder, a contact probe, a controller, software and a main control computer. The system uses an adjustable flexible tooling to fix the workpiece and a contact probe with a communication port to measure relative dimensional errors. The probe is installed on a probe holder that can freely adjust the probe posture. Through the controller, one or more probes are connected to the main control computer. The main control computer controls the collection and processing of measurement data to realize automatic detection of workpiece errors. The system software has the ability to perform statistics on measurement data and provide the information required for statistical process control, and realize adaptive calibration of the system.

[0004] Existing contact probes all have installation methods similar to those described in the aforementioned patents. They are all installed as a monolithic structure on machine tools. Workpieces on machine tools generally have the ability to move in the X, Y, and Z directions. In actual use, when the stylus ball of the contact probe abuts the workpiece through the sidewall, the workpiece can approach the stylus ball in both the X and Y directions. The horizontal installation angle of the stylus ball varies, and the amount of movement required to trigger the stylus signal also varies. Because the pre-travel of the stylus trigger signal is very small and difficult to measure with conventional equipment, existing machine tools can only roughly adjust the overall installation position of the contact probe after installation. However, these machines lack a stylus ball adjustment device, making it impossible to adjust the stylus ball's installation angle. This makes it impossible to effectively ensure high trigger accuracy and stability for some high-precision machining machines. Therefore, a device is needed to adjust the stylus ball of the contact probe so as to select the appropriate installation angle of the stylus ball relative to the probe body. Summary of the Invention

[0005] In view of this, it is necessary to provide a contact probe debugging device and an angle debugging method thereof to solve the technical problem in the prior art that the contact probe cannot debug the installation angle of the stylus ball relative to the probe body.

[0006] In order to achieve the above technical objectives, the technical solution of the present invention provides a contact probe debugging device, the contact probe comprising a probe body, a stylus and a stylus ball, and comprising:

[0007] A clamping mechanism comprising a fixed end and a lifting end, wherein the fixed end is used to horizontally fix the contact probe, and the lifting end is connected to the fixed end and is used to adjust the height of the fixed end and the contact probe;

[0008] A measuring mechanism includes a debugging platform, a displacement sensor, and a sensor adjustment member. The debugging platform is disposed below the stylus ball, with its debugging end disposed relative to the stylus ball, for driving the stylus ball to move in a vertical direction. The displacement sensor is disposed above the stylus ball and relative to the stylus ball. The displacement sensor has a measuring direction parallel to the direction of movement of the stylus ball and is used to detect the amount of movement of the stylus ball when the stylus head body outputs a stable signal. The sensor adjustment member is connected to the displacement sensor to adjust the position of the displacement sensor relative to the stylus ball.

[0009] The auxiliary measuring mechanism includes a transition plate and an adjustment end thereof. The transition plate is arranged between the measuring ball and the displacement sensor. The adjustment end is connected to the transition plate and is used to drive the upper and lower ends of the transition plate to abut against the displacement sensor and the measuring ball respectively, so that the measuring ball and the detection end of the displacement sensor are aligned.

[0010] Furthermore, it also includes a fixed base, which is arranged below the measuring mechanism and the auxiliary measuring mechanism and opposite to the clamping mechanism, and is used to support and fix the measuring mechanism and the auxiliary measuring mechanism.

[0011] Furthermore, the clamping mechanism includes a fixed box, a sliding rod and a fixed sleeve, the fixed end is the fixed box, the lifting end is the sliding rod, the fixed box is provided with a receiving groove for fixing the probe body in the horizontal direction, one end of the probe body can be rotatably inserted in the receiving groove, the sliding rod is vertically arranged at the bottom of the fixed box and one end thereof is connected to the fixed box, the fixed sleeve is arranged at the bottom of the fixed box and is provided with a sliding groove in the vertical direction, the other end of the sliding rod is slidably inserted in the sliding groove for adjusting the height of the fixed box and the probe body.

[0012] Furthermore, the debugging platform is a micro-motion measurement platform, and the micro-motion measurement platform is arranged on the fixed base and relative to the measuring ball.

[0013] Furthermore, it also includes a supporting plate, which is placed on the vertical lifting end of the micro-motion measurement platform and is arranged relative to the probe.

[0014] Furthermore, the displacement sensor is a contact digital sensor.

[0015] Furthermore, the sensor adjustment member is a magnetic table base.

[0016] Furthermore, the transition plate is a flexible hinge.

[0017] Furthermore, the adjustment end includes an adjustment rod and a clamping block, the adjustment rod is vertically arranged on the fixed base, one end of the clamping block is slidably and rotatably connected to the adjustment rod, and the other end is connected to the flexible hinge, which is used to adjust the position of the flexible hinge relative to the measuring ball.

[0018] The present invention also provides a method for debugging a contact probe, comprising the above-mentioned contact probe debugging device, and further comprising the following operating steps:

[0019] Step 1: Adjust the relative positions of the various mechanisms. Adjust the positions of the micro-motion measurement platform and the contact digital sensor according to the position of the stylus ball on the contact probe, so that the two sides of the stylus ball of the contact probe just touch the flexible hinge and the support plate respectively and are in a non-triggered state. At the same time, the contact digital sensor abuts the flexible hinge and its measurement direction is parallel to the movement direction of the stylus ball.

[0020] Step 2: Perform a contact probe signal trigger test. The micro-motion measurement rig drives the support plate to rise, causing the support plate to drive the stylus ball to produce contact displacement. Observe the signal triggering status of the contact probe in real time until the contact probe trigger signal stabilizes. Record the data measured by the contact digital sensor when the stylus body triggers the stability signal for backup, and then reset the micro-motion measurement rig.

[0021] Step 3: Adjust the measuring angle of the contact probe. Rotate the mounting angle of the stylus ball relative to the probe body so that the contact point of the stylus ball relative to the contact digital sensor changes. However, the moving direction of the stylus ball remains parallel to the measuring direction of the contact digital sensor. Repeat step 1 to adjust the corresponding micro-motion measurement platform and contact digital sensor positions. Repeat step 2 to record the data.

[0022] Step 4: Analyze and process the measurement data. By analyzing the stability of the stylus ball trigger signal at different installation angles, and measuring the displacement of the stylus ball when the stylus ball triggers the stability signal, the appropriate installation angle of the stylus ball when the stylus ball triggers the stability signal is found, and this direction is recommended as the installation direction for the stylus ball during detection.

[0023] Compared with the prior art, the present invention has the following advantages: the measuring device of the present invention can be used to detect the stability of the trigger signal when the stylus ball of a contact probe is installed at different angles relative to the probe body, and can also detect the displacement required for the contact probe to trigger a stable signal through the displacement sensor;

[0024] The measurement method provided by the present invention can quickly determine whether the contact probe meets the accuracy requirements through signal detection, so as to quickly find the measurement angle with the highest measurement ball accuracy. By using the contact probe to work at the optimal measurement angle, the measurement accuracy of the machine tool's in-situ measurement system can be effectively improved, thereby improving processing efficiency and product quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 This is a schematic structural diagram of a contact probe debugging device according to an embodiment of the present invention;

[0026] Figure 2 This is a schematic diagram of the assembly of a contact probe and a clamping mechanism in a contact probe debugging device according to an embodiment of the present invention;

[0027] Figure 3 This is a schematic diagram of the assembly of the measuring mechanism and the auxiliary measuring mechanism in the contact probe debugging device according to an embodiment of the present invention;

[0028] Figure 4 This is a schematic diagram of the movement of a stylus ball in a contact-type stylus probe debugging device according to an embodiment of the present invention;

[0029] Figure 5 The diagram is a schematic diagram of the operation flow of the contact probe debugging method provided by the present invention.

[0030] 1. Clamping mechanism; 11. Fixed box; 12. Slide rod; 13. Fixed sleeve; 2. Measuring mechanism; 21. Debugging platform; 22. Displacement sensor; 23. Sensor adjustment member; 3. Auxiliary measuring mechanism; 31. Transition plate; 32. Adjustment end; 321. Adjustment rod; 322. Clamping block; 4. Fixed base; 5. Support plate; 10. Contact probe; 101. Probe body; 102. Stylus; 103. Probe. DETAILED DESCRIPTION

[0031] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of this application and are used together with the embodiments of the present invention to illustrate the principles of the present invention, and are not used to limit the scope of the present invention.

[0032] Reference Figure 1 and Figure 3The present invention provides a contact probe debugging device, wherein the contact probe 10 includes a probe body 101, a stylus 102 and a stylus ball 103, and includes a clamping mechanism 1, a measuring mechanism 2 and an auxiliary measuring mechanism 3.

[0033] The clamping mechanism 1 includes a fixed end and a lifting end, wherein the fixed end is used to horizontally fix the contact probe 10, and the lifting end is connected to the fixed end and is used to adjust the height of the fixed end and the contact probe 10;

[0034] The measuring mechanism 2 includes a debugging platform 21, a displacement sensor 22, and a sensor adjustment member 23. The debugging platform 21 is disposed below the stylus ball 103, with its debugging end disposed opposite to the stylus ball 103, and is used to drive the stylus ball 103 to move in a vertical direction. The displacement sensor 22 is disposed above the stylus ball 103 and opposite to the stylus ball 103. The measuring direction of the displacement sensor 22 is parallel to the moving direction of the stylus ball 103, and is used to detect the movement of the stylus ball 103 when the stylus body 100 outputs a stable signal. The sensor adjustment member 23 is connected to the displacement sensor 22 to adjust the position of the displacement sensor 22 relative to the stylus ball 103.

[0035] The auxiliary measuring mechanism 3 includes a transition plate 31 and an adjustment end 32 thereof. The transition plate 31 is arranged between the measuring ball 103 and the displacement sensor 22. The adjustment end 32 is connected to the transition plate 31 and is used to drive the upper and lower ends of the transition plate 31 to abut against the displacement sensor 22 and the measuring ball 103 respectively, so that the measuring ball 103 and the detection end of the displacement sensor 22 are aligned.

[0036] The clamping mechanism 1 is used to fix the contact probe 10 so as to convert the horizontal movement of the stylus ball 103 into vertical movement, so that the measuring mechanism 2 can be installed horizontally, which is convenient for the measuring mechanism 2 to measure the contact probe 10. During the measurement process, the stylus ball can be controlled to move in the vertical direction to generate contact displacement through the debugging table 21, so that the stylus body 101 outputs a signal. The displacement sensor 22 is used to detect the displacement of the stylus ball 103. The position of the displacement sensor 22 relative to the stylus ball 103 can be adjusted through the sensor adjustment member 23, so that the position of the displacement sensor 22 can be adjusted accordingly after the angle of the stylus ball 103 is adjusted, which assists the measuring mechanism. 3 is used to assist the measuring mechanism 2 in performing multi-angle measurement on the contact probe 10. Among them, the transition plate 31 is used to connect the stylus ball 103 and the displacement sensor 22, so that the contact mode between the stylus ball 103 and the displacement sensor 22 is changed from point-to-point to point-to-plane, which is convenient for data measurement. The adjustment end 32 is used to adjust the position of the transition plate 31 so that the position of the transition plate 31 can be adjusted in real time according to the adjustment of the stylus ball 103. The stylus ball 103 of the contact probe 10 can be adjusted according to the data obtained from the measurement at different angles so as to select the appropriate installation angle, so that the contact probe 10 can ensure high-precision measurement, thereby improving the machining accuracy of the machine tool.

[0037] In the embodiment provided by the present invention, the debugging device also includes a fixed base 4, which is arranged below the measuring mechanism 2 and the auxiliary measuring mechanism 3 and relative to the clamping mechanism 1, for supporting and fixing the measuring mechanism 2 and the auxiliary measuring mechanism 3.

[0038] Reference Figure 2 In the embodiment provided by the present invention, the clamping mechanism 1 includes a fixed box 11, a sliding rod 12 and a fixed sleeve 13, the fixed end is the fixed box, and the lifting end is the sliding rod. The fixed box 11 is provided with a receiving groove for fixing the probe body 101 in the horizontal direction, and one end of the probe body 101 can be rotatably inserted in the receiving groove, the sliding rod 12 is vertically arranged at the bottom of the fixed box 11 and one end thereof is connected to the fixed box 11, the fixed sleeve 13 is arranged at the bottom of the fixed box 11 and is provided with a sliding groove in the vertical direction, and the other end of the sliding rod 12 is slidably inserted in the sliding groove for adjusting the height of the fixed box 11 and the probe body 101.

[0039] In the embodiment provided by the present invention, the debugging platform 21 is a micro-motion measurement platform, which is disposed on the fixed base 4 and opposite to the stylus ball 103. A flat-nose pliers is also provided on the fixed base 4 for clamping and fixing the micro-motion measurement platform. Both the micro-motion measurement platform and the flat-nose pliers are common structures in the prior art and will not be described in detail here.

[0040] In an embodiment provided herein, the debugging device further includes a support plate 5, which is placed at the vertical lifting end of the micro-motion measurement platform and is arranged opposite the stylus ball 103. The support plate 5 may be a hard alloy plate with a smooth surface to prevent the grooves on the working surface of the micro-motion platform from causing the stylus ball to vibrate during measurement and affect the measurement results.

[0041] In the embodiment provided by the present invention, the displacement sensor 22 is a contact digital sensor, and the sensor adjustment member 23 is a magnetic table seat, through which the position of the contact digital sensor can be adjusted in multiple directions, so that the contact digital sensor can face the measuring ball and its measuring direction is parallel to the moving direction of the measuring ball, so as to complete the debugging of the measuring ball.

[0042] In the embodiment provided by the present invention, the transition plate 31 adopts a flexible hinge, and the adjustment end 32 includes an adjustment rod 321 and a clamping block 322. The adjustment rod 321 is vertically arranged on the fixed base 4, and one end of the clamping block 322 is slidably and rotatably connected to the adjustment rod 321, and the other end is connected to the flexible hinge, which is used to adjust the position of the flexible hinge relative to the measuring ball 103.

[0043] The present invention also provides a method for debugging a contact probe, comprising the above-mentioned contact probe debugging device, and further comprising the following operating steps:

[0044] Step 1: Adjust the relative positions of each mechanism. Adjust the positions of the micro-motion measurement platform and the contact digital sensor according to the position of the stylus ball on the contact probe, so that the two sides of the stylus ball of the contact probe just touch the flexible hinge and the support plate respectively and are in an untriggered state. At the same time, the contact digital sensor abuts against the flexible hinge and its measurement direction is parallel to the movement direction of the stylus ball. At this time, establish a measurement coordinate system, and the center of the ruby ​​sphere at the tip of the stylus of the contact probe is defined as the measurement reference origin. , the radius of the ruby ​​sphere is , the height of the flexible hinge is h, and the coordinates of the contact point between the digital sensor and the flexible hinge are:

[0045]

[0046] Step 2: Conduct a contact probe signal trigger test. By adjusting the differential screw of the micro-motion measuring platform, the inclined block moves along the X direction. At the same time, the inclined block produces a small displacement in the Y direction. The support plate is driven to rise by the micro-motion measuring stand. Each time the differential screw of the micro-motion measuring stand is rotated one grid, the support plate drives the measuring ball to produce contact displacement. , observe the signal triggering situation of the contact probe in real time until the contact probe trigger signal is stable, record the data measured by the contact digital sensor when the probe body triggers the stability signal for backup, and record the reading of the stylus ball trigger stability output signal as , where i is the number of times the measurement experiment is repeated, and then the micro-motion measurement bench is reset; in order to obtain the accuracy of the measured data, it is necessary to repeat the measurement ten times, and the data of each time is recorded as x1 -x10.

[0047] During the measurement process, the contact digital sensor is abutted against the flexible hinge and its measuring direction is parallel to the movement direction of the stylus ball in order to reduce Abbe error. Abbe error means that the axis of the measuring instrument and the axis of the workpiece to be measured must be aligned. Otherwise, an error will occur, which is called Abbe error. Figure 4 When the stylus ball and the contact digital sensor are not on the same axis, there is an angle difference between the stylus ball and the contact digital sensor when triggering. and the horizontal difference (Abbe arm) , then the Abbe error can be expressed as:

[0048]

[0049] The coordinates of the contact point between the contact digital sensor and the flexible hinge when triggered are:

[0050]

[0051] Step 3: Adjust the measuring angle of the contact probe. Rotate the angle of the stylus ball in the contact probe relative to the probe body so that the contact point of the stylus ball relative to the contact digital sensor changes. However, the movement direction of the stylus ball is always parallel to the measurement direction of the contact digital sensor. Repeat step 1 to adjust the positions of the corresponding micro-motion measurement platform and the contact digital sensor. Repeat the experimental operation of step 2 and record the data. Each rotation angle of the contact probe is 30°, so the contact probe needs to be rotated twelve times to measure the displacement required for signal triggering stability at different angles of the contact probe.

[0052] Step 4: Analyze and process the measurement data. By analyzing the stability of the stylus ball trigger signal at different installation angles, and measuring the displacement of the stylus ball when the stylus ball triggers the stability signal, we can find the appropriate installation angle of the stylus ball when the stylus ball triggers the stability signal, and recommend this direction as the installation direction for the stylus probe test. It is necessary to analyze multiple data points at different angles each time, process the obtained data, and after eliminating outliers, calculate the range, variance, and standard deviation of the measurement results:

[0053]

[0054] The above formula is used to calculate and analyze the trigger stability of the contact probe at this angle through the obtained range R, variance s, and standard deviation σ, so as to find the working angle with the best measurement stability of the contact probe. Using this angle for measurement in actual use can improve the measurement accuracy of in-situ measurement.

[0055] The above description is only a preferred specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by any technician familiar with this technical field within the technical scope disclosed by the present invention should be covered by the scope of protection of the present invention.

Claims

1. A contact probe debugging device, the contact probe comprising a probe body, a stylus and a stylus ball, characterized in that: include: The clamping mechanism includes a fixed end and a lifting end, wherein the fixed end is used to horizontally fix the contact probe, and the lifting end is connected to the fixed end and is used to adjust the height of the fixed end and the contact probe; the fixed end is a fixed box, and the fixed box has a receiving groove for fixing the probe body in the horizontal direction, and one end of the probe body can be rotatably inserted into the receiving groove; A measuring mechanism includes a debugging platform, a displacement sensor, and a sensor adjustment member. The debugging platform is disposed below the stylus ball, with its debugging end disposed relative to the stylus ball, for driving the stylus ball to move in a vertical direction. The displacement sensor is disposed above the stylus ball and relative to the stylus ball. The displacement sensor has a measuring direction parallel to the direction of movement of the stylus ball and is used to detect the amount of movement of the stylus ball when the stylus head body outputs a stable signal. The sensor adjustment member is connected to the displacement sensor to adjust the position of the displacement sensor relative to the stylus ball. The auxiliary measuring mechanism includes a transition plate and an adjustment end thereof. The transition plate is arranged between the measuring ball and the displacement sensor. The adjustment end is connected to the transition plate and is used to drive the upper and lower ends of the transition plate to abut against the displacement sensor and the measuring ball respectively, so that the measuring ball and the detection end of the displacement sensor are aligned.

2. The contact probe debugging device according to claim 1, characterized in that: It also includes a fixed base, which is arranged below the measuring mechanism and the auxiliary measuring mechanism and opposite to the clamping mechanism, and is used to support and fix the measuring mechanism and the auxiliary measuring mechanism.

3. The contact probe debugging device according to claim 1, characterized in that: The clamping mechanism also includes a sliding rod and a fixed sleeve. The lifting end is a sliding rod. The sliding rod is vertically arranged at the bottom of the fixed box and one end of the sliding rod is connected to the fixed box. The fixed sleeve is arranged at the bottom of the fixed box and has a sliding groove in the vertical direction. The other end of the sliding rod is slidably inserted in the sliding groove for adjusting the height of the fixed box and the probe body.

4. The contact probe debugging device according to claim 2, wherein: The debugging platform is a micro-motion measurement platform, which is arranged on the fixed base and relative to the measuring ball.

5. The contact probe debugging device according to claim 4, characterized in that: It also includes a supporting plate, which is placed on the vertical lifting end of the micro-motion measurement platform and is arranged opposite to the probe.

6. The contact probe debugging device according to claim 5, characterized in that: The displacement sensor is a contact digital sensor.

7. The contact probe debugging device according to claim 1, characterized in that: The sensor adjustment member is a magnetic table seat.

8. The contact probe debugging device according to claim 6, characterized in that: The transition plate is a flexible hinge.

9. The contact probe debugging device according to claim 8, characterized in that: The adjustment end includes an adjustment rod and a clamping block. The adjustment rod is vertically arranged on the fixed base. One end of the clamping block is slidably and rotatably connected to the adjustment rod, and the other end is connected to the flexible hinge, which is used to adjust the position of the flexible hinge relative to the measuring ball.

10. A method for debugging a contact probe, comprising the contact probe debugging device according to claim 8 or 9, characterized in that: The following steps are also included: Step 1: Adjust the relative positions of the various mechanisms. Adjust the positions of the micro-motion measurement platform and the contact digital sensor according to the position of the stylus ball on the contact probe, so that the two sides of the stylus ball of the contact probe just touch the flexible hinge and the support plate respectively and are in a non-triggered state. At the same time, the contact digital sensor abuts the flexible hinge and its measurement direction is parallel to the movement direction of the stylus ball. Step 2: Perform a contact probe signal trigger test. The micro-motion measurement rig drives the support plate to rise, causing the support plate to drive the stylus ball to produce contact displacement. Observe the signal triggering status of the contact probe in real time until the contact probe trigger signal stabilizes. Record the data measured by the contact digital sensor when the stylus body triggers the stability signal for backup, and then reset the micro-motion measurement rig. Step 3: Adjust the measuring angle of the contact probe. Rotate the mounting angle of the stylus ball relative to the probe body so that the contact point of the stylus ball relative to the contact digital sensor changes. However, the moving direction of the stylus ball remains parallel to the measuring direction of the contact digital sensor. Repeat step 1 to adjust the corresponding micro-motion measurement platform and contact digital sensor positions. Repeat step 2 to record the data. Step 4: Analyze and process the measurement data. By analyzing the stability of the stylus ball trigger signal at different installation angles, and measuring the displacement of the stylus ball when the stylus ball triggers the stability signal, the appropriate installation angle of the stylus ball when the stylus ball triggers the stability signal is found, and this direction is recommended as the installation direction for the stylus ball during detection.

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