A method for numerically sorting material properties using distance and reflection intensity

Abstract

The present invention discloses a method for numerically sorting material characteristics by using distance and reflection intensity. The method comprises the following steps: calibrating a sensing distance to obtain a closest sensing value and a farthest sensing value, setting a closest distance, a farthest distance, and a distance distinction accuracy according to the closest sensing value and the farthest sensing value; intercepting a distance between the farthest distance and the closest distance as a distance range for judging the material characteristics of a detected object; arranging the order of reflection strength of light reflected from the detected object in descending order according to distance within the intercepted distance range; corresponding one-to-one to different characteristic values ​​of the material characteristics of the detected object with different reflection intensities within the intercepted distance range; and representing and outputting the distances of the detected object with different reflection intensities within the intercepted distance range through analog numerical values, thereby realizing numerical sorting of the material characteristics of the detected object within the detection distance range by using the distance and reflection intensity.

Description

[Technical field]

[0001] The invention relates to a method for realizing numerical sorting of material characteristics by utilizing distance and reflection intensity. [Background Technology]

[0002] The usual method for judging the color of an object is based on the principle of the proportional relationship between the three primary colors of different wavelengths. This principle requires three light sources of different colors as detection light. After the detection light is reflected back to the sensor by the detected object, the signal intensity sensed by the three light sources is obtained, and the proportional value of the intensity value is calculated to achieve the color recognition function within a certain range of a specified distance.

[0003] Existing color judgment methods rely on the principle of a proportional relationship between three primary colors. This requires the simultaneous use of multiple light sources, typically three primary colors, and the comparison of the reflected light intensities from these three sources to determine a proportional relationship. This requires the installation of three light sources and the calculation of their light intensities. The resulting proportional relationship is a relative value, and the resulting ranking based on this proportional relationship has no intuitive physical meaning.

[0004] Simple light intensity detection changes continuously with distance. At different distances, the reflected light intensity of different objects may be the same, and the corresponding color or material characteristics cannot be detected. If numerical sorting is used, other than the reflected light intensity, complete color and material characteristics cannot be compared or detected. [Summary of the invention]

[0005] The present invention overcomes the shortcomings of the prior art and provides a method for numerically sorting material properties by utilizing distance and reflection intensity.

[0006] To achieve the above object, the present invention adopts the following technical solutions:

[0007] A method for numerically ranking material properties using distance and reflection intensity, the steps are as follows:

[0008] S1. Calibrate the sensing distance to obtain the closest sensing value and the farthest sensing value. Use the closest sensing value and the farthest sensing value to set the closest distance, the farthest distance and the distance distinction accuracy.

[0009] S2. A distance between the farthest distance and the closest distance is intercepted as a distance range for determining the material characteristics of the detected object;

[0010] S3. Arrange the reflection strength of the reflected light of the detection object in the intercepted distance range from near to far according to the distance;

[0011] S4. Different reflection intensities within the intercepted distance range correspond to different characteristic values ​​of the material characteristics of the detected object;

[0012] S5. The distances of the detected object with different reflection intensities within the intercepted distance range are represented and outputted through analog numerical values, thereby realizing numerical sorting of the material characteristics of the detected object within the detection distance range.

[0013] The method for numerically sorting material characteristics by using distance and reflection intensity as described above is characterized in that: in S1 , the sensing distance is calibrated by triangulation calculation or a ranging chip.

[0014] The method for numerically ranking material characteristics by using distance and reflection intensity as described above is characterized in that the light source for illuminating the detected object to generate emitted light in S3 is a monochromatic light source or a three-primary color light source.

[0015] The method for numerically sorting material characteristics using distance and reflection intensity as described above is characterized in that: in S3, the reflection intensity difference value corresponding to the distance difference value with the highest accuracy in distance recognition is used as the judgment standard and recognition accuracy.

[0016] The method for numerically sorting material characteristics by using distance and reflection intensity as described above is characterized in that the distinction accuracy of the analog value of the distance in S5 corresponds to the recognition accuracy of the analog value of the material characteristic.

[0017] The method for numerically sorting material properties by using distance and reflection intensity as described above is characterized in that the analog value is displayed on a digital tube or screen.

[0018] The method for numerically sorting material characteristics by using distance and reflection intensity as described above is characterized in that the distance adjustment of the intercepted distance range in S2 is achieved by adjusting a numerical value or a key switch.

[0019] The beneficial effects of the present invention are:

[0020] 1. The present invention provides a universal and effective material property detection method that relies only on distance and calculable intensity of transmission and reception. Compared with existing optical properties such as color and corresponding detection methods, it is more universal.

[0021] 2. This invention is compatible with, but does not require, multiple transmitters or multiple receivers. It can also be implemented with a single reflector or receiver. A single reflector or receiver simplifies assembly and provides better illumination by avoiding the multiple focusing effects of multiple transmitters or receivers.

[0022] 3. In the present invention, the recognition accuracy and range of the identified material characteristics can be controlled by adjusting the digital, providing a new method for optimizing the range detection and precision adjustment in traditional optical detection. [Brief Description of the Drawings]

[0023] Figure 1 It is a structural diagram of the present invention;

[0024] Figure 2 This is a schematic diagram of the present invention. [Specific implementation method]

[0025] The technical solutions in the embodiments of the present invention will be described clearly and completely below with reference to the accompanying drawings.

[0026] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back...) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly. In addition, the descriptions of "preferred", "sub-preferred", etc. in the present invention are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "preferred" or "sub-preferred" may explicitly or implicitly include at least one such feature.

[0027] like Figure 1-2 As shown in the figure, a method for numerically sorting material properties using distance and reflection intensity is shown in the figure. The steps are as follows:

[0028] S1. Calibrate the sensing distance through triangulation or ranging chip to obtain the closest sensing value and the farthest sensing value. Use the closest sensing value and the farthest sensing value to set the closest distance, the farthest distance and the distance distinction accuracy.

[0029] S2. Within the distance range, sort the objects in order of distance and select a distance between the farthest distance and the closest distance as the distance range for determining the material characteristics of the object being detected;

[0030] S3. Arrange the reflection intensity of the reflected light of the detection object in the intercepted distance range from near to far according to the distance; wherein the reflection intensity difference value corresponding to the distance difference value with the highest accuracy of distance recognition is used as the judgment standard and recognition accuracy;

[0031] S4. Different reflection intensities within the intercepted distance range correspond to different characteristic values ​​of the material characteristics of the detected object;

[0032] S5. The distances of the detected objects at different reflection intensities within the intercepted distance range are represented by analog values ​​and output, displayed on a digital tube or screen, to achieve numerical sorting of the material characteristics of the detected objects within the detection distance range. The sorting of the reflection intensities corresponds to the sorting of the characteristic analog values ​​of the material characteristics of the detected objects, and the accuracy of the analog value discrimination of the distance corresponds to the accuracy of the identification of the material characteristic analog values.

[0033] Specifically, if Figure 1 As shown, the light emitted by the light source is emitted outward through the lower lens, and after being reflected by the detected object, it passes through the upper lens and is received by the distance sensing chip and the light intensity sensing diode. The distance sensing chip and the light intensity sensing diode respectively detect the distance value and the light intensity value of the reflected light, and then the distance range of the reflected light distance value is judged, and the light intensity of the reflected light intensity value is judged. The distance value range judgment results and the light intensity judgment results are input into the processing chip for data processing and then output, so as to realize the numerical sorting of the material characteristics of the detected object within the detection distance range.

[0034] Through the above method, a set of characteristic values ​​of the material characteristics of the detected object within the distance range can be obtained, including the maximum value, minimum value and the accuracy of the value distinction, and this set of values ​​corresponds one-to-one with the material characteristics, thereby realizing the numerical sorting of the material characteristics of the detected object within the detection distance range, which is very intuitive and easy to control.

[0035] Specifically, if Figure 1 As shown, the light source for illuminating the object to be inspected to generate emitted light is a monochromatic light source or a three-primary color light source. This case includes but is not limited to a proportional relationship. A single emission source can be used to achieve related functions. The assembly is simpler than multiple emission sources according to a proportional relationship, and the light source effect is better.

[0036] Specifically, if Figure 1 As shown in Figure 2, the material characteristics detection can be controlled in a region. On the one hand, similar characteristics can be sensed in a relatively small range, and this range can be expanded by distance. On the other hand, even the same characteristics or the same characteristic range can be cut off by distance. The distance adjustment of the cut-off distance range can be achieved by adjusting the value or key switch, or by adjusting the lens position by setting the screw. Figure 2 As shown, the key switch can be set to obtain the algorithm value of the distance and light intensity of the detection object according to the required function warehouse underground key value; the processing chip performs program algorithm processing on the real-time distance value and light intensity value and the key value to realize applications such as color recognition and then outputs a signal.

[0037] This solution is also applicable to detecting other more general material characteristics that do not have obvious color characteristics, or that need to ignore generally visible color characteristics. As long as such material has general properties such as distance and corresponding properties that can be calculated through reflection and reception, it has better universality.

[0038] The above are only preferred embodiments of the present invention and are not intended to limit the patent scope of the present invention. All equivalent structural transformations made based on the contents of the present invention's description and drawings, or directly or indirectly applied in other related technical fields, are included in the patent protection scope of the present invention.

Claims

1. A method for numerically ranking material properties using distance and reflection intensity, the steps of which are as follows: S1. Calibrate the sensing distance to obtain the closest sensing value and the farthest sensing value. Use the closest sensing value and the farthest sensing value to set the closest distance, the farthest distance and the distance distinction accuracy. S2. A distance between the farthest distance and the closest distance is intercepted as a distance range for determining the material characteristics of the detected object; S3. Arrange the reflection strength of the reflected light of the detection object in the intercepted distance range from near to far according to the distance; S4. Different reflection intensities within the intercepted distance range correspond to different characteristic values ​​of the material characteristics of the detected object; S5. The distances of the detected objects with different reflection intensities within the intercepted distance range are represented and outputted through analog values, so as to realize numerical sorting of the material characteristics of the detected objects within the detection distance range, and the analog values ​​are displayed on a digital tube or screen.

2. The method for numerically sorting material properties using distance and reflection intensity according to claim 1, characterized in that: In S1, the sensing distance is calibrated by triangulation or ranging chip.

3. The method for numerically ranking material properties using distance and reflection intensity according to claim 1, characterized in that: In S3 , the light source for irradiating the detected object to generate the emitted light is a monochromatic light source or a three-primary-color light source.

4. The method for numerically ranking material properties using distance and reflection intensity according to claim 1, wherein: In S3, the reflection intensity difference value corresponding to the distance difference value with the highest accuracy in distance recognition is used as the judgment standard and recognition accuracy.

5. The method for numerically ranking material properties using distance and reflection intensity according to claim 1, characterized in that: The accuracy of distinguishing the analog value of the distance in S5 corresponds to the accuracy of identifying the analog value of the material feature.

6. The method for numerically ranking material properties using distance and reflection intensity according to claim 1, wherein: The distance adjustment of the intercepted distance range in S2 is achieved by adjusting the value or the key switch.

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