A control system and control method for an electrical short circuit test laboratory
By employing a three-layer control architecture in the power short-circuit test laboratory, combined with fast and slow acquisition modules and control modules, efficient and stable control of power equipment was achieved, solving the problem of control system complexity.
CN116931460BActive Publication Date: 2026-06-02ANHUI UNIV +1
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ANHUI UNIV
- Filing Date
- 2023-08-07
- Publication Date
- 2026-06-02
AI Technical Summary
Technical Problem
The control system of the power short-circuit test laboratory is complex, requiring the control of multiple devices, the collection and processing of large amounts of data, and the execution of complex logical operations.
Method used
A three-layer control architecture is adopted, including a sensor layer, a local control layer, and a central control layer. Through the combination of fast acquisition modules, slow acquisition modules, fast control modules, and slow control modules, efficient and stable control is achieved.
Benefits of technology
It can efficiently and stably control various power devices and execute complex logical operations, solving the complexity problem of conventional control systems.
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Figure CN116931460B_ABST
Abstract
The application discloses a control system for a power short-circuit test laboratory and a control method thereof. The control system comprises a three-layer control architecture of a sensor layer, a local control layer and a central control layer. The architecture is combined by a fast acquisition module, a slow acquisition module, a fast control module and a slow control module, can efficiently and stably control various power equipment, and executes complex logic operations, so that the complexity problem of a conventional control system is solved.
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Citation Information
Patent Citations
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