A method to investigate the electrical transport properties of Al / α-Al2O3 / Al by changing the thickness of the barrier layer based on COMSOL
By building a one-dimensional square barrier tunneling model and a three-dimensional Josephson junction device model in COMSOL, the particle tunneling effect and electrical transport properties are calculated, the shortcomings in the research on the mesoscopic electrical characteristics of the Josephson junction are solved, the effectiveness of the multi-physics coupling model is verified, and the performance of superconducting integrated circuits is improved.
Patent Information
- Application Number
- CN202410632040.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-21
- Publication Date
- 2025-08-08
- Estimated Expiration
- 2044-05-21
AI Technical Summary
In the prior art, the multi-physics field coupled finite element method based on COMSOL is seriously lacking in research on the mesoscopic electrical characteristics of Josephson junction, which affects the performance optimization and process improvement of superconducting integrated circuits.
The COMSOL semiconductor module is used to build a one-dimensional square barrier tunneling model and a three-dimensional Al/α-Al2O3/Al Josephson junction device model. By parameterizing the scanning barrier layer thickness, the particle tunneling effect and electrical transport properties are calculated, and combined with the Ambegaokar-Baratoff relationship, the critical current density and room temperature resistance are obtained.
The feasibility of the multi-physics coupled model for Josephson junction research was verified, the direction of improving the preparation process was provided, the performance of superconducting integrated circuits was improved, the research cost was saved and the research process was accelerated.