Integrated circuit product testing device and method thereof

Abstract

The invention relates to the technical field of circuit product testing, in particular to an integrated circuit product testing device and a method thereof.The integrated circuit product testing device comprises a first conveying belt, a testing table and a second conveying belt, a detection machine body is installed on the testing table, a probe is arranged on the lower end face of the detection machine body, and a bottom supporting plate is arranged below the probe; mounting plates are arranged on the front side and the rear side of the bottom supporting plate, an auxiliary conveying belt is arranged on the sides of the mounting plates, a Z-axis pressing strip is arranged on one side of the auxiliary conveying belt, a containing cavity for containing the bottom supporting plate is formed in the testing table, a group of lateral main clamping plates are rotationally mounted on each of the two horizontal sides of the bottom supporting plate, and pressing pieces are mounted on the lateral main clamping plates through detachable structures; according to the invention, the test of the integrated circuit product can be rapidly and continuously carried out, the manual intervention and the test time are obviously reduced, accurate positioning can be provided, and the circuit product is ensured to be located at the same test position during each test, so that the consistency and the reliability of the test are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit product testing, and in particular to an integrated circuit product testing device and method thereof. Background Art

[0002] In the modern electronics industry, integrated circuits are widely used in various electronic devices as core components for information processing and transmission. With the continuous development of integrated circuit technology and the improvement of integration, product testing and verification have become more and more complicated. Traditional integrated circuit testing methods often rely on dedicated testing equipment. The testing process is not only time-consuming, but also easily affected by human operation and environmental factors, which limits the accuracy and reliability of the test results.

[0003] Existing test devices usually have the following problems: First, existing testing processes mostly rely on manual operations, which are susceptible to human errors and are difficult to meet the automation needs of large-scale production, limiting production efficiency and output capabilities.

[0004] Secondly, existing test devices are usually designed for specific types of integrated circuits and lack adaptability to circuit products of different sizes, which increases development and testing costs. Summary of the invention

[0005] The object of the present invention is to provide an integrated circuit product testing device and method thereof to solve the problems raised in the above background technology.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: an integrated circuit product testing device, comprising a first conveyor belt, a test bench and a second conveyor belt, a detection body is fixedly installed on the test bench, a probe is arranged on the lower end surface of the detection body, a bottom support plate is arranged directly below the probe, and is used to support the bottom of the product, the bottom support plate is driven by a lifting device and moves linearly up and down on the test bench, and is used to lift the product upward to make it contact with the probe; A set of mounting plates are provided on both the front and rear sides of the bottom support plate, and a set of auxiliary conveyor belts are provided on the side where the two sets of mounting plates are close to each other, which is used to transport the product from the first conveyor belt to the second conveyor belt, and the two sets of mounting plates are moved linearly toward each other by the driving device, which is used to adjust the spacing between the two sets of auxiliary conveyor belts; a Z-axis pressure strip is provided on the side where the two sets of auxiliary conveyor belts are separated from each other, and the two sets of Z-axis pressure strips are driven by the linkage assembly and move in an L-shaped track on the mounting plate, which is used to press and position the product front and back, and the linkage assembly is powered by the jacking device; The test bench is provided with a storage cavity for accommodating the bottom support plate, and a group of lateral main clamps are rotatably installed on both horizontal sides of the bottom support plate. The lateral main clamps are driven by driven components and perform 180° up and down flipping movements. A pressing plate is installed on the lateral main clamp through a detachable structure, which is used to press and position the product left and right.

[0007] Preferably, the lifting device includes an electric push cylinder, the end cover of which is fixedly arranged on the bottom wall of the storage cavity, the piston column of the electric push cylinder extends outward and is fixedly connected to the lower end surface of the bottom support plate, and a group of transverse push plates are fixedly connected to the front and rear sides of the bottom support plate, and the transverse push plates are connected to the linkage assembly.

[0008] Preferably, the linkage assembly includes a driven lever, an active lever and a vertical push plate, wherein the vertical push plate is limitedly inserted on the mounting plate, the lower end of the vertical push plate extends into the storage cavity and is provided with a limit through hole for accommodating the horizontal push plate.

[0009] Preferably, the upper end of the vertical push plate extends into the Z-axis pressure strip and is fixedly connected to an active lever, a driving inclined groove for accommodating the active lever is provided inside the Z-axis pressure strip, a rectangular groove for accommodating the Z-axis pressure strip is provided on the mounting plate, L-shaped matching grooves are provided on both sides of the rectangular groove, and a driven lever inserted in the L-shaped matching groove is fixedly connected to the side wall of the Z-axis pressure strip, and the lateral displacement of the L-shaped matching groove is consistent with the lateral displacement of the driving inclined groove.

[0010] Preferably, the driven assembly includes a No. 1 spring, a T-shaped push bar, a cylindrical pin, a rectangular movable seat, a No. 2 spring, a transverse rack and a spur gear. The spur gear is fixedly sleeved on the rotating shaft, one end of the transverse rack is meshed and connected to the spur gear, and the other end of the transverse rack extends into the bottom support plate and is fixedly connected to the rectangular movable seat. A No. 2 spring is fixedly connected to the side of the rectangular movable seat close to the transverse rack.

[0011] Preferably, the rectangular movable seat and the T-shaped push strip are both limitedly slidably installed in the bottom support plate, a No. 1 spring is fixedly provided at the lower end of the T-shaped push strip, the upper end of the T-shaped push strip extends into the rectangular movable seat and is fixedly connected with a cylindrical pin, and a lateral oblique groove for accommodating the cylindrical pin is opened through the rectangular movable seat.

[0012] Preferably, the driving device includes a screw nut, a driving screw, a pulley, a transmission belt and a No. 1 motor, two sets of screw nuts are fixedly connected to the lower end of each set of mounting plates, the screw nuts are limitedly slidably installed in the test bench, a driving screw is inserted inside each set of screw nuts, the output end of the No. 1 motor is fixedly connected to a set of driving screws, the two driving screws in the same row have opposite thread directions and are coaxially welded and fixed, the driving screw connected to the No. 1 motor and the driving screw in the same column are both sleeved with a set of pulleys, and the outsides of the two sets of pulleys are jointly sleeved with a transmission belt.

[0013] Preferably, the heights of the first conveyor belt, the auxiliary conveyor belt and the second conveyor belt decrease successively, and the test bench is provided with a set of guide plates between the first conveyor belt and the auxiliary conveyor belt and between the auxiliary conveyor belt and the second conveyor belt.

[0014] Preferably, the detachable component includes an adjusting screw and a guide rod, four guide rods are provided and evenly distributed at the four corners of the pressing plate, one end of the guide rod is fixedly connected to the pressing plate, the other end of the guide rod passes through the lateral main splint and is fixedly connected to the limiting disk, one end of the adjusting screw is fixedly connected to a rotating wheel, the other end of the adjusting screw passes through the lateral main splint and cooperates with the back limit rotation of the pressing plate.

[0015] An integrated circuit product testing method, used in an integrated circuit product testing device, the method comprises the following steps: S1: The circuit products to be tested are arranged on the first conveyor belt in sequence and at equal intervals, and are transported one by one from the first conveyor belt to the auxiliary conveyor belt; S2: When the circuit product is just under the probe, the electric push cylinder is quickly turned on, and its piston column extends outward and pushes the bottom support plate upward. During this process, the Z-axis pressure strip moves in an L-shaped trajectory under the action of the linkage component, pressing and positioning the circuit product front and back while moving upward with the circuit product; at the same time, the lateral main clamping plate rotates 180° upward under the action of the driven component, so that the pressure sheet presses and positions the horizontal sides of the circuit product, and the circuit product positioned in multiple directions moves upward with the bottom support plate and contacts and connects with the probe, so as to perform stable detection; S3: After the inspection is completed, the electric push cylinder is used again to retract the piston column inward and pull the bottom support plate downward. During this process, the Z-axis pressure strip and the pressure plate immediately release the circuit product that has been inspected, so that the product can be normally transported to the second conveyor belt by the auxiliary conveyor belt after the inspection is completed. Compared with the prior art, the present invention has the following beneficial effects: 1. The present invention forms an automated testing device through the design of a bottom support plate, a first conveyor belt, a second conveyor belt and two sets of auxiliary conveyor belts, which can quickly and continuously test integrated circuit products, significantly reducing manual intervention and testing time, thereby improving overall production efficiency; and through the design of a Z-axis pressure strip and a lateral main clamping plate, accurate positioning is provided to ensure that the circuit product is in the same test position each time the test is performed, thereby improving the consistency and reliability of the test and reducing the test error caused by inaccurate positioning. 2. The present invention can convert the linear up-and-down motion of the horizontal push plate into the L-shaped track motion of the Z-axis pressing strip by arranging the driven lever, the active lever and the vertical push plate to cooperate with the L-shaped matching groove and the driving inclined groove, so that the Z-axis pressing strip can quickly press and position the circuit product forward and backward before the bottom support plate lifts the product, and can continue to move upward with the bottom support plate after pressing, thereby effectively preventing the circuit product from deviating during the process of moving upward to dock with the ejector pin, thereby improving the accuracy of the final test result.

[0016] 3. The present invention, through the design of the No. 1 spring, T-shaped push bar, cylindrical pin, rectangular moving seat, No. 2 spring, transverse rack and spur gear, can make the lateral main clamping plate adaptively perform 180° up and down flipping movement according to the movement state of the bottom support plate. When the bottom support plate moves up, the lateral main clamping plate flips up and presses and positions the product in the horizontal direction. When the bottom support plate moves down, the lateral main clamping plate flips down and quickly releases the product, thereby ensuring that the product can be normally transported to the second conveyor belt by the auxiliary conveyor belt after the product is tested. 4. By setting the screw nut, driving screw, pulley, transmission belt and No. 1 motor in cooperation, the two sets of mounting plates can be moved linearly towards each other, so as to adjust the spacing between the two sets of auxiliary conveyor belts and the two sets of lateral main clamping plates, so as to adapt to circuit products of different sizes and shapes, so that the test device has stronger versatility and flexibility, and can reduce repeated investment in the test device. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a three-dimensional schematic diagram of the structure of the present invention.

[0018] Figure 2 It is a schematic diagram of another viewing angle of the structure of the present invention.

[0019] Figure 3 It is a schematic diagram of the shell probe, the mounting plate, the auxiliary conveyor belt and the test bench of the present invention.

[0020] Figure 4 It is a three-dimensional schematic diagram of the auxiliary conveyor belt, bottom support plate and driving device of the present invention.

[0021] Figure 5 It is a schematic diagram of the mounting plate, auxiliary conveyor belt, bottom support plate and driving device of the present invention.

[0022] Figure 6 It is a three-dimensional schematic diagram of the mounting plate, the auxiliary conveyor belt and the Z-axis pressure strip of the present invention.

[0023] Figure 7 It is a schematic diagram of the bottom support plate, the lateral push plate and the jacking device of the present invention.

[0024] Figure 8 It is a partially cutaway schematic diagram of the bottom support plate of the present invention.

[0025] Fig. 9 It is an exploded schematic diagram of the lateral main splint and the driven assembly of the present invention.

[0026] Fig.10 It is a schematic diagram of the mounting plate, auxiliary conveyor belt, lead screw nut and Z-axis pressure strip of the present invention.

[0027] Fig.11 It is an exploded schematic diagram of the gear linkage assembly, Z-axis pressure strip and mounting plate of the present invention.

[0028] In the figure: 1, first conveyor belt; 2, test bench; 201, storage cavity; 202, vertical slide; 3, second conveyor belt; 4, detection body; 5, probe; 6, mounting plate; 601, L-shaped matching groove; 7, auxiliary conveyor belt; 8, lead screw nut; 9, driving lead screw; 10, pulley; 11, transmission belt; 12, No. 1 motor; 13, Z-axis pressure strip; 14, driven lever; 15, driving inclined groove; 16. Active lever; 17. Vertical push plate; 18. Horizontal push plate; 19. Bottom support plate; 20. Electric push cylinder; 21. No. 1 spring; 22. T-shaped push strip; 23. Cylindrical pin; 24. Rectangular moving seat; 25. Lateral inclined groove; 26. No. 2 spring; 27. Horizontal rack; 28. Spur gear; 29. ​​Rotating shaft; 30. Lateral main splint; 31. Adjusting screw; 32. Pressing piece; 33. Guide rod. DETAILED DESCRIPTION

[0029] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0030] See also Figures 1 to 11The present invention provides a technical solution: an integrated circuit product testing device, comprising a first conveyor belt 1, a test table 2 and a second conveyor belt 3, a detection body 4 is fixedly installed on the test table 2, a probe 5 is arranged on the lower end surface of the detection body 4, a bottom support plate 19 is arranged directly below the probe 5, and is used to support the bottom of the product, the bottom support plate 19 is driven by a lifting device and moves up and down linearly on the test table 2, and is used to lift the product upward and contact it with the probe 5; a group of mounting plates 6 are arranged on both sides of the front and rear of the bottom support plate 19, and a group of auxiliary conveyor belts 7 are arranged on the side where the two groups of mounting plates 6 are close to each other, and are used to transport the product from the first conveyor belt 1 to the second conveyor belt 3, and the two groups of mounting plates 6 are connected by The driving device moves in a straight line towards each other to adjust the spacing between the two groups of auxiliary conveyor belts 7; the two groups of auxiliary conveyor belts 7 are provided with a Z-axis pressure strip 13 on the side facing away from each other, and the two groups of Z-axis pressure strips 13 are driven by a linkage component and move in an L-shaped trajectory on the mounting plate 6 to press and position the product forward and backward, and the linkage component is powered by a lifting device; a storage cavity 201 for accommodating a bottom support plate 19 is provided on the test bench 2, and a group of lateral main splints 30 are rotatably installed on both horizontal sides of the bottom support plate 19, and the lateral main splints 30 are driven by a driven component and perform a 180° up and down flip movement, and a pressing plate 32 is installed on the lateral main splint 30 through a detachable structure to press and position the product left and right.

[0031] Furthermore, the present invention forms an automated testing device through the design of a bottom support plate 19, a first conveyor belt 1, a second conveyor belt 3 and two sets of auxiliary conveyor belts 7, which can quickly and continuously test integrated circuit products, significantly reduce manual intervention and testing time, and thus improve overall production efficiency; and through the design of a Z-axis pressure strip 13 and a lateral main clamping plate 30, precise positioning is provided to ensure that the circuit product is in the same test position each time it is tested, thereby improving the consistency and reliability of the test and reducing the test error caused by inaccurate positioning.

[0032] like Figure 4 as well as Figure 7 As shown, the lifting device includes an electric push cylinder 20, the end cover of which is fixedly arranged on the bottom wall of the storage cavity 201, the piston column of the electric push cylinder 20 extends outward and is fixedly connected to the lower end surface of the bottom support plate 19, and a group of lateral push plates 18 are fixedly connected to the front and rear sides of the bottom support plate 19, and the lateral push plates 18 are connected to the linkage assembly.

[0033] Specifically, by turning on the electric push cylinder 20, the piston rod thereof extends outward and pushes the bottom support plate 19 to move up and down, and the lateral push plate 18 connected to the bottom support plate 19 also moves up and down together.

[0034] like Figure 10 to Figure 11As shown, the linkage assembly includes a driven lever 14, an active lever 16 and a vertical push plate 17. The vertical push plate 17 is inserted into the mounting plate 6. The lower end of the vertical push plate 17 extends into the storage cavity 201 and is provided with a limited through hole for accommodating the horizontal push plate 18. The upper end of the vertical push plate 17 extends into the Z-axis pressure strip 13 and is fixedly connected with the active lever 16. The Z-axis pressure strip 13 is provided with a driving inclined groove 15 for accommodating the active lever 16. The mounting plate 6 is provided with a rectangular slot for accommodating the Z-axis pressure strip 13. Both sides of the rectangular slot are provided with L-shaped matching grooves 601. The side wall of the Z-axis pressure strip 13 is fixedly connected with the driven lever 14 inserted in the L-shaped matching groove 601. The lateral displacement of the L-shaped matching groove 601 is consistent with the lateral displacement of the driving inclined groove 15.

[0035] Furthermore, by arranging a driven lever 14, an active lever 16 and a vertical push plate 17 for use in conjunction with the L-shaped matching groove 601 and the driving inclined groove 15, the linear up and down movement of the horizontal push plate 18 can be converted into the L-shaped trajectory movement of the Z-axis pressure strip 13, so that the Z-axis pressure strip 13 can quickly press and position the circuit product forward and backward before the bottom support plate 19 lifts the product, and after pressing, it can continue to maintain the upward movement with the bottom support plate 19, thereby effectively preventing the circuit product from shifting during the upward movement and docking with the ejector pin, thereby improving the accuracy of the final test result.

[0036] like Figure 4 , Figure 8 as well as Fig. 9 As shown, the driven assembly includes a No. 1 spring 21, a T-shaped push bar 22, a cylindrical pin 23, a rectangular moving seat 24, a No. 2 spring 26, a transverse rack 27 and a spur gear 28. The spur gear 28 is fixedly sleeved on the rotating shaft 29. One end of the transverse rack 27 is meshed with the spur gear 28. The other end of the transverse rack 27 extends into the bottom support plate 19 and is fixedly connected to the rectangular moving seat 24. The No. 2 spring 26 is fixedly connected to the side of the rectangular moving seat 24 close to the transverse rack 27. The rectangular moving seat 24 and the T-shaped push bar 22 are both limitedly slidably installed in the bottom support plate 19. A vertical slide groove 202 for accommodating the T-shaped push bar 22 is provided on the inner side wall of the storage cavity 201. The No. 1 spring 21 is fixedly provided at the lower end of the T-shaped push bar 22. The upper end of the T-shaped push bar 22 extends into the rectangular moving seat 24 and is fixedly connected to the cylindrical pin 23. A lateral inclined groove 25 for accommodating the cylindrical pin 23 is provided through the rectangular moving seat 24.

[0037] Furthermore, through the design of the No. 1 spring 21, the T-shaped push bar 22, the cylindrical pin 23, the rectangular moving seat 24, the No. 2 spring 26, the transverse rack 27 and the spur gear 28, the lateral main splint 30 can adaptively perform a 180° up and down flip movement according to the movement state of the bottom support plate 19. When the bottom support plate 19 moves up, the lateral main splint 30 flips upward and presses and positions the product in the horizontal direction. When the bottom support plate 19 moves downward, the lateral main splint 30 flips downward and quickly releases the product, thereby ensuring that the product can be normally transported to the second conveyor belt 3 by the auxiliary conveyor belt 7 after inspection.

[0038] like Figure 4 as well as Figure 5 As shown, the driving device includes a screw nut 8, a driving screw 9, a pulley 10, a transmission belt 11 and a No. 1 motor 12. The lower end of each group of mounting plates 6 is fixedly connected with two groups of screw nuts 8. The screw nuts 8 are limitedly slidably installed in the test bench 2. A driving screw 9 is inserted inside each group of screw nuts 8. The output end of the No. 1 motor 12 is fixedly connected to a group of driving screws 9. The two driving screws 9 in the same row have opposite thread directions and are coaxially welded and fixed. The driving screw connected to the No. 1 motor 12 and the driving screw in the same column are both sleeved with a group of pulleys 10, and the outsides of the two groups of pulleys 10 are jointly sleeved with a transmission belt 11.

[0039] Furthermore, by arranging the screw nut 8, the driving screw 9, the pulley 10, the transmission belt 11 and the No. 1 motor 12 for use in cooperation, the two sets of mounting plates 6 can be made to move linearly toward each other, thereby adjusting the spacing between the two sets of auxiliary conveyor belts 7 and between the two sets of lateral main clamping plates 30, thereby being able to adapt to circuit products of different sizes and shapes, making the test device more versatile and flexible, and being able to reduce repeated investment in the test device.

[0040] like Figure 1 to Figure 2 As shown, the heights of the first conveyor belt 1, the auxiliary conveyor belt 7 and the second conveyor belt 3 decrease in sequence, and the test bench 2 is provided with a set of guide plates between the first conveyor belt 1 and the auxiliary conveyor belt 7 and between the auxiliary conveyor belt 7 and the second conveyor belt 3. This arrangement facilitates the guided transportation of circuit products.

[0041] like Figures 7 and 8 As shown, the detachable component includes an adjusting screw 31 and a guide rod 33. Four guide rods 33 are provided and are evenly distributed at the four corners of the pressing plate 32. One end of the guide rod 33 is fixedly connected to the pressing plate 32, and the other end of the guide rod 33 passes through the lateral main splint 30 and is fixedly connected to the limiting disk. One end of the adjusting screw 31 is fixedly connected to a rotating wheel, and the other end of the adjusting screw 31 passes through the lateral main splint 30 and cooperates with the back side limiting rotation of the pressing plate 32. Furthermore, by rotating the adjusting screw 31 , the distance between the pressing sheet 32 ​​and the lateral main clamping plate 30 can be changed, so that the pressing sheet 32 ​​can be suitable for circuit products of different lengths.

[0042] When the present invention is in use: first, the circuit products to be tested are arranged in sequence and equidistantly on the first conveyor belt 1, and are transported one by one from the first conveyor belt 1 to the auxiliary conveyor belt 7. When the circuit products are just under the probe 5, the electric push cylinder 20 is turned on, and its piston column extends outward and pushes the bottom support plate 19 to move upward. During this process, the lateral push plate 18 on the bottom support plate 19 drives the active lever 16 to move upward, and the active lever 16 acts on the driving inclined groove 15, so that the Z-axis pressure strip 13 is displaced by force, and under the cooperation of the driven lever 14 and the L-shaped matching groove 601, the Z-axis pressure strip 13 is first forced to move horizontally and press the circuit products forward and backward to position them. As the bottom support plate 19 moves further upward, the Z-axis pressure strip 13 It will also move upward while keeping the circuit product pressed and positioned. At the same time, the T-shaped push bar 22 will also move upward and conflict with the top wall of the vertical slide groove 202, so that the T-shaped push bar 22 is forced to squeeze the No. 1 spring 21 and drive the cylindrical pin 23 to move downward. The cylindrical pin 23 acts on the lateral inclined groove 25, so that the rectangular moving seat 24 is forced to squeeze the No. 2 spring 26 and push the horizontal rack 27 to extend outward. The horizontal rack 27 acts on the spur gear 28, so that the rotating shaft 29 drives the lateral main clamping plate 30 to rotate 180° upward, so that the pressing sheet 32 ​​can press and position the horizontal sides of the circuit product, and the circuit product positioned in multiple directions moves upward with the bottom support plate 19 and conflicts with the probe 5 to perform stable detection. After the detection is completed, the electric push cylinder 20 is started again, and its piston column retracts inward and pulls the bottom support plate 19 to move downward. During this process, the horizontal push plate 18 on the bottom support plate 19 drives the active lever 16 to move downward, and the active lever 16 acts on the driving inclined slot 15 again, so that the Z-axis pressure strip 13 is forced to move downward first and then move horizontally and release the circuit product. At the same time, the T-shaped push bar 22 also moves downward and gradually moves away from the top wall of the vertical slide slot 202, so that the T-shaped push bar 22 drives the cylindrical pin 23 to move upward under the elastic force of the No. 1 spring 21, and the cylindrical pin 23 acts on the lateral inclined slot 25, so that the rectangular moving seat 24 is forced and pulls the horizontal rack 27 to retract inward, and the horizontal rack 27 acts on the spur gear 28, so that the rotating shaft 29 drives the lateral main clamping plate 30 to rotate downward 180°, so that the pressing plate 32 releases the circuit product, thereby ensuring that the product can be normally transported to the second conveyor belt 3 by the auxiliary conveyor belt 7 after the detection is completed.

[0043] An integrated circuit product testing method, used in an integrated circuit product testing device, the method comprises the following steps: S1: The circuit products to be inspected are arranged on the first conveyor belt 1 in sequence and at equal intervals, and are transported one by one from the first conveyor belt 1 to the auxiliary conveyor belt 7; S2: When the circuit product is just under the probe 5, the electric push cylinder 20 is quickly turned on, and its piston column extends outward and pushes the bottom support plate 19 to move upward. In this process, the Z-axis pressure strip 13 moves in an L-shaped trajectory under the action of the linkage component, pressing and positioning the circuit product front and back while moving upward with the circuit product; at the same time, the lateral main clamping plate 30 rotates upward 180° under the action of the driven component, so that the pressure sheet 32 ​​presses and positions the horizontal sides of the circuit product, and the circuit product positioned in multiple directions moves upward with the bottom support plate 19 and contacts and connects with the probe 5, so as to perform stable detection; S3: After the detection is completed, the electric push cylinder 20 is used again to retract its piston column inward and pull the bottom support plate 19 downward. During this process, the Z-axis pressure strip 13 and the pressure plate 32 immediately release the circuit product that has been inspected, so that the product can be normally transported to the second conveyor belt 3 by the auxiliary conveyor belt 7 after the inspection is completed.

[0044] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An integrated circuit product testing device, comprising a first conveyor belt (1), a test bench (2) and a second conveyor belt (3), characterized in that: A detection body (4) is fixedly mounted on the test bench (2); a probe (5) is disposed on the lower end surface of the detection body (4); a bottom support plate (19) is disposed directly below the probe (5) for supporting the bottom of the product; the bottom support plate (19) is driven by a lifting device and moves linearly up and down on the test bench (2) for lifting the product upwards to make it in close contact with the probe (5); A group of mounting plates (6) are provided on both the front and rear sides of the bottom support plate (19); a group of auxiliary conveyor belts (7) are provided on the sides where the two groups of mounting plates (6) are close to each other, and are used to transport products from the first conveyor belt (1) to the second conveyor belt (3); and the two groups of mounting plates (6) are moved linearly towards each other by a driving device, and are used to adjust the spacing between the two groups of auxiliary conveyor belts (7); a Z-axis pressure strip (13) is provided on the sides where the two groups of auxiliary conveyor belts (7) are separated from each other; the two groups of Z-axis pressure strips (13) are driven by a linkage component and move in an L-shaped trajectory on the mounting plate (6), and are used to press and position the products forward and backward; and the linkage component is powered by a lifting device; The test bench (2) is provided with a storage cavity (201) for accommodating a bottom support plate (19), and a group of lateral main clamping plates (30) are rotatably mounted on both horizontal sides of the bottom support plate (19). The lateral main clamping plates (30) are driven by a driven component and perform a 180° up and down flipping motion. A pressing plate (32) is mounted on the lateral main clamping plate (30) via a detachable structure, and is used to press and position the product to the left and right.

2. An integrated circuit product testing device according to claim 1, characterized in that: The lifting device comprises an electric push cylinder (20), an end cover of the electric push cylinder (20) is fixedly arranged on the bottom wall of the storage cavity (201), a piston column of the electric push cylinder (20) extends outward and is fixedly connected to the lower end surface of the bottom support plate (19), and a group of transverse push plates (18) are fixedly connected to the front and rear sides of the bottom support plate (19), and the transverse push plates (18) are connected to the linkage assembly.

3. The integrated circuit product testing device according to claim 2, characterized in that: The linkage assembly comprises a driven lever (14), an active lever (16) and a vertical push plate (17); the vertical push plate (17) is inserted into the mounting plate (6) in a limiting manner; the lower end of the vertical push plate (17) extends into the storage cavity (201) and is provided with a limiting through hole for accommodating a horizontal push plate (18).

4. The integrated circuit product testing device according to claim 3, characterized in that: The upper end of the vertical push plate (17) extends into the Z-axis pressure strip (13) and is fixedly connected to an active lever (16); a driving inclined groove (15) for accommodating the active lever (16) is provided inside the Z-axis pressure strip (13); a rectangular slot for accommodating the Z-axis pressure strip (13) is provided on the mounting plate (6); L-shaped matching slots (601) are provided on both sides of the rectangular slot; a driven lever (14) inserted into the L-shaped matching slot (601) is fixedly connected to the side wall of the Z-axis pressure strip (13); and the lateral displacement of the L-shaped matching slot (601) is consistent with the lateral displacement of the driving inclined slot (15).

5. The integrated circuit product testing device according to claim 1, characterized in that: The driven assembly comprises a No. 1 spring (21), a T-shaped push bar (22), a cylindrical pin (23), a rectangular movable seat (24), a No. 2 spring (26), a transverse rack (27) and a spur gear (28), wherein the spur gear (28) is fixedly sleeved on the rotating shaft (29), one end of the transverse rack (27) is meshedly connected to the spur gear (28), and the other end of the transverse rack (27) extends into the bottom support plate (19) and is fixedly connected to the rectangular movable seat (24), and the No. 2 spring (26) is fixedly connected to one side of the rectangular movable seat (24) close to the transverse rack (27).

6. The integrated circuit product testing device according to claim 5, characterized in that: The rectangular movable seat (24) and the T-shaped push bar (22) are both limitedly slidably mounted in the bottom support plate (19); a No. 1 spring (21) is fixedly arranged at the lower end of the T-shaped push bar (22); the upper end of the T-shaped push bar (22) extends into the rectangular movable seat (24) and is fixedly connected to a cylindrical pin (23); and a lateral oblique groove (25) for accommodating the cylindrical pin (23) is provided through the rectangular movable seat (24).

7. The integrated circuit product testing device according to claim 1, characterized in that: The driving device comprises a screw nut (8), a driving screw (9), a pulley (10), a transmission belt (11) and a No. 1 motor (12). The lower end of each set of mounting plates (6) is fixedly connected to two sets of screw nuts (8). The screw nuts (8) are limitedly slidably installed in the test bench (2). A driving screw (9) is inserted into each set of screw nuts (8). The output end of the No. 1 motor (12) is fixedly connected to a set of driving screws (9). The two driving screws (9) in the same row have opposite thread directions and are coaxially welded and fixed. A set of pulleys (10) are sleeved on the driving screw connected to the No. 1 motor (12) and the driving screw in the same row. The two sets of pulleys (10) are sleeved on the outside by the transmission belt (11).

8. The integrated circuit product testing device according to claim 1, characterized in that: The heights of the first conveyor belt (1), the auxiliary conveyor belt (7) and the second conveyor belt (3) decrease in sequence, and the test bench (2) is provided with a set of guide plates between the first conveyor belt (1) and the auxiliary conveyor belt (7) and between the auxiliary conveyor belt (7) and the second conveyor belt (3).

9. The integrated circuit product testing device according to claim 1, characterized in that: The detachable assembly comprises an adjusting screw (31) and a guide rod (33). Four guide rods (33) are provided and are evenly distributed at four corners of the pressing plate (32). One end of the guide rod (33) is fixedly connected to the pressing plate (32). The other end of the guide rod (33) passes through the lateral main splint (30) and is fixedly connected to the limiting disc. One end of the adjusting screw (31) is fixedly connected to a rotating wheel. The other end of the adjusting screw (31) passes through the lateral main splint (30) and is rotationally matched with the back side of the pressing plate (32) to limit the position.

10. An integrated circuit product testing method, used in the integrated circuit product testing device according to any one of claims 1 to 9, characterized in that: The method follows these steps: S1: placing the circuit products to be inspected on the first conveyor belt (1) in sequence and at equal intervals, and conveying them one by one from the first conveyor belt (1) to the auxiliary conveyor belt (7); S2: When the circuit product is just below the probe (5), the electric push cylinder (20) is quickly turned on, and its piston rod extends outward and pushes the bottom support plate (19) to move upward. During this process, the Z-axis pressing strip (13) moves in an L-shaped trajectory under the action of the linkage component, pressing and positioning the circuit product forward and backward while moving upward together with the circuit product; At the same time, the lateral main clamping plate (30) rotates upward by 180° under the action of the driven component, so that the pressing sheet (32) presses and positions the horizontal sides of the circuit product, and the circuit product positioned in multiple directions moves upward together with the bottom support plate (19) and contacts and connects with the probe (5), thereby performing stable detection; S3: After the test is completed, the electric push cylinder (20) is used again to retract its piston column inward and pull the bottom support plate (19) downward. During this process, the Z-axis pressure strip (13) and the pressure plate (32) immediately release the circuit product that has been tested, so that the product can be normally transported to the second conveyor belt (3) by the auxiliary conveyor belt (7) after the test is completed.

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