Deep learning-based tiny target defect identification model training method

Abstract

The invention discloses a deep learning-based small target defect recognition model training method, relates to the technical field of defect recognition model training, and aims at meeting small defect detection requirements, starting with high-resolution diversified data construction and accurate labeling, highlighting weak targets through multi-scale feature fusion and spatial attention, and realizing high-resolution target defect recognition. A hard case scene is processed in cooperation with layer-by-layer screening and secondary intensified training, real-time iterative optimization is achieved through multi-model fusion and online dynamic adjustment and optimization, finally, multi-mode and time sequence dimensions are expanded to capture deeper and dynamic defect information, the missing detection and false detection rate is greatly reduced, and the detection efficiency is improved. The detection efficiency and adaptability of micron-sized defects under a complex process background are improved; furthermore, by means of multi-source data such as infrared, X-ray or 3D morphology and a time sequence modeling means, multiple dimensions are fused, and hidden or early cracks are brought into a detection and prediction range, so that a high-reliability and evolvable intelligent recognition system for the tiny target defects is constructed.