High-voltage test method and device for electrical equipment, electronic equipment and storage medium

Abstract

The invention provides a high-voltage test method and device for electrical equipment, electronic equipment and a storage medium, the method is applied to a high-voltage test device, and the high-voltage test device comprises a bearing platform, a frequency modulation and voltage regulation power supply arranged on the bearing platform, an excitation transformer, an adjustable reactor and a capacitive voltage divider. Comprising the following steps: controlling an adjustable reactor and a capacitive voltage divider to be converted from a storage state to a working state on a bearing platform; target electrical equipment is connected to the output end of the adjustable reactor to form a series resonance circuit; a target test item is determined, and the voltage output frequency and the inductance value of the adjustable reactor are adjusted according to preset target test parameters of the target test item, so that the series resonance circuit reaches a resonance state; and outputting a voltage according to the target test parameter, obtaining a test operation parameter of the target electrical equipment, and generating a target test result according to the test operation parameter. According to the invention, the testing efficiency of high-voltage testing of the ultrahigh-voltage electrical equipment can be improved.

Description

Technical Field

[0001] The present application relates to the field of high-voltage electrical testing, and in particular to a high-voltage testing method and device for electrical equipment, electronic equipment, and storage medium. Background Art

[0002] Ultra-high voltage electrical equipment is an important component of power plants and substations. High-voltage testing is a necessary method to determine whether such equipment meets operating standards. It applies a test voltage to simulate the power that the equipment may withstand in actual operation. This test aims to detect potential equipment defects, thereby effectively preventing equipment damage or safety accidents. It is an important part of ensuring the safe and stable operation of electrical equipment.

[0003] Conventional technology requires high-voltage testing of ultra-high voltage electrical equipment using multiple separate pieces of equipment for on-site assembly and testing. The assembly process includes arranging the various devices, stacking reactors, installing grading rings, stacking voltage dividers, and wiring between devices. The arduous task of transporting, arranging, and switching equipment results in low high-voltage testing efficiency. Summary of the Invention

[0004] The present application aims to solve at least one of the technical problems existing in the prior art. To this end, the present application provides a high-voltage test method and apparatus for electrical equipment, an electronic device, and a storage medium, which can improve the efficiency of high-voltage testing of ultra-high voltage electrical equipment.

[0005] In a first aspect, an embodiment of the present application provides a high-voltage test method for electrical equipment, which is applied to a high-voltage test device, wherein the high-voltage test device includes a carrying platform, a frequency-modulated and voltage-regulated power supply, an excitation transformer, an adjustable reactor, and a capacitive voltage divider arranged on the carrying platform; the frequency-modulated and voltage-regulated power supply is used to output alternating current with adjustable frequency and voltage to the excitation transformer; the excitation transformer is used to boost the alternating current and output it to the adjustable reactor; the adjustable reactor is used to connect to the target electrical equipment to form a series resonant circuit, and is used to adjust the inductance parameters of the series resonant circuit to achieve resonance; the capacitive voltage divider is used to be connected in parallel to both ends of the target electrical equipment, and is used to measure the test voltage value of the target electrical equipment; the method includes:

[0006] Controlling the adjustable reactor and the capacitive voltage divider to switch from a storage state to an operating state on the carrying platform;

[0007] Connecting the target electrical device to the output end of the adjustable reactor to form the series resonant circuit;

[0008] Determining a target test item, and adjusting the voltage output frequency of the frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable reactor according to target test parameters preset in the target test item, so that the series resonant circuit reaches a resonant state;

[0009] The output voltage of the frequency- and voltage-regulated power supply is adjusted according to the target test parameters, and the test operation parameters of the target electrical equipment are obtained, and the target test results are generated according to the test operation parameters.

[0010] In some embodiments, the target test parameters include a target set frequency, a target sweep frequency range, and a target set inductance value. Adjusting the voltage output frequency of the frequency- and voltage-regulated power supply and the inductance value of the adjustable reactor according to the target test parameters preset in the target test item so that the series resonant circuit reaches a resonant state includes:

[0011] adjusting the inductance value of the adjustable reactor to the target inductance value;

[0012] Controlling the voltage output frequency to perform a first round of frequency sweep within the target frequency sweep range according to a preset first frequency adjustment step, continuously acquiring the test voltage value, and determining the voltage output frequency corresponding to the maximum value of the test voltage value in the first round of frequency sweep as the preliminary resonant frequency;

[0013] With the preliminary resonant frequency as the center, within a preset frequency adjustment range, controlling the voltage output frequency to perform a second frequency sweep according to a preset second frequency adjustment step, continuously acquiring the test voltage value, and determining the voltage output frequency corresponding to the maximum value of the test voltage value in the second frequency sweep as the current resonant frequency;

[0014] If the frequency deviation between the current resonant frequency and the target setting frequency is smaller than a preset deviation threshold, it is determined that the series resonant circuit has reached the resonant state.

[0015] In some embodiments, if the frequency deviation value is not less than the deviation threshold, the method further includes:

[0016] adjusting the voltage output frequency to the target set frequency;

[0017] If the current resonant frequency is greater than the upper limit of the preset frequency range corresponding to the target set frequency, controlling the adjustable reactor to gradually increase the inductance value, and continuously obtaining the test voltage value until the test voltage value reaches a maximum value, and then stopping adjusting the inductance value of the adjustable reactor;

[0018] If the current resonant frequency is less than the lower limit of the preset frequency range corresponding to the target set frequency, controlling the adjustable reactor to gradually reduce its inductance value, and continuously obtaining the test voltage value until the test voltage value reaches a maximum value, and then stopping adjusting the inductance value of the adjustable reactor;

[0019] With the target set frequency as the center, in the frequency adjustment interval, controlling the voltage output frequency according to the second frequency adjustment step to perform a third round of frequency sweep, continuously acquiring the test voltage value, and determining the voltage output frequency corresponding to the maximum value of the test voltage value in the third round of frequency sweep as the adjusted current resonant frequency;

[0020] If the frequency deviation between the adjusted current resonant frequency and the target set frequency is smaller than a preset deviation threshold, it is determined that the series resonant circuit has reached the resonant state.

[0021] In some embodiments, the target test item includes an excitation characteristics test, the target experimental parameters include a plurality of first test voltage platform values, and adjusting the output voltage of the frequency-modulated and voltage-regulated power supply according to the target test parameters, obtaining the test operation parameters of the target electrical equipment, and generating the target test result of the target test item according to the test operation parameters include:

[0022] According to the multiple first test voltage platform values, adjusting the output voltage so that the test voltage value applied to the voltage transformer as the target electrical equipment is gradually increased and stabilized at the current first test voltage platform value;

[0023] Obtaining a primary winding excitation current of the voltage transformer at the current first test voltage platform value;

[0024] A target test result of the excitation characteristic test is generated according to each first test voltage platform value and the corresponding primary winding excitation current.

[0025] In some embodiments, when the target test item further includes an AC withstand voltage test, the target experimental parameters include multiple second test voltage platform values, adjusting the output voltage of the frequency-modulated and voltage-regulated power supply according to the target test parameters, obtaining the test operation parameters of the target electrical equipment, and generating the target test result of the target test item according to the test operation parameters include:

[0026] According to the multiple second test voltage platform values, adjusting the output voltage so that the test voltage value applied to the voltage transformer increases step by step and stabilizes at the current second test voltage platform value;

[0027] Controlling the current second test voltage platform value to maintain a preset duration, and obtaining equipment operation data of the target electrical equipment within the duration;

[0028] A target test result of the AC withstand voltage test is generated based on each second test voltage platform value and the corresponding equipment operation data.

[0029] In some embodiments, when the target test item further includes a lightning arrester current leakage test, the target test parameters include a resistive current setting value and a continuous operating voltage value, adjusting the output voltage of the frequency-modulated and voltage-regulated power supply according to the target test parameters, obtaining the test operation parameters of the target electrical equipment, and generating the target test result of the target test item according to the test operation parameters include:

[0030] Continuously increasing the output voltage and continuously obtaining the arrester resistive current of the target electrical device until the arrester resistive current reaches the resistive current set value, and recording the current output voltage value as the target voltage value;

[0031] Reducing the output voltage to the continuous operation voltage value, and obtaining a target resistive current value and a target full current value;

[0032] A target experimental result of the arrester current leakage test is generated according to the target voltage value, the target resistive current value, and the target total current value.

[0033] In some embodiments, the adjustable reactor and the capacitive voltage divider are in a horizontal position in the storage state and in a vertical position in the working state, and controlling the adjustable reactor and the capacitive voltage divider to be converted from the storage state to the working state on the carrying platform includes:

[0034] The adjustable reactor and the capacitive voltage divider are driven to flip around a horizontal axis by a flip driving mechanism provided on the carrying platform, so as to convert the adjustable reactor and the capacitive voltage divider from the horizontal posture to the vertical posture.

[0035] In a second aspect, an embodiment of the present application provides a high-voltage experimental device, including a carrying platform, a frequency-modulated and voltage-regulated power supply arranged on the carrying platform, an excitation transformer, an adjustable reactor, a capacitive voltage divider, and a controller;

[0036] The frequency- and voltage-regulated power supply is used to output alternating current with adjustable frequency and voltage to the excitation transformer;

[0037] The excitation transformer is used to boost the AC power and output it to the adjustable reactor;

[0038] The adjustable reactor is used to connect to the target electrical equipment to form a series resonant circuit, and is used to adjust the inductance parameters of the series resonant circuit to achieve resonance;

[0039] The capacitive voltage divider is used to be connected in parallel to both ends of the target electrical equipment to measure the test voltage value of the target electrical equipment;

[0040] The controller is used to control the adjustable inductor and the capacitive voltage divider to convert from a storage state to an operating state on the carrying platform; it is also used to connect the target electrical equipment to the output end of the adjustable inductor to form the series resonant circuit; it is also used to determine the target test item, and adjust the voltage output frequency of the frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable inductor according to the target test parameters preset in the target test item to make the series resonant circuit reach a resonant state; it is also used to adjust the output voltage of the frequency-modulated and voltage-regulated power supply according to the target test parameters, and obtain the test operation parameters of the target electrical equipment, and generate target test results according to the test operation parameters.

[0041] In some embodiments, a flipping drive mechanism is also provided on the supporting platform; the adjustable inductor and the capacitive voltage divider are arranged in parallel on the flipping drive mechanism and share a voltage equalizing ring; the controller drives the adjustable inductor and the capacitive voltage divider to flip around the horizontal axis by controlling the flipping drive mechanism, so that they are converted from a horizontal posture to a vertical posture.

[0042] In some embodiments, the adjustable reactor includes:

[0043] A plurality of low-voltage adjustable reactance units, wherein the plurality of low-voltage adjustable reactance units are stacked in series to form the adjustable reactor;

[0044] an insulating cylinder, wherein the plurality of low-voltage adjustable reactance units and the excitation transformer are disposed in the insulating cylinder;

[0045] a plurality of insulating support plates, the plurality of insulating support plates being concentric with and in contact with the insulating cylinder and being respectively used to support the corresponding low-voltage adjustable reactance unit so as to distribute the weight of the low-voltage adjustable reactance unit to the cylinder wall of the insulating cylinder;

[0046] The insulating transmission mechanism passes through the multiple insulating support plates and is connected to the multiple low-voltage adjustable reactance units, and is used to synchronously adjust the inductance values ​​of the multiple low-voltage adjustable reactance units.

[0047] In some embodiments, the high voltage testing device further comprises:

[0048] At least one current sensor is arranged on the primary winding of the voltage transformer to measure the primary winding excitation current; or is arranged on the lightning arrester to measure the lightning arrester resistive current;

[0049] A wireless transmission module is connected to the current sensor and the controller; the controller obtains the primary winding excitation current or the arrester resistive current from the current sensor through the wireless transmission module.

[0050] In a third aspect, an embodiment of the present application provides an electronic device, comprising: a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, it implements a high-voltage testing method for electrical equipment as described in any one of the embodiments of the first aspect of the present application.

[0051] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the storage medium stores a program, and the program is executed by a processor to implement a high-voltage testing method for electrical equipment as described in any one of the embodiments of the first aspect of the present application.

[0052] The high-voltage test method for electrical equipment according to the embodiment of the present application has at least the following beneficial effects:

[0053] The high-voltage test method for electrical equipment according to the embodiment of the present application is applied to a high-voltage experimental device, which includes a carrying platform, a frequency-modulated and voltage-regulated power supply, an excitation transformer, an adjustable reactor, and a capacitor voltage divider arranged on the carrying platform; the frequency-modulated and voltage-regulated power supply is used to output AC power with adjustable frequency and voltage to the excitation transformer; the excitation transformer is used to boost the AC power and output it to the adjustable reactor; the adjustable reactor is used to connect to the target electrical equipment to form a series resonant circuit, and is used to adjust the inductance parameters of the series resonant circuit to achieve resonance; the capacitor voltage divider is used to be connected in parallel to both ends of the target electrical equipment to measure the target voltage. The method comprises: controlling an adjustable reactor and a capacitive voltage divider to switch from a storage state to an operating state on a carrier platform; connecting a target electrical device to an output terminal of the adjustable reactor to form a series resonant circuit; determining a target test item, and adjusting the voltage output frequency of a frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable reactor according to target test parameters preset for the target test item, so that the series resonant circuit reaches a resonant state; adjusting the output voltage of the frequency-modulated and voltage-regulated power supply according to the target test parameters, obtaining test operation parameters of the target electrical device, and generating a target test result according to the test operation parameters.

[0054] This application achieves the integration and modularization of the test equipment by pre-setting and integrating the core test components such as the frequency-modulated and voltage-regulated power supply, excitation transformer, adjustable reactor and capacitor voltage divider on the carrying platform, which greatly reduces the preparation work of handling, positioning and complex connection of each independent equipment unit before the high-voltage test. Then, by controlling the adjustable reactor and the capacitor voltage divider to quickly convert from the storage state to the working state on the carrying platform, the layout process of the test site can be further simplified, the equipment deployment and preparation time can be shortened, and the test system can be quickly ready. Next, by accurately adjusting the voltage output frequency of the frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable reactor according to the target test parameters preset by the target test project, the series resonant circuit can be efficiently brought to a resonant state, avoiding the time delays and uncertainties caused by repeated manual attempts and rough adjustments in the traditional method, and improving the accuracy and speed of parameter matching and system tuning. Subsequently, in the established resonant state, the output voltage of the frequency-modulated and voltage-regulated power supply is quickly adjusted to the required value for the test according to the target test parameters, and the test operation parameters of the target electrical equipment are obtained in real time, so that the test process can be quickly completed and the target test results can be generated. Compared with the prior art, where each component of a high-voltage test device often needs to be deployed one by one, wired separately, and manually tuned, especially when dealing with ultra-high voltage electrical equipment that is bulky and has strict test parameter requirements, the preparation phase is time-consuming, the tuning process is complex, and the overall test cycle is lengthy. The method provided in the embodiment of the present application reduces the pre-preparation time through an integrated design, optimizes the on-site operation process through convenient state transitions, accelerates the resonance tuning process through intelligent adjustment based on preset parameters, and can quickly obtain test results. Therefore, the embodiment of the present application can improve the test efficiency of high-voltage testing of ultra-high voltage electrical equipment.

[0055] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become obvious from the description below, or will be learned through practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0057] Figure 1 A schematic structural diagram of an optional high-voltage test device provided in an embodiment of the present application;

[0058] Figure 2 A flowchart of an optional high-voltage test method for electrical equipment provided in an embodiment of the present application;

[0059] Figure 3 A side view of an optional high-voltage test device provided in an embodiment of the present application showing an adjustable reactor and a capacitive voltage divider in a stored state;

[0060] Figure 4 A side view of an adjustable reactor and a capacitive voltage divider in an optional high-voltage test device provided in an embodiment of the present application in a working state;

[0061] Figure 5 A flowchart of another optional high-voltage test method for electrical equipment provided in an embodiment of the present application;

[0062] Figure 6 A flowchart of another optional high-voltage test method for electrical equipment provided in an embodiment of the present application;

[0063] Figure 7 A flowchart of another optional high-voltage test method for electrical equipment provided in an embodiment of the present application;

[0064] Figure 8 A flowchart of another optional high-voltage test method for electrical equipment provided in an embodiment of the present application;

[0065] Figure 9 A flowchart of another optional high-voltage test method for electrical equipment provided in an embodiment of the present application;

[0066] Figure 10 A schematic structural diagram of an optional adjustable reactor provided in an embodiment of the present application;

[0067] Figure 11 A flowchart of another optional high-voltage test method for electrical equipment provided in an embodiment of the present application; DETAILED DESCRIPTION

[0068] The following describes in detail embodiments of the present application. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application and are not to be construed as limiting the present application.

[0069] In the description of this application, "several" means one or more, "more" means more than two, "greater than," "less than," and "exceed" are understood to exclude the number itself, while "above," "below," and "within" are understood to include the number itself. If the term "first" or "second" is used in a description, it is only used to distinguish technical features and should not be construed to indicate or imply relative importance, or to implicitly specify the number or order of the technical features indicated.

[0070] In the description of this application, it should be understood that descriptions involving orientations, such as up, down, left, right, front, and back, etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, they cannot be understood as limitations on this application.

[0071] Throughout this specification, reference to terms such as "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0072] In the description of this application, it should be noted that, unless otherwise explicitly defined, terms such as "set," "install," and "connect" should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in this application based on the specific content of the technical solution. In addition, the identification of specific steps below does not represent a limitation on the order of steps and execution logic. The execution order and execution logic between each step should be understood and inferred with reference to the content described in the embodiments.

[0073] Ultra-high voltage electrical equipment is an important component of power plants and substations. High-voltage testing is a necessary method to determine whether such equipment meets operating standards. It applies a test voltage to simulate the power that the equipment may withstand in actual operation. This test aims to detect potential equipment defects, thereby effectively preventing equipment damage or safety accidents. It is an important part of ensuring the safe and stable operation of electrical equipment.

[0074] Conventional technology requires high-voltage testing of ultra-high voltage electrical equipment using multiple separate pieces of equipment for on-site assembly and testing. The assembly process includes arranging the various devices, stacking reactors, installing grading rings, stacking voltage dividers, and wiring between devices. The arduous task of transporting, arranging, and switching equipment results in low high-voltage testing efficiency.

[0075] This application achieves the integration and modularization of the test equipment by pre-setting and integrating the core test components such as the frequency-modulated and voltage-regulated power supply, excitation transformer, adjustable reactor and capacitor voltage divider on the carrying platform, which greatly reduces the preparation work of handling, positioning and complex connection of each independent equipment unit before the high-voltage test. Then, by controlling the adjustable reactor and the capacitor voltage divider to quickly convert from the storage state to the working state on the carrying platform, the layout process of the test site can be further simplified, the equipment deployment and preparation time can be shortened, and the test system can be quickly ready. Next, by accurately adjusting the voltage output frequency of the frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable reactor according to the target test parameters preset by the target test project, the series resonant circuit can be efficiently brought to a resonant state, avoiding the time delays and uncertainties caused by repeated manual attempts and rough adjustments in the traditional method, and improving the accuracy and speed of parameter matching and system tuning. Subsequently, in the established resonant state, the output voltage of the frequency-modulated and voltage-regulated power supply is quickly adjusted to the required value for the test according to the target test parameters, and the test operation parameters of the target electrical equipment are obtained in real time, so that the test process can be quickly completed and the target test results can be generated. Compared with the prior art, where each component of a high-voltage test device often needs to be deployed one by one, wired separately, and manually tuned, especially when dealing with ultra-high voltage electrical equipment that is bulky and has strict test parameter requirements, the preparation phase is time-consuming, the tuning process is complex, and the overall test cycle is lengthy. The method provided in the embodiment of the present application reduces the pre-preparation time through an integrated design, optimizes the on-site operation process through convenient state transitions, accelerates the resonance tuning process through intelligent adjustment based on preset parameters, and can quickly obtain test results. Therefore, the embodiment of the present application can improve the test efficiency of high-voltage testing of ultra-high voltage electrical equipment.

[0076] See also Figure 1 , Figure 1 Schematic diagram of a high voltage test device 100 provided in an embodiment of the present invention. Figure 1 As shown, the high-voltage test device 100 includes a carrying platform (not explicitly marked in the figure, but serving as the basis for the installation and integration of the main components), and a frequency-modulated and voltage-regulated power supply 110, an excitation transformer 120, an adjustable inductor 130, and a capacitive voltage divider 140 arranged on the carrying platform.

[0077] The frequency- and voltage-modulated power supply 110 serves as the initial power source for the test system, outputting alternating current with adjustable frequency and voltage. Its output is electrically connected to the input (primary winding) of the excitation transformer 120. By adjusting its output frequency, the excitation frequency applied to the subsequent series resonant circuit can be varied, thereby finding the resonance point. By adjusting its output voltage, the amplitude of the test voltage ultimately applied to the target electrical equipment can be controlled.

[0078] The excitation transformer 120 receives AC power from the frequency- and voltage-regulated power supply 110 at its input. It then boosts the voltage of this AC power to meet the voltage level requirements of the high-voltage test and outputs the boosted high voltage from its output (secondary winding). Its output is connected to the adjustable reactor 130.

[0079] One end of the adjustable reactor 130 receives the high-voltage alternating current output from the excitation transformer 120, and the other end is used to connect to the target electrical equipment 200 (i.e., the high-voltage electrical equipment to be tested). The adjustable reactor 130 is connected in series with the equivalent capacitance of the target electrical equipment 200, together forming an LC series resonant circuit. The key function of the adjustable reactor 130 is that its inductance value is adjustable. By changing its inductance parameters, the inherent resonant frequency of the entire series resonant circuit can be adjusted, so that the circuit can reach a resonant state at a specific frequency output by the frequency-modulated and voltage-regulated power supply 110. In the resonant state, the loop impedance is minimized, and a very high test voltage can be obtained on the target electrical equipment 200 at a lower excitation voltage.

[0080] Capacitive voltage divider 140 is connected in parallel across the target electrical device 200. Its function is to accurately measure the actual test voltage applied to the target electrical device 200. Because the test voltage is typically very high, capacitive voltage divider 140 proportionally reduces the high voltage to a safe range that can be measured with conventional instruments. The measured signal is then fed back to the control system or displayed to the operator.

[0081] The target electrical equipment 200 is the object of the high voltage test, such as high voltage cables, transformers, switchgear, voltage transformers, lightning arresters, etc., which usually exhibit capacitive load characteristics. The entire high voltage test device 100 is operated by the above components in a controller (not in Figure 1 A high voltage test method for the target electrical device 200 is implemented under the control of the control device 200 (shown separately in the figure, but is an essential component for implementing the method of the present invention).

[0082] See also Figure 2 The embodiment of the present invention provides a high-voltage test method for electrical equipment, which may include, but is not limited to, the following steps 201 to 204:

[0083] Step 201 : Controlling the adjustable reactor and the capacitive voltage divider to switch from a storage state to a working state on the carrying platform.

[0084] Step 202: Connect the target electrical device to the output end of the adjustable reactor to form a series resonant circuit.

[0085] Step 203 : determining a target test item, and adjusting the voltage output frequency of the frequency- and voltage-regulated power supply and the inductance of the adjustable reactor according to target test parameters preset in the target test item, so as to make the series resonant circuit reach a resonant state.

[0086] Step 204 : adjusting the output voltage of the frequency- and voltage-regulated power supply according to the target test parameters, obtaining the test operation parameters of the target electrical equipment, and generating the target test results according to the test operation parameters.

[0087] In step 201 of some embodiments, this step is intended to convert the key high-voltage components in the test device from a compact storage state that is convenient for transportation and storage, such as a horizontal placement state, to a working state that meets the requirements of electrical insulation and test operations, such as a vertical placement state. The carrying platform is usually equipped with a flipping drive mechanism, such as a hydraulically driven or electrically driven flipping mechanism, which can reliably drive the adjustable inductor and the capacitive voltage divider arranged in parallel with it and sharing the equalizing ring to flip around a preset horizontal axis. This conversion process is automatically or semi-automatically controlled by the controller of the high-voltage test device, which greatly simplifies the on-site installation and layout work and avoids the complicated operations of hoisting and stacking these heavy equipment in the traditional way.

[0088] In some embodiments, see Figure 3 , Figure 3 The side view of the adjustable reactor and capacitor voltage divider in the high-voltage test device is shown in the storage state. At this time, they are in a horizontal posture, which helps to reduce the overall height of the equipment, making its center of gravity lower and more stable during transportation, and can adapt to the height limit of standard transport vehicles. It also facilitates the storage of the equipment when it is not in operation and reduces the space occupied. Figure 3 As can be seen in the figure, the columnar high-pressure component is placed horizontally, and the flip mechanism below it is in a state of supporting the horizontal posture, and the hydraulic station next to it provides power for the flip. Figure 4 The figure shows the side view of the adjustable reactor and capacitor voltage divider after they are switched to the working state. At this time, they are in a vertical position, which can meet the requirements of the insulation distance to the ground and between phases during high-voltage testing. The "equalizing ring" on the top is also raised to a high position to optimize the electric field distribution.

[0089] Therefore, step 201 may specifically include but is not limited to the following sub-steps: driving the adjustable reactor and the capacitive voltage divider to flip around a horizontal axis through a flip driving mechanism provided on the carrier platform, so that the adjustable reactor and the capacitive voltage divider are flipped from the horizontal axis to the horizontal axis. Figure 3 The horizontal position (stowed state) shown is smoothly and accurately converted to Figure 4 The core power and execution unit of the "flip drive mechanism" can be composed of Figure 3 and Figure 4It consists of the "hydraulic station" that can be seen in the figure and the "hydraulic cylinder" that acts on the bottom of the columnar equipment.

[0090] In step 202 of some embodiments, "target electrical equipment" refers to various types of high-voltage electrical equipment that require high-voltage testing, such as power transformers and lightning arresters. These devices typically exhibit capacitive load characteristics under AC high voltage. Connecting them to the output of an adjustable reactor means electrically connecting the equivalent capacitance of the target electrical equipment and the inductance of the adjustable reactor in series. The "series resonant circuit" thus constructed is a key circuit structure that utilizes the principle of inductance and capacitance resonance to generate high voltage during high-voltage testing. By adjusting the circuit parameters to cause resonance at the power supply frequency, a test voltage significantly higher than the output of the excitation transformer can be obtained at both ends of the target electrical equipment.

[0091] In step 203 of some embodiments, according to the requirements of the test task, the target test items to be executed are first determined, such as AC withstand voltage test, excitation characteristic test or lightning arrester current leakage test. Each test item has its specific target test parameters, including but not limited to the target frequency (or frequency range) of the test voltage and the maximum capacitance of the test object. Based on these parameters, the controller of the high-voltage test device automatically or with the assistance of the operator adjusts the voltage output frequency of the AC power output by the frequency-modulated and voltage-regulated power supply to the excitation transformer, and simultaneously controls the adjustment mechanism inside the adjustable reactor (for example, changing the core air gap) to change its equivalent inductance value. By coordinating the frequency and inductance, the inductive reactance and the capacitive reactance of the series resonant circuit reach a basic balance at a certain frequency, that is, enter a resonant state, at which time the loop impedance is minimum and the quality factor Q value is high, and it is possible to induce several times or even dozens of times higher voltage on the target electrical equipment with a lower excitation voltage.

[0092] See also Figure 5 In some embodiments, the target test parameters include a target set frequency, a target sweep frequency range, and a target set inductance value. Step 203 may include, but is not limited to, steps 501 to 504.

[0093] Step 501: Adjust the inductance value of the adjustable reactor to a target inductance value.

[0094] Step 502: Control the voltage output frequency to perform a first round of frequency sweep in the target frequency sweep range according to the preset first frequency adjustment step, and continuously obtain the test voltage value, and determine the voltage output frequency corresponding to the maximum value of the test voltage value in the first round of frequency sweep as the preliminary resonant frequency.

[0095] Step 503, with the preliminary resonant frequency as the center, within the preset frequency adjustment range, the voltage output frequency is controlled according to the preset second frequency adjustment step to perform a second round of frequency sweep, and the test voltage value is continuously obtained, and the voltage output frequency corresponding to the maximum value of the test voltage value in the second round of frequency sweep is determined as the current resonant frequency.

[0096] Step 504 : If the frequency deviation between the current resonant frequency and the target frequency is less than a preset deviation threshold, it is determined that the series resonant circuit has reached a resonant state.

[0097] In step 501 of some embodiments, this step serves as the starting point for the automatic tuning process. The controller first drives the adjustment mechanism within the adjustable reactor to set its inductance to an initial reference level based on a preset target inductance value or a target inductance value entered by the operator. This target inductance value can be an empirical value based on the test product type and test requirements, or an approximate value derived through theoretical calculation. By presetting a relatively suitable inductance value, the range of subsequent frequency sweeps can be effectively narrowed, improving the efficiency and accuracy of tuning.

[0098] In step 502 of some embodiments, after the inductance value of the adjustable reactor is set, the controller starts to perform the first round of frequency scanning. At this time, the frequency-modulated and voltage-regulated power supply gradually changes the voltage output frequency of its output within a predetermined target frequency sweep range (for example, from the upper limit frequency to the scan, or vice versa) with a relatively large preset first frequency adjustment step (for example, 1Hz or 0.5Hz). During the frequency sweep process, the test voltage value applied to the target electrical equipment is continuously monitored and obtained through the capacitive voltage divider. After scanning the entire target frequency sweep range, the controller will identify the maximum peak value of the test voltage value that appears in this process, and record the voltage output frequency corresponding to the peak value as the preliminary resonant frequency. The purpose of this coarse adjustment step is to quickly locate the approximate area of ​​the resonance point.

[0099] In step 503 of some embodiments, with the preliminary resonant frequency as the center, within the preset frequency adjustment interval, the voltage output frequency is controlled according to the preset second frequency adjustment step to perform a second round of frequency sweep, and the test voltage value is continuously obtained, and the voltage output frequency corresponding to the maximum value of the test voltage value in the second round of frequency sweep is determined as the current resonant frequency. After obtaining the preliminary resonant frequency, in order to find the resonance point more accurately, the controller performs a second round of fine scanning within a smaller preset frequency adjustment interval (for example, the preliminary resonant frequency ±1Hz or ±2Hz) around the preliminary resonant frequency. In this round of scanning, a smaller preset second frequency adjustment step (for example, 0.1Hz or 0.05Hz) can be used, and the test voltage value is also continuously monitored and obtained. Through this finer frequency adjustment, the precise maximum value of the test voltage value can be captured more accurately, and the voltage output frequency corresponding to the maximum value is determined as the current actual resonant frequency, that is, the current resonant frequency.

[0100] In step 504 of some embodiments, if the frequency deviation value between the current resonant frequency and the target set frequency is less than a preset deviation threshold, it is determined that the series resonant circuit has reached a resonant state. After determining the current resonant frequency, the controller compares it with the target set frequency required by the test project (for example, the power frequency 50Hz required by the VT excitation characteristic test, or a specific frequency deviating from the power frequency required by the GI S withstand voltage test). If the frequency deviation value between the two is less than a pre-set, allowed deviation threshold, it can be considered that the current tuning result meets the test requirements and the series resonant circuit has successfully reached the required resonant state. At this point, the tuning process is completed, and the high-voltage test device can be ready to enter the subsequent boost test phase.

[0101] Through the implementation of the above steps 501 to 504, the present invention can realize a more refined and automated resonant tuning process. First, by setting the initial inductance value, a good starting point is provided for the subsequent frequency scan. Then, a coarse adjustment method is used to quickly lock the approximate range of the resonance point, effectively avoiding blind search in the entire frequency range, thereby saving time. Subsequently, fine adjustment is performed based on the coarse adjustment results, and the actual resonance point is further approached by a smaller frequency step, which significantly improves the positioning accuracy of the resonant frequency. Finally, by comparing with the target set frequency and judging the threshold, it is ensured that the resonant state finally achieved meets the requirements of the test specifications. This staged, coarse-to-fine tuning strategy not only improves the intelligence level and efficiency of automatic tuning, but also ensures the accuracy of the resonant conditions.

[0102] See also Figure 6 In some embodiments, if the frequency deviation value is not less than the deviation threshold, step 203 may further include, but is not limited to, steps 601 to 605.

[0103] Step 601: Adjust the voltage output frequency to a target set frequency.

[0104] Step 602: If the current resonant frequency is greater than the upper limit of the preset frequency range corresponding to the target set frequency, the adjustable reactor is controlled to gradually increase the inductance value, and the test voltage value is continuously obtained until the test voltage value reaches a maximum value, and the inductance value adjustment of the adjustable reactor is stopped.

[0105] Step 603: If the current resonant frequency is less than the lower limit of the preset frequency range corresponding to the target set frequency, the adjustable inductor is controlled to gradually reduce its inductance value, and the test voltage value is continuously obtained until the test voltage value reaches a maximum value, and the inductance adjustment of the adjustable inductor is stopped.

[0106] Step 604, with the target set frequency as the center, in the frequency adjustment range, the voltage output frequency is controlled according to the second frequency adjustment step to perform a third round of frequency sweep, and the test voltage value is continuously obtained, and the voltage output frequency corresponding to the maximum value of the test voltage value in the third round of frequency sweep is determined as the adjusted current resonant frequency.

[0107] Step 605: If the frequency deviation between the adjusted current resonant frequency and the target set frequency is less than a preset deviation threshold, it is determined that the series resonant circuit has reached a resonant state.

[0108] In step 601 of some embodiments, the output voltage frequency of the frequency- and voltage-regulated power supply is forcibly set to the target set frequency required by the test project. This is done so that, during the subsequent inductance adjustment process, the effect of varying the inductance on the test voltage value at the target frequency can be directly observed, thereby more directly finding the optimal resonant matching inductance at the target frequency.

[0109] In step 602 of some embodiments, when the current resonant frequency obtained by the previous round of frequency sweep is too high, according to the series resonance formula, when the frequency is fixed, in order to make the loop tend to be in tune again, it is necessary to increase the product of L*C. Since the capacitance C of the test object is usually fixed, it is necessary to increase the inductance value of the adjustable reactor. The controller will issue an instruction to make the adjustment mechanism inside the adjustable reactor gradually and slightly increase its inductance. During this process, the controller continuously monitors the test voltage value fed back by the capacitor voltage divider. When it is observed that the test voltage value reaches a maximum value and then begins to decline, indicating that the inductance value at this time and the capacitance of the test object have achieved the best resonant match at the target set frequency, the controller stops adjusting the inductance value of the adjustable reactor.

[0110] In step 603 of some embodiments, corresponding to step 602, when the current resonant frequency obtained from the previous frequency sweep is low, and also under the premise that the voltage output frequency has been fixed to the target set frequency, in order to achieve resonance at this frequency, it is necessary to reduce the product of L*C, that is, to reduce the inductance value of the adjustable inductor. The adjustable inductor is controlled to gradually reduce its inductance while continuously monitoring the test voltage value. When the test voltage value reaches a maximum value and then begins to decrease, it indicates that the best matching inductance at the target set frequency has been found, and the controller then stops adjusting the inductance value.

[0111] In step 604 of some embodiments, although step 602 or 603 adjusts the inductance so that the loop reaches the voltage maximum at the target set frequency, since the inductance adjustment of the adjustable reactor may have certain step accuracy limitations, the resonance point at this time may still have a slight deviation from the target set frequency. Therefore, after completing the inductance adjustment, it is necessary to perform a fine frequency scan again. The controller will use the second frequency adjustment step to perform a third round of frequency scanning within a smaller frequency adjustment range (similar to step 503) with the currently set target set frequency as the center, and continue to obtain the test voltage value. The frequency corresponding to the voltage maximum found by this scan is determined as the current resonant frequency after the inductance and frequency are coordinated and adjusted.

[0112] In step 605 of some embodiments, if the frequency deviation value between the adjusted current resonant frequency and the target setting frequency is less than a preset deviation threshold, it is determined that the series resonant circuit has reached a resonant state. Similar to step 404, the controller compares the adjusted current resonant frequency obtained by this round (third round) of frequency sweep with the target setting frequency. If the frequency deviation value between them is less than the preset deviation threshold, it is considered that the tuning is successful, the series resonant circuit has accurately reached the target resonant state, and subsequent tests can be performed. If it is still not satisfied, it may be necessary to repeat the above-mentioned inductance adjustment and frequency fine-tuning process.

[0113] Through the implementation of the above steps 601 to 605, the frequency is first fixed at the target value, providing a benchmark for subsequent inductance adjustment; then the inductance is intelligently adjusted according to the deviation direction of the resonant frequency until the maximum response is obtained at the target frequency; through another fine frequency scan, the resonant point is further optimized to compensate for the possible lack of accuracy in the inductance adjustment; finally, the tuning result is finally verified, so that the high-voltage test device can more effectively overcome the influence of factors such as the uncertainty of the test product parameters and environmental changes, ensuring that even in more complex situations, the target resonant frequency can be quickly and accurately found and stabilized, thereby ensuring the accuracy and reliability of the test, and further improving the level of test automation.

[0114] In step 204 of some embodiments, after the series resonant circuit reaches the resonant state, the test can be officially started. According to the target test parameters of the selected target test project, the output voltage amplitude of the frequency-modulated and voltage-regulated power supply is accurately controlled, thereby applying the required test voltage to the target electrical equipment through the amplification effect of the excitation transformer and the series resonant circuit. During the entire test process, the voltage value applied to the target electrical equipment is monitored in real time by a capacitive voltage divider, and the various test operation parameters of the target electrical equipment are continuously obtained by a current sensor (such as a sensor for measuring a primary excitation current or a lightning arrester leakage current) arranged at a specific position. These parameters are recorded for processing and analysis, and the target test results of the target test project are finally generated according to a preset evaluation standard, such as a test report, a characteristic curve, or a qualified or unqualified judgment.

[0115] See also Figure 7 In some embodiments, the target test item includes an excitation characteristic test, the target experimental parameter includes a plurality of first test voltage platform values, and step 204 may include, but is not limited to, steps 701 to 703.

[0116] Step 701: According to a plurality of first test voltage platform values, the output voltage is adjusted so that the test voltage value applied to the voltage transformer as the target electrical equipment is gradually increased and stabilized at the current first test voltage platform value.

[0117] Step 702: Obtain the primary winding excitation current of the voltage transformer at the current first test voltage platform value.

[0118] Step 703 : generating a target test result of the excitation characteristic test according to each first test voltage platform value and the corresponding primary winding excitation current.

[0119] In step 701 of some embodiments, in this step, the controller of the high-voltage test device will lock the target on each first test voltage platform value in turn according to a preset order (usually increasing step by step). These platform values ​​are usually set according to relevant test standards or rated parameters of the voltage transformer under test (for example, 20%, 50%, 80%, 100%, 110%, 120% of the rated voltage, etc.). The controller accurately controls the output voltage amplitude of the frequency-modulated and voltage-regulated power supply and utilizes the voltage amplification effect of the tuned series resonant circuit so that the test voltage value finally applied to the high-voltage side of the voltage transformer under test slowly rises until it reaches and stabilizes at the current first test voltage platform value. The stabilization process may include a certain voltage holding time to ensure accurate readings.

[0120] In step 702 of some embodiments, after the test voltage value successfully stabilizes at the current first test voltage platform value, the controller triggers a data acquisition instruction to obtain the excitation current flowing through the primary winding of the voltage transformer at this moment. The measurement of the excitation current is usually achieved by a dedicated current sensor, which is preferably arranged at the ground terminal of the primary winding of the voltage transformer to ensure safe and accurate measurement. In some advanced embodiments, the data collected by the current sensor can be sent to a controller or data recording device located in a safe operating area in real time via a wireless transmission module, avoiding the complexity and risk of wiring in a high-voltage environment. The current value obtained is the effective value of the excitation current under this specific voltage platform.

[0121] In step 703 of some embodiments, after completing the voltage application of a first test voltage platform value and the acquisition of the corresponding excitation current, the pair of voltage-current data points is recorded, and then the next preset first test voltage platform value is automatically entered, and the operations of steps 701 and 702 are repeated until the measurement of all preset voltage platform values ​​is completed. When all data points are collected, the controller or host computer will organize and store these voltage values ​​and their corresponding excitation current values, and can further process and generate the target test results of the excitation characteristic test. These results are usually presented as a data table, or more intuitively drawn as a voltage-current (UI) excitation characteristic curve. This curve can clearly reflect the magnetization state of the voltage transformer core under different magnetic flux densities, and is an important basis for judging its performance, saturation point, and whether it meets protection or metering requirements.

[0122] Through the automated execution of steps 701 to 703, the test voltage is automatically, step by step, accurately controlled and stabilized, avoiding overshoot or instability that may be caused by manual voltage boosting, and ensuring the voltage accuracy of each test point. The excitation current under each voltage platform is automatically acquired through a dedicated current sensor (possibly combined with wireless transmission), which improves the efficiency and reliability of data acquisition and reduces operational risks. The collected data is automatically sorted and the final test results, such as the excitation curve, are generated, providing a direct basis for subsequent equipment status evaluation. This automated excitation characteristic test process not only reduces the labor intensity of the test personnel and shortens the test time, but more importantly, it improves the standardization of the test process and the accuracy and repeatability of the data, thereby enabling a more reliable evaluation of the performance of the voltage transformer.

[0123] See also Figure 8 In some embodiments, the target test item further includes an AC withstand voltage test, the target experimental parameters include multiple second test voltage platform values, and step 204 may include, but is not limited to, steps 801 to 803.

[0124] Step 801: According to a plurality of second test voltage platform values, the output voltage is adjusted so that the test voltage value applied to the voltage transformer is gradually increased and stabilized at the current second test voltage platform value.

[0125] Step 802: Control the current second test voltage platform value to maintain a preset duration, and obtain the equipment operation data of the target electrical equipment within the duration.

[0126] Step 803: Generate a target test result of the AC withstand voltage test according to each second test voltage platform value and the corresponding equipment operation data.

[0127] In step 801 of some embodiments, similar to voltage regulation in an excitation characteristics test, during the voltage-boosting phase of this AC withstand voltage test, the controller of the high-voltage test apparatus controls the output of the frequency-modulated and voltage-regulated power supply according to a sequence of preset second test voltage plateau values. Through the resonated series circuit, the test voltage applied to the target electrical equipment is gradually increased at a prescribed rate or step size. Whenever the voltage reaches a preset second test voltage plateau value, the controller precisely stabilizes it at that level, ensuring voltage accuracy and stability and preparing for the subsequent withstand voltage test.

[0128] In step 802 of some embodiments, after the test voltage value is successfully stabilized at the current second test voltage platform value, a timer is started to maintain the voltage at the platform value for a predetermined duration (e.g., 1 minute or longer as specified by the standard). During the entire duration of the voltage maintenance, the controller continuously obtains equipment operation data of the target electrical equipment through various sensors and monitoring systems. Such data may include, but is not limited to: the applied test voltage value (monitored by a capacitive voltage divider to ensure stability), leakage current flowing through the test object, partial discharge signals, equipment temperature, etc.

[0129] In step 803 of some embodiments, after the preset duration, if the target electrical equipment does not have any abnormal phenomenon, it is considered that it has passed the withstand voltage test under the current voltage platform. The controller will record the voltage platform value, the actual holding time, and the key equipment operation data obtained during the entire duration. If the test includes multiple boost platforms, steps 801 and 802 will be repeated until the assessment of all platforms is completed. After the test is completed, all the collected data are combined to generate the target test results of the AC withstand voltage test. The result usually clearly indicates whether the test equipment has passed the withstand voltage test of the specified voltage level, and may be accompanied by detailed test process data records, such as voltage curves, leakage current curves, etc., as a basis for evaluating the insulation status of the equipment.

[0130] The automated execution of steps 801 through 803 ensures accurate and smooth application of the test voltage, meeting the voltage-boosting requirements of the test standard. The target voltage is maintained for the specified time, during which comprehensive status monitoring of the equipment under test is performed. Test data is automatically recorded and organized, generating a final test conclusion that provides objective evidence for equipment compliance. This automated AC withstand voltage test method significantly improves test efficiency, reduces the arbitrariness and potential risks of manual operation, and enhances the reliability and traceability of test results.

[0131] See also Figure 9 In some embodiments, the target test items also include a lightning arrester current leakage test, and the target experimental parameters include a resistive current setting value and a continuous operating voltage value. Step 204 may include, but is not limited to, steps 901 to 903.

[0132] Step 901: continuously increase the output voltage and continuously obtain the arrester resistive current of the target electrical device until the arrester resistive current reaches the resistive current setting value, and record the current output voltage value as the target voltage value.

[0133] Step 902 : Reduce the output voltage to a continuous operation voltage value, and obtain a target resistive current value and a target full current value.

[0134] Step 903 : generating a target experimental result of the arrester current leakage test according to the target voltage value, the target resistive current value, and the target total current value.

[0135] In step 901 of some embodiments, the output of the frequency-modulated and voltage-regulated power supply is first controlled so that the AC voltage applied to the arrester under test through the series resonant circuit slowly and continuously increases. At the same time, the arrester resistive current flowing through the arrester is monitored and obtained in real time by a current measurement system specially configured for this test. The voltage increase process will continue until the monitored arrester resistive current value reaches a preset resistive current setting value. Once the setting value is reached, the output voltage value applied to both ends of the arrester at this moment is immediately recorded, and the voltage value is determined as the target voltage value of the arrester, that is, its power frequency reference voltage.

[0136] In step 902 of some embodiments, after successfully measuring the power frequency reference voltage, the controller controls the output of the frequency- and voltage-regulated power supply to steadily reduce the voltage applied to the arrester from the reference voltage level to the continuous operating voltage value specified in the arrester standard. Once the voltage stabilizes at the continuous operating voltage value, the current measurement system is used again to obtain the target resistive current value and the target total current value flowing through the arrester. These current values ​​are important parameters for evaluating the long-term operating status and health of the arrester under normal operating voltage.

[0137] In step 903 of some embodiments, after completing the above-mentioned voltage regulation and current measurement, the key data recorded are sorted and stored: the target voltage value (power frequency reference voltage) measured at a specific resistive current setting value, and the target resistive current value and target full current value measured at the continuous operating voltage. Based on these data, the target test results of the arrester current leakage test can be automatically generated. These results are usually compared with standard limits or historical data to determine whether the electrical performance of the arrester is qualified, whether there are problems such as moisture, aging or internal defects.

[0138] Conventional single-core adjustable reactors have concentrated weight on the core and adjustment mechanism, requiring iron housing support, which increases the height of the reactor and is not conducive to vertical and horizontal flipping. To meet the flipping requirements, the present application embodiment designs a new type of adjustable reactor, please refer to Figure 10 , the adjustable reactor provided in the embodiment of the present application includes:

[0139] Multiple low-voltage adjustable reactance units, multiple low-voltage adjustable reactance units are stacked in series to form an adjustable reactor;

[0140] An insulating cylinder, a plurality of low-voltage adjustable reactance units and an excitation transformer are all arranged in the insulating cylinder;

[0141] A plurality of insulating support plates, which are concentric with and fixed to the insulating cylinder and are respectively used to support corresponding low-voltage adjustable reactance units to distribute the weight of the low-voltage adjustable reactance units to the cylinder wall of the insulating cylinder;

[0142] The insulating transmission mechanism passes through multiple insulating support plates and is connected to multiple low-voltage adjustable reactance units, and is used to synchronously adjust the inductance values ​​of the multiple low-voltage adjustable reactance units.

[0143] Among them, the embodiment of the present application utilizes multiple low-voltage adjustable reactors connected in series and stacked to form a high-voltage adjustable reactor, which is placed in an insulating cylinder. Insulating supports and insulating transmission mechanisms are used between each level of small reactors, and an insulating support plate that is concentric with and in close contact with the outer insulating cylinder is used to support and fix each level of reactor. The weight of each small reactor and the adjustment mechanism can be distributed to the entire insulating cylinder, reducing the height and weight of the reactor while ensuring the structural stability of the reactor during vertical and horizontal flipping. In addition, integrating the excitation transformer into the insulating cylinder can optimize the overall layout of the test platform. Taking the 750kV / 2A adjustable reactor as an example, a set of traditional adjustable reactors with the same parameters needs to be composed of two reactors stacked and connected in series, equipped with an external excitation transformer. The total height of the reactor exceeds 7 meters and weighs 20 tons, while the height of this device is less than about 4.5 meters and the weight is less than 12 tons.

[0144] In some embodiments, the high-voltage test device also includes a controller, which is responsible for coordinating and controlling the various components within the device (such as the frequency-modulated and voltage-regulated power supply, adjustable reactor, flip mechanism, various sensors, etc.) to operate according to preset programs and logic. The controller is used to specifically implement all steps of the "high-voltage test method for electrical equipment" described in detail above. For example, it controls the conversion of the components from the storage state to the working state (step 101), controls the establishment of the test circuit (step 102), performs the intelligent resonance tuning process (step 103 and its detailed steps such as 401-404, 501-505), and automatically executes the corresponding voltage application, data collection and result generation process (step 104 and its detailed steps such as 601-603, 701-703, 801-803) according to different test items (such as excitation characteristics test, AC withstand voltage test, lightning arrester test). Its specific control logic, algorithm, and interaction with each component are completely consistent with the description of the method section above.

[0145] In some embodiments, in order to accurately measure key current parameters in a specific test project and improve the safety and convenience of the measurement, the high-voltage test device is equipped with a dedicated current sensor and a wireless transmission module.

[0146] Depending on the test object, for example, when testing the excitation characteristics of a voltage transformer, a current sensor is placed in the primary winding to measure the excitation current flowing through the primary winding. When testing a lightning arrester, a current sensor is placed at the arrester's ground terminal to measure the total current flowing through the arrester and, through subsequent processing, extract the resistive current component.

[0147] One end of the wireless transmission module is connected to the current sensor to obtain its measurement data, and the other end is used for wireless communication with the controller of the high-voltage test device.

[0148] Through this wireless transmission module, the controller can obtain the required primary winding excitation current or lightning arrester resistive current data in real time and safely from current sensors located in areas with high potential or inconvenient wiring. The current signal on the high-voltage side is transmitted to the control system wirelessly, thereby improving the safety and operational convenience of the test and reducing the interference and wiring difficulties of traditional signal cables in high-voltage environments.

[0149] The high-voltage test method for electrical equipment according to the embodiment of the present application is applied to a high-voltage experimental device, which includes a carrying platform, a frequency-modulated and voltage-regulated power supply, an excitation transformer, an adjustable reactor, and a capacitor voltage divider arranged on the carrying platform; the frequency-modulated and voltage-regulated power supply is used to output AC power with adjustable frequency and voltage to the excitation transformer; the excitation transformer is used to boost the AC power and output it to the adjustable reactor; the adjustable reactor is used to connect to the target electrical equipment to form a series resonant circuit, and is used to adjust the inductance parameters of the series resonant circuit to achieve resonance; the capacitor voltage divider is used to be connected in parallel to both ends of the target electrical equipment to measure the target voltage. The method comprises: controlling an adjustable reactor and a capacitive voltage divider to switch from a storage state to an operating state on a carrier platform; connecting a target electrical device to an output terminal of the adjustable reactor to form a series resonant circuit; determining a target test item, and adjusting the voltage output frequency of a frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable reactor according to target test parameters preset for the target test item, so that the series resonant circuit reaches a resonant state; adjusting the output voltage of the frequency-modulated and voltage-regulated power supply according to the target test parameters, obtaining test operation parameters of the target electrical device, and generating a target test result according to the test operation parameters.

[0150] This application achieves the integration and modularization of the test equipment by pre-setting and integrating the core test components such as the frequency-modulated and voltage-regulated power supply, excitation transformer, adjustable reactor and capacitor voltage divider on the carrying platform, which greatly reduces the preparation work of handling, positioning and complex connection of each independent equipment unit before the high-voltage test. Then, by controlling the adjustable reactor and the capacitor voltage divider to quickly convert from the storage state to the working state on the carrying platform, the layout process of the test site can be further simplified, the equipment deployment and preparation time can be shortened, and the test system can be quickly ready. Next, by accurately adjusting the voltage output frequency of the frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable reactor according to the target test parameters preset by the target test project, the series resonant circuit can be efficiently brought to a resonant state, avoiding the time delays and uncertainties caused by repeated manual attempts and rough adjustments in the traditional method, and improving the accuracy and speed of parameter matching and system tuning. Subsequently, in the established resonant state, the output voltage of the frequency-modulated and voltage-regulated power supply is quickly adjusted to the required value for the test according to the target test parameters, and the test operation parameters of the target electrical equipment are obtained in real time, so that the test process can be quickly completed and the target test results can be generated. Compared with the prior art, where each component of a high-voltage test device often needs to be deployed one by one, wired separately, and manually tuned, especially when dealing with ultra-high voltage electrical equipment that is bulky and has strict test parameter requirements, the preparation phase is time-consuming, the tuning process is complex, and the overall test cycle is lengthy. The method provided in the embodiment of the present application reduces the pre-preparation time through an integrated design, optimizes the on-site operation process through convenient state transitions, accelerates the resonance tuning process through intelligent adjustment based on preset parameters, and can quickly obtain test results. Therefore, the embodiment of the present application can improve the test efficiency of high-voltage testing of ultra-high voltage electrical equipment.

[0151] Reference Figure 11 , Figure 11 The hardware structure of an electronic device according to another embodiment is shown. The electronic device includes:

[0152] The processor 1101 can be implemented using a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of the present application.

[0153] The memory 1102 can be implemented in the form of a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM). The memory 1102 can store an operating system and other application programs. When the technical solutions provided in the embodiments of this specification are implemented through software or firmware, the relevant program codes are stored in the memory 1102 and are called by the processor 1101 to execute the high-voltage test method for electrical equipment in the embodiments of this application.

[0154] Input / output interface 1103, used to implement information input and output;

[0155] Communication interface 1104, used to implement communication interaction between this device and other devices, which can be achieved through wired means (such as USB, network cable, etc.) or wireless means (such as mobile network, Wi-Fi, Bluetooth, etc.);

[0156] Bus 1105 , which transmits information between various components of the device (e.g., processor 1101 , memory 1102 , input / output interface 1103 , and communication interface 1104 );

[0157] The processor 1101 , the memory 1102 , the input / output interface 1103 and the communication interface 1104 are connected to each other in communication within the device via a bus 1105 .

[0158] The present application also provides a computer program product, which includes a computer program. A processor of a computer device reads and executes the computer program, so that the computer device executes the above-mentioned high-voltage test method for electrical equipment.

[0159] The terms "first," "second," "third," "fourth," and the like (if any) in the specification of the present disclosure and the accompanying drawings are used to distinguish similar objects and are not necessarily used to describe a particular order or precedence. It should be understood that the terms used in this manner are interchangeable where appropriate, so that the embodiments of the present disclosure described herein, for example, can be implemented in orders other than those illustrated or described herein. In addition, the terms "comprises" and "comprising," and any variations thereof, are intended to cover non-exclusive inclusions, e.g., a process, method, system, product, or apparatus comprising a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such process, method, product, or apparatus.

[0160] It should be understood that in the present disclosure, "at least one (item)" refers to one or more, and "plurality" refers to two or more. "And / or" is used to describe the association relationship of associated objects, indicating that three relationships may exist. For example, "A and / or B" can represent: only A exists, only B exists, and A and B exist at the same time, where A and B can be singular or plural. The character " / " generally indicates that the previous and next associated objects are in an "or" relationship. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one item (one) of a, b or c can represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0161] It should be understood that in the description of the embodiments of the present application, multiple (or multiple items) means more than two, greater than, less than, exceed, etc. are understood to exclude the number itself, and above, below, within, etc. are understood to include the number itself.

[0162] In the several embodiments provided in the present disclosure, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are merely schematic. For example, the division of units is only a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0163] Units described as separate components may or may not be physically separate, and components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0164] In addition, the functional units in the various embodiments of the present disclosure may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0165] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present disclosure, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the various embodiments of the present disclosure. The aforementioned storage medium includes various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0166] It should also be understood that the various implementation methods provided in the embodiments of the present application can be combined arbitrarily to achieve different technical effects.

[0167] The above is a specific description of the implementation methods of the present disclosure, but the present disclosure is not limited to the above implementation methods. Those skilled in the art can make various equivalent modifications or substitutions without violating the spirit of the present disclosure. These equivalent modifications or substitutions are all included in the scope defined by the claims of the present disclosure.

Claims

1. A high voltage test method for electrical equipment, characterized in that: The invention is applied to a high-voltage test device, which includes a carrying platform, a frequency-modulated and voltage-regulated power supply, an excitation transformer, an adjustable reactor, and a capacitive voltage divider arranged on the carrying platform; the frequency-modulated and voltage-regulated power supply is used to output alternating current with adjustable frequency and voltage to the excitation transformer; the excitation transformer is used to boost the alternating current and output it to the adjustable reactor; the adjustable reactor is used to connect to the target electrical equipment to form a series resonant circuit, and is used to adjust the inductance parameters of the series resonant circuit to achieve resonance; the capacitive voltage divider is used to be connected in parallel to both ends of the target electrical equipment, and is used to measure the test voltage value of the target electrical equipment; the method includes: Controlling the adjustable reactor and the capacitive voltage divider to switch from a storage state to an operating state on the carrying platform; Connecting the target electrical device to the output end of the adjustable reactor to form the series resonant circuit; Determining a target test item, and adjusting the voltage output frequency of the frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable reactor according to target test parameters preset in the target test item, so that the series resonant circuit reaches a resonant state; The output voltage of the frequency- and voltage-regulated power supply is adjusted according to the target test parameters, and the test operation parameters of the target electrical equipment are obtained, and the target test results are generated according to the test operation parameters.

2. The high voltage test method for electrical equipment according to claim 1, characterized in that: The target test parameters include a target set frequency, a target sweep frequency range, and a target set inductance value. The voltage output frequency of the frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable reactor are adjusted according to the target test parameters preset in the target test item so that the series resonant circuit reaches a resonant state, including: adjusting the inductance value of the adjustable reactor to the target inductance value; Controlling the voltage output frequency to perform a first round of frequency sweep within the target frequency sweep range according to a preset first frequency adjustment step, continuously acquiring the test voltage value, and determining the voltage output frequency corresponding to the maximum value of the test voltage value in the first round of frequency sweep as the preliminary resonant frequency; With the preliminary resonant frequency as the center, within a preset frequency adjustment range, controlling the voltage output frequency to perform a second frequency sweep according to a preset second frequency adjustment step, continuously acquiring the test voltage value, and determining the voltage output frequency corresponding to the maximum value of the test voltage value in the second frequency sweep as the current resonant frequency; If the frequency deviation between the current resonant frequency and the target setting frequency is smaller than a preset deviation threshold, it is determined that the series resonant circuit has reached the resonant state.

3. The high voltage test method for electrical equipment according to claim 2, characterized in that: If the frequency deviation value is not less than the deviation threshold, the method further includes: adjusting the voltage output frequency to the target set frequency; If the current resonant frequency is greater than the upper limit of the preset frequency range corresponding to the target set frequency, controlling the adjustable reactor to gradually increase the inductance value, and continuously obtaining the test voltage value until the test voltage value reaches a maximum value, and then stopping adjusting the inductance value of the adjustable reactor; If the current resonant frequency is less than the lower limit of the preset frequency range corresponding to the target set frequency, controlling the adjustable reactor to gradually reduce its inductance value, and continuously obtaining the test voltage value until the test voltage value reaches a maximum value, and then stopping adjusting the inductance value of the adjustable reactor; With the target set frequency as the center, in the frequency adjustment interval, controlling the voltage output frequency according to the second frequency adjustment step to perform a third round of frequency sweep, continuously acquiring the test voltage value, and determining the voltage output frequency corresponding to the maximum value of the test voltage value in the third round of frequency sweep as the adjusted current resonant frequency; If the frequency deviation between the adjusted current resonant frequency and the target set frequency is smaller than a preset deviation threshold, it is determined that the series resonant circuit has reached the resonant state.

4. The high voltage test method for electrical equipment according to claim 1, characterized in that: The target test item includes an excitation characteristic test, the target experimental parameters include a plurality of first test voltage platform values, the output voltage of the frequency-modulated and voltage-regulated power supply is adjusted according to the target test parameters, and the test operation parameters of the target electrical equipment are obtained, and the target test result of the target test item is generated according to the test operation parameters, including: According to the multiple first test voltage platform values, adjusting the output voltage so that the test voltage value applied to the voltage transformer as the target electrical equipment is gradually increased and stabilized at the current first test voltage platform value; Obtaining a primary winding excitation current of the voltage transformer at the current first test voltage platform value; A target test result of the excitation characteristic test is generated according to each first test voltage platform value and the corresponding primary winding excitation current.

5. The high voltage test method for electrical equipment according to claim 4, characterized in that: When the target test item further includes an AC withstand voltage test, the target experimental parameters include a plurality of second test voltage platform values, adjusting the output voltage of the frequency-modulated and voltage-regulated power supply according to the target test parameters, obtaining the test operation parameters of the target electrical equipment, and generating the target test result of the target test item according to the test operation parameters include: According to the multiple second test voltage platform values, adjusting the output voltage so that the test voltage value applied to the voltage transformer increases step by step and stabilizes at the current second test voltage platform value; Controlling the current second test voltage platform value to maintain a preset duration, and obtaining equipment operation data of the target electrical equipment within the duration; A target test result of the AC withstand voltage test is generated based on each second test voltage platform value and the corresponding equipment operation data.

6. The high voltage test method for electrical equipment according to claim 5, characterized in that: When the target test item further includes a lightning arrester current leakage test, the target test parameters include a resistive current setting value and a continuous operation voltage value, adjusting the output voltage of the frequency-modulated and voltage-regulated power supply according to the target test parameters, obtaining the test operation parameters of the target electrical equipment, and generating the target test result of the target test item according to the test operation parameters include: Continuously increasing the output voltage and continuously obtaining the arrester resistive current of the target electrical device until the arrester resistive current reaches the resistive current set value, and recording the current output voltage value as the target voltage value; Reducing the output voltage to the continuous operation voltage value, and obtaining a target resistive current value and a target full current value; A target experimental result of the arrester current leakage test is generated according to the target voltage value, the target resistive current value, and the target total current value.

7. The high voltage test method for electrical equipment according to claim 1, characterized in that: The adjustable reactor and the capacitive voltage divider are in a horizontal position in the storage state and in a vertical position in the working state, and the controlling the adjustable reactor and the capacitive voltage divider to be converted from the storage state to the working state on the carrying platform includes: The adjustable reactor and the capacitive voltage divider are driven to flip around a horizontal axis by a flip driving mechanism provided on the carrying platform, so as to convert the adjustable reactor and the capacitive voltage divider from the horizontal posture to the vertical posture.

8. A high-voltage experimental device, comprising a carrying platform, a frequency-modulated and voltage-regulated power supply arranged on the carrying platform, an excitation transformer, an adjustable reactor, a capacitive voltage divider, and a controller; The frequency- and voltage-regulated power supply is used to output alternating current with adjustable frequency and voltage to the excitation transformer; The excitation transformer is used to boost the AC power and output it to the adjustable reactor; The adjustable reactor is used to connect to the target electrical equipment to form a series resonant circuit, and is used to adjust the inductance parameters of the series resonant circuit to achieve resonance; The capacitive voltage divider is used to be connected in parallel to both ends of the target electrical equipment to measure the test voltage value of the target electrical equipment; The controller is used to control the adjustable inductor and the capacitive voltage divider to convert from a storage state to an operating state on the carrying platform; it is also used to connect the target electrical equipment to the output end of the adjustable inductor to form the series resonant circuit; it is also used to determine the target test item, and adjust the voltage output frequency of the frequency-modulated and voltage-regulated power supply and the inductance value of the adjustable inductor according to the target test parameters preset in the target test item to make the series resonant circuit reach a resonant state; it is also used to adjust the output voltage of the frequency-modulated and voltage-regulated power supply according to the target test parameters, and obtain the test operation parameters of the target electrical equipment, and generate target test results according to the test operation parameters.

9. The high voltage testing device according to claim 8, characterized in that: The supporting platform is also provided with a flipping drive mechanism; the adjustable reactor and the capacitive voltage divider are arranged in parallel on the flipping drive mechanism and share a voltage grading ring; the controller drives the adjustable reactor and the capacitive voltage divider to flip around the horizontal axis by controlling the flipping drive mechanism, so that they are converted from a horizontal posture to a vertical posture.

10. The high voltage testing device according to claim 8, characterized in that: The adjustable reactor comprises: A plurality of low-voltage adjustable reactance units, wherein the plurality of low-voltage adjustable reactance units are stacked in series to form the adjustable reactor; an insulating cylinder, wherein the plurality of low-voltage adjustable reactance units and the excitation transformer are disposed in the insulating cylinder; a plurality of insulating support plates, the plurality of insulating support plates being concentric with and in contact with the insulating cylinder and being respectively used to support the corresponding low-voltage adjustable reactance unit so as to distribute the weight of the low-voltage adjustable reactance unit to the cylinder wall of the insulating cylinder; The insulating transmission mechanism passes through the multiple insulating support plates and is connected to the multiple low-voltage adjustable reactance units, and is used to synchronously adjust the inductance values ​​of the multiple low-voltage adjustable reactance units.

11. The high voltage testing device according to claim 8, characterized in that: The high-voltage test device also includes: At least one current sensor is arranged on the primary winding of the voltage transformer to measure the primary winding excitation current; or is arranged on the lightning arrester to measure the lightning arrester resistive current; A wireless transmission module is connected to the current sensor and the controller; the controller obtains the primary winding excitation current or the arrester resistive current from the current sensor through the wireless transmission module.

12. An electronic device, characterized in that: include: A memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the high-voltage test method for electrical equipment according to any one of claims 1 to 7 is implemented.

13. A computer-readable storage medium, characterized in that The storage medium stores a program, and the program is executed by a processor to implement the high-voltage test method for electrical equipment according to any one of claims 1 to 7.

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