Diversified fusion analysis-based high-frequency high-speed switch test system

Abstract

The invention relates to the technical field of electronic device test, in particular to a high-frequency high-speed switch test system based on diversified fusion analysis, which comprises a diversified test center, a test execution unit, an acquisition response unit, a progressive test unit, an area positioning unit, a degree division and label acquisition unit and a test feedback unit, according to the method, preliminary analysis is performed from the perspective of test preconditions, interference of test preparation work of the high-frequency high-speed switch on subsequent tests is reduced, and the performance condition of the high-frequency high-speed switch is evaluated in an information progressive and comprehensive quantification mode so as to judge whether the performance of the high-frequency high-speed switch is abnormal or not. According to the method, multi-dimensional collaborative testing of electrical performance, thermal characteristics and environmental adaptability is achieved, so that the test coverage rate is increased, the reliability of performance test results is improved, analysis is carried out from the perspective of feature extraction, fault positions and fault types are judged, and a test feedback label of the whole high-frequency high-speed switch is obtained through fault comprehensive severity analysis.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic device testing, and in particular to a high-frequency and high-speed switch testing system based on diversified fusion analysis. Background Art

[0002] In modern electronic equipment, high-frequency and high-speed switches are widely used in communications, computers, aerospace and other fields. With the continuous development of electronic technology, the performance requirements for high-frequency and high-speed switches are becoming increasingly higher, such as switching speed, reliability, and stability. Therefore, accurate and comprehensive testing of high-frequency and high-speed switches has become particularly important. However, traditional high-frequency, high-speed switch test systems have the following shortcomings: Single test parameters fail to fully reflect switch performance, resulting in low reliability of test results. Furthermore, a lack of in-depth analysis and fusion processing of test data makes it difficult to accurately locate faults in high-frequency, high-speed switches, visually display the fault location, type, and severity, and monitor test preconditions, impacting the overall reliability and stability of the test system. In view of the above technical defects, a solution is now proposed. Summary of the Invention

[0003] The purpose of the present invention is to provide a high-frequency, high-speed switch test system based on diversified fusion analysis to address the technical deficiencies mentioned above. The present invention initially conducts a preliminary analysis from the perspective of test prerequisites to reduce the interference of test preparation work of the high-frequency, high-speed switch on subsequent tests. The performance of the high-frequency, high-speed switch is evaluated through information progression and comprehensive quantification to determine whether the performance of the high-frequency, high-speed switch is abnormal, that is, to achieve multi-dimensional collaborative testing of electrical performance, thermal characteristics, and environmental adaptability to improve test coverage and improve the reliability of performance test results. Analysis is conducted from the perspective of feature extraction to determine the fault location and fault type. Through comprehensive fault severity analysis, a test feedback label for the entire high-frequency, high-speed switch is obtained, that is, the fault location + target fault type + fault severity, providing data support for maintenance decisions.

[0004] The object of the present invention can be achieved by the following technical solutions: a high-frequency and high-speed switch test system based on diversified fusion analysis, comprising a diversified test center, a test execution unit, a response acquisition unit, a progressive test unit, a regional positioning unit, a degree division and label acquisition unit, and a test feedback unit; Test execution unit: performs test precondition discrimination analysis on the collected test preparation data to determine whether the condition feedback results of the test preparation data meet the standards; Acquisition response unit: performs test response evaluation and analysis on the collected test system response data to determine whether the test system's test response capability is normal; Diversified Test Center: Sends the collected electrical, thermal, and environmental parameters to the progressive test unit for progressive performance test analysis, i.e., evaluating the performance of high-frequency and high-speed switches; Regional positioning unit: Extracts and fuses features of electrical parameters, thermal parameters, and environmental parameters to obtain time-frequency domain feature vectors. This feature vectors are then further analyzed to identify the target fault type of the located component and obtain a visual feature image of the fault. When generating the fault visual feature image, the degree division and label acquisition unit is used to perform weighted fusion analysis on the contact resistance deviation and temperature deviation collected at the fault location to obtain a test feedback label.

[0005] Preferably, the test prerequisite discrimination analysis process is as follows: obtaining test preparation data of the high-frequency and high-speed switch, the test preparation data including the test fixture, the signal transmission cable, and the parameter settings; obtaining the conditional feedback result of the test preparation data of the high-frequency and high-speed switch, the conditional feedback result including qualified and unqualified; if the conditional feedback result is qualified, generating a qualified feedback signal; if the conditional feedback result is unqualified, generating an unqualified feedback signal; when generating the unqualified feedback signal.

[0006] Preferably, the specific test response evaluation and analysis process based on the feedback qualified signal is as follows: the test system response data of the high-frequency and high-speed switch is obtained, the test system response data includes the information acquisition time and the information transmission time, and the response evaluation result of the test system response data is obtained. The response evaluation result includes stability and fluctuation. If the response evaluation result is stable, a stable signal is generated. If the response evaluation result is fluctuating, an interference signal is generated.

[0007] Preferably, the progressive performance test analysis process is as follows: Preprocessing the collected electrical parameters, thermal parameters, and environmental parameters, assigning a preset weight factor coefficient to each parameter in the electrical parameters, and setting the sum of the multiplication of each parameter in the electrical parameters and the corresponding preset weight factor coefficient as the electrical reliability index, assigning a preset weight factor coefficient to each parameter in the thermal parameters, and setting the sum of the multiplication of each parameter in the thermal parameters and the corresponding preset weight factor coefficient as the thermal stability index, and assigning a preset weight factor coefficient to each parameter in the environmental parameters, and setting the sum of the multiplication of each parameter in the environmental parameters and the corresponding preset weight factor coefficient as the environmental adaptability index; Pre-set weight factor coefficients are assigned to the electrical reliability index, thermal stability index and environmental adaptability index, and the sum of the electrical reliability index, thermal stability index and environmental adaptability index multiplied by the corresponding pre-set weight factor coefficients is set as the reliability evaluation coefficient, and the reliability evaluation coefficient is discriminated and processed to obtain a fault signal or a normal signal.

[0008] Preferably, the analysis process of the area positioning unit is as follows: The high-frequency, high-speed switch is decomposed into multiple positional components, and the electrical parameters, thermal parameters, and environmental parameters of each positional component are extracted. The feature extraction includes time domain features and frequency domain features. The time-frequency domain feature vector is obtained based on the fusion of time domain features and frequency domain features. Collect historical fault data of high-frequency and high-speed switches, use the historical fault data to train a fault identification model, and obtain the output results after the input time-frequency domain feature vector based on the fault identification model. The output results include probability values ​​of various fault types, and the fault type probability values ​​are discriminated. If the fault type probability value is less than a preset fault type probability value threshold, the corresponding position component is judged to be normal. If the fault type probability value is greater than or equal to the preset fault type probability value threshold, the corresponding position component is judged to be abnormal. At the same time, the fault type corresponding to the maximum value in the fault type probability value is set as the target fault type of the position component.

[0009] Preferably, basic information of the high-frequency and high-speed switch is obtained by laser scanning technology, the basic information representing the dimensions of each component, and a three-dimensional simulation image of the high-frequency and high-speed switch is obtained based on the established spatial coordinate system; Based on the position of the component corresponding to the target fault type, the position of the component corresponding to the target fault type is marked in red on the three-dimensional simulation image; A thermal characteristic image of a high-frequency and high-speed switch is obtained, the thermal characteristic image is preprocessed, and a difference area between the preprocessed thermal characteristic image and the standard thermal characteristic image is obtained based on the preprocessed thermal characteristic image, and the difference area corresponding to the preprocessed thermal characteristic image and the standard thermal characteristic image is set as a fault area.

[0010] Preferably, the fault area is marked in the three-dimensional simulation image, and the fault area is compared and analyzed with the red mark. If the red mark belongs to the fault area, a positioning signal is generated, and a visual feature image of the fault after the fault area is marked is obtained at the same time. If the red mark does not belong to the fault area, a progressive verification signal is generated.

[0011] Preferably, the weighted fusion analysis process is as follows: The position of the component corresponding to the position where the fault type probability value is greater than or equal to the preset fault type probability value threshold is set as the fault position, and the contact resistance deviation and temperature deviation of the fault position are obtained; Assigning preset weight factor coefficients to the contact resistance deviation and the temperature deviation, setting the sum of the contact resistance deviation and the temperature deviation multiplied by the preset weight factor coefficients as the comprehensive severity, and performing discrimination processing on the comprehensive severity to obtain a high severity level, a medium severity level, and a low severity level; High severity, medium severity, and low severity are collectively referred to as fault severity, and the fault location + target fault type + fault severity are set as the test feedback label.

[0012] The beneficial effects of the present invention are as follows: (1) The present invention initially conducts a preliminary analysis from the perspective of test preconditions, and further analyzes from the perspective of test system response to ensure that the test preconditions meet the standards, while reducing the interference of the test preparation work of the high-frequency and high-speed switch on subsequent tests, which helps to provide data support and credibility for subsequent analysis. The performance of the high-frequency and high-speed switch is evaluated by information progression and comprehensive quantification to determine whether the performance of the high-frequency and high-speed switch is abnormal, that is, to achieve multi-dimensional coordinated testing of electrical performance, thermal characteristics, and environmental adaptability, so as to improve test coverage and improve the reliability of performance test results; (2) The present invention analyzes from the perspective of feature extraction to determine the fault location and fault type, and then performs reasonable and targeted fault management on the high-frequency and high-speed switch based on the fault type and fault location. At the same time, it helps to improve the efficiency of fault diagnosis and positioning. Through comprehensive fault severity analysis, the test feedback label of the entire high-frequency and high-speed switch is obtained, namely, the fault location + target fault type + fault severity, providing data support for maintenance decisions. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The present invention will be further described below with reference to the accompanying drawings; Figure 1 It is a flow chart of the system of the present invention; Figure 2 It is a local reference analysis diagram of the present invention. DETAILED DESCRIPTION

[0014] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0015] References to "embodiments" herein mean that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the present invention. The appearance of the phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute a separate or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments; Example 1: See also Figures 1 to 2 As shown, the present invention is a high-frequency and high-speed switch test system based on diversified fusion analysis, including a diversified test center, a test execution unit, an acquisition response unit, a progressive test unit, a regional positioning unit, a degree division and label acquisition unit, and a test feedback unit. The diversified test center is connected to the test execution unit and the acquisition response unit in a two-way communication, the diversified test center is connected to the regional positioning unit in a one-way communication, the diversified test center is connected to the progressive test unit in a two-way communication, the regional positioning unit is connected to the degree division and label acquisition unit in a one-way communication, and the degree division and label acquisition unit is connected to the test feedback unit in a one-way communication. The test execution unit is used to perform test precondition discrimination analysis on the collected test preparation data to determine whether all test preconditions are met to ensure the stable progress of the entire test; The response acquisition unit is used to perform test response evaluation and analysis on the collected test system response data to determine whether the test response capability of the test system is normal, thereby further improving the credibility of the entire test; The specific test prerequisite discriminant analysis process is as follows: Acquire test preparation data of the high-frequency, high-speed switch, including test fixtures, signal transmission cables, parameter settings, etc.; acquire conditional feedback results of the test preparation data of the high-frequency, high-speed switch, including pass and fail. If the conditional feedback result is pass, generate a pass feedback signal; if the conditional feedback result is fail, generate a fail feedback signal; when the fail feedback signal is generated, immediately execute a preset operation corresponding to the fail feedback signal, so as to manage the test preparation data and ensure test prerequisites; Among them, the results of each data in the test preparation data are obtained and input into the test execution unit for evaluation; The specific test response evaluation and analysis process based on the feedback qualified signal is as follows: Acquire the test system response data of the high-frequency, high-speed switch, including information collection time, information transmission time, etc.; acquire the response evaluation results of the test system response data, including stability and fluctuation. If the response evaluation result is stable, a stable signal is generated; if the response evaluation result is fluctuating, an interference signal is generated. The diversified test center responds to the interference signal or stable signal and immediately performs the preset warning operation corresponding to the interference signal or stable signal, thereby rationalizing the management of the test preparation work of the high-frequency, high-speed switch to reduce the interference of the test preparation work of the high-frequency, high-speed switch on subsequent tests; In the embodiment of the present invention, an analysis is performed from the perspective of the test preconditions of the test system to reduce the interference of the test preparation work of the high-frequency and high-speed switch on the subsequent test, which helps to provide data support and credibility for the subsequent analysis.

[0016] Example 2: The diversified test center is used to send the collected electrical parameters, thermal parameters, and environmental parameters to the progressive test unit for progressive performance test analysis. That is, the performance of the high-frequency, high-speed switch is evaluated in a comprehensive and quantitative manner to determine whether the performance of the high-frequency, high-speed switch is abnormal. The specific progressive performance test analysis process is as follows: The electrical parameters during the high-frequency and high-speed switch test are collected by a data acquisition instrument, including contact resistance fluctuation coefficient, dielectric loss, etc. The thermal parameters during the high-frequency and high-speed switch test are collected by an infrared thermal imager, including contact thermal resistance, package temperature, etc. The environmental parameters during the high-frequency and high-speed switch test are collected by temperature and humidity sensors, including ambient temperature and humidity values; Preprocess electrical parameters, thermal parameters, and environmental parameters, including denoising and normalization; Assigning a preset weight factor coefficient to each parameter in the electrical parameters, and setting the sum of the multiplication of each parameter in the electrical parameters and the corresponding preset weight factor coefficient as the electrical reliability index; assigning a preset weight factor coefficient to each parameter in the thermal parameters, and setting the sum of the multiplication of each parameter in the thermal parameters and the corresponding preset weight factor coefficient as the thermal stability index; assigning a preset weight factor coefficient to each parameter in the environmental parameters, and setting the sum of the multiplication of each parameter in the environmental parameters and the corresponding preset weight factor coefficient as the environmental adaptability index; Assigning preset weight factor coefficients to the electrical reliability index, thermal stability index, and environmental adaptability index, setting the sum of the electrical reliability index, thermal stability index, and environmental adaptability index multiplied by the corresponding preset weight factor coefficients as a reliability evaluation coefficient, and performing discrimination processing on the reliability evaluation coefficient. If the reliability evaluation coefficient is less than a preset reliability evaluation coefficient threshold, a fault signal is generated; if the reliability evaluation coefficient is greater than or equal to the preset reliability evaluation coefficient threshold, a normal signal is generated; The test feedback unit is used to respond to fault signals or normal signals and immediately display the preset warning text corresponding to the fault signal or normal signal, so that the test feedback results can be intuitively understood. The present invention breaks through the traditional single electrical parameter test mode and realizes multi-dimensional collaborative testing of electrical performance, thermal characteristics, and environmental adaptability to improve test coverage. It also realizes correlation analysis of multi-source data through deep learning algorithms, which helps to improve the accuracy of test results. In the embodiment of the present invention, the performance of high-frequency and high-speed switches directly affects the reliability and stability of the entire electronic system, so accurate and comprehensive testing of them is crucial; The collected data is pre-processed and analyzed to improve the data quality. At the same time, the performance of the high-frequency and high-speed switch is evaluated in a comprehensive and quantitative manner to determine whether the performance of the high-frequency and high-speed switch is abnormal.

[0017] Example 3: When a fault signal is generated, the regional positioning unit is used to extract and fuse the electrical parameters, thermal parameters, and environmental parameters to obtain a time-frequency domain feature vector. The time-frequency domain feature vector is further analyzed to identify the target fault type of the located component and obtain a visual feature image of the fault. The analysis process of the regional positioning unit is as follows: Decompose the high-frequency and high-speed switch into multiple position components, such as contact group A, contact group B, insulation layer C, etc. Extract features of the electrical parameters, thermal parameters, and environmental parameters of components at each location. Feature extraction includes time domain features and frequency domain features. The time-frequency domain feature vector is obtained based on the fusion of time domain features and frequency domain features. Collect historical fault data of high-frequency and high-speed switches, including fault type (contact degradation, insulation breakdown), fault time, etc. The fault identification model is trained using historical fault data. The output result after the input time-frequency domain feature vector is obtained based on the fault identification model. The output result includes the probability value of each fault type, and the fault type probability value is discriminated. If the fault type probability value is less than the preset fault type probability value threshold, the corresponding position component is judged to be normal. If the fault type probability value is greater than or equal to the preset fault type probability value threshold, the corresponding position component is judged to be abnormal. At the same time, the fault type corresponding to the maximum value among the fault type probability values ​​is set as the target fault type of the position component; The basic information of the high-frequency, high-speed switch is obtained through laser scanning technology. The basic information represents the dimensions of each component, and a three-dimensional simulation image of the high-frequency, high-speed switch is obtained based on the established spatial coordinate system. Based on the position of the component corresponding to the target fault type, the position of the component corresponding to the target fault type is marked in red on the three-dimensional simulation image; A thermal signature image of the high-frequency, high-speed switch is obtained, and the thermal signature image is preprocessed, including cleaning and enhancement. A difference region between the preprocessed thermal signature image and the standard thermal signature image is obtained based on the preprocessed thermal signature image, and the difference region between the preprocessed thermal signature image and the standard thermal signature image is set as the fault region. The fault area is marked on the 3D simulation image, and the fault area is compared with the red mark. If the red mark belongs to the fault area, a positioning signal is generated, and a visual feature image of the fault after the fault area is marked is obtained. If the red mark does not belong to the fault area, a progressive verification signal is generated; The test feedback unit is used to respond to the visual characteristic image of the fault or the progressive verification signal, immediately displaying the visual characteristic image of the fault or further verifying the fault location. The image positioning display helps to intuitively understand the fault location of the high-frequency and high-speed switch. At the same time, the fault type is obtained based on the analysis of the time-frequency domain characteristic vector. Based on the fault type and fault location, reasonable and targeted fault management of the high-frequency and high-speed switch can be carried out, which also helps to improve the efficiency of fault diagnosis and location. In the embodiment of the present invention, feature extraction and diversified fusion analysis are performed on the collected data; feature extraction is used to extract key characteristic parameters that can reflect switch faults from the pre-processed data; diversified fusion analysis fuses multiple different types of characteristic parameters to obtain a more comprehensive and accurate switch fault assessment result; When generating the fault visual feature image, the degree division and label acquisition unit is used to perform weighted fusion analysis on the contact resistance deviation and temperature deviation collected at the fault location to obtain the comprehensive severity and test feedback label; The specific weighted fusion analysis process is as follows: The position of the component corresponding to the position where the fault type probability value is greater than or equal to the preset fault type probability value threshold is set as the fault position, and the contact resistance deviation and temperature deviation of the fault position are obtained; The contact resistance deviation analysis process involves obtaining the measured contact resistance value at the fault location, the normal contact resistance value, and the contact resistance fault threshold, and setting the value obtained by (measured contact resistance value - normal contact resistance value) / (contact resistance fault threshold - normal contact resistance value) × 100% as the contact resistance deviation. Temperature deviation analysis process: Obtain the measured temperature, normal temperature, and fault temperature threshold at the fault location. Set the value obtained by (measured temperature - normal temperature) / (fault temperature threshold - normal temperature) × 100% as the temperature deviation; A preset weight factor coefficient is assigned to the contact resistance deviation and the temperature deviation, and the sum of the contact resistance deviation and the temperature deviation multiplied by the preset weight factor coefficient is set as the comprehensive severity, and the comprehensive severity is judged: If the comprehensive severity is greater than the maximum value in the preset comprehensive severity range, it is determined to be a high severity level; If the comprehensive severity falls within the preset comprehensive severity range, it is determined to be of medium severity; If the comprehensive severity is less than the minimum value in the preset comprehensive severity range, it is determined to be a low severity level; High severity, medium severity, and low severity are collectively referred to as fault severity; The fault location + target fault type + fault severity are set as a test feedback label. The test feedback unit is used to respond to the test feedback label and immediately display the test feedback label so as to intuitively understand the fault location + target fault type + fault severity of the high-frequency and high-speed switch, providing data support for maintenance decisions. Through the above steps, high-frequency and high-speed switch fault location can be achieved with high accuracy, and the fault severity can be quantitatively evaluated to provide data support for maintenance decisions; In summary, the present invention conducts a preliminary analysis from the perspective of test preconditions and further analyzes from the perspective of test system response to ensure that the test preconditions are met. This also reduces the interference of test preparation work for high-frequency and high-speed switches on subsequent tests, helping to provide data support and credibility for subsequent analysis. The performance of high-frequency and high-speed switches is evaluated through information progression and comprehensive quantification to determine whether their performance is abnormal. This enables multi-dimensional coordinated testing of electrical performance, thermal characteristics, and environmental adaptability, thereby improving test coverage and the reliability of performance test results. By analyzing from the perspective of feature extraction, we can determine the fault location and fault type, and then conduct reasonable and targeted fault management of the high-frequency and high-speed switch based on the fault type and fault location. This also helps to improve the efficiency of fault diagnosis and positioning. Through comprehensive fault severity analysis, we can obtain the test feedback label of the entire high-frequency and high-speed switch, namely the fault location + target fault type + fault severity, to provide data support for maintenance decisions.

[0018] The threshold is set for result comparison and analysis to determine whether it is good or bad. The value of the threshold is set based on a combination of large-scale model analysis of sample data and manual experience to enter and store data. It can also be appropriately adjusted based on seasonal or common sense influencing conditions. The size of the coefficient is to quantify each parameter to obtain a specific numerical value, which is convenient for subsequent comparison. The size of the coefficient depends on the amount of sample data and the preliminary setting of the corresponding operating coefficient for each set of sample data by technical personnel in this field; as long as it does not affect the proportional relationship between the parameter and the quantized value.

[0019] The above description is only a preferred specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any technician familiar with the technical field, within the technical scope disclosed by the present invention, who makes equivalent replacements or changes based on the technical solution and inventive concept of the present invention, should be covered by the scope of protection of the present invention.

Claims

1. A high-frequency and high-speed switch test system based on diversified fusion analysis, characterized by: It includes a diversified test center, a test execution unit, a response acquisition unit, a progressive test unit, a regional positioning unit, a degree division and label acquisition unit, and a test feedback unit; Test execution unit: performs test precondition discrimination analysis on the collected test preparation data to determine whether the condition feedback results of the test preparation data meet the standards; Acquisition response unit: performs test response evaluation and analysis on the collected test system response data to determine whether the test system's test response capability is normal; Diversified Test Center: Sends the collected electrical, thermal, and environmental parameters to the progressive test unit for progressive performance test analysis, i.e., evaluating the performance of high-frequency and high-speed switches; Regional positioning unit: Extracts and fuses features of electrical parameters, thermal parameters, and environmental parameters to obtain time-frequency domain feature vectors. This feature vectors are then further analyzed to identify the target fault type of the located component and obtain a visual feature image of the fault. When generating the fault visual feature image, the degree division and label acquisition unit is used to perform weighted fusion analysis on the contact resistance deviation and temperature deviation collected at the fault location to obtain a test feedback label.

2. The high-frequency and high-speed switch test system based on diversified fusion analysis according to claim 1 is characterized in that: The test prerequisite discrimination analysis process is as follows: obtaining test preparation data of the high-frequency and high-speed switch, the test preparation data including the test fixture, signal transmission cable, and parameter settings, obtaining the conditional feedback result of the test preparation data of the high-frequency and high-speed switch, the conditional feedback result including qualified and unqualified, if the conditional feedback result is qualified, generating a feedback qualified signal, if the conditional feedback result is unqualified, generating a feedback unqualified signal, and generating a feedback unqualified signal.

3. The high-frequency and high-speed switch test system based on diversified fusion analysis according to claim 2 is characterized in that: The specific test response evaluation and analysis process based on the feedback qualified signal is as follows: the test system response data of the high-frequency and high-speed switch is obtained. The test system response data includes information acquisition time and information transmission time. The response evaluation result of the test system response data is obtained. The response evaluation result includes stability and fluctuation. If the response evaluation result is stable, a stable signal is generated. If the response evaluation result is fluctuating, an interference signal is generated.

4. The high-frequency and high-speed switch test system based on diversified fusion analysis according to claim 1 is characterized in that: The progressive performance test analysis process is as follows: Preprocessing the collected electrical parameters, thermal parameters, and environmental parameters, assigning a preset weight factor coefficient to each parameter in the electrical parameters, and setting the sum of the multiplication of each parameter in the electrical parameters and the corresponding preset weight factor coefficient as the electrical reliability index, assigning a preset weight factor coefficient to each parameter in the thermal parameters, and setting the sum of the multiplication of each parameter in the thermal parameters and the corresponding preset weight factor coefficient as the thermal stability index, and assigning a preset weight factor coefficient to each parameter in the environmental parameters, and setting the sum of the multiplication of each parameter in the environmental parameters and the corresponding preset weight factor coefficient as the environmental adaptability index; Pre-set weight factor coefficients are assigned to the electrical reliability index, thermal stability index and environmental adaptability index, and the sum of the electrical reliability index, thermal stability index and environmental adaptability index multiplied by the corresponding pre-set weight factor coefficients is set as the reliability evaluation coefficient, and the reliability evaluation coefficient is discriminated and processed to obtain a fault signal or a normal signal.

5. The high-frequency and high-speed switch test system based on diversified fusion analysis according to claim 1 is characterized in that: The analysis process of the regional positioning unit is as follows: The high-frequency, high-speed switch is decomposed into multiple positional components, and the electrical parameters, thermal parameters, and environmental parameters of each positional component are extracted. The feature extraction includes time domain features and frequency domain features. The time-frequency domain feature vector is obtained based on the fusion of time domain features and frequency domain features. Collect historical fault data of high-frequency and high-speed switches, use the historical fault data to train a fault identification model, and obtain the output results after the input time-frequency domain feature vector based on the fault identification model. The output results include probability values ​​of various fault types, and the fault type probability values ​​are discriminated. If the fault type probability value is less than a preset fault type probability value threshold, the corresponding position component is judged to be normal. If the fault type probability value is greater than or equal to the preset fault type probability value threshold, the corresponding position component is judged to be abnormal. At the same time, the fault type corresponding to the maximum value in the fault type probability value is set as the target fault type of the position component.

6. The high-frequency and high-speed switch test system based on diversified fusion analysis according to claim 5 is characterized in that: The basic information of the high-frequency, high-speed switch is obtained through laser scanning technology. The basic information represents the dimensions of each component, and a three-dimensional simulation image of the high-frequency, high-speed switch is obtained based on the established spatial coordinate system. Based on the position of the component corresponding to the target fault type, the position of the component corresponding to the target fault type is marked in red on the three-dimensional simulation image; A thermal characteristic image of a high-frequency and high-speed switch is obtained, the thermal characteristic image is preprocessed, and a difference area between the preprocessed thermal characteristic image and the standard thermal characteristic image is obtained based on the preprocessed thermal characteristic image, and the difference area corresponding to the preprocessed thermal characteristic image and the standard thermal characteristic image is set as a fault area.

7. The high-frequency and high-speed switch test system based on diversified fusion analysis according to claim 6 is characterized in that: The fault area is marked on the 3D simulation image and compared with the red mark. If the red mark belongs to the fault area, a positioning signal is generated and a visual feature image of the fault is obtained. If the red mark does not belong to the fault area, a progressive verification signal is generated.

8. The high-frequency and high-speed switch testing system based on diversified fusion analysis according to claim 1 is characterized in that: The weighted fusion analysis process is as follows: The position of the component corresponding to the position where the fault type probability value is greater than or equal to the preset fault type probability value threshold is set as the fault position, and the contact resistance deviation and temperature deviation of the fault position are obtained; Assigning preset weight factor coefficients to the contact resistance deviation and the temperature deviation, setting the sum of the contact resistance deviation and the temperature deviation multiplied by the preset weight factor coefficients as the comprehensive severity, and performing discrimination processing on the comprehensive severity to obtain a high severity level, a medium severity level, and a low severity level; High severity, medium severity, and low severity are collectively referred to as fault severity, and the fault location + target fault type + fault severity are set as the test feedback label.

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