Aging seat for aging cycle test and use method thereof

Abstract

The invention discloses an aging seat for an aging cycle test, which comprises an upper gland and a base, a placement groove is formed in the upper gland, the base is positioned at the bottom of the upper gland, buffer rods are mounted at four corners of the base, the tops of the buffer rods are connected into the upper gland, a clamping pin group is arranged on the base, and a clamping pin is arranged on the clamping pin group. The top of the clamping needle set abuts against the interior of the upper gland, and side limiting clamps are arranged on the two sides of the upper gland. Through cooperative use of the upper gland, the base and the clamping needle group, a transmission part corresponding to a to-be-tested electronic device is put in, the to-be-tested electronic device can be conveniently and quickly mounted and taken out, through cooperative use of the base, a bottom connecting rod and an inserting rod, and through cooperative use of a side guide clamp, an upper guide clamping rod, a trapezoidal seat and a lower guide clamping rod, the to-be-tested electronic device can be conveniently and quickly mounted and taken out. And the unique accuracy of the upper gland on the base is facilitated, and the problem of low test efficiency of the existing aging test equipment caused by inconvenient installation of the to-be-tested device on the aging seat is solved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of aging test, and in particular to an aging seat for aging cycle test and a use method thereof. BACKGROUND

[0002] Power cycle aging test is an important test method for evaluating the performance changes of electronic components under different power and environmental conditions. Its core is to simulate the use state of electronic components in the actual working environment by periodically changing the power and environmental conditions (such as temperature, humidity, vibration, etc.), so as to test its reliability and service life.

[0003] In modern industry, power cycle aging test equipment has been widely used, especially in the fields of electronics, semiconductors, automobiles, aerospace, etc. These fields have very high requirements for the performance and reliability of electronic components, and power cycle aging test equipment can effectively simulate various conditions in the actual working environment, providing reliable data support for performance evaluation and life prediction of components.

[0004] However, the existing aging test equipment is inconvenient to install the device to be tested on the aging seat, resulting in low test efficiency of the existing aging equipment. To solve the above problems, a new type of aging seat for aging cycle test and a use method thereof are proposed. SUMMARY

[0005] The purpose of the present application is to overcome the shortcomings of the existing aging test equipment, which is inconvenient to install the device to be tested on the aging seat, resulting in low test efficiency of the existing aging equipment, and to propose an aging seat for aging cycle test and a use method thereof.

[0006] In order to achieve the above purpose, the present application adopts the following technical scheme: An aging seat for aging cycle test, comprising an upper cover and a base, the upper cover is provided with a placing groove, the base is located at the bottom of the upper cover, the base is provided with a buffer rod at each corner, the buffer rod is connected to the top of the upper cover, the base is provided with a needle clamp set, the top of the needle clamp set is in contact with the upper cover, the upper cover is provided with a side limiting clamp on both sides, the base is provided with a trapezoidal seat corresponding to the side limiting clamp, the upper cover is pressed on the base, when installing the electronic device to be tested, the needle clamp set is opened in the placing groove, and the electronic device to be tested is electrically connected, at the same time, the side limiting clamp and the trapezoidal seat are clamped with each other, the needle clamp set is provided with a transmission needle, the transmission needle is extended out of the bottom of the base when the bottom is pressed, and the transmission needle is used for transmitting the test data of the electronic device.

[0007] Preferably, the transmission card needle is provided with an upper pressing rod and a bottom fixed rod, the upper pressing rod and the bottom fixed rod are connected through a large bending connecting rod, the upper pressing rod is connected with an upper clamping rod, the bottom fixed rod is connected with a lower clamping rod through a small bending connecting rod, the upper clamping rod and the lower clamping rod form a test clamping opening, one side of the bottom fixed rod is provided with a bottom connecting rod, the upper pressing rod is installed in an upper pressing cover, when the electronic device to be tested is installed, the upper pressing rod is pressed by the upper pressing cover and is transmitted to the large bending connecting rod, the upper clamping rod and the lower clamping rod are driven to move up and down respectively, the test clamping opening is opened, the transmission part of the electronic device to be tested is put in, then the upper pressing cover is supported and reset through the buffer rod, the large bending connecting rod drives the upper clamping rod and the lower clamping rod to reset, the test clamping opening is tightened, the transmission part of the electronic device to be tested is clamped, and the test data of the electronic device is transmitted through the bottom connecting rod.

[0008] Preferably, the bottom seat is provided with a lower limiting groove corresponding to the card needle group, the transmission card needle is installed in the lower limiting groove, and the top of the lower limiting groove is connected with a fixed plate.

[0009] Preferably, the bottom seat is provided with a connecting hole, the connecting hole is provided with a buffer spring, and the buffer rod is installed in the connecting hole through the buffer spring.

[0010] Preferably, the bottom of the trapezoidal seat is provided with an insertion rod, the bottom seat is further provided with a side guard plate, and the side guard plate is located on both sides of the lower limiting groove.

[0011] Preferably, the side guide clamp is further provided with an upper guide clamp rod on both sides, the trapezoidal seat is provided with a lower guide clamp rod corresponding to the upper guide clamp rod on both sides, when the upper pressing cover is pressed down on the bottom seat, the upper guide clamp rod and the lower guide clamp rod cooperate with each other to guide the movement of the upper pressing cover on the bottom seat.

[0012] A method for using an aging seat for aging cycle test: In the first step, the aging seat is installed on the matching test aging plate through the bottom insertion rod, and the bottom connecting rod of the transmission card needle is electrically connected with the aging plate for signal transmission. In the second step, the upper pressing cover is pressed down, the side guide clamp and the upper guide clamp rod cooperate with the trapezoidal seat and the lower guide clamp rod respectively for guiding, so that the card needle group in the bottom seat is pressed by the upper pressing cover and is transmitted to the large bending connecting rod, the upper clamping rod and the lower clamping rod are driven to move up and down respectively, the test clamping opening is opened, and the transmission part of the electronic device to be tested is put in. In the third step, the upper pressing cover is pressed down again, the buffer rod at the bottom of the upper pressing cover supports and pops up, the card needle group tightens the test clamping opening, clamps the transmission part of the electronic device to be tested, and the installation of the electronic device to be tested in the aging seat is completed. Fourth step, the aging board of the installation completed aging seat is put into the test equipment, the condition is set through the test equipment, and the aging test of the device to be tested is carried out; Fifth step, the aging test parameter of the device to be tested is transmitted to the aging board through the bottom connecting rod, and data processing is carried out in the test equipment through the aging board; Sixth step, after the test is completed, the aging seat is taken out from the matching test aging board through the bottom insertion rod; Seventh step: press down the upper pressing cover, the side guide clamp and the upper guide clamp rod cooperate with the trapezoidal seat and the lower guide clamp rod again, guide, the clamping needle group in the base is pressed by the upper pressing cover, the test clamp is opened, and the electronic device to be tested is taken out from the placing groove; Eighth step: press down the upper pressing cover again, support and pop up through the buffer rod at the bottom of the upper pressing cover, complete the aging test of the electronic device to be tested, and collect and process uniformly.

[0013] 1. By cooperation of the upper pressing cover, the base and the clamping needle group, after pressing down the upper pressing cover, the side limiting clamp and the upper limiting clamp rod are clamped on the trapezoidal seat and the lower limiting clamp rod respectively, so that the clamping needle group in the base is pressed by the upper pressing cover and transmitted to the large bending connecting rod, which drives the upper clamp rod and the lower clamp rod to move up and down respectively, opens the test clamp, and puts the transmission part corresponding to the electronic device to be tested, so as to facilitate quick installation and taking out of the device to be tested; 2. By cooperation of the side guide clamp and the upper guide clamp rod with the trapezoidal seat and the lower guide clamp rod, the uniqueness and accuracy of the upper pressing cover on the base are facilitated, the transmission clamping needle in the clamping needle group is prevented from being not accurately connected with the electronic device to be tested, and the aging test is affected; 3. By cooperation of the base, the bottom connecting rod and the insertion rod, the aging seat can be quickly fixed on the matching aging board through the insertion rod, transmission data can be transmitted to the aging board through the bottom connecting rod, and then transmitted to the aging test equipment for data analysis and processing, so as to facilitate installation of the aging seat in the equipment and improve the efficiency of the aging test; In summary, the aging seat can be quickly fixed on the matching aging board through the insertion rod, transmission data can be transmitted to the aging board through the bottom connecting rod, and then transmitted to the aging test equipment for data analysis and processing, so as to facilitate installation of the aging seat in the equipment and improve the efficiency of the aging test; by cooperation of the side guide clamp and the upper guide clamp rod with the trapezoidal seat and the lower guide clamp rod, the uniqueness and accuracy of the upper pressing cover on the base are facilitated, the transmission clamping needle in the clamping needle group is prevented from being not accurately connected with the electronic device to be tested, and the aging test is affected; the process is simple, the existing aging test equipment is avoided due to inconvenient installation of the device to be tested on the aging seat, and the problem of low test efficiency of the existing aging equipment is solved. BRIEF DESCRIPTION OF DRAWINGS

[0014] Figure 1 The overall schematic diagram of an aging seat for aging cycle test and its use method proposed by the present application; Figure 2 The assembly schematic diagram of an aging seat for aging cycle test and its use method proposed by the present application; Figure 3 The schematic diagram of an upper cover and its components of an aging seat for aging cycle test and its use method proposed by the present application; Figure 4 The schematic diagram of a card needle group of an aging seat for aging cycle test and its use method proposed by the present application; Figure 5 The schematic diagram of a transmission card needle of an aging seat for aging cycle test and its use method proposed by the present application; Figure 6 The schematic diagram of a base and its components of an aging seat for aging cycle test and its use method proposed by the present application; Figure 7 The top view of an aging seat for aging cycle test and its use method proposed by the present application; Figure 8 The A-A sectional view of an aging seat for aging cycle test and its use method proposed by the present application; Figure 9 The side view of an aging seat for aging cycle test and its use method proposed by the present application; Figure 10 The B-B sectional view of an aging seat for aging cycle test and its use method proposed by the present application.

[0015] In the figure: 10, upper cover; 11, placing groove; 12, side guide clamp; 13, upper guide clamp rod; 20, base; 21, trapezoidal seat; 22, fixed plate; 23, insertion rod; 24, side guard plate; 25, side plate; 26, lower guide clamp rod; 30, buffer rod; 31, buffer spring; 32, connecting hole; 40, lower limiting groove; 41, upper limiting groove; 50, card needle group; 51, transmission card needle; 511, upper pressing rod; 512, large bending connecting rod; 513, bottom connecting rod; 514, upper clamp rod; 515, lower clamp rod; 516, small bending connecting rod; 517, bottom fixed rod. DETAILED DESCRIPTION

[0016] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific embodiments of the present application are described in detail below with reference to the description.

[0017] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0018] Secondly, the term "one embodiment" or "embodiment" herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in various places throughout this specification does not necessarily refer to the same embodiment, nor does it refer to a separate or selective embodiment that is mutually exclusive of other embodiments.

[0019] Unless otherwise specified, the raw materials used in the examples were purchased commercially.

[0020] like Figures 1-10 As shown, the present application discloses an aging seat for aging cycle testing, including an upper cover 10 and a base 20. A placement slot 11 is provided in the upper cover 10, and the base 20 is located at the bottom of the upper cover 10. Buffer rods 30 are installed at the four corners of the base 20, and the top of the buffer rod 30 is connected to the upper cover 10. A card pin group 50 is provided on the base 20, and the top of the card pin group 50 is in contact with the upper cover 10. Side limit clamps are provided on both sides of the upper cover 10, and trapezoidal seats 21 are provided on the corresponding side limit clamps on both sides of the base 20. The upper cover 10 is pressed down on the base 20. When the electronic device to be tested is installed, the card pin group 50 is opened in the placement slot 11 to electrically connect the electronic device to be tested. At the same time, the side limit clamps and the trapezoidal seat 21 are clamped with each other. A transmission card pin 51 is provided in the card pin group 50. When the bottom of the transmission card pin 51 is under pressure, it extends out of the bottom of the base 20 to transmit the test data of the electronic device.

[0021] In the above embodiment, an upper pressing rod 511 and a bottom fixing rod 517 are provided on the transmission card pin 51. The upper pressing rod 511 and the bottom fixing rod 517 are connected by a large bent connecting rod 512. An upper clamping rod 514 is connected to the upper pressing rod 511. The bottom fixing rod 517 is connected to the lower clamping rod 515 by a small bent connecting rod 516. A test clamp is formed between the upper clamping rod 514 and the lower clamping rod 515. A bottom connecting rod 513 is provided on one side of the bottom fixing rod 517. The upper pressing rod 511 is installed in the upper pressure cover 10. The electronic device to be tested is installed. When the device is tested, the upper pressure rod 511 is subjected to pressure from the upper pressure cover 10 and the pressure is transmitted to the large bend connecting rod 512, which drives the upper clamping rod 514 and the lower clamping rod 515 to move up and down respectively, opens the test clamp, and puts the transmission part corresponding to the electronic device to be tested into it. After that, the upper pressure cover 10 is supported and reset by the buffer rod 30, and the large bend connecting rod 512 drives the upper clamping rod 514 and the lower clamping rod 515 to reset, tightens the test clamp, clamps the transmission part of the electronic device to be tested, and transmits the test data of the electronic device through the bottom connecting rod 513.

[0022] Among them, a lower limit groove 40 is provided on the base 20 corresponding to the card pin group 50, and the transmission card pin 51 is correspondingly installed in the lower limit groove 40. The top of the lower limit groove 40 is connected with a fixed plate 22, and the upper clamping rod 514 and the lower clamping rod 515 at the top of the transmission card pin 51 are located in the fixed plate 22.

[0023] like Figure 6 As shown, in a preferred embodiment, a lower limit groove 40 is provided on the base 20 corresponding to the card pin group 50, and the transmission card pin 51 is correspondingly installed in the lower limit groove 40. The top of the lower limit groove 40 is connected with a fixed plate 22, and the upper clamping rod 514 and the lower clamping rod 515 at the top of the transmission card pin 51 are located in the fixed plate 22.

[0024] In the above embodiment, a connection hole 32 is provided on the base 20 , a buffer spring is provided in the connection hole 32 , and the buffer rod 30 is installed in the connection hole 32 through the buffer spring.

[0025] like Figures 1-3 As shown, in a preferred embodiment, an inserting rod 23 is provided at the bottom of the trapezoidal seat 21 , and a side guard plate 24 is further provided on the base 20 , and the side guard plates 24 are located on both sides of the lower limiting groove 40 .

[0026] In the above embodiment, upper guide clamping rods 13 are further provided on both sides of the side guide clamp 12, and lower guide clamping rods 26 are provided on both sides of the trapezoidal seat 21 corresponding to the upper guide clamping rods 13. When the upper pressure cover 10 is pressed down on the base 20, the upper guide clamping rod 13 and the lower guide clamping rod 26 cooperate with each other to guide the upper pressure cover 10 to move on the base 20.

[0027] A method for using an aging seat for aging cycle testing: First, the aging seat is installed on the matching test aging board through the bottom insertion rod 23, and the bottom connecting rod 513 of the transmission card needle 51 is electrically connected with the aging board for signal transmission. Second step: press down the upper cover 10, and the side guide clamp 12 and the upper guide clamp rod 13 are respectively matched with the trapezoidal seat 21 and the lower guide clamp rod 26 for guiding, so that the card needle group 50 in the base 20 is pressed by the upper cover 10 and is transmitted to the large bending connecting rod 512, which drives the upper clamp rod 514 and the lower clamp rod 515 to move up and down respectively, and opens the test clamp, and the transmission part of the electronic device to be tested is put in. Third step: press down the upper cover 10 again, support and pop up through the buffer rod 30 at the bottom of the upper cover 10, so that the card needle group 50 tightens the test clamp, clamps the transmission part of the electronic device to be tested, and completes the installation of the electronic device to be tested in the aging seat. Fourth step: put the aging board with the installed aging seat into the test equipment, and set the conditions through the test equipment to test the aging of the device to be tested. Fifth step: the aging test parameters of the device to be tested are transmitted to the aging board through the bottom connecting rod 513, and are transmitted to the test equipment through the aging board for data processing. Sixth step: after the test is completed, the aging seat is taken out from the matching test aging board through the bottom insertion rod 23. Seventh step: press down the upper cover 10, and the side guide clamp 12 and the upper guide clamp rod 13 are matched with the trapezoidal seat 21 and the lower guide clamp rod 26 again for guiding, so that the card needle group 50 in the base 20 is pressed by the upper cover 10, the test clamp is opened, and the electronic device to be tested is taken out from the placing groove 11. Eighth step: press down the upper cover 10 again, support and pop up through the buffer rod 30 at the bottom of the upper cover 10, complete the aging test of the electronic device to be tested, and collect and process uniformly.

[0028] In summary, the electronic device to be tested is put in through the cooperation of the upper cover, the base and the card needle group, which facilitates the rapid installation and removal of the device to be tested. Through the cooperation of the base, the bottom connecting rod and the insertion rod, the aging seat can be quickly fixed on the matching aging board through the insertion rod, the transmission data can be transmitted to the aging board through the bottom connecting rod, and then to the aging test equipment for data analysis and processing, which facilitates the installation of the aging seat in the equipment, thereby improving the efficiency of the aging test. Through the cooperation of the side guide clamp and the upper guide clamp rod with the trapezoidal seat and the lower guide clamp rod, the accuracy of the upper cover on the base is ensured, the transmission card needle in the card needle group is prevented from being not accurately connected with the electronic device to be tested, and the aging test is affected. The process is simple, the existing aging test equipment is avoided due to the inconvenience of installing the device to be tested on the aging seat, and the problem of low test efficiency of the existing aging equipment is solved.

[0029] It should be noted that the above has shown and described the basic principles, main features and advantages of the present application. Those skilled in the art should understand that the present application is not limited to the above embodiments, and the above embodiments and the description in the specification are only to illustrate the principles of the present application. Without departing from the spirit and scope of the present application, various changes and improvements can be made to the present application, and these changes and improvements all fall within the scope of the claimed present application. The scope of protection of the present application is defined by the appended claims and their equivalents.

Claims

1. An aging seat for aging cycle testing, comprising an upper pressure cover (10) and a base (20), characterized in that: The upper cover (10) is provided with a placement groove (11), the base (20) is located at the bottom of the upper cover (10), and the four corners of the base (20) are equipped with buffer rods (30), the top of the buffer rod (30) is connected to the upper cover (10), and the base (20) is provided with a card pin group (50), the top of the card pin group (50) is in contact with the upper cover (10), and the upper cover (10) is provided with side limit clips on both sides, and the base (20) has side limit clips on both sides. The limit clamp is provided with a trapezoidal seat (21), and the upper pressure cover (10) is pressed down on the base (20). When the electronic device to be tested is installed, the card pin group (50) is opened in the placement groove (11) to electrically connect the electronic device to be tested. At the same time, the side limit clamp and the trapezoidal seat (21) are clamped to each other. A transmission card pin (51) is provided in the card pin group (50). When the bottom of the transmission card pin (51) is pressed, it extends out of the bottom of the base (20) to transmit the test data of the electronic device.

2. The aging seat for aging cycle testing according to claim 1, characterized in that: The transmission card needle (51) is provided with an upper pressure rod (511) and a bottom fixing rod (517), the upper pressure rod (511) and the bottom fixing rod (517) are connected via a large bending connecting rod (512), the upper pressure rod (511) is connected with an upper clamping rod (514), the bottom fixing rod (517) is connected with a lower clamping rod (515) via a small bending connecting rod (516), a test clamp is formed between the upper clamping rod (514) and the lower clamping rod (515), a bottom connecting rod (513) is provided on one side of the bottom fixing rod (517), the upper pressure rod (511) is installed in the upper pressure cover (10), and the lower clamping rod (515) is installed. When the electronic device to be tested is installed, the upper pressure rod (511) is subjected to pressure from the upper pressure cover (10) and the pressure is transmitted to the large-bend connecting rod (512), which drives the upper clamping rod (514) and the lower clamping rod (515) to move up and down respectively, opens the test clamp, and puts the transmission part corresponding to the electronic device to be tested into the test device. After that, the upper pressure cover (10) is supported and reset by the buffer rod (30), and the large-bend connecting rod (512) drives the upper clamping rod (514) and the lower clamping rod (515) to reset, tightens the test clamp, clamps the transmission part of the electronic device to be tested, and transmits the test data of the electronic device through the bottom connecting rod (513).

3. The aging seat for aging cycle testing according to claim 2, characterized in that: The base (20) is provided with a lower limit groove (40) corresponding to the card pin group (50), and the transmission card pin (51) is correspondingly installed in the lower limit groove (40). The top of the lower limit groove (40) is connected to a fixed plate (22), and the upper clamping rod (514) and the lower clamping rod (515) at the top of the transmission card pin (51) are located in the fixed plate (22).

4. The aging seat for aging cycle testing according to claim 1, characterized in that: A connecting hole (32) is provided on the base (20), a buffer spring is provided in the connecting hole (32), and the buffer rod (30) is installed in the connecting hole (32) via the buffer spring.

5. The aging seat for aging cycle testing according to claim 1, characterized in that: The bottom of the trapezoidal seat (21) is provided with an insertion rod (23), and the base (20) is further provided with a side guard plate (24), and the side guard plate (24) is located on both sides of the lower limit groove (40).

6. The aging seat for aging cycle testing according to claim 1, characterized in that: Upper guide clamping rods (13) are further provided on both sides of the side guide clamps (12), and lower guide clamping rods (26) are provided on both sides of the trapezoidal seat (21) corresponding to the upper guide clamping rods (13). When the upper pressure cover (10) is pressed down on the base (20), the upper guide clamping rod (13) and the lower guide clamping rod (26) cooperate with each other to guide the upper pressure cover (10) to move on the base (20).

7. A method for using an aging seat for aging cycle testing. Its characteristics are: The first step is to install the aging seat on the matching test aging board through the bottom plug-in rod (23), and electrically connect the bottom connecting rod (513) of the transmission card pin (51) to the aging board to perform signal transmission; Step 2: Press down the upper cover (10), and the side guide clamp (12) and the upper guide clamp rod (13) cooperate with the trapezoidal seat (21) and the lower guide clamp rod (26) respectively to guide, so that the pin group (50) in the base (20) is subjected to the pressure of the upper cover (10) and is transmitted to the large bend connecting rod (512), which drives the upper clamp rod (514) and the lower clamp rod (515) to move up and down respectively, opens the test clamp, and puts the transmission part corresponding to the electronic device to be tested into it; In the third step, the upper cover (10) is pressed down again, and the buffer rod (30) at the bottom of the upper cover (10) is supported and rebounded, so that the card needle group (50) tightens the test clamp to clamp the transmission part of the electronic device to be tested, and the installation of the electronic device to be tested in the aging seat is completed; The fourth step is to place the aging board with the aging seat installed into the test equipment, set the conditions through the test equipment, and perform aging test on the device under test; In the fifth step, the aging test parameters of the device to be tested are transmitted to the aging board through the bottom connecting rod (513), and then transmitted to the test equipment through the aging board for data processing; Step 6: After the test is completed, the aging seat is removed from the matching test aging board through the bottom insertion rod (23); Step 7: Press down the upper cover (10), and the side guide clamp (12) and the upper guide clamp rod (13) cooperate with the trapezoidal seat (21) and the lower guide clamp rod (26) again to guide, so that the pin assembly (50) in the base (20) is subjected to the pressure of the upper cover (10), the test clamp is opened, and the electronic device to be tested is taken out of the placement slot (11); Step 8: Press the upper cover (10) down again, and support the upper cover (10) to bounce up through the buffer rod (30) at the bottom, completing the aging test of the electronic device to be tested, and collecting and processing them uniformly.

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