Automatic test system and method for vector network analyzer

Abstract

The invention relates to the technical field of radio frequency microwaves, and discloses an automatic test system and method for a vector network analyzer, and the system comprises a data interaction module which is used for achieving the data interaction with the vector network analyzer; the test setting module is used for setting test items: according to the electronic product to be tested, items needing to be tested are added to a test process, test item information is set, and the test item information comprises test item names, test parameters and test index value ranges input by testers; and the data processing module is used for executing the test items: processing the test data returned by the vector network analyzer according to different test items to obtain a test result, and checking whether the test items meet the requirements of the to-be-tested electronic product or not according to a set test index value range. The problem that an automatic test system can only test electronic products of a single model is solved.

Description

Technical Field

[0001] This invention relates to the field of radio frequency microwave technology, specifically an automated testing system and method for vector network analyzers. Background Technology

[0002] Existing automated testing host computer systems for vector network analyzers typically only test a single type of filter when testing electronic products such as filters. The execution order of each test item, as well as the test parameters and test index ranges, are pre-set and cannot be changed. When the filter product under test is a new product, testers need to communicate with software developers to discuss the product's test procedures, test parameters, and test index ranges, and wait for the software developers to write a new automated testing system. The entire process is quite time-consuming. Summary of the Invention

[0003] The purpose of this invention is to solve the problem that automatic test systems can only test a single model of electronic product, improve the testing efficiency of testers, and reduce the number of times software developers need to repeatedly write automatic test systems.

[0004] The technical solution of the present invention to solve the above-mentioned technical problems is as follows: An automated testing system for a vector network analyzer includes: The data interaction module is used to enable data interaction with the vector network analyzer. The test settings module is used to set test items: based on the electronic product under test, add the items to be tested to the test process and set the test item information, including the test item name, test parameters and test index value range entered by the tester; The data processing module is used to execute test items: according to different test items, it processes the test data returned by the vector network analyzer to obtain test results, and verifies whether the test items meet the requirements of the electronic product under test according to the set test index value range.

[0005] As a preferred technical solution, the test setup module is used to: set up a window interface for each type of test project. The window interface allows testers to generate test projects and add them to the test process by filling in the test parameters and test index value ranges.

[0006] As a preferred technical solution, the window interface allows testers to modify and delete test items.

[0007] As a preferred technical solution, the data processing module is used to: write functions for each type of test project, and pass the test parameters and test index value ranges filled in by the testers in the window interface as parameters to the functions; during the test, call the functions of the test project according to the test process.

[0008] As a preferred technical solution, the test setup module is used to: store test item information as a class attribute in the custom class TestItem in the program code; wherein the type of the test item is stored in the TestItem class in the form of an enumeration data type; the data processing module is used to: pass the TestItem class as a function parameter to the function during the execution of the test.

[0009] As a preferred technical solution, it also includes a log information module, which is used to: display the running information of the automatic test system during operation, use a TextBox control to display the running information of the automatic test system during operation, and use the DateTime class to record the time when the running information occurs.

[0010] Preferably, the log information module is interconnected with the data interaction module, the test setting module, and the data processing module.

[0011] As a preferred technical solution, the aforementioned automatic test system for vector network analyzers is used to perform tests on the electronic products under test by the vector network analyzer.

[0012] As a preferred technical solution, the steps include: S1, Interconnection: The data interaction module enables interconnection with the vector network analyzer; S2, the test setting module determines whether the electronic product under test has been tested: if yes, the test setting module loads the test process of the electronic product model and then proceeds to step S3; if no, the test setting module sets the test items and then proceeds to step S3. S3, Test: The data interaction module reads the test item information from the vector network analyzer, and the data processing module executes the test item.

[0013] As a preferred technical solution, in step S3, the data interaction module performs the following steps: S3A1 reads the attribute of the scattering parameter curve number saved in the test settings module, and reads the point coordinate data of the string data type of the corresponding scattering parameter curve in the vector network analyzer; S3A2 continuously reads the point coordinate data returned by the vector network analyzer until all point coordinate data has been read, then the loop ends; S3A3 converts the read point coordinate data from string type to floating-point type and stores it in an array.

[0014] As a preferred technical solution, in step S3, the data processing module performs the following steps: S3B1 inputs the point coordinate data into the test item for processing, and obtains the test results of the electronic product under test in the test item. S3B2 verifies whether the test items meet the requirements of the electronic product under test according to the set test index value range.

[0015] Compared with the prior art, the present invention has the following advantages: (1) The test setting module of this invention sets up a corresponding window interface for each type of test item. Testers generate test items and add them to the test process in sequence by filling in the relevant test parameters and test index value ranges of the test items. In the data processing module, corresponding functions are written for each type of test item. The test parameters and test index value ranges filled in by the testers in the window interface are passed into the functions as actual parameters. During the test, the system calls the functions of the corresponding test items in the order of the test process. Through the above two core modules, the problem that the automatic test system can only test a single model of filter and other electronic products can be solved, so that testers can customize test items and test processes. (2) This invention can quickly complete the addition, modification and deletion of test items, complete the construction of the test process according to the test plan, and then start the testing of filter products; for electronic products such as filters that are being tested for the first time, testers do not need to communicate and discuss with developers and can complete the construction of the test process on their own; developers also do not need to spend extra time modifying the automatic test system to adapt it to new electronic products such as filters; in summary, this automatic test system not only saves the time for testers to communicate with developers and wait for system development, but also avoids the time spent by developers to repeatedly modify the automatic test system. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the main interface of the automatic testing system of the present invention; Figure 2 This is a schematic diagram of the test process interface of the present invention; Figure 3 This is a schematic diagram of the test project interface of the present invention; Figure 4 This is a schematic diagram of the main interface when the test of this invention is completed; Figure 5 This is a schematic diagram of the operation flow of the automatic testing system of the present invention; Figure 6This is a schematic diagram illustrating how the automatic testing system of the present invention exports test results to an Excel file. Detailed Implementation

[0017] The present invention will be further described in detail below with reference to the embodiments and accompanying drawings, but the embodiments of the present invention are not limited thereto.

[0018] The principles and features of the present invention are described below. The examples given are only for explaining the present invention and are not intended to limit the scope of the present invention.

[0019] It is worth noting that: 1. The following embodiments use filter products as examples, but the present invention is not limited to testing filters. The technical solutions of the present invention are also applicable to many other electronic products (especially microwave electronic products) that can be tested by vector network analyzers; 2. The program code for functions, data categories, etc. in the following embodiments uses C# language as an example, but it is also applicable to other programming languages ​​that do not depart from the inventive concept of the present invention; 3. In the following embodiments, English terms that are not given a definition are common knowledge in the field, so their full names and Chinese scope are not explained step by step.

[0020] Example 1 like Figures 1 to 6 As shown, an automated testing system for a vector network analyzer includes: The data interaction module is used to enable data interaction with the vector network analyzer. The test settings module is used to set test items: based on the electronic product under test, add the items to be tested to the test process and set the test item information, including the test item name, test parameters and test index value range entered by the tester; The data processing module is used to execute test items: according to different test items, it processes the test data returned by the vector network analyzer to obtain test results, and verifies whether the test items meet the requirements of the electronic product under test according to the set test index value range (preferably, the value range is set by setting thresholds at both ends).

[0021] Preferably, the electrical connection method (information interaction method) of each module is as follows: the data interaction module is interconnected with the vector network analyzer, and the data interaction module, test setting module, data processing module, and vector network analyzer are interconnected in pairs.

[0022] The beneficial effects are as follows: the automatic testing system of this invention can quickly add, modify, and delete test items, construct the test process according to the test plan, and then begin testing electronic products such as filters; for filter products being tested for the first time, testers do not need to communicate and discuss with developers and can complete the construction of the test process themselves; developers also do not need to spend extra time modifying the automatic testing system to adapt it to new filters and other electronic products; in summary, this automatic testing system not only saves testers and developers time from communication and waiting for system development, but also avoids the time spent by developers repeatedly modifying the automatic testing system.

[0023] Based on the above technical solution, the present invention can be further improved as follows.

[0024] As a preferred technical solution, the test setup module is used to: set up a window interface for each type of test project. The window interface allows testers to generate test projects and add them to the test process by filling in the test parameters and test index value ranges.

[0025] The advantages of adopting the above-mentioned further solution are: testers can use the window interface to fill in the test parameters and test index value ranges of the test items, generate test items, and add the test items to the test process. The operation is simple and time-saving.

[0026] As a preferred technical solution, the window interface allows testers to modify and delete test items.

[0027] The advantage of adopting the above-mentioned further solutions is that it facilitates the rapid and efficient construction of the test process for filter products undergoing initial testing.

[0028] As a preferred technical solution, the data processing module is used to: write functions for each type of test project, and pass the test parameters and test index value ranges filled in by the testers in the window interface as parameters to the functions; during the test, call the functions of the test project according to the test process.

[0029] The advantages of adopting the above-mentioned further solution are: by calling functions for testing, a lot of manual operation is saved, the execution efficiency is high, and the degree of automation is high.

[0030] As a preferred technical solution, the test setup module is used to: store test item information as a class attribute in the custom class TestItem in the program code; wherein the type of the test item is stored in the TestItem class in the form of an enumeration data type; the data processing module is used to: pass the TestItem class as a function parameter to the function during the execution of the test.

[0031] The advantages of adopting the above-mentioned further solution are: storing test project information as a class attribute in the class has good encapsulation, which can enhance security and simplify programming, while saving unnecessary duplicate code, making the code more concise and easier to maintain.

[0032] As a preferred technical solution, it also includes a log information module, which is used to: display the running information of the automatic test system during operation, use a TextBox control to display the running information of the automatic test system during operation, and use the DateTime class to record the time when the running information occurs.

[0033] Preferably, the log information module is interconnected with the data interaction module, the test setting module, and the data processing module.

[0034] The beneficial effect of adopting the above-mentioned further solution is that it facilitates the display and recording of the operation information of the automatic testing system during operation.

[0035] As a preferred technical solution, the aforementioned automatic test system for vector network analyzers is used to perform tests on the electronic products under test by the vector network analyzer.

[0036] Its beneficial effects are as follows: Using the automatic test system of this invention to perform tests on electronic products under test using a vector network analyzer allows for the rapid addition, modification, and deletion of test items, the construction of the test flow according to the test plan, and the commencement of testing on electronic products such as filters. For filter products being tested for the first time, testers do not need to communicate with developers and can independently construct the test flow. Developers also do not need to spend additional time modifying the automatic test system to adapt it to new filters and other electronic products. In summary, this automatic test system not only saves testers and developers time in communicating and waiting for system development, but also avoids the time spent by developers repeatedly modifying the automatic test system.

[0037] As a preferred technical solution, the steps include: S1, Interconnection: The data interaction module enables interconnection with the vector network analyzer; S2, the test setting module determines whether the electronic product under test has been tested: if yes, the test setting module loads the test process of the electronic product model and then proceeds to step S3; if no, the test setting module sets the test items and then proceeds to step S3. S3, Test: The data interaction module reads the test item information from the vector network analyzer, and the data processing module executes the test item.

[0038] The beneficial effects of adopting the above-mentioned further solutions are: through the above interconnection, determining whether the electronic product under test has been tested, the testing process, and the specific execution of the test.

[0039] As a preferred technical solution, in step S3, the data interaction module performs the following steps: S3A1 reads the attribute of the scattering parameter curve number saved in the test settings module, and reads the point coordinate data of the string data type of the corresponding scattering parameter curve in the vector network analyzer; S3A2 continuously reads the point coordinate data returned by the vector network analyzer until all point coordinate data has been read, then the loop ends; S3A3 converts the read point coordinate data from string type to floating-point type and stores it in an array.

[0040] The advantage of adopting the above-mentioned further solution is that it facilitates the reading of all point coordinate data.

[0041] As a preferred technical solution, in step S3, the data processing module performs the following steps: S3B1 inputs the point coordinate data into the test item for processing, and obtains the test results of the electronic product under test in the test item. S3B2 verifies whether the test items meet the requirements of the electronic product under test according to the set test index value range.

[0042] The advantages of adopting the above-mentioned further solution are: it facilitates obtaining test results and enables the verification of whether the test items meet the requirements of the electronic product under test based on the range of test index values.

[0043] Example 2 like Figures 1 to 6 As shown, as a further optimization of Embodiment 1, this embodiment also includes the following more refined technical features based on Embodiment 1: An automated testing system for a vector network analyzer includes: The data interaction module is used to realize data interaction between the computer (i.e., the host computer) and the vector network analyzer, including the connection between the computer and the vector network analyzer, the computer sending SCPI commands to the vector network analyzer, and the data returned by the vector network analyzer to the computer. The test settings module is used to set the test items. Depending on the different filter products, the items that need to be tested are added to the test process in sequence, and the numerical range of the test indicators is set. The data processing module is used to execute the test items in the test list sequentially; according to different test items, it processes the data returned by the vector network analyzer accordingly, obtains test results, and verifies whether the corresponding test items meet the expected requirements of the filter product according to the set test index value range. The log information module is used to display various information during the operation of the automated testing system.

[0044] As a preferred technical solution, the connection and data exchange between the computer and the vector network analyzer are achieved by using the instrument library provided by NI-VISA.

[0045] As a preferred technical solution, the entire testing process can be set up by adding different test items and setting the test parameters and test index value ranges for the test items.

[0046] As a preferred technical solution, based on the type of test project and test parameters, the S-parameters S11, S12, S21, and S22 are switched. The coordinates of several points constituting the curve are read through the data interaction module, and different processing methods are applied to the read coordinates to obtain the test results. Regarding the S-parameters (scattering parameters), this is common knowledge in the field and is briefly described as follows: A two-port network has four scattering parameters: S11, S21, S12, and S22. When both terminals are matched, S11 and S22 are the reflection coefficients of ports 1 and 2, respectively; S21 is the transmission coefficient from port 1 to port 2; and S12 is the transmission coefficient in the opposite direction.

[0047] As a preferred technical solution, the test results of the filter under test are displayed in a test table, and the test results of the filter under test are compared with the range of test index values. Test results that do not meet the requirements of the test index value range are displayed in red in the test table.

[0048] As a preferred technical solution, the TextBox control is used to display various information during the operation of the automated testing system, and the DateTime class is used to record the time (date and time, etc.) when various information occurs.

[0049] As a preferred technical solution, a network cable is used to connect the computer and the vector network analyzer; a communication session between the computer and the vector network analyzer is opened using the LANPortOperator class in the PortOperator library provided by NI-VISA; the IP addresses of the computer and the vector network analyzer must be set to the same network segment; the WriteLine and ReadLine functions are used to send SCPI commands to the vector network analyzer and read the data returned by the vector network analyzer.

[0050] As a preferred technical solution, different window interfaces are designed for each test item. Users can complete the settings of the test item by filling in the test-related parameters and test index value range in the window interface.

[0051] As a preferred technical solution, the functions corresponding to each test item are called sequentially according to the execution order of the test items in the test process to complete the entire test process, and the test results are displayed in the test table; by creating an XSSFWorkbook object, the data in the test table is saved as an xlsx table file.

[0052] This invention provides an automated testing host computer system for vector network analyzers. The system includes a data interaction module, a test setting module, a data processing module, and a log information module. The test setting module provides a corresponding window interface for each type of test item. Testers generate test items and add them to the test process sequentially by filling in relevant test parameters and test index value ranges. In the data processing module, corresponding functions are written for each type of test item, and the test parameters and test index value ranges filled in by the testers in the window interface are passed to the functions as actual parameters. During the test, the system calls the functions of the corresponding test items sequentially according to the test process. Through these two core modules, the problem that automated testing systems can only test a single model of filter product can be solved, allowing testers to customize test items and test processes.

[0053] Example 3 like Figures 1 to 6 As shown, this embodiment provides a more detailed implementation method based on Embodiments 1 and 2.

[0054] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to specific embodiments and accompanying drawings. It should be noted that, unless otherwise specified, the experimental methods described in the following embodiments are conventional methods, and the reagents and materials described are commercially available unless otherwise specified.

[0055] A vector network analyzer is an electromagnetic wave energy testing device. It can measure the amplitude of various parameters of single-port or two-port networks, as well as the phase. The vector network analyzer can display the measurement data using a Smith chart, which is more convenient for engineering applications and debugging.

[0056] Vector network analyzers typically have a LAN port, which can be used to communicate with a host computer via a network cable. Vector network analyzers generally support the SCPI protocol, so the host computer can control the vector network analyzer via SCPI commands.

[0057] Based on the above knowledge, such as Figure 1 As shown, this invention provides an automatic testing system for a vector network analyzer. This automatic testing system is applied in a host computer. The following example uses a vector network analyzer to test filter products for insertion loss, bandwidth, in-band ripple, in-band standing wave ratio, and phase consistency to illustrate the usage of the automatic testing system for a vector network analyzer.

[0058] The method of using the automated testing system includes: Connect both ends of the network cable to the LAN ports of the computer and the vector network analyzer, respectively. Set the IP addresses of the computer and the vector network analyzer to be on the same network segment. Enter the IP address of the vector network analyzer and click the "Connect Instrument" button. After detecting a valid IP address, the system calls the `open` function of the NI-VISA dynamic library to open a communication session between the computer and the vector network analyzer. The method for detecting a valid IP address is regular expression matching of the string. The matching regular expression is: ^((25[0-5]|2[0-4]\d|

[01] ?\d\d?)\.){3}(25[0-5]|2[0-4]\d|

[01] ?\d\d?)$ If the IP address string entered by the user successfully matches the above regular expression, it indicates that the entered IP address is in the correct format and is a valid IP address.

[0059] If the communication session between the computer and the vector network analyzer is successfully opened, the background color of the "Connect to Instrument" button changes from light green to light red, and the button text changes from "Connect to Instrument" to "Disconnect from Instrument," making it easier for testers to determine whether the computer and the vector network analyzer have been successfully connected.

[0060] According to the test plan for the filter product under test, begin setting up the test procedure; if the filter product under test is being tested for the first time, a test procedure needs to be set up; click the "Set Test Procedure" button, enter the product model in the test procedure setting interface, and add the test items in sequence. Figure 2 The image shows the test process interface; by clicking the "Add Test Project" menu item in the window menu bar, a drop-down menu containing various test project types will pop up, allowing you to select the test project you want to add.

[0061] In the test project settings interface, according to the test plan, fill in the name of the test project, the test parameters, and the range of test indicator values. Figure 3 The image shown is the test project interface. After filling in the information, click the "Complete Filling" button to add the test project to the test process. Repeat the process of adding test projects to complete the setup of the entire test process.

[0062] In the code, a custom class TestItem is used to represent the test item. The test item name, test parameters, and test indicator value range entered by the tester are stored as properties in the TestItem class. The type of the test item is stored in the TestItem class as an enumeration data type. During the execution of the test, the TestItem class is passed as a function parameter.

[0063] In the test process setup interface, if there are errors in the test project settings, or if the test project and test process need to be modified, you can click the "Modify Test Project" and "Delete Test Project" buttons to complete the modification of the test project and test process.

[0064] For product models being tested for the first time, follow the above steps to add test items and test procedures. After completing the test procedure settings, you can save the relevant data of the test procedure as a txt text file by clicking the save procedure button. The text file name should be the product model of the filter under test.

[0065] For product models that have already been tested, click the drop-down menu item for the product model. After selecting the model of the product to be tested, the system will automatically load the corresponding test process for that model. Testers do not need to reset the test process, which greatly improves the testing experience and efficiency of testers.

[0066] After the test process is set up, the entire test process will be displayed on the right side of the system's main interface for easy viewing by testers; in addition, the test items included in the test process will also be generated in the test table in sequence.

[0067] After completing the test process setup and successfully establishing a communication session between the computer and the vector network analyzer, click the "Start Test" button. The system will first call the data interaction module, read the attribute storing the curve number in the TestItem class, call the WriteLine function to send SCPI commands to the vector network analyzer, and read the point coordinates of the corresponding curve. The curve numbers are usually S11, S12, S21, and S22. Using a while loop, the system will continuously call the ReadLine function to read the string data returned by the vector network analyzer until the read string data ends with \n, at which point the loop will end. The read string data will be converted into floating-point data and stored in an array.

[0068] After obtaining the coordinates of the points that make up the curve, the data processing module is called to pass these coordinates to the function corresponding to the test item. After relevant calculations and processing, the test results of the filter product under test are obtained. Then, the test results are checked according to the test index value range set by the tester. Test results that meet the expectations are displayed in black font in the test table, and test results that do not meet the expectations are displayed in red font in the test table, so that the tester can easily identify which test items have unqualified test results at a glance.

[0069] Repeat the operations of reading curve data and processing curve data in the order of the test process until all test items in the test process have been completed. Figure 4 The image shown is the main interface after the test is completed. The test results for each test item will be displayed in the test table in sequence.

[0070] After the test is completed, the tester checks whether the test results meet the expected requirements. If they do, the data in the test table can be saved as an .xlsx spreadsheet file after selecting a save path. Figure 6 The image shown is the exported Excel spreadsheet. For filter products that do not meet the expected requirements, after the testers debug the product, the test will be repeated, and the new test results will automatically overwrite the previous test results.

[0071] When the system is shut down, it will automatically save the relevant information of this test as a txt text file, including the IP address, product model, and the corresponding test process for the product model. When the system is restarted next time, it will automatically load the txt text file containing the relevant information of the last test, initialize the test information, and further improve the user experience and testing efficiency of testers.

[0072] Thus, the testing of a certain model of filter product was completed using the automated testing system; Figure 5 The diagram shows the general workflow of the automated testing system. By following this workflow, testers can complete the testing of the filter product under test.

[0073] The automated testing system of this invention can quickly add, modify, and delete test items, construct the test process according to the test plan, and then begin testing the filter products. For filter products being tested for the first time, testers do not need to communicate with developers and can complete the test process construction themselves. Developers also do not need to spend extra time modifying the automated testing system to adapt it to new filter products. In summary, this automated testing system not only saves testers and developers time from communication and waiting for system development, but also avoids the time spent by developers repeatedly modifying the automated testing system.

[0074] As described above, the present invention can be implemented well.

[0075] Although embodiments of the present invention have been disclosed above, they are not limited to the applications listed in the specification and embodiments. They can be applied to various fields suitable for the present invention, and those skilled in the art can easily make other modifications. Therefore, without departing from the general concept defined by the claims and their equivalents, the present invention is not limited to the specific details and illustrations shown and described herein. Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

[0076] All features disclosed in all embodiments of this specification, or steps in all methods or processes implied in the disclosure, may be combined and / or extended or replaced in any way, except for mutually exclusive features and / or steps.

[0077] The above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention in any way. Based on the technical essence of the present invention, any simple modifications, equivalent substitutions, and improvements made to the above embodiments within the spirit and principles of the present invention shall still fall within the protection scope of the present invention.

Claims

1. An automated testing system for a vector network analyzer, characterized in that, include: The data interaction module is used to enable data interaction with the vector network analyzer. The test settings module is used to set test items: based on the electronic product under test, add the items to be tested to the test process and set the test item information, including the test item name, test parameters and test index value range entered by the tester; The data processing module is used to execute test items: according to different test items, it processes the test data returned by the vector network analyzer to obtain test results, and verifies whether the test items meet the requirements of the electronic product under test according to the set test index value range.

2. The automatic testing system for a vector network analyzer according to claim 1, characterized in that, The test settings module is used to set up a separate window interface for each type of test project. The window interface allows testers to generate test projects and add them to the test process by filling in the test parameters and test index value ranges.

3. The automatic testing system for a vector network analyzer according to claim 2, characterized in that, The window interface allows testers to modify and delete test items.

4. The automatic testing system for a vector network analyzer according to claim 2, characterized in that, The data processing module is used to: write functions for each type of test project, and pass the test parameters and test index value ranges filled in by the testers in the window interface as parameters to the functions; during the test, call the functions of the test project according to the test process.

5. An automatic testing system for a vector network analyzer according to claim 4, characterized in that, The test setup module is used to: store test item information as a class attribute in the custom class TestItem in the program code; the type of the test item is stored in the TestItem class as an enumerated data type; the data processing module is used to: pass the TestItem class as a function parameter to the function during the execution of the test.

6. An automatic testing system for a vector network analyzer according to any one of claims 1 to 5, characterized in that, It also includes a log information module, which is used to: display the running information of the automated test system during operation, use a TextBox control to display the running information of the automated test system during operation, and use the DateTime class to record the time when the running information occurs.

7. An automatic testing method for a vector network analyzer, characterized in that, The automated test system for a vector network analyzer, as described in any one of claims 1 to 6, is used to perform tests on the electronic product under test using the vector network analyzer.

8. An automatic testing method for a vector network analyzer according to claim 7, characterized in that, Includes the following steps: S1, Interconnection: The data interaction module enables interconnection with the vector network analyzer; S2, the test setting module determines whether the electronic product under test has been tested: if yes, the test setting module loads the test process of the electronic product model and then proceeds to step S3; if no, the test setting module sets the test items and then proceeds to step S3. S3, Test: The data interaction module reads the test item information from the vector network analyzer, and the data processing module executes the test item.

9. An automatic testing method for a vector network analyzer according to claim 8, characterized in that, In step S3, the data interaction module performs the following steps: S3A1 reads the attribute of the scattering parameter curve number saved in the test settings module, and reads the point coordinate data of the string data type of the corresponding scattering parameter curve in the vector network analyzer; S3A2 continuously reads the point coordinate data returned by the vector network analyzer until all point coordinate data has been read, then the loop ends; S3A3 converts the read point coordinate data from string type to floating-point type and stores it in an array.

10. An automatic testing method for a vector network analyzer according to claim 9, characterized in that, In step S3, the data processing module performs the following steps: S3B1 inputs the point coordinate data into the test item for processing, and obtains the test results of the electronic product under test in the test item. S3B2 verifies whether the test items meet the requirements of the electronic product under test according to the set test index value range.

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