Evaluation method and device for breaking result of high-voltage SF6 circuit breaker, electronic equipment and storage medium

Abstract

The invention discloses an evaluation method and device for a breaking result of a high-voltage SF6 circuit breaker, electronic equipment and a storage medium, and belongs to the field of power system protection, and the method comprises the steps: obtaining a reference arc extinguishing peak voltage and a reference contact opening distance of the high-voltage SF6 circuit breaker; obtaining a to-be-measured arc extinguishing peak voltage and a to-be-measured contact opening distance of the high-voltage SF6 circuit breaker; calculating the ratio of the to-be-measured arc extinguishing peak voltage to the preset power of the to-be-measured contact opening distance, and generating a to-be-evaluated index value; calculating an on-off evaluation critical value according to the reference arc extinguishing peak voltage, the reference contact opening distance and a preset critical value coefficient; and judging whether the to-be-evaluated index value is greater than the cut-off evaluation critical value, if so, judging that the predicted cut-off result is successful, and if not, judging that the predicted cut-off result is failed. Therefore, by implementing the invention, the problem that electric breakdown failure and successful breaking cannot be distinguished due to similar voltage characteristics in the prior art can be solved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of power system protection, and in particular to a high-voltage SF6 circuit breaker breaking result evaluation method and device, electronic equipment and storage medium. BACKGROUND

[0002] The high-voltage SF6 circuit breaker is a core protection device in the power system, which undertakes the key task of quickly and reliably cutting off the huge fault current when a short-circuit fault occurs, and is the last line of defense to ensure the safe and stable operation of the entire power grid. Therefore, whether the breaking result can be accurately evaluated and the real performance under various complex conditions can be predicted at each stage of the circuit breaker design, factory delivery and operation is of great significance to prevent major power accidents and improve power supply reliability.

[0003] However, the existing evaluation methods for the breaking result of the high-voltage SF6 circuit breaker are relatively single, mainly focusing on monitoring the arc extinction peak voltage during the breaking process. The inherent defect of this method is that only the voltage dimension cannot fully represent the complex physical process of arc extinction. Especially when electrical breakdown occurs, the change rule of the arc extinction peak voltage is highly similar to the successful breaking condition, which often leads to ineffective differentiation by traditional methods, resulting in misjudgment. SUMMARY

[0004] The embodiments of the present application provide a high-voltage SF6 circuit breaker breaking result evaluation method, device, electronic equipment and storage medium, which can solve the problem that electrical breakdown failure and successful breaking cannot be distinguished due to similar voltage characteristics in the prior art.

[0005] An embodiment of the present application provides a high-voltage SF6 circuit breaker breaking result evaluation method, comprising:

[0006] obtaining a reference arc extinction peak voltage and a reference contact opening distance of a high-voltage SF6 circuit breaker; wherein the reference arc extinction peak voltage and the reference contact opening distance are determined by screening the test results with the shortest arc time in a plurality of successful breaking tests under a reference time constant;

[0007] obtaining a to-be-measured arc extinction peak voltage and a to-be-measured contact opening distance of the high-voltage SF6 circuit breaker; wherein the to-be-measured arc extinction peak voltage and the to-be-measured contact opening distance are determined according to a breaking test under a to-be-predicted time constant;

[0008] calculating the ratio of the to-be-measured arc extinction peak voltage to the to-be-measured contact opening distance to the preset power, to generate a to-be-evaluated index value;

[0009] calculating a breaking evaluation critical value according to the reference arc extinction peak voltage, the reference contact opening distance and a preset critical value coefficient;

[0010] determining whether the to-be-evaluated index value is greater than the breaking evaluation threshold value, if yes, determining that the predicted breaking result is success, and if no, determining that the predicted breaking result is failure.

[0011] Further, the determination of the threshold value coefficient comprises:

[0012] when the to-be-predicted time constant is greater than the reference time constant, calculating a product of a preset multiple and the to-be-predicted time constant to generate a first calculation result;

[0013] calculating a quotient of the first calculation result and the reference time constant, and taking a solution result as the threshold value coefficient;

[0014] when the to-be-predicted time constant is equal to the reference time constant, the threshold value coefficient is 1;

[0015] when the to-be-predicted time constant is less than the reference time constant, calculating a product of the multiple and the reference time constant to generate a second calculation result;

[0016] calculating a quotient of the second calculation result and the to-be-predicted time constant, and taking a solution result as the threshold value coefficient.

[0017] Further, a to-be-evaluated index value is generated by calculating a ratio of the to-be-measured arc extinction peak voltage and a preset power of the to-be-measured contact opening distance according to the following formula:

[0018]

[0019] In the formula, I eva is the to-be-evaluated index value; U meas is the to-be-measured arc extinction peak voltage; L meas is the to-be-measured contact opening distance; and a is the preset power.

[0020] Further, a breaking evaluation threshold value is calculated according to the reference arc extinction peak voltage, the reference contact opening distance and a preset threshold value coefficient according to the following formula:

[0021]

[0022] In the formula, K is the breaking evaluation threshold value; k is the threshold value coefficient; U a is the reference arc extinction peak voltage; L a is the reference contact opening distance.

[0023] Further, the preset power is in a range of 0.4 to 0.7, and the preset multiple is 0.75.

[0024] On the basis of the above-mentioned method embodiment, the application correspondingly provides a device embodiment.

[0025] An embodiment of the application provides an evaluation device for breaking results of a high-voltage SF6 circuit breaker, comprising: a high-voltage SF6 circuit breaker reference test data acquisition module, a high-voltage SF6 circuit breaker to-be-tested test data acquisition module, a to-be-evaluated index value generation module, a breaking evaluation critical value calculation module and a breaking result evaluation module.

[0026] The high-voltage SF6 circuit breaker reference test data acquisition module is used for acquiring reference arc extinguishing peak voltage and reference contact opening distance of the high-voltage SF6 circuit breaker; wherein the reference arc extinguishing peak voltage and the reference contact opening distance are determined by screening the test result with the shortest arc time in a plurality of groups of successful breaking tests performed under a reference time constant.

[0027] The high-voltage SF6 circuit breaker to-be-tested test data acquisition module is used for acquiring to-be-measured arc extinguishing peak voltage and to-be-measured contact opening distance of the high-voltage SF6 circuit breaker; wherein the to-be-measured arc extinguishing peak voltage and the to-be-measured contact opening distance are determined according to a breaking test under a to-be-predicted time constant.

[0028] The to-be-evaluated index value generation module is used for calculating a ratio of the to-be-measured arc extinguishing peak voltage and the to-be-measured contact opening distance raised to a preset power, and generating a to-be-evaluated index value.

[0029] The breaking evaluation critical value calculation module is used for calculating a breaking evaluation critical value according to the reference arc extinguishing peak voltage, the reference contact opening distance and a preset critical value coefficient.

[0030] The breaking result evaluation module is used for judging whether the to-be-evaluated index value is greater than the breaking evaluation critical value; if yes, it is determined that a predicted breaking result is successful, and if no, it is determined that the predicted breaking result is failed.

[0031] Further, the evaluation device for breaking results of the high-voltage SF6 circuit breaker further comprises a critical value coefficient determination module.

[0032] The critical value coefficient determination module is used for calculating a product of a preset multiple and the to-be-predicted time constant when the to-be-predicted time constant is greater than the reference time constant, and generating a first calculation result.

[0033] The critical value coefficient determination module is used for calculating a product of a preset multiple and the to-be-predicted time constant when the to-be-predicted time constant is greater than the reference time constant, and generating a first calculation result.

[0034] When the to-be-predicted time constant is equal to the reference time constant, the critical value coefficient is 1.

[0035] When the to-be-predicted time constant is less than the reference time constant, a product of the multiple and the reference time constant is calculated to generate a second calculation result;

[0036] A quotient of the second calculation result and the to-be-predicted time constant is calculated, and a solution result is taken as a critical value coefficient.

[0037] Further, the to-be-evaluated index value generation module calculates a ratio of the to-be-measured arc extinction peak voltage to a preset power of the to-be-measured contact opening distance to generate a to-be-evaluated index value according to the following formula:

[0038]

[0039] In the formula, I eva is the to-be-evaluated index value; U meas is the to-be-measured arc extinction peak voltage; L meas is the to-be-measured contact opening distance; and a is the preset power.

[0040] On the basis of the above-mentioned method embodiment, the present application correspondingly provides an electronic device embodiment.

[0041] An embodiment of the present application provides an electronic device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, and the processor implements the evaluation method of the breaking result of the high-voltage SF6 circuit breaker in any one of the above-mentioned method embodiments when executing the computer program.

[0042] On the basis of the above-mentioned method embodiment, the present application correspondingly provides a storage medium embodiment.

[0043] An embodiment of the present application provides a storage medium, which has a computer program stored thereon, and when the computer program runs, the storage medium controls a device where the storage medium is located to execute the evaluation method of the breaking result of the high-voltage SF6 circuit breaker in any one of the above-mentioned method embodiments.

[0044] Compared with the prior art, the present application has the following beneficial effects:

[0045] The embodiment of the present application provides an evaluation method, device, electronic device and storage medium for a breaking result of a high-voltage SF6 circuit breaker. The method relates to the breaking performance prediction of a high-voltage SF6 circuit breaker. A plurality of groups of successful breaking tests are performed under a reference time constant, the test data with the shortest arc time is screened, and a reference arc extinction peak voltage and a reference contact opening distance are extracted. Then, the arc extinction peak voltage and the contact opening distance under a to-be-predicted time constant are obtained, a ratio of powers thereof is calculated as a to-be-evaluated index value. A breaking evaluation critical value is calculated according to the reference parameter and the critical value coefficient. The to-be-evaluated index value is compared with the critical value, if greater, the breaking is predicted to be successful, otherwise, the breaking is predicted to be failed.

[0046] The application completely abandons the evaluation method of relying on only a single voltage parameter in the background technology by simultaneously acquiring and comprehensively analyzing the two key physical quantities of arc extinguishing peak voltage and contact opening distance. On this basis, by constructing a ratio index of voltage and contact opening distance power, the method can quantify the breaking process from a new dimension, thereby effectively solving the technical problem that the traditional method cannot distinguish between electrical breakdown failure and successful breaking due to similar voltage characteristics. BRIEF DESCRIPTION OF DRAWINGS

[0047] Figure 1 is a flowchart of a high-voltage SF6 circuit breaker breaking result evaluation method provided by an embodiment of the application.

[0048] Figure 2 is a structural diagram of a high-voltage SF6 circuit breaker breaking result evaluation device provided by an embodiment of the application. DETAILED DESCRIPTION

[0049] The technical solutions in the embodiments of the application will be clearly and completely described below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, rather than all the embodiments of the application. Based on the embodiments in the application, all other embodiments obtained by a person of ordinary skill in the art without creative labor fall within the protection scope of the application.

[0050] As shown in Figure 1 To solve the problem that the electrical breakdown failure and the successful breaking cannot be distinguished due to similar voltage characteristics in the prior art, an embodiment of the application provides a high-voltage SF6 circuit breaker breaking result evaluation method, which at least includes the following steps:

[0051] Step S1, acquiring a reference arc extinguishing peak voltage and a reference contact opening distance of a high-voltage SF6 circuit breaker; wherein the reference arc extinguishing peak voltage and the reference contact opening distance are determined by screening the test result with the shortest arc time in a plurality of successful breaking tests performed at a reference time constant;

[0052] Specifically, the evaluation method first needs to establish a stable and reliable performance benchmark for the target high-voltage SF6 circuit breaker. The first step of the process is to obtain the benchmark arc extinguishing peak voltage and the benchmark contact opening distance of the high-voltage SF6 circuit breaker. The benchmark time constant here is not an arbitrary value, but a predefined parameter for standardized testing. In the type test performed on the circuit breaker at the factory, the constant value is determined according to the relevant industry standards, aiming to simulate a representative and generally more severe short-circuit fault condition, to ensure that the performance benchmark established under this condition has universality and comparability. To ensure the effectiveness of the collected data, multiple sets of opening tests need to be performed on the circuit breaker under the uniform benchmark time constant, and only the successful opening test results are retained for subsequent analysis.

[0053] After obtaining multiple sets of successful opening test data, the method does not simply average the data, but selects and identifies the specific test with the shortest arc time from the successful results. The reason for choosing the successful opening with the shortest arc time as the benchmark is that this point often represents the ability of the circuit breaker to successfully open under critical conditions (such as the boundary with the highest risk of thermal breakdown), and can more critically and more representatively reflect its inherent performance.

[0054] Finally, the measured arc extinguishing peak voltage and contact opening distance in the successful opening test with the shortest arc time are officially determined as the benchmark arc extinguishing peak voltage and the benchmark contact opening distance for subsequent calculation. Through this step, an objective, rigorous and clearly physically meaningful performance anchor point can be provided for the entire evaluation model, thereby laying a solid foundation for the accuracy and reliability of subsequent evaluation results.

[0055] Step S2, obtaining the measured arc extinguishing peak voltage and the measured contact opening distance of the high-voltage SF6 circuit breaker; wherein the measured arc extinguishing peak voltage and the measured contact opening distance are determined according to the opening test under the to-be-predicted time constant;

[0056] Specifically, after establishing the performance benchmark, the next step of the evaluation method is to obtain the measured parameters of the high-voltage SF6 circuit breaker under a specific evaluation scenario, i.e., the measured arc extinguishing peak voltage and the measured contact opening distance. The core of this step is to first determine a to-be-predicted time constant, which defines the target opening condition to be evaluated. This to-be-predicted time constant can be derived from the short-circuit calculation of a specific node in the power grid, or a theoretical value set to study the performance of the circuit breaker under a certain potential severe condition.

[0057] The two to-be-measured parameters are determined according to the breaking process under the to-be-predicted time constant. Unlike the reference parameters, the to-be-measured parameters are obtained in a more flexible manner, which is aimed at achieving the prediction purpose. One main implementation manner is to obtain the to-be-measured parameters through computer simulation modeling: a digital model matching the characteristics of the actual high-voltage SF6 circuit breaker and external circuit is constructed in a simulation environment, the circuit parameters are set to a value capable of representing the to-be-predicted time constant, and then a breaking process is simulated. Through analysis of the simulation results, the to-be-measured arc extinguishing peak voltage and the corresponding to-be-measured contact opening distance generated in the simulated breaking process can be accurately extracted.

[0058] The two voltages and opening distances obtained from the specific breaking condition are used as direct inputs for the calculation of the to-be-evaluated index value. This step obtains the key electrical and physical parameters under the specific condition in a flexible manner, providing necessary input data for the subsequent accurate prediction based on the model, and making it possible to evaluate the performance of the circuit breaker under any condition.

[0059] Step S3, calculating a ratio of the to-be-measured arc extinguishing peak voltage and the to-be-measured contact opening distance raised to a preset power, to generate a to-be-evaluated index value;

[0060] In a preferred embodiment, the ratio of the to-be-measured arc extinguishing peak voltage and the to-be-measured contact opening distance raised to a preset power is calculated by the following formula to generate a to-be-evaluated index value:

[0061]

[0062] In the formula, I eva is the to-be-evaluated index value; U meas is the to-be-measured arc extinguishing peak voltage; L meas is the to-be-measured contact opening distance; and a is the preset power.

[0063] In a preferred embodiment, the preset power ranges from 0.4 to 0.7, and the preset multiple is 0.75.

[0064] Specifically, after obtaining the reference parameters and the to-be-measured parameters, the core step of the evaluation method is to perform calculation to generate a to-be-evaluated index value capable of quantitatively representing the breaking possibility under the to-be-measured condition. Specifically, the step calculates a ratio of the to-be-measured arc extinguishing peak voltage and the to-be-measured contact opening distance raised to a preset power. The construction of this index is not a simple mathematical combination, but is based on a deep understanding of the complex physical characteristics in the breaking process of the circuit breaker.

[0065] The application realizes that the breaking success depends on the dynamic balance between the electrical stress (reflected by the voltage) between the contacts at the breaking moment and the insulation capability of the contact gap (related to the physical state such as the opening distance). From the perspective of the electric field, the electric field intensity between the contacts and the voltage and the opening distance are not simply inversely proportional, especially under the influence of the arc plasma, and the distribution rule is more complex. Therefore, the scheme creatively introduces the "preset power" factor, which is precisely to more accurately fit and reflect the nonlinear relationship between the electric field distribution and the contact opening distance. At the same time, from the energy perspective, the ratio index can also well reflect how the storage and conversion characteristics of the arc energy evolve with the change of the contact opening distance. Therefore, the evaluation index value comprehensively considers the two core factors of electric field and energy, and is a comprehensive measurement that can more comprehensively reflect the physical nature of the breaking process.

[0066] Further, a large amount of test data is verified, and in order to achieve the optimal accuracy of the evaluation result, the value range of the preset power a is preferably 0.4 to 0.7.

[0067] Through this step, two independent physical quantities (voltage and opening distance) measured at the breaking moment are converted into a comprehensive evaluation index that can more deeply and comprehensively reflect the inherent physical law of the breaking process, providing a scientific and reliable quantitative basis for subsequent accurate judgment of the success or failure of the breaking result.

[0068] Step S4, calculating a breaking evaluation critical value according to the reference arc extinguishing peak voltage, the reference contact opening distance and a preset critical value coefficient;

[0069] In a preferred embodiment, the determination of the critical value coefficient comprises:

[0070] When the to-be-predicted time constant is greater than the reference time constant, the product of a preset multiple and the to-be-predicted time constant is calculated to generate a first calculation result;

[0071] The quotient of the first calculation result and the reference time constant is calculated, and the solution result is taken as the critical value coefficient;

[0072] When the to-be-predicted time constant is equal to the reference time constant, the critical value coefficient is 1;

[0073] When the to-be-predicted time constant is less than the reference time constant, the product of the multiple and the reference time constant is calculated to generate a second calculation result;

[0074] The quotient of the second calculation result and the to-be-predicted time constant is calculated, and the solution result is taken as the critical value coefficient.

[0075] In a preferred embodiment, the breaking evaluation threshold value is calculated according to the reference arc extinguishing peak voltage, the reference contact opening distance and a preset threshold coefficient by the following formula:

[0076]

[0077] wherein K is the breaking evaluation threshold value; k is the threshold coefficient; U a is the reference arc extinguishing peak voltage; L a is the reference contact opening distance.

[0078] Specifically, after the to-be-evaluated index value is generated, in order to effectively judge it, the method then calculates a breaking evaluation threshold value corresponding thereto according to the reference arc extinguishing peak voltage, the reference contact opening distance and a threshold coefficient. The threshold value is not a fixed and unchangeable threshold, but a dynamic evaluation reference that can be adaptively adjusted according to the severity of the to-be-evaluated working condition, and the core lies in the dynamic determination of the threshold coefficient.

[0079] In a preferred embodiment, the determination process of the threshold coefficient embodies the adaptability of the method to different working conditions. According to the relationship between the to-be-predicted time constant and the reference time constant, the process is processed in different cases: when the to-be-predicted time constant is greater than the reference time constant, it means that the to-be-evaluated working condition is more severe, and the threshold coefficient is obtained by multiplying a preset multiple by the quotient of the to-be-predicted time constant and the reference time constant; when the two time constants are equal, the severity of the working condition is the same, and the threshold coefficient is 1; and when the to-be-predicted time constant is less than the reference time constant, it means that the working condition is relatively relaxed, and the threshold coefficient is obtained by multiplying the preset multiple by the quotient of the reference time constant and the to-be-predicted time constant.

[0080] In a preferred embodiment, the final calculation process of the breaking evaluation threshold value is as follows: first, the ratio of the preset power of the reference arc extinguishing peak voltage to the reference contact opening distance is calculated; then, the ratio is multiplied by the threshold coefficient determined in the foregoing step, thereby obtaining the final breaking evaluation threshold value.

[0081] Through this step, the method constructs a scientific and flexible evaluation reference, which can intelligently adjust according to the actual difficulty of the to-be-evaluated working condition, greatly improving the pertinence, adaptability and accuracy of the final evaluation result.

[0082] Step S5, judging whether the to-be-evaluated index value is greater than the breaking evaluation threshold value, if yes, determining that the predicted breaking result is successful, and if no, determining that the predicted breaking result is failed.

[0083] Specifically, after calculating the values ​​of the indicators to be evaluated and the breaking capacity assessment threshold, this evaluation method proceeds to the final judgment and prediction step. The core of this step is a direct quantitative comparison of the two calculation results: comparing the "values ​​to be evaluated," representing the actual performance of the circuit breaker under the predicted operating condition, with the "breaking capacity assessment threshold," representing the threshold required for successful breaking under that condition. The physical meaning of this comparison process can be understood as comparing the circuit breaker's "actual capability" with its "minimum requirement" in that specific scenario.

[0084] The specific judgment rules are as follows: If the comparison result shows that the value of the index to be evaluated is greater than the breaking assessment threshold, it indicates that the overall performance of the circuit breaker under the predicted operating condition exceeds the minimum threshold for successful breaking. In this case, the method determines that the predicted breaking result is successful. Conversely, if the value of the index to be evaluated is not greater than (i.e., less than or equal to) the breaking assessment threshold, it indicates that the overall performance of the circuit breaker fails to meet the necessary conditions for successful breaking under this operating condition. In this case, the method determines that the predicted breaking result is unsuccessful.

[0085] This step ultimately outputs a clear, binary (success or failure) prediction, providing a clear, intuitive, and reliable technical basis for circuit breaker design optimization, performance margin assessment, and fault diagnosis under specific operating conditions, thus completing the closed loop of the entire evaluation method.

[0086] Based on the above method embodiments, the present invention provides corresponding apparatus embodiments.

[0087] like Figure 2 As shown, an embodiment of the present invention provides an evaluation device for the breaking results of a high-voltage SF6 circuit breaker, comprising: a high-voltage SF6 circuit breaker benchmark test data acquisition module, a high-voltage SF6 circuit breaker test data acquisition module, a test index value generation module, a breaking evaluation critical value calculation module, and a breaking result evaluation module.

[0088] The high-voltage SF6 circuit breaker reference test data acquisition module is used to acquire the reference arc-extinguishing peak voltage and reference contact opening distance of the high-voltage SF6 circuit breaker; wherein, the reference arc-extinguishing peak voltage and the reference contact opening distance are determined by selecting the test result with the shortest arcing time from multiple sets of successful breaking tests conducted under a reference time constant.

[0089] The high-voltage SF6 circuit breaker test data acquisition module is used to acquire the arc-extinguishing peak voltage and the contact opening distance of the high-voltage SF6 circuit breaker to be tested; wherein, the arc-extinguishing peak voltage and the contact opening distance to be tested are determined based on the breaking test under the time constant to be predicted.

[0090] The to-be-evaluated index value generation module is configured to calculate a ratio of the to-be-tested arc extinction peak voltage to a preset power of the to-be-tested contact opening distance, and generate a to-be-evaluated index value.

[0091] The breaking evaluation threshold value calculation module is configured to calculate a breaking evaluation threshold value according to the reference arc extinction peak voltage, the reference contact opening distance, and a preset threshold value coefficient.

[0092] The breaking result evaluation module is configured to determine whether the to-be-evaluated index value is greater than the breaking evaluation threshold value, and if yes, determine that a predicted breaking result is successful, and if no, determine that the predicted breaking result is failed.

[0093] In a preferred embodiment, the breaking result evaluation device of the high-voltage SF6 circuit breaker further comprises a threshold value coefficient determination module.

[0094] The threshold value coefficient determination module is configured to, when the to-be-predicted time constant is greater than the reference time constant, calculate a product of a preset multiple and the to-be-predicted time constant, and generate a first calculation result.

[0095] The threshold value coefficient determination module is configured to, when the to-be-predicted time constant is greater than the reference time constant, calculate a product of a preset multiple and the to-be-predicted time constant, and generate a first calculation result.

[0096] When the to-be-predicted time constant is equal to the reference time constant, the threshold value coefficient is 1.

[0097] When the to-be-predicted time constant is less than the reference time constant, the threshold value coefficient determination module is configured to calculate a product of the multiple and the reference time constant, and generate a second calculation result.

[0098] The threshold value coefficient determination module is configured to, when the to-be-predicted time constant is less than the reference time constant, calculate a product of the multiple and the reference time constant, and generate a second calculation result.

[0099] In a preferred embodiment, the to-be-evaluated index value generation module calculates the ratio of the to-be-tested arc extinction peak voltage to the preset power of the to-be-tested contact opening distance according to the following formula, and generates a to-be-evaluated index value:

[0100]

[0101] In the formula, I eva is the to-be-evaluated index value; U meas is the to-be-tested arc extinction peak voltage; L meas is the to-be-tested contact opening distance; and a is the preset power.

[0102] It should be noted that the above-described embodiments of the device correspond to the above-described embodiments of the application, and can realize the evaluation method of the breaking result of the high-voltage SF6 circuit breaker according to any one of the above-described embodiments of the application. In addition, the above-described embodiments of the device are only illustrative, and the modules described as separate components can or can not be physically separated, and the components displayed as modules can or can not be physical units, i.e., they can be located in one place or distributed on multiple network units. According to actual needs, part or all of the modules can be selected to achieve the purpose of the embodiment. In addition, the connection between the modules in the device embodiments provided by the application indicates that there is a communication connection between them, which can be implemented as one or more communication buses or signal lines. Those skilled in the art can understand and implement it without creative labor.

[0103] On the basis of the above-described method embodiments of the application, an electronic device embodiment is provided.

[0104] An embodiment of the application provides an electronic device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, when the computer program is executed by the processor, the evaluation method of the breaking result of the high-voltage SF6 circuit breaker according to any one of the above-described embodiments of the application is realized, or when the computer program is executed by the processor, the functions of the modules in the above-described device embodiments are realized.

[0105] For example, the computer program can be divided into one or more modules, which are stored in the memory and executed by the processor to complete the application. The one or more modules can be a series of computer program instruction segments capable of completing a specific function, which are used to describe the execution process of the computer program in the terminal device.

[0106] The terminal device can be a desktop computer, a notebook computer, a palm computer, a cloud server, and other computing devices. The terminal device can include, but is not limited to, a processor and a memory.

[0107] The processor can be a central processing unit (CPU), and can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc. The processor is a control center of the terminal device, and connects all parts of the terminal device through various interfaces and lines.

[0108] The memory can be used to store the computer program and / or modules, and the processor realizes various functions of the terminal device by running or executing the computer program and / or modules stored in the memory, and calling data stored in the memory. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required by a function, etc.; and the data storage area can store data created according to the use of the mobile phone, etc. In addition, the memory can include a high-speed random access memory, and can also include a nonvolatile memory, for example, a hard disk, a memory, a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, at least one disk storage device, a flash memory device, or other volatile solid-state memory devices.

[0109] On the basis of the above-mentioned method embodiment, the application further provides a storage medium embodiment;

[0110] Another embodiment of the application provides a storage medium, which comprises a stored computer program, wherein when the computer program runs, the device where the storage medium is located performs the evaluation method of the breaking result of the high-voltage SF6 circuit breaker.

[0111] The storage medium is a computer readable storage medium, and the computer program includes computer program code in the form of source code, object code, an executable file, or some intermediate form, etc. The computer readable medium can include any entity or device capable of carrying the computer program code, a recording medium, a U disk, a mobile hard disk, a magnetic disk, an optical disk, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, a software distribution medium, etc.

[0112] In the description of the present specification, the description of the terms "one embodiment", "some embodiments", "an example", "a specific example" or "some examples" means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. Moreover, the specific features, structures, materials or characteristics described can be combined in any suitable manner in any one or more embodiments or examples. In addition, the person skilled in the art can combine and combine the different embodiments or examples described in the present specification and the features of the different embodiments or examples without contradiction.

[0113] The above is the preferred embodiment of the present application. It should be pointed out that for those skilled in the art, without departing from the principles of the present application, a number of improvements and refinements can be made, which are also considered to be within the scope of protection of the present application.

Claims

1. A method for evaluating the breaking results of a high-voltage SF6 circuit breaker, characterized in that, include: The reference arc-extinguishing peak voltage and reference contact opening distance of the high-voltage SF6 circuit breaker are obtained; wherein, the reference arc-extinguishing peak voltage and the reference contact opening distance are determined by selecting the test result with the shortest arcing time from multiple successful breaking tests conducted under a reference time constant; The test arc-extinguishing peak voltage and the test contact distance of the high-voltage SF6 circuit breaker are obtained; wherein the test arc-extinguishing peak voltage and the test contact distance are determined based on the breaking test under the time constant to be predicted. Calculate the ratio of the measured arc-extinguishing peak voltage to the preset power of the measured contact opening distance to generate the index value to be evaluated; The critical value for breaking assessment is calculated based on the reference arc-extinguishing peak voltage, the reference contact opening distance, and the preset critical value coefficient. Determine whether the value of the indicator to be evaluated is greater than the critical value for breaking assessment. If yes, the predicted breaking result is determined to be successful; otherwise, the predicted breaking result is determined to be unsuccessful.

2. The method for evaluating the breaking results of a high-voltage SF6 circuit breaker as described in claim 1, characterized in that, The determination of the critical value coefficient includes: When the time constant to be predicted is greater than the reference time constant, the product of a preset multiple and the time constant to be predicted is calculated to generate a first calculation result; Calculate the quotient of the first calculation result and the reference time constant, and use the solution result as the critical value coefficient; When the time constant to be predicted is equal to the reference time constant, the critical value coefficient is 1; When the time constant to be predicted is less than the reference time constant, the product of the multiple and the reference time constant is calculated to generate a second calculation result; Calculate the quotient of the second calculation result and the time constant to be predicted, and use the solution result as the critical value coefficient.

3. The method for evaluating the breaking results of a high-voltage SF6 circuit breaker as described in claim 2, characterized in that, The ratio of the measured arc-extinguishing peak voltage to the preset power of the measured contact opening distance is calculated using the following formula to generate the evaluation index value: In the formula, I eva The value of the indicator to be evaluated; U meas L represents the voltage at the arc extinction peak to be measured. meas is the contact gap to be tested; 'a' is a preset power.

4. The method for evaluating the breaking results of a high-voltage SF6 circuit breaker as described in claim 3, characterized in that, The critical value for breaking assessment is calculated using the following formula based on the reference arc-extinguishing peak voltage, the reference contact opening distance, and the preset critical value coefficient: In the formula, K is the critical value for breaking down; k is the critical value coefficient; U a The reference arc-extinguishing peak voltage; L a The reference contact opening distance.

5. The method for evaluating the breaking results of a high-voltage SF6 circuit breaker as described in claim 4, characterized in that, The preset power ranges from 0.4 to 0.7; the preset multiple is 0.

75.

6. An evaluation device for the breaking results of a high-voltage SF6 circuit breaker, characterized in that, include: The module includes: high-voltage SF6 circuit breaker benchmark test data acquisition module, high-voltage SF6 circuit breaker test data acquisition module, evaluation index value generation module, breaking evaluation critical value calculation module, and breaking result evaluation module. The high-voltage SF6 circuit breaker reference test data acquisition module is used to acquire the reference arc-extinguishing peak voltage and reference contact opening distance of the high-voltage SF6 circuit breaker; wherein, the reference arc-extinguishing peak voltage and the reference contact opening distance are determined by selecting the test result with the shortest arcing time from multiple sets of successful breaking tests conducted under a reference time constant. The high-voltage SF6 circuit breaker test data acquisition module is used to acquire the arc-extinguishing peak voltage and the contact opening distance of the high-voltage SF6 circuit breaker to be tested; wherein, the arc-extinguishing peak voltage and the contact opening distance to be tested are determined based on the breaking test under the time constant to be predicted. The evaluation index value generation module is used to calculate the ratio of the measured arc extinguishing peak voltage to the preset power of the measured contact opening distance, and generate the evaluation index value. The interruption assessment critical value calculation module is used to calculate the interruption assessment critical value based on the reference arc extinguishing peak voltage, the reference contact opening distance, and the preset critical value coefficient. The interruption result evaluation module is used to determine whether the value of the indicator to be evaluated is greater than the interruption evaluation threshold. If it is, the predicted interruption result is determined to be successful; otherwise, the predicted interruption result is determined to be unsuccessful.

7. The evaluation device for the breaking results of a high-voltage SF6 circuit breaker as described in claim 6, characterized in that, Also includes: Critical value coefficient determination module; The critical value coefficient determination module is used to calculate the product of a preset multiple and the time constant to be predicted when the time constant to be predicted is greater than the reference time constant, and generate a first calculation result. Calculate the quotient of the first calculation result and the reference time constant, and use the solution result as the critical value coefficient; When the time constant to be predicted is equal to the reference time constant, the critical value coefficient is 1; When the time constant to be predicted is less than the reference time constant, the product of the multiple and the reference time constant is calculated to generate a second calculation result; Calculate the quotient of the second calculation result and the time constant to be predicted, and use the solution result as the critical value coefficient.

8. The evaluation device for the breaking results of a high-voltage SF6 circuit breaker as described in claim 7, characterized in that, The module for generating the evaluation index value calculates the ratio of the measured arc-extinguishing peak voltage to the preset power of the measured contact opening distance using the following formula to generate the evaluation index value: In the formula, I eva The value of the indicator to be evaluated; U meas L represents the voltage at the arc extinction peak to be measured. meas is the contact gap to be tested; 'a' is a preset power.

9. An electronic device, characterized in that, The device includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor, when executing the computer program, implements the method for evaluating the breaking results of a high-voltage SF6 circuit breaker as described in any one of claims 1 to 5.

10. A storage medium, characterized in that, The storage medium includes a stored computer program, wherein, when the computer program is executed, it controls the device containing the storage medium to perform the evaluation method for the breaking results of a high-voltage SF6 circuit breaker as described in any one of claims 1 to 5.

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