Data link test method and device based on UCIe and chip

Abstract

The invention relates to a UCIe-based data link test method and device, and a chip. The method comprises the steps that a local core particle obtains an eye pattern inspection result which is returned by a remote core particle and is associated with any data channel in a data link; according to the eye pattern inspection result and a preset eye pattern threshold interval parameter, determining whether the eye pattern inspection result accords with an interval range allowed by the eye pattern threshold interval parameter; determining any data channel as a qualified channel under the condition that the eye pattern inspection result accords with an interval range allowed by the eye pattern threshold interval parameter; and under the condition that the eye pattern inspection result does not accord with the interval range allowed by the eye pattern threshold interval parameter, determining any data channel as an unqualified channel. According to the technical scheme, the available bandwidth of the data link can be improved, the stable communication rate of the data link can be ensured, the flexibility of configuration about link training can be improved, and the method and the device can be compatible with a related UCIe protocol.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the chip technical field, and in particular to a data link test method, device and chip based on UCIe (Universal Chiplet Interconnect express). BACKGROUND

[0002] In the link training process of the UCIe protocol, the LTSM (Link Training and Status Machine) state machine plays a core role. The LTSM state gradually completes the whole process from physical layer initialization to link rate negotiation through a series of well-defined sub-states. Among them, the LINKSPEED sub-state is one of the key stages of link training, mainly responsible for determining the maximum stable communication rate that the current link can support, and configuring the corresponding transmission parameters accordingly. Ensuring the maximum stable communication rate is always the goal pursued by the UCIe protocol. SUMMARY

[0003] Therefore, the present disclosure provides a data link test method, device and chip based on UCIe to help ensure the stable communication rate of the selected link.

[0004] According to an aspect of an embodiment of the present disclosure, a data link test method based on UCIe is provided, comprising:

[0005] The local chiplet obtains an eye diagram test result associated with any one data channel in the data link returned by the remote chiplet, the eye diagram test result being at least one of an eye height test result based on eye height scanning and an eye width test result based on eye width scanning;

[0006] According to the eye diagram test result and a preset eye diagram threshold interval parameter, it is determined whether the eye diagram test result conforms to the interval range allowed by the eye diagram threshold interval parameter, wherein the eye diagram threshold interval parameter is at least one of an eye height threshold interval and an eye width threshold interval;

[0007] In the case where the eye diagram test result conforms to the interval range allowed by the eye diagram threshold interval parameter, the any one data channel is determined as a qualified channel;

[0008] In the case where the eye diagram test result does not conform to the interval range allowed by the eye diagram threshold interval parameter, the any one data channel is determined as an unqualified channel.

[0009] In a possible implementation, when the eye diagram test result comprises the eye height test result, the determining, according to the eye diagram test result and a preset eye diagram threshold interval parameter, whether the eye diagram test result conforms to an interval range allowed by the eye diagram threshold interval parameter, comprises:

[0010] comparing an eye height interval in which the eye height test result that passes the test is located and the eye height threshold interval;

[0011] when the eye height interval in which the eye height test result that passes the test is located completely covers the eye height threshold interval, determining that the eye diagram test result conforms to the interval range allowed by the eye diagram threshold interval parameter;

[0012] when the eye height interval in which the eye height test result that passes the test is located does not completely cover the eye height threshold interval, determining that the eye diagram test result does not conform to the interval range allowed by the eye diagram threshold interval parameter.

[0013] In a possible implementation, when the eye diagram test result comprises the eye width test result, the determining, according to the eye diagram test result and a preset eye diagram threshold interval parameter, whether the eye diagram test result conforms to an interval range allowed by the eye diagram threshold interval parameter, comprises:

[0014] comparing an eye width interval in which the eye width test result that passes the test is located and the eye width threshold interval;

[0015] when the eye width interval in which the eye width test result that passes the test is located completely covers the eye width threshold interval, determining that the eye diagram test result conforms to the interval range allowed by the eye diagram threshold interval parameter;

[0016] when the eye width interval in which the eye width test result that passes the test is located does not completely cover the eye width threshold interval, determining that the eye diagram test result does not conform to the interval range allowed by the eye diagram threshold interval parameter.

[0017] In a possible implementation, the UCIe-based data link test method further comprises:

[0018] performing bit error rate analysis on the arbitrary data channel to obtain a bit error rate of the arbitrary data channel;

[0019] determining, according to the bit error rate and a preset bit error rate threshold, whether the bit error rate is lower than the bit error rate threshold;

[0020] when the bit error rate is lower than the bit error rate threshold, determining that the arbitrary data channel is a qualified channel;

[0021] If the bit error rate is not lower than the bit error rate threshold, any one of the data channels will be identified as an unqualified channel.

[0022] In one possible implementation, the UCIe-based data link testing method further includes:

[0023] If any one of the data channels is determined to be a non-compliant channel and there is a compliant backup data channel available for replacement, then the non-compliant data channel shall be replaced with the compliant backup data channel.

[0024] In one possible implementation, the UCIe-based data link testing method further includes:

[0025] If any of the data channels is determined to be a non-compliant channel and there is no compliant backup data channel available for replacement, the data link will either be down-frequency communicated or the data link will be retrained.

[0026] In one possible implementation, the UCIe-based data link testing method is executed in response to a received eye diagram test enable command.

[0027] In one possible implementation, the UCIe-based data link testing method further includes:

[0028] In response to the received eye diagram test start command, the local core performs an eye diagram scan and sends eye diagram test data to the remote core through any one of the data channels, wherein the remote core stores a copy of the same eye diagram test data;

[0029] The remote core receives the eye diagram test data and compares the received eye diagram test data with the copy data;

[0030] If the received eye diagram test data is the same as the copy data, the remote core returns a passed eye diagram check result to the local core.

[0031] If the received eye diagram test data is different from the copy data, the remote core returns a failed eye diagram check result to the local core.

[0032] In one possible implementation, when the eye diagram scan is an eye height scan, the eye diagram inspection result is the eye height inspection result; when the eye diagram scan is an eye width scan, the eye diagram inspection result is the eye width inspection result.

[0033] According to another aspect of the embodiments of this disclosure, a data link testing apparatus based on UCIe is provided, comprising:

[0034] The receiving module, located in the local core, is used to obtain the eye diagram inspection result returned by the remote core and associated with any data channel in the data link. The eye diagram inspection result is at least one of the eye height inspection result based on eye height scanning and the eye width inspection result based on eye width scanning.

[0035] An analysis module, located in the local chip, is used to determine whether the eye diagram examination result conforms to the range allowed by the eye diagram threshold range parameter based on the eye diagram examination result and the preset eye diagram threshold range parameter, wherein the eye diagram threshold range parameter is at least one of the eye height threshold range and the eye width threshold range;

[0036] The determination module, located in the local core, is used to determine any one of the data channels as a qualified channel when the eye diagram inspection result falls within the range allowed by the eye diagram threshold range parameter; and to determine any one of the data channels as an unqualified channel when the eye diagram inspection result does not fall within the range allowed by the eye diagram threshold range parameter.

[0037] In one possible implementation, the UCIe-based data link testing device further includes:

[0038] A transmitting module, located in the local chip, is used to send eye diagram test data to the remote chip through any one of the data channels;

[0039] The data comparison module, located in the remote core, is used to store a copy of the same data as the eye diagram test data, receive the eye diagram test data, and compare the received eye diagram test data with the copy data.

[0040] The result feedback module, located in the remote core, is used to return an eye diagram check result indicating that the received eye diagram test data is the same as the copy data to the local core, and to return an eye diagram check result indicating that the received eye diagram test data is different from the copy data to the local core.

[0041] In one possible implementation, the UCIe-based data link testing device further includes:

[0042] The parameter configuration module, located in the local core, is used to configure the eye diagram threshold range parameters.

[0043] In one possible implementation, the UCIe-based data link testing device further includes:

[0044] The control module, located in the local chip and coupled to the transmitting module, the receiving module, the analysis module, and the determining module, is used to receive instructions and enable or disable eye diagram scanning according to the instructions, and to control the transmitting module, the receiving module, the analysis module, and the determining module to enable or disable data link testing according to the instructions.

[0045] According to another aspect of the present disclosure, a chip is provided, the chip including a UCIe-based data link testing apparatus as described in any of the preceding claims.

[0046] As can be seen from the above scheme, the UCIe-based data link testing method, apparatus, and chip disclosed herein, by judging based on eye diagram examination results, selects data channels with sufficiently large eye diagram openings that meet the eye diagram threshold range parameter requirements for data communication between local and remote cores. This ensures that the selected data channels have sufficient voltage noise margin and clock skew margin, making them more tolerant and robust to signal jitter, noise, crosstalk, temperature drift, and other factors. Furthermore, combined with bit error rate judgment, it improves the reliability of data communication in the UCIe data link after link training, contributing to a stable communication rate and compatibility with relevant UCIe protocols. In addition, by using an eye diagram test start command to trigger execution, the UCIe-based data link testing method disclosed herein can be executed by local and remote cores during the link training phase through software means, which helps to improve the flexibility of link training configuration. When a data channel is determined to be unqualified, if a qualified backup data channel is available, the unqualified channel will be replaced with a qualified backup data channel, making full use of the backup channel resources. If no qualified backup data channel is available, the data link will be down-frequency communication or the data link will be retrained, which can achieve flexible configuration according to the communication strategy requirements. Attached Figure Description

[0047] Figure 1 This is a flowchart illustrating the LINKSPEED sub-state in related technologies;

[0048] Figure 2 This is a schematic flowchart illustrating a UCIe-based data link testing method according to an illustrative embodiment;

[0049] Figure 3 This is a schematic diagram illustrating the steps of determining whether an eye diagram examination result conforms to the allowed range of the eye diagram threshold range parameter based on the eye height examination result, according to an illustrative embodiment.

[0050] Figure 4This is a schematic diagram illustrating the steps of determining whether an eye diagram examination result conforms to the allowed range of the eye diagram threshold range parameter based on the eye width examination result, according to an illustrative embodiment.

[0051] Figure 5 This is a schematic diagram illustrating a bit error rate-based judgment process according to an illustrative embodiment;

[0052] Figure 6 This is a schematic diagram illustrating the process of obtaining eye diagram examination results according to an illustrative embodiment;

[0053] Figure 7 This is a schematic diagram of the comparison between eye diagram examination results and eye diagram threshold interval parameters in the UCIe-based data link testing method disclosed in this publication;

[0054] Figure 8 This is a schematic diagram of a UCIe-based data link testing device according to an illustrative embodiment;

[0055] Figure 9 This is a schematic diagram of a state machine in a specific application scenario of the UCIe-based data link testing method, apparatus and chip according to the embodiments of this disclosure;

[0056] Figure 10 This is a flowchart illustrating the application scenario process of the link quality inspection module performing multi-dimensional link quality checks.

[0057] In the attached diagram, the component names represented by each number are as follows:

[0058] 801. Receiver module

[0059] 802. Analysis Module

[0060] 803. Determine the module.

[0061] 804. Sending module.

[0062] 805. Data Comparison Module

[0063] 806. Result Feedback Module

[0064] 807. Parameter Configuration Module

[0065] 808. Control Module

[0066] 810. Locally produced chips.

[0067] 820, Remote Core Particle

[0068] 901. Master state machine control module.

[0069] 902. Test data sending module,

[0070] 903. Link quality inspection module.

[0071] 904. Threshold configuration module.

[0072] 910. State machine. Detailed Implementation

[0073] To make the objectives, technical solutions, and advantages of this disclosure clearer, the following detailed description is provided with reference to the accompanying drawings and embodiments.

[0074] It should be noted that the terms "first," "second," etc., in the specification, claims, and drawings of this disclosure are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0075] As used in the specification and claims of this disclosure, “coupled (or connected)” may refer to any direct or indirect means of connection. For example, if a first device is coupled (or connected) to a second device, it should be interpreted as the first device being directly connected to the second device, or the first device being indirectly connected to the second device through other devices or some means of connection.

[0076] The embodiments disclosed herein can be applied to link speed optimization in the UCIe protocol and can be deployed in the LINKSPEED (link rate) sub-state stage of the LTSM in the UCIe protocol. They can be used to dynamically optimize the communication performance of the link during the link training process.

[0077] Figure 1 This is a flowchart illustrating the LINKSPEED sub-state in related technologies. For example... Figure 1 As shown, in related technologies, the functions and processes of the LINKSPEED sub-state mainly include rate negotiation, rate testing based on a preset sequence, rate threshold determination and selection, and data channel-level and data link-level decision-making.

[0078] Regarding rate negotiation: After completing the preliminary stages before LINKSPEED, each data channel (Lane, or data transmission channel, or simply channel) in the data link has basic signal integrity guarantees. Upon entering the LINKSPEED stage, the transmitting end (Tx) and the receiving end (Rx) evaluate the data rate that the current data channel can support by exchanging specific training sequences.

[0079] Regarding rate testing based on preset sequences: Training sequences typically include a set of standardized patterns. These patterns can be used to measure metrics such as eye diagram quality, bit error rate (BER), and jitter characteristics at the receiver. For any data channel, these metrics can be used to determine whether the data channel can operate stably at a certain rate.

[0080] Regarding rate threshold determination and selection: The receiver evaluates the performance of each data channel at different rates. If the preset decision threshold is met (UCIe requires a bit error rate of less than 10%), the receiver will select the appropriate data channel. -15 If the threshold is set to 1 (or more stringent), then the data channel is considered to be functioning normally at that rate. Ultimately, the operating rate of the entire data link is determined by the lowest supported communication rate among all data channels between the sender and receiver, ensuring the stability and consistency of the overall link.

[0081] Regarding data channel-level and data link-level decisions: In a multi-data channel architecture, even if some data channels have higher speed capabilities, if any data channel cannot reach a certain speed level, the entire data link must be slowed down to the maximum speed supported by that data channel that cannot reach that speed level. After completing data channel-level and data link-level decisions, if there is a data channel that cannot reach the corresponding speed level, the entire data link is slowed down and retrained, and then re-enters speed negotiation. If all data channels in the data link reach the corresponding speed level, the data link maintains the current communication speed and enters the subsequent state.

[0082] As mentioned above, in related technologies, during the LINKSPEED phase, the communication rate of the data link is typically evaluated based on a preset training sequence, and the final operating rate is determined according to a fixed bit error rate decision threshold. However, this mechanism has several significant drawbacks:

[0083] First, it is sensitive to the signal quality of a single data channel. In a multi-data-channel parallel transmission architecture, if the signal quality of one data channel is poor (e.g., due to encapsulation mismatch, uneven channel loss, or eye diagram closure caused by crosstalk), even if other data channels have good signal integrity, the communication rate of the entire data link may be forced to decrease to the maximum rate supported by the data channel with poor signal quality. This directly limits the bandwidth utilization of the system.

[0084] Second, the link replacement strategy is rigid. Although some existing solutions have introduced a backup data channel replacement mechanism, their judgment often relies solely on a single bit error rate threshold, lacking a comprehensive assessment and quantitative modeling of signal quality. This can easily lead to misjudgments or omissions, resulting in poor replacement performance.

[0085] Third, poor flexibility and configurability. Most implementations embed the link quality assessment logic in hardware, lacking programmable interfaces, making it difficult for users to flexibly configure assessment criteria and replacement strategies according to different application scenarios (such as high-performance computing, low-power mode, heterogeneous packaging structure).

[0086] In view of this, this disclosure provides a UCIe-based data link testing method, apparatus, and chip. By examining the eye diagram results, it helps select a data channel with a sufficiently large eye diagram opening, ensuring that the selected data channel has sufficient voltage noise margin and clock skew margin. Ultimately, this helps improve the crosstalk resistance, power supply noise resistance, jitter resistance, temperature drift resistance, and clock skew resistance of the selected inter-chip data link, thereby helping to ensure the stable communication rate of the selected link.

[0087] Figure 2 This is a schematic flowchart illustrating a UCIe-based data link testing method according to an illustrative embodiment. Figure 2 As shown in the illustrative embodiment, the data link testing method mainly includes the following steps 201 to 204.

[0088] Step 201: The local chiplet obtains the eye diagram check result associated with any data channel in the data link returned by the remote chiplet. The eye diagram check result is at least one of the eye height check result based on eye height scan and the eye width check result based on eye width scan.

[0089] Step 202: Based on the eye diagram examination results and the preset eye diagram threshold interval parameters, determine whether the eye diagram examination results conform to the range allowed by the eye diagram threshold interval parameters, wherein the eye diagram threshold interval parameters are at least one of the eye height threshold interval and the eye width threshold interval.

[0090] Step 203: If the eye diagram examination results meet the allowable range of the eye diagram threshold range parameter, determine any data channel as a qualified channel.

[0091] Step 204: If the eye diagram test results do not meet the allowed range of the eye diagram threshold range parameter, any data channel shall be identified as an unqualified channel.

[0092] In an illustrative embodiment, eye height scanning refers to gradually increasing the voltage from a preset minimum voltage to a preset maximum voltage in a set step size, and sending test data based on different voltages. In an illustrative embodiment, eye width scanning refers to gradually increasing the clock phase from a preset minimum clock phase to a preset maximum clock phase in a set phase step size, and sending test data based on different clock phases.

[0093] In conjunction with UCIe, the UCIe-based data link testing method of this disclosure can be applied to the LINKSPEED sub-state phase of LTSM. It can be used in conjunction with the bit error rate judgment performed by the relevant UCIe protocol in the LINKSPEED sub-state to select a high-quality data channel.

[0094] In an illustrative embodiment, in step 201, the eye diagram check result may be that the remote core returns to the local core through the sideband specified by UCIe.

[0095] The eye diagram, or eye diagram, is a graph that repeatedly overlays received waveforms from multiple bit periods onto a single image, resembling an "eye." It unfolds the voltage-time characteristics of a signal using an eye-like shape, allowing for rapid assessment of communication link quality. The parameters of the eye diagram include eye height and eye width. Eye height represents the voltage range between the upper and lower boundaries of the eye diagram, indicating the voltage noise margin. A larger eye height provides stronger resistance to crosstalk, reflections, and power supply noise. Eye width represents the time range on the time axis between the left and right boundaries of the eye diagram that ensures correct sampling. Eye width characterizes the system's ability to resist inter-symbol interference and jitter, as well as the time margin for correct sampling; a larger eye width provides better jitter resistance. Therefore, selecting a data channel with a large eye diagram opening helps the chosen data link maintain a sufficiently stable communication rate and is less susceptible to interference. Because the parameters of the eye diagram include eye height and eye width, in the illustrative embodiment, at least one of the eye height and eye width can be judged for different purposes. In the preferred embodiment, in order to ensure that the selected data link maintains a sufficiently stable communication rate and is subject to minimal interference, the judgment is made by combining the eye height and eye width.

[0096] Figure 3 This is a schematic diagram illustrating the steps of determining whether an eye diagram examination result conforms to the allowed range of the eye diagram threshold range parameter based on the eye height examination result, according to an illustrative embodiment. Figure 3 As shown in the illustrative embodiment, when the eye diagram examination results include the eye height examination results, step 202 may specifically include the following steps 301 to 303.

[0097] Step 301: Compare the eye height range and eye height threshold range where the eye height test result with the content "pass" is located;

[0098] Step 302: If the eye height test result containing the content of "passed" completely covers the eye height threshold range, determine the eye diagram test result as the range allowed by the eye diagram threshold range parameter.

[0099] Step 303: If the eye height test result containing the content of "passed" does not completely cover the eye height threshold range, the eye diagram test result is determined to be within the range allowed by the eye diagram threshold range parameter.

[0100] The eye height check result is obtained by comparing the code pattern of the training sequence received by the remote core from the local core through the tested data channel with the code pattern of the training sequence stored in the remote core. The local core sends the code pattern of the training sequence to the remote core through the tested data channel based on different signal voltages by executing a voltage scanning algorithm. The code pattern of the training sequence sent by the local core to the remote core is the same as the code pattern of the training sequence stored in the remote core. When the local core sends the code pattern of the training sequence to the remote core based on different signal voltages, the code pattern of the training sequence received by the remote core may be incorrect due to the change in signal voltage. This error can be confirmed by comparing the code pattern of the received training sequence with the code pattern of the training sequence stored by the remote core. Specifically, the signal voltage corresponding to the code pattern of the training sequence with errors received by the remote core is in an excessively high voltage range or an excessively low voltage range, while the signal voltage corresponding to the code pattern of the correct training sequence received by the remote core is between these two voltage ranges, i.e., between the upper and lower boundaries of the eye diagram.

[0101] In an illustrative embodiment, the eye height check result includes "pass" or "fail". A "pass" result indicates that the remote chip's comparison of the training sequence's code pattern is consistent, while a "fail" result indicates that the remote chip's comparison of the training sequence's code pattern is inconsistent. The local chip can determine the range of signal voltages when the remote chip correctly receives the training sequence's code pattern based on the eye height check result.

[0102] Assume that the eye height interval of the passed eye height test result is the voltage range between the first voltage and the second voltage, or the eye height value is the voltage range between the first voltage and the second voltage, and the eye height threshold interval is the voltage range between the third voltage and the fourth voltage. If the comparison result obtained through step 301 is that the first voltage is less than the third voltage, the third voltage is less than the fourth voltage, and the fourth voltage is less than the second voltage, then this satisfies the condition in step 302 that the eye height interval of the passed eye height test result completely covers the eye height threshold interval. If the comparison result obtained through step 301 is not that the first voltage is less than the third voltage, the third voltage is less than the fourth voltage, and the fourth voltage is less than the second voltage, then the condition in step 302 that the eye height interval of the passed eye height test result completely covers the eye height threshold interval is not satisfied.

[0103] In an illustrative embodiment, incorporating relevant UCIe technologies, the eye height value for each data channel originates from the reference voltage scanning algorithm (Vref Training) of the MBTRAIN.DATATRAINVREF stage (i.e., the main band training-data training reference voltage stage) during link training. The reference voltage scanning algorithm initiates an eye diagram scan through the local chip, scanning the entire reference voltage range. The pass interval of the reference voltage (Vref), i.e., the range of the eye height, is obtained through the results of the relevant data inspection circuit of the remote chip.

[0104] Figure 4 This is a schematic diagram illustrating the steps of determining whether an eye diagram examination result conforms to the allowed range of the eye diagram threshold range parameter based on the eye width examination result, according to an illustrative embodiment. Figure 4 As shown in the illustrative embodiment, when the eye diagram examination result includes the eye width examination result, step 202 may specifically include the following steps 401 to 403.

[0105] Step 401: Compare the eye width range containing the passed eye width test results with the eye width threshold range;

[0106] Step 402: If the eye width interval of the passed eye width test result completely covers the eye width threshold interval, the eye diagram test result is determined to be within the range allowed by the eye diagram threshold interval parameter.

[0107] Step 403: If the eye width interval of the eye width test result that is passed does not completely cover the eye width threshold interval, the eye diagram test result is determined to be within the range allowed by the eye diagram threshold interval parameter.

[0108] The eye width test result is obtained by comparing the code pattern of the training sequence received by the remote core from the local core through the tested data channel with the code pattern of the training sequence stored in the remote core. The local core sends the code pattern of the training sequence to the remote core through the tested data channel by executing a phase interpolation scanning algorithm to send clock signals based on data with different phases. The code pattern of the training sequence sent by the local core to the remote core is the same as the code pattern of the training sequence stored in the remote core. When the local core sends the code pattern of the training sequence to the remote core based on data with different phases, the code pattern of the training sequence received by the remote core may be incorrect due to the phase mismatch between the data receiving clock signal and the data sending clock signal. This error can also be confirmed by comparing the code pattern of the received training sequence with the code pattern of the training sequence stored in the remote core. Specifically, when the remote core receives a training sequence with an erroneous code pattern, the phase of the data transmission clock signal corresponding to that code pattern is in a phase interval that is too far to the left or too far to the right. Conversely, when the remote core receives a training sequence with a correct code pattern, the phase of the data transmission clock signal corresponding to that code pattern is between the phase intervals that are too far to the left and too far to the right, i.e., between the left and right boundaries of the eye diagram.

[0109] In an illustrative embodiment, the eye width check result also includes "pass" or "fail". A "pass" result indicates that the remote chip's comparison of the training sequence's code pattern is consistent, while a "fail" result indicates that the remote chip's comparison of the training sequence's code pattern is inconsistent. The local chip can determine the range of the data transmission clock signal phase when the remote chip correctly receives the training sequence's code pattern by using the eye width check result.

[0110] Assume that the eye width interval containing the passed eye width test result is the voltage range between the first phase and the second phase, or the eye width value is the phase range between the first phase and the second phase, and the eye width threshold interval is the phase range between the third phase and the fourth phase. If the comparison result obtained through step 401 is that the first phase is less than the third phase, the third phase is less than the fourth phase, and the fourth phase is less than the second phase, then this satisfies the condition in step 402 that the eye width interval containing the passed eye width test result completely covers the eye width threshold interval. If the comparison result obtained through step 401 is not that the first phase is less than the third phase, the third phase is less than the fourth phase, and the fourth phase is less than the second phase, then the condition in step 402 that the eye width interval containing the passed eye width test result completely covers the eye width threshold interval is not satisfied.

[0111] In an illustrative embodiment, incorporating relevant UCIe technologies, the eye width value of each data channel originates from the phase interpolation scan algorithm (PI SCAN) of the MBTRAIN.DATATRAINCENTER1 stage (i.e., mainband training - data training center 1 stage) during link training. The phase interpolation scan algorithm initiates an eye diagram scan through the local core, scanning the entire phase interpolation (PI) range. The phase pass interval, i.e., the eye width range, is obtained through the results of the relevant data inspection circuit of the remote core.

[0112] In related technologies, in the LINKSPEED sub-state of UCIe, the bit error rate is used to assess whether the data channel meets the current communication rate and can transmit data normally. For example, the bit error rate is compared with a preset decision threshold (e.g., 10). -15 The error rate of a data channel is compared with the decision threshold. If the bit error rate of a certain data channel at the current communication rate is lower than the decision threshold, then the data channel is considered to be able to operate normally at the current communication rate. Ultimately, the operating rate of the entire link is determined by the lowest supported communication rate among all data channels. Based on this, in the illustrative embodiment, the UCIe-based data link testing method of this disclosure is compatible with UCIe bit error rate assessment. Figure 5 This is a schematic diagram illustrating a bit error rate-based judgment process according to an illustrative embodiment, as shown below. Figure 5 As shown in the illustrative embodiment, the UCIe-based data link testing method of this disclosure may further include the following steps 501 to 504.

[0113] Step 501: Perform bit error rate analysis on any data channel to obtain the bit error rate of any data channel;

[0114] Step 502: Determine whether the bit error rate is lower than the bit error rate threshold based on the bit error rate and the preset bit error rate threshold.

[0115] Step 503: If the bit error rate is lower than the bit error rate threshold, determine any data channel as a qualified channel;

[0116] Step 504: If the bit error rate is not lower than the bit error rate threshold, determine any data channel as an unqualified channel.

[0117] In conjunction with relevant UCIe technologies, in an illustrative embodiment, step 501 may include: the local chip sending a test pattern (e.g., an LFSR (Linear Feedback Shift Register) test pattern) for bit error rate analysis to the remote chip through any data channel; the remote chip generating its own test pattern identical to the test pattern sent by the local chip; and comparing the received test pattern bit by bit with its own generated test pattern to obtain the bit error rate of the arbitrary data channel.

[0118] In conjunction with relevant UCIe technologies, in an illustrative embodiment, steps 502 to 504 can be implemented in a remote core, and the remote core feeds back information on whether any data channel is a qualified channel to the local core via a sideband.

[0119] In an illustrative embodiment, the eye diagram inspection result judgment process in steps 201 to 204 and the bit error rate judgment process in steps 501 to 504 can be combined to determine whether any data channel is a qualified channel.

[0120] In UCIe-related technologies, the data link between local and remote cores includes a backup data channel in addition to the data channel. This backup data channel can be replaced when a data channel experiences an open circuit or the bit error rate does not meet the requirements. Based on this, in the illustrative embodiment, the UCIe-based data link testing method of this disclosure may further include: replacing any data channel with a qualified backup data channel when any data channel is determined to be a non-qualified channel and there is a qualified backup data channel available for replacement.

[0121] In the illustrative embodiment, a replaceable qualified backup data channel refers to a backup data channel that is confirmed as a qualified channel by adopting the UCIe-based data link testing method of this disclosure embodiment, including the judgment process of the eye diagram inspection results in steps 201 to 204 above, and further including the backup data channel that is confirmed as a qualified channel by the bit error rate judgment process in steps 501 to 504 above.

[0122] In an illustrative embodiment, when a data channel between the local and remote cores is a non-compliant channel and there is no replaceable compliant backup data channel, the data link between the local and remote cores cannot meet the minimum requirement of the current communication rate. In this case, based on UCIe, the communication rate of the data link between the local and remote cores can be reduced. After the reduction, link training can be performed again based on the new communication rate. Alternatively, a retraining process can be performed to re-attempt whether normal communication can be achieved at the current communication rate. Therefore, in an illustrative embodiment, the UCIe-based data link testing method of this disclosure may further include: when any data channel is determined to be a non-compliant channel and there is no replaceable compliant backup data channel, performing a data link frequency reduction communication or performing a data link retraining process.

[0123] In an illustrative embodiment, the UCIe-based data link testing method of this disclosure can be executed in response to a received eye diagram test enable command. The eye diagram test enable command can be sent to the local core particle via software, causing the local core particle and the remote core particle to execute the UCIe-based data link testing method of this disclosure during the link training phase, such as in the LINKSPEED sub-state. This helps improve the flexibility of link training configuration.

[0124] In an illustrative embodiment, the eye diagram scan prior to acquiring the eye diagram test data can be performed on the local chip side. In an illustrative embodiment, the eye diagram check results include eye diagram check results indicating a pass and eye diagram check results indicating a fail. Figure 6 This is a schematic diagram illustrating the process of obtaining eye diagram examination results according to an illustrative embodiment, such as... Figure 6 As shown in the illustrative embodiment, the data link testing method based on UCIe of this disclosure further includes the following steps 601 to 604.

[0125] Step 601: In response to the received eye diagram test start command, the local chip performs an eye diagram scan and sends eye diagram test data to the remote chip through any data channel, wherein the remote chip stores a copy of the same eye diagram test data.

[0126] Step 602: The remote chip receives eye diagram test data and compares the received eye diagram test data with the copy data;

[0127] Step 603: If the received eye diagram test data is the same as the copy data, the remote core returns the passed eye diagram check result to the local core.

[0128] Step 604: If the received eye diagram test data is different from the copy data, the remote core returns an eye diagram check result that fails to pass to the local core.

[0129] In the illustrative embodiment, when the eye diagram scan is an eye height scan, the eye diagram examination result is the eye height examination result; when the eye diagram scan is an eye width scan, the eye diagram examination result is the eye width examination result.

[0130] Steps 601 to 604 above can be implemented in the LINKSPEED sub-state stage, and can be combined with the eye diagram judgment process of steps 201 to 204 to test any data channel. Furthermore, the bit error rate judgment process of steps 501 to 504 above can be combined in the LINKSPEED sub-state stage to test any data channel.

[0131] Figure 7 This is a schematic diagram of the comparison between eye diagram examination results and eye diagram threshold interval parameters in the UCIe-based data link testing method disclosed in this publication. Figure 7 In the illustrated embodiment, there are a first data channel, a second data channel, ..., an nth data channel, and a spare data channel. The eye diagram test result of the first data channel is less than the range allowed by the eye diagram threshold range parameter. The eye diagram test results of the second to nth data channels and the spare data channel are all greater than the range allowed by the eye diagram threshold range parameter. Therefore, the spare data channel replaces the first data channel for data communication.

[0132] The UCIe-based data link testing method of this disclosure selects a data channel with a sufficiently large eye opening that meets the eye diagram threshold range parameter requirements for data communication between the local and remote cores, based on the eye diagram examination results. This ensures that the selected data channel has sufficient voltage noise margin and clock skew margin, making it more tolerant and robust to signal jitter, noise, crosstalk, reflection, temperature drift, clock drift, and other factors. Combined with bit error rate assessment, this improves the reliability of data communication in the UCIe data link after link training, contributing to a stable communication rate and compatibility with relevant UCIe protocols. Furthermore, by using an eye diagram test enable command to trigger execution, the UCIe-based data link testing method of this disclosure can be implemented in software during the link training phase for both the local and remote cores, improving the flexibility of link training configuration. When a data channel is determined to be unqualified, if a qualified backup data channel is available, the unqualified channel will be replaced with a qualified backup data channel, making full use of the backup channel resources. If no qualified backup data channel is available, the data link will be down-frequency communication or the data link will be retrained, which can achieve flexible configuration according to the communication strategy requirements.

[0133] Figure 8 This is a schematic diagram of a UCIe-based data link testing device according to an illustrative embodiment, as shown below. Figure 8 As shown, the UCIe-based data link testing device mainly includes a receiving module 801, an analysis module 802, and a determination module 803. The receiving module 801, located in the local core 810, is used to acquire the eye diagram check result associated with any data channel in the data link, returned by the remote core 820. The eye diagram check result is at least one of an eye height check result based on eye height scanning and an eye width check result based on eye width scanning. The analysis module 802, located in the local core 810, is used to determine whether the eye diagram check result conforms to the allowed range of the eye diagram threshold range parameter based on the eye diagram check result and a preset eye diagram threshold range parameter. The eye diagram threshold range parameter is at least one of an eye height threshold range and an eye width threshold range. The determination module 803, located in the local core 810, is used to determine any data channel as a qualified channel if the eye diagram check result conforms to the allowed range of the eye diagram threshold range parameter; and to determine any data channel as an unqualified channel if the eye diagram check result does not conform to the allowed range of the eye diagram threshold range parameter.

[0134] In an illustrative embodiment, the UCIe-based data link testing device further includes a sending module 804, a data comparison module 805, and a result feedback module 806. The sending module 804, located in the local core 810, is used to send eye diagram test data to the remote core 820 through any data channel. The data comparison module 805, located in the remote core, is used to store a copy of the same eye diagram test data, receive the eye diagram test data, and compare the received eye diagram test data with the copy data. The result feedback module 806, located in the remote core, is used to return a passed eye diagram check result to the local core 810 if the received eye diagram test data is the same as the copy data, and to return a failed eye diagram check result to the local core 810 if the received eye diagram test data is different from the copy data.

[0135] In an illustrative embodiment, the UCIe-based data link testing apparatus further includes a parameter configuration module 807. The parameter configuration module 807 is located in the local core 810 and is used to configure eye diagram threshold range parameters.

[0136] In an illustrative embodiment, the UCIe-based data link testing device further includes a control module 808. The control module 808 is located in the local core 810 and coupled to the transmitting module 804, receiving module 801, analysis module 802, determination module 803, and parameter configuration module 807. It receives instructions and enables or disables eye diagram scanning according to the instructions. The parameter configuration module 807 configures eye diagram threshold range parameters and controls the transmitting module 804, receiving module 801, analysis module 802, and determination module 803 to enable or disable data link testing according to the instructions. In an illustrative embodiment, when the instruction is an eye diagram test enable instruction, the control module 808 enables eye diagram scanning and controls the transmitting module 804, receiving module 801, analysis module 802, and determination module 803 to enable data link testing. In an illustrative embodiment, when the instruction is an eye diagram test disable instruction, the control module 808 disables eye diagram scanning and controls the transmitting module 804, receiving module 801, analysis module 802, and determination module 803 to disable data link testing.

[0137] Regarding the UCIe-based data link testing apparatus in the above embodiments, the specific methods by which each unit performs operations have been described in detail in the embodiments related to the UCIe-based data link testing method, and will not be elaborated here.

[0138] In the illustrative embodiments, depending on the design, at least one of the receiving module 801, the analysis module 802, the determination module 803, the sending module 804, the data comparison module 805, the result feedback module 806, the parameter configuration module 807, and the control module 808 can be implemented as a combination of multiple hardware, firmware, and software (i.e., programs).

[0139] In terms of hardware, at least one of the receiving module 801, analysis module 802, determination module 803, transmission module 804, data comparison module 805, result feedback module 806, parameter configuration module 807, and control module 808 can be implemented as logic circuits on an integrated circuit. For example, the relevant functions of at least one of the receiving module 801, analysis module 802, determination module 803, transmission module 804, data comparison module 805, result feedback module 806, parameter configuration module 807, and control module 808 can be implemented in various logic blocks, modules, and circuits in one or more hardware controllers, microcontrollers, hardware processors, microprocessors, application-specific integrated circuits (ASICs), digital signal processors (DSPs), field-programmable gate arrays (FPGAs), central processing units (CPUs), or other processing units. The related functions of at least one of the receiving module 801, analysis module 802, determination module 803, sending module 804, data comparison module 805, result feedback module 806, parameter configuration module 807, and control module 808 can be implemented as hardware circuits, such as various logic blocks, modules, and circuits in integrated circuits, using hardware description languages ​​(such as Verilog HDL or VHDL) or other suitable programming languages.

[0140] In software or firmware form, the functions of at least one of the receiving module 801, analysis module 802, determination module 803, transmission module 804, data comparison module 805, result feedback module 806, parameter configuration module 807, and control module 808 can be implemented as programming codes. For example, at least one of the receiving module 801, analysis module 802, determination module 803, transmission module 804, data comparison module 805, result feedback module 806, parameter configuration module 807, and control module 808 can be implemented using general programming languages ​​(such as C, C++, or assembly language) or other suitable programming languages. The programming code can be recorded and stored in a non-transitory machine-readable storage medium. In some embodiments, the non-transitory machine-readable storage medium includes, for example, semiconductor memory and / or a storage device. Electronic devices (such as CPUs, hardware controllers, microcontrollers, hardware processors, or microprocessors) can read and execute programming code from a non-transitory machine-readable storage medium to realize at least one of the related functions of receiving module 801, analysis module 802, determination module 803, sending module 804, data comparison module 805, result feedback module 806, parameter configuration module 807, and control module 808.

[0141] In the illustrative embodiments, the UCIe-based data link testing method and UCIe-based data link testing device of this disclosure are applicable to SoC chips, etc., wherein the SoC chip can be any one of CPU (Central Processing Unit), GPU (Graphics Processing Unit), TPU (Tensor Processing Unit), NPU (Neural Network Processing Unit), DPU (Deep Learning Processing Unit), APU (Accelerated Processing Unit), and GPGPU (General-Purpose computing on Graphics Processing Unit).

[0142] In an illustrative embodiment, a chip is also provided, which includes the UCIe-based data link testing apparatus of any of the above embodiments.

[0143] This disclosure discloses a UCIe-based data link testing method, apparatus, and chip, providing a data channel selection and replacement mechanism based on signal quality assessment. Compatible with UCIe, it can identify and replace low-quality data channels in the LINKSPEED sub-state of UCIe, prioritizing the use of data channels with larger eye diagrams and higher signal quality for data transmission. This not only helps improve the available bandwidth and stability of the data link but also offers highly configurable flexibility. For example, eye diagram-based data link testing can be enabled or disabled as needed, thus better meeting the high-performance requirements of UCIe in chip interconnects. Furthermore, this disclosure can be tightly integrated with the UCIE link training process to achieve efficient link management capabilities, making it suitable for advanced chip design scenarios such as multi-data-channel parallel transmission and heterogeneous packaging architectures.

[0144] In a specific application scenario of the UCIe-based data link testing method, apparatus and chip according to the embodiments of this disclosure, it can be divided into the following three stages.

[0145] Phase 1: Test Data Transmission Phase. In this phase, according to the UCIe protocol, the local chip sends eye diagram test data to the remote chip through the test data channel, and waits for the remote chip to receive and return the eye diagram inspection results. In accordance with the UCIe protocol, in this phase, the local chip also sends test code patterns for bit error rate analysis to the remote chip through the test data channel, and waits for the remote chip to receive and return the bit error rate.

[0146] Phase Two: Data Channel Quality Judgment Phase. In this phase, the local chip determines the quality of the data channel based on the eye diagram inspection results and bit error rate returned by the remote chip, combined with the set eye diagram threshold range parameters (including eye height threshold range and eye width threshold range) and bit error rate threshold value. Data channels that simultaneously meet the requirements of eye diagram inspection results conforming to the eye diagram threshold range parameters and bit error rate conforming to the bit error rate threshold value are judged as qualified channels; otherwise, they are judged as unqualified channels.

[0147] Phase 3: Replaceable Data Channel Check Phase. In this phase, it is checked whether there is a replaceable backup data channel. If there is a replaceable backup data channel, the LTSM state machine jumps to the REPAIR state specified by UCIe to replace the channel; otherwise, the data link is slowed down.

[0148] Figure 9 This is a schematic diagram of a state machine in a specific application scenario of the UCIe-based data link testing method, apparatus, and chip according to embodiments of this disclosure, such as... Figure 9As shown, the state machine 910 includes a main state machine control module 901, a test data transmission module 902, a link quality check module 903, and a threshold configuration module 904.

[0149] The main state machine control module 901, as the core controller for communication link selection, coordinates the workflow of other modules and can deeply interact with the UCIe protocol state machine (especially the LINKSPEED sub-state). This state machine 910 includes an initialization (INIT) state, a training (TRAIN) state, an evaluation (ASSESS) state, and a switching (SWITCH) state. The initialization state initializes the link topology, the training state initiates training mode, the evaluation state triggers link quality evaluation, and the switching state performs link switching. In the evaluation state, the UCIe-based data link testing method and apparatus of this disclosure are used to test the data link. When the eye diagram check result is detected to be outside the allowed range of the eye diagram threshold range parameter, the system automatically jumps to the switching state. The test data sending module 902 is used to send test data and can employ a relevant UCIe PRBS (pseudo-random binary sequence) test data sending module 902. The link quality inspection module 903 receives test data inspection results and performs eye diagram comparison and bit error rate (BER) judgment. This module is the intelligent decision-making center for link quality assessment, responsible for managing the evaluation criteria for signal quality, performing precise diagnosis of link signal health, and achieving multi-dimensional quality assessment. The test data inspection results include eye diagram inspection results and BER. The threshold configuration module 904 can be used to configure eye diagram threshold range parameters.

[0150] Figure 10 This is a flowchart illustrating the application scenario of the link quality inspection module performing multi-dimensional link quality checks, such as... Figure 10 As shown, the process mainly includes the following steps 1001 to 1008.

[0151] Step 1001: Receive the inspection data of the current data channel from the remote core, and then execute steps 1002, 1003 and 1004.

[0152] The inspection data includes eye diagram results and bit error rate. The eye diagram results include eye height inspection results based on eye height scanning and eye width inspection results based on eye width scanning.

[0153] Step 1002: Compare the eye height test results with the eye height threshold range, and then proceed to step 1005.

[0154] Step 1003: Compare the eye width test results with the eye width threshold range, and then proceed to step 1006.

[0155] Step 1004: Compare the bit error rate with the bit error rate threshold, and then proceed to step 1007.

[0156] Step 1005: Determine whether the current data channel is a qualified channel based on the eye height comparison results, and then proceed to step 1008.

[0157] Step 1006: Determine whether the current data channel is a qualified channel based on the eye width comparison result, and then proceed to step 1008.

[0158] Step 1007: Determine whether the current data channel is a qualified channel based on the bit error rate comparison result, and then proceed to step 1008.

[0159] Step 1008: Determine whether the current data channel is a qualified channel based on the combined results of eye height comparison, eye width comparison, and bit error rate comparison.

[0160] If at least one of the eye height comparison result, eye width comparison result, and bit error rate comparison result determines the current data channel as an unqualified channel, then the current data channel is ultimately determined to be an unqualified channel. If all three of the eye height comparison result, eye width comparison result, and bit error rate comparison result determine the current data channel as a qualified channel, then the current data channel is ultimately determined to be a qualified channel.

[0161] In an illustrative embodiment, the link quality inspection module 903 can enable or disable the eye diagram judgment process in steps 1002, 1005, 1003, and 1006 according to the software configuration.

[0162] like Figure 9 As shown, the eye height check result in the eye diagram examination results can be implemented using the UCIe reference voltage scanning algorithm (Vref Training). The eye height value of each data channel originates from the reference voltage scanning algorithm in the link training stage MBTRAIN.DATATRAINVREF (main band training.data training reference voltage). The reference voltage scanning algorithm initiates a local core eye diagram scan to scan the entire reference voltage range (eye height range), and obtains the eye height check result through the data inspection circuit of the remote core. The eye width check result in the eye diagram examination results can be implemented using the UCIe phase interpolation scanning algorithm (PI SCAN). The eye width value of each data channel originates from the phase interpolation scanning algorithm in the link training stage MBTRAIN.DATATRAINCENTER1 (main band training.data training center 1). The phase interpolation scanning algorithm initiates a local core eye diagram scan to scan the entire phase interpolation (PI) range (eye width range), and obtains the eye width check result through the data inspection circuit of the remote core.

[0163] The above description is merely a preferred embodiment of this disclosure and is not intended to limit this disclosure. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this disclosure should be included within the scope of protection of this disclosure.

Claims

1. A data link testing method based on UCIe, characterized in that, include: The local core obtains the eye diagram inspection result associated with any data channel in the data link returned by the remote core, wherein the eye diagram inspection result is at least one of the eye height inspection result based on eye height scanning and the eye width inspection result based on eye width scanning; Based on the eye diagram examination results and the preset eye diagram threshold interval parameters, it is determined whether the eye diagram examination results conform to the range allowed by the eye diagram threshold interval parameters, wherein the eye diagram threshold interval parameters are at least one of the eye height threshold interval and the eye width threshold interval; If the eye diagram test result falls within the range allowed by the eye diagram threshold range parameter, any one of the data channels will be determined as a qualified channel. If the eye diagram test result does not conform to the range allowed by the eye diagram threshold range parameter, any one of the data channels will be determined as an unqualified channel.

2. The data link testing method based on UCIe according to claim 1, characterized in that, When the eye diagram examination result includes the eye height examination result, determining whether the eye diagram examination result conforms to the allowed range of the eye diagram threshold range parameter based on the eye diagram examination result and the preset eye diagram threshold range parameter includes: Compare the eye height range containing the passed eye height test results with the eye height threshold range; If the eye height test result containing the content of "passed" completely covers the eye height threshold range, the eye diagram test result is determined to be within the range allowed by the eye diagram threshold range parameter. If the eye height test result containing the passed result does not completely cover the eye height threshold range, the eye diagram test result is determined to be within the range allowed by the eye diagram threshold range parameter.

3. The data link testing method based on UCIe according to claim 1, characterized in that, When the eye diagram examination result includes the eye width examination result, determining whether the eye diagram examination result conforms to the allowed range of the eye diagram threshold range parameter based on the eye diagram examination result and the preset eye diagram threshold range parameter includes: Compare the eye width range containing the passed eye width test results with the eye width threshold range; If the eye width test result containing the content of "pass" completely covers the eye width threshold range, the eye diagram test result is determined to be within the range allowed by the eye diagram threshold range parameter. If the eye width interval of the passed eye width test result does not completely cover the eye width threshold interval, the eye diagram test result is determined to be within the range allowed by the eye diagram threshold interval parameter.

4. The data link testing method based on UCIe according to claim 1, characterized in that, The UCIe-based data link testing method also includes: Perform bit error rate analysis on any one of the data channels to obtain the bit error rate of any one of the data channels; Based on the bit error rate and the preset bit error rate threshold, determine whether the bit error rate is lower than the bit error rate threshold; If the bit error rate is lower than the bit error rate threshold, any one of the data channels will be determined as a qualified channel. If the bit error rate is not lower than the bit error rate threshold, any one of the data channels will be identified as an unqualified channel.

5. The data link testing method based on UCIe according to claim 1, characterized in that, The UCIe-based data link testing method also includes: If any one of the data channels is determined to be a non-compliant channel and there is a compliant backup data channel available for replacement, then the non-compliant data channel shall be replaced with the compliant backup data channel.

6. The data link testing method based on UCIe according to claim 1, characterized in that, The UCIe-based data link testing method also includes: If any of the data channels is determined to be a non-compliant channel and there is no compliant backup data channel available for replacement, the data link will either be down-frequency communicated or the data link will be retrained.

7. The data link testing method based on UCIe according to claim 1, characterized in that: The UCIe-based data link testing method is executed in response to a received eye diagram test enable command.

8. The data link testing method based on UCIe according to claim 1, characterized in that, The UCIe-based data link testing method also includes: In response to the received eye diagram test start command, the local core performs an eye diagram scan and sends eye diagram test data to the remote core through any one of the data channels, wherein the remote core stores a copy of the same eye diagram test data; The remote core receives the eye diagram test data and compares the received eye diagram test data with the copy data; If the received eye diagram test data is the same as the copy data, the remote core returns a passed eye diagram check result to the local core. If the received eye diagram test data is different from the copy data, the remote core returns a failed eye diagram check result to the local core.

9. The data link testing method based on UCIe according to claim 8, characterized in that: When the eye diagram scan is an eye height scan, the eye diagram inspection result is the eye height inspection result; when the eye diagram scan is an eye width scan, the eye diagram inspection result is the eye width inspection result.

10. A data link testing device based on UCIe, characterized in that, include: The receiving module, located in the local core, is used to obtain the eye diagram inspection result returned by the remote core and associated with any data channel in the data link. The eye diagram inspection result is at least one of the eye height inspection result based on eye height scanning and the eye width inspection result based on eye width scanning. An analysis module, located in the local chip, is used to determine whether the eye diagram examination result conforms to the range allowed by the eye diagram threshold range parameter based on the eye diagram examination result and the preset eye diagram threshold range parameter, wherein the eye diagram threshold range parameter is at least one of the eye height threshold range and the eye width threshold range; The determination module, located in the local core, is used to determine any one of the data channels as a qualified channel when the eye diagram inspection result falls within the range allowed by the eye diagram threshold range parameter; and to determine any one of the data channels as an unqualified channel when the eye diagram inspection result does not fall within the range allowed by the eye diagram threshold range parameter.

11. The data link testing device based on UCIe according to claim 10, characterized in that, The UCIe-based data link testing device also includes: A transmitting module, located in the local chip, is used to send eye diagram test data to the remote chip through any one of the data channels; The data comparison module, located in the remote core, is used to store a copy of the same data as the eye diagram test data, receive the eye diagram test data, and compare the received eye diagram test data with the copy data. The result feedback module, located in the remote core, is used to return an eye diagram check result indicating that the received eye diagram test data is the same as the copy data to the local core, and to return an eye diagram check result indicating that the received eye diagram test data is different from the copy data to the local core.

12. The data link testing device based on UCIe according to claim 10, characterized in that, The UCIe-based data link testing device also includes: The parameter configuration module, located in the local core, is used to configure the eye diagram threshold range parameters.

13. The data link testing device based on UCIe according to claim 11, characterized in that, The UCIe-based data link testing device also includes: The control module, located in the local chip and coupled to the transmitting module, the receiving module, the analysis module, and the determining module, is used to receive instructions and enable or disable eye diagram scanning according to the instructions, and to control the transmitting module, the receiving module, the analysis module, and the determining module to enable or disable data link testing according to the instructions.

14. A chip, characterized in that, Includes the UCIe-based data link testing apparatus as described in any one of claims 10 to 13.

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