Non-contact electric power parameter measurement method, system and device and storage medium

Abstract

The invention discloses a non-contact electric power parameter measurement method, system and device, and a storage medium. The method comprises the steps of obtaining a first output voltage signal and a second output voltage signal generated by induction of a space electric field around a to-be-measured wire; establishing an equation set of a to-be-measured voltage phasor based on the first output voltage signal and the second output voltage signal, and solving the equation set of the to-be-measured voltage phasor to obtain a parameter of the to-be-measured voltage; acquiring a magnetic field measurement signal generated by a space magnetic field around the to-be-measured wire; and establishing an equation set of the current to be measured according to the magnetic field measurement signal, and solving the equation set of the current to be measured to obtain parameters of the current to be measured, thereby effectively solving the problem that the gain and the phase shift are unknown after the probe is connected.

Description

Technical Field

[0001] This invention relates to the field of power system measurement technology, and in particular to a non-contact power parameter measurement method, system, device and storage medium. Background Technology

[0002] With the large-scale integration of high-proportion renewable energy into the power system, the complexity and dynamism of power grid operation have significantly increased, placing higher demands on the real-time synchronous measurement of voltage and current. Traditional contact-based measurement equipment suffers from problems such as complex installation, high cost, and insulation risks, making it difficult to meet the flexible deployment needs of distributed renewable energy power plants. Non-contact measurement methods, with their advantages of flexible deployment, safety, and low cost, provide a foundation for the massive deployment of measurement devices in renewable energy areas. However, existing non-contact measurement systems have the following key problems: In voltage measurement, existing capacitive coupling-based methods have difficulty tracing the gain and phase shift after the probe is connected to the sampling circuit, resulting in inaccurate calculation of voltage amplitude and phase angle. The insulation layer of medium and low voltage lines hinders the propagation of the electric field, further increasing the measurement difficulty. In current measurement, magnetic field-based current measurement methods (such as Hall effect and magnetoresistive sensors) are highly dependent on the relative position information of the sensor and the conductor and the alignment of the sensitive direction, which is difficult to guarantee accurately in actual installation. Moreover, deviations in the manufacturing process of the sensor array can lead to increased errors. At the same time, existing non-contact measurement devices still have shortcomings in hardware integration, miniaturization, and anti-interference capabilities, making it difficult to meet the high-precision and stable measurement requirements in complex field environments.

[0003] Therefore, there is an urgent need to develop a non-contact voltage and current measurement method that is traceable in terms of gain and phase shift, has low position dependence, strong anti-interference ability, and is easy to integrate. Summary of the Invention

[0004] In view of the aforementioned existing problems, the present invention is proposed.

[0005] This invention provides a non-contact method, system, device, and storage medium for measuring electrical parameters, which solves the problems of difficulty in tracing voltage measurement gain phase shift, reliance on location information for current measurement, and insufficient device integration and accuracy in the prior art.

[0006] To solve the above-mentioned technical problems, the present invention provides the following technical solution:

[0007] In a first aspect, the present invention provides a non-contact method for measuring electrical parameters, comprising:

[0008] Acquire the first and second output voltage signals generated by the electric field induction around the conductor under test;

[0009] Based on the first output voltage signal and the second output voltage signal, establish a set of equations for the phasor of the voltage to be measured, solve the set of equations for the phasor of the voltage to be measured, and obtain the parameters of the voltage to be measured.

[0010] Acquire the magnetic field measurement signal generated by the spatial magnetic field around the conductor under test;

[0011] Based on the magnetic field measurement signal, establish a set of equations for the current to be measured, solve the set of equations for the current to be measured, and obtain the parameters of the current to be measured.

[0012] As a preferred embodiment of the non-contact power parameter measurement method of the present invention, solving the equation set of the voltage phasor to be measured includes:

[0013] Based on the capacitive coupling principle and the equivalent circuit model of the probe, a set of equations is established that includes the phasor of the voltage to be measured and the phasor of the probe output voltage.

[0014] The equations of the voltage phasor are solved using the first solution method to obtain the real and imaginary parts of the voltage phasor to be measured.

[0015] The amplitude and phase of the voltage to be measured are calculated based on the real and imaginary parts of the phasor of the voltage to be measured.

[0016] The beneficial effects of this preferred technical solution are that by solving the system of equations, the amplitude and phase of the voltage to be measured can be accurately calculated, which effectively solves the problem of difficulty in tracing voltage measurement gain and phase shift in the prior art, and improves measurement accuracy and reliability.

[0017] As a preferred embodiment of the non-contact power parameter measurement method of the present invention, it further includes:

[0018] Calculate the exponentially weighted moving average of the output voltage and input voltage scaling factor within the sliding time window;

[0019] The scaling factor calculated at the current moment is compared with the exponentially weighted moving average to obtain the scaling deviation.

[0020] The proportional deviation is judged. If the proportional deviation is greater than the first threshold, the current amplitude is calibrated by the exponentially weighted moving average.

[0021] The beneficial effect of this preferred technical solution is that, through dynamic calibration, measurement errors are corrected in real time, significantly improving measurement accuracy and stability.

[0022] In a preferred embodiment of the non-contact power parameter measurement method of the present invention, solving the equations for the current to be measured includes:

[0023] Based on the law of electromagnetic induction and the spatial geometric relationship of the sensor array, a set of equations is established between the current to be measured and multiple magnetic field measurement signals.

[0024] The second solution method is used to solve the system of equations to obtain the amplitude of the current to be measured;

[0025] The amplitude of the current to be measured is determined based on the output voltage phase of at least one preset magnetic sensor in the sensor array.

[0026] The beneficial effects of this preferred technical solution are that by solving the equation system and determining the phase, the dependence of current measurement on sensor position is effectively reduced, thereby improving measurement accuracy and reliability.

[0027] As a preferred embodiment of the non-contact power parameter measurement method of the present invention, it further includes:

[0028] Using known input current calibration data, the compensation parameters for each magnetic sensor are obtained through optimization algorithm fitting.

[0029] The measured magnetic field strength is compensated using compensation parameters, and the compensated measured magnetic field strength is used to solve for the amplitude of the current to be measured.

[0030] Secondly, the present invention provides a non-contact power parameter measurement system, comprising:

[0031] The voltage measurement module is used for two dual semi-cylindrical capacitively coupled probes with different structural parameters, as well as signal conditioning and sampling circuits connected to the probe outputs;

[0032] The current measurement module is used for a linear array integrated on a printed circuit board. The linear array consists of at least four tunnel magnetoresistive chips with the same sensing direction, the spacing between adjacent chips is fixed, and signal conditioning and sampling circuits connecting the output of each tunnel magnetoresistive chip.

[0033] The device housing is used to encapsulate and protect the voltage measurement module and the current measurement module.

[0034] As a preferred embodiment of the non-contact power parameter measurement system described in this invention, the dual semi-cylindrical capacitive coupling probe includes:

[0035] The insulating support layer of the capacitive coupling probe is made of epoxy resin material through three-dimensional printing, and the inner and outer metal electrodes are made of copper foil.

[0036] As a preferred embodiment of the non-contact power parameter measurement system of the present invention, it further includes:

[0037] The dual semi-cylindrical capacitive coupling probe is used for sensing electric fields. It consists of an inner metal electrode, an insulating support layer that wraps around the inner electrode, and an outer metal electrode that wraps around the insulating layer and is grounded and shielded.

[0038] Thirdly, the present invention provides a computer device, including a memory and a processor, wherein the memory stores a computer program, characterized in that the processor executes the computer program to implement the steps of the non-contact power parameter measurement method.

[0039] Fourthly, the present invention provides a computer-readable storage medium having a computer program stored thereon, characterized in that the computer program, when executed by a processor, implements the steps of the non-contact power parameter measurement method.

[0040] Compared with existing technologies, the advantages of this invention are as follows: This invention addresses the problems of difficulty in tracing voltage gain phase shift, reliance on location information for current measurement, and insufficient device integration and accuracy in existing non-contact power parameter measurement methods. It proposes a non-contact power parameter measurement method. By establishing an equation system using a dual-probe structure, the voltage amplitude and phase are solved in reverse, and dynamic calibration is used to improve accuracy. Current measurement utilizes the spatial redundancy of the TMR linear array, combined with a position-attitude compensation algorithm to correct manufacturing and installation deviations. This invention improves measurement accuracy and anti-interference capability, has high device integration, is suitable for high-precision measurement in complex field environments, and meets the flexible deployment requirements of new energy areas. Attached Figure Description

[0041] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the following description of the embodiments will be briefly introduced. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0042] Figure 1 A schematic diagram of the overall process logic of a non-contact power parameter measurement method provided in one embodiment of the present invention;

[0043] Figure 2 A schematic diagram of the internal structure of a double-layer semi-cylindrical capacitive coupling probe for a non-contact power parameter measurement method provided in an embodiment of the present invention;

[0044] Figure 3 A schematic diagram of the external structure of a double-layer semi-cylindrical capacitive coupling probe for a non-contact power parameter measurement method according to an embodiment of the present invention;

[0045] Figure 4This is a schematic diagram of the PCB design of a linear array of TMR magnetoresistive sensors for a non-contact power parameter measurement method according to an embodiment of the present invention. Detailed Implementation

[0046] To make the above-mentioned objects, features, and advantages of the present invention more apparent and understandable, specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0047] Example 1, referring to Figures 1-4 As an embodiment of the present invention, a non-contact electrical parameter measurement method is provided, comprising:

[0048] S100: Acquire the first and second output voltage signals generated by the electric field induction around the conductor under test;

[0049] Specifically, the system acquires spatial electric field information around the conductor under test in a power line. It uses two double-layer semi-cylindrical capacitive coupling probes with different structural parameters to sense the electric field around the conductor under test and output the corresponding first and second output voltage signals.

[0050] The first output voltage signal is generated by the first double-layer semi-cylindrical capacitive coupling probe sensing the electric field around the wire under test, reflecting the electric field coupling between probe 1 and the wire.

[0051] The second output voltage signal is generated by the second double-layer semi-cylindrical capacitive coupling probe sensing the electric field around the conductor under test, reflecting the electric field coupling between probe 2 and the conductor.

[0052] S200: Based on the first output voltage signal and the second output voltage signal, establish a set of equations for the phasor of the voltage to be measured, solve the set of equations for the phasor of the voltage to be measured, and obtain the parameters of the voltage to be measured;

[0053] S300: Acquire the magnetic field measurement signal generated by the spatial magnetic field around the conductor under test;

[0054] Specifically, to obtain information about the spatial magnetic field around the conductor under test in a power line, a linear array of at least four tunnel magnetoresistive (TMR) chips arranged along the same straight line and with the same sensitive direction is used to sense the projection of the magnetic field strength around the conductor under test in the sensitive direction.

[0055] S400: Establish a set of equations for the current to be measured based on the magnetic field measurement signal, solve the set of equations for the current to be measured, and obtain the parameters of the current to be measured.

[0056] It should be noted that by acquiring the electric field signal using a double-layer semi-cylindrical capacitive coupling probe and establishing a system of equations using the output signals from two probes with different structures, the problem of difficulty in tracing gain and phase shift in voltage measurement is solved, thus improving the accuracy of voltage measurement. Simultaneously, a linear array of TMR chips is used to acquire the magnetic field signal, and the current parameters are solved through the system of equations, reducing the dependence on sensor position and improving the accuracy and reliability of current measurement. Overall, this improves the accuracy and stability of non-contact power parameter measurement, making it suitable for complex field environments.

[0057] In this embodiment of the invention, step S200 includes the following sub-steps A1-A3;

[0058] In A1: Based on the capacitive coupling principle and the equivalent circuit model of the probe, a set of equations is established that includes the phasor of the voltage to be measured and the phasor of the probe output voltage.

[0059] In A2: The first solution method is used to solve the equations of the voltage phasor to obtain the real and imaginary parts of the voltage phasor to be measured;

[0060] In A3: The amplitude and phase of the voltage to be measured are calculated based on the real and imaginary parts of the phasor of the voltage to be measured.

[0061] In an optional embodiment, the first solution method can be the matrix inversion method, which expresses the complex equation system based on the probe equivalent model as a standard matrix form. The coefficient matrix is ​​determined by the structural parameters of the two probes, and the constant vector is composed of the real and imaginary parts of the output voltage signals of the two probes. The vector to be solved is the real and imaginary parts of the voltage to be measured. By calculating the inverse matrix of the coefficient matrix, the phasor of the voltage to be measured can be directly solved.

[0062] In another optional embodiment, the first solution method can also be a numerical iteration method. When the probe parameters or environmental factors cause the equation system to be ill-conditioned or close to singular, the numerical iteration method is adopted. Starting from an initial estimate, the values ​​of the real part and imaginary part of the voltage to be measured are continuously updated through the iterative formula until the difference between the two iteration results is less than the preset tolerance, which means that it is considered to have converged to the solution of the equation system.

[0063] In this embodiment of the invention, the first solution method includes the dual-probe capacitive coupling reverse solution method;

[0064] Specifically, based on the capacitive coupling principle and the equivalent circuit model of the probe, a system of equations is established, including the phasor of the voltage to be measured and the phasors of the output voltages of the two probes. By solving the system of equations, the amplitude and phase of the voltage to be measured are calculated in reverse. The solution is expressed as:

[0065]

[0066] in, The imaginary part of the voltage phasor to be measured. Let be the real part of the voltage phasor to be measured. The voltage phasor output by probe 1. The voltage phasor output by probe 2. The voltage phase across the inner capacitor of probe 1. The voltage phase across the inner capacitor of probe 2. The voltage phasor to be measured is denoted as .

[0067] The phase of the voltage across the inner capacitor of the probe is related to the phase of the probe's output current, expressed as:

[0068]

[0069] The amplitude and phase are then calculated and expressed as follows:

[0070]

[0071] Where Im{·} is the imaginary part, Re{·} is the real part, and U i For amplitude, For phase, The voltage phase across the inner capacitor of probe 1. Let be the voltage phase across the inner capacitor of probe 2, tan be the tangent function, and arctan be the arctangent function.

[0072] It should be noted that by establishing a system of equations and solving them in reverse, the amplitude and phase of the voltage under test can be accurately calculated. Utilizing the independent output voltage signal of the dual-probe structure effectively solves the problem of difficulty in tracing voltage measurement gain and phase shift in traditional methods, significantly improving the accuracy and reliability of voltage measurement.

[0073] In this embodiment of the invention, after completing steps A1-A3, step S200 also includes steps A4-A6;

[0074] In A4: Calculate the exponentially weighted moving average of the output voltage and input voltage scaling factor within the sliding time window;

[0075] In A5: The scaling factor calculated at the current moment is compared with the exponentially weighted moving average to obtain the scaling deviation;

[0076] In A6: The proportional deviation is judged. If the proportional deviation is greater than the first threshold, the current amplitude is calibrated first using the exponentially weighted moving average.

[0077] In one optional embodiment, the first calibration can be a progressive weighted calibration method, which weights and fuses the current calculated value with the historical reference value. The greater the deviation, the higher the weight of the historical reference value. By defining a weight function related to the deviation, the calibrated amplitude can be obtained.

[0078] In another optional embodiment, the first calibration can also be a parameter correction calibration. When the judgment deviation exceeds the threshold, it is considered that the current measurement model has drifted due to environmental factors. The exponentially weighted moving average reference value is regarded as a more reliable benchmark. The correction amount of the model parameters is calculated in reverse, and the current and subsequent voltage amplitudes are recalculated using the corrected model parameters.

[0079] In this embodiment of the invention, the first calibration includes using an exponentially weighted moving average;

[0080] Specifically, calculate the ratio of the average value of the probe output voltage at the current moment to the calculated value of the voltage to be measured;

[0081] Within the sliding time window, the proportion mean after removing outliers is calculated, and then an exponentially weighted moving average is obtained.

[0082] The scaling factor calculated at the current moment is compared with the exponentially weighted moving average to calculate the scaling deviation.

[0083] If the proportional deviation exceeds a preset threshold, the current amplitude calculation result is calibrated using an exponentially weighted moving average, as shown below:

[0084]

[0085] Where ΔR is the proportional deviation, ε is the first threshold, and U i (t) represents the current amplitude, U o (t) represents the average output voltage of the two probes, H(·) is the step function, and R ewma (t) is the exponentially weighted moving average.

[0086] For example, two capacitive probes synchronously acquire the output voltage. and Process the sampled data (e.g., filter) and calculate the voltage phasor within the current data window. and The phasor U of the voltage to be measured is solved based on the equivalent model of the probe and the formula. i .

[0087] The ratio of the current average output voltage to the input voltage is calculated and expressed as:

[0088]

[0089] Within a sliding time window (e.g., N periods), the mean proportion after outlier removal is calculated and then subjected to an exponentially weighted moving average. The proportion deviation is expressed as:

[0090]

[0091] If ΔR > ε (ε can be 5%, 7%, or 10%), then use Correct the amplitude result.

[0092] It should be noted that dynamic calibration using an exponentially weighted moving average allows for real-time monitoring and correction of errors during the measurement process. When the proportional deviation exceeds a preset threshold, the current amplitude is calibrated using the exponentially weighted moving average, effectively improving the stability and accuracy of the measurement and enhancing the system's anti-interference capability.

[0093] In this embodiment of the invention, step S400 includes the following sub-steps B1-B3;

[0094] In B1: Based on the law of electromagnetic induction and the spatial geometric relationship of the sensor array, a set of equations is established between the current to be measured and multiple magnetic field measurement signals;

[0095] In B2: The second solution method is used to solve the system of equations to obtain the amplitude of the current to be measured;

[0096] In B3: The amplitude of the current to be measured is determined based on the output voltage phase of at least one preset magnetic sensor in the sensor array.

[0097] In one optional embodiment, the second solution method can be a magnetic field distribution fitting method, which uses magnetic field strength values ​​measured by multiple TMR chips to fit a magnetic field distribution model of the space surrounding the conductor. According to the Biot-Savart law, the magnetic field strength around an infinitely long straight conductor is directly proportional to the current and inversely proportional to the distance. By fitting the magnetic field strength data from multiple measuring points to the theoretical magnetic field distribution model, the amplitude of the current to be measured can be directly derived.

[0098] In another alternative embodiment, the second solution method can be a weighted fusion-based solution method. Based on the relative position of each TMR chip and the wire, an estimated current value is calculated individually using Ampere's circuital law. Since the degree of interference and sensitivity of sensors at different locations vary, the reliability of each estimated value also differs. A weight is assigned to each sensor based on its reliability, and the current estimates from all sensors are weighted and averaged to obtain the final measured current amplitude.

[0099] In this embodiment of the invention, the second solution method includes establishing and solving a system of equations based on Ampere's circuital law;

[0100] Specifically, the projection H of the magnetic field strength around the conductor under test in the sensitive direction. mi (i = 1, 2, 3, 4), based on Ampere's circuital law and array geometry, a system is established that includes the amplitude of the current to be measured and the position coordinates of each TMR chip, and the measurement magnetic field H. mi The system of equations. Using the known chip spacing and synchronous sampling, H is obtained. mi The amplitude of the current to be measured is solved in reverse.

[0101] The phase of the current to be measured is determined by the phase of the output voltage of the TMR chip closest to the wire (calibrated with microsecond hysteresis).

[0102] It should be noted that by establishing a system of equations using Ampere's circuital law to solve for the current amplitude, and combining this with the magnetic field measurement data from the TMR chip, the dependence on sensor position accuracy is effectively reduced, significantly improving the accuracy and reliability of current measurement, while also simplifying the installation and debugging process.

[0103] In this embodiment of the invention, after completing steps B1-B3, step S400 further includes steps B4-B5;

[0104] In B4: Using the known input current calibration data, the compensation parameters of each magnetic sensor are obtained by fitting through an optimization algorithm;

[0105] In B5: The measured magnetic field strength is compensated using compensation parameters, and the compensated measured magnetic field strength is used to solve for the amplitude of the current to be measured.

[0106] In one alternative embodiment, the optimization algorithm can be the Gauss-Newton method, which is based on Ampere's circuital law. It establishes a theoretical relationship model between the magnetic field measurement value of each TMR chip and the current to be measured, constructs a least squares objective function, initializes the compensation coefficient (usually set to 0), calculates the gradient of the objective function under the current parameters, solves the linear equation system, updates the compensation coefficient, and repeats the steps until convergence.

[0107] In another alternative embodiment, the optimization algorithm can also be a particle swarm optimization algorithm, which combines the compensation parameters of each sensor into a multi-dimensional particle, defines a reasonable search range for the parameters, randomly generates a group of particles, defines a fitness function, evaluates the fitness value of each particle, updates the individual optimal position and the global optimal position of the group of each particle, adjusts the flight direction and speed of each particle according to the PSO velocity update formula, updates the particle position, and repeats until the conditions are met.

[0108] In this embodiment of the invention, the optimization algorithm includes a Levenberg-Marquardt (LM) nonlinear least squares algorithm;

[0109] Specifically, using a set of known input current calibration data, the position compensation coefficient and angle compensation coefficient of each TMR chip are fitted to compensate for the measured magnetic field strength, expressed as follows:

[0110]

[0111] Where, α i β is the position compensation coefficient. i H is the angle compensation coefficient. ci The compensated magnetic field strength is given by I, where I is the amplitude of the current to be measured, and r is the magnetic field strength. i Let be the distance from the i-th TMR chip to the wire.

[0112] For example, four TMR chips synchronously acquire the output voltage. Based on the TMR sensitivity coefficient, the output voltage is converted into a magnetic field strength projection. According to the array geometry and Ampere's circuital law, a system of equations is established to solve for the amplitude of the current to be measured. The output voltage phase of the TMR chip closest to the conductor (e.g., chip 3) is taken as the phase reference for the current to be measured (a fixed time-delay compensation calibration needs to be performed during system calibration). After the device leaves the factory or is installed, a calibration is performed: input a set of standard power frequency currents with known amplitudes and phases. Record the corresponding H... mij For each chip, the objective function minimized using the LM algorithm is expressed as:

[0113]

[0114] The optimal compensation coefficient was obtained by fitting. and The storage compensation coefficient is expressed as:

[0115]

[0116] In subsequent actual measurements, the original magnetic field measurements were compensated for: Using the compensated H ci Substitute the values ​​into the system of equations to solve for the current amplitude.

[0117] It should be noted that by fitting the compensation coefficient using the LM algorithm, the measured magnetic field strength is accurately compensated, which effectively corrects the manufacturing and installation deviations of the TMR chip, significantly improves the accuracy and stability of current measurement, enhances the device's anti-interference capability and adaptability, and makes it more suitable for high-precision measurement needs in complex field environments.

[0118] The above is a schematic scheme of a non-contact power parameter measurement method according to this embodiment. It should be noted that the technical solution of this non-contact power parameter measurement system and the technical solution of the above-described non-contact power parameter measurement method belong to the same concept. For details not described in detail in the technical solution of the non-contact power parameter measurement system in this embodiment, please refer to the description of the technical solution of the above-described non-contact power parameter measurement method.

[0119] The non-contact power parameter measurement system in this embodiment includes:

[0120] The voltage measurement module is used for two dual semi-cylindrical capacitively coupled probes with different structural parameters, as well as signal conditioning and sampling circuits connected to the probe outputs;

[0121] The current measurement module is used for a linear array integrated on a printed circuit board. The linear array consists of at least four tunnel magnetoresistive chips with the same sensing direction, the spacing between adjacent chips is fixed, and signal conditioning and sampling circuits connecting the output of each tunnel magnetoresistive chip.

[0122] The device housing is used to encapsulate and protect the voltage measurement module and the current measurement module.

[0123] In this embodiment of the invention, the insulating support layer of the capacitive coupling probe is made of epoxy resin material through three-dimensional printing, and the inner and outer metal electrodes are copper foil.

[0124] The dual semi-cylindrical capacitive coupling probe is used for sensing electric fields. It consists of an inner metal electrode, an insulating support layer that wraps around the inner electrode, and an outer metal electrode that wraps around the insulating layer and is grounded and shielded.

[0125] Specifically, such as Figure 2 , Figure 3 As shown, an epoxy resin insulating support layer is fabricated using 3D printing technology. Both the inner sensing electrode and the outer shielding electrode are made of copper foil bonded to the inner and outer surfaces of the insulating layer. The probe is designed as a closable semi-cylindrical structure, facilitating the tight wrapping of insulated wires of different diameters. The probe output line is connected to the sampling circuit. The outer layer capacitance is typically in the tens of picofarads (pF) range.

[0126] like Figure 4 As shown, the TMR2901 chip is selected. Four chips are arranged in a straight line on the PCB, with adjacent spacing of 10mm, 20mm, and 30mm respectively. Ensure that the sensitive directions of all chips (as determined by the datasheet) are parallel. The PCB design includes the necessary signal conditioning circuitry and interfaces.

[0127] The capacitance probe is connected to the processing module via a cable. The TMR array PCB is connected to the processing module via an interface. All modules are mounted in a custom housing, which may be lined with a metal layer to provide electromagnetic shielding.

[0128] This embodiment also provides a computer device suitable for non-contact electrical parameter measurement, including:

[0129] The system includes a memory and a processor. The memory stores computer-executable instructions, and the processor executes these instructions to implement a non-contact power parameter measurement method as described in the above embodiments.

[0130] This embodiment also provides a storage medium storing a computer program that, when executed by a processor, implements a non-contact power parameter measurement method as proposed in the above embodiments.

[0131] The storage medium proposed in this embodiment belongs to the same inventive concept as the non-contact power parameter measurement method proposed in the above embodiments. Technical details not described in detail in this embodiment can be found in the above embodiments, and this embodiment has the same beneficial effects as the above embodiments.

[0132] Based on the above description of the implementation methods, those skilled in the art can clearly understand that the present invention can be implemented using software and necessary general-purpose hardware, and of course, it can also be implemented using hardware. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as a computer floppy disk, read-only memory (ROM), random access memory (RAM), flash memory, hard disk, or optical disk, etc., including several instructions to cause a computing device (which may be a personal computer, server, or network device, etc.) to execute the methods of the various embodiments of the present invention.

[0133] Example 2, referring to Tables 1-2, differs from the first example and provides a verification test of a non-contact power parameter measurement method, verifying and explaining the technical effects used in this method.

[0134] The method of the present invention was simulated and tested using an AC voltage of 220V and a current of 10A as an example. The specific parameters are shown in Table 1 and Table 2.

[0135] Table 1 Voltage Measurement Simulation Circuit Parameters

[0136]

[0137] Table 2. Coordinates of the TMR chip location for current measurement.

[0138]

[0139] As shown in Tables 1 and 2, for power frequency steady-state voltage measurement: amplitude error ≤ 1.5%, phase error ≤ 2°; for power frequency steady-state current measurement: amplitude error ≤ 2%, phase error ≤ 0.2°.

[0140] Therefore, the present invention has stable measurement capabilities in a laboratory environment.

[0141] It should be noted that, in voltage measurement, this invention solves the problem that existing methods have difficulty tracing the gain and phase shift after the probe is connected to the sampling circuit, resulting in the inability to accurately calculate the voltage amplitude and phase angle; in current measurement, it overcomes the problem of high dependence on the relative position information of the sensor and the wire and the sensitive direction; at the same time, it improves the hardware integration and anti-interference capability, meeting the high-precision and stable measurement requirements in complex field environments.

[0142] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention, and all such modifications or substitutions should be covered within the scope of the claims of the present invention.

Claims

1. A non-contact method for measuring electrical parameters, characterized in that, include: Acquire the first and second output voltage signals generated by the electric field induction around the conductor under test; Based on the first output voltage signal and the second output voltage signal, establish a set of equations for the phasor of the voltage to be measured, solve the set of equations for the phasor of the voltage to be measured, and obtain the parameters of the voltage to be measured. Acquire the magnetic field measurement signal generated by the spatial magnetic field around the conductor under test; Based on the magnetic field measurement signal, establish a set of equations for the current to be measured, solve the set of equations for the current to be measured, and obtain the parameters of the current to be measured.

2. The non-contact electrical parameter measurement method as described in claim 1, characterized in that, Solving the equations for the phasor of the voltage to be measured includes: Based on the capacitive coupling principle and the equivalent circuit model of the probe, a set of equations is established that includes the phasor of the voltage to be measured and the phasor of the probe output voltage. The equations of the voltage phasor are solved using the first solution method to obtain the real and imaginary parts of the voltage phasor to be measured. The amplitude and phase of the voltage to be measured are calculated based on the real and imaginary parts of the phasor of the voltage to be measured.

3. The non-contact electrical parameter measurement method as described in claim 2, characterized in that, Also includes: Calculate the exponentially weighted moving average of the output voltage and input voltage scaling factor within the sliding time window; The scaling factor calculated at the current moment is compared with the exponentially weighted moving average to obtain the scaling deviation. The proportional deviation is judged. If the proportional deviation is greater than the first threshold, the current amplitude is calibrated by the exponentially weighted moving average.

4. The non-contact electrical parameter measurement method as described in claim 3, characterized in that, Solving the equations for the current to be measured includes: Based on the law of electromagnetic induction and the spatial geometric relationship of the sensor array, a set of equations is established between the current to be measured and multiple magnetic field measurement signals. The second solution method is used to solve the system of equations to obtain the amplitude of the current to be measured; The amplitude of the current to be measured is determined based on the output voltage phase of at least one preset magnetic sensor in the sensor array.

5. The non-contact electrical parameter measurement method as described in claim 4, characterized in that, Also includes: Using known input current calibration data, the compensation parameters for each magnetic sensor are obtained through optimization algorithm fitting. The measured magnetic field strength is compensated using compensation parameters, and the compensated measured magnetic field strength is used to solve for the amplitude of the current to be measured.

6. A non-contact power parameter measurement system, employing the non-contact power parameter measurement method as described in any one of claims 1-5, characterized in that, include: The voltage measurement module is used for two dual semi-cylindrical capacitively coupled probes with different structural parameters, as well as signal conditioning and sampling circuits connected to the probe outputs; The current measurement module is used for a linear array integrated on a printed circuit board. The linear array consists of at least four tunnel magnetoresistive chips with the same sensing direction, the spacing between adjacent chips is fixed, and signal conditioning and sampling circuits connecting the output of each tunnel magnetoresistive chip. The device housing is used to encapsulate and protect the voltage measurement module and the current measurement module.

7. A non-contact power parameter measurement system as described in claim 6, characterized in that, The dual semi-cylindrical capacitive coupling probe includes: The insulating support layer of the capacitive coupling probe is made of epoxy resin material through three-dimensional printing, and the inner and outer metal electrodes are made of copper foil.

8. A non-contact power parameter measurement system as described in claim 6, characterized in that, Also includes: The dual semi-cylindrical capacitive coupling probe is used for sensing electric fields. It consists of an inner metal electrode, an insulating support layer that wraps around the inner electrode, and an outer metal electrode that wraps around the insulating layer and is grounded and shielded.

9. A computer device, characterized in that, include: A memory and a processor, the memory storing a computer program, the processor executing the computer program to implement the steps of a non-contact power parameter measurement method according to any one of claims 1 to 5.

10. A computer-readable storage medium, characterized in that, It stores a computer program, which, when executed by a processor, implements the steps of a non-contact power parameter measurement method according to any one of claims 1 to 5.

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