Method for determining temperature and time of high-temperature annealing test of irradiated material

Abstract

The embodiment of the invention relates to the field of nuclear reactor device testing, in particular to a method for determining the temperature and time of a high-temperature annealing test of an irradiated material. According to the method, by determining first microdefect information of a material, specific characteristics of microdefects of the material after irradiation can be recognized, the irradiation damage state is quantified, first hardening information is determined accordingly, and correlation between the microdefects of the material and macroscopic performance is established; by determining second microdefect information under different temperature and time conditions, microdefect long-time evolution simulation under different high-temperature annealing conditions can be realized, test trials and errors are reduced, and selection of annealing conditions is optimized; according to the first hardening information and the second hardening information, the annealing temperature and time of material performance recovery can be determined, the number of times of actual annealing tests is further reduced, the test trial and error cost is saved, and the expected test effect is obtained more efficiently.

Description

Technical Field

[0001] Embodiments of this application relate to the field of nuclear reactor device testing, and in particular to a method for determining the temperature and time for high-temperature annealing tests on irradiated materials. Background Technology

[0002] The statements herein are provided merely as background information in connection with this application and do not necessarily constitute prior art.

[0003] During operation, nuclear reactor structural materials are continuously bombarded by high-energy neutrons and other particles. These high-energy particles collide with the crystal lattice structure of the material's atoms, ejecting atoms from their normal positions and creating numerous point defects. These point defects migrate and accumulate within the material, evolving into more complex microscopic defect structures. This alteration of the microstructure caused by radiation damage leads to the degradation of the material's macroscopic properties. Therefore, to prevent material performance degradation from affecting the safe operation of the reactor, it is necessary to conduct radiation damage studies on reactor structural materials. Summary of the Invention

[0004] A brief overview of this application is provided below to offer a basic understanding of certain aspects thereof. It should be understood that this overview is not an exhaustive summary of the application. It is not intended to identify key or essential parts of the application, nor is it intended to limit its scope. Its purpose is merely to present certain concepts in a simplified form as a prelude to the more detailed description that follows.

[0005] An embodiment of this application provides a method for determining the temperature and time of a high-temperature annealing test for an irradiated material, comprising the following steps: S10: determining the irradiation parameters of the irradiation process and the intrinsic parameters of the material; S20: determining, based on the irradiation parameters and intrinsic parameters, the first microscopic defect information of the material after reaching the target irradiation dose under the irradiation conditions of the irradiation parameters; S30: determining, based on the first microscopic defect information, the first hardening information of the material after irradiation; S40: determining, based on the intrinsic parameters and the first microscopic defect information, the second microscopic defect information under different annealing temperatures and different annealing times; S50: obtaining, based on the second microscopic defect information, the second hardening information after annealing; S60: determining, based on the first hardening information and the second hardening information, the temperature and time of the high-temperature annealing test for the irradiated material.

[0006] The method for determining the temperature and time for high-temperature annealing tests on irradiated materials provided in this application identifies the specific characteristics of micro-defects in the irradiated material by determining the first micro-defect information, quantifies the irradiation damage state, and thereby determines the first hardening information, establishing a correlation between the material's micro-defects and macroscopic properties. By combining the material's intrinsic parameters and the first micro-defect information to determine the second micro-defect information under different temperature and time conditions, it enables long-term simulation of the evolution of micro-defects under different high-temperature annealing conditions, reducing experimental trial and error and optimizing the selection of annealing conditions. Based on the first and second hardening information, the annealing temperature and time for material performance recovery can be determined, further reducing the number of actual annealing tests and improving efficiency. The method provided in this application helps to understand the physical behavior of micro-defects in materials under neutron irradiation during high-temperature annealing, saves the cost of experimental trial and error, and obtains the expected experimental results more efficiently. Attached Figure Description

[0007] To further illustrate the above and other advantages and features of this application, the specific embodiments of this application will be described in more detail below with reference to the accompanying drawings. The drawings, together with the following detailed description, are included in and form a part of this specification. Elements having the same function and structure are indicated by the same reference numerals. It should be understood that these drawings only depict typical examples of this application and should not be considered as limiting the scope of this application.

[0008] Figure 1 This is a flowchart illustrating a method for determining the temperature and time of a high-temperature annealing test on irradiated materials, as provided in an embodiment of this application. Detailed Implementation

[0009] Exemplary embodiments of this application will be described below with reference to the accompanying drawings. For clarity and brevity, not all features of actual implementations are described in the specification. However, it should be understood that many implementation-specific decisions must be made in the development of any such actual embodiment to achieve the developer's specific goals, such as complying with constraints related to the system and business, and these constraints may vary depending on the implementation. Furthermore, it should be understood that while development work can be very complex and time-consuming, such development work is merely a routine task for those skilled in the art who benefit from the content of this application.

[0010] It should also be noted that, in order to avoid obscuring this application with unnecessary details, only the equipment structure and / or processing steps closely related to the solution according to this application are shown in the accompanying drawings, while other details that are not closely related to this application are omitted.

[0011] The following disclosure provides several different implementations or examples for carrying out this application. To simplify the disclosure of this application, specific examples of components and methods are described below. Of course, these are merely examples and are not intended to limit this application. In the description of the embodiments of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0012] Currently, the study of nuclear reactor structural materials typically involves experimentally characterizing the microscopic defects in materials after neutron irradiation. However, the microscopic defects in many materials often fall outside the experimentally measurable range. Therefore, in the study of irradiation damage to nuclear materials, high-temperature annealing is often used to further evolve the microscopic defects induced by neutron irradiation, bringing them to a size range that can be experimentally characterized. The characteristics of the initial microscopic defects are then inferred based on the characterization results after annealing. However, because different microscopic defects behave differently during high-temperature annealing, the experimental conditions for high-temperature annealing are often difficult to determine.

[0013] To address the aforementioned problems, embodiments of this application provide a method for determining the temperature and time for high-temperature annealing tests on irradiated materials. Figure 1 This is a flowchart illustrating a method for determining the temperature and time of a high-temperature annealing test on irradiated materials, as provided in an embodiment of this application. Figure 1 As shown, it includes the following steps: S10: Determine the irradiation parameters of the material irradiation process and the intrinsic parameters of the material; S20: Based on the irradiation parameters and intrinsic parameters, determine the first microscopic defect information of the material after reaching the target irradiation dose under the irradiation conditions of the irradiation parameters; S30: Based on the first microscopic defect information, determine the first hardening information of the material after irradiation; S40: Based on the intrinsic parameters and the first microscopic defect information, determine the second microscopic defect information under different annealing temperatures and different annealing times; S50: Based on the second microscopic defect information, obtain the second hardening information after annealing; S60: Based on the first hardening information and the second hardening information, determine the temperature and time of the high-temperature annealing test of the irradiated material.

[0014] The method for determining the temperature and time for high-temperature annealing tests on irradiated materials provided in this application identifies the specific characteristics of micro-defects in the irradiated material by determining the first micro-defect information, quantifies the irradiation damage state, and thereby determines the first hardening information, establishing a correlation between the material's micro-defects and macroscopic properties. By combining the material's intrinsic parameters and the first micro-defect information to determine the second micro-defect information under different temperature and time conditions, it enables long-term simulation of the evolution of micro-defects under different high-temperature annealing conditions, reducing experimental trial and error and optimizing the selection of annealing conditions. Based on the first and second hardening information, the annealing temperature and time for material performance recovery can be determined, further reducing the number of actual annealing tests and improving efficiency. The method provided in this application helps to understand the physical behavior of micro-defects in materials under neutron irradiation during high-temperature annealing, saves the cost of experimental trial and error, and obtains the expected experimental results more efficiently.

[0015] In some embodiments, in step S60, the first hardening information is represented as a change in the first yield strength. The second hardening information is represented by the change in the second yield strength. It also includes the following steps: S61: Determine If the value is greater than the predetermined value (e.g., 80%), repeat steps S40-S50; S62: Determine. If the annealing rate is less than a predetermined value (e.g., 80%), the temperature and time for the annealing test at this point are determined to be the temperature and time for the high-temperature annealing test of the irradiated material. This indicator reflects the impact of different annealing times and temperatures on hardening information, indicating the elimination ratio of the material hardening increment under different test conditions, i.e., the recovery rate of material properties. When this indicator is less than the predetermined value, it indicates that the annealing process has approached the material's recovery limit under the current conditions. Under this condition, there is no need to increase the annealing strength and repeat the annealing test. By using the above indicator to determine the temperature and time of the high-temperature annealing test of the irradiated material, the standard can be quantitatively determined, while avoiding additional annealing tests and reducing costs.

[0016] In some embodiments, steps S30 and S50 further include: determining the size distribution information of the corresponding defect types based on the first microscopic defect information and the second microscopic defect information; and determining the first hardening information of the material after irradiation and the second hardening information after annealing based on the size distribution information. Since defects in actual materials exhibit size distribution, the above-described feature calculations can make the results more consistent with reality.

[0017] In some embodiments, the size distribution information includes the size of the material and the number density of the material. In steps S30 and S50, the following steps are also included: determining the relationship between the size and the number density; and determining the first hardening information of the material after irradiation and the second hardening information after annealing based on the relationship between the size and the number density. This can reduce the amount of computation while ensuring the accuracy of the calculation results.

[0018] In some embodiments, in step S20, the first microscopic defect information may include the type, size, and number density of the defect.

[0019] In some embodiments, step S30 further includes the following steps: S31: determining the pinning force in the first microscopic defect information; S32: determining the critical angle in the first microscopic defect information; S33: determining the first hardening information based on the pinning force and the critical angle. Using the above method can more accurately describe the process by which defects hinder dislocation movement, thereby making the first hardening information closer to the actual situation.

[0020] In some embodiments, step S31 further includes the following steps: S311: determining the type of the first micro-defect in the first micro-defect information; S312: determining the size of the material in the first micro-defect information; S313: determining the number density of the material in the first micro-defect information; S314: determining the pinning force and critical angle based on the type, size, and number density. Using the above method can more accurately characterize the micro-defect information, making the pinning force and critical angle closer to reality.

[0021] In some embodiments, the relationship between type, size, number density, and pinning force conforms to the following formula: ; Pinning force in the first microscopic defect information The first micro-defect type is indicated in the first micro-defect information; r represents the size of the material in the first micro-defect information. This represents the number density of the material in the first microscopic defect information.

[0022] In some embodiments, the critical angle conforms to the following relationship based on type, size, and number density: ; This represents the critical angle in the first microscopic defect information; The first micro-defect type is indicated in the first micro-defect information; r represents the size of the material in the first micro-defect information. This represents the number density of the material in the first microscopic defect information.

[0023] By using the above methods, microscopic defect information such as defect type, material size, and number density is transformed into mechanical parameters such as pinning force and critical angle, which quantifies the strength of microscopic defects as obstacles, thereby reflecting the effectiveness of the annealing test.

[0024] In some embodiments, the pinning force, critical angle, and first hardening information conform to the following relationship: W represents a constant determined based on the type of the first micro-defect and the size of the material in the information about the first micro-defect; This represents the pinning force in the first microscopic defect information; This represents the critical angle in the first microscopic defect information; This indicates the first hardening information.

[0025] In some embodiments, in step S20, the first microscopic defect information is determined as follows: ; This represents the neutron flux rate in the irradiation parameters. This indicates the temperature in the irradiation parameters. The diffusion coefficient represents the intrinsic parameters of the material, and n represents the number of atoms in the solute clusters. It represents the binding energy between the atoms of a material; The concentration of solute clusters in the first microscopic defect information represents the defect type, size, and number density, while t represents time. This method allows for the simulation of the long-term evolutionary behavior of a multi-component defect system, resulting in more refined microscopic defect information.

[0026] In some embodiments, in step S10, irradiation parameters and intrinsic parameters can be obtained through atomic simulation or based on literature data.

[0027] Regarding the embodiments of this application, it should also be noted that, without conflict, the embodiments of this application and the features in the embodiments can be combined with each other to obtain new embodiments.

[0028] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. The scope of protection of this application shall be determined by the scope of the claims.

Claims

1. A method for determining the temperature and time of a high-temperature annealing test on an irradiated material, characterized in that, It includes the following steps: S10: Determine the irradiation parameters of the irradiation process of the material and the intrinsic parameters of the material; S20: Based on the irradiation parameters and the intrinsic parameters, determine the first microscopic defect information of the material after reaching the target irradiation dose under the irradiation conditions of the irradiation parameters; S30: Based on the first microscopic defect information, determine the first hardening information of the material after irradiation; S40: Based on the intrinsic parameters and the first micro-defect information, determine the second micro-defect information under different annealing temperatures and different annealing times; S50: Obtain the second hardening information after annealing based on the second microscopic defect information; S60: Based on the first hardening information and the second hardening information, determine the temperature and time for the high-temperature annealing test of the irradiated material.

2. The method according to claim 1, characterized in that, In step S60, the first hardening information is represented as the change in the first yield strength. The second hardening information is represented by the change in the second yield strength. It also includes the following steps: S61: Confirm If the value is greater than the predetermined value, repeat steps S40-S50; S62: Confirm If the value is less than the predetermined value, the temperature and time of the annealing test at this time are determined to be the temperature and time of the high-temperature annealing test of the irradiated material.

3. The method according to claim 1, characterized in that, Steps S30 and S50 also include: The size distribution information of the corresponding defect type is determined based on the first microscopic defect information and the second microscopic defect information, respectively. Based on the size distribution information, the first hardening information of the material after irradiation and the second hardening information after annealing are determined respectively.

4. The method according to claim 3, characterized in that, The size distribution information includes the size of the material and the number density of the material. Steps S30 and S50 also include the following steps: Determine the relationship between the size and the number density; Based on the relationship between the size and the number density, the first hardening information of the material after irradiation and the second hardening information after annealing are determined.

5. The method according to claim 1, characterized in that, Step S30 also includes the following steps: S31: Determine the pinning force in the first microscopic defect information; S32: Determine the critical angle in the first microscopic defect information; S33: Determine the first hardening information based on the pinning force and the critical angle.

6. The method according to claim 5, characterized in that, Step S31 also includes the following steps: S311: Determine the type of the first micro defect in the first micro defect information; S312: Determine the size of the material in the first microscopic defect information; S313: Determine the number density of the material in the first microscopic defect information; S314: Determine the pinning force and the critical angle based on the type, the size, and the number density.

7. The method according to claim 6, characterized in that, The following relationship exists between the type, the size, the number density, and the pinning force: ； This indicates the pinning force in the first microscopic defect information. The first micro-defect type is indicated in the first micro-defect information; r represents the size of the material in the first micro-defect information. This represents the number density of the material in the first microscopic defect information.

8. The method according to claim 6, characterized in that, Based on the type, the size, and the number density, the critical angle conforms to the following relationship: ； This represents the critical angle in the first microscopic defect information; The first micro-defect type is indicated in the first micro-defect information; r represents the size of the material in the first micro-defect information. This represents the number density of the material in the first microscopic defect information.

9. The method according to claim 5, characterized in that, The pinning force, the critical angle, and the first hardening information conform to the following relationship: ； W represents a constant determined based on the type of the first micro-defect and the size of the material in the first micro-defect information; This represents the pinning force in the first microscopic defect information; This represents the critical angle in the first microscopic defect information; This indicates the first hardening information.

10. The method according to claim 1, characterized in that, In step S20, the first microscopic defect information is determined in the following manner: ； This represents the neutron flux rate in the irradiation parameters. This refers to the temperature in the irradiation parameters. The diffusion coefficient of the material is represented by the intrinsic parameters of the material, and n represents the number of atoms in the solute cluster of the material. This represents the binding energy between the atoms of the material; The concentration of solute clusters in the first microscopic defect information is represented by t, which reflects the defect type, size, and number density in the first microscopic defect information.

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