Method for determining probe frequency response calibration parameters, measurement system and storage medium

Abstract

The application provides a probe frequency response calibration parameter determination method, a measurement system and a storage medium. The calibration parameter determination method introduces a composite test signal containing a steady-state sweep signal and a transient pulse signal. Based on the data sets obtained by responding to the same test signal under two conditions that the calibration system is not connected to the probe and is connected to the probe, the de-embedding calculation is performed, that is, the amplitude is divided to eliminate the link gain deviation, and the phase is subtracted to peel off the channel phase offset, the accurate extraction of the independent frequency response characteristics of the probe is realized, and the frequency response calibration parameter of the probe is determined. The application eliminates the system error introduced by the test environment and the rear-end measurement link, improves the calibration accuracy of the amplitude-frequency characteristics and the phase-frequency characteristics of the probe in the whole working frequency band, provides a reliable basis for the oscilloscope and other measurement equipment to implement accurate real-time anti-distortion compensation in actual signal capture, and ensures the restoration authenticity of the whole measurement system in high-frequency and wideband signal testing.

Description

Technical Field

[0001] This application relates to the field of electronic measurement technology, specifically to a method for determining probe frequency response calibration parameters, a measurement system, and a storage medium. Background Technology

[0002] With the rapid development of high-speed digital and radio frequency technologies, the frequency and rate of the signals being measured are constantly increasing. For example, the rate of high-speed serial communication signals has reached the order of 10 gigabits per second. In the measurement of such high-frequency, high-speed signals, the measurement probe, as a key component connecting the object under test and the measuring instrument, directly affects the accuracy of the measurement results.

[0003] When a probe is connected to a signal test point, it essentially constitutes an additional load on the signal path. This load effect alters the original signal characteristics at the test point. Simultaneously, the frequency response characteristics of the probe's internal circuitry are not ideally flat within its operating frequency band, introducing additional amplitude and phase errors. Therefore, the signal actually output by the probe is a signal distorted by both the load effect and its own frequency response, rather than a true reproduction of the original signal at the test point. To obtain accurate measurement results, it is necessary to calibrate these distortions introduced by the probe. Calibration corrects these distortions, ensuring that the signal presented by the measuring instrument effectively approximates the original signal at the measured point.

[0004] Traditional probe calibration methods are generally divided into DC calibration and AC calibration. The basic principle is to input a standard signal of known amplitude into the probe, and then adjust components on the probe (such as potentiometers) mechanically, or adjust the digital gain at the instrument end, to make the instrument reading match the standard signal value. However, these traditional calibration methods can usually only perform precise calibration at a single frequency point (such as DC or a specific frequency), or simply apply a fixed gain compensation to the entire frequency band. This is far from sufficient for modern high-bandwidth probes, whose frequency response curves are often not simple flat lines over a wide bandwidth, but may contain complex non-uniform fluctuations. Traditional methods cannot comprehensively correct for these finely varied frequency-amplitude characteristics and frequency-varying phase characteristics within the band, resulting in non-negligible errors in high-frequency and high-speed signal measurements. Summary of the Invention

[0005] To address the aforementioned shortcomings of existing technologies, this application provides a method, measurement system, and storage medium for determining probe frequency response calibration parameters. The aim is to solve the technical problem that traditional probe calibration methods cannot accurately acquire and compensate for the complex frequency response characteristics of the probe within its wide bandwidth, leading to high-frequency signal measurement distortion.

[0006] In a first aspect, embodiments of this application provide a method for determining probe frequency response calibration parameters, including:

[0007] Obtain a reference frequency response dataset of the calibration system to the test signal when the probe is not connected;

[0008] Obtain the system frequency response dataset of the calibration system in response to the same test signal when the probe is connected;

[0009] De-embedding calculations are performed on the reference frequency response dataset and the system frequency response dataset to determine the frequency response calibration parameters of the probe;

[0010] The test signals cover the entire operating frequency band of the probe and include at least one of a first type of test signal for exciting the steady-state amplitude response and a second type of test signal for exciting the transient phase response; the reference frequency response dataset and the system frequency response dataset both include amplitude frequency response data and / or phase frequency response data corresponding to multiple frequency points.

[0011] In some embodiments, the calibration system includes at least a signal generation unit for generating test signals and a measurement unit for measuring frequency response;

[0012] The reference frequency response dataset of the calibration system's response to the test signal when no probe is connected includes:

[0013] The signal generation unit is controlled to output the first type of test signal in sequence according to a preset frequency sequence, and the measurement unit synchronously measures the signal amplitude value corresponding to each frequency point to obtain the first set of amplitude measurement results.

[0014] And / or, control the signal generation unit to output the second type of test signal, and capture the corresponding first time-domain waveform through the measurement unit.

[0015] In some embodiments, obtaining the system frequency response dataset of the calibration system responding to the same test signal when the probe is connected includes:

[0016] The signal generation unit is controlled to output the first type of test signal sequentially according to the same preset frequency sequence, and the measurement unit synchronously measures the signal amplitude value corresponding to each frequency point to obtain the second set of amplitude measurement results.

[0017] And / or, control the signal generation unit to output the second type of test signal, and capture the corresponding second time-domain waveform through the measurement unit.

[0018] In some embodiments, the method for determining the probe frequency response calibration parameters further includes:

[0019] Select any frequency point as a reference point, and based on the signal amplitude value corresponding to the reference point, normalize the first group of amplitude measurement results and the second group of amplitude measurement results respectively.

[0020] Generate the first amplitude frequency response array and the second amplitude frequency response array corresponding to each frequency point.

[0021] In some embodiments, the step of performing de-embedding calculations on the reference frequency response dataset and the system frequency response dataset to determine the frequency response calibration parameters of the probe includes:

[0022] The amplitude frequency response data corresponding to each frequency point in the second amplitude frequency response array and the first amplitude frequency response array are divided to obtain the gain calibration parameter array of the probe corresponding to each frequency point.

[0023] In some embodiments, the method for determining the probe frequency response calibration parameters further includes:

[0024] Perform frequency domain transformation on the first time-domain waveform and the second time-domain waveform respectively;

[0025] Based on the transformation results, the first set of phase values ​​and the second set of phase values ​​corresponding to each frequency point are extracted to generate the first phase frequency response array and the second phase frequency response array.

[0026] In some embodiments, the step of performing de-embedding calculations on the reference frequency response dataset and the system frequency response dataset to determine the frequency response calibration parameters of the probe includes:

[0027] The second phase frequency response array and the first phase frequency response array are subtracted element by element to obtain the phase calibration parameter array of the probe corresponding to each frequency point.

[0028] In some embodiments, the signal generating unit includes a radio frequency signal source and a fast-edge pulse generator;

[0029] The radio frequency signal source is used to output a frequency scanning sine wave signal covering the entire operating frequency band of the probe as the first type of test signal; the fast edge pulse generator is used to output a fast edge pulse signal covering the entire operating frequency band of the probe as the second type of test signal; the measurement unit is an oscilloscope.

[0030] Secondly, embodiments of this application provide a measurement system, including:

[0031] probe;

[0032] An oscilloscope is configured to, when the probe is connected, acquire probe frequency response calibration parameters obtained by the method for determining probe frequency response calibration parameters as described in any embodiment of the first aspect, and use the probe frequency response calibration parameters to perform frequency response compensation on the measured signal acquired by the probe.

[0033] In some embodiments, the oscilloscope includes:

[0034] The parameter acquisition module is configured to acquire the probe frequency response calibration parameters and the oscilloscope's own channel calibration parameters when the probe is connected.

[0035] The compensation processing module is configured to process the probe frequency response calibration parameters and the oscilloscope's own channel calibration parameters to determine the compensation parameters corresponding to each frequency point, and to use the compensation parameters to perform frequency response compensation on the measured signal.

[0036] In some embodiments, the compensation processing module is further configured to:

[0037] The calibration parameters of the probe and the channel calibration parameters stored in the oscilloscope are aligned at frequency points to obtain aligned probe frequency response calibration parameters.

[0038] Based on the aligned probe gain calibration parameters and channel gain calibration parameters, the actual gain of the measurement system is calculated. According to the relationship between the actual gain of the system and the preset ideal gain, gain compensation parameters are generated. The measured signal is then filtered using the gain compensation parameters to achieve gain frequency response compensation.

[0039] And / or, based on the aligned probe phase calibration parameters and channel phase calibration parameters, a phase compensation parameter is generated, and the phase compensation parameter is used to perform phase correction on the measured signal to achieve phase frequency response compensation.

[0040] Thirdly, embodiments of this application provide a computer-readable storage medium storing a computer-executable program or instructions, which, when executed by a processor, are used to implement the method for determining probe frequency response calibration parameters as described in any embodiment of the first aspect.

[0041] The method for determining probe frequency response calibration parameters and the measurement system applied to this method, as provided in this application, introduce a composite test signal including steady-state sweep signals and transient pulse signals. By combining frequency response data acquisition in two phases—without and with the probe—the method achieves precise quantification and characterization of the non-ideal characteristics of the signal source, connecting cables, and the measurement unit itself. Furthermore, by performing vector de-embedding calculations in the complex frequency domain on the reference frequency response dataset and the system frequency response dataset—that is, dividing the amplitude to eliminate link gain deviation and subtracting the phase to remove channel phase offset—the method achieves accurate extraction of the probe's independent frequency response characteristics. This application effectively eliminates system errors introduced by the test environment and the back-end measurement link, improves the calibration accuracy of the probe's amplitude and phase frequency characteristics across the entire operating frequency band, and provides a reliable basis for oscilloscopes and other measurement equipment to implement precise real-time anti-distortion compensation in actual signal acquisition. This ensures the accuracy of amplitude reproduction and waveform reconstruction in high-frequency and broadband signal testing.

[0042] In addition, this application also provides a computer-readable storage medium that has the same beneficial effects as the method for determining the probe frequency response calibration parameters described above. Attached Figure Description

[0043] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0044] Figure 1 This is a schematic diagram of the structure of a measurement system provided in one embodiment of this application.

[0045] Figure 2 This is a schematic diagram of the structure of a calibration system provided in one embodiment of this application.

[0046] Figure 3 This is a flowchart illustrating a method for determining probe frequency response calibration parameters according to one embodiment of this application.

[0047] Figure 4 This is a flowchart illustrating a method for determining probe gain calibration parameters according to one embodiment of this application.

[0048] Figure 5 This is a flowchart illustrating a method for determining probe phase calibration parameters according to one embodiment of this application.

[0049] Figure 6 A flowchart illustrating a method for determining probe frequency response calibration parameters according to another embodiment of this application.

[0050] Figure 7 This is a schematic diagram of the structure of a measurement system provided in another embodiment of this application.

[0051] The accompanying drawings illustrate specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0052] The present application will now be described in further detail with reference to the accompanying drawings and specific embodiments. Similar elements in different embodiments are referred to by related similar element reference numerals. In the following embodiments, many details are described to facilitate a better understanding of the present application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to the present application are not shown or described in the specification. This is to avoid obscuring the core parts of the present application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.

[0053] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can be rearranged or adjusted in a manner obvious to those skilled in the art. Therefore, the various orders in the specification and drawings are only for the clear description of a particular embodiment and do not imply a necessary order, unless otherwise stated that a particular order must be followed.

[0054] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class, without limiting the number of objects; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship. Unless otherwise specified, the terms "connection" and "linkage" used in this application include both direct and indirect connections (linkages).

[0055] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.

[0056] Figure 1 This is a schematic diagram of the structure of a measurement system provided in one embodiment of this application. Figure 1 As shown, the measurement system provided in this embodiment includes at least a matching probe 10 and an oscilloscope 20.

[0057] In this embodiment, probe 10 is the signal pickup and conditioning front end of the measurement system. Its core function is to transmit the electrical signal in the circuit under test to the oscilloscope 20 with the highest possible fidelity, and at the same time match the high impedance test point with the input impedance of the oscilloscope 20 to reduce the load effect on the original signal. Depending on the measurement requirements, probe 10 can be divided into various types such as passive voltage probe, active differential probe, and current probe. Its attenuation ratio, bandwidth and input impedance directly determine the range and accuracy of the signal that can be accurately measured.

[0058] The oscilloscope 20 is the core of the measurement system for display and analysis. It is essentially a graphical electronic measuring instrument that converts the amplitude of the acquired electrical signal over time into a visual waveform image displayed on the screen. This allows users to intuitively observe key parameters such as the waveform shape, amplitude, frequency, and phase of the signal, and to use its triggering, measurement, and mathematical calculation functions to perform in-depth analysis and fault diagnosis of the signal.

[0059] As described in the background art, when probe 10 is connected to a signal test point, it essentially constitutes an additional load on the signal path. This load effect will change the original signal characteristics at the test point. At the same time, the frequency response characteristics of the internal circuit of probe 10 are not ideally flat within its operating frequency band, which will introduce additional amplitude and phase errors. Therefore, before using this measurement system, the frequency response of probe 10 needs to be calibrated, that is, to compensate for the mismatch between probe 10 and the input channel of oscilloscope 20 and the difference in attenuation characteristics of probe 10 at different frequencies.

[0060] However, determining the probe's frequency response calibration parameters directly determines whether the entire measurement system can maintain signal amplitude consistency and phase linearity at different frequencies. If the parameters are set improperly, capacitive load mismatch between the input channels of probe 10 and oscilloscope 20 can lead to attenuation or enhancement of high-frequency components, resulting in amplitude deviation, blunted edges, or even ringing distortion in the observed waveform. Only when the calibration parameters are accurate can it be ensured that all frequency components of the signal can be transmitted without loss within the entire frequency spectrum of the probe 10's bandwidth limit, thereby guaranteeing that the measurement results truly reflect the high-frequency transient changes and low-frequency envelope characteristics of the measured point.

[0061] Therefore, the oscilloscope 20 is also configured to acquire probe frequency response calibration parameters when probe 10 is connected, and to use the probe frequency response calibration parameters to perform frequency response compensation on the measured signal acquired through probe 10.

[0062] In this embodiment, the probe frequency response calibration parameters reflect its attenuation and phase change patterns across the entire frequency band. During actual measurement, the oscilloscope 20 utilizes these pre-acquired parameters to perform digital signal processing on the measured signal acquired and transmitted in real time by the probe 10. Specifically, it uses inverse filtering or equalization algorithms to specifically compensate for the amplitude distortion and phase shift introduced by the probe 10 at different frequency points. Compared to traditional methods relying solely on hardware compensation, this approach can more accurately restore the true nature of the signal. Especially for signals with complex high-frequency components or those exhibiting distortion, it can significantly improve the fidelity of the entire measurement chain, ensuring that the final displayed waveform is an accurate mathematical reconstruction of the original state of the measured point.

[0063] The following section will further detail the specific implementation process of a method for determining probe frequency response calibration parameters. This process aims to accurately quantify the transmission characteristics of probe 10 across the entire frequency band through standardized excitation signal injection and response analysis.

[0064] The method for determining the probe frequency response calibration parameters provided in this application utilizes a calibration system. By acquiring the frequency response data of the probe 10 before and after it is connected to the calibration system, the two sets of data are processed to accurately extract the frequency response of the probe 10 itself, thereby determining the calibration parameters that can be used for subsequent signal compensation.

[0065] Figure 2 This is a schematic diagram of the structure of a calibration system provided in one embodiment of this application. Figure 2 As shown, the calibration system provided in this embodiment includes a host computer 210, a signal generation unit 220, and a measurement unit 230.

[0066] In this embodiment, the host computer 210 serves as the control core and data processing center of the entire process, and is responsible for sending synchronization commands to the signal generation unit 220 and the measurement unit 230 to coordinate the precise execution of the calibration steps.

[0067] The signal generation unit 220 acts as the excitation source. Its core function is to generate test signals covering the entire operating frequency band of the probe 10 under the control of the host computer 210. This unit can generate at least two types of standard signals: one type is the first type of test signal, such as the swept sine wave used to excite the steady-state amplitude response, and the other type is the second type of test signal, such as the fast-edge pulse used to excite the transient phase response. This ensures that the response characteristics of the probe 10 can be fully excited at different frequency points and under dynamic conditions, providing a complete excitation basis for subsequent frequency response analysis.

[0068] The measurement unit 230 is responsible for capturing the signal transmitted by the probe 10 with high precision and completing the preliminary extraction of frequency response data. When the probe 10 is not connected, it directly collects the test signal generated by the signal generation unit 220 to establish a reference frequency response dataset. After the probe 10 is connected, it synchronously collects the same test signal after the probe 10 to construct a system frequency response dataset.

[0069] During the determination of the frequency response calibration parameters of probe 10, probe 10 is physically connected in series to the signal link. Specifically, its signal input is connected to signal generation unit 220 to receive standard test excitation, and its signal output is connected to the input channel of measurement unit 230, thus forming a complete signal transmission path. At this time, probe 10, as the object under test, is positioned between signal generation unit 220 and measurement unit 230. This means that the test signal must pass through the attenuation network, transmission cable, and compensation circuit inside probe 10 before being captured by measurement unit 230. This connection method ensures that the data acquired by measurement unit 230 truly incorporates all the influence of probe 10 on signal amplitude and phase.

[0070] In some embodiments, the signal generation unit 220 includes a radio frequency signal source and a fast-edge pulse generator. The radio frequency signal source is used to output a frequency scanning sine wave signal covering the entire operating frequency band of the probe 10 as a first type of test signal; the fast-edge pulse generator is used to output a fast-edge pulse signal covering the entire operating frequency band of the probe 10 as a second type of test signal.

[0071] The signal generation unit 220 is designed to include two excitation sources: an RF signal source and a fast-edge pulse generator, to provide two types of test signals for steady-state analysis and transient analysis, respectively. The RF signal source outputs a continuously adjustable or stepped sweep sine wave as the first type of test signal. Its core function is to accurately measure the steady-state amplitude response (gain / attenuation) of the probe 10 at discrete frequency points by traversing the entire nominal operating frequency band of the probe 10. The fast-edge pulse generator outputs a pulse signal with an extremely fast rise time (theoretically covering an extremely wide spectrum) as the second type of test signal. Its function is to use the rich frequency components in the pulse to excite the full-band response of the probe 10 at once, which is particularly suitable for capturing the phase characteristics of the probe 10 under transient conditions. By integrating these two signal generators into the same unit, the calibration system can simultaneously acquire complete response data of the probe 10 in both the frequency domain (steady-state) and time domain (transient), providing complementary and mutually verifying raw datasets for subsequent de-embedding calculations, thereby ensuring that the determined frequency response calibration parameters have both amplitude accuracy and phase accuracy.

[0072] In some embodiments, the measurement unit 230 is a high-bandwidth oscilloscope, which can convert the acquired time-domain waveform into frequency-domain data containing amplitude and phase information of multiple frequency points through Fourier transform, and upload this data to the host computer 210 for subsequent processing.

[0073] Meanwhile, the host computer 210 is also responsible for receiving the raw sampling data returned by the measurement unit 230, running the pre-stored algorithm to perform complex frequency domain vector calculation on the reference frequency response dataset and the system frequency response dataset, thereby extracting the frequency response calibration parameters of the probe 10, and storing or writing the final parameters back into the storage chip of the probe 10 to provide accurate compensation basis for the measurement system.

[0074] In some embodiments, the signal generating unit 220 and the measuring unit 230 are connected by a coaxial cable 240 and a clamp 250.

[0075] To achieve a stable and repeatable RF connection, a basic signal link is established between the signal generation unit 220 and the measurement unit 230 via a coaxial cable 240 and a fixture 250. During the determination of calibration parameters, the probe 10 is connected between the output of the fixture 250 and the input of the measurement unit 230: the test signal emitted by the signal generation unit 220 is first transmitted to the fixture 250 via the coaxial cable 240, and then fed into the signal input of the probe 10 by the fixture 250, while the signal output of the probe 10 is directly connected to the measurement unit 230. This connection method makes the parasitic parameters and contact impedance introduced by the fixture 250 part of the system frequency response dataset, thereby ensuring that the probe frequency response calibration parameters extracted through de-embedding calculation more closely reflect its actual performance in real-world applications.

[0076] When determining the probe frequency response calibration parameters based on this calibration system, under the unified control of the host computer 210, the signal generation unit 220 generates a test signal covering the entire operating frequency band of the probe 10 and outputs it in two stages: In the first stage, when the probe 10 is not connected, the measurement unit 230 directly acquires the signal to generate a reference frequency response dataset characterizing the link's background characteristics; in the second stage, after the probe 10 is connected, the measurement unit 230 again acquires the same signal transmitted through the probe 10 to generate a system frequency response dataset that incorporates the influence of the probe 10. Finally, the host computer 210 performs complex frequency domain vector calculations on the two datasets by running a de-embedding algorithm to accurately extract the frequency response of the probe 10 itself, thereby determining the calibration parameters that can be used for subsequent signal compensation. The specific implementation steps are as follows.

[0077] Figure 3 This is a flowchart illustrating a method for determining probe frequency response calibration parameters according to one embodiment of this application. Figure 3 As shown, the method for determining the probe frequency response calibration parameters provided in this embodiment is applied to the probe 10 connected to the oscilloscope 20, and specifically includes the following steps:

[0078] Step S310: Obtain the reference frequency response dataset of the calibration system's response to the test signal when the probe is not connected. The test signal covers the entire operating frequency band of the probe and includes at least one of a first type of test signal used to excite the steady-state amplitude response and a second type of test signal used to excite the transient phase response.

[0079] The purpose of acquiring a reference frequency response dataset of the calibration system's response to the test signal when probe 10 is not connected is to establish a reference benchmark for the entire measurement link (excluding probe 10 under test) itself, thereby eliminating the influence of non-ideal amplitude and phase frequency characteristics that may exist in the signal source, connecting cables, and the input channel of oscilloscope 20 on subsequent calibration results. After the calibration system is set up, the host computer 210 controls the signal generation unit 220 to output a test signal covering the entire operating frequency band of probe 10. This signal includes at least one of the first type of test signal used to excite the steady-state amplitude response and the second type of test signal used to excite the transient phase response. At this time, probe 10 is not yet connected to the link, and the signal is directly transmitted to the measurement unit 230 through coaxial cable 240 and fixture 250. The measurement unit 230 performs high-precision acquisition and frequency domain transformation processing on the signal, and finally obtains a set of reference frequency response datasets containing amplitude and / or phase information corresponding to multiple frequency points.

[0080] Step S320: Obtain the system frequency response dataset of the calibration system in response to the same test signal when the probe is connected. Both the reference frequency response dataset and the system frequency response dataset include amplitude frequency response data and / or phase frequency response data corresponding to multiple frequency points.

[0081] After obtaining the reference frequency response dataset for the test signal response, while keeping the output settings of the signal generation unit 220 completely consistent with step S310, the probe 10 is connected to the link. That is, the input end of the probe 10 is connected to the output port of the fixture 250, and the output end is connected to the input channel of the measurement unit 230 to obtain the comprehensive frequency response characteristics of the complete transmission path including the probe 10. After the probe 10 is connected, the test signal must pass through the front-end attenuation network, transmission cable, and compensation circuit inside the probe 10 before it can be captured by the measurement unit 230. The measurement unit 230 again performs synchronous sampling and frequency domain analysis on the signal transmitted through the probe 10 to generate the system frequency response dataset. Since the probe 10 itself introduces specific amplitude attenuation, frequency selectivity characteristics, and phase delay, this dataset essentially integrates the total effect of the probe 10 and the back-end measurement link. After comparison and processing with the reference frequency response dataset, the frequency response characteristics of the probe 10 can be separated.

[0082] Step S330: Perform de-embedding calculations on the reference frequency response dataset and the system frequency response dataset to determine the frequency response calibration parameters of the probe.

[0083] After obtaining the reference frequency response dataset and system frequency response dataset before and after probe 10 is connected to the calibration system, mathematical stripping technology is used to perform de-embedding calculation on the reference frequency response dataset and system frequency response dataset. From the system frequency response data that incorporates the influence of probe 10, the link background characteristics represented by the reference frequency response dataset are accurately removed, thereby accurately extracting the independent frequency response characteristics of probe 10 itself.

[0084] Specifically, the de-embedding computation processes the corresponding frequency points of the two datasets separately in the complex frequency domain: for amplitude frequency response data, a division operation is used to divide the amplitude values ​​in the system frequency response dataset point by point by the corresponding amplitude values ​​in the reference frequency response dataset, thereby eliminating amplitude deviations caused by factors such as signal source unevenness, cable loss, and the gain of the measurement unit 230 channels; for phase frequency response data, a subtraction operation is used to subtract the corresponding phase values ​​in the reference frequency response dataset point by point from the phase values ​​in the system frequency response dataset, thereby removing the phase offset introduced by link attachments. Through this joint vector operation of amplitude division and phase subtraction, the finally calculated pure data is the frequency response calibration parameter of probe 10. It accurately quantifies the actual gain / attenuation characteristics and phase change characteristics of probe 10 at each frequency point in the entire operating frequency band, providing a calibration compensation basis for the subsequent accurate amplitude restoration and phase compensation of the measured signal by the oscilloscope 20.

[0085] In summary, the method for determining probe frequency response calibration parameters provided in this embodiment introduces a composite test signal including steady-state sweep signals and transient pulse signals, and combines frequency response data acquisition in two stages—without probe connection and with probe connection—to achieve accurate quantification and characterization of the non-ideal characteristics of the signal source, connecting cables, and the measurement unit itself. Based on this, by performing vector de-embedding calculations in the complex frequency domain on the reference frequency response dataset and the system frequency response dataset—that is, dividing the amplitude to eliminate link gain deviation and subtracting the phase to remove channel phase offset—accurate extraction of the probe's independent frequency response characteristics is achieved. This method not only effectively eliminates system errors introduced by the test environment and the back-end measurement link, significantly improving the calibration accuracy of the probe's amplitude-frequency and phase-frequency characteristics across the entire operating frequency band, but also provides a reliable basis for oscilloscopes and other measurement equipment to implement accurate real-time anti-distortion compensation in actual signal acquisition through the output of digital calibration parameters, thereby ensuring the amplitude reproduction authenticity and waveform reconstruction fidelity of the entire measurement system in high-frequency and broadband signal testing.

[0086] Figure 4 This is a flowchart illustrating a method for determining probe gain calibration parameters according to one embodiment of this application. Figure 4 As shown, the method for determining probe gain calibration parameters provided in this embodiment includes the following steps:

[0087] Step S410: When the calibration system is not connected to the probe, the control signal generation unit outputs the first type of test signal in sequence according to the preset frequency sequence, and the measurement unit synchronously measures the signal amplitude value corresponding to each frequency point to obtain the first set of amplitude measurement results.

[0088] This step aims to establish an amplitude reference for the entire measurement link (excluding probe 10). By having the signal generation unit 220 output a single-frequency sine wave according to a pre-set frequency point sequence (e.g., stepping from low frequency to high frequency), and the measurement unit 230 accurately captures the amplitude value of the signal at each frequency point, a set of basic data reflecting the output flatness of the signal source, cable loss, and the channel gain of the measurement unit 230 as a function of frequency is obtained. This data will serve as the original basis for subsequently identifying the amplitude non-ideal of the link itself.

[0089] Step S420: With the probe connected to the calibration system, the control signal generation unit outputs the first type of test signal in sequence according to the same preset frequency sequence, and the measurement unit synchronously measures the signal amplitude value corresponding to each frequency point to obtain the second set of amplitude measurement results.

[0090] While maintaining the exact same frequency sequence and signal amplitude as in step S410, probe 10 is connected in series to the signal link. At this point, the test signal must pass through the attenuation network and transmission path inside probe 10 before being captured by measurement unit 230. Measurement unit 230 then precisely measures the signal amplitude after passing through probe 10 at each frequency point, thereby obtaining a second set of amplitude measurement results. This set of data actually integrates the gain or attenuation characteristics of probe 10 at different frequency points, as well as the influence of the back-end link itself, and will serve as the original basis for subsequently extracting the independent amplitude response of probe 10.

[0091] Step S430: Select any frequency point as a reference point, and normalize the first group of amplitude measurement results and the second group of amplitude measurement results based on the signal amplitude value corresponding to the reference point.

[0092] To eliminate the influence of the absolute amplitude of the test signal and the absolute gain of the measurement unit 230 on subsequent calculations, and to ensure that the calibration results only focus on the relative amplitude changes of the probe 10 at various frequency points, data processing of the measurement results is required. Specifically, the amplitude value of a certain frequency point (such as 1kHz or the center point of the probe 10's operating frequency band) is selected from the first set of measurement results as a reference value. Then, the measured values ​​of all frequency points in this set are divided by this reference value to obtain the normalized first amplitude sequence. Similarly, the amplitude value of the same frequency point as the first set of measurement results is selected from the second set of measurement results as a reference, and the same normalization operation is performed. Through normalization, both sets of data are converted into relative amplitude values ​​with the reference point as the 0dB reference.

[0093] Step S440: Generate the first amplitude frequency response array and the second amplitude frequency response array corresponding to each frequency point.

[0094] After normalization, the normalized data is organized and structured according to frequency points, forming two standard array formats. The first amplitude-frequency response array represents the relative amplitude-frequency characteristics of the measurement link itself without probe 10; the second amplitude-frequency response array represents the relative amplitude-frequency characteristics of the entire system including probe 10.

[0095] Step S450: Perform division operations on the amplitude frequency response data corresponding to each frequency point in the second amplitude frequency response array and the first amplitude frequency response array respectively to obtain the gain calibration parameter array of the probe corresponding to each frequency point.

[0096] After obtaining the frequency response arrays characterizing the relative amplitude-frequency characteristics of the system link before and after the probe 10 is connected, since the second amplitude-frequency response array includes the total effect of the probe 10 and the link, while the first amplitude-frequency response array only represents the effect of the link itself, the gain contribution of the probe 10 can be accurately extracted from the total effect by dividing the amplitude value of the second amplitude-frequency response array by the corresponding amplitude value of the first amplitude-frequency response array at each frequency point. This point-by-point division operation eliminates the influence of factors such as signal source unevenness, cable loss, and gain fluctuations of the measurement unit 230 channels, ultimately yielding a pure amplitude calibration parameter array that reflects only the relative gain or attenuation characteristics of the probe 10 at each frequency point.

[0097] This array of amplitude calibration parameters will be stored in the non-volatile memory of the oscilloscope 20, or written back to the memory chip inside the probe 10 via a digital communication interface. This allows the test system to retrieve the corresponding gain calibration value from the array based on the current operating frequency when acquiring the signal under test in real time. This enables precise reverse compensation for the amplitude attenuation or frequency-selective fluctuations introduced by the probe 10, thereby ensuring that the waveform amplitude finally displayed by the oscilloscope 20 can truly reproduce the original signal characteristics of the measured point.

[0098] The gain calibration parameter determination method provided in this embodiment introduces a two-stage amplitude measurement process with and without a probe connected, and combines it with reference point normalization processing to accurately separate the link background characteristics such as signal source output flatness, connection cable loss, and the gain of the 230 channels of the measurement unit. On this basis, by performing point-by-point division operations on the amplitude frequency response array generated in the two stages, the independent gain characteristics of the probe itself at each frequency point are accurately extracted from the total effect of the probe and the link.

[0099] Figure 5 This is a flowchart illustrating a method for determining probe phase calibration parameters according to one embodiment of this application. Figure 5 As shown, the method for determining the probe phase calibration parameters provided in this embodiment includes the following steps:

[0100] Step S510: When the calibration system is not connected to the probe, the control signal generation unit outputs the second type of test signal and captures the corresponding first time domain waveform through the measurement unit.

[0101] This step aims to establish a benchmark for phase measurement: by having a fast-edge pulse generator output a step or pulse signal covering the entire frequency band, and the measurement unit 230 directly captures the original waveform before it is transmitted by the probe 10, the initial phase characteristics introduced by the signal source, connecting cables, and the measurement unit 230 itself are fully recorded. This first time-domain waveform contains the inherent phase shifts exerted by each link in the link on each frequency component of the signal, and will serve as the original comparison benchmark for subsequent removal of the phase influence of the probe 10 itself.

[0102] Step S520: With the probe connected to the calibration system, the control signal generation unit outputs a second type of test signal and captures the corresponding second time-domain waveform through the measurement unit.

[0103] While maintaining the output settings of the signal generation unit 220 exactly the same as in step S510, the probe 10 is connected to the link. At this time, the fast-edge pulse signal must pass through the transmission network inside the probe 10 before it can be captured by the measurement unit 230. The reactive components and transmission delay present in the probe 10 will cause varying degrees of shift in the phase relationship of each frequency component in the signal. The second time-domain waveform captured by the measurement unit 230 essentially integrates the combined phase response of the probe 10 and the back-end link, and will also serve as the raw data for subsequently extracting the independent phase response of the probe 10.

[0104] Step S530: Perform frequency domain transformation on the first time domain waveform and the second time domain waveform respectively.

[0105] After capturing the waveform data, mathematical algorithms such as the Fast Fourier Transform (FFT) are needed to decompose the first and second time-domain waveforms, representing amplitude changes over time, into a combination of a series of discrete frequency components. The transformed frequency-domain data can clearly present the amplitude and phase information of each frequency component, making the phase characteristics originally implicit in the waveform shape explicit.

[0106] Step S540: Based on the transformation results, extract the first set of phase values ​​and the second set of phase values ​​corresponding to each frequency point to generate the first phase frequency response array and the second phase frequency response array.

[0107] After completing the frequency domain transformation, for each discrete frequency point covering the operating frequency band of probe 10, the corresponding phase angle is extracted from the transformation result of the first time domain waveform to form a first phase frequency response array. This array characterizes the phase frequency characteristics of the link itself without probe 10. Similarly, the phase angle of each frequency point is extracted from the transformation result of the second time domain waveform to form a second phase frequency response array, which reflects the phase frequency characteristics of the entire system including probe 10. The generation of these two phase frequency response arrays realizes the quantization of continuous phase characteristics into a structured digital sequence, facilitating precise mathematical calculations.

[0108] Step S550: Perform element-wise subtraction on the second phase frequency response array and the first phase frequency response array to obtain the phase calibration parameter array of the probe corresponding to each frequency point.

[0109] Finally, since the second phase array is the sum of the probe 10 phase and the link phase, while the first phase array only represents the link phase, the net phase offset introduced by the probe 10 itself can be accurately isolated by subtracting the corresponding phase value of the first array from the phase value of the second array at each frequency point. This point-by-point subtraction operation effectively eliminates the influence of factors such as the initial phase of the signal source, cable transmission delay, and phase shift of the measurement unit 230 channel, ultimately obtaining a set of calibration parameters that only reflects the phase change characteristics of the probe 10 at each frequency point.

[0110] Similarly, this array of phase calibration parameters will be stored in the non-volatile memory of the oscilloscope 20, or written back to the memory chip inside the probe 10 via the digital communication interface, so that when the test system acquires the signal under test in real time, it can retrieve the corresponding phase calibration value from the array according to the current operating frequency, and accurately compensate for the amplitude attenuation or frequency selective fluctuation introduced by the probe 10, thereby ensuring that the waveform phase finally displayed by the oscilloscope 20 can truly restore the original signal characteristics of the measured point.

[0111] The phase calibration parameter determination method provided in this embodiment introduces fast-edge pulse excitation in two stages: one with the probe not connected and the other with the probe connected. Combined with time-domain waveform capture and frequency-domain transformation processing, it achieves accurate characterization of the link's inherent characteristics, such as the initial phase of the signal source, cable delay, and channel phase shift of the measurement unit. Based on this, by performing point-by-point subtraction on the phase frequency response array generated in the two stages, the net phase offset introduced by the probe itself at each frequency point is precisely extracted from the total phase response, which integrates the probe and the link. This not only eliminates systematic phase errors caused by the test environment and the back-end link, improving the purity and accuracy of probe phase characteristic calibration, but also allows the final generated phase calibration parameter array to be directly used in actual measurements for real-time reverse compensation of the phase distortion introduced by the probe. This ensures that the entire test system accurately reproduces the waveform shape and timing relationship of the signal when capturing complex modulated signals or high-speed digital signals.

[0112] Figure 6 A flowchart illustrating a method for determining probe frequency response calibration parameters according to another embodiment of this application. Figure 6 As shown, the method for determining the probe frequency response calibration parameters provided in this embodiment specifically includes the following steps:

[0113] Step S610: When the calibration system is not connected to the probe, the control signal generation unit outputs the first type of test signal and the second type of test signal in sequence according to the preset frequency sequence, and obtains the first set of amplitude measurement results corresponding to each frequency point of the first type of test signal and the first time domain waveform corresponding to each frequency point of the second test signal through the measurement unit synchronously.

[0114] Step S620: With the probe connected to the calibration system, the control signal generation unit outputs the first type of test signal and the second type of test signal in sequence according to the same preset frequency sequence, and obtains the second set of amplitude measurement results corresponding to each frequency point of the first type of test signal and the second time domain waveform corresponding to each frequency point of the second test signal through the measurement unit synchronously measuring.

[0115] Step S630: Normalize the first group of amplitude measurement results and the second group of amplitude measurement results respectively to obtain the first amplitude frequency response array and the second amplitude frequency response array corresponding to each frequency point.

[0116] Step S640: Perform frequency domain transformation and phase extraction on the first time domain waveform and the second time domain waveform respectively to obtain the first phase frequency response array and the second phase frequency response array corresponding to each frequency point.

[0117] Step S650: Perform division operations on the amplitude frequency response data corresponding to each frequency point in the second amplitude frequency response array and the first amplitude frequency response array respectively to obtain the gain calibration parameter array of the probe corresponding to each frequency point.

[0118] Step S660: Perform element-wise subtraction on the second phase frequency response array and the first phase frequency response array to obtain the phase calibration parameter array of the probe corresponding to each frequency point.

[0119] It should be noted that the method for determining probe frequency response calibration parameters provided in this embodiment is essentially a fusion and parallel implementation of the aforementioned methods for determining gain calibration parameters and phase calibration parameters. This method utilizes a first type of test signal (such as a swept-frequency sine wave) for point-by-point amplitude measurement and a second type of test signal (such as a fast-edge pulse) for time-domain waveform capture and phase extraction within a unified calibration process. By simultaneously executing measurements in both the probe-free and probe-connected stages, and performing normalization and division operations on the amplitude measurement results, and frequency domain transformation and phase subtraction operations on the time-domain waveform, a gain calibration parameter array and a phase calibration parameter array covering the entire frequency band are generated in one step. In practical applications, this fusion method design makes the calibration process highly flexible. Operators can selectively perform only gain calibration, only phase calibration, or both simultaneously to obtain complete probe frequency response characteristics, based on specific testing needs. This effectively improves testing efficiency and adapts to diverse measurement scenarios while ensuring calibration accuracy.

[0120] Furthermore, the specific implementation principles and processes of steps S610 to S660 can be found in the description of the above embodiments, and will not be repeated here to avoid repetition.

[0121] Figure 7 This is a schematic diagram of the structure of a measurement system provided in another embodiment of this application. Figure 7 As shown, the measurement system provided in this embodiment includes a probe 10 and an oscilloscope 20. The oscilloscope 20 is configured to acquire the probe 10 frequency response calibration parameters obtained by the method for determining the probe 10 frequency response calibration parameters provided in any of the above embodiments when the probe 10 is connected, and to use the calibration parameters to perform frequency response compensation on the measured signal acquired by the probe 10.

[0122] In this embodiment, the oscilloscope 20 is endowed with intelligent interaction and compensation capabilities. When the probe 10 is connected, the oscilloscope 20 can actively identify and acquire the probe frequency response calibration parameters determined by the aforementioned precise method that integrates gain and phase calibration. These calibration parameters quantify the amplitude attenuation characteristics and phase shift characteristics of the probe 10 across the entire operating frequency band. During actual measurement, the oscilloscope 20 uses these pre-stored calibration parameters to perform digital domain inverse frequency response compensation on the measured signal acquired and transmitted in real time by the probe 10, that is, to perform amplitude restoration and phase correction for each frequency component separately. In this way, the measurement system can eliminate the amplitude-frequency distortion and phase-frequency distortion introduced by the probe 10 itself, achieving end-to-end signal fidelity from the probe 10 front end to the oscilloscope 20 display terminal, ensuring that the final waveform can accurately reproduce the original state of the measured point, thereby improving the accuracy and reliability of the entire measurement system in complex signal testing.

[0123] Furthermore, in some embodiments, the oscilloscope 20 includes at least a parameter acquisition module 201 and a compensation processing module 202.

[0124] The parameter acquisition module 201 is configured to acquire the probe frequency response calibration parameters and the channel calibration parameters of the oscilloscope 20 itself when the probe 10 is connected.

[0125] The parameter acquisition module 201 is configured as the intelligent identification interface of the measurement system. When the probe 10 is connected to the oscilloscope 20, it acquires the probe frequency response calibration parameters (including gain and phase characteristics) determined by the aforementioned calibration method by digital communication with the probe 10 or by reading its internal storage chip. On the other hand, it retrieves its own channel calibration parameters (such as the inherent amplitude and phase characteristics of the input amplifier, analog-to-digital converter and internal links) from the local memory of the oscilloscope 20.

[0126] The compensation processing module 202 is configured to process the probe frequency response calibration parameters and the channel calibration parameters of the oscilloscope 20 itself, determine the compensation parameters corresponding to each frequency point, and use the compensation parameters to perform frequency response compensation on the measured signal.

[0127] The compensation processing module 202 is responsible for data fusion and real-time correction. First, it performs joint data processing on the two parameter sets provided by the parameter acquisition module 201, synthesizing the probe frequency response calibration parameters and the oscilloscope channel calibration parameters into global compensation parameters corresponding to each frequency point. This processing can be viewed as constructing an inverse filter, whose frequency response characteristics are inverse functions of the distortion characteristics of the entire measurement link (probe + oscilloscope channel). In actual measurement, when the measured signal enters the oscilloscope 20 through the probe 10, the compensation processing module 202 immediately calls upon these global compensation parameters to perform frequency-domain or time-domain deconvolution operations on the real-time acquired digital signal stream. This accurately eliminates all amplitude attenuation and phase shift from the tip of the probe 10 to the output of the analog-to-digital converter, ensuring that the final displayed waveform accurately reproduces the original signal characteristics of the measured point.

[0128] In some embodiments, the compensation processing module 202 is further configured to:

[0129] The calibration parameters of probe 10 and the channel calibration parameters stored in oscilloscope 20 are frequency-aligned to obtain the aligned probe frequency response calibration parameters.

[0130] Based on the aligned probe gain calibration parameters and channel gain calibration parameters, the actual gain of the measurement system is calculated. According to the relationship between the actual gain of the system and the preset ideal gain, gain compensation parameters are generated. The measured signal is then filtered using the gain compensation parameters to achieve gain frequency response compensation.

[0131] Furthermore, based on the aligned probe phase calibration parameters and channel phase calibration parameters, phase compensation parameters are generated, and the phase compensation parameters are used to perform phase correction on the measured signal to achieve phase frequency response compensation.

[0132] To address the potential frequency inconsistency between the probe calibration parameters and the channel calibration parameters stored internally in the oscilloscope, the compensation processing module 202 aligns the probe frequency response calibration parameters and the oscilloscope's own channel calibration parameters before compensation. This is achieved by mapping the two sets of data onto a unified frequency coordinate axis using interpolation or resampling algorithms, ensuring they have the same number of frequency points and frequency intervals, thus obtaining aligned probe frequency response calibration parameters. Based on this, for gain compensation, the module performs vector superposition of the aligned probe gain calibration parameters and channel gain calibration parameters to calculate the actual total gain of the measurement system at each frequency point. This actual gain is then compared point-by-point with a preset ideal gain (typically a flat 0dB reference) to generate gain compensation parameters. In actual measurements, these parameters are used to filter the measured signal, eliminating amplitude and frequency distortion introduced by the link. Meanwhile, for phase compensation, the module directly performs point-by-point subtraction (or phase superposition followed by inversion) on the aligned probe phase calibration parameters and channel phase calibration parameters to generate phase compensation parameters. These parameters are then used to correct the phase of the measured signal, thereby compensating for the group delay and phase distortion caused by the probe 10 and the channel reactive components. Through this method of separating gain and phase processing and then jointly compensating, the module ensures that the calibrated measurement system can simultaneously achieve a flat amplitude response and a linear phase response across the entire operating frequency band.

[0133] Understandably, the frequency response compensation mechanism of the measurement system is based on the probe frequency response calibration parameters obtained by the aforementioned precise method that integrates staged de-embedding measurement, gain and phase separation calibration, and steady-state and transient composite excitation. Because these calibration parameters accurately quantify the true amplitude attenuation and phase shift of the probe 10 at every frequency point across the entire operating frequency band by stripping away the test link's inherent error and extracting the probe 10's independent characteristics, the compensation processing module 202 constructs a compensation filter that is the inverse function of the probe 10's distortion characteristics, enabling precise reverse cancellation of the measured signal. The compensation process not only eliminates the amplitude-frequency distortion and phase-frequency nonlinearity introduced by the capacitive load and transmission delay at the probe 10's front end, but also seamlessly integrates with the oscilloscope 20's own channel calibration parameters, ensuring that the entire measurement link exhibits a flat amplitude response and a linear phase response in complex signal testing. Ultimately, the waveform displayed on the oscilloscope 20 screen highly reproduces the original state of the measured point in terms of amplitude, shape, and even timing relationships.

[0134] This application also provides a readable storage medium storing a program or instructions. When the program or instructions are executed by a processor, they implement various processes of any embodiment of the method for determining the probe frequency response calibration parameters described above, and achieve the same technical effect. To avoid repetition, they will not be described again here.

[0135] The processor can be a central processing unit (CPU), an application-specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of this application. The readable storage medium includes computer-readable storage media, such as computer read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk.

[0136] Those skilled in the art will understand that all or part of the functions of the various methods in the above embodiments can be implemented by hardware or by computer programs. When all or part of the functions in the above embodiments are implemented by computer programs, the program can be stored in a computer-readable storage medium, which may include: read-only memory, random access memory, disk, optical disk, hard disk, etc., and the program is executed by a computer to achieve the above functions. For example, the program can be stored in the memory of a device, and when the program in the memory is executed by the processor, all or part of the above functions can be achieved. In addition, when all or part of the functions in the above embodiments are implemented by computer programs, the program can also be stored in a server, another computer, disk, optical disk, flash drive, or external hard drive, etc., and can be downloaded or copied to the memory of a local device, or the system of the local device can be updated. When the program in the memory is executed by the processor, all or part of the functions in the above embodiments can be achieved.

[0137] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art, under the guidance of this application, can make several simple deductions, modifications or substitutions based on the spirit of this application and the scope of protection of the claims without departing from the spirit of this application and the claims. All of these are within the protection scope of this application.

Claims

1. A method for determining probe frequency response calibration parameters, characterized in that, include: Obtain a reference frequency response dataset of the calibration system to the test signal when the probe is not connected; Obtain the system frequency response dataset of the calibration system in response to the same test signal when the probe is connected; De-embedding calculations are performed on the reference frequency response dataset and the system frequency response dataset to determine the frequency response calibration parameters of the probe; The test signals cover the entire operating frequency band of the probe and include at least one of a first type of test signal for exciting the steady-state amplitude response and a second type of test signal for exciting the transient phase response; the reference frequency response dataset and the system frequency response dataset both include amplitude frequency response data and / or phase frequency response data corresponding to multiple frequency points.

2. The method for determining probe frequency response calibration parameters according to claim 1, characterized in that, The calibration system includes at least a signal generation unit for generating test signals and a measurement unit for measuring frequency response; The reference frequency response dataset of the calibration system's response to the test signal when no probe is connected includes: The signal generation unit is controlled to output the first type of test signal in sequence according to a preset frequency sequence, and the measurement unit synchronously measures the signal amplitude value corresponding to each frequency point to obtain the first set of amplitude measurement results. And / or, control the signal generation unit to output the second type of test signal, and capture the corresponding first time-domain waveform through the measurement unit.

3. The method for determining the probe frequency response calibration parameters according to claim 2, characterized in that, The acquisition of the system frequency response dataset of the calibration system in response to the same test signal when the probe is connected includes: The signal generation unit is controlled to output the first type of test signal sequentially according to the same preset frequency sequence, and the measurement unit synchronously measures the signal amplitude value corresponding to each frequency point to obtain the second set of amplitude measurement results. And / or, control the signal generation unit to output the second type of test signal, and capture the corresponding second time-domain waveform through the measurement unit.

4. The method for determining the probe frequency response calibration parameters according to claim 3, characterized in that, Also includes: Select any frequency point as a reference point, and based on the signal amplitude value corresponding to the reference point, normalize the first group of amplitude measurement results and the second group of amplitude measurement results respectively. Generate the first amplitude frequency response array and the second amplitude frequency response array corresponding to each frequency point.

5. The method for determining the probe frequency response calibration parameters according to claim 4, characterized in that, The step of performing de-embedding calculations on the reference frequency response dataset and the system frequency response dataset to determine the frequency response calibration parameters of the probe includes: The amplitude frequency response data corresponding to each frequency point in the second amplitude frequency response array and the first amplitude frequency response array are divided to obtain the gain calibration parameter array of the probe corresponding to each frequency point.

6. The method for determining the probe frequency response calibration parameters according to claim 3, characterized in that, Also includes: Perform frequency domain transformation on the first time-domain waveform and the second time-domain waveform respectively; Based on the transformation results, the first set of phase values ​​and the second set of phase values ​​corresponding to each frequency point are extracted to generate the first phase frequency response array and the second phase frequency response array.

7. The method for determining probe frequency response calibration parameters according to claim 6, characterized in that, The step of performing de-embedding calculations on the reference frequency response dataset and the system frequency response dataset to determine the frequency response calibration parameters of the probe includes: The second phase frequency response array and the first phase frequency response array are subtracted element by element to obtain the phase calibration parameter array of the probe corresponding to each frequency point.

8. The method for determining probe frequency response calibration parameters according to claim 2, characterized in that, The signal generation unit includes a radio frequency signal source and a fast-edge pulse generator; The radio frequency signal source is used to output a frequency scanning sine wave signal covering the entire operating frequency band of the probe as the first type of test signal; the fast edge pulse generator is used to output a fast edge pulse signal covering the entire operating frequency band of the probe as the second type of test signal; the measurement unit is an oscilloscope.

9. A measurement system, characterized in that, include: probe; An oscilloscope is configured to, when the probe is connected, acquire probe frequency response calibration parameters obtained by the method for determining probe frequency response calibration parameters as described in any one of claims 1 to 8, and use the probe frequency response calibration parameters to perform frequency response compensation on the measured signal acquired through the probe.

10. The measurement system according to claim 9, characterized in that, The oscilloscope includes: The parameter acquisition module is configured to acquire the probe frequency response calibration parameters and the oscilloscope's own channel calibration parameters when the probe is connected. The compensation processing module is configured to process the probe frequency response calibration parameters and the oscilloscope's own channel calibration parameters to determine the compensation parameters corresponding to each frequency point, and to use the compensation parameters to perform frequency response compensation on the measured signal.

11. The measurement system according to claim 10, characterized in that, The compensation processing module is also configured to: The calibration parameters of the probe and the channel calibration parameters stored in the oscilloscope are aligned at frequency points to obtain aligned probe frequency response calibration parameters. Based on the aligned probe gain calibration parameters and channel gain calibration parameters, the actual gain of the measurement system is calculated. According to the relationship between the actual gain of the system and the preset ideal gain, gain compensation parameters are generated. The measured signal is then filtered using the gain compensation parameters to achieve gain frequency response compensation. And / or, based on the aligned probe phase calibration parameters and channel phase calibration parameters, a phase compensation parameter is generated, and the phase compensation parameter is used to perform phase correction on the measured signal to achieve phase frequency response compensation.

12. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer-executable program or instructions, which, when executed by a processor, are used to implement the method for determining the probe frequency response calibration parameters as described in any one of claims 1 to 8.

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