Test method, system, computer device, storage medium and program product

Abstract

Embodiments of the present application relate to the technical field of testing, and particularly relate to a testing method, system, computer device, storage medium and program product. The method comprises: corresponding to different models of a device under test and corresponding general testing equipment, pre-configuring corresponding test track points and setting corresponding test parameters, and storing them in a composite controller; according to the model of the current device under test, sending a running instruction to the composite controller, so that the composite controller controls the current device under test and the testing equipment to test according to the corresponding test track points and test parameters. In this way, for different models of the device under test, the corresponding test track points and test control programs can be loaded by selecting the model, without the need to write a debugging test program before each test, thereby effectively improving the testing efficiency.

Description

Technical Field

[0001] This application relates to the field of testing technology, and in particular to testing methods, systems, computer equipment, storage media, and program products. Background Technology

[0002] Grinding slewing machines and other grinding equipment are common in factories such as automobile plants. For example, in welding, because electrodes can wear and oxidize during the welding process, affecting weld quality, grinding slewing machines can be used to dress spot welding electrode tips, removing impurities and worn parts from the electrode surface to ensure weld quality. In machining, grinding slewing machines are used to dress grinding wheels, maintaining their sharp cutting edges and correct shape to ensure the precision and efficiency of grinding processes. Therefore, grinding slewing machines are an important auxiliary device.

[0003] In response to this, some related technologies check whether the sensor signals, control signals, and mechanical operation of the grinding machine meet the factory conditions before it leaves the factory to reduce installation and commissioning failures. However, existing technologies still suffer from low testing efficiency for grinding machines. Summary of the Invention

[0004] The purpose of this application is to provide testing methods, systems, computer equipment, storage media, and program products that effectively improve the testing efficiency of grinding machines.

[0005] The objective of this application is achieved through the following technical solution: In a first aspect, embodiments of this application provide a testing method applied to the control terminal of a testing system, the testing system further including at least a composite controller, a device under test (DUT), and a testing device; the method includes: pre-configuring corresponding test trajectory points for different models of DUTs and corresponding general-purpose testing devices, and storing them in the composite controller; wherein, the testing device includes a servo driver and a multi-axis actuator; setting corresponding test parameters for different models of DUTs and storing them in the composite controller; sending a run command to the composite controller according to the model of the current DUT, so as to control the current DUT and the testing device to perform tests according to the corresponding test trajectory points and test parameters through the composite controller, including: the composite controller sending corresponding test trajectory points and test parameters to the current DUT and the testing device according to the run command, the servo driver driving the multi-axis actuator to place the DUT on the test point of the current DUT, and simultaneously controlling the current DUT to execute the corresponding test parameters to complete the working condition test at the corresponding position.

[0006] In some embodiments, the method includes: during the test, monitoring the current operating status of the device under test and the test device, and issuing an alarm when an execution command is issued but no corresponding feedback signal is received.

[0007] In some embodiments, the method includes: before testing, sending a jog command to the composite controller to determine that the current device under test meets the test conditions based on the feedback signal returned by the current device under test performing the jog operation.

[0008] In some embodiments, the method includes: setting a preset number of tests; and controlling the device under test to perform a corresponding number of tests according to the preset number of tests.

[0009] In some embodiments, the method includes: determining the stability of the current device under test based on the recorded test results of the current device under test.

[0010] Secondly, embodiments of this application provide a testing system, which includes at least a composite controller, a control terminal, a device under test (DUT), and a testing device. The testing device includes a servo driver and a multi-axis actuator. The control terminal is used to pre-configure a test set and store it in the composite controller, and to send a running instruction to the composite controller according to the model of the current DUT. The test set includes test trajectory points and test parameters for different models of DUTs and corresponding general-purpose testing devices. The composite controller is used to send corresponding test trajectory points and test parameters to the current DUT and the testing device according to the running instruction sent by the control terminal. The servo driver is used to drive the multi-axis actuator to place the DUT on the test point of the current DUT, and simultaneously control the current DUT to execute the corresponding test parameters to complete the working condition test at the corresponding position.

[0011] In some embodiments, the test device further includes: a first protocol processing module; the first protocol processing module is configured to convert the protocol format sent by the sender in the test system into the protocol format received by the receiver.

[0012] Thirdly, embodiments of this application provide a computer device, including: a memory and a processor, wherein the memory stores at least one computer program, and the at least one computer program is loaded and executed by the processor to implement the method as described in any one of the first aspects.

[0013] Fourthly, embodiments of this application provide a computer storage medium for storing a program, wherein the program, when running, controls the device where the computer storage medium is located to execute the method described in any one of the first aspects.

[0014] Fifthly, embodiments of this application provide a computer program product for implementing the method as described in any one of the first aspects.

[0015] This application provides a testing method, system, computer equipment, storage medium, and program product. By pre-configuring corresponding test trajectory points for different models of the device under test, this application enables the loading of corresponding test trajectory points and test control programs for different models of the device under test by selecting the model, thus eliminating the need to write and debug test programs before each test and effectively improving testing efficiency. Attached Figure Description

[0016] This application will be further described below with reference to the accompanying drawings and specific embodiments.

[0017] Figure 1 This is a schematic diagram of a test grinder provided in an embodiment of this application.

[0018] Figure 2 This is a flowchart illustrating a testing method provided in an embodiment of this application.

[0019] Figure 3 This is an example diagram of a grinding tool provided in an embodiment of this application.

[0020] Figure 4 This is a schematic diagram of a configuration interface provided in an embodiment of this application.

[0021] Figure 5 This is a schematic diagram of an operating parameter provided in an embodiment of this application.

[0022] Figure 6 This is a schematic diagram of an abnormal interface provided in an embodiment of this application.

[0023] Figure 7 This is a schematic diagram of the structure of a testing system provided in an embodiment of this application.

[0024] Figure 8 This is a schematic diagram of the structure of a control system provided in an embodiment of this application.

[0025] Figure 9 This is a flowchart illustrating another testing method provided in an embodiment of this application.

[0026] Figure 10This is a structural block diagram of a computer device provided in an embodiment of this application. Detailed Implementation

[0027] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0028] In the description of the embodiments of this application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, features defined with "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0029] Understandably, for example, in the welding field, the welding quality is affected by factors such as wear and oxidation of the electrodes during the welding process. A shaving tool can be used to repair the spot welding electrode head, removing impurities and worn parts from the electrode surface to ensure weld quality. To reduce installation and debugging failures of the shaving tool and improve the accuracy of spot welding electrode head grinding, the sensor signals, control signals, and mechanical operation of the shaving tool are checked before leaving the factory to ensure they meet factory requirements.

[0030] See Figure 1 , Figure 1 This is a schematic diagram of a test grinder provided in an embodiment of this application.

[0031] like Figure 1 As shown, the scenario may include a testing system and an operator 101. The testing system may include a testing device 102, a device under test (DUT) 103, and a control terminal 104. The testing device 102 can be used to test the DUT 103. Before the test begins, the operator 101 can set a corresponding test program on the control terminal 104 according to the model of the DUT 103. This program may include the number of tests, the test location, and the test time. After the test starts, the operator 101 can trigger a start operation on the control terminal 104, which will then send a run command to the testing device 102 in response to the operation. The testing device 102 can control the DUT 103 in response to the run command, and the DUT 103 will perform the test according to the set test program and generate test results.

[0032] In some embodiments, after the current device under test 103 has been tested, the operator can set the corresponding test program again on the control terminal 104 according to the model of the next device under test. However, for situations where a large number of devices under test need to be factory tested, if the operator 101 frequently sets test programs for different models of devices under test, it will greatly affect the testing efficiency of the devices under test.

[0033] See Figure 2 , Figure 2 This is a flowchart illustrating a testing method provided in an embodiment of this application.

[0034] This application provides a testing method applied to the control terminal of a testing system, wherein the testing system further includes at least a composite controller, a device under test, and a testing device. The method includes steps S101-S103: S101: For different models of the device under test and corresponding general-purpose testing equipment, the corresponding test trajectory points are pre-configured and stored in the composite controller. The testing equipment includes a servo driver and a multi-axis actuator.

[0035] S102: For different models of the device under test, set the corresponding test parameters and store them in the composite controller; S103: Based on the model of the current device under test, send an operation command to the composite controller to control the current device under test and the test equipment to perform tests according to the corresponding test trajectory points and test parameters. This includes: the composite controller sending the corresponding test trajectory points and test parameters to the current device under test and the test equipment according to the operation command; the servo driver driving the multi-axis actuator to place the device under test on the test point of the current device under test; and simultaneously controlling the current device under test to execute the corresponding test parameters to complete the working condition test at the corresponding position.

[0036] In some embodiments, the control terminal may be an electronic device (also referred to as a terminal), including a computer. In this regard, operations can be performed on the control terminal, which then sends corresponding instructions to the composite controller to perform the test on the device under test.

[0037] The device under test may include equipment for grinding and adjusting the workpiece, such as a grinder, used to trim the spot welding electrode head, remove impurities and worn parts from the electrode surface, and ensure the quality of the weld. For example, such as... Figure 3 As shown, the grinder can be either a vertically operating grinder or a horizontally operating grinder. Obviously, the working points (e.g., grinding point, cap removal point, and cap installation point) of the two types of grinders are not exactly the same, so their test trajectory points are also different.

[0038] In some embodiments, before testing the device under test (DUT), corresponding test trajectory points can be configured in response to the operator's configuration operation, depending on the model of the DUT. For example... Figure 4 The configuration interface shown exemplifies this: operators can configure the preparation point positions as {146.21, 160.32, 270.79}, the capping safety point positions as {81.88, 166.10, 151.53}, etc., according to the model of the device under test. Depending on the model of the device under test, the operator can sequentially configure the settings... Figure 4 The example configuration page configures the corresponding test trajectory points. Afterwards, in response to the operator completing the configuration, the control unit sends the model of the device under test and the corresponding test trajectory points to the composite controller for storage.

[0039] In some embodiments, in response to operator settings, corresponding test parameters can be set for different models of the device under test. Then, in response to the operator completing the configuration, the control unit can send the model of the device under test and the corresponding test parameters to the composite controller for storage.

[0040] Multi-axis actuators can be, for example, robots with three or more axes. Multi-axis actuators can mount the device under test onto the fixed fixture of the test platform, and then the operator can connect the power lines, communication lines and IO (input / output) lines of the device under test.

[0041] In some embodiments, the operator can select the model of the device under test (DUT) on the control terminal and trigger an activation operation. In response to the activation operation, the control terminal sends a run command to the composite controller, which in turn sends control commands to the servo driver and sends test parameters and test points to the DUT. The servo driver can then drive a multi-axis actuator to place the spot welding electrode head (DUT) onto the DUT according to the received control commands.

[0042] Furthermore, after detecting that the spot welding electrode head is placed on the current device under test (DUT), the DUT can re-grind the spot welding electrode head according to the received test parameters and test points, and can transmit the operating parameters of the re-grinding process to the control terminal through the composite controller. For example, Figure 5As shown in the example, operating parameters may include current torque, current position, and cumulative wear amount. Once wear is complete, the operator can switch to testing other models of the device under test by selecting the model on the control panel. This eliminates the need to set up test programs for different models of the device under test; simply selecting the model on the control panel allows for direct testing, effectively improving testing efficiency.

[0043] In some embodiments, the method includes: during the test, monitoring the current operating status of the device under test and the test device, and issuing an alarm when an execution command is issued but no corresponding feedback signal is received.

[0044] In some embodiments, when the control terminal detects that it has sent an operation command to the current device under test (DUT) and the test equipment via the composite controller, but the DUT and / or the test equipment do not respond with a corresponding signal, an alarm is triggered to prompt the operator to check whether the wiring and settings are correct. In response, the control terminal can display a message to the operator. Figure 6 The example error interface alerts operators to the time, category, status, and description of any anomalies. For instance, the control unit might detect an abnormal motor operation in the tested device at 4:08 PM.

[0045] In some embodiments, before testing, a jog command is sent to the composite controller to determine whether the current device under test meets the test conditions based on the feedback signal returned by the current device under test performing the jog operation.

[0046] In some embodiments, before testing the device under test (DUT), a jog test is performed to determine if the DUT meets the testing conditions and can be tested. Specifically, the control unit can respond to the operator's jog operation to test the already placed DUT, checking whether the DUT's clamping fixture is clamped, the welding torch is open, and the DUT is controllable. For example, in response to the operator's jog operation, the control unit can send a jog command to the composite controller, which then sends corresponding control commands to the DUT and the servo driver. Afterward, the DUT can return information about whether the clamping fixture is clamped based on sensor signals via the composite controller. It can be understood that if the DUT's clamping fixture is clamped, the welding torch is open, and the DUT is controllable, the control unit can determine that the DUT can be tested. This indicates that the sensor and control signals of the DUT are normal.

[0047] In some embodiments, the method includes: setting a preset number of tests; and controlling the device under test to perform a corresponding number of tests according to the preset number of tests.

[0048] In some embodiments, the number of tests can also be set in the control terminal. When the control terminal determines that the current device under test meets the test conditions, it can automatically trigger the execution of the current device under test for the corresponding number of tests according to the set number of tests, such as the current device under test performing 1000 tests continuously.

[0049] In some embodiments, the method includes: determining the stability of the current device under test based on the recorded test results of the current device under test.

[0050] During the testing process of the device under test (DUT) for a certain number of tests, the control terminal can record the test results and determine the stability. For example, if a failure occurs once out of 1000 tests, it can be determined that the DUT is stable.

[0051] See Figure 7 , Figure 7 This is a schematic diagram of the structure of a testing system provided in an embodiment of this application.

[0052] This application provides a testing system, which includes at least a composite controller, a control terminal, a device under test, and a testing device; wherein the testing device includes a servo driver and a multi-axis actuator.

[0053] The control terminal is used to pre-configure a test set and store it in the composite controller, and to send a running command to the composite controller according to the model of the device under test. The test set includes test trajectory points and test parameters for different models of devices under test and corresponding general test equipment.

[0054] The composite controller is used to send corresponding test trajectory points and test parameters to the current device under test and the test equipment according to the operation instructions sent by the control terminal.

[0055] The servo driver is used to drive the multi-axis actuator to place the test piece on the test point of the current device under test, and at the same time control the current device under test to execute the corresponding test parameters to complete the working condition test at the corresponding position.

[0056] In some embodiments, the test equipment further includes a first protocol processing module. The first protocol processing module is configured to convert the protocol format sent by the sender in the test system into a protocol format received by the receiver.

[0057] It is understandable that different parts of the test system may use different protocol formats, and different models of the device under test may also use different protocol formats. Therefore, to improve testing efficiency, by setting up a first protocol processing module in the test system, seamless transmission of instructions and information between different parts of the test system can be achieved.

[0058] In some embodiments, this application also provides a control system, disposed in a control terminal, whereby an operator can trigger corresponding operations. The control terminal, in response to the operator's operation, sends corresponding instructions to the composite controller to control the device under test for testing. For example... Figure 8 The schematic diagram of the control system shown in the example can specifically include: a position configuration module, a test parameter setting module, a jog control module, an automatic operation control module, a second protocol processing module, and a status processing module.

[0059] In some embodiments, the position configuration module can be used to pre-configure the corresponding test trajectory points for different models of devices under test (DUTs) in the test set and store them in the composite controller, so that the current DUT is tested according to the corresponding test trajectory points. Before testing the DUT, the position configuration module can also respond to the configuration operation performed by the operator on the control terminal and configure the corresponding test trajectory points according to different models of DUTs. The test trajectory points can include at least stationary boom points, boom points, and safety points, such as those mentioned above. Figure 4 The examples include the safety position for attaching the cap, the stationary arm position for attaching the cap, and the moving arm position for attaching the cap.

[0060] In some embodiments, the position configuration module can also be used to update, teach, and jump test trajectory points. In some specific application scenarios, before or during testing, the position configuration module can respond to the operator's modification operation of the test trajectory points and update the original test trajectory points. Alternatively, based on the test trajectory points configured by the position configuration module, the operator can also trigger a teaching operation, in which the position configuration module sends corresponding control commands to the composite controller, causing the composite controller to control the servo driver to drive the multi-axis actuator to learn the teaching operation. Or, the operator can also trigger a jump operation based on a selected point, in which the position configuration module sends corresponding control commands to the composite controller, causing the composite controller to control the servo driver to drive the multi-axis actuator to quickly jump from the current position to the selected position.

[0061] In response to this, when the location needs to be changed, there is no need to rewrite the test program. The test trajectory points can be updated, taught, and quickly switched by simply responding to the change operation through the location configuration module, which effectively improves the convenience and efficiency of testing.

[0062] In some embodiments, the test parameter setting module can respond to setting operations performed by the operator on the control terminal, set corresponding test parameters according to different models of the device under test, and store them in the composite controller. The test parameters may include at least test time, torque, and speed.

[0063] In some embodiments, the jog control module can be used to send jog commands to the composite controller to determine whether the device under test (DUT) meets the test conditions based on the feedback signal returned by the DUT performing the jog operation. Meeting the test conditions may include the DUT's fixture being in a clamped state, the welding torch being in an open state, and the DUT being in a controllable state.

[0064] In some embodiments, the automatic operation control module can be used to perform a corresponding number of tests according to a preset number of tests, provided that the jog control module determines that the current device under test (DUT) meets the automatic testing requirements. The second protocol processing module can be used to process and monitor the communication protocols of various modules in the client. The stability testing module can be used to determine the stability of the current DUT based on its operating status during the corresponding number of tests. The status processing module can be used to monitor the operating status of the current DUT during the testing process.

[0065] It is understandable that different models of the device under test may have different communication protocols. In this regard, the second protocol processing module can convert the protocol of the signal sent by the control terminal into a protocol that the device under test can receive, and complete the address mapping to ensure that the instructions sent by the control terminal can be accurately recognized by the device under test.

[0066] In the above embodiments, the device under test can be automatically tested for a long time through the control terminal, which can improve the convenience of operation for operators and improve the efficiency of testing.

[0067] Therefore, in the embodiments of this application, in Figure 7 Based on the example test system, a control system can be built at the control end to configure test programs for at least some different models of the device under test (DUT) before testing. This allows for automatic testing of the DUT simply by selecting its model when testing begins. Consequently, it eliminates the need to frequently configure test programs for different DUT models, effectively improving testing efficiency.

[0068] In some specific application scenarios, Figure 9A flowchart illustrating another testing method is shown. This method can be applied to the aforementioned control terminal and testing system. Taking a grinder as the device under test, specifically, the method may include: a multi-axis motion actuator suspending the grinder onto a fixed fixture on the testing platform, and determining whether the fixture is closed via jogging. Afterwards, the operator can connect the grinder's power lines, communication lines, and I / O (input / output) lines. Before testing the grinder, the jogging control module can perform jogging detection to determine if the grinder meets the testing conditions and can be tested. Furthermore, the position configuration module can respond to the operator's configuration operations, configuring corresponding test trajectory points according to different grinders, and can also be used to update, teach, and jump test trajectory points in response to the operator's position change operations.

[0069] Furthermore, once it's confirmed that the grinding tool is ready for testing, the operator can select the model of the device under test (DUT) on the control terminal and trigger the start-up operation. The control terminal responds to the operator's start-up operation by sending a run command to the composite controller, which in turn sends control commands to the servo driver and test parameters and test points to the grinding tool. The servo driver, based on the received control commands, drives the multi-axis actuator to place the spot welding electrode head (DUT) onto the DUT. The grinding tool can then grind the spot welding electrode head according to the received test parameters and test points, and can transmit the running parameters of the grinding process to the control terminal via the composite controller. During this process, the automatic operation control module can be triggered to perform the corresponding number of tests on the DUT according to the set number of tests, and the stability test module records the number of tests performed on the DUT to determine its stability. After the test is completed, the fixture automatically opens, allowing the next grinding tool to be used for testing.

[0070] Understandably, after replacing the next grinding tool, the operator can simply select the corresponding model on the control terminal without having to rewrite the debugging and testing program, which effectively improves the efficiency of testing.

[0071] One embodiment of this application also provides a computer device, the computer device including a memory and a processor, the memory storing at least one computer program, the at least one computer program being loaded and executed by the processor to implement the test method as described above.

[0072] One embodiment of this application also provides a computer-readable storage medium storing at least one computer program that, when executed by a processor, can implement the test method as described above.

[0073] One embodiment of this application also provides a computer program product for implementing the testing method as described above.

[0074] See Figure 10 , Figure 10 This is a structural block diagram of a computer device provided in an embodiment of this application.

[0075] The computer device may include: a memory 110, a processor 120, and a communication interface 130. The memory 110, the processor 120, and the communication interface 130 are connected through internal connection paths.

[0076] The memory 110 is used to store computer programs, which in some implementations may include code for implementing the methods of the embodiments of this application.

[0077] The processor 120 executes the computer program stored in the memory 110 to control the communication interface 130 to receive input data and information, and output operation results and other data. In some implementations, when the solutions of the embodiments of this application are implemented by software or firmware, the computer program used to implement the solutions of the embodiments of this application can be stored in the processor 120 and executed by the processor 120.

[0078] The memory 110 may be volatile memory or non-volatile memory, or may include both volatile and non-volatile memory. The non-volatile memory may be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. The volatile memory may be random access memory (RAM). It should be noted that the memory 110 described herein is intended to include, but is not limited to, any memory of these and other suitable types. As an example, the memory 110 includes random access memory (RAM), cache memory, and read-only memory (ROM). The memory 110 stores a computer program that can be executed by processor 120, causing processor 120 to implement the steps of any of the methods described above.

[0079] The processor 120 can be a central processing unit (CPU), or it can be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor, or the processor 120 can be any conventional processor.

[0080] In implementation, each step of the above method can be completed by the integrated logic circuitry of the hardware in the processor 120 or by instructions in software form. The method disclosed in the embodiments of this application can be directly implemented by the hardware processor, or by a combination of hardware and software modules in the processor 120. The software modules can be located in mature storage media in the art, such as random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, or registers. This storage medium is located in the memory 110, and the processor 120 reads the information in the memory 110 and, in conjunction with its hardware, completes the steps of the above method. To avoid repetition, detailed descriptions are not provided here.

[0081] In some implementations, in addition to the hardware units described above, computer devices may also include software modules, such as operating systems, basic input / output systems (BIOS), and application software.

[0082] An operating system is used to manage one or more of the hardware and software resources of a computer device; it is the kernel and foundation of the computer device. The operating system handles fundamental tasks such as managing and configuring memory, determining the priority of system resource allocation and demand, controlling input and output devices, operating the network, and managing the file system. To facilitate user operation, most operating systems provide a user interface for interaction with the system.

[0083] The BIOS is used to perform hardware initialization during the power-on boot phase and to provide runtime services for the operating system and applications. In some implementations, the BIOS can also monitor and display processor temperature and execute temperature protection strategies.

[0084] Application software, also known as an application program, can be understood as software written for a specific user application purpose, and is one of the main categories of computer software. For example, application software can be a program used to achieve purposes such as power control and temperature management.

[0085] It is understood that the specific examples in this application are only intended to help those skilled in the art better understand the implementation of this application, and are not intended to limit the scope of protection of this application.

[0086] It is understood that in the various embodiments of this application, the sequence number of each process does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of this application.

[0087] It is understood that the various implementation methods described in this application can be implemented individually or in combination, and this application does not limit them.

[0088] Unless otherwise stated, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to limit the scope of this application. The term "one or more" as used in this application includes any and all combinations of one or more of the associated listed items. The singular forms "a," "the," and "the" as used in this application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise.

[0089] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0090] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes and beneficial effects of the embodiments described above can be referred to the corresponding processes and beneficial effects in other embodiments, and will not be repeated here.

[0091] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0092] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of the technical solution in this application, depending on actual needs.

[0093] In addition, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0094] If a function is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, essentially, or the part that contributes to the prior art, or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0095] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A testing method, characterized in that, The method is applied to a control terminal in a testing system, wherein the testing system at least includes a composite controller, a device under test (DUT), and testing equipment; the method includes: For different models of the device under test and corresponding general testing equipment, the corresponding test trajectory points are pre-configured and stored in the composite controller; wherein, the testing equipment includes a servo driver and a multi-axis actuator; For different models of the device under test, the corresponding test parameters are set and stored in the composite controller; Based on the model of the device under test (DUT), a running command is sent to the composite controller to control the DUT and the test equipment to perform tests according to the corresponding test trajectory points and test parameters. This includes: the composite controller sending the corresponding test trajectory points and test parameters to the DUT and the test equipment according to the running command; the servo driver driving the multi-axis actuator to place the device under test (DUT) on the test point of the DUT; and simultaneously controlling the DUT to execute the corresponding test parameters to complete the working condition test at the corresponding position.

2. The method according to claim 1, characterized in that, The method includes: During the test, the operating status of the device under test and the test device is monitored. If an execution command is issued but no corresponding feedback signal is received, an alarm is issued.

3. The method according to claim 1, characterized in that, The method includes: Before testing, a jog command is sent to the composite controller to determine whether the current device under test meets the test conditions based on the feedback signal returned by the current device under test after performing the jog operation.

4. The method according to claim 1, characterized in that, The method includes: Preset number of tests; The device under test is controlled to perform a corresponding number of tests according to a preset number of tests.

5. The method according to claim 1, characterized in that, The method includes: Based on the recorded test results of the current device under test, the stability of the current device under test is determined.

6. A testing system, characterized in that, The testing system includes at least a composite controller, a control terminal, a device under test, and testing equipment; wherein the testing equipment includes a servo driver and a multi-axis actuator. The control terminal is used to pre-configure the test set and store it in the composite controller, and to send operation instructions to the composite controller according to the model of the device under test; wherein, the test set includes: test trajectory points and test parameters corresponding to different models of devices under test and corresponding general test equipment; The composite controller is used to send corresponding test trajectory points and test parameters to the current device under test and the test equipment according to the operation instructions sent by the control terminal; The servo driver is used to drive the multi-axis actuator to place the test piece on the test point of the current device under test, and at the same time control the current device under test to execute the corresponding test parameters to complete the working condition test at the corresponding position.

7. The testing system according to claim 6, characterized in that, The testing equipment further includes: a first protocol processing module; The first protocol processing module is used to convert the protocol format sent by the sender in the test system into the protocol format received by the receiver.

8. A computer device, characterized in that, include: A memory and a processor, wherein the memory stores at least one computer program, the at least one computer program being loaded and executed by the processor to implement the method as described in any one of claims 1 to 5.

9. A computer storage medium, characterized in that, The computer storage medium is used to store a program, wherein, when the program is running, it controls the device where the computer storage medium is located to execute the method according to any one of claims 1 to 5.

10. A computer program product, characterized in that, The computer program product is used to implement the method as described in any one of claims 1 to 5.

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