A method and system for scatter detection of surface defects of a curved optical element
CN122217990BActive Publication Date: 2026-08-28XIAMEN METROLOGICAL VERIFICATION & TESTING INST +1
Patent Information
- Application Number
- CN202610681785.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-18
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2046-05-18
AI Technical Summary
Technical Problem
然而,上述散射理论模型建立在平面假设之上,当检测对象是曲面元件时,由于曲率导致局部入射与散射角在空间中连续变化,基于固定角度条件建立的平面散射模型将不再适用
Benefits of technology
[0017]本发明提出了一种曲面光学元件表面缺陷的散射检测方法和系统,通过预聚焦补偿光路与基于离散化微面元的曲面散射物理模型相结合,将平面Rayleigh-Rice理论严格扩展到曲面元件,解决了小曲率半径下镜面反射光发散淹没缺陷散射信号以及平面散射理论直接不适用的两大技术瓶颈。在入射角30°、光斑直径2-4mm的优化配置下,系统对多种曲率半径透镜的表面微米级缺陷识别准确率达到96.7%,缺陷分类准确率达到98.66%。与现有技术相比,本发明不仅实现了镜面光与散射光的有效空间分离,还通过模型驱动的参数优化和五个具有明确物理意义的频域特征实现了高精度、定量、可解释的缺陷识别与分类,为高端曲面光学元件表面质量评估提供了理论依据与工程化解决方案。
✦ Generated by Eureka AI based on patent content.
Smart Images

Figure CN122217990B_ABST
Abstract
The application provides a curved surface optical element surface defect scattering detection method and system, which comprises the following steps: setting a pre-focusing incident light beam in a detection light path, so that the incident light beam forms a virtual object point behind the curved surface optical element; adjusting the distance from the virtual object point to the vertex of the curved surface to satisfy a conjugate relationship with the distance from the detector to the vertex of the curved surface; discretizing the illuminated local curved surface region into an array of micro surface elements; calculating the projection of the unit vector of the scattered light and the unit vector of the incident light on the local tangent plane of each micro surface element to establish a local spatial frequency mapping relationship; performing surface-detector geometric modeling, micro surface BRDF calculation, radiation transmission and irradiance calculation of the scattered light field, constructing a curved surface scattering physical model and reconstructing the irradiance distribution on the detector target surface; performing total integral scattering processing on the irradiance distribution to identify defects, extracting the power spectral density of the defect region to obtain five frequency domain characteristic values, and inputting the five frequency domain characteristic values into a machine learning classifier for defect classification.
Need to check novelty before this filing date? Find Prior Art
Citation Information
Patent Citations
Light field surface defect identification system and method based on multi-angle scattering
CN121120579A
Apparatus and method for optical inspection
US20070121106A1
