Near field communication device testing fixtures, systems, methods, devices, and media

Abstract

This specification provides a near-field communication (NFC) device testing fixture, system, method, apparatus, and medium. The solution includes: a near-field coupling antenna for near-field electromagnetic coupling with the near-field communication antenna of the device under test (DUT); a radio frequency (RF) switch electrically connected to the near-field coupling antenna; and a control unit communicatively connected to the RF switch, configured to: in response to a control command, control the RF switch to connect the near-field coupling antenna to a network analyzer to perform passive RF performance testing of the DUT; and control the RF switch to connect the near-field coupling antenna to a near-field communication reader / writer to perform active interactive testing of the DUT.

Description

Technical Field

[0001] This specification relates to the field of device testing technology, and particularly to testing fixtures for near-field communication devices. This specification also relates to near-field communication device testing systems, near-field communication device testing methods, a computing device, and a computer-readable storage medium. Background Technology

[0002] Near Field Communication (NFC) technology is widely used in smart terminals, IoT devices, payment cards, and other fields. In the mass production of NFC devices, it is necessary to test the radio frequency performance of the products to ensure that they can reliably communicate with devices such as card readers or mobile phones in actual use. Common test items include antenna parameter measurement and communication function verification. These tests typically require the use of different test instruments or equipment.

[0003] In production line testing scenarios, test fixtures need to be adaptable to different test items. Therefore, it is necessary to provide a test fixture with a reasonable structure and integrated functions to support various types of radio frequency performance tests on near-field communication devices. Summary of the Invention

[0004] In view of this, one or more embodiments of this specification provide near-field communication device test fixtures, systems, methods, devices and media to support various types of radio frequency performance tests on near-field communication devices.

[0005] According to a first aspect of one or more embodiments of this specification, a near-field communication device test fixture is provided, comprising: A near-field coupling antenna is used for near-field electromagnetic coupling with the near-field communication antenna of the device under test. A radio frequency switch is electrically connected to the near-field coupling antenna; The control unit, communicatively connected to the RF switch, is configured to: in response to a control command, control the RF switch to connect the near-field coupling antenna to a network analyzer to perform passive RF performance testing on the device under test; and control the RF switch to connect the near-field coupling antenna to a near-field communication reader to perform active interactive testing on the device under test.

[0006] According to a second aspect of one or more embodiments of this specification, a near-field communication device testing system is provided, comprising: Such as the testing fixtures for near-field communication equipment mentioned above; The host computer is communicatively connected to the control unit of the tooling and is configured to send test control commands to the control unit and receive test data from the tooling. The network analyzer is detachably connected to the tooling via an interface; The host computer is further configured as follows: In passive RF performance testing mode, the fixture is controlled to switch the RF switch to connect to the network analyzer and trigger the network analyzer to perform testing; In the active interactive test mode, the fixture is controlled to switch the radio frequency switch to connect the near-field communication reader integrated in the fixture, and the near-field communication reader is triggered to perform a test.

[0007] According to a third aspect of one or more embodiments of this specification, a near-field communication device test fixture is provided, comprising: A near-field coupling antenna is used for near-field electromagnetic coupling with the near-field communication antenna of the device under test. A near-field communication reader, electrically connected to the near-field coupling antenna, is configured to transmit low-power detection pulse signals; The control unit includes an analog-to-digital converter, and the control unit is communicatively connected to the near-field communication reader / writer. The control unit is configured to: control the near-field communication reader to transmit the low-power detection pulse signal; acquire the carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal through the analog-to-digital converter; compare the duration of the carrier signal with a predetermined duration threshold; and determine whether the active excitation function of the device under test is qualified based on the comparison result.

[0008] According to a fourth aspect of one or more embodiments of this specification, a test method for a near-field communication device is provided, applied to a test fixture including a near-field coupling antenna, a radio frequency switch, a control unit, and a near-field communication reader / writer, comprising: When the device under test establishes near-field electromagnetic coupling with the near-field coupling antenna, the control unit receives the test mode command; If the test mode instruction indicates that a passive radio frequency performance test is to be performed, the control unit controls the radio frequency switch to connect the near-field coupling antenna to the network analyzer connected to the tooling, so that the network analyzer can perform a passive radio frequency performance test on the device under test. If the test mode instruction indicates to perform an active interactive test, the control unit controls the radio frequency switch to connect the near-field coupling antenna to the near-field communication reader, and controls the near-field communication reader to perform an active interactive test on the device under test.

[0009] According to a fifth aspect of one or more embodiments of this specification, a method for testing a near-field communication device is provided, comprising: The near-field communication device test method described above is sequentially applied to multiple devices under test to obtain test results for each device under test; the test results include at least one of the following: resonant frequency measurement value, quality factor measurement value, return loss measurement value, minimum activation field strength level, whether the active excitation is qualified, and whether the card reading function is qualified. The test results of the multiple devices under test are uploaded to the remote management terminal; The remote management terminal generates statistical quality indicators based on the test results received from the multiple devices under test; the statistical quality indicators include at least one of first pass rate and process capability index; When the statistical quality index is lower than the preset threshold, an early warning signal is issued.

[0010] According to a sixth aspect of one or more embodiments of this specification, a testing method for a near-field communication device is provided, applied to a test fixture including a near-field coupling antenna, a near-field communication reader / writer, and a control unit, comprising: When the device under test establishes near-field electromagnetic coupling with the near-field coupling antenna, the control unit controls the near-field communication reader to transmit a low-power detection pulse signal; The analog-to-digital converter of the control unit acquires the carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal; The duration of the carrier signal is compared with a predetermined duration threshold; The effectiveness of the active excitation function of the device under test is determined based on the comparison results.

[0011] According to a seventh aspect of one or more embodiments of this specification, a computing device is provided, including a memory, a processor, and computer instructions stored in the memory and executable on the processor, wherein the processor executes the computer instructions to implement the steps of the near-field communication device testing method.

[0012] According to an eighth aspect of one or more embodiments of this specification, a computer-readable storage medium is provided that stores computer instructions which, when executed by a processor, implement the steps of the near-field communication device testing method.

[0013] One embodiment of this specification achieves at least the following beneficial effects: The fixture, responding to commands through a control unit, uses an RF switch to connect the same near-field coupling antenna to a network analyzer for passive RF performance testing, or to a near-field communication reader for active interactive testing. Due to the shared design of a single near-field coupling antenna and RF switch, passive and active tests can be completed sequentially on the same fixture and at the same workstation, without the need to change antennas or reposition the device under test. This reduces manual intervention and positional deviations caused by repeated clamping, improving the automation and efficiency of the testing process. The control unit, as a unified scheduling core, can precisely control the path selection of the RF switch, ensuring that the two test modes are performed independently in a time-sharing manner. This integrated architecture helps reduce the overall cost of production line testing equipment (eliminating the need for independent coupling antennas or dedicated fixtures for each test) and improves the consistency and repeatability of RF performance measurements in batch testing. Attached Figure Description

[0014] To more clearly illustrate the technical solutions in the embodiments or prior art of this specification, the drawings used in the description of the embodiments or prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this specification. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 A schematic diagram of a test fixture for a near-field communication device provided in one embodiment of this specification; Figure 2 This is a schematic diagram of the structure of the test fixture provided in one embodiment of this specification; Figure 3 This specification provides a schematic diagram of the structure of a near-field communication device testing system in a practical application scenario, as an embodiment of the present specification. Figure 4 The embodiment provided in this specification corresponds to Figure 1 A flowchart illustrating a testing method for near-field communication devices; Figure 5 The embodiment provided in this specification corresponds to Figure 3 A flowchart illustrating a testing method for near-field communication devices; Figure 6 A flowchart illustrating another near-field communication device testing method provided in one embodiment of this specification; Figure 7 This is a flowchart illustrating a testing method for near-field communication devices in a practical application scenario, as provided in the embodiments of this specification. Figure 8A structural block diagram of a computing device provided according to an embodiment of this specification is shown. Detailed Implementation

[0016] To enable those skilled in the art to better understand the technical solutions in this specification, the technical solutions in the embodiments of this specification will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this specification, and not all embodiments. Based on the embodiments in this specification, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of this specification.

[0017] This specification uses specific terms to describe embodiments thereof. Terms such as "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic associated with at least one embodiment of this specification. Therefore, it should be emphasized and noted that references to "an embodiment," "one embodiment," or "an alternative embodiment" in different locations throughout this specification do not necessarily refer to the same embodiment. Furthermore, those skilled in the art can combine and integrate the different embodiments or examples described herein, as well as the features of those different embodiments or examples, without contradiction.

[0018] The terminology used in one or more embodiments of this specification is for the purpose of describing particular embodiments only and is not intended to be limiting of the one or more embodiments of this specification. The singular forms “a,” “an,” “an,” “the,” and “the” as used in one or more embodiments of this specification and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used in one or more embodiments of this specification includes any or all possible combinations of one or more associated listed items.

[0019] The terms “comprising,” “including,” or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, product, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, product, or apparatus. Without further limitation, the presence of additional identical or equivalent elements in the process, method, product, or apparatus that includes said elements is not excluded.

[0020] Although the terms "first," "second," etc., may be used to describe various information in one or more embodiments of this specification, this information should not be limited to these terms. These terms are only used to distinguish information of the same type from one another. For example, "first" may also be referred to as "second," and similarly, "second" may also be referred to as "first," without departing from the scope of one or more embodiments of this specification. Ordinal numbers such as "first," "second," etc., do not necessarily indicate order; often they are used to facilitate the distinction of objects. For example, "first server" and "second server" usually refer to two servers. To distinguish these two servers, they are described as "first server" and "second server." Of course, sometimes these two servers may be the same server.

[0021] Depending on the context, the word "if" as used here can be interpreted as "when," "when," or "in response to determination."

[0022] In this specification, unless explicitly stated otherwise, "receiving and sending data" does not necessarily mean direct receiving and sending; it can also mean indirect receiving and sending. For example, A receiving data sent by B can be understood as A directly receiving the data sent by B, or it can be understood as A indirectly receiving the data sent by B through other entities such as C. Similarly, B sending data to A can be understood as B sending the data directly to A, or it can be understood as B indirectly sending the data to A through other entities such as C. Here, C can be one entity, or it can be two or more entities.

[0023] In this specification, unless explicitly stated otherwise, the relationships between structures can be direct or indirect. For example, when describing "A is connected to B," unless it is explicitly stated that A and B are directly connected, it should be understood that A can be directly connected to B or indirectly connected to B. Similarly, when describing "A is on top of B," unless it is explicitly stated that A is directly above B (AB is adjacent and A is above B), it should be understood that A can be directly above B or indirectly above B (AB is separated by other elements, and A is above B). And so on.

[0024] The user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in one or more embodiments of this specification are all information and data authorized by the user or fully authorized by all parties. The collection, use and processing of related data shall comply with the relevant laws, regulations and standards of the relevant regions, and corresponding operation entry points shall be provided for users to choose to authorize or refuse.

[0025] To facilitate understanding of the technical solutions of this application, the terms and concepts involved in one or more embodiments of this specification are explained below. It should be noted that these explanations are for illustrative purposes only and should not be considered as limiting the scope of protection of this application.

[0026] Near Field Communication (NFC) is a short-range, high-frequency wireless communication technology that operates at a frequency of 13.56MHz, allowing electronic devices to exchange data when they are close to each other.

[0027] Near Field Communication (NFC) Reader: Refers to a control chip or module (e.g., PN5180, PN76xx series, PN17660, etc.) capable of executing the NFC protocol stack, generating a radio frequency field, and communicating with NFC tags. The reader chip used in the embodiments of this specification (such as PN17660) can simulate the working mode of a card reader or card, for example, as an active excitation source, simulating card readers such as smartphones and smart wearable devices sending low-power detection (LPCD) waveforms to perform active excitation testing; as a variable power source, simulating card readers such as smartphones and smart wearable devices transmitting carriers at different power levels to perform minimum activation field strength testing; and as a communication interface, simulating card readers such as smartphones and smart wearable devices communicating with the device under test to perform card reading function testing.

[0028] Tag chip: An NFC tag chip embedded in the device under test (DUT) is used to store network configuration data, Uniform Resource Locators (URLs), and other information. In the embodiments of this specification, the DUT typically refers to a product integrating NFC tag functionality. Users can trigger specific operations (such as network configuration, payment, or information reading) by bringing the product close to a card reader such as a smartphone or smart wearable device. The DUT integrates an NFC tag chip and an antenna coil. The embodiments of this specification can test whether the radio frequency performance of the tag chip and its antenna meets the standards.

[0029] Test Fixture (Jig): An auxiliary device specifically designed for testing a particular product. In the embodiments of this specification, the fixture is used to fix the product under test and integrates test circuit modules such as a near-field coupling antenna, RF switch, and control unit to ensure the consistency of the position and connection method of each product under test during the testing process.

[0030] Fixture: A component of tooling, specifically the base fixed to the test bench, with positioning structures such as pins, slots or magnetic attraction, used to position the carrier or directly position the product to be tested.

[0031] Carrier: A component of the tooling, it is a replaceable part that directly supports the device under test. Different product models correspond to different shaped carriers. The carrier is detachably mounted on the fixture, and different products can be adapted by changing the carrier, thereby achieving a standardized design of the test tooling.

[0032] A Vector Network Analyzer (VNA) is an RF test instrument used to measure the reflection characteristics of an antenna or circuit. Specifically, it is used to test passive RF parameters such as the resonant frequency, quality factor (Q value), and return loss (S11) of the NFC antenna of a device under test. For example, a network analyzer can include a portable network analyzer, and more specifically, a handheld network analyzer.

[0033] Host Computer: A computer device that runs the test software. Operators configure test parameters, initiate test commands, monitor the test process, and receive test data through the host computer interface. Correspondingly, in the embodiments of this specification, the slave computer (Slave / MCU) is a microcontroller (MCU) integrated within the test fixture. It is responsible for receiving commands from the host computer, controlling RF switch switching, driving the reader / writer, acquiring ADC signals, and feeding back test data to the host computer. The host computer and slave computer typically communicate via a serial port (UART / USB-to-UART).

[0034] Resonant frequency: The frequency at which the antenna impedance is purely resistive (reactance is zero), at which point the antenna radiation efficiency is highest. For NFC applications, the resonant frequency refers to the frequency at which the equivalent circuit of the NFC antenna resonates in series or parallel; the standard resonant frequency is 13.56MHz. A resonant frequency deviating from the standard value will result in a shortened communication distance or even prevent communication. By measuring whether the resonant frequency deviates from the standard value, it is possible to determine whether there are deviations in the antenna's manufacturing or assembly.

[0035] Quality Factor (Q-value): A metric that measures the ratio of energy storage efficiency to energy loss in a resonant circuit or antenna. A higher Q-value indicates that energy is more concentrated near the resonant frequency, but an excessively high Q-value can lead to a narrower operating bandwidth; a low Q-value indicates significant antenna loss (such as poor soldering or material issues), which can reduce reading distance or wake-up sensitivity. In the embodiments of this specification, testing the Q-value can determine whether the antenna winding process, magnetic sheet material, and matching capacitor are up to standard.

[0036] Return loss (RL / S11): A common logarithm (in dB) representing the ratio of reflected power to incident power at an RF port. It reflects the impedance matching between the antenna port and the transmission line. The smaller the S11 (the larger the negative value, such as below -10dB), the less reflection, the better the matching, and the higher the energy transfer efficiency.

[0037] Voltage Standing Wave Ratio (VSWR): The ratio of the maximum to the minimum voltage on a transmission line, it is another commonly used indicator for measuring impedance matching. VSWR and return loss (S11) are interchangeable. VSWR=1 indicates ideal matching, while VSWR>1 indicates the presence of reflection. Generally, VSWR<2 (corresponding to S11 of approximately -9.5dB or less) is considered a good match.

[0038] Low-Power Detection Pulse (LPCD Pulse): This is an extremely short radio frequency pulse periodically emitted by the NFC reader / writer to simulate Low-Power Detection Mode (LPCD), which can be used to detect the presence of nearby NFC tags. Once a tag receives a pulse with sufficient energy, it can actively transmit a continuous carrier signal in response, which can be used to exit LPCD mode.

[0039] Analog-to-digital converter (ADC): A circuit module that converts continuous analog voltage signals into digital quantities. In the embodiments of this specification, the control unit acquires the carrier waveform transmitted back during the active excitation test of the device under test through the ADC and determines whether its duration meets a predetermined threshold (e.g., 1.5ms).

[0040] First-Pass Yield (FPY): This refers to the percentage of products that pass the first test without rework or repair on the production line. FPY is an important indicator of the real-time health of the production line. A sudden drop in FPY can be an early warning sign of production line abnormalities.

[0041] Process Capability Index (CPK): A statistical indicator that measures the ability of a production process to meet technical standards under steady-state conditions. A CPK ≥ 1.33 generally indicates sufficient process capability; a low CPK indicates excessive process fluctuation or that the average value deviates from the center, requiring process adjustment.

[0042] In the mass production of Near Field Communication (NFC) devices, various radio frequency (RF) performance tests are typically performed at multiple production stations. However, existing production line testing solutions have limited ability to identify NFC performance indicators, making it difficult to quantitatively intercept potential RF performance anomalies. For example, issues such as antenna resonant frequency shifts, abnormal quality factors, and missing active excitation responses are often only discovered by users after the products have entered the market. Therefore, the industry hopes to explore a standardized testing solution that covers key NFC RF indicators (including passive antenna parameters, active excitation capability, reading distance, and data content comparison) to achieve consistent control of NFC performance throughout the production process and ensure product quality.

[0043] In related technologies, there are methods that use professional NFC testers (such as KEOLABS equipment) to simulate card readers or cards communicating with the device under test, thereby testing performance indicators such as resonant frequency, quality factor, and minimum activation field strength. While these devices can provide relatively accurate measurement results, they still have limitations in practical production line applications. For example, their test items cannot cover specific functions such as active excitation response; the overall cost of the equipment is high, making it difficult to deploy on a large scale in every production line; furthermore, its antenna coupling structure has limited compatibility with products of different shapes, and adjustments are complex when changing product models.

[0044] Based on the above, it is necessary to provide an improved NFC device testing solution to more comprehensively cover key radio frequency indicators, while taking into account the cost, manageability, and adaptability of production line deployment.

[0045] This specification provides near-field communication device test fixtures in some embodiments that address the aforementioned problems through an integrated hardware architecture. The fixture includes a near-field coupling antenna, an RF switch, and a control unit. The near-field coupling antenna establishes near-field electromagnetic coupling with the near-field communication antenna of the device under test (DUT), ensuring stable transmission of the test signal. Responding to control commands, the control unit controls the RF switch to connect the near-field coupling antenna to a network analyzer, thereby performing passive RF performance tests (such as resonant frequency, quality factor, and return loss) to achieve a quantitative evaluation of the antenna's physical performance. Simultaneously, the control unit can also control the RF switch to connect the near-field coupling antenna to a near-field communication reader / writer, thereby performing active interactive tests (such as active excitation response, minimum activation field strength verification, card reading function, and data content comparison).

[0046] The above technical solutions achieve comprehensive testing of passive radio frequency indicators and active interaction capabilities within a single fixture, avoiding the need for multiple sets of equipment for different test items. Compared to existing solutions using expensive specialized testing equipment, some embodiments of this specification utilize a general-purpose network analyzer and an integrated near-field communication reader / writer, significantly reducing production line testing costs. Simultaneously, the control unit integrated within the fixture can automatically switch test paths, simplifying the testing process and improving production line efficiency. Furthermore, this fixture structure can be used with interchangeable carriers to adapt to products of different shapes, enhancing the versatility and flexibility of production line testing. Therefore, some embodiments of this specification effectively solve the problems of insufficient test coverage, high cost, and adaptability in the prior art, providing a reliable solution for the consistent control of radio frequency performance in NFC device production.

[0047] The technical solutions provided in the various embodiments of this specification are described in detail below with reference to the accompanying drawings.

[0048] This specification provides a near-field communication device testing fixture and a near-field communication device testing system. This application also relates to a near-field communication device testing method, a computing device, and a computer-readable storage medium, which will be described in detail in the following embodiments.

[0049] Figure 1 This is a schematic diagram of a test fixture for a near-field communication device provided in one embodiment of this specification.

[0050] like Figure 1 As shown, a testing fixture for near-field communication devices is provided, comprising: A near-field coupling antenna is used for near-field electromagnetic coupling with the near-field communication antenna of the device under test. A radio frequency switch is electrically connected to the near-field coupling antenna; The control unit, communicatively connected to the RF switch, is configured to: in response to a control command, control the RF switch to connect the near-field coupling antenna to a network analyzer to perform passive RF performance testing on the device under test; and control the RF switch to connect the near-field coupling antenna to a near-field communication reader to perform active interactive testing on the device under test.

[0051] This fixture can be used to perform radio frequency performance testing on devices under test (DUTs) with integrated NFC tag chips (i.e., "tap-to-play" products). Throughout the testing process, the DUT operates in passive mode (Tag mode), meaning it is powered and responds to an external test signal.

[0052] The near-field coupling antenna is used for near-field electromagnetic coupling with the near-field communication antenna of the device under test. This near-field coupling antenna can be implemented in various physical forms, such as a PCB coil, a flexible board coil, or a wire-wound coil. In some embodiments, the near-field coupling antenna is designed for near-field communication in the 13.56MHz frequency band.

[0053] The RF switch is electrically connected to the near-field coupled antenna. The control unit is communicatively connected to the RF switch. In some embodiments, the control unit is a microcontroller (MCU), which is connected to the control terminal of the RF switch via general purpose input / output (GPIO) pins to send path selection signals. Besides an MCU, the control unit can also be implemented using other programmable logic devices, such as FPGAs, CPLDs, DSPs, ARM processors, or embedded industrial control boards; in production line applications, an MCU is a suitable choice due to cost and convenience considerations.

[0054] In some embodiments, the RF switch is a single-pole multi-throw switch, such as a single-pole four-throw switch (SP4T). A double-pole four-throw (DP4T) switch can also be used, but in practice only one pole is used, while the other pole is idle or grounded. The RF switch has at least two signal path terminals and one common terminal.

[0055] In one or more embodiments of this specification, the fixture further includes: a first interface electrically connected to a first path terminal of the RF switch for connecting to an external network analyzer; wherein the near-field communication reader is integrated within the fixture and electrically connected to a second path terminal of the RF switch; and the common terminal of the RF switch is electrically connected to the near-field coupling antenna.

[0056] Specifically, the RF switch has a first path terminal (or first connection terminal), a second path terminal (or second connection terminal), and a common terminal (or common connection terminal). The fixture is equipped with a first interface, which is electrically connected to the first path terminal of the RF switch for connecting to an external network analyzer. As a specific connection method, the first interface can use an SMA RF connector, allowing for detachable connection to the external network analyzer via an SMA RF cable. An SMA RF cable typically refers to a coaxial cable assembly with SMA male or female connectors at both ends, suitable for signal transmission in the 13.56MHz frequency band.

[0057] The near-field communication (NFC) reader is integrated within the fixture, located on the same circuit board or a separate daughterboard of the fixture. The RF output of the NFC reader is electrically connected to the second path of the RF switch. In some embodiments, the second path is connected to the NFC reader via a PCB microstrip line. A PCB microstrip line is a transmission line of a specific width on a printed circuit board that forms a specified impedance with respect to a reference plane.

[0058] The common terminal (common connection terminal) of the RF switch is electrically connected to the near-field coupling antenna. In some embodiments, the common terminal is also connected to the near-field coupling antenna via another SMA RF cable. The use of an SMA RF cable facilitates the mechanical mounting and replacement of the antenna board. If the antenna board and the RF switch are located on the same circuit board and are very close, a direct PCB microstrip connection can also be used; however, in some embodiments of this application, considering that the antenna board needs to be precisely fixed in the fixture, the use of an SMA RF cable provides greater layout flexibility.

[0059] It should be understood that, regarding the aforementioned connection media (SMA RF lines, microstrip lines, coaxial lines), those skilled in the art may also employ other equivalent connection methods, such as using MMCX connectors, ultra-miniature coaxial cables, or directly soldered rigid coaxial structures, depending on the actual layout and signal integrity requirements. As long as reliable transmission of RF signals can be achieved, any connection method does not depart from the scope of protection of this application.

[0060] Through the aforementioned interfaces and connection structures, the fixture enables time-division sharing of the same near-field coupled antenna between an external network analyzer and an internal reader / writer. When passive RF performance testing is required, the external network analyzer connects via the first interface, and the RF switch connects the common terminal to the first path. When active interactive testing is required, the RF switch connects the common terminal to the second path, and the internally integrated near-field communication reader / writer takes over the antenna path. This design allows the fixture to quickly adapt to different types of test instruments while maintaining the fixture's integration and portability.

[0061] Based on some embodiments in this specification, an external network analyzer is connected via a detachable interface, while the reader / writer is fixed inside the fixture. This reduces the overall cost of the fixture (the network analyzer can be shared across multiple workstations or configured as needed) while ensuring the response speed and stability of active interactive testing. Through standardized interfaces and impedance-matched transmission lines, the integrity and repeatability of test signals are improved, which helps to enhance the consistency and reliability of production line testing.

[0062] In some embodiments, the control unit is configured to perform the following two basic operations in response to control commands from a host computer or other test management device.

[0063] First, the control unit controls the RF switch to connect the near-field coupling antenna to the network analyzer to perform passive RF performance testing on the device under test. In this mode, the MCU's role is to select the path via the RF switch; specific measurement commands (e.g., "start frequency sweep," "read Q value") can be directly sent to the network analyzer by the host computer, without the MCU directly sending commands to the network analyzer. The network analyzer (e.g., a handheld network analyzer) connects to the host computer via a USB interface, and the host computer controls it to perform measurements and read data.

[0064] Second, the control unit controls the RF switch to connect the near-field coupling antenna to the near-field communication reader to perform active interactive testing of the device under test. The near-field communication reader (e.g., a PN17660 or a similar reader chip) is integrated inside the fixture. The control unit connects to the reader via I2C or other communication buses, sends commands such as start test, configure power level, and transmit waveform, and reads data returned by the device under test from the reader.

[0065] In one or more embodiments of this specification, the control unit is communicatively connected to the near-field communication reader / writer; the control unit is configured to send control commands to the near-field communication reader / writer to trigger the near-field communication reader / writer to perform the active interaction test.

[0066] In some embodiments, the control unit (e.g., a microcontroller MCU) and the near-field communication reader (e.g., a PN17660 or a similar reader chip) are connected via an I2C bus (Inter-Integrated Circuit). The I2C bus is a commonly used two-wire serial communication interface that enables instruction and data exchange between the control unit and peripheral chips with low pin overhead. Besides the I2C bus, SPI, UART, or other suitable communication interfaces can also be used depending on the specific design requirements.

[0067] The control unit is configured to actively generate and send a series of control commands to the near-field communication reader. These commands are used to control different operating modes of the reader, including but not limited to: transmitting low-power detection pulses to perform active excitation testing, transmitting carriers at multiple different power levels to perform minimum activation field strength testing, and sending read commands according to a predetermined communication protocol to perform card reading function testing. The control unit can also read data (such as UID, ATQA, or stored service data) returned by the device under test from the reader and upload this data to the host computer.

[0068] In some embodiments, the control unit may function as follows: receiving test commands from a host computer, controlling the switching of RF switches, controlling the operation of the near-field communication reader, and acquiring analog signals (e.g., carrier continuity waveforms in active excitation tests) transmitted back by the device under test via an analog-to-digital converter (ADC). Specifically, for the execution of active interactive tests, the control unit generates a corresponding control sequence based on the test mode issued by the host computer and sends it to the reader chip, thereby triggering the reader to complete the required transmission and reception tasks while the RF path is connected.

[0069] By centralizing the triggering and control of active interactive testing in the control unit, timing coordination in the testing process is simplified. The control unit can directly sense the current state of the RF switch and only sends a transmit command to the reader after confirming that the antenna board is connected to the reader's path, avoiding invalid operations caused by the path not being ready. At the same time, since the control unit and the reader use low-latency board-level communication, the command response speed is faster, which helps to shorten the testing cycle of a single product.

[0070] Based on some embodiments in this specification, the direct communication connection between the control unit and the near-field communication reader / writer allows the fixture to perform precise control of the reader / writer operation independently of the host computer. The host computer only needs to issue high-level test commands (e.g., "execute active excitation test"), while details such as power level settings, waveform parameter configuration, and data reading timing are all completed collaboratively by the control unit and the reader / writer. This hierarchical control architecture reduces the complexity of the host computer software and facilitates the portability of the fixture to different host computer platforms. Furthermore, when new active interaction test items need to be added, typically only the firmware of the control unit or reader / writer needs to be updated, without modifying the host computer software, thereby improving the scalability and maintainability of the fixture.

[0071] In actual testing, the host computer (e.g., a computer running the test software) communicates with the control unit via a serial port (e.g., USB to UART) to issue test commands and receive test data. The handheld network analyzer can be directly controlled by the host computer (e.g., via USB). The control unit is only responsible for switching RF paths and does not directly send SCPI commands to the network analyzer. This division of labor reduces the software complexity of the control unit while ensuring the flexibility of the network analyzer's measurements.

[0072] Based on some embodiments of this specification, the aforementioned fixture, through a single near-field coupling antenna and the switching of an RF switch, enables the same test setup to connect to a network analyzer and a near-field communication reader in a time-sharing manner, thereby sequentially completing passive RF performance testing and active interactive testing at the same workstation. This integrated design reduces the handling and repetitive positioning operations between different test equipment on the production line, helping to improve testing efficiency. Since there is no need to equip each test with a separate dedicated coupling antenna, the overall hardware cost can be controlled. The control unit automatically switches the RF path according to instructions, standardizing the testing process, reducing manual intervention, and improving the consistency of RF performance in mass production. Furthermore, the time-sharing mechanism ensures that the two tests do not interfere with each other, avoiding signal conflicts. This fixture can be used with interchangeable carriers to adapt to various product shapes and can be optionally equipped with a positioning module for fixture tracking, thus achieving a good balance between production management, cost control, and test coverage.

[0073] In one or more embodiments of this specification, the tooling further includes: a fixture for accommodating the near-field coupling antenna; a replaceable carrier for fixing the device under test; the replaceable carrier is detachably mounted on the fixture, and when the replaceable carrier is mounted on the fixture, the near-field communication antenna of the device under test and the near-field coupling antenna maintain a predetermined relative position.

[0074] Specifically, the fixture is typically fixed to the test bench or tooling base plate and has positioning structures such as pins, slots, or magnetic attraction. The near-field coupling antenna is fixed at a predetermined position on the fixture to ensure the long-term stability of the antenna position.

[0075] A replaceable carrier is used to secure the device under test (DUT). This carrier is a tray precisely molded to the shape of the DUT, with receiving slots that match the DUT's shape. The replaceable carrier secures the DUT by limiting its shape. Once the DUT is placed in the carrier, the position of the DUT's internal near-field communication antenna relative to the edge of the carrier remains fixed.

[0076] The replaceable carrier is detachably mounted on the fixture, for example, by engaging with positioning holes on the fixture via positioning pins, or by using slots or magnetic attraction for quick assembly and disassembly. When the replaceable carrier is mounted on the fixture, the relative position between the carrier and the fixture is constrained by the positioning structure, ensuring that the near-field communication antenna of the device under test and the near-field coupling antenna within the fixture maintain a predetermined relative position and coupling distance (e.g., center alignment in the X and Y directions, a 5mm gap in the Z direction, and an offset controlled within ±0.5mm).

[0077] Through this fixed mechanical chain relationship: product coil → carrier → fixture → antenna board, the relative position between the product coil and the antenna board is precisely reproduced during each test, thus ensuring the consistency of test conditions. Different models of the device under test only require changing the corresponding carrier, while the main fixture (including near-field coupling antenna, RF switch, control unit, near-field communication reader, etc.) remains unchanged, thereby achieving a standardized design and improving the versatility of the fixture and production efficiency.

[0078] In one or more embodiments of this specification, a replaceable carrier for testing near-field communication devices is also disclosed. This replaceable carrier can be used as a separate component in conjunction with the aforementioned tooling. The replaceable carrier includes: a body having a receiving slot for accommodating the device under test (DUT); and a positioning structure disposed on the bottom or side of the body for engaging with a fixture of the test tooling. When the replaceable carrier is mounted on the fixture, the positioning structure ensures that the near-field communication antenna of the DUT maintains a predetermined relative position and coupling distance with the near-field coupling antenna within the fixture.

[0079] Based on some embodiments in this specification, by using a fixture and a replaceable carrier, devices under test with different shapes can be quickly and accurately positioned in the test fixture, avoiding manual alignment before each test and improving production line testing efficiency and repeatability. At the same time, since the main fixture remains unchanged, product models can be switched simply by changing the low-cost carrier, reducing fixture development and maintenance costs and making consistent control of RF indicators in mass production more feasible.

[0080] Figure 2This is a schematic diagram of the test fixture provided in one embodiment of this specification.

[0081] like Figure 2 As shown, the test fixture for near-field communication devices includes a test carrier and a test jig arranged sequentially from top to bottom.

[0082] The test fixture, serving as the base for the entire tooling system, can be fixedly installed or placed on the test platform. The upper surface of the test fixture may be equipped with a precision positioning structure (such as a positioning pin, slot, or magnetic base) to support and secure the test carrier.

[0083] The test carrier is detachably mounted on top of the test fixture. The test carrier has contoured grooves designed to accommodate and secure the device under test. The aforementioned positioning structure enables rapid and consistent repeatable positioning between the test carrier and the test fixture, ensuring that the device under test is uniquely and repeatedly positioned in three-dimensional space for each test.

[0084] The device under test (DUT), referred to as the product under test in practical applications, such as a "tap-to-pay" product containing an NFC tag, is placed in the contour slot of the test fixture. The NFC coil inside the DUT maintains a preset relative positional relationship with the NFC antenna board fixedly mounted in the test fixture, such as vertical alignment and fixed spacing.

[0085] With the above three-layer structure, when changing different models of the device under test, only the matching test carrier needs to be replaced, without modifying the test fixture and the test circuit modules such as the NFC antenna board, RF switch, and MCU board fixed therein, thereby realizing the standardized design of the tooling and rapid production changeover.

[0086] It should be noted that, Figure 2 The shapes of the device under test, test carrier, and test fixture in this specification are merely illustrative and do not constitute a limitation on the scope of protection of the tooling structure provided in the embodiments of this specification; in actual applications, they may also be other shapes.

[0087] In one or more embodiments of this specification, the network analyzer is a portable network analyzer.

[0088] In the context of the embodiments described in this specification, "portable" means that the network analyzer is small and lightweight, unlike traditional bulky benchtop network analyzers. The portable network analyzer can be easily moved between different workstations on the production line or fixed to a fixture bracket. In actual testing, the portable network analyzer can be placed or mounted on a shelf next to the fixture and connected to the fixture's RF switch via a short coaxial cable (e.g., an SMA to SMA cable). Operators do not need to hold the device; they can simply start the test via the host computer software.

[0089] In a preferred embodiment of this application, the portable network analyzer is a handheld vector network analyzer (e.g., a low-cost device based on an ARM architecture). Compared to traditional desktop network analyzers (which often cost over 100,000 yuan), the cost of a handheld network analyzer can be reduced to several thousand to around 20,000 yuan, significantly reducing the equipment investment per testing station and making it possible to equip each production line or even each workstation with an independent network analyzer. "Handheld" describes its product form, not that it must be held by hand during testing.

[0090] In some embodiments, the portable network analyzer is connected to a host computer (test computer) via a USB interface, and the host computer directly controls its measurement parameters (such as center frequency, sweep width, number of measurement points, etc.) and reads the measurement data. The control unit within the fixture is only responsible for switching the RF switch to the network analyzer path, and does not directly send commands to the network analyzer.

[0091] The testing principle of a network analyzer: A portable network analyzer emits a swept-frequency signal within a known frequency range and then measures the signal reflected back from the port under test. In this fixture, when the RF switch connects the network analyzer to the near-field coupled antenna, the network analyzer emits a swept-frequency signal to the antenna board. Near-field electromagnetic coupling exists between the antenna board and the near-field communication coil of the device under test (DUT). The parameters of the DUT coil (resonant frequency, Q value, presence of short circuits or poor soldering) will affect the reflection characteristics of the antenna board, i.e., influence the S11 parameters. The S11 curve measured by the network analyzer is actually the comprehensive response of the entire coupling system (antenna board + product coil). Since the reflection characteristics of the fixture's antenna board are known and stable (calibrated or tested at the factory), the change in measurement results after placing the DUT mainly originates from the product coil. The factory will pre-measure a set of reference values ​​using standard good products (e.g., resonant frequency 13.56MHz, Q value 30) and set upper and lower limit judgment thresholds based on process capabilities. If the measurement value caused by the DUT exceeds the specification range, it is judged as defective.

[0092] Based on some embodiments in this specification, using portable network analyzers (especially low-cost handheld network analyzers) can significantly reduce the hardware cost of production line testing equipment. Furthermore, their compact size makes them easy to integrate into automated testing stations. Combined with the aforementioned RF switch switching scheme for the tooling, a single network analyzer can serve multiple test items (passive performance testing) without requiring expensive dedicated instruments for each passive performance indicator. This selection significantly improves the economy and scalability of the production line testing solution while ensuring acceptable measurement accuracy, making NFC RF conformance testing in small-to-medium scale production and multi-variety batch production easier to implement.

[0093] In one or more embodiments of this specification, the passive radio frequency performance testing includes testing at least one of the following: resonant frequency, quality factor, return loss, and standing wave ratio of the device under test.

[0094] Passive RF performance testing refers to testing the physical and electrical characteristics of the antenna itself without powering the NFC tag chip inside the device under test or engaging in protocol interaction. Resonant frequency, quality factor (Q value), return loss (S11), and voltage standing wave ratio (VSWR) are all passive performance indicators. They depend only on the antenna's geometry, materials, and the dielectric constant of the surrounding environment, and are independent of whether the chip is operational.

[0095] The resonant frequency is the frequency at which the antenna impedance is purely resistive (with zero reactance). For NFC applications, the standard resonant frequency is 13.56MHz. If the measured resonant frequency deviates too much from the standard value (e.g., more than ±0.5MHz), it may cause card readers such as mobile phones to have difficulty reading the signal. The resonant frequency can be obtained by measuring the frequency corresponding to the lowest point (valley) of the S11 curve using network analysis.

[0096] The quality factor (Q value) is an indicator that represents the ratio of antenna energy storage efficiency to energy loss, and also reflects the antenna's bandwidth characteristics. A higher Q value means the antenna energy is more concentrated near the resonant frequency, but the operating bandwidth is narrower, and the tolerance to environmental changes decreases. A low Q value indicates significant antenna losses (such as poor soldering, short circuits between coil turns, or high dielectric loss), which can lead to a shorter reading distance or reduced wake-up sensitivity. The Q value can be calculated from the ratio of the half-power bandwidth to the resonant frequency on the S11 curve: Q = f0 / BW, where f0 is the resonant frequency and BW is the half-power bandwidth.

[0097] Return loss (S11) is the common logarithm (in dB) of the ratio of reflected power to incident power at an RF port, representing the degree of matching between the antenna and the circuit. A more negative S11 (e.g., below -10 dB) indicates less reflected energy and better matching; a S11 close to 0 dB indicates almost total reflection, resulting in antenna failure. Typically, S11 ≤ -10 dB is required.

[0098] Voltage Standing Wave Ratio (VSWR) is an indicator that measures the impedance matching degree between an RF transmission line and a load. It is directly calculated from the S11 parameter: VSWR = (1 + |S11|) / (1 |S11|). VSWR=1 indicates ideal matching, and VSWR>1 indicates the presence of reflection. Generally, VSWR<2 is required (corresponding to approximately -9.5dB below S11). VSWR and return loss are essentially equivalent, differing only in their expression; both can be used to evaluate matching quality.

[0099] The physical basis of passive RF performance testing is the measurement of reflection characteristics by a network analyzer. The network analyzer (preferably a handheld network analyzer in this embodiment) is connected to the near-field coupling antenna via an RF switch. The specific testing process can be as follows: The host computer sends a "execute passive RF performance test" command to the control unit (MCU) in the fixture via a serial port; the control unit controls the RF switch through the GPIO pin, connecting the common terminal to the first path terminal (i.e., the path connecting to the network analyzer). At this time, the near-field coupling antenna and the network analyzer are in the same RF link; the host computer sends a measurement command to the network analyzer directly or through the SCPI command (Standard Instrument Control Command) forwarded by the control unit; the network analyzer transmits a sweep frequency signal to the near-field coupling antenna. This signal acts on the NFC coil of the device under test through near-field electromagnetic coupling. The electrical parameters of the coil of the device under test (resonant frequency, Q value, impedance matching status) will react on the reflection characteristics of the near-field coupling antenna, thereby changing the S11 curve measured by the network analyzer; the network analyzer returns the measurement results (S11 curve, resonant frequency, Q value, VSWR, etc.) to the host computer; the host computer compares these values ​​with the preset specification range to determine whether the antenna performance of the device under test is qualified.

[0100] In practical applications, passive RF indicators can reflect physical defects in the antenna itself, such as poor coil soldering, short circuits, coil deformation, and patch misalignment. These defects may not be detected during active interaction testing (e.g., a product with a low Q value but barely acceptable activation field strength), but may completely fail after leaving the factory due to temperature and humidity changes or minor impacts. Passive indicator testing can intercept such potential defects early in the production line.

[0101] Furthermore, quantitative data such as resonant frequency and Q value obtained from batch testing can be used to calculate the process capability index (CPK) and first-pass yield (FPY), thereby monitoring the stability of the production process. When CPK is too low, it indicates that the production process fluctuates too much, and process parameters need to be adjusted in a timely manner to avoid large-scale quality accidents.

[0102] Based on some embodiments in this specification, passive RF performance testing is configured to include at least one of resonant frequency, Q value, return loss, and VSWR. This allows the fixture to quickly evaluate the physical performance of the antenna of the device under test (DUT) without relying on chip power supply and protocol interaction. These metrics not only determine the qualification of individual products but also provide a data foundation for process capability statistics in mass production. By integrating the network splitter path and reader path in the same fixture and using a control unit for automated switching, this fixture can simultaneously obtain test results for passive antenna performance and active communication functions without increasing the number of devices or operational complexity. This is of practical significance for ensuring the consistency of NFC RF performance of touch-sensitive products and providing early warning of production process fluctuations.

[0103] In one or more embodiments of this specification, the active interaction test includes at least one of active stimulus test, minimum activation field strength test, and card reading function test.

[0104] The three tests—active stimulus test, minimum activation field strength test, and card reader function test—evaluate different aspects of the device under test (DUT): the active stimulus test verifies whether the DUT can actively transmit a carrier signal of a predetermined duration after detecting a low-power detection pulse; the minimum activation field strength test determines the minimum radio frequency field strength required for the DUT to be woken up and respond correctly; and the card reader function test verifies whether the DUT can correctly store and return the expected service data under standard field strength. By integrating these test capabilities into the same fixture, multi-dimensional evaluation of active interaction performance can be completed at a single test station, eliminating the need for separate instruments or antennas for different tests.

[0105] In some embodiments of this application, a near-field communication (NFC) reader / writer (e.g., a PN17660 chip soldered onto an MCU board) acts as a simulated card reader, such as a smartphone or smart wearable device. This reader / writer is connected to the fixture's antenna board via an RF switch and is capable of transmitting a 13.56MHz carrier wave, modulating data, and generating Low Power Card Detection (LPCD) waveforms. Specifically: in active excitation testing, the reader / writer simulates a smartphone or smart wearable device transmitting an LPCD waveform (25μs width, 200ms period); in minimum activation field strength testing, the reader / writer simulates a smartphone or smart wearable device transmitting carrier waves at different power levels; and in card reading function testing, the reader / writer simulates a smartphone or smart wearable device reading NFC tag data from the device under test. This integration allows the fixture to simulate real card reader-tag interaction scenarios without the need for external card reader devices or dedicated communication testers.

[0106] In one or more embodiments of this specification, in the active excitation test: the near-field communication reader is configured to transmit a low-power detection pulse signal; the control unit is configured to acquire a carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal via an analog-to-digital converter; and determine whether the duration of the carrier signal is greater than or equal to a predetermined duration threshold.

[0107] In some embodiments, the near-field communication reader simulates the low-power card detection mode of card readers such as smartphones and smart wearable devices, transmitting a low-power detection pulse signal (e.g., an LPCD waveform with a width of 25 microseconds and a period of 200 milliseconds). This signal is transmitted to the device under test (DUT) via an RF switch and a near-field coupling antenna. Upon detecting the pulse, the DUT (operating in tag mode) is awakened by its internal circuitry and actively drives its antenna to transmit a 13.56 MHz carrier signal (referred to herein as "active transmission"). This carrier signal is returned to the fixture via the near-field coupling antenna.

[0108] Because the carrier signal frequency is relatively high (13.56MHz), direct sampling may require a high-speed analog-to-digital converter. In some embodiments of this specification, the fixture may further include an envelope extraction circuit (e.g., a detector circuit) to convert the high-frequency carrier into a low-frequency envelope voltage signal for acquisition by the analog-to-digital converter of the control unit; or, if the analog-to-digital converter inside the control unit has a sufficient sampling rate or bandpass sampling capability, it can also directly sample the carrier. The control unit acquires the amplitude (or envelope) of the waveform through a built-in or external analog-to-digital converter and uses a software algorithm to determine whether the duration of the waveform reaches a predetermined duration threshold (e.g., 1.5 milliseconds). If the carrier signal actively transmitted by the device under test lasts for a sufficiently long duration, it indicates that it can effectively wake up the card reader device such as a mobile phone in low-power card detection mode (i.e., it can switch to standard card detection mode), providing a communication basis for "tap to detect"; if the duration is too short, it may result in the inability to effectively wake up the card reader device such as a mobile phone in low-power card detection mode (i.e., it cannot switch to standard card detection mode), thus resulting in the phenomenon of "no response when tapped".

[0109] In the above test, the reader and control unit work together: the reader is responsible for transmitting the LPCD waveform, and the analog-to-digital converter of the control unit is responsible for receiving and determining the carrier duration transmitted back by the device under test (DUT). The specific signal flow can be as follows: the control unit sends a transmission command to the reader; the reader generates the LPCD waveform and couples it to the DUT via an RF switch and antenna board; the DUT responds to the LPCD waveform by actively transmitting a carrier, which is transmitted to the input of the control unit's analog-to-digital converter via the antenna board and RF switch (through appropriate pathways). The control unit analyzes the sampled data to determine whether the active excitation function of the DUT is qualified.

[0110] Based on some embodiments of this specification, by configuring the active excitation test to have the reader transmit low-power detection pulses and the analog-to-digital converter of the control unit collect and determine the carrier duration, a quantitative evaluation of the active excitation function can be achieved in a production line environment at a lower cost. Compared to simply verifying whether communication is established, this duration determination method can more directly reflect the response capability of the device under test in low-power wake-up scenarios and the ability of the active excitation reader to exit the low-power card detection mode. This helps to screen out products with excessively short response waveforms and those lacking effective excitation functions, thereby improving the consistency of user experience.

[0111] In one or more embodiments of this specification, in the minimum activation field strength test: the control unit is configured to control the near-field communication reader to transmit carrier signals at multiple different power levels, and to perform a reading operation on the identification information of the device under test at each power level; and to determine the minimum power level at which the identification information can be successfully read as the minimum activation field strength level.

[0112] In some embodiments, the near-field communication reader (e.g., the PN17660 chip) has a complete NFC protocol stack, capable of transmitting a 13.56MHz carrier wave, modulation protocol commands (such as REQA), and demodulating the response returned by the tag. The control unit sends power level setting commands and read commands to the reader via I2C or other communication buses.

[0113] Optionally, the testing process typically (but not necessarily) proceeds in ascending order of transmit power. For example, the reader's transmit power may have multiple preset levels (including up to eight levels, where level 0 corresponds to the maximum field strength and level 6 corresponds to the minimum field strength). The control unit starts from the minimum power level (e.g., level 6) and gradually increases to larger power levels (e.g., levels 7, 5, 4, 3, 2, 1, 0). At each power level, the reader sends a REQA command and attempts to read the Response Request (ATQA) and Unique Identifier (UID) of the device under test. Once the identification information (e.g., ATQA and / or UID) is successfully read, the test stops immediately, and the current power level is recorded as the minimum active field strength level of the device under test. If reading fails at all power levels, the minimum active field strength of the device under test is deemed to be exceeded.

[0114] The “identity information” mentioned in the embodiments of this specification refers to the information used by the near-field communication device to identify its own identity or type during the initialization process, including but not limited to Response Request (ATQA) and / or Unique Identifier (UID), as well as any equivalent response parameters (such as manufacturer-defined ID, serial number, etc.).

[0115] Based on some embodiments of this specification, by controlling the reader to transmit carrier waves at multiple different power levels and successively attempt to read identification information, the sensitivity boundary of the device under test can be quantified. Compared to simply determining whether communication is possible at a fixed power level, this test provides a quantitative indicator of the minimum activation field strength level, thereby enabling the monitoring of the consistency of sensitivity across batches of products. Furthermore, this test is automatically executed by the control unit and can be seamlessly integrated into the aforementioned RF switchover process without manual intervention or additional instruments.

[0116] In one or more embodiments of this specification, during the card reader function test: the near-field communication reader is configured to transmit a carrier signal at a preset transmission power and send a read command according to the near-field communication protocol to read data from the device under test; the control unit is configured to receive the data transmitted by the near-field communication reader and verify whether the data contains predetermined data content.

[0117] In some embodiments, the near-field communication reader transmits a carrier at a preset transmit power (e.g., level 2 or 3, sufficient to ensure stable communication) and executes a complete protocol interaction sequence according to a near-field communication protocol (e.g., ISO / IEC 14443, ISO / IEC 15693, or NFC Forum). Typically, this sequence includes: sending a REQA command to wait for ATQA, performing an anti-collision procedure to read the UID, selecting a card, and reading a specific data block (e.g., a block storing a Uniform Resource Locator URL). After completing the underlying protocol handshake, the reader transmits the read data (e.g., UID, ATQA, URL text, etc.) to the control unit via a communication interface (e.g., I2C, SPI, UART, or USB).

[0118] After receiving data transmitted by the reader, the control unit compares the acquired data content with preset data content (such as a expected URL, a specific UID prefix, or fixed block data). During verification, the system is considered to have passed if the read data contains the preset data content—if the data content matches successfully, the card reading function is deemed qualified; otherwise, it is deemed unqualified.

[0119] In practical applications, both the card reading function test and the minimum activation field strength test can be performed when the near-field communication reader is in standard card detection mode.

[0120] It should be noted that the card reader function test and the minimum activation field strength test complement each other: the former verifies the integrity of business data and the stability of the protocol under normal field strength, and can detect data writing errors (such as incorrect URLs during production) or protocol anomalies; the latter provides sensitivity boundary information to ensure the consistency of wake-up of the product under different field strengths. Using both together can more comprehensively evaluate the active interaction performance of the device under test.

[0121] Based on some embodiments of this specification, a complete protocol reading and control unit data verification can be performed by a reader / writer at a preset power within the same fixture. This allows for rapid verification of the basic communication functions and data storage correctness of the device under test (DUT) in a production line environment. This test uses the same fixture hardware and antenna as the active excitation and minimum activation field strength tests, eliminating the need for equipment replacement or repositioning, thereby reducing the complexity and time cost of production line testing.

[0122] In one or more embodiments of this specification, the tooling further includes a positioning module configured to acquire the geographical location information of the tooling and upload the geographical location information to a remote management terminal.

[0123] The positioning module can employ the Global Positioning System (GPS) or other available positioning technologies (such as BeiDou, base station positioning, etc.). In some embodiments, the positioning module is connected to a USB hub inside the fixture via a USB interface or directly to the fixture's control unit (e.g., via a serial port or USB). The upload path for geographic location information varies depending on the connection method between the fixture and the host computer: if the fixture itself has network communication capabilities (e.g., an NB-IoT module or Wi-Fi module with a built-in SIM card), the positioning information can be directly uploaded from the fixture to the remote management terminal; if the fixture is connected to the host computer (test computer) via a serial port, USB, or other interface, the positioning information is first received by the host computer and then forwarded to the remote management terminal.

[0124] The positioning module can be configured to automatically acquire and upload the geographical location information of the tooling at preset time intervals (e.g., once per hour). The uploaded information may include longitude, latitude, and an optional timestamp. In some embodiments, the transmission of positioning information is independent of the test results of the device under test; that is, the positioning information is not triggered by the test process and does not need to be bound to the test data of a specific product. This independent uploading method is beneficial for continuous monitoring of the tooling's whereabouts and prevents the tooling from being used unintentionally or physically lost.

[0125] In other embodiments, after receiving the geographical location information of the tooling, the remote management terminal can further dynamically adjust the test configuration based on this location information. For example, when the tooling is detected to be located in a specific production area or workshop, the remote management terminal or host computer automatically loads the test parameters (such as frequency upper and lower limits, Q value range, power level sequence, etc.) corresponding to that location for the product model. This location-configuration linkage mechanism reduces the need for operators to manually switch parameters and reduces test deviations caused by configuration errors.

[0126] Based on some embodiments of this specification, by integrating a positioning module into the tooling and enabling it to upload geographical location information to a remote management terminal, not only is asset tracking of the tooling itself achieved, but auxiliary information is also provided for the automated configuration of the testing process. When the tooling moves between different production lines and factories, the system can automatically adapt the corresponding test parameters according to the current location, thereby reducing manual intervention and improving test consistency. Simultaneously, location information independent of test data uploads does not interfere with normal test data statistics, and the preset time interval upload strategy balances real-time performance with communication overhead. This design provides convenience for equipment management, loss prevention, and unified scheduling across multiple plants in the production environment, helping to improve the standardization and traceability of production line testing.

[0127] In one or more embodiments of this specification, a near-field communication device testing system is further provided, comprising: The fixture includes a near-field coupled antenna, an RF switch, and a control unit. The near-field coupled antenna is used for near-field electromagnetic coupling with the near-field communication antenna of the device under test (DUT). The RF switch is electrically connected to the near-field coupled antenna. The control unit is communicatively connected to the RF switch and is configured to: in response to a control command, control the RF switch to connect the near-field coupled antenna to a network analyzer to perform passive RF performance testing of the DUT; and control the RF switch to connect the near-field coupled antenna to a near-field communication reader to perform active interactive testing of the DUT.

[0128] The host computer is communicatively connected to the control unit of the tooling and is configured to send test control commands to the control unit and receive test data from the tooling. The network analyzer is detachably connected to the tooling via an interface; The host computer is further configured as follows: In passive RF performance testing mode, the fixture is controlled to switch the RF switch to connect to the network analyzer and trigger the network analyzer to perform testing; In the active interactive test mode, the fixture is controlled to switch the radio frequency switch to connect the near-field communication reader integrated in the fixture, and the near-field communication reader is triggered to perform a test.

[0129] The host computer (e.g., a computer running the test software) communicates with the control unit within the fixture (e.g., via serial port, USB, or Ethernet) to send test control commands to the control unit and receive test data from the fixture. The network analyzer is connected to the fixture via a detachable interface (e.g., an SMA RF connector and a coaxial cable). Specifically, the network analyzer is connected to the first interface of the fixture, which is electrically connected to the first path terminal of the RF switch.

[0130] Figure 3 This is a schematic diagram of a near-field communication device testing system in a practical application scenario, provided as an embodiment of this specification.

[0131] like Figure 3 As shown, the system adopts a centralized control architecture: the test computer (e.g., running the host computer software Ntest.exe) communicates with a handheld network analyzer (e.g., NanoVNA V2) and the MCU board (e.g., N32G352) within the fixture via a USB hub; the MCU board controls the path switching of the RF switch (e.g., DP4T SW) via GPIO pins and controls the near-field communication reader (e.g., FM17660) via the I2C bus; the RF switch alternately connects the network analyzer or the reader to the near-field coupling antenna board; the near-field coupling antenna board and the device under test placed on the fixture are tested via near-field electromagnetic coupling. All test data can be transmitted back to the host computer and then uploaded to a cloud server for quality statistics. In addition, the system may also include a positioning module, which connects to the USB hub via a USB interface, independently acquires the geographical location information (longitude, latitude, etc.) of the fixture and uploads it to the test computer to prevent fixture loss. The cloud server performs statistical analysis on the received test data and location information, and generates data dashboards such as first pass rate and CPK for production management personnel to monitor in real time.

[0132] It should be noted that, in Figure 3 In the system block diagram shown, the connections between the MCU and the RF switch, and the communication lines between the MCU and the positioning module are simplified to highlight the data flow and functional module division. However, these connections exist in the actual implementation of this system, and those skilled in the art can reasonably infer them based on the functional description.

[0133] In a specific embodiment, the host computer is further configured to support two test modes and coordinate the tooling and instruments to perform tests according to the selected mode.

[0134] Passive RF performance testing mode: The host computer sends commands to the control unit (MCU) of the fixture, which then switches the RF switch to the first path (connecting to the network analyzer). Simultaneously, the host computer sends measurement commands (e.g., setting the center frequency to 13.56MHz, sweep width, measuring S11 parameters, etc.) to the network analyzer via its direct communication interface (USB). The network analyzer performs the measurements and returns the results (resonant frequency, Q value, S11) to the host computer. In this mode, the fixture's control unit is only responsible for establishing the RF path and does not directly participate in sending measurement commands to the network analyzer, thus reducing the complexity of the fixture firmware.

[0135] Active Interactive Test Mode: The host computer sends instructions to the control unit of the fixture, which then switches the RF switch to the second path (connecting to the near-field communication reader integrated within the fixture). Simultaneously, the host computer sends the specific active interactive test type to the control unit (such as active excitation test, minimum activation field strength test, card reading function test, or a combination thereof). The control unit then sends detailed transmission parameters and read commands to the reader via the I2C bus and collects the data obtained by the reader (such as waveform sampling results, UID, ATQA, service data, etc.) before returning it to the host computer. The host computer can further analyze, display, and store this data.

[0136] In a typical test cycle, the operator places and secures the device under test (DUT) in the fixture and starts the host computer software. The host computer first sends a command to the control unit to switch the RF switch to the network analyzer path, performing passive performance tests such as resonant frequency, Q value, and return loss. Subsequently, the host computer sends a command to the control unit to switch the RF switch to the reader path, sequentially performing active excitation tests (emitting an LPCD pulse, acquiring the 13.56MHz waveform returned by the DUT via the MCU's ADC, and determining if the duration is ≥1.5ms), minimum activation field strength tests (scanning from minimum power level 6 to maximum power level 0, reading the UID / ATQA, and recording the successful level), and card reading function tests (reading the URL at standard power and verifying the content). After all tests are completed, the host computer summarizes all measurement data, displays the judgment results, and can upload them to the production management system or cloud server.

[0137] Based on some embodiments of this specification, the above-described testing system, through a host computer, centrally schedules the switching of RF switches, network analyzer measurements, and reader / writer operations within the fixture, achieving automated and sequential testing of passive RF indicators and active interactive functions. Operators only need to place the device under test (DUT) and start the program; manual connection or switching of instruments is unnecessary, reducing human error. Because the network analyzer is detachably connected, a single network analyzer can be shared by multiple fixtures in a time-sharing manner, or configured as needed at each workstation, making system deployment flexible. The hierarchical instruction architecture between the host computer and the fixture control unit (the host computer issues mode commands, and the control unit executes specific path switching and reader / writer control) simplifies system integration complexity while maintaining sufficient scalability, facilitating the addition of new test items or replacement of different network analyzer models in the future. This system can significantly improve the automation level and data traceability of production line testing without significantly increasing hardware costs, providing an integrated solution for the consistency management of NFC RF indicators of the DUT ("tap-to-pay" products).

[0138] Based on the test fixtures (including a near-field coupling antenna, an RF switch, a control unit, and a near-field communication reader / writer) described in the foregoing embodiments, this embodiment provides a test method for near-field communication devices.

[0139] Figure 4 The embodiment provided in this specification corresponds to Figure 1 A flowchart illustrating a testing method for near-field communication devices.

[0140] From a procedural perspective, the execution entity of the process can be a program mounted on the test fixture. More specifically, the near-field communication device testing method is applied to a test fixture including a near-field coupling antenna, an RF switch, a control unit, and a near-field communication reader / writer.

[0141] like Figure 4 As shown, the process may include the following steps: Step 402: When the device under test establishes near-field electromagnetic coupling with the near-field coupling antenna, the control unit receives the test mode command.

[0142] Step 404: If the test mode instruction indicates that a passive radio frequency index test is to be performed, the control unit controls the radio frequency switch to connect the near-field coupling antenna to the network analyzer connected to the fixture, so that the network analyzer can perform a passive radio frequency index test on the device under test.

[0143] Step 406: If the test mode instruction indicates to perform an active interaction test, the control unit controls the radio frequency switch to connect the near-field coupling antenna to the near-field communication reader, and controls the near-field communication reader to perform an active interaction test on the device under test.

[0144] In practical applications, test preparation is required first. In some embodiments, before executing the test method, the operator fixes the device under test (DUT) to the test fixture, aligning the near-field coupling antenna of the test fixture with the near-field communication antenna of the DUT. The alignment method can be referred to the description of the carrier and fixture above: the DUT is positioned in a predetermined location using an interchangeable carrier, ensuring that the distance and relative position between the near-field coupling antenna and the DUT antenna remain within design tolerances (e.g., a spacing of 5 mm and a center offset not exceeding ±0.5 mm). This preparation step ensures the reproducibility of the test conditions.

[0145] Next, a test mode command is received. In some embodiments, this test mode command comes from a host computer (e.g., a computer running the test software). The host computer sends a command to the control unit of the fixture via a serial port (USB to UART) or other communication interface, indicating the type of test to be performed (passive RF performance test or active interactive test). The control unit parses the command and determines the subsequent operations.

[0146] Optionally, passive RF performance testing can then be performed. Specifically, the control unit sends a path selection signal to the RF switch via a GPIO pin, connecting the common terminal of the RF switch (connected to the near-field coupling antenna) to the first path terminal (connected to the network analyzer). At this time, the near-field coupling antenna and the network analyzer are in the same RF link. It should be noted that the network analyzer is actually directly controlled by the host computer (e.g., the host computer sends SCPI commands to the network analyzer via USB for measurement). In this mode, the control unit is only responsible for establishing the RF path and does not directly trigger the operation of the network analyzer. After completing the measurement, the network analyzer returns the results to the host computer. In some embodiments, the network analyzer is a portable network analyzer (e.g., a handheld vector network analyzer), which is detachably electrically connected to the fixture via an SMA RF cable. Portable network analyzers are small in size and low in cost, and can be fixed to the fixture frame and connected to the first interface of the fixture via a short cable.

[0147] Alternatively, active interactive testing can be performed. Specifically, the control unit switches the RF switch to the second path (connecting to the reader / writer) via GPIO, and then sends specific test commands to the reader / writer via buses such as I2C (e.g., transmitting LPCD pulses, transmitting carriers at different power levels, sending read commands, etc.). The reader / writer executes the corresponding operation and returns the read data (such as UID, ATQA, service data) or measurement status to the control unit. The control unit then reports the results to the host computer.

[0148] Finally, the results can be judged. Specifically, based on the measurement results, the host computer or control unit determines whether the device under test is qualified. For passive radio frequency index testing, the measured resonant frequency, Q value, S11, etc. are compared with the preset specification range; for active interaction testing, a qualified or unqualified judgment is given based on standards such as whether the active excitation duration is ≥1.5ms, whether the minimum activation field strength level is not higher than the upper limit, and whether the card reading data contains the predetermined content.

[0149] In some embodiments, the test order can be adjusted according to actual needs. Passive RF performance tests can be performed first, followed by active interaction tests; or active interaction tests can be performed first, followed by passive RF performance tests. Neither order changes the respective test principles and judgment logic. The choice of order usually depends on the production line testing cycle and defect screening strategy (for example, prioritizing passive testing can quickly eliminate products with antenna physical defects, reducing the time spent on subsequent active testing).

[0150] The specific structure of the tooling used in this method, the connection relationships of each component, and the specific implementation of passive indicators and active interaction tests can be referred to the descriptions in the embodiments above. For example, the shape of the near-field coupled antenna, the time-division multiplexing logic of the RF switch, the use of the reader and ADC by the control unit, and the optional configuration of the positioning module are all applicable to this method.

[0151] While one or more embodiments of this specification provide method steps as described in the embodiments or flowcharts, it is understood that the order of steps listed in the embodiments or flowcharts is merely one possible execution order among many steps and does not represent the only possible execution order. The order of some steps may be adjusted according to actual needs, or some steps may be omitted. When the claims involve method steps, changes in the order of such steps, or parallel execution between steps, are also within the scope of protection of the claims.

[0152] Figure 4 The proposed method automatically switches the RF switch according to the test mode command through the control unit, enabling the same near-field coupling antenna to connect to the network analyzer or near-field communication reader in a time-division manner. This allows passive RF performance testing and active interaction testing to be completed sequentially on the same fixture and at the same workstation. This method avoids configuring separate fixtures for different test items and manually assembling and disassembling antennas, reducing human intervention and errors caused by repeated positioning. Since the network analyzer is detachably connected to the fixture, and portable network analyzers are less expensive, the production line can flexibly configure test resources as needed. The control unit is only responsible for path switching and reader control, while the host computer directly schedules the network analyzer, resulting in a clear division of labor and reduced system integration complexity. Overall, this method facilitates automated and parameterized production line testing processes, and the test results are traceable, which is beneficial for the consistency control of NFC RF performance in mass production.

[0153] based on Figure 4 In addition to the method described herein, this specification also provides some improved implementation methods, which will be described below.

[0154] In one or more embodiments of this specification, the passive radio frequency performance testing includes testing at least one of the resonant frequency, quality factor, return loss, and VSWR of the device under test. Specifically, the method includes: measuring at least one of the resonant frequency, quality factor, return loss, and VSWR of the device under test, and comparing the measurement results with a preset specification range.

[0155] The resonant frequency refers to the frequency at which the antenna impedance is purely resistive (with zero reactance). For near-field communication equipment, the standard resonant frequency is 13.56MHz. The quality factor (Q value) characterizes the ratio of antenna energy storage efficiency to energy loss. An abnormal Q value may reflect problems with coil winding, materials, or soldering. Return loss (S11) represents the logarithm (dB) of the ratio of reflected power to incident power at the RF port, used to determine the degree of matching between the antenna and the circuit. Voltage standing wave ratio (VSWR) is calculated from the S11 parameter and is equivalent to return loss but expressed differently; both can be used to evaluate matching quality.

[0156] In some embodiments, the S11 curve measured by the network analyzer can be used to simultaneously derive the above-mentioned indicators: the frequency corresponding to the lowest point of the curve is the resonant frequency; the depth of the lowest point corresponds to the return loss (or converted to VSWR); and the quality factor can be calculated based on the ratio of the half-power bandwidth of the curve to the resonant frequency. The control unit or host computer compares the measured values ​​with preset upper and lower limits of the specifications. If all measured indicators are within the specification range, the passive test item is judged to be qualified. By incorporating these quantitative data into the test report, basic data can be provided for subsequent calculation of the process capability index (CPK) and production line quality monitoring.

[0157] Based on some embodiments in this specification, passive RF performance testing is refined to include at least one of resonant frequency, Q value, return loss, and VSWR, enabling the testing method to quantitatively evaluate the antenna's physical characteristics. These indicators are not only used for the acceptance of individual products but can also be statistically analyzed in batches to monitor the stability of the manufacturing process. Compared to simply performing functional continuity testing, this indicator-level testing can detect potential defects such as poor soldering, short circuits, and coil deformation in the antenna in advance, thereby reducing the failure rate after the product leaves the factory.

[0158] In one or more embodiments of this specification, the active interaction test includes at least one of active stimulus testing, minimum activation field strength testing, and card reading function testing. These three tests evaluate different aspects of the device under test (DUT): the active stimulus test verifies whether the DUT can actively transmit a carrier signal of a predetermined duration after detecting a low-power detection pulse; the minimum activation field strength test determines the minimum radio frequency field strength required for the DUT to be woken up and respond correctly; and the card reading function test verifies whether the DUT can correctly store and return the expected service data under standard field strength. By integrating these tests in the same process flow, the active interaction performance of the DUT can be comprehensively evaluated without adding tooling or operational steps. Subsequent embodiments provide specific implementation methods for these three tests.

[0159] In one or more embodiments of this specification, the active excitation test includes: the control unit controlling the near-field communication reader to transmit a low-power detection pulse signal; the control unit acquiring a carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal via an analog-to-digital converter; and the control unit determining whether the duration of the carrier signal is greater than or equal to a predetermined duration threshold.

[0160] In some embodiments, the active excitation function of the device under test is determined to be qualified based on the judgment result: if the duration is greater than or equal to a predetermined duration threshold, the active excitation function is determined to be qualified; otherwise, it is determined to be unqualified.

[0161] The low-power detection pulse signal is a characteristic waveform emitted by low-power card detection (LPCD) modes of card readers such as smartphones and smart wearable devices. In some alternative embodiments, the pulse signal has a width of 25 microseconds and a period of 200 milliseconds. Upon detecting the pulse, the device under test (operating in tag mode) is awakened and actively drives its antenna to transmit a 13.56 MHz carrier signal (i.e., "active transmission"). This carrier signal returns to the fixture via a near-field coupled antenna, where its envelope is acquired by the analog-to-digital converter of the control unit or directly sampled. The control unit compares the duration of the acquired waveform with a predetermined duration threshold (e.g., 1.5 milliseconds). If the carrier signal actively transmitted by the device under test lasts for a sufficiently long duration, it indicates that it can effectively wake up the card reader, such as a mobile phone, which is in low-power card detection mode (i.e., it can switch to standard card detection mode), thus providing a communication basis for "tap to detect". If the duration is too short, it may result in the inability to effectively wake up the card reader, such as a mobile phone, which is in low-power card detection mode (i.e., it cannot switch to standard card detection mode), thus causing the phenomenon of "no response when tapped".

[0162] In practical applications, the reader can first establish a carrier wave (RF field), and the device under test (DUT) actively transmits its own carrier wave after detecting the LPCD pulse; the two processes are sequential in time. The ADC sampling window of the control unit should cover the complete carrier envelope transmitted by the DUT.

[0163] Based on some embodiments in this specification, by controlling the reader to transmit low-power detection pulses through the control unit, and by having the ADC acquire the transmitted carrier and determine the duration, a quantitative evaluation of the active stimulation function can be achieved at a lower cost in a production line environment. Compared to simply verifying whether communication is established, this duration-based method can more directly reflect the response capability of the device under test in low-power wake-up scenarios and the ability of the active stimulation reader to exit the low-power card detection mode. This helps to filter out products with excessively short response waveforms and those lacking effective stimulation functions, thereby improving the consistency of the user experience.

[0164] In one or more embodiments of this specification, the minimum activation field strength test includes: the control unit controlling the near-field communication reader to transmit carrier signals at multiple different power levels; at each power level, the control unit controlling the near-field communication reader to perform a reading operation on the identification information of the device under test; the control unit determining the minimum power level at which the identification information can be successfully read as the minimum activation field strength level.

[0165] In some optional embodiments, the controller can transmit carriers sequentially in ascending order of transmit power (e.g., increasing step by step from the minimum power level). At each power level, it attempts to read the identification information of the device under test. When the identification information is successfully read for the first time, the corresponding power level is determined as the minimum active field strength level. Identification information refers to the information used by the near-field communication device to identify its own identity or type during initialization, including but not limited to a unique identifier (UID) and an ATQA (Attack Response Request), as well as any equivalent response parameters (such as a manufacturer-defined ID, serial number, etc.). The specific setting of the power level can be multiple preset levels. In some embodiments, it includes 8 levels that increase step by step from the minimum power to the maximum power, where level 0 corresponds to the maximum field strength and level 6 corresponds to the minimum field strength; the test order is level 6, level 7, level 5, level 4, level 3, level 2, level 1, and level 0.

[0166] Throughout the test, the reader chip executes the complete protocol interaction: transmitting a carrier wave and modulating a REQA command on the carrier wave, demodulating the ATQA returned by the device under test (DUT), and sending an anti-collision command to read the UID. If the UID and / or ATQA are successfully read, the power increment stops and the current power level is recorded as the minimum active field strength level. If reading fails at all power levels, the minimum active field strength of the DUT is determined to be exceeded.

[0167] Based on some embodiments of this specification, by controlling the reader to transmit carrier waves at multiple different power levels and successively attempting to read identification information, the sensitivity boundaries of the device under test can be quantified. Compared to simply determining whether communication is possible at a fixed power level, this test provides a quantitative indicator of the minimum activation field strength level, thereby enabling the monitoring of consistency in sensitivity across batches of products. This test is executed automatically and can be seamlessly integrated into the test sequence of a tooling setup without manual intervention or additional instruments.

[0168] In one or more embodiments of this specification, the card reading function test includes: the control unit controlling the near-field communication reader to transmit a carrier signal at a preset transmission power and sending a read command according to the near-field communication protocol to read data from the device under test; the control unit receiving the data transmitted by the near-field communication reader; and the control unit verifying whether the data contains predetermined data content.

[0169] In some embodiments, the card reading function of the device under test is determined to be qualified or not based on the verification result: if it contains the predetermined data content, the card reading function is determined to be qualified; otherwise, it is determined to be unqualified.

[0170] When performing this test, the near-field communication reader first activates the RF front-end to generate a continuous carrier wave (with a preset transmission power, such as level 2 or 3, to ensure stable communication). While maintaining the presence of the carrier wave, the reader encodes the read commands generated according to the near-field communication protocol (such as the ISO / IEC 14443 protocol) by changing the amplitude or phase of the carrier wave, including command sequences such as REQA, ANTICOLLISION, SELECT, READ, etc. The carrier wave provides the energy and information carrier for the transmission of the read commands. After obtaining energy from the carrier wave, the device under test returns the response data (such as UID, ATQA or the content of the storage area). After demodulation and decoding, the reader transmits this data to the control unit through interfaces such as I2C, SPI or UART. After receiving the data, the control unit checks whether it contains the predetermined data content (such as a Uniform Resource Locator URL, a specific text or a key field). If it contains, the card reading function is determined to be qualified; otherwise, it is unqualified.

[0171] The card reading function test and the minimum activation field strength test complement each other: the former verifies the integrity of service data and the protocol stability under normal field strength, and can detect data writing errors (such as writing the wrong URL during production) or protocol anomalies; the latter provides sensitivity boundary information to ensure the wake-up consistency of the product under different field strengths.

[0172] Based on some embodiments of this specification, by the reader performing a complete protocol read with a preset power and the control unit performing data verification, the basic communication function and the data storage correctness of the device under test can be quickly confirmed in the production line environment. This test uses the same tooling hardware and antenna as the active excitation and minimum activation field strength tests, without the need to replace the equipment or reposition, thus reducing the complexity and time cost of the production line test. At the same time, through the flexibility verification of the read data by the control unit (such as using inclusion determination), it can adapt to different formats of service data requirements, improving the generality of the test solution.

[0173] In one or more embodiments of this specification, it further includes: obtaining the geographical location information of the test tooling through the positioning module of the test tooling; uploading the geographical location information to the remote management terminal.

[0174] In some optional embodiments, the geographical location information is uploaded at a preset time interval (such as once an hour), and the geographical location information is uploaded independently of the test result of the device under test, that is, the location information is not triggered by the test process and does not have to be bound to the test data of a specific product.

[0175] The positioning module can employ GPS or other positioning technologies (such as BeiDou, base station positioning, etc.). As described in the preceding embodiments, depending on the connection method between the tooling and the host computer, the geographical location information can be directly uploaded by the tooling (if the tooling itself has network communication capabilities), or it can be transmitted to the host computer first and then forwarded to the remote management terminal by the host computer. Independent uploading is beneficial for continuous monitoring of the tooling's whereabouts, preventing unauthorized use or physical loss of the tooling. In some embodiments, after receiving the location information, the remote management terminal can dynamically adjust the test configuration based on this information (e.g., automatically loading the corresponding product test parameters according to the factory area where the tooling is located), thus realizing location tracking. Configuration linkage.

[0176] Based on some embodiments of this specification, acquiring and uploading the geographical location information of tooling through a positioning module not only enables the tracking and management of tooling assets but also provides auxiliary information for the automated configuration of the testing process. The upload strategy, independent of test data, does not interfere with normal test statistics, while the preset upload frequency balances real-time performance with communication overhead. This method facilitates equipment management, loss prevention, and unified scheduling across multiple plants in the production environment, contributing to improved standardization and traceability of production line testing.

[0177] The various technical features in the above embodiments can be combined arbitrarily, as long as there is no conflict or contradiction between the combinations of features. However, due to space limitations, they have not been described one by one. Therefore, the arbitrary combination of various technical features in the above embodiments is also within the scope of this specification.

[0178] Figure 5 The embodiment provided in this specification corresponds to Figure 3 A flowchart illustrating a testing method for near-field communication devices.

[0179] From a procedural perspective, the entity executing the process can be the program mounted on the testing fixture.

[0180] like Figure 5 As shown, the process may include the following steps: Step 502: Perform the following steps sequentially on multiple devices under test: Figure 4 The test method for near-field communication devices shown (or based on such) Figure 4 An improved method for testing near-field communication devices (as shown) is used to obtain test results for each device under test; the test results include at least one of the following: resonant frequency measurement, quality factor measurement, return loss measurement, minimum activation field strength level, whether the active excitation is qualified, and whether the card reading function is qualified. Step 504: Upload the test results of the multiple devices under test to the remote management terminal; Step 506: The remote management terminal generates statistical quality indicators based on the test results received from the plurality of devices under test; the statistical quality indicators include at least one of first pass rate and process capability index; Step 508: When the statistical quality index is lower than the preset threshold, an early warning signal is issued.

[0181] In practical applications, such as Figure 5 The near-field communication (NFC) device testing method shown can be used for consistency control of mass-produced NFC devices. The method includes the following steps.

[0182] First, batch testing of individual items is performed. In practice, operators (or through automated processes) place the devices under test (DUTs) one by one into the replaceable carrier of the fixture, and initiate the testing process via a host computer. The testing process for each device follows the description in the embodiment of the near-field communication device testing method for a single DUT above. After one device is completed, it is removed and the next device is placed in, repeating the process until a predetermined batch (e.g., 1000 devices) is tested. The host computer automatically records the unique identifier (such as a serial number) of each device and its corresponding test results.

[0183] Next, the test results are uploaded to the remote management terminal. The remote management terminal refers to a remote computing device used to receive, store, and process the data uploaded by the tooling. In some embodiments, the remote management terminal can be a cloud server, a local data center server, or a remote monitoring terminal. Preferably, the remote management terminal is a cloud server to enable centralized statistics and analysis of large-scale data. The upload method can be online real-time upload or unified upload after batch testing. During transmission, the test results are stored in association with information such as device identifier and test timestamp to ensure data traceability.

[0184] Next, statistical quality indicators are generated. These indicators include at least one of first-pass yield and process capability index. First-pass yield (FPY) represents the percentage of devices that pass the test on the first attempt out of all devices tested in that batch. For example, if 950 out of 1000 devices in a batch pass all tests on the first attempt, the first-pass yield is 95%. FPY reflects the immediate yield of the production line; a sudden drop may indicate an anomaly (such as material changes, loose tooling, or operator errors). The process capability index (CPK) is calculated based on the distribution of measured values ​​of continuous indicators such as the resonant frequency, quality factor, return loss, or minimum activation field strength level of the device under test. CPK considers both the process mean deviation and standard deviation, and measures the ability of the production process output characteristics to meet specifications. Generally, CPK ≥ 1.33 indicates sufficient process capability; CPK between 1.0 and 1.33 indicates barely acceptable capability; and CPK < 1.0 indicates insufficient process capability, requiring process adjustment.

[0185] For example, regarding the resonant frequency specification, the remote management terminal collects frequency measurements from all devices in the batch, calculates the average value μ and standard deviation σ, and calculates CPK based on the preset upper limit USL and lower limit LSL. If the CPK is too low, even if the frequencies of all individual products are within the specification range, it means that the production process fluctuates significantly, posing a risk of exceeding the specifications.

[0186] Finally, early warnings can be issued based on statistical quality indicators. Specifically, an early warning signal is triggered when a statistical quality indicator falls below a preset threshold. For example, if the first-pass yield is below 90% or the CPK is below 1.0, the remote management terminal can notify production management personnel via interface alerts, SMS, email, etc. The early warning signal can trigger subsequent actions, such as suspending the production line, prompting tooling calibration, and checking material batches.

[0187] In practical applications, when performing consistency control on mass-produced near-field communication (NFC) devices based on NFC device testing methods, two levels of judgment are typically combined: Individual Item Acceptance Criteria: For each device under test, its multi-dimensional test data is compared with a preset standard threshold range. If all test data falls within the standard threshold range, the device is deemed acceptable; otherwise, the device is blocked. Individual item acceptance criteria ensure that each individual product leaving the factory meets basic performance requirements.

[0188] Process quality monitoring: The remote management terminal generates statistical quality indicators such as first-pass yield and CPK based on the test results of multiple devices under test within a historical time period (e.g., the most recent 24 hours, the most recent 1000 products). An alert is issued when these indicators fall below preset thresholds. Process quality monitoring focuses on the stability and consistency of the production process, rather than the pass / fail status of individual products.

[0189] The two complement each other: individual product acceptance criteria intercept obviously defective products, while process quality monitoring provides early warnings of systemic process deviations. For example, if the average resonant frequency of a batch of products gradually drifts from 13.56MHz to 13.65MHz (still within ±0.5MHz of the specification), the individual product acceptance criteria may all be qualified, but the CPK will decrease. The early warning signal can indicate that the process needs to be adjusted to prevent subsequent products from exceeding the specifications.

[0190] In some embodiments, the remote management terminal generates a data dashboard that displays the trends of statistical quality indicators over time or batches (such as line charts or bar charts). Production managers can intuitively monitor the dynamics of first-pass yield and CPK, and promptly identify anomalies.

[0191] In some embodiments, the near-field communication device testing method may further include: obtaining the geographical location information of the test fixture through the positioning module of the test fixture, and uploading the geographical location information to a remote management terminal. The geographical location information is uploaded independently of the test results and is used to monitor the location of the test fixture. Optionally, the geographical location information is uploaded at preset time intervals (e.g., once per hour).

[0192] In some embodiments, the near-field communication device testing method may further include establishing a test profile for the device under test (DUT). The test profile includes the DUT's unique identifier (e.g., product serial number), test time, geographical location information (tooling location), and multi-dimensional test data (frequency, Q value, S11, minimum activation field strength level, active excitation determination, card reading function determination, etc.). This test profile is uploaded to a cloud database for statistical analysis of batch product pass-through rate and process capability index (CPK). When customer complaints or quality issues arise, the complete test data for the product can be retrieved to analyze the cause of the problem.

[0193] In a further embodiment, the method may also include verification during the deployment phase: the test fixture is deployed in a preset test area, and the fixture's positioning module verifies that it is within the allowed geofence range. If the geographic location information obtained by the positioning module exceeds the allowed geofence range, the control unit of the test fixture is locked, subsequent test steps are prohibited, and an abnormal alarm message is generated and uploaded to the remote management terminal. This mechanism helps prevent the fixture from being taken out of the designated area for unauthorized use.

[0194] During the clamping phase, the interchangeable carrier is equipped with corresponding positioning structures for different models of the device under test (DUT) to ensure that the coupling coefficient deviation between the near-field communication antenna and the near-field coupling antenna of different models of DUT is less than a preset threshold (e.g., ±0.5dB) when the DUT is loaded into the test fixture. By changing the carrier instead of adjusting the fixture body, the test object can be quickly switched.

[0195] During the calibration phase, the test fixture can be self-calibrated using a standard reference label before the start of each day's testing or at preset intervals (e.g., every 4 hours). If the self-calibration result deviates from the standard value, a recalibration process is triggered or testing is paused until calibration is successful. This helps to offset measurement biases caused by environmental drift and instrument aging.

[0196] Based on some embodiments of this specification, the above method collects multi-dimensional RF test results of batch products through sequential single-item testing, and calculates statistical quality indicators such as first-pass yield and process capability index at the remote management terminal, realizing a complete quality control closed loop from single-item qualification judgment to production process stability monitoring. Single-item judgment ensures that the antenna physical performance, active excitation response, sensitivity boundary, and card reading function of each product meet the specifications; while first-pass yield and CPK monitoring can promptly detect production line fluctuations, process deviations, or tooling abnormalities, triggering early warnings to prevent large-scale quality accidents. Through the establishment of test archives, all test data is traceable and analyzable, providing data support for process improvement and quality review. This method elevates production line testing from a simple "good or bad judgment" to "process control," helping to ensure the consistency of NFC RF indicators and shipment quality of products.

[0197] Figure 6 This is a flowchart illustrating another near-field communication device testing method provided in one embodiment of this specification.

[0198] From a procedural perspective, the execution entity of the process can be a program mounted on the test fixture. More specifically, the near-field communication device testing method is applied to a test fixture including a near-field coupling antenna, a near-field communication reader / writer, and a control unit.

[0199] like Figure 6 As shown, the process may include the following steps: Step 602: When the device under test establishes near-field electromagnetic coupling with the near-field coupling antenna, the control unit controls the near-field communication reader to transmit a low-power detection pulse signal; Step 604: The analog-to-digital converter of the control unit acquires the carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal; Step 606: Compare the duration of the carrier signal with a predetermined duration threshold; Step 608: Determine whether the active excitation function of the device under test is qualified based on the comparison results.

[0200] In practical applications, the first step is to establish near-field electromagnetic coupling between the device under test (DUT) and the near-field coupling antenna. This step is typically achieved by fixing the DUT onto a fixture, ensuring that the DUT's near-field communication antenna and the near-field coupling antenna maintain a predetermined relative position and distance (e.g., a 5mm gap and center alignment). For details on the specific positioning methods of the fixture and the carrier, please refer to the description in the above embodiment.

[0201] Next, a low-power detection pulse signal is emitted. This pulse signal is used to simulate the low-power card detection (LPCD) behavior of a mobile phone or card reader. In some embodiments, the low-power detection pulse signal can be a low-power card detection pulse conforming to ISO / IEC 14443 or ISO / IEC 15693 standards, or it can be a custom periodic short pulse signal. As a specific example, the pulse signal width can be 25 microseconds and the period can be 200 milliseconds.

[0202] Next, the carrier signal actively transmitted by the device under test (DUT) is acquired. The DUT is awakened upon detecting a low-power detection pulse and actively drives its antenna to transmit a carrier signal at a predetermined frequency (e.g., 13.56 MHz). This carrier signal is returned to the fixture via a near-field coupling antenna.

[0203] Next, the duration is compared with a predetermined duration threshold. In some embodiments, the duration can be determined by identifying the start and end times of the amplitude exceeding a preset noise threshold in the acquired signal, and calculating the time difference between the start and end times as the duration of the carrier signal. The predetermined duration threshold can be 1.5 milliseconds. The comparison result can be "greater than or equal to the threshold" or "less than the threshold".

[0204] Finally, the pass / fail status of the active excitation function is determined. Specifically, if the duration of the carrier signal is greater than or equal to a predetermined duration threshold, the active excitation function of the device under test is deemed to be passable; otherwise, it is deemed to be failable. In some embodiments, the determination step can be performed directly by the control unit (e.g., through an internal comparator or software algorithm), or it can be performed by a host computer that is communicatively connected to the control unit (the control unit uploads the acquired waveform data to the host computer, and the host computer software performs the duration determination).

[0205] In a non-limiting specific example, the predetermined duration threshold is 1.5 milliseconds, the width of the low-power detection pulse signal is 25 microseconds and the period is 200 milliseconds, and the frequency of the carrier signal is 13.56 MHz. These values ​​can be adjusted according to the actual protocol standard used and the design requirements of the device under test, and this application is not limited to the specific values ​​mentioned above.

[0206] Based on some embodiments of this specification, this active excitation test method uses a reader to transmit low-power detection pulses, the ADC of the control unit to acquire the carrier signal actively transmitted by the device under test (DUT), and compares the carrier duration with a predetermined threshold to quantitatively evaluate the DUT's responsiveness in low-power wake-up scenarios. Compared to simply verifying whether communication is established, this duration-based method more directly reflects the DUT's responsiveness in low-power wake-up scenarios and its ability to actively excite the card reader to exit low-power card detection mode. This helps to filter out products with excessively short response waveforms or lacking effective excitation functionality, thereby improving the consistency of user experience. This method can be fully automated, sharing the same hardware with other tests on the tooling (such as passive indicators and minimum activation field strength), requiring no additional instruments, and is suitable for mass deployment on production lines.

[0207] Based on the same idea, this specification also provides near-field communication device testing fixtures corresponding to the above methods in its embodiments.

[0208] The near-field communication device test fixture includes: A near-field coupling antenna is used for near-field electromagnetic coupling with the near-field communication antenna of the device under test. A near-field communication reader, electrically connected to the near-field coupling antenna, is configured to transmit low-power detection pulse signals; The control unit includes an analog-to-digital converter, and the control unit is communicatively connected to the near-field communication reader / writer. The control unit is configured to: control the near-field communication reader to transmit the low-power detection pulse signal; acquire the carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal through the analog-to-digital converter; compare the duration of the carrier signal with a predetermined duration threshold; and determine whether the active excitation function of the device under test is qualified based on the comparison result.

[0209] The near-field coupling antenna is used for near-field electromagnetic coupling with the near-field communication antenna of the device under test (DUT). This antenna can be in the form of a PCB coil, flexible board coil, or wire-wound coil, and its relative position to the DUT antenna is maintained by a fixture and carrier.

[0210] The near-field communication reader is electrically connected to a near-field coupled antenna (e.g., via a PCB microstrip line or SMA RF line) and is configured to transmit low-power detection pulse signals. This reader can simulate the low-power card detection (LPCD) behavior of a mobile phone by transmitting a pulse signal with a width of 25 microseconds and a period of 200 milliseconds, or other low-power detection pulses conforming to ISO / IEC 14443 or ISO / IEC 15693 standards.

[0211] The control unit includes an analog-to-digital converter (ADC) and is communicatively connected to the near-field communication reader (e.g., via I2C, SPI, or UART bus). The control unit is configured to perform the following operations: control the near-field communication reader to transmit the low-power detection pulse signal; acquire, via its ADC, a carrier signal (e.g., a 13.56MHz carrier) actively transmitted by the device under test in response to the low-power detection pulse signal; compare the duration of the acquired carrier signal with a predetermined duration threshold (e.g., 1.5 milliseconds); and determine, based on the comparison result, whether the active excitation function of the device under test is qualified (qualified if the duration is ≥ the threshold).

[0212] Based on some embodiments of this specification, this fixture integrates a reader, control unit (including an ADC), and near-field coupled antenna, specifically designed for testing active excitation functions. Combined with a configuration where the control unit actively controls the reader to transmit pulses and the ADC automatically acquires the transmission carrier duration, this fixture can automatically and quickly evaluate the low-power wake-up response capability of the device under test in a production line environment. Since it does not require an external oscilloscope or dedicated analyzer, the entire test can be completed at a single workstation, reducing testing costs and improving testing efficiency. The optional signal conditioning circuitry within the fixture further reduces the hardware performance requirements of the control unit, enabling its implementation on a wider range of low-cost controllers. By using a predetermined duration threshold (e.g., 1.5ms) as a criterion, this fixture can quantitatively filter out products with excessively short response waveforms (unable to transmit an effective excitation signal), thereby improving the stability and consistency of shipped products in real-world user "touch-and-go" scenarios.

[0213] Figure 7 This is a flowchart illustrating a testing method for near-field communication devices in a practical application scenario, as provided in the embodiments of this specification.

[0214] like Figure 7 As shown, the specific steps include: Step 1: Test preparation and alignment.

[0215] According to the antenna coupling test requirements, the NFC antenna board on the fixture is aligned with the NFC coil inside the device under test using the same method to ensure that the relative position, spacing, and coupling coefficient between the two are consistent during each test. Specifically, by replacing the test carrier with one that matches the shape of the product under test, the product is fixed in the test fixture, and the positioning structure of the fixture is used to ensure precise alignment of the antenna board and the coil.

[0216] Step 2: Start the host computer and configure the parameters.

[0217] The operator starts the host computer software running on the test computer. In the host computer interface, the test threshold values ​​and the test items to be performed are configured. The threshold values ​​include, but are not limited to: the upper and lower limits of the resonant frequency, the upper and lower limits of the Q value, the maximum allowable value of S11 (e.g., -10dB), and the allowable level of the minimum activation field strength (e.g., ≤4 levels). The test items include one or more of the following: frequency test, Q value test, S11 test, active excitation test, card reading function test, and minimum activation field strength test. Simultaneously, the unique serial number (SN) of the product under test can be entered for subsequent result traceability.

[0218] Step 3: Initiate the test.

[0219] For example, when the operator clicks the "Start Test" button on the host computer interface, the host computer sends a start test command to the MCU via the serial port.

[0220] Step 4: Passive RF performance testing.

[0221] 1) Switching the RF switch: The MCU controls the RF switch via GPIO to switch to the handheld network analyzer path, enabling the NFC antenna board to establish an RF connection with the handheld network analyzer.

[0222] 2) Calibrate the network analyzer: The host computer sends calibration commands to the handheld network analyzer via USB to perform manual or automated calibration (e.g., open circuit, short circuit, load calibration) to eliminate inherent errors in the test cables and tooling antenna boards.

[0223] 3) Measure dynamic radio frequency indicators: The host computer controls the handheld network divider to perform frequency sweep measurement on the coupling system, obtain the resonant frequency, Q value and S11 parameters, and compare them with the preset threshold value to determine whether they are qualified.

[0224] Step 5: Testing proactive interaction metrics.

[0225] 1) Switching the RF switch: The MCU controls the RF switch to switch to the near-field communication reader (Reader chip, such as model FM17660) path, establishing an RF connection between the NFC antenna board and the Reader chip. Subsequently, the following three tests can be performed sequentially. The order of the tests is adjustable; this embodiment uses the order of active excitation, minimum activation field strength, and card reading function as an example.

[0226] 2) Active incentive testing.

[0227] The reader chip simulates a mobile phone, emitting an LPCD (Low Power Card Detection) characteristic waveform with a width of 25μs and a period of 200ms. After the NFC tag of the product under test is woken up, it sends back a 13.56MHz oscillation signal (the signal used in actual use to wake the phone from LPCD mode to standard card detection mode). This transmitted signal is acquired by the MCU's built-in ADC (Analog-to-Digital Converter). The MCU determines whether the duration of the acquired 13.56MHz waveform meets the requirement of ≥1.5ms. If it does, the active excitation function is considered qualified; otherwise, it is considered unqualified.

[0228] 3) Minimum activation field strength test.

[0229] The reader chip simulates a mobile phone transmitting carrier signals. Its transmission power can be divided into eight levels according to the Fudan Microchip documentation: 0 is the maximum field strength, and 6 is the minimum field strength. The test starts from the minimum level 6, and then transmits signals sequentially at levels 6, 7, 5, 4, 3, 2, 1, and 0, attempting to read the UID and ATQA of the product under test at each power level. If the UID and ATQA are successfully read at a certain level, the scan immediately stops, and the current power level is recorded as the minimum active field strength level for that product. If there is no response within a 10-second timeout period, the process continues to the next level; if all levels fail to read the signal, the product is deemed unqualified.

[0230] 4) Card reading function test.

[0231] The reader chip transmits a carrier wave at a standard transmit power (e.g., level 2 or 3) and executes the complete card reading process (including commands such as REQA, ANTICOLLISION, SELECT, and READ) according to the ISO / IEC 14443-3A protocol to read the business data (such as URLs) stored internally by the product under test. If the reading is successful and the data content matches the expectations, the card reading function is considered qualified; otherwise, it is considered unqualified.

[0232] Step 6: Upload test results and save logs.

[0233] After all tests are completed, the host computer will upload the raw data of this test (including resonant frequency, Q value, S11, whether the active excitation is passed, whether the card reading function is passed, and the minimum activation field strength level) and the final judgment result (PASS / FAIL) to the cloud database, and save the test log file locally.

[0234] Step 7: Data dashboard and quality monitoring.

[0235] Based on the received batch test data, the cloud server automatically builds data dashboards for various test indicators, such as first pass rate and CPK (process capability index), for production managers to monitor the production line quality status in real time.

[0236] In practical applications, the passive indicator test and the active indicator test can be performed in any order. Preferably, the passive indicator test is performed first to quickly screen out products with antenna physical abnormalities and improve test efficiency.

[0237] The active stimulus test, minimum activation field strength test, and card reader function test are independent of each other and can be executed in any order. For example, the card reader function test can be performed first to quickly verify whether the device under test has basic communication capabilities; then the minimum activation field strength test can be performed to quantify the product's sensitivity boundaries; finally, the active stimulus test can be performed to verify the product's response capability in low-power wake-up scenarios. Alternatively, depending on different testing strategies, the minimum activation field strength test can be performed first, followed by the card reader function test, and finally the active stimulus test.

[0238] According to the technical solutions of the above embodiments, the beneficial technical effects achieved by this application are at least reflected in the following aspects: First, the above embodiments achieve comprehensive quantitative testing of the NFC radio frequency indicators of the device under test ("tap-to-pay" products) at a relatively low cost. By organically combining a low-cost handheld network analyzer with an MCU control board, RF switch, and reader chip, it can not only measure traditional passive indicators such as resonant frequency, Q value, and S11, but also complete automated testing of active interaction indicators such as active excitation response, minimum activation field strength, and card reading function. This overcomes the shortcomings of existing solutions, which are either incomplete in testing or have expensive equipment, and significantly reduces the investment in production line testing and the threshold for promotion and application.

[0239] Secondly, the above embodiments effectively ensure the consistency of NFC performance and quality traceability in mass production. Through normalized fixture design (adapting to different products simply by changing the carrier) and precise positioning structure, consistent antenna coupling conditions are ensured for each test. The host computer automatically switches RF channels, determines PASS / FAIL according to preset thresholds, and independently uploads all test data and GPS positioning information to the cloud, generating quality dashboards such as pass rate and CPK. This enables real-time early warning and process capability monitoring of production line anomalies, thereby intercepting various potential defects such as frequency exceeding limits, abnormal Q values, and excessively high minimum activation field strength, significantly improving the shipment quality and user experience consistency of NFC products.

[0240] Third, the above embodiments also enhance the controllability and security of the tooling equipment. The tooling integrates a GPS positioning module, which automatically uploads latitude and longitude information to the cloud periodically (e.g., hourly), effectively preventing the testing tooling from being taken out of the designated area or lost, thus solving the management blind spot where traditional professional testing equipment cannot be tracked. At the same time, the entire testing process is highly automated; operators only need to place the product, scan the serial number (SN), and click start to complete all tests, improving production line cycle time and personnel efficiency.

[0241] Based on the same idea, this specification also provides devices corresponding to the above methods in its embodiments.

[0242] Figure 8 A structural block diagram of a computing device 800 provided according to an embodiment of this specification is shown.

[0243] The computing device 800 includes: Memory 810 and processor 820; The memory 810 is used to store computer programs / instructions, and the processor 820 is used to execute the computer programs / instructions. When the computer programs / instructions are executed by the processor 820, they implement the steps of the near-field communication device testing method.

[0244] Specifically, the components of the computing device 800 include, but are not limited to, a memory 810 and a processor 820. The processor 820 is connected to the memory 810 via a bus 830, and the database 850 is used to store data.

[0245] The computing device 800 also includes an access device 840, which enables the computing device 800 to communicate via one or more networks 860. Examples of these networks include Public Switched Telephone Network (PSTN), Local Area Network (LAN), Wide Area Network (WAN), Personal Area Network (PAN), or combinations of communication networks such as the Internet. The access device 840 may include one or more of any type of wired or wireless network interface (e.g., a network interface card (NIC)), such as an IEEE 802.11 Wireless Local Area Network (WLAN) wireless interface, a Wi-MAX (Worldwide Interoperability for Microwave Access) interface, an Ethernet interface, a Universal Serial Bus (USB) interface, a cellular network interface, a Bluetooth interface, a Near Field Communication (NFC) interface, and so on.

[0246] In one embodiment of this specification, the aforementioned components of the computing device 800 and Figure 8 Other components, not shown, can also be connected to each other, for example, via a bus. It should be understood that... Figure 8 The block diagram of the computing device shown is for illustrative purposes only and is not intended to limit the scope of this application. Those skilled in the art can add or replace other components as needed.

[0247] The computing device 800 can be any type of stationary or mobile computing device, including mobile computers or mobile computing devices (e.g., tablet computers, personal digital assistants, laptop computers, notebook computers, netbooks, etc.), mobile phones (e.g., smartphones), wearable computing devices (e.g., smartwatches, smart glasses, etc.) or other types of mobile devices, or stationary computing devices such as desktop computers or personal computers (PCs). The computing device 800 can also be a mobile or stationary server.

[0248] The processor 820 executes the computer instructions to implement the steps of the near-field communication device testing method.

[0249] The above is an illustrative scheme of a computing device according to this embodiment. It should be noted that the technical solution of this computing device and the technical solution of the near-field communication device testing method described above belong to the same concept. For details not described in detail in the technical solution of the computing device, please refer to the description of the technical solution of the near-field communication device testing method described above.

[0250] An embodiment of this specification also provides a computer-readable storage medium storing computer instructions that, when executed by a processor, implement the steps of the near-field communication device testing method as described above.

[0251] The above is an illustrative scheme of a computer-readable storage medium according to this embodiment. It should be noted that the technical solution of this storage medium belongs to the same concept as the technical solution of the near-field communication device testing method described above. For details not described in detail in the technical solution of the storage medium, please refer to the description of the technical solution of the near-field communication device testing method described above.

[0252] An embodiment of this specification also provides a computer program product, including a computer program / instructions that, when executed by a processor, implement the steps of the above-described near-field communication device testing method.

[0253] The above is an illustrative scheme of a computer program product according to this embodiment. It should be noted that the technical solution of this computer program product and the technical solution of the above-described near-field communication device testing method belong to the same concept. For details not described in detail in the technical solution of the computer program product, please refer to the description of the technical solution of the above-described near-field communication device testing method.

[0254] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, for the device and medium embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the description of the method embodiments. The devices, media and methods provided in the embodiments of this specification are corresponding to each other, and therefore the devices and media also have similar beneficial technical effects as the corresponding methods. Since the beneficial technical effects of the methods have been described in detail above, the beneficial technical effects of the corresponding devices and media will not be repeated here.

[0255] The foregoing has described specific embodiments of this specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims may be performed in a different order than that shown in the embodiments and may still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are possible or may be advantageous.

[0256] In the 1990s, improvements to a technology could be clearly distinguished as either hardware improvements (e.g., improvements to the circuit structure of diodes, transistors, switches, etc.) or software improvements (improvements to methodology). However, with technological advancements, many methodological improvements today can be considered direct improvements to hardware circuit structures. Designers almost always obtain the corresponding hardware circuit structure by programming the improved methodology into the hardware circuit. Therefore, it cannot be said that a methodological improvement cannot be implemented using hardware physical modules. For example, a Programmable Logic Device (PLD) (such as a Field Programmable Gate Array (FPGA)) is such an integrated circuit whose logic function is determined by the user programming the device. Designers can program a digital system themselves to "integrate" it onto a PLD, without needing chip manufacturers to design and manufacture dedicated integrated circuit chips. Furthermore, nowadays, instead of manually manufacturing integrated circuit chips, this programming is mostly implemented using "logic compiler" software. Similar to the software compiler used in program development, the original code before compilation must also be written in a specific programming language, called a Hardware Description Language (HDL). There are many HDLs, such as ABEL (Advanced Boolean Expression Language), AHDL (Altera Hardware Description Language), Confluence, CUPL (Cornell University Programming Language), HDCal, JHDL (Java Hardware Description Language), Lava, Lola, MyHDL, PALASM, and RHDL (Ruby Hardware Description Language). Currently, the most commonly used are VHDL (Very-High-Speed ​​Integrated Circuit Hardware Description Language) and Verilog. Those skilled in the art should also understand that by simply performing some logic programming on the method flow using one of these hardware description languages ​​and programming it into an integrated circuit, the hardware circuit implementing the logical method flow can be easily obtained.

[0257] The controller can be implemented in any suitable manner. For example, it can take the form of a microprocessor or processor and a computer-readable medium storing computer-readable program code (e.g., software or firmware) executable by the (micro)processor, logic gates, switches, application-specific integrated circuits (ASICs), programmable logic controllers, and embedded microcontrollers. Examples of controllers include, but are not limited to, the following microcontrollers: ARC 625D, Atmel AT91SAM, Microchip PIC18F26K20, and Silicon Labs C8051F320. A memory controller can also be implemented as part of the control logic of the memory. Those skilled in the art will also recognize that, in addition to implementing the controller in purely computer-readable program code form, the same functionality can be achieved by logically programming the method steps to make the controller take the form of logic gates, switches, application-specific integrated circuits, programmable logic controllers, and embedded microcontrollers. Therefore, such a controller can be considered a hardware component, and the means included therein for implementing various functions can also be considered as structures within the hardware component. Alternatively, the means for implementing various functions can be considered as both software modules implementing the method and structures within the hardware component.

[0258] The systems, devices, modules, or units described in the above embodiments can be implemented by computer chips or entities, or by products with certain functions. A typical implementation device is a computer. Specifically, a computer can be, for example, a personal computer, laptop computer, cellular phone, camera phone, smartphone, personal digital assistant, media player, navigation device, email device, game console, tablet computer, wearable device, or any combination of these devices.

[0259] For ease of description, the above devices are described separately by function as various units. Of course, in implementing this application, the functions of each unit can be implemented in one or more software and / or hardware.

[0260] Those skilled in the art will understand that one or more embodiments of this specification can be provided as a method, system, or computer program product. Therefore, embodiments of this specification can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, embodiments of this specification can take the form of a computer program product implemented on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0261] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this specification. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, produce a machine for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0262] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0263] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0264] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0265] Memory may include non-persistent storage in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0266] Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital character versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0267] This application can be described in the general context of computer-executable instructions, such as program modules, that are executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc., that perform a specific task or implement a specific abstract data type. This application can also be practiced in distributed computing environments where tasks are performed by remote processing devices connected via a communication network. In distributed computing environments, program modules can reside in local and remote computer storage media, including storage devices.

[0268] The above description is merely an embodiment of this application and is not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A testing fixture for near-field communication devices, comprising: A near-field coupling antenna is used for near-field electromagnetic coupling with the near-field communication antenna of the device under test. A radio frequency switch is electrically connected to the near-field coupling antenna; The control unit, communicatively connected to the RF switch, is configured to: in response to a control command, control the RF switch to connect the near-field coupling antenna to a network analyzer to perform passive RF performance testing on the device under test; and control the RF switch to connect the near-field coupling antenna to a near-field communication reader to perform active interactive testing on the device under test.

2. The tooling as described in claim 1 further includes: The first interface is electrically connected to the first path terminal of the RF switch and is used to connect to an external network analyzer. The near-field communication reader is integrated into the tooling and is electrically connected to the second channel terminal of the radio frequency switch. The common terminal of the radio frequency switch is electrically connected to the near-field coupling antenna.

3. The tooling as described in claim 1, wherein the control unit is communicatively connected to the near-field communication reader; The control unit is configured to send control commands to the near-field communication reader to trigger the near-field communication reader to perform the active interaction test.

4. The tooling as described in claim 1 further includes: A fixture for accommodating the near-field coupling antenna; A replaceable carrier for securing the device under test; The replaceable carrier is detachably mounted on the fixture, and when the replaceable carrier is mounted on the fixture, the near-field communication antenna of the device under test and the near-field coupling antenna maintain a predetermined relative position.

5. The tooling as described in claim 1, wherein the network analyzer is a portable network analyzer.

6. The tooling as described in claim 1, wherein the passive radio frequency performance test includes testing at least one of the resonant frequency, quality factor, return loss, and VSWR of the device under test.

7. The tooling as described in claim 1, wherein the active interaction test includes at least one of active excitation test, minimum activation field strength test, and card reading function test.

8. The tooling as described in claim 7, in the active excitation test: The near-field communication reader is configured to transmit low-power detection pulse signals; The control unit is configured to acquire, via an analog-to-digital converter, a carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal; and to determine whether the duration of the carrier signal is greater than or equal to a predetermined duration threshold.

9. The tooling as described in claim 7, in the minimum activation field strength test: The control unit is configured to control the near-field communication reader to transmit carrier signals at multiple different power levels, and to perform a reading operation on the identification information of the device under test at each power level; and to determine the minimum power level at which the identification information can be successfully read as the minimum activation field strength level.

10. The tooling as described in claim 7, in the card reading function test: The near-field communication reader is configured to transmit a carrier signal at a preset transmission power and send a read command according to the near-field communication protocol to read data from the device under test. The control unit is configured to receive the data transmitted by the near-field communication reader and verify whether the data contains predetermined data content.

11. The tooling as described in any one of claims 1 to 10, further comprising a positioning module, The positioning module is configured to acquire the geographical location information of the tooling and upload the geographical location information to a remote management terminal.

12. A near-field communication device testing system, comprising: Tooling as described in any one of claims 1 to 11; The host computer is communicatively connected to the control unit of the tooling and is configured to send test control commands to the control unit and receive test data from the tooling. The network analyzer is detachably connected to the tooling via an interface; The host computer is further configured as follows: In passive RF performance testing mode, the fixture is controlled to switch the RF switch to connect to the network analyzer and trigger the network analyzer to perform testing; In the active interactive test mode, the fixture is controlled to switch the radio frequency switch to connect the near-field communication reader integrated in the fixture, and the near-field communication reader is triggered to perform a test.

13. A testing fixture for near-field communication devices, comprising: A near-field coupling antenna is used for near-field electromagnetic coupling with the near-field communication antenna of the device under test. A near-field communication reader, electrically connected to the near-field coupling antenna, is configured to transmit low-power detection pulse signals; The control unit includes an analog-to-digital converter, and the control unit is communicatively connected to the near-field communication reader / writer. The control unit is configured to: control the near-field communication reader to transmit the low-power detection pulse signal; acquire the carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal through the analog-to-digital converter; and compare the duration of the carrier signal with a predetermined duration threshold. The effectiveness of the active excitation function of the device under test is determined based on the comparison results.

14. A test method for near-field communication devices, applied to a test fixture including a near-field coupling antenna, a radio frequency switch, a control unit, and a near-field communication reader / writer, comprising: When the device under test establishes near-field electromagnetic coupling with the near-field coupling antenna, the control unit receives the test mode command; If the test mode instruction indicates that a passive radio frequency performance test is to be performed, the control unit controls the radio frequency switch to connect the near-field coupling antenna to the network analyzer connected to the tooling, so that the network analyzer can perform a passive radio frequency performance test on the device under test. If the test mode instruction indicates to perform an active interactive test, the control unit controls the radio frequency switch to connect the near-field coupling antenna to the near-field communication reader, and controls the near-field communication reader to perform an active interactive test on the device under test.

15. The method of claim 14, wherein the passive radio frequency performance testing includes testing at least one of the resonant frequency, quality factor, return loss, and VSWR of the device under test.

16. The method of claim 14, wherein the active interaction test includes at least one of active stimulus test, minimum activation field strength test and card reading function test.

17. The method of claim 16, wherein the active stimulus test comprises: The control unit controls the near-field communication reader to transmit low-power detection pulse signals; The control unit acquires the carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal via an analog-to-digital converter; The control unit determines whether the duration of the carrier signal is greater than or equal to a predetermined duration threshold.

18. The method of claim 16, wherein the minimum activation field strength test comprises: The control unit controls the near-field communication reader to transmit carrier signals at multiple different power levels; At each power level, the control unit controls the near-field communication reader to perform a reading operation on the identification information of the device under test; The control unit determines the minimum power level at which the identification information can be successfully read as the minimum activation field strength level.

19. The method of claim 16, wherein the card reading function test includes: The control unit controls the near-field communication reader to transmit a carrier signal at a preset transmission power and sends a read command according to the near-field communication protocol to read data from the device under test; The control unit receives the data transmitted by the near-field communication reader; The control unit verifies whether the data contains predetermined data content.

20. The method of any one of claims 14 to 19, further comprising: The geographical location information of the test fixture is obtained through the positioning module of the test fixture; The geographic location information is uploaded to the remote management terminal.

21. A testing method for a near-field communication device, comprising: The near-field communication device test method according to any one of claims 14 to 20 is sequentially applied to multiple devices under test to obtain the test results for each device under test. The test results include at least one of the following: resonant frequency measurement, quality factor measurement, return loss measurement, minimum activation field strength level, whether the active excitation is qualified, and whether the card reading function is qualified. The test results of the multiple devices under test are uploaded to the remote management terminal; The remote management terminal generates statistical quality indicators based on the test results received from the multiple devices under test; the statistical quality indicators include at least one of first pass rate and process capability index; When the statistical quality index is lower than the preset threshold, an early warning signal is issued.

22. A testing method for near-field communication devices, applied to a test fixture including a near-field coupled antenna, a near-field communication reader / writer, and a control unit, comprising: When the device under test establishes near-field electromagnetic coupling with the near-field coupling antenna, the control unit controls the near-field communication reader to transmit a low-power detection pulse signal; The analog-to-digital converter of the control unit acquires the carrier signal actively transmitted by the device under test in response to the low-power detection pulse signal; The duration of the carrier signal is compared with a predetermined duration threshold; The effectiveness of the active excitation function of the device under test is determined based on the comparison results.

23. A computing device, comprising: Memory and processor; The memory is used to store computer programs / instructions, and the processor is used to execute the computer programs / instructions, which, when executed by the processor, implement the steps of the method according to any one of claims 14 to 22.

24. A computer-readable storage medium storing computer instructions that, when executed by a processor, implement the steps of the method according to any one of claims 14 to 22.

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