Deformation monitoring method and device, electronic equipment and storage medium
By calculating the ambiguity characteristics of the base station, it is determined whether the base station has moved. If it has not moved, coordinate compensation is performed, which solves the deformation monitoring error caused by single-point positioning and achieves more accurate deformation monitoring.
CN122329124APending Publication Date: 2026-07-03SHANGHAI YICHEN TECH CO LTD
View PDF 0 Cites 0 Cited by
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHANGHAI YICHEN TECH CO LTD
- Filing Date
- 2026-04-16
- Publication Date
- 2026-07-03
Smart Images

Figure CN122329124A_ABST
Abstract
This application provides a deformation monitoring method, apparatus, electronic device, and storage medium, relating to the field of positioning technology. The method includes: when the coordinates of a first reference station and a second reference station are different, calculating first ambiguity feature information based on first observation data, the coordinates of the first reference station, the coordinates of a first monitoring station, and first ephemeris data; calculating second ambiguity feature information based on second observation data, the coordinates of the first reference station, the coordinates of the first monitoring station, and the second ephemeris data; determining whether the reference station has moved relative to a first epoch based on the first and second ambiguity feature information; and calculating the final deformation based on the second observation data, the coordinates of the second reference station, the second ephemeris data, the coordinates of the first reference station, and the initial monitoring station coordinates when it is determined that the reference station has not moved relative to the first epoch; thereby improving the accuracy of deformation monitoring.
Need to check novelty before this filing date? Find Prior Art