Universal chip resistor test fixture

Abstract

The utility model discloses a universal chip resistor test fixture, including seat body, bearing mechanism, elevating mechanism, probe subassembly and connector, the bearing mechanism is used for bearing the resistance sample piece, elevating mechanism includes compressible piece and drive subassembly that drives the compressible piece to move, has ensured the accurate contact of probe and resistance sample piece, probe subassembly includes four probe, and the connector is connected with the probe subassembly. The four probes are detachably connected with the four-in and four-out connector, and the four-in and four-out connector is detachably connected with the detection equipment through the transmission line, so that the universality and flexibility of the test fixture are greatly improved. Moreover, the test fixture reduces the dependence on a connector of a specific model, thereby remarkably reducing the cost, and enabling the test fixture to be connected with test devices of different models, thereby facilitating the comparison of the test results of different test devices.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic device testing, in particular to a universal chip resistor testing fixture. Background Art

[0002] Common chip resistor resistance test fixtures are connected to resistance testers through test lines, which consist of plug connectors (such as Japanese HRS connectors, with an original market price of 70-100 yuan) and RVV 4-core national standard cables. Plug connectors are expensive, and if each product resistance test fixture is equipped with one, the cost is high. In addition, the plug model of the test fixture is fixed, which means that the test fixture can only be connected to the corresponding model of resistance tester, and it is not convenient to switch to resistance testers with other plug models for testing, resulting in poor versatility of the test equipment and the inability to compare the test results of the same resistor by different resistance testers. Utility Model Content

[0003] The utility model aims to provide a universal chip resistor testing fixture with good versatility and reduced cost.

[0004] In order to solve the above technical problems, the utility model provides a universal chip resistor test fixture, comprising:

[0005] seat body;

[0006] A carrying mechanism, arranged on the seat body, for carrying the resistor sample;

[0007] The lifting mechanism comprises a pressing piece movably arranged on the seat body up and down, and a driving component drivingly connected to the pressing piece, wherein the driving component is drivingly connected to the pressing piece to drive the pressing piece to move up and down;

[0008] a probe assembly, disposed on the pressing piece or the seat, comprising four probes; and

[0009] A connector, the connector being a four-input and four-output connector, and having four input ports and four output ports, wherein the four probes are electrically and detachably connected to the four input ports one by one correspondingly through transmission lines, and the four output ports are used to be detachably connected to a detection device through transmission lines;

[0010] The pressing member makes each of the probes contact the resistance sample during the downward movement.

[0011] Optionally, the probe assembly is arranged on the base body, the supporting mechanism includes a supporting plate and a guide member, the guide member is telescopically arranged on the base body, the supporting plate is supported on the upper end of the guide member, the upper side of the supporting plate is used to carry the resistor sample, the probe assembly is arranged below the supporting plate, the supporting plate is penetrated by a channel in the up and down directions, the channel is used for allowing multiple probes to pass through and contact the resistor sample during the active stroke of the pressing member pressing down the supporting plate.

[0012] Optionally, the guide member includes a guide column extending vertically and a compression spring sleeved on the guide column, and the bearing plate is provided with a guide hole that cooperates with the guide column for guidance.

[0013] Optionally, a carrying module is detachably mounted on the upper side of the carrying plate.

[0014] Optionally, a mounting groove is provided on the upper side of the carrier module, the outer contour of the mounting groove is set to be consistent with the resistor sample and is used to accommodate the resistor sample, and four sockets are provided on the bottom wall of the mounting groove corresponding to the upper side of the channel, each of the sockets is for inserting one of the probes.

[0015] Optionally, the supporting plate is detachably mounted on the upper end of the guide member, a mounting groove is provided on the upper side of the supporting plate, an outer contour of the mounting groove is configured to be consistent with the resistor sample and is used to accommodate the resistor sample, and the bottom wall of the mounting groove is provided with the channel.

[0016] Optionally, the probe assembly is detachably mounted on the seat.

[0017] Optionally, the probe assembly also includes a mounting plate, which is telescopically supported on the base body in the up and down directions by elastic members, and the mounting plate is provided with four mounting holes in the up and down directions, and each mounting hole is respectively provided with a probe, and the head of each probe protrudes from the upper side of the mounting plate.

[0018] Optionally, the pressing member includes a pressing plate fixedly connected to the driving assembly, and a pressing block detachably connected to the lower side of the pressing plate.

[0019] Optionally, a buffer is provided on the lower side of the pressing block.

[0020] The technical solution provided by the utility model has the following advantages:

[0021] The utility model provides a universal chip resistor test fixture, which includes a seat, a bearing mechanism, a lifting mechanism, a probe assembly and a connector. The bearing mechanism is installed on the seat, and is used to stably bear the resistor sample. The lifting mechanism includes a pressing piece that can be moved up and down on the seat and a driving assembly that drives the pressing piece to move, which ensures the precise contact between the probe and the resistor sample and improves the accuracy and repeatability of the test; the probe assembly includes four probes, and the four probes are detachably connected to a four-input and four-output connector. At the same time, the four-input and four-output connector is detachably connected to the detection equipment through a transmission line, which greatly improves the versatility and flexibility of the test fixture. In addition, the design of the test fixture simplifies the detection operation process, while reducing the dependence on a specific model of connector, thereby significantly reducing costs, and enables the test fixture to be connected to different models of test equipment, so as to facilitate the comparison of test results using different test equipment. In summary, the utility model not only improves the convenience of operation and test stability, but also achieves a dual improvement in cost-effectiveness and versatility. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the specific implementation methods of the utility model or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 A three-dimensional structural diagram of an embodiment of a universal chip resistor test fixture provided by the utility model;

[0024] Figure 2 for Figure 1 Schematic diagram of the three-dimensional structure of the test fixture;

[0025] Figure 3 for Figure 2 Schematic diagram of the three-dimensional structure of the connector.

[0026] Description of reference numerals:

[0027] 100-test fixture; 10-base; 11-base; 12-bracket; 20-carrying mechanism; 21-carrying plate; 22-guide member; 23-mounting slot; 30-lifting mechanism; 31-pressing member; 311-pressing plate; 312-pressing block; 32-driving assembly; 40-probe assembly; 41-probe; 42-mounting plate; 50-connector; 51-input port; 60-transmission line. DETAILED DESCRIPTION

[0028] The technical solution of the utility model will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the utility model, rather than all of the embodiments. The utility model will be described in detail below with reference to the accompanying drawings and in conjunction with the embodiments. It should be noted that the embodiments of the utility model and the features in the embodiments can be combined with each other without conflict.

[0029] It should be noted that the terms "first", "second", etc. in the specification and claims of the utility model and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.

[0030] See also Figures 1 to 3 The utility model provides a universal chip resistor test fixture 100. Specifically, the test fixture 100 includes a seat body 10, a bearing mechanism 20, a lifting mechanism 30, a probe assembly 40 and a connector 50.

[0031] The base 10 is used to carry the entire device. Specifically, the base 10 may include a base 11 and a bracket 12. Specifically, the carrying mechanism 20 is installed on the base 10, preferably installed on the base 11, for stably carrying the resistor sample.

[0032] The lifting mechanism 30 includes a pressure piece 31 which is movably arranged on the base 10, preferably on the bracket 12, and a driving assembly 32 which is drivingly connected to the pressure piece 31. The driving assembly 32 is drivingly connected to the pressure piece 31 to drive the pressure piece 31 to move up and down. The specific structure of the driving assembly 32 is not limited. For example, it can be a connecting rod mechanism or a cylinder assembly, and its power source can be electric or manual. The driving assembly 32 can drive the pressure piece 31 to reciprocate up and down, and the movable stroke is fixed. In this way, the pressure piece 31 makes each of the probes 41 of the probe assembly 40 contact with the resistor sample during the downward movement, ensuring the precise contact between the probes 41 and the resistor sample, thereby improving the accuracy and repeatability of the test.

[0033] Specifically, the probe assembly 40 includes four probes 41, two of which are used to supply current, and two of which are used to measure voltage. Figure 3The connector 50 is specifically a four-input and four-output connector 50, and has four input ports 51 and four output ports, wherein the four probes 41 are electrically and detachably connected to the four input ports 51 one by one through a transmission line 60 (which can be a cable), and the four output ports are used to be detachably connected to the detection equipment through the transmission line 60. The detection equipment can be an existing device such as a multimeter, a resistance tester, etc. that can perform resistance testing. In this way, compared with the prior art, the expensive and fixed-model plug connector 50 is omitted, which significantly reduces the cost while greatly improving the versatility and flexibility of the test fixture 100.

[0034] The design of the test fixture 100 provided in this embodiment simplifies the detection operation process, improves the accuracy and repeatability of the patch resistor test, and uses a four-input and four-output connector 50 to replace the original expensive plug connector 50, reducing the dependence on a specific model connector 50, thereby significantly reducing costs, and allowing the test fixture 100 to be connected to different models of test equipment, which is conducive to comparing the test results of different test equipment. In general, the utility model not only improves the convenience of operation and test stability, but also achieves a dual improvement in cost-effectiveness and versatility.

[0035] On the basis of the previous embodiment, the probe assembly 40 is arranged on the seat body 10, preferably on the base 11. The bearing mechanism 20 includes a bearing plate 21 and a guide member 22, the guide member 22 is telescopically arranged on the seat body 10, the bearing plate 21 is supported on the upper end of the guide member 22, the upper side of the bearing plate 21 is used to carry the resistor sample, the probe assembly 40 is arranged below the bearing plate 21, and the bearing plate 21 is penetrated by a channel in the vertical direction, and the channel is used for allowing a plurality of the probes 41 to pass through and contact the resistor sample during the active stroke of the pressing member 31 pressing down the bearing plate. In the technical solution provided in this embodiment, the supporting mechanism 20 provides a stable supporting plate 21 that can be adjusted in the up and down directions. The upper side of the supporting plate 21 carries a resistor sample. When the pressing piece 31 moves downward under the drive of the driving component 32, it abuts against the upper side of the supporting plate 21 and presses the supporting plate 21 downward, driving the resistor sample it carries to move downward together, until the contact point on the lower side of the resistor sample contacts and is connected with the probe 41 passing through the channel, thereby realizing the resistance value detection of the resistor sample.

[0036] The specific structure of the guide member 22 is not limited, as long as it has the function of telescoping up and down. Preferably, the guide member 22 includes a gas spring. In this embodiment, the guide member 22 further includes a guide column extending up and down and a compression spring sleeved on the guide column, and the support plate 21 is provided with a guide hole that cooperates with the guide column. In this way, the support plate 21 can move up and down smoothly under the guidance of the guide column, and the compression spring provides the necessary elastic force to absorb the impact and maintain the appropriate contact pressure between the probe 41 and the resistor sample.

[0037] In one embodiment, the carrier plate 21 directly carries the resistor to be tested. Specifically, the carrier plate 21 is detachably mounted on the upper end of the guide member 22. A mounting groove 23 is provided on the upper side of the carrier plate 21. The outer contour of the mounting groove 23 is set to be consistent with the resistor sample and is used to accommodate the resistor sample. The bottom wall of the mounting groove 23 is provided with the channel. In this embodiment, the user is allowed to quickly replace the carrier plate 21 according to the test needs. Different carrier plates 21 have different shapes and sizes of the mounting groove 23 and the shape and structure of the channel, so that the test fixture 100 can quickly adapt to the test of different resistor samples, thereby improving the adaptability and convenience of the test fixture 100.

[0038] In another embodiment, a carrying module is detachably mounted on the upper side of the carrying plate, so that the user can replace different carrying modules according to the test needs to adapt to various specifications and models of resistor samples, thereby increasing the flexibility and versatility of the test fixture 100. At the same time, the detachable carrying module also facilitates the cleaning and maintenance of the fixture, extending its service life.

[0039] Specifically, a mounting groove 23 is provided on the upper side of the carrier module, the outer contour of the mounting groove 23 is set to be consistent with the resistor sample, and is used to accommodate the resistor sample. Four plug holes are provided on the bottom wall of the mounting groove 23 corresponding to the upper side of the channel, and each of the plug holes is used to insert a probe 41. In this way, a customized installation position is provided for the resistor sample, ensuring the stability of the resistor sample during the test and the precise docking of the probe 41, thereby improving the reliability and accuracy of the test.

[0040] Based on the above examples, please continue to refer to Figure 2 The probe assembly 40 is detachably mounted on the base 10. Thus, the probe assembly 40 can be replaced by simply removing the probe assembly 40 from the base 11 and removing the transmission line 60 between the probe assembly 40 and the connector 50. In this way, for resistor samples of different models and specifications, the probe assembly 40 that matches the contacts on the resistor sample can be selected for installation and replacement, so that the same detection fixture can be used to detect resistor samples of different models and specifications, thereby enhancing the versatility of the detection equipment and reducing the detection cost.

[0041] Specifically, the probe assembly 40 also includes a mounting plate 42, and the mounting plate 42 is retractably supported on the base 10 in the up-down direction by an elastic member, and the elastic member can be a compression spring, rubber, etc. The mounting plate 42 is provided with four mounting holes in the up-down direction, and each mounting hole is provided with a probe 41, and the head of each probe 41 protrudes from the upper side of the mounting plate 42. This structure enables the probe 41 to adapt to the height change of the resistor sample within a certain range, avoiding excessive contact between the resistor sample and the probe 41, resulting in damage. The elastic member presses the probe 41 upward, ensuring good contact between the probe 41 and the resistor sample during the test, thereby improving the adaptability of the fixture and the accuracy of the test.

[0042] Optionally, the pressing member 31 includes a pressing plate 311 fixedly connected to the driving assembly 32 and a pressing block 312 detachably connected to the lower side of the pressing plate 311. This design allows the pressing block 312 to be quickly replaced according to different test requirements, and changes the distance between the pressing member 31 and the probe assembly 40 when the pressing member 31 is pressed down into place, providing a flexible way to adapt to resistor samples of different thicknesses, while also facilitating the maintenance and upgrade of the test fixture.

[0043] Preferably, a buffer is provided on the lower side of the pressing block 312, which provides additional protection for the resistor sample, reduces possible damage to the resistor sample during the test, and improves the safety of the test.

[0044] Obviously, the above described embodiments are only a part of the embodiments of the utility model, not all of them. Based on the embodiments of the utility model, ordinary technicians in this field can make other different forms of changes or modifications without creative work, which should fall within the scope of protection of the utility model.

Claims

1. A universal chip resistor test fixture, characterized in that: include: seat body; A carrying mechanism, arranged on the seat body, for carrying the resistor sample; The lifting mechanism comprises a pressing piece movably arranged on the seat body up and down, and a driving component drivingly connected to the pressing piece, wherein the driving component is drivingly connected to the pressing piece to drive the pressing piece to move up and down; a probe assembly, disposed on the pressing piece or the seat, comprising four probes; and A connector, the connector being a four-input and four-output connector, and having four input ports and four output ports, wherein the four probes are electrically and detachably connected to the four input ports one by one correspondingly through transmission lines, and the four output ports are used to be detachably connected to a detection device through transmission lines; The pressing member makes each of the probes contact the resistance sample during the downward movement.

2. The universal chip resistor test fixture as claimed in claim 1, characterized in that: The probe assembly is arranged on the base body, and the supporting mechanism includes a supporting plate and a guide member. The guide member is arranged on the base body telescopically up and down, and the supporting plate is supported on the upper end of the guide member. The upper side of the supporting plate is used to support the resistance sample. The probe assembly is arranged below the supporting plate. The supporting plate is penetrated by a channel in the up and down directions. The channel is used for allowing multiple probes to pass through and contact the resistance sample during the active stroke of the pressing member pressing down the supporting plate.

3. The universal chip resistor test fixture as claimed in claim 2, characterized in that: The guide member comprises a guide column extending upward and downward and a compression spring sleeved on the guide column, and the bearing plate is provided with a guide hole matched with the guide column.

4. The universal chip resistor test fixture as claimed in claim 2, characterized in that: A carrying module is detachably mounted on the upper side of the carrying plate.

5. The universal chip resistor test fixture as claimed in claim 4, characterized in that: The upper side of the carrier module is provided with a mounting groove, the outer contour of which is set to be consistent with the resistor sample and is used to accommodate the resistor sample. The bottom wall of the mounting groove is provided with four sockets corresponding to the upper side of the channel, each of which is used for inserting a probe.

6. The universal chip resistor test fixture as claimed in claim 2, characterized in that: The carrier plate is detachably mounted on the upper end of the guide member, a mounting groove is provided on the upper side of the carrier plate, the outer contour of the mounting groove is configured to be consistent with the resistor sample and is used to accommodate the resistor sample, and the bottom wall of the mounting groove is provided with the channel.

7. The universal chip resistor test fixture according to any one of claims 2 to 6, characterized in that: The probe assembly is detachably mounted on the seat body.

8. The universal chip resistor test fixture as claimed in claim 7, characterized in that: The probe assembly also includes a mounting plate, which is telescopically supported on the base body in the up-and-down direction by elastic members, and the mounting plate is provided with four mounting holes in the up-and-down direction, each mounting hole is respectively provided with a probe, and the head of each probe protrudes from the upper side of the mounting plate.

9. The universal chip resistor test fixture as claimed in claim 8, characterized in that: The pressing member comprises a pressing plate fixedly connected to the driving assembly, and a pressing block detachably connected to the lower side of the pressing plate.

10. The universal chip resistor test fixture as claimed in claim 9, characterized in that: A buffer is provided on the lower side of the pressing block.

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