A test platform for chip manufacturing

Abstract

The utility model discloses a kind of test platforms for chip manufacturing belong to chip manufacturing technical field, including workbench, the detection groove is arranged in the middle of workbench top, workbench top one end is fixedly installed with side frame, the hydraulic column is fixedly installed in the middle of side frame top, and test probe assembly is fixedly installed in the bottom of hydraulic column, the convex groove is opened in the both ends of workbench top, and the screw rod is rotatably installed in two convex groove interiors.The utility model in this way that workbench top is slidably provided with negative pressure frame, before chip is placed in detection groove, by driving motor and transmission chain and two screw rods cooperate work, while negative pressure fan works all the time, so that negative pressure frame can quickly suck away dust and chippings in the both ends of workbench top and detection groove when the both ends of workbench top unidirectional displacement, so that chip can be standard placed in detection groove, then negative pressure frame is reversed unilaterally displaced to reset in the both ends of workbench top, can quickly suck away dust on chip surface, guarantee chip detection result.

Description

Technical Field

[0001] This utility model relates to the field of chip manufacturing technology, and in particular to a testing platform for chip manufacturing. Background Technology

[0002] A chip is a miniaturized form of circuitry (primarily including semiconductor devices, but also passive components), often fabricated on the surface of a semiconductor wafer. As chips become increasingly widely used, test probes are used during the manufacturing process to ensure that chip quality meets production requirements.

[0003] A search revealed a patent with publication number CN211979002U entitled "A Testing Platform for Chip Manufacturing." The technical problem it addresses is that during chip manufacturing, circuit defects can occur. Selling defective chips harms consumers and damages the manufacturer's reputation. The platform utilizes a combination of a vertical rod, horizontal rod, and convex lens to provide clearer observation of the chip and facilitate the identification of electrical connections. A multimeter and its probes enable continuity testing. A second storage box and dividers store qualified labels, allowing users to easily mark tested chips, making chip testing faster and more convenient. However, the platform still has drawbacks that need to be addressed: debris may fall during chip replacement, preventing proper placement of the next chip, and dust on the chip top can affect chip performance test results. Utility Model Content

[0004] The purpose of this invention is to address the shortcomings of existing technologies by proposing a testing platform for chip manufacturing.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] A testing platform for chip manufacturing includes a workbench with a detection groove at the center of its top. A side frame is fixedly mounted at one end of the top of the workbench, and a hydraulic column is fixedly mounted at the center of the top of the side frame. A test probe assembly is fixedly mounted at the bottom of the hydraulic column. The top of the workbench has convex grooves at both ends, and threaded rods are rotatably mounted inside each of the two convex grooves. Movable frames are rotatably sleeved around the circumference of each of the two threaded rods, and each row of movable frames is slidably sleeved with the convex grooves. A negative pressure frame is fixedly mounted between the opposite ends of the two movable frames. A negative pressure suction port and a booster suction port are respectively provided on both sides of the bottom of the negative pressure frame. A negative pressure fan is fixedly mounted on one side of the bottom of the workbench, and a manifold is fixedly mounted at the input end of the negative pressure fan. A first connecting pipe is fixedly connected between the input end of the manifold and the output end of the negative pressure suction port, and a second connecting pipe is fixedly connected between the input end of the manifold and the output end of the booster suction port.

[0007] Preferably, a display is rotatably mounted on the outer side of the top of the side frame.

[0008] Preferably, support members are fixedly installed at the four corners of the bottom end of the workbench.

[0009] Preferably, a dust filter bag is fixedly connected to the output end of the negative pressure fan.

[0010] Preferably, both the first connecting pipe and the second connecting pipe are flexible hoses.

[0011] Preferably, the length and width of the detection groove are both greater than the length and width of the test probe assembly, and the length of the negative pressure frame is greater than the length of the detection groove.

[0012] Preferably, one side of each of the two threaded rods passes through the worktable and extends to the outside of the worktable. A sprocket is fixedly installed on one side of each of the two threaded rods, and a transmission chain is sleeved between the two sprockets. A drive motor is fixedly installed on the other side of one of the threaded rods.

[0013] The beneficial effects of this utility model are as follows:

[0014] 1. The present invention proposes a testing platform for chip manufacturing, wherein a negative pressure frame is slidably installed on the top of the worktable. Before the chip is placed in the testing slot, a drive motor, a transmission chain, and two threaded rods work together, while a negative pressure fan works continuously. This allows the negative pressure frame to quickly suck away dust and debris from the top of the worktable and inside the testing slot when it moves unidirectionally at the top of the worktable, ensuring that the chip is placed in the testing slot in a standard manner. Then, the negative pressure frame moves unidirectionally in the opposite direction at the top of the worktable to its reset position, which can quickly suck away floating dust on the chip surface and ensure the chip testing results.

[0015] 2. The present invention proposes a testing platform for chip manufacturing, which has a negative pressure dust suction port and a high pressure dust suction port respectively set on both sides of the bottom of the negative pressure frame. It can suck away dust with negative pressure and suck away chip debris with high pressure suction. A first connecting pipe is fixedly connected between the input end of the manifold and the output end of the negative pressure dust suction port, and a second connecting pipe is fixedly connected between the input end of the manifold and the output end of the high pressure dust suction port. Both the first and second connecting pipes are flexible hoses, so that the first and second connecting pipes can move with the movement of the negative pressure frame. A dust filter bag is fixedly fitted to the output end of the negative pressure fan to collect dust and debris, and to ensure that the air discharged by the negative pressure fan is clean, so as to prevent the airflow from carrying dust and falling on the surface of the workbench. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure of a chip manufacturing testing platform proposed in this utility model;

[0017] Figure 2 This is a top view of the test platform for chip manufacturing proposed in this utility model.

[0018] Figure 3 This is a schematic diagram of the structure of a mobile test platform for chip manufacturing proposed in this utility model;

[0019] Figure 4 This is a bottom view of the negative pressure frame of a chip manufacturing test platform proposed in this utility model.

[0020] In the diagram: 1. Workbench, 2. Side frame, 3. Hydraulic column, 4. Test probe assembly, 5. Display, 6. Detection slot, 7. Convex slot, 8. Threaded rod, 9. Sprocket, 10. Transmission chain, 11. Drive motor, 12. Support component, 13. Negative pressure fan, 14. Dust filter bag, 15. Manifold, 16. Moving frame, 17. Negative pressure frame, 18. Negative pressure suction port, 19. Boosting suction port, 20. First connecting pipe, 21. Second connecting pipe. Detailed Implementation

[0021] Reference Figure 1-4A testing platform for chip manufacturing includes a workbench 1, a detection groove 6 at the center of the top of the workbench 1, a side frame 2 fixedly mounted at one end of the top of the workbench 1, a hydraulic column 3 fixedly mounted at the center of the top of the side frame 2, and a test probe assembly 4 fixedly mounted at the bottom of the hydraulic column 3. The top of the workbench 1 has convex grooves 7 at both ends, and threaded rods 8 are rotatably mounted inside each of the two convex grooves 7. Movable frames 16 are rotatably sleeved around the circumference of each of the two threaded rods 8, and each row of movable frames 16 slides with respect to the convex grooves 7. A negative pressure frame 17 is fixedly installed between the opposite ends of the two movable frames 16. Negative pressure suction port 18 and booster suction port 19 are respectively provided on both sides of the bottom end of the negative pressure frame 17. A negative pressure fan 13 is fixedly installed on one side of the bottom end of the workbench 1, and a manifold 15 is fixedly installed at the input end of the negative pressure fan 13. A first connecting pipe 20 is fixedly connected between the input end of the manifold 15 and the output end of the negative pressure suction port 18, and a second connecting pipe 21 is fixedly connected between the input end of the manifold 15 and the output end of the booster suction port 19.

[0022] In this utility model, a display 5 is rotatably mounted on the outer side of the top of the side frame 2;

[0023] Support components 12 are fixedly installed at the four corners of the bottom of the workbench 1;

[0024] A dust filter bag 14 is fixedly connected to the output end of the negative pressure fan 13;

[0025] Both the first connecting pipe 20 and the second connecting pipe 21 are flexible hoses;

[0026] The length and width of the detection slot 6 are both greater than the length and width of the test probe assembly 4, and the length of the negative pressure frame 17 is greater than the length of the detection slot 6.

[0027] Two threaded rods 8 pass through the workbench 1 on one side and extend to the outside of the workbench 1. A sprocket 9 is fixedly installed on one side of each of the two threaded rods 8, and a transmission chain 10 is sleeved between the two sprockets 9. A drive motor 11 is fixedly installed on the other side of one of the threaded rods 8.

[0028] Working principle: A negative pressure frame 17 is slidably installed on the top of the worktable 1. Before the chip is placed in the detection slot 6, the drive motor 11 works in conjunction with the transmission chain 10 and two threaded rods 8. At the same time, the negative pressure fan 13 works continuously. When the negative pressure frame 17 moves unidirectionally at the top of the worktable 1, it can quickly suck away the dust and debris on the top of the worktable 1 and inside the detection slot 6, so that the chip can be placed in the detection slot 6 in a standard manner. Then, the negative pressure frame 17 moves unidirectionally in the opposite direction at the top of the worktable 1 to reset, which can quickly suck away the floating dust on the chip surface and ensure the chip detection results.

[0029] Negative pressure suction port 18 and booster suction port 19 are respectively set on both sides of the bottom of the negative pressure frame 17. It can suck away dust with negative pressure and suck away chip debris with high pressure. A first connecting pipe 20 is fixedly connected between the input end of the manifold 15 and the output end of the negative pressure suction port 18, and a second connecting pipe 21 is fixedly connected between the input end of the manifold 15 and the output end of the booster suction port 19. Both the first connecting pipe 20 and the second connecting pipe 21 are flexible hoses, so that the first connecting pipe 20 and the second connecting pipe 21 can move with the movement of the negative pressure frame 17. A dust filter bag 14 is fixedly sleeved on the output end of the negative pressure fan 13 to collect dust and debris, and also to ensure that the air discharged by the negative pressure fan 13 is clean, so as to prevent the airflow from carrying dust and falling onto the surface of the workbench 1.

[0030] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. A test platform for chip manufacturing, comprising a workbench (1), a detection groove (6) is arranged in the middle of the top end of the workbench (1), a side frame (2) is fixedly installed at one end of the top end of the workbench (1), a hydraulic column (3) is fixedly installed at the middle of the top end of the side frame (2), and a test probe assembly (4) is fixedly installed at the bottom end of the hydraulic column (3), characterized in that, The workbench (1) top end two ends are provided with convex grooves (7), and the two convex grooves (7) are internally rotatably provided with threaded rods (8), the two threaded rods (8) are circumferentially rotatably sleeved with moving frames (16), and each row of moving frames (16) is slidably sleeved with the convex groove (7), and the two moving frames (16) are fixedly installed with negative pressure frames (17) between opposite ends, the negative pressure frame (17) bottom end two sides are respectively provided with negative pressure suction ports (18) and booster suction ports (19), the workbench (1) bottom end one side is fixedly installed with a negative pressure fan (13), and the negative pressure fan (13) input end is fixedly installed with a manifold (15), the manifold (15) input end and the negative pressure suction port (18) output end are fixedly connected with a first connecting pipe (20), and the manifold (15) input end and the booster suction port (19) output end are fixedly connected with a second connecting pipe (21).

2. The test platform of claim 1, wherein The side frame (2) top end outside is rotatably installed with a display (5).

3. The test platform of claim 1, wherein The workbench (1) bottom end four corners are fixedly installed with supporting pieces (12).

4. The test platform of claim 3, wherein The negative pressure fan (13) output end is fixedly sleeved with a dust filter bag (14).

5. The test platform of claim 1, wherein The first connecting pipe (20) and the second connecting pipe (21) are both hoses.

6. The test platform of claim 1, wherein The detection groove (6) length and width are greater than the test probe assembly (4) length and width, and the negative pressure frame (17) length is greater than the detection groove (6) length.

7. The test platform of claim 1, wherein Two threaded rods (8) one side penetrates the workbench (1) and extends to the workbench (1) outside, and two threaded rods (8) one side are fixedly installed with sprockets (9), and the two sprockets (9) are sleeved with a transmission chain (10), and one threaded rod (8) the other side is fixedly provided with a driving motor (11).

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