Product Inspection Equipment

Abstract

To provide an article inspection device which, when inspecting the shape state of an inspection object using design data, enables inspection to be performed for each region formed in the inspection object.SOLUTION: When a commodity package is designed by CAD, etc., design data is preliminarily generated with lines having attributes differentiated by a contour line or gridline, a cut-in line, a half-cut line, an emboss line, a pattern, and a hue. Then an image is acquired from the commodity package, while at the same time an inspection program or a parameter is changed for each type of line having the same attribute among lines of design data having been used when the commodity package is designed, and comparison is made with image data from the image acquired by image acquisition means 2, whereby inspection is conducted.SELECTED DRAWING: Figure 6

Description

[Technical field]

[0001] The present invention relates to an object inspection device that can inspect the formation state of an object being inspected, and more particularly, to an object inspection device that can inspect the contour lines, ruled lines, cut lines, half-cut lines, embossed lines, etc. of an unfolded paper packaging container in an optimal manner for each of the above. [Background technology]

[0002] Conventionally, when inspecting the formation state of an object to be inspected, image data acquired from the object to be inspected is compared with inspection reference data, but when inspecting using such inspection reference data, a method using image data determined to be a non-defective product by visual inspection or a method using design data such as CAD data used at the time of designing is used (Patent Document 1, etc.). Of these, the method using the design data used at the time of designing has the advantage of being able to perform more accurate inspection than the method using inspection reference data generated by visual inspection. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2020-173129 A Summary of the Invention [Problem to be solved by the invention]

[0004] However, when performing inspection using such design data, the following problems arise.

[0005] That is, since design data such as CAD data is composed of lines, it is effective for inspecting the position of lines and contour patterns formed on the surface of an object to be inspected, but it is not possible to inspect the state of parts according to the types of lines on the design data. Specifically, on the surface of a paper packaging container such as thick paper or cardboard, not only the contour lines that are the outline parts, but also various lines are formed, such as groove-like lines embossed in advance on the folded part, continuous cut lines on the flap for opening, half-cut lines that cut the thick paper in half to make it easier to fold, and convex embossed lines that display the product logo, etc., but since all of these lines are expressed as simple lines on the design data, it is not possible to inspect the contour lines, the ruled lines, the cut lines, the half-cut lines, and the embossed lines by changing the programs or inspection reference data for each of them.

[0006] In addition, when inspecting not only paper packaging containers but also other objects, there was a problem that accurate inspection using design data was not possible if there were characteristics in the various lines and patterns formed on the object to be inspected.

[0007] Therefore, in order to solve the above problem, the present invention aims to provide an object inspection device that is capable of inspecting each part formed on an object when inspecting the forming state of the object using design data. [Means for solving the problem]

[0008] That is, in order to solve the above problems, the present invention provides an image acquisition means for acquiring an image of an object to be inspected, and a method for determining the layer, thickness, solid line, dashed line, one-dot chain line, two-dot chain line, Color The system includes a line type information extraction means for extracting line attributes, a storage means for storing different inspection programs and parameters according to the line attributes, and an inspection means for reading out the inspection program and parameters corresponding to the line attributes extracted by the line type information extraction means from the storage means and comparing them with image data based on the image acquired by the image acquisition means for inspection.

[0009] In addition, in such an invention, the lines of the design data are divided into at least two or more types corresponding to contour lines, ruled lines, cut lines, half-cut lines, and embossed lines, and the attributes of the lines are given to the lines. Effect of the Invention

[0010] According to the present invention, it becomes possible to perform inspection using an optimal method for each inspection target portion, based on the attributes of the lines drawn for that portion. [Brief description of the drawings]

[0011] [Figure 1] FIG. 1 is an external view of an article inspection device according to an embodiment of the present invention. [Diagram 2] Functional block diagram of the same configuration [Diagram 3] FIG. 1 shows a product package that is an object to be inspected in the same manner. [Figure 4] FIG. 1 shows design data in the same form. [Diagram 5] FIG. 2 shows a memory means in the embodiment. [Figure 6] FIG. 13 is a flowchart showing the inspection in the same embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0012] Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

[0013] The product inspection device 1 in this embodiment is capable of inspecting the quality of the formed state of an inspection object, which is an article, using design data such as CAD, and is configured to include an image acquisition means 2 for acquiring a surface image of the inspection object, and an inspection means 4 for inspecting the quality of the inspection object by comparing image data based on the image acquired by the image acquisition means 2 with the design data, as shown in FIG. 2. Characteristically, when the design data is created, lines with different attributes are created for each inspection object portion, and during inspection, as shown in FIG. 4, the inspection method can be changed according to the attribute of the line. The present embodiment will be described in detail below. Note that in this embodiment, an article such as a product package developed in a plane will be described as an example of the inspection object to be inspected, and contour lines, ruled lines, cut lines, half-cut lines, embossed lines, patterns, colors, etc. formed on the surface of the product package will be inspected.

[0014] First, as shown in Fig. 1, image acquisition means 2 for acquiring a surface image of an object to be inspected acquires an image of the surface of the object to be inspected using a camera 21, and acquires an image of the part to be inspected formed on the surface by receiving reflected light from light irradiated from an illumination device 22. At this time, depending on the part to be inspected, it may be better to change the irradiation angle or color of the light for inspection, so the irradiation angle and color of the light are made changeable. Then, the image acquired in this manner is stored in storage means 3 as image data.

[0015] In this storage means 3, not only image data acquired from the object to be inspected, but also different inspection programs and parameters corresponding to the attributes of the lines are stored as shown in Fig. 5, so that the acquired image data of the object to be inspected can be inspected using the inspection program and parameters corresponding to the attributes of the lines in the design data. At this time, for example, parameters corresponding to the attributes are stored, such as the "thickening width" of the line used when generating the inspection area according to the attributes of the line, the "search distance" for inspecting whether or not there is a pixel corresponding to each pixel of the master image according to the attributes of the line, the "threshold value" of the luminance to be determined as a non-defective product, the "expansion amount" of the defective area, and the "threshold value" of the area or length to be determined as defective.

[0016] The inspection means 4 is executed by an inspection program, and as shown in Fig. 5, inspection is performed using inspection programs and parameters stored corresponding to line attributes. As the inspection programs, inspection programs each having a different inspection algorithm may be stored, or the program itself may be common, and inspection may be performed as different inspection methods using parameters. When performing such an inspection, the contour line of a previously acquired image and the contour line of the design data are aligned using pattern matching, reference marks, etc., and in this state, the contour line, ruled line, cut line, half-cut line, embossed line, pattern, and color are inspected. An example of this inspection method is described below.

[0017] First, when performing an inspection, attribute information such as the type, color, thickness, etc. of the line is extracted from the design data. At this time, if multiple types of lines are used, attribute information of all the lines is extracted.

[0018] Then, for the extracted line, parameters are read from the storage means 3 based on the attribute information of the line, and the line is thickened to set the inspection area. At this time, for example, the "thickening area" is made small for contour lines, and the "thickening area" is made large for parts with irregularities such as embossed lines.

[0019] When performing an inspection by setting an inspection area in this way, the color of the master image and the color of the object being inspected (RGB brightness) are compared for each pixel, and pixels that do not belong to the "threshold value" corresponding to the line attributes are extracted.

[0020] The extracted pixel (bad pixel) is then expanded by a preset "defective area expansion amount" to prevent it from being determined to be a good pixel due to discontinuities such as blurring.

[0021] Then, a labeling process is performed on the defective pixels thus extracted, and areas that are clusters of defective pixels are extracted, and it is determined whether or not they correspond to a defective area based on "threshold values" of area and length that are registered in advance in correspondence with the attributes of the lines.

[0022] These processes are then performed by shifting the image forward, backward, left, and right within the range of the search amount registered corresponding to the line attribute, and if it is OK, the area is deemed to be OK and a judgment process is performed. Conversely, if it is not good, the area is deemed to be bad and a judgment process is performed.

[0023] The design data used for this inspection is designed with different line attributes for each part to be inspected. For example, as shown in Figure 4, contour lines are recorded on the first layer of the CAD, ruled lines are recorded on the second layer, cut lines and half-cut lines are recorded on the third layer with different line types and thicknesses, and embossed lines and patterns are recorded as contours on the fourth layer.

[0024] The line type information extraction means 5 is capable of extracting attributes of lines extracted from design data, such as the layer corresponding to the inspection target part, line thickness, type (solid line, dashed line, one-dot chain line, two-dot chain line, etc.), color, etc.

[0025] In addition, the output means 6 outputs the inspection results, and if the product is found to be good, outputs a message to that effect so that the product can be notified, and if the product is defective, outputs not only the result that the product is "defective" but also information about the defective areas, etc.

[0026] The process of inspection using the thus configured article inspection device 1 will be described with reference to the flowchart in Fig. 6. Note that, when performing inspection, it is assumed that design data is generated in advance by changing line attributes for each contour line, ruled line, cut line, half-cut line, embossed line, pattern, and color.

[0027] When inspecting an object to be inspected, the object to be inspected is positioned in front of the camera 21, and its surface image is acquired by the image acquisition means 2 (step S1). At this time, if it is better to inspect each part to be inspected with different light irradiation angles or with different colors, light is irradiated with light at a plurality of irradiation angles and colors, and the images are acquired and stored in the storage means 3.

[0028] Next, after acquiring the image in this manner, the design data is read from the storage means 3 (step S2), and from the design data, line attributes of the design data corresponding to the part to be inspected are extracted using the line type information extraction means 5 (step S3).Then, the inspection program and parameters corresponding to the extracted line attributes are read from the storage means 3 (step S4).

[0029] Then, using the inspection program and parameters thus read out, it is judged whether the inspection target portion corresponding to the line is proper or defective (step S5). Specifically, for the extracted line, an inspection area is set for thickening the line and inspecting it based on the parameters of the set attribute information. Then, inspection is performed on the thickened inspection area, and at this time, the color of the master image that is the reference for inspection is compared with the color (RGB brightness) of the acquired inspection target for each pixel, and pixels that do not belong to the "threshold value" stored corresponding to the attribute of the line are extracted. Then, the extracted pixel (defective pixel) is expanded by the "expansion amount of the defective area" previously set as the attribute of the line, so that it is not judged as a good pixel due to discontinuities such as blurring. Then, a labeling process is performed on the pixel to extract the defective area, and the defective area is judged by the threshold value of the area and length registered beforehand. Then, these processes are performed by shifting the image back and forth and left and right within the range of the search amount registered corresponding to the attribute of the line, and if it is OK, the area is treated as OK and processed.

[0030] If the inspection of all the target parts is judged to be proper, it is judged to be a "good product" and this is output to the output means 6 (step S7). Conversely, if it is judged to be defective, a message indicating that it is "defective" along with the defective parts is output so that visual inspection, etc. can be performed (step S6).

[0031] As described above, according to the embodiment, the image acquisition means 2 for acquiring an image of an object to be inspected and the layer, thickness, solid line, dashed line, one-dot chain line, two-dot chain line, ColorThe system is equipped with a line type information extraction means 5 which extracts the attributes of a line, a memory means 3 which stores different inspection programs and parameters depending on the attributes of the line, and an inspection means 4 which reads out the inspection program and parameters corresponding to the line attributes extracted by the line type information extraction means 5 from the memory means 3 and compares them with image data based on the image acquired by the image acquisition means 2 for inspection.This makes it possible to inspect the area using the most suitable method for that area, based on the attributes of the lines drawn for each area to be inspected.

[0032] The present invention is not limited to the above-described embodiment, but can be embodied in various forms.

[0033] For example, in the above embodiment, an example was given of inspecting the formation state of a product package, but the present invention can also be applied to inspecting the formation state of other planar inspection objects.

[0034] In the above embodiment, the lines of the design data are assumed to be straight lines, curved lines, etc., but may be rectangular, circular, or polygonal. In addition, the attributes of the lines are described by taking the layer, line thickness, line type, and color as examples, but may be straight lines, curved lines, single points, rectangles, circles, and polygonal shapes. In addition, when auxiliary lines such as center lines are provided in the design data, the line types may be excluded from the inspection target.

[0035] Furthermore, in the above embodiment, the parameters are changed to perform the inspection, but it is also possible to provide separate inspection programs for each line and perform the inspection using an inspection program that corresponds to the attribute of the line. [Explanation of symbols]

[0036] 1. Product inspection equipment 2. Image Acquisition Method 21. Camera 22. Lighting equipment 3...Storage means 4. Inspection method 5. Line type information extraction method 6. Output means

Claims

1. An image acquisition means for acquiring an image of an object to be inspected; A line type information extraction means for extracting attributes of lines, such as layer, thickness, solid line, dashed line, one-dot chain line, two-dot chain line, and color, from design data used in designing the inspection object; A storage means for storing different inspection programs and parameters according to the attributes of the line; an inspection means for reading out from said storage means an inspection program and parameters corresponding to the line attributes extracted by said line type information extraction means, and comparing said program and parameters with image data based on the image acquired by said image acquisition means for inspection; An article inspection device comprising:

2. 2. An object inspection device according to claim 1, wherein the lines of the design data are divided into at least two or more types corresponding to contour lines, ruled lines, cut lines, half-cut lines, and embossed lines, and the line attributes are assigned to the lines.

3. acquiring an image of an inspection object; a step of storing different inspection programs and parameters according to attributes of lines in design data used when designing the inspection object, such as layer, thickness, solid line, dashed line, one-dot chain line, two-dot chain line, and color, reading out the inspection program and parameters corresponding to the stored line attributes, and comparing them with the acquired image of the inspection object to inspect the line; An article inspection method comprising:

4. 4. The method for inspecting an object according to claim 3, wherein the lines of the design data are divided into at least two of contour lines, ruled lines, cut lines, half-cut lines, and embossed lines, and are provided with attributes of the lines.

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