System for testing the material properties of film-type gas sensors.
Patent Information
- Authority / Receiving Office
- TH · TH
- Patent Type
- Patents
- Current Assignee / Owner
- NATIONAL SCIENCE TECHNOLOGY DEVELOPMENT AGENCY
- Filing Date
- 2016-09-30
- Publication Date
- 2026-07-02
Abstract
Claims
1. A system for testing the properties of film-type gas sensors, consisting of part 1: a probe assembly station (10) with a suspended heating unit (7) consisting of a nickel-chromium heating coil (28) suspended between two poles (29) (30) containing a thermocouple temperature sensor (27) in a ceramic tube (26) for measuring the temperature from the back of the base plate (8). The station is mounted on a probe base plate (6) on a stand (5). Part 2: the probe assembly (10) and the positioning unit. The small (11) probe consists of a pointed probe head, the positioning arm (11) of which can be adjusted along the longitudinal groove of the positioning arm (33) which is mounted on the base of the positioner (35) which has a surface tilted 10-20 degrees to the horizontal. Both parts are housed inside chamber (1), which has the gas inlet of pipe (2) connected to the gas distribution cone (3) and exits the system at the outlet pipe (4) with signal conversion through coupling device (14) to processing device (17) via control cable (18).2.
3. A system for testing the material properties of film gas sensors according to one of the claims 1 or 2 in which the micro-positioner (11) station has 6-10 pairs arranged symmetrically on the probe base (5)(6).
4. A system for testing the material properties of film gas sensors according to one of the claims 1-3 in which the micro-positioner (11) can move freely in 3 axes: tilt 10-20 degrees relative to the vertical with the probe head and slide in and out with the probe arm, slide axis perpendicular to the first axis, and rotation axis around the vertical axis.
5. A system for testing the material properties of film gas sensors according to one of the claims 1-3 in which the station of the probe assembly (10) and the micro-positioner (11) can adjust the position of the probes to a fineness of no more than 1 ml.