Apparatus capable of testing contact state and leakage current during aging of capacitors in large batch, and method

Abstract

An apparatus capable of testing a contact state and a leakage current during aging of capacitors in a large batch, comprising a direct-current power supply (6), an alternating-current power supply (7), and a capacitor array. Each capacitor (2) is connected in series to one protective element to form a two-end capacitor unit. One end of each of a plurality of capacitor units forming a column in the capacitor array is connected to a measurement connecting line (4), to form one column in the array. A plurality of capacitor units forming a row are connected to a voltage connecting line (5), to form one row in the array. The voltage connecting lines (5) are voltage lines of the direct-current power supply (6) and voltage lines of the alternating-current power supply (7). The voltage lines of the direct-current power supply (6) and the voltage lines of the alternating-current power supply (7) are respectively provided with switches. According to a method for performing testing by using the apparatus, the value measured on each measurement line is the total leakage current of all of the capacitors connected to the measurement line. The power supply connected to the voltage connecting line where a capacitor unit of which the leakage current needs to be tested is located is disconnected, and the total current on the measurement connecting line connected to said capacitor unit is immediately tested again, so that the screening quality of high capacitance capacitors is improved.

Description

Device and method for testing contact status and leakage current of large quantities of capacitors during aging Technical Field

[0001] The present invention relates to a device and method for testing contact status and leakage current of capacitors in large quantities during aging. Background Art

[0002] During batch aging of high-reliability capacitors, it is usually necessary to identify whether each capacitor is in good contact with the fixture to ensure that each capacitor has undergone sufficient voltage aging. In addition, it is necessary to identify failed capacitors that have experienced overcurrent or even short circuits during aging and record the location of the failed capacitors. After the aging is completed, the aged and failed capacitors can be accurately eliminated. To prevent the aging power supply from overloading and causing the aging voltage to drop after the capacitor fails due to breakdown or short circuit, affecting the continued aging of other capacitors, a protection element, such as a resistor, is usually connected in series with each capacitor. When a capacitor breaks down, almost all the voltage is applied to the protection element. At this time, only a small protection current flows through the protection element, which will not affect the continued aging of other capacitors. For certain types of capacitors, if the capacitor overcurrent or breakdown causes the protection current of the protection element to be too low after activation, after the aging temperature returns to normal, the capacitor that broke down at high temperature or had too low insulation resistance will return to normal. When tested with conventional leakage current or insulation resistance testing equipment at room temperature, the leakage current returns to normal. If the capacitor's overcurrent state during the high-temperature aging process is not identified and recorded, it will not be identified and eliminated at room temperature. Such capacitors will slip through the screening and flow into the market, ultimately posing risks during use. If the protection current is increased, the protection element itself will generate a higher temperature rise due to the high power consumption after the capacitor short-circuits. Combined with the high temperature environment during aging, the protection element will be easily damaged by the actual high temperature rise, significantly increasing maintenance costs. Therefore, it is generally desirable to use a lower protection current to extend the service life of the protection element. This requires that the capacitor aging equipment must be able to test the leakage current or insulation resistance of each capacitor during the aging process and record its location. To ensure the accuracy of the test results, it is also necessary to have the ability to test the contact status of each capacitor and the contacts in the fixture to prevent false test data due to poor contact and false aged capacitors, which will have an extremely adverse effect on the quality of aging screening.

[0003] Existing technology typically uses multiple capacitor banks connected in parallel to age large quantities of capacitors. This approach maximizes the number of capacitors on the aging board (fixture) and reduces the cost of the equipment by utilizing the limited number of connection channels between the aging board (fixture) and the aging equipment. However, this technology is unable to identify and locate any single failed capacitor due to short circuit or overcurrent during the aging process, nor can it record the location of failed capacitors. It is also unable to remove capacitors that failed during high-temperature aging after the aging process is complete, nor can it identify capacitors that have experienced false aging due to poor contact.

[0004] There is another technology, such as the technology disclosed in patent publication number CN112595999A, which uses a cross matrix method to connect one end of multiple capacitors horizontally and the other end of multiple capacitors vertically. In the aging mode, a DC aging voltage is applied to each capacitor, that is, a DC aging voltage is applied to the powered connection (such as the horizontal connection), and a DC ammeter is connected to the measuring connection (such as the vertical connection). The total leakage current of all capacitors on the measuring connection is read, and the leakage current of each capacitor cannot be measured; in the contact test mode, an AC voltage is applied to the powered connection (such as the horizontal connection) where a capacitor to be tested is located, and the ground connection (such as the vertical connection) is connected to the AC ammeter. At this time, the contact status of this capacitor and the fixture contact can be measured. For DC testing, a DC voltage is applied only to the energized connection with the capacitor under test, and the DC voltage on the other energized connections is disconnected. At this time, the energized connection of the capacitor under test can still lead to the measurement connection of the capacitor under test through the network formed by other capacitors, so that the current measured on the measurement connection is not only the leakage current flowing through the capacitor under test, but also the current in other leakage paths. In this way, the ammeter connected to this line cannot measure the true leakage current of the capacitor under test. Because it is impossible to measure the leakage current of each capacitor, it is impossible to locate the position of the capacitor that has overcurrent or short circuit during the aging process, and it is impossible to eliminate the capacitors that have abnormalities during the aging process after the aging is completed. It can only be determined that there are failed capacitors in a group of multiple capacitors. This group of capacitors needs to be screened twice to find the specific failed capacitors, which increases the difficulty and cost of screening. At present, this technology mainly realizes the ability to ensure the identification and recording of any single capacitor that has poor contact during the aging process, and records its location. After aging, it is removed and rearranged for aging, thereby ensuring the quality of the delivered capacitors and effectively preventing the delivery of virtual aged capacitors to users, thereby blocking the virtual aging loophole that is prone to occur in the aging assessment link of capacitors.

[0005] In summary, high-reliability capacitor batch aging equipment currently requires the ability to test the contact status of each capacitor (to identify capacitors with poor contact or open circuits) and provide independent overcurrent protection for each capacitor. In addition, when the capacitor experiences overcurrent or short-circuit breakdown, the protection element maintains a low current, thereby minimizing the temperature rise of the protection element and extending its service life. This requires that capacitor batch aging equipment should also be able to test for a significant increase in the DC leakage current of each capacitor (to identify capacitors with overcurrent or short circuits) and record the location of capacitors with excessive leakage current during the aging process, facilitating their accurate removal after aging. To achieve efficient production of large-scale capacitor aging, it is desirable to have large-scale aging equipment with an aging capacity of 10,000 to 20,000 capacitors or more, equipped with comprehensive protection and online monitoring for each capacitor. Existing technology does not meet this demand, especially for high-capacitance MLCC capacitors, which are more susceptible to insulation resistance drop and leakage current increase at high temperatures. Therefore, the screening process on the production line urgently needs to add efficient and low-cost high-temperature insulation resistance testing methods and devices to improve the screening quality of high-capacitance capacitors. Summary of the Invention

[0006] The purpose of the present invention is to overcome the defects existing in the prior art and provide a device that can test the contact status and leakage current of large quantities of capacitors during aging. The batch aging equipment for high-reliability capacitors not only has the ability to test the contact status of each capacitor (for discovering capacitors with poor contact or open circuit), but also has independent overcurrent protection for each capacitor. When the capacitor has an overcurrent or short circuit breakdown, the current maintained by the protection element is small, so that the temperature rise of the protection element is not high and the service life is long.

[0007] To achieve the above-mentioned object, the technical solution of the present invention is to design a device capable of testing the contact state and leakage current of a large number of capacitors during aging, comprising a DC power supply and a capacitor array, wherein one end of a plurality of capacitor units forming a column in the capacitor array is connected to a measurement line, forming a column in the array; the other end of a plurality of capacitor units forming a row is connected to a voltage line, forming a row in the array; the voltage line is a voltage line for applying power; and a switch is provided between the voltage line and the power supply;

[0008] Or the device for testing the contact status and leakage current of a large number of capacitors when they are aged includes a DC power supply, an AC power supply and a capacitor array; one end of a plurality of capacitor units forming a column in the capacitor array is connected to a measurement line to form a column in the array; a plurality of capacitor units forming a row is connected to a voltage line to form a row in the array; switches are respectively provided between the voltage line and the DC power supply and the AC power supply.

[0009] A further technical solution is that the capacitor unit is a capacitor;

[0010] Or the capacitor unit is a two-terminal capacitor unit formed by connecting each capacitor in series with a protection element.

[0011] A further technical solution is that all capacitor units are connected to their two voltage lines through a diode to isolate the adverse effects of bypass current caused by other units around the capacitor unit being tested, thereby increasing the leakage current test accuracy of the capacitor unit being tested;

[0012] One of the voltage lines is used to charge the capacitor, one is used to discharge the capacitor, and the two

[0013] The voltage lines are connected to an external power source or a discharge terminal through respective switches, and the switches determine whether to energize or discharge the capacitor;

[0014] The voltage line used to energize the capacitor is connected to the DC power supply through a switch or is connected to the DC power supply and AC power supply in series through a switch;

[0015] Alternatively, a voltage line for energizing the capacitor is connected to a DC power supply through a switch, and a measurement line is connected to an AC power supply through a switch.

[0016] A further technical solution is that the large-scale capacitor aging device includes an aging orifice plate and an upper needle plate that is matched with it. The aging orifice plate is used to load capacitors in a vertical manner. The lower electrode of the vertical capacitor is connected to the electrode contact at the bottom of the aging orifice plate. The electrode contacts at the bottom of the aging orifice plate are connected on the aging plate to form a row or column of the capacitor array; the probes on the upper needle plate correspond to the upper end electrodes of the vertical capacitor array loaded in the aging orifice plate.

[0017] A further technical solution is that a protection element is provided on the upper needle plate; or protection elements are provided on both the upper needle plate and the aging hole plate; and the capacitor and the protection element are connected in series to form a capacitor unit.

[0018] A further technical solution is that a protection element is provided on the upper needle board; the other ends of the protection elements on the upper needle board are connected together to form a column or a row of the capacitor array.

[0019] A further technical solution is that the connection line on the upper needle plate is connected to the electrode contact provided on the aging hole plate through the connection probe, and the electrode contact is connected to the multi-contact plug provided on the end of the aging hole plate through the connection line on the aging hole plate, and the multi-contact plug is used to connect with the aging test equipment or the high-temperature leakage current test equipment;

[0020] The device is used for aging and testing of high-capacitance capacitors.

[0021] Another technical solution is a device for testing the contact status and leakage current of large quantities of capacitors during aging, comprising a capacitor carrier box and an upper needle plate provided therewith; the capacitor carrier box is used to load capacitors in a vertical manner, and independent contact electrodes are provided at the bottom of the capacitor carrier box to form a contact electrode array, and the contact electrode array is used to contact and connect with the aging needle plate or the test needle plate from the bottom of the carrier box, thereby connecting the terminal electrodes at the lower ends of the capacitors; the upper needle plate corresponds to the terminal electrodes at the upper ends of the capacitors exposed on the surface of the carrier box in contact with the carrier box;

[0022] The device is used for aging and testing capacitors with low capacitance and high operating frequency.

[0023] The present invention also provides a method for testing a large number of capacitors during aging using a device capable of testing contact status and leakage current, comprising the following steps:

[0024] During aging, the switches on all voltage lines are closed, and the switches on the DC power supply lines are also closed. What is measured on each measurement line is the total leakage current of all capacitors connected to the measurement line; the switch on the voltage line where the capacitor unit whose leakage current needs to be tested is located is disconnected, and the power supply connected to the capacitor unit whose leakage current needs to be tested is disconnected. The total current on the measurement line connected to this capacitor unit is tested again. The total current of this test is less than the current measured before the voltage line is disconnected from the power supply. The reduced current value is the leakage current value of the capacitor unit under test.

[0025] The present invention also provides a method for testing a large number of capacitors during aging using a device capable of testing contact status and leakage current, comprising the following steps:

[0026] The switch on the DC power supply line is disconnected, and the switch on the AC power supply line is closed. What is measured on each measurement line is the AC current of all the capacitors connected to the measurement line. When the AC current on a certain measurement line is small, the switch on each voltage line is disconnected in turn. If the test current decreases less in a certain period, it means that the capacitor on the corresponding voltage line has poor contact.

[0027] The advantages and beneficial effects of the present invention are:

[0028] Based on the technology disclosed in patent announcement number CN112595999A, the present invention has made special improvements. Under the premise of effectively extending the service life of the protection element (reducing the protection current to a lower level, such as below 1mA), the present invention can not only measure any capacitor with poor contact or even open circuit and record its position during the aging process, but also measure any capacitor with overcurrent or even short circuit and record its position. The aging capacity can reach more than 10,000 to 20,000 capacitors, thereby realizing high-quality aging of large quantities of capacitors and high-temperature leakage current (or high-temperature insulation resistance IR) testing, and is particularly suitable for achieving high-quality screening operations of high-capacitance capacitors. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] FIG1 is a schematic diagram of a first embodiment of a device for testing contact status and leakage current of a large number of capacitors during aging according to the present invention;

[0030] FIG2 is a bottom view of FIG1;

[0031] FIG3 is a schematic diagram of an aging orifice plate in FIG1 ;

[0032] FIG4 is a partial enlarged schematic diagram of FIG3;

[0033] FIG5 is a side view of FIG3;

[0034] FIG6 is a schematic diagram of the present invention;

[0035] FIG7 is a schematic diagram of a second embodiment of the present invention.

[0036] In the figure: 1. Aging orifice plate; 2. Capacitor; 3. Diode; 4. Measurement connection; 5. Voltage connection; 6. DC power supply; 7. AC power supply; 8. Discharge terminal. DETAILED DESCRIPTION

[0037] The following embodiments are further described in conjunction with the accompanying drawings and examples. The following embodiments are only used to more clearly illustrate the technical solutions of the present invention and are not intended to limit the scope of protection of the present invention.

[0038] Example 1:

[0039] As shown in Figures 1 to 6 (Figure 1 is a schematic diagram of multiple devices assembled together), the present invention is a device that can test the contact status and leakage current of large quantities of capacitors during aging. The aging fixture used in the present invention can also be used for capacitance and loss testing of capacitor components. The following aging fixture is a solution after considering compatible test devices:

[0040] For high-capacitance capacitors, the fixture used is an aging orifice plate 1 superimposed on an upper needle plate, wherein the aging orifice plate 1 is used to load the capacitor 2 in a vertical manner, and the lower electrode of the vertical capacitor 2 is connected to the electrode contact at the bottom of the aging orifice plate 1, and the relevant contacts are connected on the aging orifice plate 1 to form a row or column of the capacitor element matrix; the probe on the upper needle plate is pressed on the upper end electrode of the vertical capacitor array, and the upper needle plate is provided with a protection element. After the capacitor and the protection element are connected in series to form a capacitor unit, the other end of the relevant protection element on the upper needle plate is connected together to form a column or row of the capacitor element matrix. The connection line on the upper needle plate is connected to the contact provided on the aging orifice plate 1 through a probe or other connection method, and is finally connected to the multi-contact plug provided on the end of the aging orifice plate, like the capacitor on the aging orifice plate, and the plug is used to connect to the aging test equipment or high-temperature leakage current test equipment.

[0041] For capacitors with low capacitance and high operating frequency, a capacitor carrier box is used as a unified tooling. Each capacitor is vertically loaded into the carrier box. The bottom of the carrier box has independent contact electrodes, which can be used by the aging pin board or the test pin board to contact the contact electrode array of the carrier box from the bottom of the carrier box, thereby connecting the terminal electrode at the bottom of the capacitor. The upper pin board contacts the terminal electrode at the top of the capacitor exposed on the surface of the carrier box. In the aging or high-temperature IR (insulation resistance) value (or leakage current) test mode, the protection element, voltage connection, and test connection are all arranged on the upper pin board and aging pin board; in the capacity and loss test mode, the carrier box is used in the test machine to test each capacitor independently, and the test accuracy is not affected by the aforementioned connections.

[0042] The advantage of using shared tooling for the above-mentioned aging test or high-temperature IR test, room-temperature test, and screening stages is that it eliminates the need for a separately configured, costly four-parameter tester with a bulk capacitor loading system. By utilizing tooling already loaded with capacitors in the aging or high-temperature IR test stage and employing a screening device with a lower-cost testing device, defective products generated in the aging or high-temperature IR test stage can be automatically screened out. Defective products in the capacity and loss tests in the room-temperature test can also be screened out, and classified and screened according to different capacity and loss parameters. The equipment using this solution has good compatibility with capacitor products of various sizes, which can significantly improve the utilization rate of production line equipment.

[0043] In an array consisting of multiple capacitors, each capacitor 2 is connected in series with a protection element to form a two-terminal capacitor unit. Multiple capacitor units forming a column in the capacitor array are connected to a measurement connection 4 at one end, forming a column in the array; multiple capacitor units forming a row are connected to a voltage connection 5, forming a row in the array. The total leakage current measured on each measurement connection 4 is the total leakage current of all capacitors 2 connected to the measurement connection 4. At this time, the power supply connected to the voltage connection 5 where the capacitor unit whose leakage current needs to be tested is disconnected, and the total current on the measurement connection 4 connected to this capacitor unit is immediately tested again. The total current of this test is less than the current measured before the voltage connection 5 is disconnected from the power supply. The reduced current value can be considered the leakage current value of the capacitor unit being tested.

[0044] In order to reduce the influence of the voltage on other voltage connection lines 5 on the total current of the measuring line connected to the measured capacitor unit through other capacitor units, two diodes 3 are added between all capacitor units and their respective voltage connection lines 5 to isolate the adverse effects of bypass current caused by other units around the measured capacitor unit, thereby increasing the leakage current test accuracy of the measured capacitor unit.

[0045] One of the two voltage connections 5 is used to energize the capacitor, and the other is used to discharge the capacitor. The two voltage connections 5 are connected to an external power source or a discharge terminal 8 through respective switches. The switches determine whether the capacitor is energized or discharged.

[0046] A voltage connection line 5 for energizing the capacitor is connected to a DC power source 6 via a switch or is connected to a series-connected DC power source 6 and an AC power source 7 via a switch;

[0047] The aging fixture used can also be used for capacity and loss testing of capacitor components.

[0048] For high-capacitance capacitors, the fixture used is an aging orifice plate superimposed on an upper needle plate, wherein the aging orifice plate is used to load the capacitor in a vertical manner, and the lower electrode of the vertical capacitor is connected to the electrode contact at the bottom of the aging orifice plate, and one end of the relevant capacitor unit is connected on the aging plate to form a row or column of the capacitor unit matrix; the probe on the upper needle plate is pressed on the upper end electrode of the vertical capacitor array, and the other end of the capacitor unit is connected together on the upper needle plate to form a column or row of the capacitor element matrix. The connection line on the upper needle plate is connected to the contact set on the aging orifice plate through a probe or other connection method, and is finally connected to the multi-contact plug set on the end of the aging orifice plate, just like the connection line of the row or column of the capacitor unit on the aging orifice plate. The plug is used to connect to the aging test equipment or high-temperature leakage current test equipment.

[0049] For capacitors with low capacitance and high operating frequency, a capacitor carrier box is used as a unified tooling. Each capacitor is vertically loaded into the carrier box. There are independent contact electrodes at the bottom of the carrier box, which can be used by the aging needle board or the test needle board to contact the contact electrode array of the carrier box from the bottom of the carrier box, thereby connecting the terminal electrode at the lower end of the capacitor. The upper needle board contacts the terminal electrode at the upper end of the capacitor exposed on the surface of the carrier box. In the aging or high-temperature IR value (or leakage current) test mode, the protection elements of the capacitor unit, the isolation diode elements, the voltage connection line, and the test connection line are all arranged on the upper needle board and the aging needle board. When the carrier box is separated from the aging board, the electrodes of all the capacitors in the carrier box are in an independent state. In the capacity and loss test mode, the carrier box is used in the test machine to test each capacitor independently. The test accuracy is not affected by the aforementioned connections, protection elements, and isolation diodes.

[0050] There are voltage connections and test connections on the upper needle board and the aging hole board. The preferred solution is to place the protection components on the upper needle board. When the upper needle board is separated from the aging board, the upper electrode of the capacitor on the aging hole board is in an independent state. The upper needle board can be moved to the test device, and the test needle is pressed on the test point of the connection between the upper electrode of the capacitor and the lower electrode of the capacitor on the aging hole board (the contact on the aging board that was originally touched by the connection probe on the upper needle board can be used as the test point). The capacity and leakage current can also be tested. Especially for large capacity and low test frequency, the influence of various connections on the aging board on the test accuracy can be ignored.

[0051] During aging, the switches on all voltage connections 5 are closed, and the switches on the DC power supply 6 connection are also closed. What is measured on each measurement connection 4 is the total leakage current of all capacitors connected to the measurement connection 4; the switch on the voltage connection 5 where the capacitor unit whose leakage current needs to be tested is located is disconnected, and the power supply connected to the capacitor unit whose leakage current needs to be tested is disconnected. The total current on the measurement connection 4 connected to this capacitor unit is measured again. The total current of this test is less than the current measured before the voltage connection and the power supply are disconnected. The reduced current value is the leakage current value of the capacitor unit under test;

[0052] The switch on the DC power supply 6 is disconnected, and the switch on the AC power supply 7 is closed. What is measured on each measuring line 4 is the AC current of all capacitors 2 connected to the measuring line 4. When the AC current on a certain measuring line 4 is small, the switch on each voltage line 5 is disconnected in turn. If the test current decreases less in a certain time, it means that the capacitor on the corresponding voltage line has poor contact.

[0053] Example 2:

[0054] The difference from Example 1 is that, as shown in Figure 7, the voltage connection 5 used to energize the capacitor is connected to a DC power supply 6 via a switch, and the measurement connection 4 is connected to an AC power supply 7 (for measuring contact status) via a switch. Another voltage connection 5 is connected to a discharge terminal 8 via a switch. The above is merely a preferred embodiment of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the technical principles of the present invention, and such improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A device for testing the contact status and leakage current of large quantities of capacitors during aging, characterized in that: It includes a DC power supply and a capacitor array, wherein one end of a plurality of capacitor units forming a column in the capacitor array is connected to a measurement line to form a column in the array; the other end of a plurality of capacitor units forming a row is connected to a voltage line to form a row in the array; the voltage line is a voltage line for applying power; a switch is provided between the voltage line and the power supply; Or the device capable of testing the contact state and leakage current of a large number of capacitors when they are aged comprises a DC power supply, an AC power supply and a capacitor array; one end of a plurality of capacitor units forming a column in the capacitor array is connected to a measuring line to form a column in the array; a plurality of capacitor units forming a row are connected to a voltage line to form a row in the array; switches are respectively provided between the voltage line and the DC power supply and the AC power supply.

2. The device for testing contact status and leakage current of bulk capacitors during aging according to claim 1, characterized in that: The capacitor unit is a capacitor; Or the capacitor unit is a two-terminal capacitor unit formed by connecting each capacitor in series with a protection element.

3. The device for testing contact status and leakage current of bulk capacitors during aging according to claim 2, characterized in that: All capacitor units are connected to their two voltage lines through a diode to isolate the adverse effects of bypass current caused by other units around the capacitor unit under test, thereby increasing the leakage current test accuracy of the capacitor unit under test; one of the two voltage lines is used to energize the capacitor, and the other is used to discharge the capacitor, and the two voltage lines are connected to an external power supply or a discharge end through respective switches, and the switch determines whether to energize or discharge the capacitor; A voltage line for energizing the capacitor is connected to a DC power source through a switch or is connected to a DC power source and an AC power source in series through a switch; Alternatively, a voltage line for energizing the capacitor is connected to a DC power source through a switch, and a measuring line is connected to an AC power source through a switch.

4. The device for testing contact status and leakage current of bulk capacitors during aging according to claim 3, characterized in that: The large-volume capacitor aging device includes an aging orifice plate and an upper needle plate that is matched with it. The aging orifice plate is used to load capacitors in a vertical manner. The lower electrode of the vertical capacitor is connected to the electrode contact at the bottom of the aging orifice plate. The electrode contacts at the bottom of the aging orifice plate are connected on the aging board to form a row or column of a capacitor array; the probes on the upper needle plate correspond to the upper end electrodes of the vertical capacitor array loaded in the aging orifice plate.

5. The device for testing contact status and leakage current of bulk capacitors during aging according to claim 4, characterized in that: The upper needle plate is provided with a protection element; or both the upper needle plate and the aging hole plate are provided with a protection element; the capacitor and the protection element are connected in series to form a capacitor unit.

6. The device for testing contact status and leakage current of bulk capacitors during aging according to claim 5, characterized in that: The upper needle plate is provided with a protection element; the other ends of the protection elements on the upper needle plate are connected together to form a column or a row of a capacitor array.

7. The device for testing contact status and leakage current of bulk capacitors during aging according to claim 6, characterized in that: The connection lines on the upper needle plate are connected to the electrode contacts set on the aging hole plate through the connection probes, and the electrode contacts are connected to the multi-contact plug set on the end of the aging hole plate through the connection lines on the aging hole plate. The multi-contact plug is used to connect to the aging test equipment or the high-temperature leakage current test equipment.

8. The device for testing contact status and leakage current of bulk capacitors during aging according to claim 2, characterized in that: The large-volume capacitor aging device includes a capacitor carrier box and an upper needle plate that is matched with it; the capacitor carrier box is used to load capacitors in a vertical manner, and independent contact electrodes are provided at the bottom of the capacitor carrier box to form a contact electrode array, and the contact electrode array is used to contact and connect with the aging needle plate or the test needle plate from the bottom of the carrier box, thereby connecting the end electrode at the lower end of the capacitor; the upper needle plate corresponds to the end electrode at the upper end of the capacitor exposed on the surface of the carrier box in the contact carrier box.

9. The device for testing contact status and leakage current of bulk capacitors during aging according to claim 2, characterized in that: The bulk capacitor aging device includes a capacitor carrier box, which is used to load capacitors in a horizontal manner. Independent contact electrodes are provided at the bottom of the capacitor carrier box to form a contact electrode array, which connects two terminal electrodes at the lower ends of all horizontal capacitors.

10. A method for testing a large number of capacitors by using the device capable of testing contact status and leakage current when the capacitors are aged as claimed in claim 2, 7, 8 or 9, characterized in that: The steps include: During aging, the switches on all voltage lines are closed, and the switches on the DC power supply lines are also closed. What is measured on each measurement line is the total leakage current of all capacitors connected to the measurement line. The switch on the voltage line where the capacitor unit that needs to test the leakage current is located is disconnected, and the power supply connected to the capacitor unit that needs to test the leakage current is disconnected. The total current on the measurement line connected to this capacitor unit is tested again. The total current of this test is less than the current measured before the voltage line is disconnected from the power supply, and the reduced current value is the leakage current value of the capacitor unit being tested.

11. A method for testing a large number of capacitors by using the device capable of testing contact status and leakage current when aging as claimed in claim 2, 7, 8 or 9, characterized in that: The steps include: The switch on the DC power supply line is disconnected, and the switch on the AC power supply line is closed. What is measured on each measurement line is the AC current of all the capacitors connected to the measurement line. When the AC current on a certain measurement line is small, the switch on each voltage line is disconnected in turn. If the test current decreases less in a certain time, it means that the capacitor on the corresponding voltage line has poor contact.

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