A sample analysis system and a sample analysis system control method
The unified sample analysis system addresses inefficiencies in existing systems by optimizing sample distribution and processing across multiple analyzers, enhancing detection efficiency through a sample transfer device with multiple mechanisms and buffer areas.
Patent Information
- Application Number
- CN201810380606.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2018-04-25
- Publication Date
- 2024-12-20
- Estimated Expiration
- 2038-04-25
AI Technical Summary
Existing sample analysis systems suffer from inefficiencies due to independent sample placement and recovery platforms, leading to idle instruments and inefficient sample processing.
A unified sample analysis system with a sample transfer device and a control method that includes a sample transfer device with multiple feeding and unloading mechanisms, buffer areas, and loading devices to optimize sample distribution across multiple analyzers, enhancing detection efficiency.
The system achieves high detection efficiency by optimizing sample distribution and reducing idle time in analyzers, allowing for streamlined sample processing and analysis.
Smart Images

Figure CN110398602B_ABST
Abstract
Description
Technical Field
[0001] The present invention belongs to the field of medical diagnostic equipment, and in particular relates to a sample analysis system and a sample analysis system control method. Background Art
[0002] In the field of medical diagnosis, sample analysis equipment is used to test samples such as blood. Samples are generally placed on sample racks and transported through assembly lines to achieve streamlined testing operations. By cascading multiple analytical instruments together through assembly lines, all samples can be managed and scheduled in a unified manner, thereby completing efficient sample measurement.
[0003] Assembly line sample analysis equipment usually has an independent sample centralized placement platform and recovery platform, which may be placed on both sides or on the same side of the assembly line. The placement platform is located on one side of the assembly line. When the user places a sample rack, it can actively identify and start scheduling, and distribute the sample rack to each instrument through the outer rail transmission mechanism for analysis and measurement. There is also an independent loading buffer area on the front side of the instrument. When the instrument receives the sample rack dispatched from the placement platform, it will temporarily store the sample rack and wait for the instrument to be idle before starting analysis and detection, which is inefficient. Summary of the invention
[0004] The purpose of the present invention is to overcome the above-mentioned deficiencies of the prior art and to provide a sample analysis system and a sample analysis system control method, which have high detection efficiency.
[0005] The technical solution of the present invention is: a sample analysis system, comprising a sample transfer device, a first sample analyzer and a second sample analyzer,
[0006] The sample transfer device comprises:
[0007] a first feeding device and a second feeding device, wherein the first feeding device and the second feeding device respectively feed the sample rack into the first sample analyzer and the second sample analyzer for sampling and analysis;
[0008] a first unloading buffer area, the first unloading buffer area corresponding to the first feeding device, and used to receive the sample rack passing through the first feeding device;
[0009] a second unloading buffer area, the second unloading buffer area corresponds to the second feeding device and is used to receive the sample rack passing through the first feeding device;
[0010] A unified loading device, used for loading sample racks into the first feeding device and the second feeding device, wherein the first feeding device and the second feeding device are respectively arranged on both sides of the unified loading device;
[0011] A first unloading mechanism and a second unloading mechanism, wherein the first unloading mechanism is used to transport the sample rack on the first feeding device to the first unloading buffer area for storage; and the second unloading mechanism is used to transport the sample rack on the second feeding device to the second unloading buffer area for storage.
[0012] Optionally, the first feeding device includes a first feeding channel, the second feeding device includes a second feeding channel, the first feeding channel and the second feeding channel are respectively arranged on both sides of the unified loading device, the first feeding channel is connected to the unified loading device and the first unloading buffer area, the second feeding channel is connected to the unified loading device and the second unloading buffer area, the unified loading device is used to load sample racks into the first feeding channel and the second loading feeding channel, the first unloading mechanism is used to transport the sample racks on the first feeding channel to the first unloading buffer area for storage, and the second unloading mechanism is used to transport the sample racks on the second feeding channel to the second unloading buffer area for storage; or,
[0013] The first feeding device includes a first feeding channel, a first loading buffer area and a first loading mechanism, the second feeding device includes a second feeding channel, a second loading buffer area and a second loading mechanism, the first loading buffer area and the second loading buffer area are arranged on both sides of the unified loading device, the first feeding channel is connected to the first loading buffer area and the first unloading buffer area, the second feeding channel is connected to the second loading buffer area and the second unloading buffer area, the unified loading device is used to load sample racks into the first loading buffer area and the second loading buffer area, the first loading mechanism is used to transport the sample racks stored in the first loading buffer area to the first feeding channel; the second loading mechanism is used to transport the sample racks stored in the second loading buffer area to the second feeding channel, the first unloading mechanism is used to transport the sample racks on the first feeding channel to the first unloading buffer area for storage, and the second unloading mechanism is used to transport the sample racks on the second feeding channel to the second unloading buffer area for storage.
[0014] The present invention also provides a sample analysis system, including a sample transfer device, a first sample analyzer and a second sample analyzer.
[0015] The sample transfer device comprises:
[0016] a first feed channel and a second feed channel, wherein the first feed channel and the second feed channel correspond to the first sample analyzer and the second sample analyzer, respectively;
[0017] a first loading cache area and a first unloading cache area, wherein the first loading cache area and the first unloading cache area correspond to the first feeding channel respectively;
[0018] a second loading cache area and a second unloading cache area, the second loading cache area and the second unloading cache area respectively corresponding to the second feed channel;
[0019] A unified loading device, used for receiving sample racks to be distributed to the first loading buffer area and the second loading buffer area, wherein the first loading buffer area and the second loading buffer area are arranged on both sides of the unified loading device;
[0020] A first loading mechanism and a second loading mechanism, wherein the first loading mechanism is used to transport the sample rack of the unified loading device to the first loading buffer area, and the first loading mechanism is also used to transport the sample rack stored in the first loading buffer area to the first feeding channel; the second loading mechanism is used to transport the sample rack of the unified loading device to the second loading buffer area, and the second loading mechanism is also used to transport the sample rack stored in the second loading buffer area to the second feeding channel;
[0021] A first unloading mechanism and a second unloading mechanism, wherein the first unloading mechanism is used to transport the sample rack on the first feeding channel to the first unloading buffer area for storage; and the second unloading mechanism is used to transport the sample rack on the second feeding channel to the second unloading buffer area for storage.
[0022] Optionally, a sample rack information detection device is provided on one side of the unified loading device, and the sample rack information detection device is used to obtain identification information of the sample rack on the unified loading device and select to allocate the sample rack to the first loading buffer area or the first feeding channel and the second loading buffer area or the second feeding channel according to the identification information.
[0023] Optionally, the sample transfer device further comprises a manual sample injection device, the manual sample injection device corresponds to the first feeding channel, and the manual sample injection device is an open sample injection device or a closed sample injection device.
[0024] Optionally, the sample transfer device further comprises a manual sample injection device, the manual sample injection device corresponds to the second feeding channel, and the manual sample injection device is an open sample injection device or a closed sample injection device.
[0025] Optionally, the first feeding channel is a bidirectional transmission channel, and the first unloading mechanism is further used to transport the sample rack on the first unloading buffer area to the first feeding channel.
[0026] Optionally, the second feeding channel is a bidirectional transmission channel, and the second unloading mechanism is further used to transport the sample rack on the second unloading buffer area to the second feeding channel.
[0027] Optionally, the first loading buffer area and the second loading buffer area are respectively provided with a quantity detection device, and the quantity detection device is used to detect the number of sample racks in the first loading buffer area and the second loading buffer area or the number of sample racks that can currently be accommodated.
[0028] The present invention also provides a sample analysis system control method, wherein a unified loading device loads a sample rack of samples to be tested to a first feeding device and a second feeding device corresponding to a first sample analyzer respectively;
[0029] The first feeding device transports the sample rack to the first sample analyzer for sampling and analysis;
[0030] The first unloading mechanism transports the sample rack after passing through the first feeding device to the first unloading buffer area; or / and:
[0031] The second feeding device transports the sample rack to the second sample analyzer for sampling and analysis;
[0032] The second unloading mechanism transports the sample rack after passing through the second feeding device to the second unloading buffer area.
[0033] Optionally, the unified loading device loads the sample rack into the first feeding channel of the first feeding device and the second feeding channel of the second feeding device, the first feeding channel transports the sample rack to the first sample analyzer for sampling and analysis, and the second feeding channel transports the sample rack to the second sample analyzer for sampling and analysis;
[0034] Alternatively, the unified loading device loads the sample rack into the first buffer area of the first feeding device, and the first loading mechanism of the first feeding device transports the sample rack on the first loading buffer area to the first feeding channel corresponding to the first sample analyzer; the unified loading device loads the sample rack into the second buffer area of the second feeding device, and the second loading mechanism of the second feeding device transports the sample rack on the second loading buffer area to the second feeding channel corresponding to the second sample analyzer, the first feeding channel transports the sample rack to the first sample analyzer for sampling and analysis, and the second feeding channel transports the sample rack to the second sample analyzer for sampling and analysis.
[0035] The present invention also provides a sample analysis system control method, wherein a unified loading device receives a sample rack of samples to be tested;
[0036] The first loading mechanism and the second loading mechanism load the sample racks of the samples to be tested from the unified loading device to the first loading buffer area and the second loading buffer area respectively;
[0037] The first loading mechanism transports the sample rack on the first loading buffer area to the first feeding channel corresponding to the first sample analyzer;
[0038] The first feeding channel transports the sample rack to the first sample analyzer for sampling and analysis;
[0039] The first unloading mechanism transports the sample rack after passing through the first feeding channel to the first unloading buffer area; or / and:
[0040] The second loading mechanism transports the sample rack on the second loading buffer area to a second feeding channel corresponding to the second sample analyzer, and the second feeding channel transports the sample rack to the second sample analyzer for sampling and analysis;
[0041] The second unloading mechanism transports the sample rack after passing through the second feeding channel to the second unloading buffer area.
[0042] Optionally, before the unified loading device loads the sample rack of the samples to be tested into the first loading buffer area and the second loading buffer area respectively, it also includes obtaining identification information of the sample rack on the unified loading device, and loading the sample rack into the first loading buffer area or the first feed channel and the second loading buffer area or the second feed channel according to the identification information.
[0043] Optionally, the identification information includes identifying whether the samples in the sample rack in the unified loading device are sampled and analyzed by the first sample analyzer or the second sample analyzer.
[0044] Optionally, when the tested sample needs to be retested, the first feed channel moves in the opposite direction to transport the tested sample to the first sample analyzer for secondary analysis; or / and, the second feed channel moves in the opposite direction to transport the tested sample to the second sample analyzer for secondary analysis.
[0045] Optionally, the method further comprises: when the emergency action is triggered, moving the sample to be tested to the sample aspirating needle of the open sampling device in the first sample analyzer, the sample aspirating needle extending into the sample to be tested and starting the sample aspirating test;
[0046] Alternatively, when the emergency action is triggered, the door of the closed sampling device in the first sample analyzer is opened, and the sample to be tested is placed in the closed sampling device for sample suction testing.
[0047] Optionally, the method further comprises: when the emergency action is triggered, moving the sample to be tested to the sample aspirating needle of the open sampling device in the second sample analyzer, the sample aspirating needle extending into the sample to be tested and starting the sample aspirating test;
[0048] Alternatively, when the emergency action is triggered, the door of the closed sampling device in the second sample analyzer is opened, and the user places the sample to be tested in the closed sampling device for sample suction testing.
[0049] Optionally, the method further includes: identifying the number of sample racks stored in the first loading buffer area and the second loading buffer area; and placing the sample racks in a loading buffer area with a smaller number or a loading buffer area with a number of sample racks less than a preset number by a unified loading device.
[0050] Optionally, the step of identifying the number of sample racks in each loading buffer area specifically includes the following steps: based on the sample rack detection signals obtained in the detection areas at both ends of each loading buffer area, controlling the loading mechanism in the loading buffer area to push the sample rack to move between the detection areas at both ends of the loading buffer area, and calculating the number of sample racks in the loading buffer area based on the movement distance of the loading mechanism between the two detection areas and the maximum storage number of sample racks between the two detection areas.
[0051] The present invention provides a sample analysis system and a sample analysis system control method. Users can place samples on a unified loading device, and the samples can be directly diverted to a first loading buffer area or a second loading buffer area, thereby achieving high detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0052] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0053] Figure 1 It is a structural schematic diagram of the first feeding device in the first embodiment of the sample analysis system of the present invention when the first specific solution is adopted;
[0054] Figure 2 It is a structural schematic diagram of the first feeding device in the first embodiment of the sample analysis system of the present invention when the second specific solution is adopted;
[0055] Figure 3 It is a schematic structural diagram of a third embodiment of the sample analysis system of the present invention;
[0056] Figure 4 A three-dimensional diagram of an embodiment of a manual sample injection device in a sample analysis system of the present invention;
[0057] Figure 5 A schematic structural diagram of an embodiment of a first loading mechanism in a sample analysis system of the present invention;
[0058] Figure 6A three-dimensional diagram of a sample transfer device in a sample analysis system of the present invention
[0059] Figure 7 A perspective view of a first sample holder (elongated bottle) used in the sample analysis system of the present invention;
[0060] Figure 8 A perspective view of a second sample holder (microtube) used in the sample analysis system of the present invention;
[0061] Fig. 9 It is a structural schematic diagram of a first loading position detector and a first direction identification mechanism in the sample analysis system of the present invention;
[0062] Fig.10 It is a schematic diagram of the station design when the first loading mechanism in the sample analysis system of the present invention performs bidirectional loading. DETAILED DESCRIPTION
[0063] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.
[0064] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be an intermediate element at the same time. When an element is referred to as being "connected to" another element, it may be directly connected to the other element or there may be an intermediate element at the same time.
[0065] It should also be noted that the directional terms such as left, right, up, and down in the embodiments of the present invention are merely relative concepts or are based on the normal use status of the product and should not be considered as restrictive.
[0066] Embodiment 1:
[0067] like Figure 1 As shown, the first embodiment of the sample analysis system provided by the present invention includes a sample transfer device, a first sample analyzer 20 and a second sample analyzer 30 .
[0068] The first sample analyzer 20 and the second sample analyzer 30 can be used to analyze body fluid samples (such as blood, etc.) or urine samples, etc. The first sample analyzer 20 and the second sample analyzer 30 can be the same or different. The first sample analyzer 20 and the second sample analyzer 30 can be a blood cell analyzer, a special protein analyzer, a glycated hemoglobin analyzer, a film pusher, a blood type analyzer, etc., but are not limited to the above-listed ones, and the user can set them according to actual conditions. At least one or both of the first sample analyzer 20 or the second sample analyzer 30 are provided with a display screen, so that the operator can easily obtain the operating status of the system from the display screen. The display screen can be a touch-screen display screen, and the operator can also input control instructions to the system through the touch-screen display screen.
[0069] The sample transfer device includes: a unified loading device 340, a first feeding device and a second feeding device, a first unloading buffer area 180, a second unloading buffer area 210, a first unloading mechanism 190, and a second unloading mechanism 220. The first unloading mechanism 190 and the second unloading mechanism 220 can be mechanical mechanisms such as a manipulator mechanism, a claw mechanism, a push claw mechanism, and a magnetic suction mechanism that can move the sample rack.
[0070] The first feeding device is used to feed the sample rack into the first sample analyzer 20 for sampling and analysis. The second feeding device is used to feed the sample rack into the second sample analyzer 30 for sampling and analysis.
[0071] The unified loading device 340 is used to load sample racks into the first feeding device corresponding to the first sample analyzer 20 and the second feeding device corresponding to the second sample analyzer 30 . The first feeding device and the second feeding device are respectively arranged on both sides of the unified loading device 340 .
[0072] The first unloading buffer area 180 corresponds to the first feeding device and is used to receive the sample rack passing through the first feeding device. The second unloading buffer area 210 corresponds to the second feeding device and is used to receive the sample rack passing through the first feeding device.
[0073] The first unloading mechanism 190 is used to transport the sample rack on the first feeding device to the first unloading buffer area 180 for storage; the second unloading mechanism 220 is used to transport the sample rack on the second feeding device to the second unloading buffer area 210 for storage.
[0074] The sample rack can be placed manually by the user or by a robot or other device on the unified loading device 340. The unified loading device 340 can transfer the sample rack to the first feeding device and the second feeding device, that is, a unified loading mechanism is provided on the unified loading platform to realize the functions of unified loading and transfer.
[0075] For the sample rack transferred to the first feeding device, the first feeding device can transfer the sample rack to the first sample analyzer 20 for sampling and analysis. After the sample is sampled and analyzed by the first sample analyzer 20, the first feeding device transports the sample rack sampled and analyzed by the first sample analyzer 20 to the place corresponding to the first unloading buffer area 180, and the first unloading mechanism 190 transports the sample rack after passing through the first feeding device to the first unloading buffer area 180 for storage.
[0076] For the sample rack transferred to the second feeding device, the second feeding device can transfer the sample rack to the second sample analyzer 30 for sampling and analysis. After the sample is sampled and analyzed by the second sample analyzer 30, the second feeding device transports the sample rack sampled and analyzed by the second sample analyzer 30 to the corresponding second unloading buffer area 210, and the second unloading mechanism 220 transports the sample rack after passing through the second feeding device to the second unloading buffer area 210 for storage.
[0077] As a first specific solution of the first feeding device and the second feeding device in this embodiment, Figure 1 As shown, the first feeding device includes a first feeding channel 120, and the second feeding device includes a second feeding channel 130. The first feeding channel 120 and the second feeding channel 130 are respectively arranged on both sides of the unified loading device 340, that is, one end of the first feeding channel 120 is directly connected to one side of the unified loading device 340, and one end of the second feeding channel 120 is directly connected to the other side of the unified loading device 340.
[0078] Specifically, the first feeding channel 120 is connected to the unified loading device 340 and the first unloading buffer area 180, and the second feeding channel 130 is connected to the unified loading device 340 and the second unloading buffer area 210. The unified loading device is used to load sample racks into the first feeding channel 120 and the second feeding channel 130, the first unloading mechanism 190 is used to transport the sample racks on the first feeding channel 120 to the first unloading buffer area 180 for storage, and the second unloading mechanism 220 is used to transport the sample racks on the second feeding channel 130 to the second unloading buffer area 210 for storage.
[0079] When the first feeding device and the second feeding device in the sample analysis system adopt the first specific scheme, the control method adopted by the present sample analysis system may include the following steps: the unified loading device 340 loads the sample rack into the first feeding channel 120 of the first feeding device and the second feeding channel 130 of the second feeding device, the first feeding channel 120 transports the sample rack to the first sample analyzer 20 for sampling and analysis, and the second feeding channel 130 transports the sample rack to the second sample analyzer 30 for sampling and analysis.
[0080] As the first possible situation in the above-mentioned first specific scheme, the sample rack is loaded into the first feed channel 120 by the unified loading device 340, and the first feed channel 120 transports the sample rack to the first sample analyzer 20 for sampling and analysis. After the sampling and analysis by the first sample analyzer 20, the sample rack is transported to the end of the first feed channel 120 by the first feed channel 120, and the first unloading mechanism 190 transports the sample rack after passing through the first feed channel 120 to the first unloading buffer area 180.
[0081] As a second possible situation in the above-mentioned first specific scheme, the sample rack is loaded into the second feed channel 130 by the unified loading device 340, and the second feed channel 130 transports the sample rack to the second sample analyzer 30 for sampling and analysis. After the sampling and analysis by the second sample analyzer 30, the sample rack is transported to the end of the second feed channel 130 by the second feed channel 130, and the second unloading mechanism 220 transports the sample rack after passing through the second feed channel 130 to the second unloading buffer area 210.
[0082] As a second specific solution of the first feeding device and the second feeding device in this embodiment, which is different from the first specific solution, Figure 2As shown, the first feeding device includes not only the first feeding channel 120, but also the first loading buffer area 140 and the first loading mechanism 160. The second feeding device includes not only the second feeding channel 130, but also the second loading buffer area 150 and the second loading mechanism 170. The first loading buffer area 140 and the second loading buffer area 150 are respectively arranged on both sides of the unified loading device 340. The unified loading device 340 can be used to load sample racks into the first loading buffer area 140 and the second loading buffer area 150. The first loading mechanism 160 can be used to transport the sample rack stored in the first loading buffer area 140 to the first feeding channel 120; the second loading mechanism 170 can be used to transport the sample rack stored in the second loading buffer area 150 to the second feeding channel 130, the first unloading mechanism 190 is used to transport the sample rack on the first feeding channel 120 to the first unloading buffer area 180 for storage, and the second unloading mechanism 220 is used to transport the sample rack on the second feeding channel 130 to the second unloading buffer area 210 for storage.
[0083] The first loading cache area 140 and the first unloading cache area 180 correspond to the first feeding channel 120, respectively, and the first feeding channel 120 is connected to the first loading cache area 140 and the first unloading cache area 180. The first sample analyzer 20 is located on one side of the first feeding channel 120, and the first sample analyzer 20 is close to the middle of the first feeding channel 120. The first loading cache area 140 and the first unloading cache area 180 can be located on the other side of the first feeding channel 120, and the first loading cache area 140 and the first unloading cache area 180 are respectively arranged at two ends close to the first feeding channel 120.
[0084] The first loading mechanism 160 can be used to deliver the sample rack from the first loading buffer area 140 to one end of the first feeding channel 120. Under the transportation of the first feeding channel 120, the sample rack can reach the sampling and analysis position of the first sample analyzer 20. After passing through the first sample analyzer 20, the sample rack can reach the other end of the first feeding channel 120, where the sample rack is moved to the first unloading buffer area 180 by the first unloading mechanism 190.
[0085] The second loading cache area 150 and the second unloading cache area 210 correspond to the second feeding channel 130 respectively, the second feeding channel 130 is connected to the second loading cache area 150 and the second unloading cache area 210, the second sample analyzer 30 is located at one side of the second feeding channel 130, and the second sample analyzer 30 is close to the middle of the second feeding channel 130. The second loading cache area 150 and the second unloading cache area 210 can be located at the other side of the second feeding channel 130, and the second loading cache area 150 and the second unloading cache area 210 are respectively arranged at two ends close to the second feeding channel 130.
[0086] The second loading mechanism 170 can be used to deliver the sample rack from the second loading buffer area 150 to one end of the second feeding channel 130. Then, under the transportation of the second feeding channel 130, the sample rack can reach the sampling and analysis location of the second sample analyzer 30. After passing through the second sample analyzer 30, the sample rack can reach the other end of the second feeding channel 130 and be transferred to the second unloading buffer area 210 by the second unloading mechanism 220.
[0087] When the first feeding device and the second feeding device in the sample analysis system adopt the second specific scheme, the control method adopted by the present sample analysis system may include the following steps: the unified loading device 340 loads the sample racks of the samples to be tested into the first loading buffer area 140 and the second loading buffer area 150 respectively. The sample racks can be placed manually by the user or placed on the unified loading device 340 by devices such as a manipulator.
[0088] As a first possible situation, the sample rack is loaded into the first loading buffer area 140: the unified loading device 340 loads the sample rack into the first loading buffer area 140, and the sample rack entering the first loading buffer area 140 can enter the analysis process of the first sample analyzer 20. The analysis process of the first sample analyzer 20 may include the following: the first loading mechanism 160 transports the sample rack on the first loading buffer area 140 to the first feeding channel 120 corresponding to the first sample analyzer 20. The first feeding channel 120 transports the sample rack to the first sample analyzer 20 for sampling and analysis, and the sample rack after sampling and analysis by the first sample analyzer 20 is transported to the end of the first feeding channel 120 by the first feeding channel 120, and the first unloading mechanism 190 transports the sample rack after passing through the first feeding channel 120 to the first unloading buffer area 180.
[0089] As a second possible situation, the sample rack is loaded into the second loading buffer area 150: the unified loading device 340 loads the sample rack into the second loading buffer area 150, and the sample rack entering the second loading buffer area 150 can enter the analysis process of the second sample analyzer 30. The analysis process of the second sample analyzer 30 may include the following: the second loading mechanism 170 transports the sample rack from the second loading buffer area 150 to the second feeding channel 130, the second feeding channel 130 transports the sample rack to the second sample analyzer 30 for sampling and analysis, the sample rack after sampling and analysis by the second sample analyzer 30 is transported to the end of the second feeding channel 130 by the second feeding channel 130, and the second unloading mechanism 220 transports the sample rack after passing through the second feeding channel 130 to the second unloading buffer area 210.
[0090] It is understandable that the sample racks in the first loading buffer area 140 corresponding to the first sample analyzer 20 may be placed directly into the first loading buffer area 140 by a machine automatically or manually by an operator, in addition to coming from the unified loading device 340 .
[0091] Similarly, the sample racks in the second loading buffer area 150 corresponding to the second sample analyzer 30 may be placed directly into the second loading buffer area 150 by a machine automatically or manually by an operator, in addition to being placed from the unified loading device 340 .
[0092] Embodiment 2:
[0093] like Figure 2 As shown, the second embodiment of the sample analysis system provided by the present invention includes a sample transfer device, a first sample analyzer 20 and a second sample analyzer 30 .
[0094] The first sample analyzer 20 and the second sample analyzer 30 can be used to analyze body fluid samples (such as blood, etc.) or urine samples, etc. The first sample analyzer 20 and the second sample analyzer 30 can be the same or different. The first sample analyzer 20 and the second sample analyzer 30 can be a blood cell analyzer, a special protein analyzer, a glycated hemoglobin analyzer, a film pusher, a blood type analyzer, etc., but are not limited to the above-listed ones, and the user can set them according to actual conditions. At least one or both of the first sample analyzer 20 or the second sample analyzer 30 are provided with a display screen, so that the operator can easily obtain the operating status of the system from the display screen. The display screen can be a touch-screen display screen, and the operator can also input control instructions to the system through the touch-screen display screen.
[0095] The sample transfer device includes: a unified loading device 340, a first feeding channel 120 and a second feeding channel 130, a first loading buffer area 140 and a first unloading buffer area 180, a second loading buffer area 150 and a second unloading buffer area 210, a first loading mechanism 160 and a first unloading mechanism 190, a second loading mechanism 170 and a second unloading mechanism 220. The first loading mechanism 160 and the first unloading mechanism 190, the second loading mechanism 170 and the second unloading mechanism 220 can be mechanical mechanisms such as a manipulator mechanism, a claw mechanism, a push claw mechanism, a magnetic attraction mechanism, etc. that can move the sample rack.
[0096] The unified loading device 340 is used to receive sample racks to be distributed to the first loading buffer area 140 and the second loading buffer area 150, and the first loading buffer area 140 and the second loading buffer area 150 are respectively arranged on both sides of the unified loading device 340. The sample racks can be placed manually by the user or by a robot or other device on the unified loading device 340. The unified loading device 340 can store sample racks in a centralized manner.
[0097] The first feed channel 120 and the second feed channel 130 correspond to the first sample analyzer 20 and the second sample analyzer 30 respectively; the first feed channel 120 can be used to transport the sample rack to the first sample analyzer 20 for sampling and analysis. The second feed channel 130 can be used to transport the sample rack to the second sample analyzer 30 for sampling and analysis.
[0098] The first loading cache area 140 and the first unloading cache area 180 correspond to the first feeding channel 120 respectively, and the first sample analyzer 20 is located at one side of the first feeding channel 120, and the first sample analyzer 20 is close to the middle of the first feeding channel 120. The first loading cache area 140 and the first unloading cache area 180 can be located at the other side of the first feeding channel 120, and the first loading cache area 140 and the first unloading cache area 180 are respectively arranged at two ends close to the first feeding channel 120.
[0099] The first loading mechanism 160 can be used to transport the sample rack on the unified loading device 340 to the first loading buffer area 140. The first loading mechanism 160 can also be used to transport the sample rack from the first loading buffer area 140 to one end of the first feeding channel 120. The first unloading mechanism 190 is used to transport the sample rack on the first feeding channel 120 to the first unloading buffer area 180 for storage. Under the transportation of the first feeding channel 120, the sample rack can reach the sampling and analysis position of the first sample analyzer 20. After passing through the first sample analyzer 20, the sample rack can reach the other end of the first feeding channel 120, where the sample rack is moved to the first unloading buffer area 180 by the first unloading mechanism 190.
[0100] The second loading cache area 150 and the second unloading cache area 210 correspond to the second feeding channel 130 respectively, and the second sample analyzer 30 is located at one side of the second feeding channel 130, and the second sample analyzer 30 is close to the middle of the second feeding channel 130. The second loading cache area 150 and the second unloading cache area 210 can be located at the other side of the second feeding channel 130, and the second loading cache area 150 and the second unloading cache area 210 are respectively arranged at two ends close to the second feeding channel 130.
[0101] The second loading mechanism 170 can be used to transport the sample rack on the unified loading device 340 to the second loading buffer area 150. The second loading mechanism 170 can also be used to transport the sample rack from the second loading buffer area 150 to one end of the second feeding channel 130. The second unloading mechanism 220 is used to transport the sample rack on the second feeding channel 130 to the second unloading buffer area 210 for storage. Under the transportation of the second feeding channel 130, the sample rack can reach the sampling and analysis location of the second sample analyzer 30. After passing through the second sample analyzer 30, the sample rack can reach the other end of the second feeding channel 130 and be moved to the second unloading buffer area 210 by the second unloading mechanism 220.
[0102] The control method adopted by the sample analysis system of the second embodiment includes the following steps:
[0103] The unified loading device 340 receives a sample rack of samples to be tested. The sample rack can be placed manually by a user or placed on the unified loading device 340 by a robot or other device.
[0104] The first loading mechanism 160 and the second loading mechanism 170 load the sample racks of the samples to be tested from the unified loading device 340 to the first loading buffer area 140 and the second loading buffer area 150 respectively;
[0105] As a first possible situation, the sample rack is loaded into the first loading buffer area 140: the first loading mechanism 160 loads the sample rack into the first loading buffer area 140 from one side of the unified loading device 340, and the sample rack entering the first loading buffer area 140 can enter the analysis process of the first sample analyzer 20. The analysis process of the first sample analyzer 20 may include the following: the first loading mechanism 160 transports the sample rack on the first loading buffer area 140 to the first feeding channel 120 corresponding to the first sample analyzer 20. The first feeding channel 120 transports the sample rack to the first sample analyzer 20 for sampling and analysis, and the sample rack after sampling and analysis by the first sample analyzer 20 is transported to the end of the first feeding channel 120 by the first feeding channel 120, and the first unloading mechanism 190 transports the sample rack after passing through the first feeding channel 120 to the first unloading buffer area 180.
[0106] As a second possible situation, the sample rack is loaded into the second loading buffer area 150: the second loading mechanism 170 loads the sample rack into the second loading buffer area 1540 from the other side of the unified loading device 340, and the sample rack entering the second loading buffer area 150 can enter the analysis process of the second sample analyzer 30. The analysis process of the second sample analyzer 30 may include the following: the second loading mechanism 170 transports the sample rack from the second loading buffer area 150 to the second feeding channel 130, the second feeding channel 130 transports the sample rack to the second sample analyzer 30 for sampling and analysis, the sample rack after sampling and analysis by the second sample analyzer 30 is transported to the end of the second feeding channel 130 by the second feeding channel 130, and the second unloading mechanism 220 transports the sample rack after passing through the second feeding channel 130 to the second unloading buffer area 210.
[0107] It is understandable that the sample racks in the first loading buffer area 140 corresponding to the first sample analyzer 20 may be placed directly into the first loading buffer area 140 by a machine automatically or manually by an operator, in addition to coming from the unified loading device 340 .
[0108] Similarly, the sample racks in the second loading buffer area 150 corresponding to the second sample analyzer 30 may be placed directly into the second loading buffer area 150 by a machine automatically or manually by an operator, in addition to being placed from the unified loading device 340 .
[0109] Embodiment three:
[0110] like Figure 3 As shown, the sample analysis system of the present invention provides a third embodiment, and the difference between the third embodiment and the first or second embodiment is that:
[0111] A sample rack information detection device 360 is provided on one side of the unified loading device 340. The sample rack information detection device 360 is used to obtain the identification information of the sample rack on the unified loading device 340 and select to distribute the sample rack to the first feeding device corresponding to the first sample analyzer 20 and the second feeding device corresponding to the second sample analyzer 20 according to the identification information.
[0112] When the first feeding device and the second feeding device in the sample analysis system adopt the first specific solution in the first embodiment, that is, the first feeding device includes a first feeding channel 120 connected to one side of the unified loading device 340, and the second feeding device includes a second feeding channel 130 connected to the other side of the unified loading device 340. After the sample rack information detection device 360 obtains the identification information of the sample rack on the unified loading device 340, the unified loading device 340 selects to allocate the sample rack to the first feeding channel 120 and the second feeding channel 130 according to the identification information.
[0113] When the first feeding device and the second feeding device in the sample analysis system adopt the second specific scheme in Example 1, after the sample rack information detection device 360 obtains the identification information of the sample rack on the unified loading device 340, the unified loading device 340 selects to allocate the sample rack to the first loading buffer area 140 and the second loading buffer area 150 according to the identification information, so that the sample rack is loaded into the first loading buffer area 140 or the second loading buffer area 150.
[0114] The control method adopted by the sample analysis system of the third embodiment, based on the first or second embodiment, further includes the following steps:
[0115] Before the unified loading device 340 loads the sample rack of the sample to be detected into the first loading buffer area 140 and the second loading buffer area 150 respectively, it also includes obtaining the identification information of the sample rack on the unified loading device 340, and loading the sample rack into the first loading buffer area 140 and the second loading buffer area 150 according to the identification information. The identification process can be performed by scanning the barcode or QR code of the sample rack through a camera, or by identifying the preset different color marks of the sample rack through a color recognition device.
[0116] Specifically, the identification information includes identifying whether the sample in the sample rack in the unified loading device 340 is sampled and analyzed by the first sample analyzer 20 or the second sample analyzer 30. The system can allocate the sample rack to the first loading buffer area 140 or the second loading buffer area 150 according to the detection items of the sample. If, according to the identification information, the sample is sampled by the first sample analyzer 20, the corresponding sample rack will be transferred to the first loading buffer area 140. If, according to the identification information, the sample is sampled and analyzed by the second sample analyzer 30, the corresponding sample rack will be transferred to the second loading buffer area 150.
[0117] As a first case, corresponding to the sample analysis system in the first embodiment, according to the identification information, the unified loading device 340 transports the sample rack to the corresponding loading buffer area. That is, the identification information determines whether the sample rack enters one of the first loading buffer area 140 and the second loading buffer area 150, and accordingly, the unified loading device 340 loads the sample rack into one of the first loading buffer area 140 and the second loading buffer area 150. If the sample rack enters the first loading buffer area 140, the sample rack can enter the analysis process of the first sample analyzer 20. If the sample rack enters the second loading buffer area 140, the sample rack can enter the analysis process of the second sample analyzer 30.
[0118] As a second case, corresponding to the sample analysis system in the second embodiment, according to the identification information, the first loading mechanism 160 and the second loading mechanism 170 load the sample rack of the sample to be detected from the unified loading device 340 to the first loading buffer area 140 and the second loading buffer area 150; that is, the identification information determines whether the sample rack enters one of the first loading buffer area 140 and the second loading buffer area 150, and accordingly, the first loading mechanism 160 loads the sample rack from the unified loading device 340 to the first loading buffer area 140, or the second loading mechanism 170 loads the sample rack from the unified loading device 340 to the second loading buffer area 150. If the sample rack enters the first loading buffer area 140, the sample rack entering the first loading buffer area 140 can enter the analysis process of the first sample analyzer 20. If the sample rack enters the second loading buffer area 140, the sample rack entering the second loading buffer area 150 can enter the analysis process of the second sample analyzer 30.
[0119] Embodiment 4:
[0120] The sample analysis system of the present invention provides a fourth embodiment, and the fourth embodiment differs from the first to third embodiments only in that:
[0121] The first loading buffer area 140 and the second loading buffer area 150 are respectively provided with a quantity detection device, and the quantity detection device is used to detect the number of sample racks in the first loading buffer area 140 and the second loading buffer area 150 or the number of sample racks that can be currently accommodated. The system will preferentially transfer sample racks to the loading buffer area where the number of sample racks is relatively small or the number of sample racks is less than the set value, or the system will preferentially transfer sample racks to the loading buffer area where the number of sample racks that can currently be accommodated is large or the number of sample racks that can currently be accommodated is greater than the set value. That is, according to the loading conditions of the first loading buffer area 140 and the second loading buffer area 150, it is determined whether the sample rack enters one of the first loading buffer area 140 and the second loading buffer area 150, so that resources can be reasonably used and the detection and analysis efficiency is improved.
[0122] The control method adopted by the sample analysis system of the fourth embodiment, based on any one of the first to third embodiments, further includes the following steps:
[0123] Identify the number of sample racks in the first loading buffer area 140 and the second loading buffer area 150;
[0124] The method for identifying the number of sample racks in the loading buffer area (the first loading buffer area 140 and the second loading buffer area 150) includes the following steps:
[0125] Sensors are arranged at both ends of the loading buffer area, and the sensors form detection areas at both ends of the loading buffer area for detecting the sample rack;
[0126] Calculate the maximum number of sample racks stored in the loading buffer area according to the distance between the two detection areas;
[0127] Control the loading mechanism to push the sample rack in the loading buffer area to move toward one end of the loading buffer area. When the sample rack enters the detection area of the sensor, the sensor sends a signal to control the loading mechanism to stop moving.
[0128] Then the loading mechanism is controlled to push the sample rack to move toward the other end of the loading buffer area. When the sample rack enters the detection area of the sensor at the other end of the loading buffer area, the sensor sends a signal to control the loading mechanism to stop moving.
[0129] The number of current sample racks in the loading buffer area can be obtained according to the movement distance of the loading mechanism between the two detection areas and the maximum storage number of sample racks in the loading buffer area.
[0130] After identifying the number of sample racks in each loading buffer area, if the number of sample racks in a certain loading buffer area is relatively small or less than a set value, the loading mechanism corresponding to the loading buffer area can preferentially transfer the sample racks to the loading buffer area, so that the number of sample racks in each loading buffer area matches the sampling and analysis efficiency of each sample analyzer.
[0131] Embodiment five:
[0132] During the actual detection process, when there are special samples that need to be manually tested, such as samples without barcodes, retest samples, trace blood samples, etc., manual injection can be performed by triggering emergency actions. To this end, different from the first four embodiments, the sample transfer device also includes a first manual injection device 50.
[0133] The first manual injection device 50 corresponds to the first feeding channel 120 , and the first manual injection device 50 and the first sample analyzer 20 can be disposed on both sides of the first feeding channel 120 . The first manual injection device 50 is located between the first loading buffer area 140 and the first unloading buffer area 180 .
[0134] The first manual sample injection device 50 can be an open sample injection device or a closed sample injection device. The open sample injection device has an extendable sample suction needle, and the operator can manually shake the sample and hold the test tube containing the sample to the corresponding position of the sample suction needle. The sample suction needle can directly pierce the sample cover and suck the sample, or the sample suction needle can be directly inserted into a test tube without a sample cover to suck the sample, which provides convenience for emergency testing. The closed sample injection device has a built-in sample suction needle, and the sample is clamped by a built-in clamping device and shaken by the clamping device. The built-in sample suction needle samples the sample clamped by the clamping device.
[0135] The first manual sampling device 50 and the automatic sampling device corresponding to the first sample analyzer 20 can use the same sample suction needle, that is, the sample suction needle can move between the manual sampling position and the automatic sampling position, and the manual sampling and automatic sampling use the same path. The same sample suction needle has the same sample suction volume during manual sampling and automatic sampling, so only one calibration and test work is required, which simplifies the operation process and ensures the consistency of the analysis results. If two sample suction needles are used to inject samples through two paths, two calibrations are required, which is not conducive to ensuring the consistency of the analysis results.
[0136] In this embodiment, Figure 4 As shown, the first manual sample injection device 50 includes a sample chamber 51 and a translation mechanism 52, the sample chamber 51 is provided with a receiving cavity for accommodating a sample container, the translation mechanism 52 includes a sample chamber mounting base 5206 and a driving assembly, the sample chamber 51 is mounted on the sample chamber mounting base 5206, and the driving end of the driving assembly is connected to the sample chamber mounting base 5206 to drive the sample chamber mounting base 5206 to move horizontally, and is used to drive the sample chamber 51 to move horizontally between the sample container manual loading position and the manual sampling area S of the sample analyzer. The sample container manual loading position is set on a side away from the sample analyzer 20, so as to facilitate operators to take and place sample containers.
[0137] The control method adopted by the sample analysis system of the fifth embodiment includes the following steps:
[0138] In specific applications, when an open sampling device is configured and an emergency action is triggered, the emergency action has a higher priority. The operator can move the sample to be tested to the sample suction needle of the open sampling device in the first sample analyzer 20, and the sample suction needle is inserted into the sample to be tested and starts the sample suction; the first sample analyzer 20 can analyze the sample.
[0139] When a closed sampling device is configured and the emergency action is triggered, the door of the closed sampling device in the first sample analyzer 20 is opened, the operator places the sample to be tested in the closed sampling device, inserts the sample suction needle into the sample to be tested and starts the sample suction, and the first sample analyzer 20 can analyze the sample.
[0140] Embodiment six:
[0141] During the actual detection process, when there are special samples that need to be manually tested, such as samples without barcodes, re-test samples, trace blood samples, etc., manual injection can be performed by triggering emergency actions. To this end, the sample analysis system of the present invention provides a sixth embodiment, and the difference between the sixth embodiment and the previous five embodiments is that the sample transfer device also includes a second manual injection device 60, and the structure of the second manual injection device 60 can be the same as the first manual injection device 50 in Example 5. The second manual injection device 60 corresponds to the second feed channel 130, and the second manual injection device 60 is located between the second loading buffer area 150 and the second unloading buffer area 210.
[0142] The second manual sample injection device 60 is an open sample injection device or a closed sample injection device.
[0143] In specific applications, when an open sampling device is configured, an emergency action is triggered, and the emergency action has a higher priority. The operator can move the sample to be tested to the sample suction needle of the open sampling device in the second sample analyzer 30, and the sample suction needle is inserted into the sample to be tested and starts the sample suction; the second sample analyzer 30 can analyze the sample.
[0144] Alternatively, when a closed sampling device is configured, an emergency action is triggered, the door of the closed sampling device in the second sample analyzer 30 is opened, and the operator places the sample to be tested in the closed sampling device, and the second sample analyzer 30 can analyze the sample.
[0145] The second manual sampling device 60 and the automatic sampling device corresponding to the second sample analyzer 30 can use the same sampling component to absorb samples. The sampling component can be a reciprocating sampling needle, that is, the sampling component can move between the manual sampling position and the automatic sampling position. Manual sampling and automatic sampling use the same path. The same sampling component has the same sample suction volume during manual sampling and automatic sampling. Therefore, only one calibration and test work is required, which simplifies the operation process and ensures the consistency of the analysis results. If two sampling components (sampling needles) are used to inject samples through two paths, two calibrations are required, which is not conducive to ensuring the consistency of the analysis results.
[0146] Embodiment seven:
[0147] The sample analysis system of the present invention provides a seventh embodiment, which differs from the first to sixth embodiments only in that:
[0148] like Figure 1As shown, the first feed channel 120 can be a unidirectional transmission channel. Preferably, the first feed channel 120 is a bidirectional transmission channel, and the first feed channel 120 can transport the sample rack in both positive and negative directions. The forward direction of the first feed channel 120 is defined as the direction from the first loading buffer area 140 to the first unloading buffer area 180. In this way, the first feed channel 120 can also be used to reversely transport the sample rack that has been analyzed by the first sample analyzer 20 to the first sample analyzer 20 for secondary analysis, which can be used for re-inspection. When the first feed channel 120 is a bidirectional transmission channel, the first unloading mechanism 190 is also used to transport the sample rack on the first unloading buffer area 180 to the first feed channel 120. If the test result of the sample analyzed by the first sample analyzer 20 meets the re-inspection trigger condition (for example, the test result is abnormal, etc.), the first feed channel 120 can be reversely moved to transport the sample rack to the sampling analysis location of the first sample analyzer 20 for secondary analysis, thereby realizing the operation of re-inspecting the sample in the same sample analyzer.
[0149] The control method adopted by the sample analysis system of the seventh embodiment includes the following steps:
[0150] When the sample detected by the first sample analyzer 20 needs to be re-tested in the first sample analyzer 20 , the first feeding channel 120 moves in the reverse direction to transport the detected sample to the first sample analyzer 20 for secondary analysis.
[0151] As a first possible situation in the secondary analysis of the first sample analyzer 20: before the sample reaches the first unloading buffer area 180, the sample can be directly sent back to the first sample analyzer 20 through the first feed channel 120, and the first sample analyzer 20 performs secondary analysis on the sample.
[0152] As the second possible situation in the secondary analysis of the first sample analyzer 20: before the sample reaches the first unloading buffer area 180, the sample can be directly sent back to the starting end of the first feed channel 120 through the first feed channel 120 in the reverse direction, and the first feed channel 120 then sends the sample forward to the first sample analyzer 20, and the first sample analyzer 20 performs secondary analysis on the sample.
[0153] As a third possible situation in the secondary analysis of the first sample analyzer 20: after the sample arrives at the first unloading buffer area 180, the first unloading mechanism 190 transports the corresponding sample rack on the first unloading buffer area 180 to the first feed channel 120, and returns the sample to the first sample analyzer 20 through the first feed channel 120, and the first sample analyzer 20 performs secondary analysis on the sample.
[0154] As a fourth possible situation in the secondary analysis of the first sample analyzer 20: after the sample arrives at the first unloading buffer area 180, the first unloading mechanism 190 transports the corresponding sample rack on the first unloading buffer area 180 to the first feeding channel 120, and directly reversely sends the sample back to the starting end of the first feeding channel 120 through the first feeding channel 120, and the first feeding channel 120 then forwardly sends the sample to the front of the first sample analyzer 20, and the first sample analyzer 20 performs secondary analysis on the sample. Of course, it can be understood that there are other possible situations for the first sample analyzer 20 to perform secondary analysis, such as the sample rack retreating to the first loading buffer area 140 and then re-entering the first feeding channel 120.
[0155] Embodiment eight:
[0156] like Figure 1 As shown, the sample analysis system of the present invention provides an eighth embodiment, and the eighth embodiment differs from the first to seventh embodiments only in that:
[0157] The second feed channel 130 may be a unidirectional transmission channel. Preferably, the second feed channel 130 is a bidirectional transmission channel, and the second feed channel 130 may transport the sample rack in both forward and reverse directions. The forward direction of the second feed channel 130 is defined as the direction from the second loading buffer area 150 to the second unloading buffer area 210. The second feed channel 130 may be used to reversely transport the sample rack that has been analyzed by the second sample analyzer 30 to the second sample analyzer 30 for secondary analysis. When the second feed channel 130 is a bidirectional transmission channel, the second unloading mechanism 220 may also be used to transport the sample rack on the second unloading buffer area 210 to the second feed channel 130. If the test result of the sample analyzed by the second sample analyzer 30 reaches the trigger condition, the sample rack may be transported to the second sample analyzer 30 for secondary analysis by the reverse movement of the second feed channel 130, thereby realizing the operation of retesting the sample in the same sample analyzer.
[0158] The control method adopted by the sample analysis system of the eighth embodiment includes the following steps:
[0159] When the sample analyzed by the second sample analyzer 30 needs to be re-tested in the second sample analyzer 30 , the second feed channel 130 moves in the reverse direction to transport the tested sample to the second sample analyzer 30 for secondary analysis.
[0160] As a first possible situation in the secondary analysis of the second sample analyzer 30: before the sample reaches the second unloading buffer area 210, the sample can be directly sent back to the second sample analyzer 30 through the second feed channel 130, and the second sample analyzer 30 performs secondary analysis on the sample.
[0161] As a second possible situation in the secondary analysis of the second sample analyzer 30: before the sample reaches the second unloading buffer area 210, the sample can be directly sent back to the starting end of the second feed channel 130 through the second feed channel 130, and the second feed channel 130 then sends the sample forward to the second sample analyzer 30, and the second sample analyzer 30 performs secondary analysis on the sample.
[0162] As a third possible situation in the secondary analysis of the second sample analyzer 30: after the sample arrives at the second unloading buffer area 210, the second unloading mechanism 220 transports the corresponding sample rack on the second unloading buffer area 210 to the second feed channel 130, and returns the sample to the second sample analyzer 30 through the second feed channel 130, and the second sample analyzer 30 performs secondary analysis on the sample.
[0163] As a fourth possible situation in the secondary analysis of the second sample analyzer 30: after the sample arrives at the second unloading buffer area 210, the second unloading mechanism 220 transports the corresponding sample rack on the second unloading buffer area 210 to the second feed channel 130, and reversely sends the sample back to the starting end of the second feed channel 130 through the second feed channel 130, and the second feed channel 130 then forwards the sample to the front of the second sample analyzer 30, and the second sample analyzer 30 performs secondary analysis on the sample.
[0164] Embodiment nine:
[0165] like Figure 5 As shown, the first loading mechanism 160 in the sample analysis system of the present invention includes: a bracket 161, a push claw 162 and a push claw driving device 163, the bracket 161 is used to support the first loading mechanism 160, and the push claw driving device 163 is arranged on the bracket 161, and is used to drive the push claw 162 to drive the sample rack stored in the first loading buffer area 140 to slide toward the first feed channel 120.
[0166] Please combine Figure 6As shown, the first loading buffer area 140 in the sample analysis system of the present invention includes a panel 141 for carrying a sample rack, and a long hole 142 is provided on the panel 141. The push claw driving device 163 of the first loading mechanism 160 includes: a horizontal pushing component 1631, a push claw mounting seat 1632 and a lifting component 1633. The horizontal pushing component 1631 is arranged on the bracket 161 and can move horizontally relative to the bracket 161. The push claw mounting seat 1632 is linked with the horizontal pushing component 1631, and the horizontal pushing component 1631 can drive the push claw mounting seat 1632 to move horizontally. The lifting component 1633 is arranged on the push claw mounting base 1632, and the push claw 162 is arranged on the lifting component 1633. The lifting component 1633 drives the push claw 162 to rise, so that the push claw 162 at least partially passes through the long hole 142 on the panel 141 and cooperates with the bottom of the sample rack. The horizontal pushing component 1631 can drive the push claw mounting base 1632 to move horizontally, and then the push claw 162 drives the sample rack to slide on the panel 141 toward the first feeding channel 120.
[0167] As a preferred embodiment, the horizontal pushing assembly 1631 can be a motor synchronous belt drive structure, which uses the motor to drive the synchronous belt to rotate, thereby driving the push claw mounting seat 1632 to perform horizontal movement. Of course, the horizontal pushing assembly 1631 can also be a linear motor, and the primary drive of the linear motor drives the push claw mounting seat 1632 to perform horizontal linear movement. In order to ensure that the push claw mounting seat 1632 can operate stably, a linear guide rail 164 can also be installed on the bracket 161, and the push claw mounting seat 1632 can be slidably installed on the linear guide rail 164. The lifting assembly 1633 can use a lifting cylinder, fix the cylinder body of the lifting cylinder on the push claw mounting seat 1632, and fix the push claw 162 to the piston rod of the lifting cylinder, and drive the lifting and lowering movement of the push claw 162 by controlling the piston rod of the lifting cylinder.
[0168] In the above embodiment, the lifting assembly 1633 is used to drive the push claw 162 to approach the sample rack so that the push claw 162 and the sample rack are in abutment with each other. It is understandable that other forms of abutment assemblies can be used to replace the lifting assembly to drive the push claw to abut the sample rack. For example, the abutment assembly can drive the push claw to approach from both sides of the sample rack to the middle so that the push claw clamps the sample rack from both sides of the sample rack, thereby making the push claw and the sample rack abut with each other. When the push claw mounting seat moves horizontally, the push claw can drive the sample rack to slide on the panel toward the first feeding channel 120.
[0169] Furthermore, in order to locate the position of the push claw 162, a position sensor 165 is provided on the bracket 161, and the position sensor 165 can cooperate with the push claw mounting seat 1632 or the push claw 162 to enable the system controller to obtain the movement position of the push claw 162. The position sensor 165 is preferably an optical coupler, and an optical coupler sheet is provided on the push claw mounting seat 1632. When the push claw mounting seat 1632 moves to be close to the first feeding channel 120, the optical coupler sheet interacts with the optical coupler to cause the optical coupler to send an induction signal, so that the system controller can determine the position of the push claw 162.
[0170] The above only describes the structure of one embodiment of the first loading mechanism 160 in the sample analysis system of the present invention. It is understandable that the first loading mechanism 160 can also be a manipulator structure. In fact, the first unloading mechanism 190, the second loading mechanism 170 and the second unloading mechanism 220 in the sample analysis system of the present invention can also adopt the same structure as the first loading mechanism 160.
[0171] It should be noted that the sample holder 40 has a structure that can cooperate with the push claw 162, such as Figure 6 As shown, the bottom of the sample rack 40 is provided with bottom grooves 401 at intervals. When the push claw 162 extends upward from the long hole 142 on the panel 141, it can be inserted into the bottom groove 401 at the bottom of the sample rack 40, thereby driving the sample rack 40 to move synchronously. In the prior art, there is a bending edge structure on one side of the panel of the loading buffer area, so that the card slot on one side of the sample rack is stuck in the bending edge structure to prevent the sample rack from tipping over during movement. Due to the existence of the bending edge structure, the sample rack can only be pushed into the loading buffer area from one side of the panel. If the sample rack is directly placed downward from the top of the loading buffer area, one end of the sample rack will fall on the bending edge structure, so that the sample rack is located on the panel with one end high and the other end low. When the push claw pushes the sample rack, it is easy to cause the sample rack to tip over. In the embodiment of the present invention, guide side walls are provided on both sides of the panel. The guide side walls have no bent edge structure. The two guide side walls form a placement opening that opens upward. The placement opening that opens upward enables the sample rack to be directly placed on the panel from top to bottom, and the guide side walls can limit the sample rack from both ends. At the same time, since the height of the push claw 162 is set to just abut against the bottom of the sample rack 40, it can be ensured that the sample rack is not easy to tip over during the movement. Of course, the push claw 162 can also push the sample rack 40 to slide on the panel 141 from the front and back sides of the bottom of the sample rack 40. In addition, the sample analysis system of the present invention can be used for both Figure 7 The sample rack 40 carrying the elongated bottle shown in the figure can be used for sampling and analysis, and the sample rack 40 carrying a small amount of blood can also be used for sampling and analysis, such as Figure 8 As shown, the sample rack 40 is provided with a socket 402 capable of accommodating a micro-tube, and a barcode pasting area 403 is also provided on the sample rack 40 corresponding to the socket 402 of each micro-tube.
[0172] when Figure 7 and Figure 8 Before the sample rack 40 shown in the figure enters the sample analyzer for sampling and analysis, the sample analyzer needs to scan the barcode of the test tube on the sample rack 40 to obtain the sampling and analysis task of the corresponding sample. Therefore, a scanning hole 404 is opened on the side wall of the sample rack 40 corresponding to each test tube placement hole, so that the scanner can scan the barcode attached to the test tube. However, if the sample rack 40 enters the first feeding channel 120 in the opposite direction, the scanning hole 404 opened on the sample rack 40 will face away from the scanner, so that the scanner cannot scan the barcode on the test tube, and the first sample analyzer 20 cannot perform sampling and analysis on the sample in the sample rack 40. Figure 7 and Figure 8 As shown, in order to prevent the sample rack 40 from reversely entering the first feed channel 120, a first loading position detector 121 is provided on the side of the first feed channel 120 facing the first loading buffer area 140. The first loading position detector 121 is used to detect the direction of the sample rack 40 entering the first feed channel 120 from the first loading buffer area 140. When the sample rack 40 enters the first feed channel 120 in a forward placement manner, the first loading position detector 121 detects that the placement direction of the sample rack 40 is correct, and the first feed channel 120 will send the sample rack 40 into the first sample analyzer 20; otherwise, the first feed channel 120 will not send the reversely placed sample rack 40 into the first sample analyzer 20, and send an alarm signal to remind the operator.
[0173] Furthermore, a first direction identification mechanism 122 is provided on the side of the first feed channel 120 facing the first loading buffer area 140. The first direction identification mechanism 122 is used to cooperate with the sample rack 40. When the sample rack 40 placed in the correct direction enters the first feed channel 120 from the first loading buffer area 140, the first direction identification mechanism 122 enables the sample rack 40 to trigger the first loading in place detector 121; otherwise, the first direction identification mechanism 122 restricts the sample rack 40 from triggering the first loading in place detector 121.
[0174] Specifically, Figure 6 and Figure 7 As shown, a protrusion 405 is provided on the bottom of the sample rack 40 and the same side as the scanning hole 404 on the sample rack 40; Fig. 9As shown, the first direction identification mechanism 122 is a first direction identification step arranged toward the first loading buffer area 140, and a gap capable of accommodating the protrusion 405 on the sample rack 40 is reserved below the first direction identification step. The first loading position detector 121 is a micro switch arranged on one side of the first direction identification step. If the sample rack 40 is placed in the first loading buffer area 140 in the correct direction, the protrusion 405 and the scanning hole 404 on the sample rack 40 are both facing the first feeding channel 120 and the scanner. When the sample rack 40 is transported from the first loading buffer area 140 to the first feeding channel 120, the protrusion 405 on the sample rack 40 will enter the gap below the first direction identification step, and at the same time, the protrusion 405 will trigger the micro switch, which sends a detection signal to the system controller, and then controls the first feeding channel 120 to transport the sample rack 40 to the first sample analysis for sampling and analysis. If the sample rack 40 is placed in the first loading buffer area 140 in reverse, the protrusion 405 and the scanning hole 404 on the sample rack 40 will face away from the first feeding channel 120 and the scanner. When the sample rack 40 is transported from the first loading buffer area 140 to the first feeding channel 120, the first direction identification step will press against the side of the sample rack 40, and the micro switch will not be triggered by the sample rack 40. Then, the system controller will not control the first feeding channel 120 to transport the sample rack 40 to the first sample analyzer 20, and will send out an alarm signal to remind the operator.
[0175] In addition to the specific structure of the first direction identification mechanism provided in the above embodiment, other forms can also be used to realize the identification of the direction of the sample rack, such as using a magnetic structure for direction identification, setting magnets with opposite poles on both sides of the sample rack, and setting magnets in the feed channel and the fast channel as direction identification mechanisms. When the placement direction of the sample rack is correct, the magnetic poles of the magnets of the sample rack facing the direction identification mechanism are different from the magnetic poles of the direction identification mechanism, and the sample rack will be adsorbed by the direction identification mechanism and enter the feed channel; if the placement direction of the sample rack is wrong, the magnetic poles of the magnets of the sample rack facing the direction identification mechanism are the same as the magnetic poles of the direction identification mechanism, and the sample rack is pushed out of the feed channel under the repulsive effect of the magnetic force, and the feed channel cannot transport the sample rack. The specific form that the direction identification mechanism can adopt in this application is not unique, as long as the mechanism that can realize the identification of the placement direction of the sample rack is within the protection scope of this application.
[0176] like Fig.10As shown, when the first loading mechanism 160 is required to transport the sample rack in the first loading buffer area 140 to the first feeding channel 120, firstly, the push claw is driven to move from under the panel of the first loading buffer area 140 carrying the sample rack to the side of the sample rack away from the first feeding channel 120, and the position where the push claw of the first loading buffer area 140 stops serves as the positive loading starting position of the first loading mechanism 160. The push claw is controlled to extend from the long hole on the panel at the positive loading starting position and then translate to the side close to the first feeding channel 120. The push claw pushes several sample racks in the first loading buffer area 140 to slide toward the first feeding channel 120 together. When a sample rack close to the side of the first feeding channel 120 enters the first feeding channel 120, the sample rack triggers the first loading mechanism 160 in the first feeding channel 120. After the sample rack is loaded into the position detector 121, the push claw stops pushing toward the first feeding channel 120, then the push claw drops to the bottom of the panel and moves to the junction of the first feeding channel 120 and the first loading buffer area 140. This position serves as the positive loading separation position of the first loading mechanism 160. The push claw is controlled to rise upward at the positive loading separation position and insert into the bottom groove at the bottom of the sample rack adjacent to the first feeding channel 120. Then, the push claw is driven to move away from the first feeding channel 120, so that a certain gap is generated between the sample rack in the first loading buffer area 140 and the sample rack in the first feeding channel 120. The gap forms a safety position. Then, the push claw separates from the sample rack and moves to the safety position and rises above the panel. The safety position is also the position where the push claw stops after each positive loading of the first loading mechanism 160 is completed. The purpose of setting the safety position is based on two considerations. One is to make the push claw return to a fixed position after each pushing work is completed and stay above the panel, so that the push claw is in a position that the operator can observe when it is not working, to prevent the operator from placing the sample rack above the push claw, causing the push claw to flip the upper sample rack when it rises upward; the other consideration is to make the push claw occupy the intersection of the first feed channel 120 and the first loading buffer area 140 when it is not working, to prevent the operator from placing the sample rack at the intersection of the first feed channel 120 and the first loading buffer area 140, causing the first feed channel 120 to stick to the sample rack in the first loading buffer area 140 when transporting the sample rack.
[0177] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions or improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.
Claims
1. A sample analysis system, characterized in that: comprising a sample transfer device, a first sample analyzer and a second sample analyzer, The sample transfer device comprises: a first feeding device and a second feeding device, wherein the first feeding device and the second feeding device respectively feed the sample rack into the first sample analyzer and the second sample analyzer for sampling and analysis; a first unloading buffer area, the first unloading buffer area corresponding to the first feeding device, and used to receive the sample rack passing through the first feeding device; a second unloading buffer area, the second unloading buffer area corresponds to the second feeding device and is used to receive the sample rack passing through the first feeding device; A unified loading device, used for loading sample racks into the first feeding device and the second feeding device, the unified loading device uniformly loads and transfers the sample racks on the same loading platform; the first feeding device and the second feeding device are respectively arranged on both sides of the unified loading device; wherein the first feeding device comprises a first feeding channel, the second feeding device comprises a second feeding channel, and the first feeding channel and the second feeding channel are respectively arranged on both sides of the unified loading device; A first unloading mechanism and a second unloading mechanism, wherein the first unloading mechanism is used to transport the sample rack on the first feeding device to the first unloading buffer area for storage; and the second unloading mechanism is used to transport the sample rack on the second feeding device to the second unloading buffer area for storage.
2. A sample analysis system as claimed in claim 1, characterized in that: The first feed channel is connected to the unified loading device and the first unloading buffer area, the second feed channel is connected to the unified loading device and the second unloading buffer area, the unified loading device is used to load sample racks into the first feed channel and the second feed channel, the first unloading mechanism is used to transport the sample racks on the first feed channel to the first unloading buffer area for storage, and the second unloading mechanism is used to transport the sample racks on the second feed channel to the second unloading buffer area for storage; or, The first feeding device includes a first feeding channel, a first loading buffer area and a first loading mechanism, the second feeding device includes a second feeding channel, a second loading buffer area and a second loading mechanism, the first loading buffer area and the second loading buffer area are arranged on both sides of the unified loading device, the first feeding channel is connected to the first loading buffer area and the first unloading buffer area, the second feeding channel is connected to the second loading buffer area and the second unloading buffer area, the unified loading device is used to load sample racks into the first loading buffer area and the second loading buffer area, the first loading mechanism is used to transport the sample racks stored in the first loading buffer area to the first feeding channel; the second loading mechanism is used to transport the sample racks stored in the second loading buffer area to the second feeding channel, the first unloading mechanism is used to transport the sample racks on the first feeding channel to the first unloading buffer area for storage, and the second unloading mechanism is used to transport the sample racks on the second feeding channel to the second unloading buffer area for storage.
3. A sample analysis system, characterized in that: comprising a sample transfer device, a first sample analyzer and a second sample analyzer, The sample transfer device comprises: a first feed channel and a second feed channel, wherein the first feed channel and the second feed channel correspond to the first sample analyzer and the second sample analyzer, respectively; a first loading cache area and a first unloading cache area, wherein the first loading cache area and the first unloading cache area correspond to the first feeding channel respectively; a second loading cache area and a second unloading cache area, the second loading cache area and the second unloading cache area respectively corresponding to the second feed channel; A unified loading device, used for receiving sample racks to be allocated to the first loading buffer area and the second loading buffer area, and the unified loading device uniformly loads and transfers the sample racks on the same loading platform; the first loading buffer area and the second loading buffer area are arranged on both sides of the unified loading device, and the first feeding channel and the second feeding channel are arranged on both sides of the unified loading device; A first loading mechanism and a second loading mechanism, wherein the first loading mechanism is used to transport the sample rack of the unified loading device to the first loading buffer area, and the first loading mechanism is also used to transport the sample rack stored in the first loading buffer area to the first feeding channel; the second loading mechanism is used to transport the sample rack of the unified loading device to the second loading buffer area, and the second loading mechanism is also used to transport the sample rack stored in the second loading buffer area to the second feeding channel; A first unloading mechanism and a second unloading mechanism, wherein the first unloading mechanism is used to transport the sample rack on the first feeding channel to the first unloading buffer area for storage; and the second unloading mechanism is used to transport the sample rack on the second feeding channel to the second unloading buffer area for storage.
4. A sample analysis system according to claim 2 or 3, characterized in that: A sample rack information detection device is provided on one side of the unified loading device, and the sample rack information detection device is used to obtain the identification information of the sample rack on the unified loading device and select to allocate the sample rack to the first loading buffer area or the first feeding channel and the second loading buffer area or the second feeding channel according to the identification information.
5. A sample analysis system according to claim 2 or 3, characterized in that: The sample transfer device further comprises a manual sample injection device, which corresponds to the first feeding channel and is an open sample injection device or a closed sample injection device.
6. A sample analysis system according to claim 2 or 3, characterized in that: The sample transfer device further comprises a manual sample injection device, which corresponds to the second feeding channel and is an open sample injection device or a closed sample injection device.
7. A sample analysis system according to claim 2 or 3, wherein the first feeding channel is a bidirectional transmission channel, and the first unloading mechanism is further used to transport the sample rack on the first unloading buffer area to the first feeding channel.
8. A sample analysis system according to claim 2 or 3, characterized in that: The second feeding channel is a bidirectional transmission channel, and the second unloading mechanism is also used to transport the sample rack on the second unloading buffer area to the second feeding channel.
9. A sample analysis system according to claim 2 or 3, characterized in that: The first loading buffer area and the second loading buffer area are respectively provided with a quantity detection device, and the quantity detection device is used to detect the number of sample racks in the first loading buffer area and the second loading buffer area or the number of sample racks that can be currently accommodated.
10. A sample analysis system control method, characterized in that: The unified loading device loads the sample racks of the samples to be tested to the first feeding device corresponding to the first sample analyzer and the second feeding device corresponding to the second sample analyzer respectively; the unified loading device uniformly loads and transfers the sample racks on the same loading platform; wherein the first feeding device includes a first feeding channel, the second feeding device includes a second feeding channel, and the first feeding channel and the second feeding channel are respectively arranged on both sides of the unified loading device; The first feeding device transports the sample rack to the first sample analyzer for sampling and analysis; The first unloading mechanism transports the sample rack after passing through the first feeding device to the first unloading buffer area; or / and: The second feeding device transports the sample rack to the second sample analyzer for sampling and analysis; The second unloading mechanism transports the sample rack after passing through the second feeding device to the second unloading buffer area; Wherein, the first feeding device includes a first loading cache area, the second feeding device includes a second loading cache area, and the first loading cache area and the second loading cache area are arranged on both sides of the unified loading device.
11. A sample analysis system control method according to claim 10, characterized in that: The unified loading device loads the sample rack into the first feeding channel of the first feeding device and the second feeding channel of the second feeding device, the first feeding channel transports the sample rack to the first sample analyzer for sampling and analysis, and the second feeding channel transports the sample rack to the second sample analyzer for sampling and analysis; Alternatively, the unified loading device loads the sample rack into the first buffer area of the first feeding device, and the first loading mechanism of the first feeding device transports the sample rack on the first loading buffer area to the first feeding channel corresponding to the first sample analyzer; the unified loading device loads the sample rack into the second buffer area of the second feeding device, and the second loading mechanism of the second feeding device transports the sample rack on the second loading buffer area to the second feeding channel corresponding to the second sample analyzer, the first feeding channel transports the sample rack to the first sample analyzer for sampling and analysis, and the second feeding channel transports the sample rack to the second sample analyzer for sampling and analysis.
12. A sample analysis system control method, characterized in that: The unified loading device receives the sample racks of the samples to be tested; the unified loading device uniformly loads and transfers the sample racks on the same loading platform; The first loading mechanism and the second loading mechanism load the sample racks of the samples to be tested from the unified loading device to the first loading buffer area and the second loading buffer area respectively; The first loading mechanism transports the sample rack on the first loading buffer area to the first feeding channel corresponding to the first sample analyzer; The first feeding channel transports the sample rack to the first sample analyzer for sampling and analysis; The first unloading mechanism transports the sample rack after passing through the first feeding channel to the first unloading buffer area; or / and: The second loading mechanism transports the sample rack on the second loading buffer area to a second feeding channel corresponding to the second sample analyzer, and the second feeding channel transports the sample rack to the second sample analyzer for sampling and analysis; The second unloading mechanism transports the sample rack after passing through the second feeding channel to the second unloading buffer area; Wherein, the first loading cache area and the second loading cache area are arranged on both sides of the unified loading device, and the first feeding channel and the second feeding channel are arranged on both sides of the unified loading device.
13. A sample analysis system control method according to claim 11 or 12, characterized in that: Before the unified loading device loads the sample rack of the sample to be tested into the first loading buffer area or the first feeding channel and the second loading buffer area or the second feeding channel respectively, it also includes obtaining the identification information of the sample rack on the unified loading device, and loading the sample rack into the first loading buffer area and the second loading buffer area according to the identification information.
14. A sample analysis system control method according to claim 13, characterized in that: The identification information includes identifying whether the samples in the sample rack in the unified loading device are sampled and analyzed by the first sample analyzer or the second sample analyzer.
15. A sample analysis system control method according to claim 11 or 12, characterized in that: When the tested sample needs to be retested, the first feed channel moves in the opposite direction to transport the tested sample to the first sample analyzer for secondary analysis; or / and, the second feed channel moves in the opposite direction to transport the tested sample to the second sample analyzer for secondary analysis.
16. A sample analysis system control method according to claim 10 or 12, characterized in that: The method further comprises: when the emergency action is triggered, the sample to be tested is moved to the sample aspirating needle of the open sampling device in the first sample analyzer, the sample aspirating needle is inserted into the sample to be tested and the sample aspirating test is started; Alternatively, when the emergency action is triggered, the door of the closed sampling device in the first sample analyzer is opened, and the sample to be tested is placed in the closed sampling device for sample suction testing.
17. A sample analysis system control method according to claim 10 or 12, characterized in that: The method further comprises: when the emergency action is triggered, moving the sample to be tested to the sample aspirating needle of the open sampling device in the second sample analyzer, the sample aspirating needle extending into the sample to be tested and starting the sample aspirating test; Alternatively, when the emergency action is triggered, the door of the closed sampling device in the second sample analyzer is opened, and the user places the sample to be tested in the closed sampling device for sample suction testing.
18. A sample analysis system control method according to claim 11 or 12, characterized in that: Also includes: Identify the number of sample racks stored in the first loading buffer area and the second loading buffer area; The unified loading device places the sample racks in a loading buffer area with a smaller number or a loading buffer area with a number of sample racks less than a preset number.
19. The sample analysis system control method according to claim 11, characterized in that: Also includes: Identify the number of sample racks in the first loading buffer area and the second loading buffer area; Wherein, the identifying the number of sample racks in the first loading buffer area and the second loading buffer area comprises the following steps: Sensors are arranged at both ends of the loading buffer area, and the sensors form detection areas at both ends of the loading buffer area for detecting the sample rack; Calculate the maximum number of sample racks stored in the loading buffer area according to the distance between the two detection areas; The loading mechanism is controlled to push the sample rack in the loading buffer area to move toward one end of the loading buffer area. When the sample rack enters the detection area of the sensor, the sensor sends a signal to control the loading mechanism to stop moving. The loading mechanism is then controlled to push the sample rack to move toward the other end of the loading buffer area. When the sample rack enters the detection area of the sensor at the other end of the loading buffer area, the sensor sends a signal to control the loading mechanism to stop moving. The number of current sample racks in the loading buffer area is obtained according to the movement distance of the loading mechanism between the two detection areas and the maximum storage number of sample racks in the loading buffer area.
