Testing equipment

Abstract

The present invention relates to a testing device, which includes a base and a connecting device. The connecting device is arranged on the base. The connecting device includes a plurality of probes. Each adjacent pair of probes is arranged at intervals in a first direction. The connecting device and the fuel cell stack can move relative to each other, and there is a connecting position during the relative movement of the connecting device and the fuel cell stack. When the connecting device is in the connecting position, the plurality of probes abut against one side surface of the fuel cell stack, and each probe abuts against a corresponding bipolar plate. By providing the above-mentioned testing device, the fuel cell stack and the connecting device are moved relative to each other so that the plurality of probes of the connecting device abut against one side surface of the fuel cell stack, and the plurality of probes abut against the plurality of bipolar plates of the fuel cell stack one by one. When it is necessary to perform a voltage test on the fuel cell stack, the connecting device can be directly moved so that the probes abut against the fuel cell stack, and then the voltage test on the fuel cell stack can be performed. In this way, it is not necessary to manually connect the plurality of bipolar plates to the testing device one by one, and the testing efficiency is high.

Description

Technical Field

[0001] The present invention relates to the technical field of fuel cells, and particularly to a testing device. Background Art

[0002] A proton exchange membrane fuel cell is a fuel cell that uses hydrogen and oxygen to react and directly converts chemical energy into electrical energy. Due to its advantages of high energy conversion efficiency, fast cold start, no pollution, good durability, high specific power, etc., it is considered to be one of the best green energy sources in the 20th century.

[0003] A fuel cell stack is composed of multiple single cells, and the multiple single cells are stacked and connected in series with each other. When testing the voltage of a single cell during the development test or factory stage of a fuel cell stack, the existing testing method manually connects the bipolar plates in multiple single cells of the fuel cell stack to a testing device one by one, resulting in low efficiency. Summary of the Invention

[0004] Based on this, in view of the problem of low testing efficiency of the voltage of a single cell in an existing fuel cell stack, it is necessary to provide a testing device that can automatically test the voltage of a single cell in a fuel cell stack and improve the testing efficiency.

[0005] A testing device for testing the voltage of a stack, wherein a plurality of bipolar plates of the stack are arranged along a first direction, and the testing device is characterized in that it includes:

[0006] A base; and

[0007] A connecting device disposed on the base, the connecting device includes a plurality of probes, and every two adjacent probes are arranged at intervals in the first direction. The connecting device and the stack can move relative to each other, and there is a connecting position during the relative movement of the connecting device and the stack.

[0008] When the connecting device is in the connecting position, the plurality of probes abut against one side surface of the stack, and each probe abuts against a corresponding bipolar plate.

[0009] By providing the above-mentioned testing device, the stack and the connecting device are moved relative to each other so that the plurality of probes of the connecting device abut against one side surface of the stack, and the plurality of probes abut against the plurality of bipolar plates of the stack one by one. When it is necessary to test the voltage of the stack, the connecting device can be directly moved so that the probes abut against the stack, and then the voltage of the stack can be tested. In this way, it is not necessary to manually connect the plurality of bipolar plates to the testing device one by one, and the testing efficiency is high.

[0010] In one embodiment, the connecting device is reciprocally movably disposed on the base along a second direction that forms an angle with the first direction, and the connecting device has the connecting position during the reciprocating movement along the second direction.

[0011] In one embodiment, multiple probes are reciprocally movable along the first direction, and multiple probes have a corresponding position during the reciprocating movement along the first direction;

[0012] When multiple probes are located at the corresponding position, each probe corresponds to each bipolar plate one by one in the second direction;

[0013] Wherein, the second direction is perpendicular to one side surface of the stack where the multiple probes are in contact.

[0014] In one embodiment, the connecting device further includes a mounting plate, the mounting plate is reciprocally movably disposed on the base along the second direction, and multiple probes are reciprocally movably disposed on one side of the mounting plate facing the stack along the first direction.

[0015] In one embodiment, the connecting device further includes an alignment driving member, the alignment driving member is disposed on the mounting plate, and multiple probes are in transmission connection with the alignment driving member to drive the multiple probes to reciprocate along the first direction.

[0016] In one embodiment, there are multiple alignment driving members;

[0017] Multiple probes are divided into multiple groups, each group includes multiple probes, multiple probes in each group are in transmission connection with a corresponding alignment driving member, and multiple groups of probes are arranged at intervals along a third direction that forms an angle with the first direction;

[0018] Wherein, the third direction is perpendicular to the second direction.

[0019] In one embodiment, multiple probes are divided into at least two units, each unit includes multiple groups of probes, the probes of at least two units are arranged at uniform intervals along the first direction, and multiple groups of probes in each unit are arranged at intervals along the third direction.

[0020] In one embodiment, the testing device further includes a controller and a vision detection device, the vision detection device is disposed on the base for obtaining the arrangement information of multiple bipolar plates of the stack;

[0021] The controller is electrically connected to the vision detection device and the alignment driving member respectively, and is used to control the alignment driving member according to the arrangement information obtained by the vision detection device.

[0022] In one embodiment, the test device further includes a connection driving member disposed on the base, and the connection driving member is in transmission connection with the connection device.

[0023] In one embodiment, the test device further includes a voltage inspection device, and the voltage inspection device is electrically connected to a plurality of the probes of the connection device. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 A side view of the test device provided by an embodiment of the present invention;

[0025] Figure 2 is Figure 1 A bottom view of a partial structure of the shown test device;

[0026] Figure 3 is Figure 1 A front view of the connection device of the shown test device;

[0027] Figure 4 is Figure 3 A top view of a partial structure of the shown connection device;

[0028] Figure 5 is Figure 1 A top view of the vision detection device of the shown test device;

[0029] Figure 6 is Figure 5 A side view of the shown vision detection device. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0030] For ease of understanding of the present invention, the present invention will be described more comprehensively below with reference to the relevant drawings. Preferred embodiments of the present invention are shown in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided so that the understanding of the disclosure of the present invention is more thorough and comprehensive.

[0031] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly on the other element or there can also be an intermediate element. When an element is considered to be "connected" to another element, it can be directly connected to the other element or there may be an intermediate element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only.

[0032] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this invention belongs. The terms used in the specification of the present invention are for the purpose of describing specific embodiments only and are not intended to limit the present invention. The term "or / and" used herein includes any and all combinations of one or more of the related listed items.

[0033] To facilitate understanding of the technical solution of the present invention, the fuel cell stack is described herein: The stack is composed of a plurality of single cells stacked in series. Specifically, bipolar plates and membrane electrodes are alternately laminated, and seals are inserted between each single cell. After being compressed by the front and rear end plates, they are fastened with screws.

[0034] As Figure 1 and Figure 2 As shown, a test device provided by an embodiment of the present invention is used to perform voltage tests on the stack 200. A plurality of bipolar plates of the stack 200 are arranged in a first direction. The test device includes a base 10 and a connecting device 20.

[0035] The connecting device 20 is arranged on the base 10. The connecting device 20 includes a plurality of probes 24. Each adjacent pair of probes 24 is arranged at intervals in the first direction. The connecting device 20 and the stack 200 can move relative to each other, and there is a connection position during the relative movement of the connecting device 20 and the stack 200.

[0036] When the connecting device 20 is in the connection position, the plurality of probes 24 abut against one side surface of the stack 200, and each probe 24 abuts against a corresponding bipolar plate.

[0037] By setting the above test device, the stack 200 and the connecting device 20 are moved relative to each other so that the plurality of probes 24 of the connecting device 20 abut against one side surface of the stack 200, so that the plurality of probes 24 abut against the plurality of bipolar plates of the stack 200 one by one. When it is necessary to perform a voltage test on the stack 200, the connecting device 20 can be directly moved so that the probes 24 abut against the stack 200, and then a voltage test is performed on the stack 200. In this way, there is no need to manually connect the plurality of bipolar plates to the test device one by one, and the test efficiency is high.

[0038] It can be understood that the test device is used to perform voltage tests on the stack 200. Therefore, the probes 24 that abut against the bipolar plates have a conductive function.

[0039] In some embodiments, the connecting device 20 is reciprocally movably disposed on the base 10 along a second direction that is angled with respect to the first direction, and the connecting device 20 has a connecting position during the reciprocating movement along the second direction. Further, the base 10 includes a substrate 12 and a fixing structure. The connecting device 20 is movably disposed on one side of the substrate 12 along the second direction, the fixing structure is relatively fixedly connected to one end of the substrate 12, and the fixing structure has a fixing position for fixing the stack 200.

[0040] In practical applications, a slide rail 14 longitudinally arranged along the second direction is provided on one side of the substrate 12, and the connecting device 20 is slidably disposed on the slide rail 14. Specifically, the number of the slide rails 14 is two, and the two slide rails 14 are arranged in parallel.

[0041] Fix the stack 200 in the fixing position, and then move the connecting device 20 along the second direction so that the plurality of probes 24 abut against one side surface of the stack 200, and each probe 24 abuts against a corresponding bipolar plate.

[0042] In other embodiments, it may also be that the connecting device 20 is fixedly disposed relative to the substrate 12, and the stack 200 is moved to a connecting position where it abuts against the connecting device 20 by a handling mechanism or other mechanism capable of transporting the stack 200. Of course, the preferred embodiment is that the connecting device 20 is reciprocally movably disposed on the base 10 along the second direction.

[0043] In some embodiments, the testing device further includes a connecting driving member 30. The connecting driving member 30 is disposed on the base 10, and the connecting driving member 30 is in transmission connection with the connecting device 20 to drive the connecting device 20 to reciprocate along the second direction.

[0044] In practical applications, the connecting driving member 30 includes a servo motor 32 and a lead screw module 34. The servo motor 32 and the lead screw module 34 are disposed on the substrate 12, and the lead screw module 34 is in transmission connection between the servo motor 32 and the connecting device 20.

[0045] Of course, in other embodiments, the connecting driving member 30 may also be a driving device such as a cylinder or an electric cylinder, which is not limited herein.

[0046] In some embodiments, the plurality of probes 24 are reciprocally movable along the first direction, and the plurality of probes 24 have a corresponding position during the reciprocating movement along the first direction. When the plurality of probes 24 are in the corresponding position, each probe 24 corresponds to each bipolar plate one by one in the second direction, and the second direction is perpendicular to the side surface of the stack 200 where the plurality of probes 24 abut.

[0047] It can be seen therefrom that the first direction is perpendicular to the second direction, and the first direction is Figure 1 the up and down direction shown, and the second direction is Figure 1Thus, after moving the plurality of probes 24 to the corresponding positions, the connecting device 20 can be directly moved along the second direction to ensure that the connecting device 20 moves to the connecting position and each probe 24 abuts against a corresponding bipolar plate.

[0048] Please continue reading Figure 1 and Figure 2 In some embodiments, the connection device 20 further includes a mounting plate 22 , which is reciprocatably disposed on the base 10 along the second direction, and a plurality of probes 24 are reciprocatably disposed on a side of the mounting plate 22 facing the battery stack 200 along the first direction.

[0049] It is understandable that the probe 24 has a certain amount of retractive elasticity, that is, when the probe 24 is in the connection position, the probe 24 is in a compressed state to ensure the connection effect between the probe 24 and the battery stack 200 when abutting.

[0050] At the same time, taking the example of the connecting device 20 being movably arranged on the base 10, if the second direction is not perpendicular to the side surface of the battery stack 200 abutting against the probe 24, during the process of the probe 24 moving along the second direction to the connection position, the probe 24 will first contact the side surface of the battery stack 200, and slide a certain distance on the side surface of the battery stack 200 to make the probe 24 enter a compressed state. In order to avoid damaging the surface of the battery stack 200 or damaging the probe 24 during the movement of the probe 20, it is preferred that the connecting device 20 moves in a direction perpendicular to the side surface of the battery stack 200 abutting against the probe 24.

[0051] Furthermore, the testing equipment also includes a voltage patroller 40, which is electrically connected to the multiple probes 24 of the connecting device 20, so that the voltage patroller 40 can be electrically connected to multiple bipolar plates through the probes 24, so that the voltage patroller 40 can detect the voltages of multiple single batteries.

[0052] In actual applications, the other end of the probe 24 facing away from the battery stack 200 is used to be electrically connected to the voltage patroller 40 , thereby achieving electrical conduction between the voltage patroller 40 and the battery stack 200 .

[0053] See also Figure 2 and Figure 3 In some embodiments, the connecting device 20 also includes an alignment driving member 26, which is disposed on the mounting plate 22, and the plurality of probes 24 are transmission-connected to the alignment driving member 26, so that the plurality of probes 24 are driven to move along the first direction through the alignment driving member 26, thereby moving the plurality of probes 24 to the alignment position.

[0054] Further, the connecting device 20 includes a plurality of alignment driving members 26. The plurality of probes 24 are divided into multiple groups, each group includes a plurality of probes 24, and the plurality of probes 24 in each group are drivingly connected to a corresponding alignment driving member 26.

[0055] It should be noted that if all the probes 24 are arranged on one alignment driving member 26, then all the probes 24 are linearly arranged and evenly spaced along the first direction. Whether it is the setting of the stack 200 or the probes 24, there will be errors in actual production. For example, the thickness error of the bipolar plate, the thickness error of the membrane electrode, and the arrangement error of the probes 24. Even if these errors are within the allowable range, when the number of bipolar plates in the stack 200 is large, the influence of the errors will become larger, resulting in some bipolar plates being unable to be correspondingly connected to the corresponding probes 24.

[0056] Please refer to Figure 1 、 Figure 3 and Figure 4 In a specific embodiment, Figure 1 in the uppermost probe 24 is the first probe 24, the uppermost bipolar plate is the first bipolar plate, and the probes 24 and bipolar plates are sequentially arranged downward. And the first probe 24 belongs to the first group of probes 24. The thickness of the bipolar plate is usually 2.4 ± 0.04 mm, the thickness of the membrane electrode is 0.4 ± 0.015 mm, the spacing error of the probes 24 is 0.01 mm, and the parallelism of the above-mentioned slide rail 14 is 0.01 mm.

[0057] When the first probe 24 abuts against the center of the first bipolar plate, it is necessary to ensure that all the probes 24 in the same group as the first probe 24 abut against the corresponding bipolar plates. The diameter of the probe is 0.5 mm. According to the above data, the allowable error for each group of probes 24 can be calculated as: (2.4 - 0.5) / 2 = 0.95 mm, and the number of probes 24 in each group is: 0.95 / (0.04 + 0.015 + 0.01) = 14.6. Taking the integer, the number of probes 24 in each group is 14.

[0058] In some embodiments, the multiple groups of probes 24 are arranged at intervals along a third direction that forms an angle with the first direction. It should be noted that the spacing between two adjacent groups of probes 24 along the third direction in the first direction is actually the spacing between two adjacent probes 24 in the first direction.

[0059] Further, a plurality of alignment driving members 26 are arranged at intervals in the third direction. Each group of probes 24 is drivingly connected to the driving end of the alignment driving member 26, and the structures of the plurality of alignment driving members 26 are the same. The multiple groups of probes 24 are arranged at intervals in the third direction, and correspondingly, the multiple alignment driving members 26 are also arranged at intervals in the third direction. The distance between two adjacent probes 24 is relatively small. If the multiple alignment driving members 26 are arranged at intervals along a straight line parallel to the first direction, affected by the alignment driving members 26, it is impossible to ensure that the distance between two groups of probes 24 is the same as the distance between two adjacent probes 24 mentioned above.

[0060] Meanwhile, the third direction and the first direction cannot be perpendicular to each other, that is, the multiple alignment driving members 26 should be arranged obliquely relative to the first direction.

[0061] In addition, the multiple alignment driving members 26 are all arranged on the same side of the mounting plate 22, so the third direction is perpendicular to the second direction.

[0062] In some embodiments, the multiple probes 24 are divided into at least two units. Each unit includes multiple groups of probes 24. The probes 24 of at least two units are arranged at uniform intervals in the first direction, and the multiple groups of probes 24 in each unit are arranged at intervals in the third direction.

[0063] Further, the multiple alignment driving members 26 are divided into at least two groups. Each group includes multiple alignment driving members 26. The at least two groups of alignment driving members 26 are arranged at uniform intervals in the first direction, and the multiple alignment driving members 26 in each group are arranged at intervals in the third direction. In this way, the multiple groups of probes 24 in each unit are correspondingly arranged on the multiple alignment driving members 26 of one group, and each group of probes 24 is correspondingly arranged on one alignment driving member 26. Specifically, the alignment driving member 26 is a stepper motor to ensure the movement accuracy.

[0064] Combined Figure 3 For illustration, the multiple probes 24 are divided into the first unit 24A1 and the second unit 24A2. The first unit 24A1 and the second unit 24A2 are arranged at uniform intervals in the first direction, and both the first unit 24A1 and the second unit 24A2 include eight groups of probes 24. The eight groups of probes 24 are arranged at intervals in the third direction.

[0065] It should be explained that the multiple probes 24 are abutted against the same side surface of the stack 200. That is to say, the orthographic projections of all the probes 24 on the side surface of the stack 200 facing the probes 24 are located within this surface. Moreover, for the convenience of assembly, the size of the mounting plate 22 is not much larger than the side surface of the stack 200 facing the probes 24. That is to say, the mounting space on the mounting plate 22 is limited.

[0066] The multiple probes 24 are divided into multiple groups, and each group of probes 24 is arranged on a corresponding pair of alignment driving members 26. The alignment driving members 26 are installed on the mounting plate 22 and will also occupy the mounting space on one side of the mounting plate 22. Therefore, the above arrangement is adopted to effectively utilize the mounting space.

[0067] Meanwhile, as described in the above embodiments, in actual application, 14 probes 24 are arranged on each alignment driving member 26. Combining Figure 3 it can be known that if only one group of alignment driving members 26 is arranged, the width of the mounting plate 22 is only enough to install 8 alignment driving members 26. Therefore, the multiple probes 24 are divided into at least two units, and the multiple alignment driving members 26 are divided into at least two groups.

[0068] It should be noted that taking the example that there is a preset distance between two adjacent probes 24 in each group, when the multiple probes 24 are divided into at least two units, each unit includes multiple groups, and each group includes multiple probes 24, two adjacent groups of probes 24 refer to two groups of probes 24 with a preset distance in the first direction, that is, Figure 3 the leftmost and lowermost group of probes 24B1 and the rightmost and uppermost group of probes 24B2 in

[0069] are two adjacent groups of probes 24. In other words, taking the example that the multiple probes 24 are divided into at least two units, each unit includes multiple groups, and each group includes multiple probes 24, the distances between all the probes 24 in the first direction are the same and are all the preset distance.

[0070] Please refer to Figure 3 and Figure 4 , in some embodiments, the connecting device 20 further includes a fixing block 28. The fixing block 28 is in transmission connection with the alignment driving member 26. The fixing block 28 is provided with a plurality of mounting holes, and the multiple probes 24 are correspondingly installed in the mounting holes, and each mounting hole installs one probe 24.

[0071] In actual application, there are also multiple fixing blocks 28. One fixing block 28 is arranged on each alignment driving member 26, and one group of probes 24 is installed on each fixing block 28.

[0072] Of course, in some other embodiments, the multiple alignment driving members 26 can also be arranged on the mounting plate 22 in a direction perpendicular to the first direction, and fixing blocks 28 with different lengths are arranged on each alignment driving member 26 to ensure that the multiple probes 24 are arranged in the arrangement manner in the above embodiments. Of course, it is preferred to use fixing blocks 28 with the same size for convenient assembly.

[0073] Please refer to Figure 1 、 Figure 5 and Figure 6, in some embodiments, the test device further includes a controller and a vision detection device 50. The vision detection device 50 is disposed on the base 10 and is used to obtain the arrangement information of a plurality of bipolar plates of the stack 200. The controller is electrically connected to the vision detection device 50 and the alignment driving member 26 respectively, and is used to control the alignment driving member 26 according to the arrangement information obtained by the vision detection device 50.

[0074] Further, the vision detection device 50 includes a camera 52. The camera 52 is disposed on the substrate 12 so as to be reciprocally movable along a first direction, and is used to photograph the stack 200 during the movement, so as to obtain the arrangement information of a plurality of bipolar plates in the stack 200. The controller is electrically connected to the camera 52. Specifically, the camera 52 is a line-scan camera. The line-scan camera moves along the first direction to a certain position, stops moving to take a picture, and then continues to move. It can stop multiple times during the movement to take multiple pictures.

[0075] It should be noted that obtaining the arrangement information by using the camera 52 actually means obtaining the thickness and position of the bipolar plates in the stack 200. The processing method is to pre-calibrate the relative positions of the probes 24 and the stack 200 to obtain the relative position deviation values of each bipolar plate and the corresponding probe 24, which are used as reference values for data analysis.

[0076] Taking 14 probes 24 as a group as an example: Suppose the deviation values calibrated for each probe 24 in the early stage are (X1, X2, X3, X4....X14), and X1X2 is the distance between the center of each bipolar plate calibrated and the end plate of the stack 200. Now, the line-scan camera takes pictures for data collection and analysis to obtain the deviation values (Y1, Y2, Y3, Y4....Y14) of the bipolar plates of the stack 200 and the positions of the corresponding probes 24. Y1Y2 is the distance between the center of the bipolar plate of the actually detected stack 200 and the end plate of the stack 200. Calculate the values of (Y1 - X1), (Y2 - X2), (Y3 - X3), (Y4 - X4)....(Y14 - X14), and select an intermediate value from these 14 groups of data as the travel distance for the driving end of the alignment driving member 26 in this group to move.

[0077] Among them, the method of data selection is that all the probes 24 can be docked at a position close to the center of the bipolar plate. Moreover, if the deviation of a group of data exceeds half of the thickness of the bipolar plate, this data is discarded, or if the bipolar plate captured is greatly deformed or the whole thickness does not meet the requirements, the data is also discarded.

[0078] Of course, the number of 14 probes 24 in each group in the above embodiment is a theoretical calculated value. In actual application, the actual deviation values can be calculated, and the number of probes 24 in each group in actual application can be calculated by using the deviation comparison method.

[0079] In some embodiments, the vision detection device 50 further includes a translation driving member 54. The translation driving member 54 is disposed on the substrate 12 and is in transmission connection with the imager 52. In practical applications, the translation driving member 54 is a servo electric cylinder longitudinally arranged along the first direction.

[0080] In some embodiments, the vision detection device 50 further includes a light source 56. The light source 56 is fixedly arranged relative to the camera and can reciprocate along the first direction synchronously with the imager 52, and is used to emit light towards the stack 200, thereby improving the clarity of the image captured by the imager 52.

[0081] In practical applications, the vision detection device 50 further includes a connecting rod 58. One end of the connecting rod 58 is in transmission connection with the translation driving member 54, and the other end is fixedly connected to the imager 52 and the light source 56 respectively, so that the imager 52 and the light source 56 move synchronously along the first direction.

[0082] It should be noted that, in order to facilitate obtaining the arrangement information of the bipolar plates in the stack 200, the vision detection device 50 is located on the moving path of the connecting device 20. Therefore, the connecting rod 58 has an avoidance position during the reciprocating movement along the first direction. When the connecting rod 58 is in the avoidance position, the connecting rod 58, the line-scan camera and the light source 56 will not affect the movement of the connecting device 20 in the second direction. Specifically, Figure 1 the avoidance position is the position where the connecting rod 58 moves to the lowest position.

[0083] To facilitate understanding of the technical solution of the present invention, the working process of the testing device in the above embodiments is described herein:

[0084] The stack 200 is fixed at the fixed position. At this time, the surface of one side of the stack 200 faces the probe 24. The line-scan camera takes pictures to collect the arrangement information of the bipolar plates in the stack 200. After obtaining the information, the connecting rod 58 moves to the avoidance position. The controller controls the alignment driving member 26 on the mounting plate 22 to act according to the arrangement information, so that all the probes 24 are in the alignment position. Next, the connecting driving member 30 acts to move the mounting plate 22 along the second direction until all the probes 24 are in the connection position. At this time, the probes 24 are in contact with the stack 200, and the probes 24 have a compression amount of 1.5 mm. The other ends of the probes 24 are electrically connected to the voltage inspection device 40 through wires, and the voltage data is measured and saved by the voltage inspection device 40. After the test is completed, the connecting driving member 30 acts to move the mounting plate 22 along the second direction to return to the initial position.

[0085] Compared with the prior art, the testing device provided by the present invention has at least the following advantages:

[0086] 1) The probes 24 and the bipolar plates in the stack 200 can be automatically connected without manual sequential connection, effectively improving the test efficiency;

[0087] 2) For the stack 200 with different bipolar plate thicknesses or different numbers of bipolar plates, it only needs to correspondingly adjust the spacing between the probes 24 or the number of the probes 24, and the versatility is relatively high.

[0088] 3) The probes 24 are divided into multiple groups and arranged on multiple alignment driving members 26. The arrangement form of the multiple alignment driving members 26 effectively utilizes the installation space of the mounting plate 22, so as to ensure that multiple probes 24 corresponding to the bipolar plates of the stack 200 are arranged on the mounting plate 22, and the positions of all the probes 24 can be adjusted.

[0089] The technical features of the above-described embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0090] The above-described embodiments only represent several implementation manners of the present invention. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the invention patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several deformations and improvements can still be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the invention patent should be subject to the appended claims.

Claims

1. A test device for performing voltage tests on a stack, wherein a plurality of bipolar plates of the stack are arranged along a first direction, characterized in that, The test device includes: a base; a connecting device disposed on the base, the connecting device including a plurality of probes, each adjacent pair of the probes being spaced apart in the first direction, the connecting device being movable relative to the fuel cell stack, and having a connection position during the relative movement between the connecting device and the fuel cell stack; a vision detection device disposed on the base for obtaining arrangement information of a plurality of bipolar plates of the fuel cell stack; and when the connecting device is in the connection position, the plurality of probes abut against one side surface of the fuel cell stack, and each probe abuts against a corresponding bipolar plate; wherein, the connecting device further includes an alignment driving member, the plurality of probes being in transmission connection with the alignment driving member to drive the plurality of probes to reciprocate in the first direction, and capable of adjusting the probe pitch according to the arrangement information obtained by the vision detection device to adapt to different bipolar plate pitches; there are a plurality of the alignment driving members; the plurality of probes are divided into multiple groups, each group including a plurality of the probes, each probe in each group being in transmission connection with a corresponding alignment driving member, and the multiple groups of probes being spaced apart in a third direction that forms an angle with the first direction.

2. The test device according to claim 1, characterized in that, The connecting device is reciprocally movably disposed on the base in a second direction that forms an angle with the first direction, and has the connection position during the reciprocal movement of the connecting device in the second direction; wherein, the second direction is perpendicular to the third direction.

3. The testing device according to claim 2, wherein The plurality of probes are reciprocally movable in the first direction, and have a corresponding position during the reciprocal movement of the plurality of probes in the first direction; when the plurality of probes are at the corresponding position, each probe corresponds to each bipolar plate in the second direction one by one; wherein, the second direction is perpendicular to the side surface of the fuel cell stack against which the plurality of probes abut.

4. The test device according to claim 3, wherein The connecting device further includes a mounting plate, the mounting plate being reciprocally movably disposed on the base in the second direction, and the plurality of probes being reciprocally movably disposed on the side of the mounting plate facing the fuel cell stack in the first direction.

5. The testing device according to claim 4, wherein, The alignment driving member is disposed on the mounting plate.

6. The testing device according to claim 1, characterized in that The plurality of probes are divided into at least two units, each unit including multiple groups of the probes, the probes of the at least two units being evenly spaced apart in the first direction, and the multiple groups of probes in each unit being spaced apart in the third direction.

7. The test device according to claim 5, characterized in that, The test device further includes a controller, the controller being electrically connected to the vision detection device and the alignment driving member respectively for controlling the alignment driving member according to the arrangement information obtained by the vision detection device.

8. The test device according to claim 2, characterized in that The test device further includes a connection driving member, the connection driving member being disposed on the base, and the connection driving member being in transmission connection with the connecting device.

9. The test device according to claim 1, characterized in that, The test device further includes a voltage inspection device, the voltage inspection device being electrically connected to the plurality of probes of the connecting device.

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