Planar probe shrapnel

Abstract

The present invention belongs to the technical field of shrapnel, and particularly relates to a planar probe shrapnel, which includes a first adapter and a second adapter. A connecting piece and at least two bending pieces are arranged between the first adapter and the second adapter, and the connecting piece is connected between two adjacent bending pieces. When an external force acts on the first adapter or the second adapter and moves them in a direction away from each other, the bending pieces are pulled to generate elastic deformation after being stressed. The bending pieces respectively generate acting forces in opposite directions on the first adapter and the second adapter, thereby reducing the deformation amount of the planar probe shrapnel and reducing deformation. By connecting multiple bending pieces through the connecting piece, the degree of deformation of the bending pieces is large. By setting multiple bending pieces, the maximum deformation amount of the planar probe shrapnel is increased, thereby increasing the range of elastic deformation of the overall planar probe shrapnel, increasing the force-bearing range of the shrapnel, having good mechanical properties, being reusable multiple times, and having a long service life.

Description

Technical Field

[0001] The present invention belongs to the technical field of shrapnel, and particularly relates to a planar probe shrapnel. Background Art

[0002] The existing shrapnel can be applied to chip connection, where the arc of the shrapnel contacts the chip, and can also be used to connect other devices, such as Figure 1 As shown, a continuous arc 101 is connected between two adapters 100. When the two adapters 100 are stressed, the arc 101 undergoes elastic deformation, and the arc 101 generates opposite acting forces on the two adapters 100 to reduce the overall deformation of the shrapnel after being stressed. However, the structural design of this shrapnel is not reasonable enough, the elastic deformation range of the continuous arc structure is small, resulting in a small stress range of the shrapnel, affecting the applicable range of the shrapnel, and having a short service life. Summary of the Invention

[0003] An object of the present invention is to provide a planar probe shrapnel, aiming to solve the technical problem that the structural design of the shrapnel in the existing technology is not reasonable enough, resulting in a small stress range of the shrapnel.

[0004] To achieve the above object, a planar probe shrapnel provided by an embodiment of the present invention includes a first adapter and a second adapter, and a connecting member and at least two bending members are provided between the first adapter and the second adapter, and the connecting member is connected between two adjacent bending members.

[0005] Optionally, the bending member includes an arc portion and a support portion, one end of the arc portion is connected to the connecting member, and the support portion is connected to the other end of the arc portion so that the arc portion is disposed between the connecting member and the support portion.

[0006] Optionally, the arc portion is in an "S" shape.

[0007] Optionally, the arc portion includes a first arc portion and a second arc portion, and the first arc portion and the second arc portion are arranged at intervals; one ends of the first arc portion and the second arc portion are both connected to the connecting member, and the other ends of the first arc portion and the second arc portion are connected to the support portion.

[0008] Optionally, the support portion and the connecting member are both arranged in parallel along the direction in which the first adapter extends toward the second adapter.

[0009] Optionally, the bending member includes a first bending member and a second bending member that are symmetrically arranged, and the first bending member and the second bending member are respectively disposed on both sides of the first adapter.

[0010] Optionally, the bending member is in an "I" shape.

[0011] Optionally, the number of the bending members is set to two, and the two bending members are symmetrically arranged.

[0012] Optionally, a transition portion for enhancing the force borne by the bending member is provided at the connection between the first connecting member and the bending member.

[0013] Optionally, the transition portion is recessed away from the bending member to form an arc surface.

[0014] One or more of the above technical solutions in the planar probe elastic sheet provided by the embodiments of the present invention have at least one of the following technical effects: In the embodiments of the present invention, the first adapter and the second adapter are used to connect external devices, the connecting member and the bending member are connected between the first adapter and the second adapter. When an external force acts on the first adapter or the second adapter and moves them away from each other, the bending member is pulled and elastically deformed under force. The bending member generates opposite-direction acting forces on the first adapter and the second adapter respectively, thereby reducing the deformation amount of the planar probe elastic sheet and reducing deformation; the plurality of bending members are connected by the connecting member, and the bending members have a large deformation degree. By providing a plurality of bending members, the maximum deformation amount of the planar probe elastic sheet is increased, thereby increasing the range of elastic deformation of the whole planar probe elastic sheet, increasing the force-bearing range of the elastic sheet, having good mechanical properties, being reusable for multiple times, and having a long service life. Description of the Drawings

[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0016] Figure 1 It is a schematic structural diagram of an elastic sheet in the prior art.

[0017] Figure 2 It is a schematic structural diagram of the planar probe elastic sheet provided by the embodiments of the present invention.

[0018] Figure 3 It is a top view of the planar probe elastic sheet provided by the embodiments of the present invention.

[0019] Figure 4 It is a top view of the planar probe elastic sheet provided by the embodiments of the present invention.

[0020] Among them, the reference numerals in the drawings are as follows:

[0021] 10 - First adapter; 20 - Second adapter; 30 - Connecting member

[0022] 40 - Bending member; 41 - Arc portion; 42 - Support portion

[0023] 50 - Transition part, 51 - Arc surface, 100 - Adapter

[0024] 101 - Arc, 400 - First bending part, 401 - Second bending part

[0025] 410 - First arc part, 411 - Second arc part. Detailed implementation manner

[0026] The embodiments of the present invention will be described in detail below. Examples of the embodiments are shown in the drawings, where the same or similar reference numerals indicate the same or similar elements or elements with the same or similar functions throughout. The following is by reference to the attached Figures 2 to 4 The described embodiments are exemplary and are intended to explain the embodiments of the present invention, and should not be construed as a limitation of the present invention.

[0027] In the description of the embodiments of the present invention, it should be understood that the orientation or positional relationships indicated by the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. are based on the orientation or positional relationships shown in the drawings, and are only for the convenience of describing the embodiments of the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation of the present invention.

[0028] In addition, the terms "first" and "second" are only used for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the embodiments of the present invention, "a plurality" means two or more, unless otherwise specifically defined.

[0029] In the embodiments of the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed", etc. should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the communication inside two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present invention can be understood according to specific circumstances.

[0030] In one embodiment of the present invention, as Figures 2 to 3As shown, a planar probe spring piece is provided, including a first adapter 10 and a second adapter 20 , wherein a connecting member 30 and at least two bending members 40 are provided between the first adapter 10 and the second adapter 20 , and the connecting member 30 is connected between two adjacent bending members 40 .

[0031] In an embodiment of the present invention, the first adapter 10 and the second adapter 20 are used to connect external devices, and the connecting member 30 and the bending member 40 are connected between the first adapter 10 and the second adapter 20. When the first adapter 10 or the second adapter 20 is acted upon by an external force, it moves in a direction away from each other, pulling the bending member 40 so that it generates elastic deformation after being subjected to the force. The bending member 40 generates forces in opposite directions on the first adapter 10 and the second adapter 20, respectively, thereby reducing the deformation of the planar probe spring piece and reducing deformation; multiple bending members 40 are connected by the connecting member 30, and the deformation degree of the bending members 40 is large. Multiple bending members 40 are provided to increase the maximum deformation of the planar probe spring piece, thereby increasing the range of the overall elastic deformation of the planar probe spring piece and the force range of the spring piece. The mechanical properties are good, the bending members can be recycled for multiple times, and the service life is long.

[0032] In another embodiment of the present invention, Figures 2 to 3 As shown, the bending piece 40 of the planar probe spring piece includes an arc portion 41 and a support portion 42, one end of the arc portion 41 is connected to the connecting piece 30, and the support portion 42 is connected to the other end of the arc portion 41 so that the arc portion 41 is arranged between the connecting piece 30 and the support portion 42; the arc portion 41 and the support portion 42 are connected to form the bending piece 40, and the arc portion 41 and the support portion 42 are subjected to force and produce elastic deformation at the same time, the force is evenly applied, the force is improved, and the mechanical properties are further improved.

[0033] In another embodiment of the present invention, Figures 2 to 3 As shown, the arc portion 41 of the planar probe spring piece is in an "S" shape. The "S"-shaped structure is stable, which increases the force range of the bending part 40 and has a wide range of applications.

[0034] In another embodiment of the present invention, Figures 2 to 3As shown, the arc portion 41 of the planar probe spring piece includes a first arc portion 410 and a second arc portion 411, and the first arc portion 410 and the second arc portion 411 are spaced apart; one ends of the first arc portion 410 and the second arc portion 411 are both connected to the connecting member 30, and the other ends of the first arc portion 410 and the second arc portion 411 are connected to the supporting portion 42; there is a clearance space between the first arc portion 410 and the second arc portion 411 to prevent the various parts in the bending member 40 from colliding with each other during the elastic deformation process of the bending member 40, which affects the overall force on the bending member 40. The first arc portion 410 and the second arc portion 411 are spaced apart, further optimizing the structure and making the mechanical properties of the planar probe spring piece better.

[0035] In another embodiment of the present invention, as Figures 2 to 3 shown, the supporting portion 42 and the connecting member 30 of the planar probe spring piece are both arranged in parallel along the direction in which the first adapter 10 extends toward the second adapter 20; the supporting portion 42 and the connecting member 30 are arranged in parallel, enhancing the force on the bending member 40 and the connecting member 30 in the direction in which the first adapter 10 extends toward the second adapter 20, increasing the maximum force on the planar probe spring piece, and having a wide range of applications.

[0036] In another embodiment of the present invention, as Figures 2 to 3 shown, the bending member 40 of the planar probe spring piece includes a first bending member 400 and a second bending member 401 which are symmetrically arranged with each other, and the first bending member 400 and the second bending member 401 are respectively arranged on both sides of the first adapter 10; the first connecting member 30 and the second connecting member 30 are coaxially arranged, the first bending member 400 and the second bending member 401 are respectively arranged on both sides of this axis, and the first connecting member 30, the second connecting member 30, the first bending member 400 and the second bending member 401 are all arranged in the same plane.

[0037] In another embodiment of the present invention, as Figures 2 to 3 shown, the bending member 40 of the planar probe spring piece is in an "I" shape, and the size of the bending member 40 can be adjusted accordingly according to actual needs, making it suitable for use in different scenarios.

[0038] In another embodiment of the present invention, as Figures 2 to 3 shown, the number of the bending members 40 of the planar probe spring piece is two, and the two bending members 40 are symmetrically arranged with each other. By arranging two "I"-shaped bending members 40, the stress can be effectively released, the structure is reasonable, the elastic performance is good, the number of times of recyclable use is large, and the service life of the planar probe spring piece is greatly extended.

[0039] In another embodiment of the present invention, as Figure 4As shown, a transition portion 50 for enhancing the force on the bending member 40 is provided at the connection between the first connecting member 30 and the bending member 40 of the planar probe spring piece. By providing the transition portion 50, the structure at the connection is optimized. Compared with a straight-edge structure, this structure has a better connection effect, thereby enhancing the force and achieving a better mechanical effect.

[0040] Specifically, the transition portion 50 can also be a chamfer structure, which is used to enhance the stiffness of the planar probe spring piece.

[0041] In another embodiment of the present invention, as Figure 4 shown, the transition portion 50 of the planar probe spring piece is recessed away from the bending member 40 to form an arc surface 51. By providing the arc surface 51, the bending member 40 can expand to a greater extent during the elastic deformation process, increasing the maximum range of deformation and making the structure more stable.

[0042] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.

Claims

1. A planar probe spring piece, characterized in that It includes a first adapter and a second adapter. A connecting piece and at least two bending pieces are provided between the first adapter and the second adapter. The connecting piece is connected between two adjacent bending pieces. The bending piece includes an arc portion and a support portion. One end of the arc portion is connected to the connecting piece, and the support portion is connected to the other end of the arc portion so that the arc portion is disposed between the connecting piece and the support portion. The arc portion includes a first arc portion and a second arc portion. The first arc portion and the second arc portion are spaced apart. One ends of the first arc portion and the second arc portion are both connected to the connecting piece, and the other ends of the first arc portion and the second arc portion are connected to the support portion. The bending piece includes a first bending piece and a second bending piece which are symmetrically arranged. The first bending piece and the second bending piece are respectively disposed on both sides of the first adapter. The first connecting piece and the second connecting piece are coaxially arranged. The first bending piece and the second bending piece are respectively disposed on both sides of this axis. The first connecting piece, the second connecting piece, the first bending piece and the second bending piece are all disposed in the same plane.

2. The planar probe spring piece according to claim 1, characterized in that, The arc portion is in an "S" shape.

3. The planar probe shrapnel according to claim 1, characterized in that, The support portion and the connecting piece are both arranged in parallel along the direction in which the first adapter extends toward the second adapter.

4. The planar probe shrapnel according to claim 1, characterized in that, The bending piece includes a first bending piece and a second bending piece which are symmetrically arranged. The first bending piece and the second bending piece are respectively disposed on both sides of the first adapter.

5. The planar probe elastic sheet according to claim 4, characterized in that, The bending piece is in an "I" shape.

6. The planar probe shrapnel according to any one of claims 1 to 5, wherein The number of the bending pieces is set to two, and the two bending pieces are symmetrically arranged with each other.

7. The planar probe shrapnel according to any one of claims 1 to 5, characterized in that A transition portion for improving the force-bearing of the bending piece is provided at the connection between the first connecting piece and the bending piece.

8. The planar probe spring piece according to claim 7, characterized in that, The transition portion is recessed in a direction away from the bending piece to form an arc surface.

Images