In-situ force loading test instrument

Abstract

The present invention provides an in-situ force loading test instrument, which clamps and mechanically loads the test specimen through a micro-specimen loading system, and is supported by a support frame. Before the mechanical loading test, the test specimen is adjusted to be vertical and located at the center of the field of view through a rotating shaft positioning system, and the test specimen is adjusted to be located at the center of the field of view through a test specimen positioning and rotation system. During the mechanical loading test, the test specimen is rotated through the test specimen positioning and rotation system. By setting an independent micro-specimen loading system and a rotating shaft positioning system, the test specimen positioning and rotation system is placed inside the support frame, and the loading and rotation of the test specimen is independent of the support structure, so that the information data collection process of the test specimen is unobstructed.

Description

Technical Field

[0001] The invention relates to the technical field of mechanical experiments, and more specifically to an in-situ force loading experimental instrument. Background Art

[0002] Nanoscale internal three-dimensional in-situ mechanical experiments are the key to understanding the failure mechanism of materials, optimizing material performance, and preventing material damage. In-situ means real-time online, which means that the experiment and the measurement object are in the original test environment, and the experimental process is dynamically observed.

[0003] The internal structure of the material can be observed by nanometer resolution in-situ computed tomography (CT) observation technology. However, there are no mature experimental instruments and methods in the existing technology. Therefore, it is urgent to develop an experimental technology and instrument that can perform in-situ nanometer resolution in-situ CT observation during the material loading process. However, in the nanometer CT experiment, the precise positioning and linkage of the complex axis system with 7 to 8 degrees of freedom are required. The introduction of the force loading system will cause the loss of some angle projection information or the destruction of the axis system linkage. So far, nanometer resolution in-situ CT experimental observation of the material loading process has not been realized (currently, advanced light sources such as the Argonne Laboratory in the United States, the Diamond Light Source in the United Kingdom, and the Swiss Light Source can only achieve in-situ CT detection of the loading process with a maximum resolution of 0.65 microns).

[0004] The technical difficulty of in-situ nanometer-resolution in-situ CT observation lies in that, first of all, nanometer-resolution CT experiments require a series of complex axis systems for nanometer-level precision linkage, including positioning of the specimen center, positioning of the rotation axis, adjustment of the rotation axis inclination, and rotation of the specimen. In nanometer-resolution CT experiments, the rotational motion error of the specimen needs to be less than 30 nanometers, and for the adjustment of the rotation axis inclination, it is necessary to use the axis system linkage of 6 degrees of freedom to make the angle between the rotation axis and the vertical direction less than 0.0025. The ultra-high-precision multi-degree-of-freedom complex axis system leads to great experimental difficulty in nanometer-resolution CT.

[0005] Furthermore, introducing a loading system based on the complex multi-degree-of-freedom motion of CT will lead to the loss of some angle projection information or the destruction of the axis system linkage. The current existing technical solutions generally adopt the method of simply stacking the loading system on top of the complex axis system, which will cause the loading system to block the X-rays and cause the loss of some angle projection information. If the complex axis system is introduced into the loading system, each moving axis needs to perform synchronous loading movement. The tension, compression, torsion and other movements of the loading process itself will destroy the linkage of the complex axis system, making this idea impossible to achieve. The contradiction between the loading system and the complex multi-degree-of-freedom axis system makes it difficult for the resolution of CT in-situ loading experiments to break through to the nanometer scale.

[0006] In summary, the core technical difficulty in realizing nanometer-resolution CT in-situ loading experiments lies in the coupling of force loading with complex axis systems with multiple degrees of freedom, that is, meeting the requirements of nanometer-resolution multi-degree-of-freedom complex motion on the basis of ultra-high precision mechanical loading. Summary of the invention

[0007] In view of this, the present invention provides an in-situ force loading experiment instrument to improve the adjustment accuracy of the in-situ loading experiment and realize the unobstructed acquisition of CT experiment information data.

[0008] In order to achieve the above object, the present invention provides the following technical solutions:

[0009] An in-situ force loading experimental instrument comprises a micro-specimen loading system for clamping and force loading the experimental specimen, and a support frame for supporting the micro-specimen loading system;

[0010] A rotation axis positioning system for supporting the support frame and adjusting the verticality and position of the rotation axis of the experimental specimen is arranged at the bottom of the support frame.

[0011] Preferably, in the above-mentioned in-situ force loading experimental instrument, the micro-specimen loading system includes a positioning and rotating system for positioning and rotating the experimental specimen, a fixture alignment system for aligning the position of the positioning and rotating system, and a force loading system for clamping and mechanically loading the sample specimen;

[0012] The positioning and rotating system comprises an upper positioning and rotating system arranged on the top of the supporting frame for adjusting and rotating the position of the experimental specimen.

[0013] and a lower positioning and rotating system fixedly mounted above the fixture alignment system for adjusting and rotating the position of the experimental specimen.

[0014] Preferably, in the above-mentioned in-situ force loading test instrument, the upper positioning and rotating system comprises an upper rotating table mounted on the top of the supporting frame for rotating and adjusting the test specimen.

[0015] and an upper orthogonal translation stage mounted below the upper rotating stage for adjusting the position of the experimental specimen.

[0016] Preferably, in the above-mentioned in-situ force loading test instrument, the lower positioning and rotating system comprises a lower rotating table mounted above the fixture alignment system for performing rotation adjustment on the test specimen.

[0017] and a lower orthogonal translation stage mounted above the lower rotating stage for adjusting the position of the experimental specimen.

[0018] Preferably, in the above-mentioned in-situ force loading experimental instrument, a first orthogonal displacement stage for adjusting the position of the positioning and rotating system is provided in the fixture alignment system.

[0019] and a first orthogonal tilting platform for adjusting the tilt angle of the positioning and rotating system.

[0020] Preferably, in the above-mentioned in-situ force loading experimental instrument, the micro-specimen loading system also includes a synchronization device for synchronously controlling the orthogonal translation stage for adjusting the specimen position of the upper positioning rotation system and the lower positioning rotation system and the rotation stage responsible for the specimen rotation during the information data acquisition process.

[0021] Preferably, in the above-mentioned in-situ force loading test instrument, the force loading drive device is provided with a force sensor for monitoring its loading force, and a displacement sensor for monitoring the deformation of the specimen.

[0022] Preferably, in the above-mentioned in-situ force loading experimental apparatus, the shaft positioning system comprises a shaft positioning tilting table arranged up and down for adjusting the verticality of the support frame.

[0023] A rotating shaft positioning displacement stage for adjusting the position of the support frame,

[0024] A rotating shaft positioning lifting platform is used to adjust the height of the support frame.

[0025] Preferably, in the above-mentioned in-situ force loading experimental instrument, it also includes a synchrotron radiation light source or an X-ray machine that cooperates with the position of the support frame to generate X-rays,

[0026] And an X-ray detector for receiving the X-rays, and a system for performing image inversion, reconstruction and processing on the received X-rays.

[0027] The in-situ force loading experimental instrument provided by the present invention comprises a micro-specimen loading system for clamping and force loading the experimental specimen, and a support frame for supporting the micro-specimen loading system;

[0028] A rotation axis positioning system is provided at the bottom of the support frame for supporting the support frame and adjusting the verticality and position of the rotation axis of the specimen.

[0029] Before the force loading experiment, the rotation axis is adjusted to be vertical and located at the center of the field of view. The specimen position is adjusted to coincide with the rotation axis through the specimen positioning and rotation system. The force loading system clamps and mechanically loads the specimen. When the shape of the specimen changes during the force loading experiment, the specimen is rotated by the specimen positioning and rotation system. The synchrotron radiation source or X-ray source generates X-rays that pass through the specimen and are received by the X-ray detector for information data collection.

[0030] By setting up an independent micro-specimen loading system and a rotating shaft positioning system, the loading and rotation of the experimental specimen are independent of the supporting structure, so that the information data collection process of the experimental specimen is unobstructed. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0032] Figure 1 A system schematic diagram of the in-situ force loading experimental instrument provided by the present invention;

[0033] Figure 2 A schematic diagram of the structure of the in-situ force loading experimental instrument provided by the present invention;

[0034] Figure 3 for Figure 2 The structural diagram of the positioning rotation system;

[0035] Figure 4 for Figure 3 Schematic diagram of the structure of the middle fixture alignment system;

[0036] Figure 5 for Figure 2 The structural diagram of the transfer axis positioning system;

[0037] Figure 6 A schematic diagram of the structure of a synchronous system for synchronously controlling a positioning rotation system;

[0038] Figure 7 for Figure 2 Schematic diagram of the structure of the middle support frame. DETAILED DESCRIPTION

[0039] The invention discloses an in-situ force loading experiment instrument, which improves the accuracy of the in-situ loading experiment and realizes the unobstructed collection of CT experiment information data.

[0040] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0041] like Figure 1-Figure 7 As shown, Figure 1A system schematic diagram of the in-situ force loading experimental instrument provided by the present invention; Figure 2 A schematic diagram of the structure of the in-situ force loading experimental instrument provided by the present invention; Figure 3 for Figure 1 The structural diagram of the positioning rotation system; Figure 4 for Figure 1 Schematic diagram of the structure of the middle fixture alignment system; Figure 5 for Figure 1 Structural diagram of the transfer axis positioning system; Figure 6 A schematic diagram of the structure of a synchronization device for synchronously controlling a positioning rotation system; Figure 7 for Figure 2 Schematic diagram of the structure of the middle support frame.

[0042] This embodiment provides an in-situ force loading experimental instrument, including a micro-specimen loading system 101 for clamping, positioning, rotating and force loading an experimental specimen 5, and a support frame 1 for supporting the micro-specimen loading system;

[0043] A rotation axis positioning system 102 is provided at the bottom of the support frame 1 for supporting the support frame 1 and adjusting the verticality and position of the rotation axis of the specimen.

[0044] Before the force loading experiment, the rotating axis of the specimen is adjusted to be vertical and located at the center of the field of view by the rotating axis positioning system 102, and then the specimen position is adjusted to coincide with the rotating axis by the specimen positioning and rotating systems 1011 and 1012, and supported by the support frame 1. When the morphology of the specimen changes during the force loading experiment, the specimen is rotated by the specimen positioning and rotating systems 1011 and 1012, and the synchrotron radiation light source or X-ray source generates X-rays that pass through the specimen and are received by the X-ray detector to collect information data.

[0045] By providing an independent micro-specimen loading system 101 and a rotating shaft positioning system 102, the loading and rotation of the experimental specimen are independent of the supporting structure, so that the information data collection process of the experimental specimen is unobstructed.

[0046] In a specific embodiment of the present case, the micro-specimen loading system 101 includes a positioning and rotating system for positioning and rotating the experimental specimen 5 and a fixture alignment system 1013 for adjusting the position of the positioning and rotating system, and also includes a force loading system for clamping and mechanically loading the experimental specimen;

[0047] The micro-specimen loading system 101 is used to clamp, position and rotate the experimental specimen 5 , and provide the experimental specimen 5 with pulling, pressing, twisting and other movements during the force loading process.

[0048] Before the force loading experiment of the experimental specimen 5, the clamp alignment system adjusts the alignment of the upper and lower clamps of the force loading system, and then clamps the specimen. The specimen positioning and rotation system adjusts the position of the specimen to coincide with the rotation axis. During the force loading experiment, when the specimen morphology changes, the specimen positioning and rotation system is responsible for sample rotation. The synchrotron radiation light source or X-ray source generates X-rays that pass through the specimen and are received by the X-ray detector for information data collection.

[0049] The positioning and rotating system includes an upper positioning and rotating system 1011 disposed on the top of the supporting frame 1 for adjusting and rotating the position of the test specimen 5.

[0050] and a lower positioning and rotating system 1012 fixed to the top of the fixture alignment system for adjusting and rotating the position of the test specimen 5 .

[0051] In a specific embodiment of the present case, the upper positioning and rotating system 1011 includes an upper rotating table 2 mounted on the top of the supporting frame 1 for rotating the experimental specimen, and an upper orthogonal displacement table 3 mounted below the upper rotating table 2 for adjusting the position of the experimental specimen.

[0052] The lower positioning and rotating system 1012 includes a lower rotating table 7 mounted above the fixture alignment system 1013 for rotating the experimental specimen, and a lower orthogonal displacement table 6 mounted above the lower rotating table 7 for adjusting the position of the experimental specimen 5 .

[0053] The fixture alignment system 1013 includes a first orthogonal displacement stage 9 mounted above the support structure 1 for adjusting the position of the lower positioning and rotating system 1012, and a first orthogonal tilting stage 8 mounted below the first orthogonal displacement stage 9 for adjusting the tilt angle of the lower positioning and rotating system 1012.

[0054] Before the test specimen is clamped, the fixture alignment system 1013 adjusts the position of the lower positioning and rotating system 1012 by the first orthogonal displacement table 9, and adjusts the tilt angle of the lower positioning and rotating system 1012 by the first orthogonal tilting table 8 to ensure the alignment of the upper and lower fixtures. After the specimen is clamped, the upper orthogonal displacement table 3 and the lower orthogonal displacement table 6 of the specimen positioning and rotating system jointly adjust the specimen position to coincide with the rotation axis. During the force loading experiment, when the specimen morphology changes, the upper rotating table 2 and the lower rotating table 7 of the specimen positioning and rotating system jointly rotate the specimen, and the synchrotron radiation light source or X-ray source generates X-rays that pass through the specimen and are received by the X-ray detector to collect information data. Preferably, the micro-specimen loading system 101 also includes a force loading system for loading the experimental specimen; and also includes a synchronization device 13 for synchronously controlling the position adjustment of the upper positioning and rotating systems and the rotation of the specimen during the information data collection process.

[0055] Since the upper positioning rotation system and the lower positioning rotation system move synchronously, the synchronization device controls the two synchronously to ensure the consistency of the position adjustment and rotation movement of the two.

[0056] In a specific embodiment of the present case, a force sensor for monitoring the loading force and a displacement sensor for monitoring the displacement are provided on the force loading drive device. After the test specimen is mechanically loaded, its clamping position changes. In order to accurately measure the experimental data of the test specimen, a force sensor and a displacement sensor are provided in the force loading drive device to accurately record and measure the experimental process of the test specimen during the experiment.

[0057] In a specific embodiment of the present case, the shaft positioning system 102 includes a shaft positioning tilting table 10 arranged up and down to adjust the verticality of the support frame 1.

[0058] A rotating shaft positioning displacement platform 11 for adjusting the lateral position of the support frame 1,

[0059] A rotating shaft positioning lifting platform 12 is used to adjust the height of the supporting frame 1.

[0060] A rotation axis positioning system for adjusting the position and verticality of the rotation axis during the rotation of the experimental specimen is arranged at the bottom of the support frame 1. In order to meet the experimental accuracy requirements of tensile loading, a rotation axis positioning system 102 is arranged at the bottom of the support frame 1 to adjust the lateral position, vertical height and verticality of the support frame 1 in multiple degrees of freedom. The support frame 1 of the force loading system is coupled with the independent rotation axis positioning system 102 for adjusting multiple degrees of freedom to ensure the experimental accuracy, by means of a rotation axis positioning tilting table 10 that can adjust the tilt angle, a rotation axis positioning displacement table 11 that can adjust the lateral position of the support frame 1, and a rotating positioning lifting table 12 that can adjust the vertical height of the support frame 1 to realize the support frame 1 of the force loading system.

[0061] The support frame 1 is a frame-shaped structure, the top of which is a frame top plate 171 of the upper positioning rotation system, and the bottom of which is a frame bottom plate 172 of the support fixture alignment system 102. The frame top plate 171 and the frame bottom plate 172 are supported by a plurality of support columns 173. Preferably, the frame top plate 171 and the frame bottom plate 172 are both rectangular structures, and the support columns 173 support the corners of the rectangular frame top plate 171 and the frame bottom plate 172.

[0062] In a specific embodiment of the present case, it also includes a synchrotron radiation source or an X-ray machine that cooperates with the position of the support frame to generate X-rays, and an X-ray detector that receives X-rays, and an image inversion reconstruction and processing system for the received X-rays. During the detection process, the X-rays pass through a series of optical elements and then penetrate the specimen and are emitted from the X-ray detector, and then are received and imaged. In the specific implementation process, the X-rays can be generated by a synchrotron radiation source or an X-ray machine, and the beam types include but are not limited to parallel beams, cone beams, and fan beams.

[0063] The X-rays emitted after penetrating the specimen are received by the X-ray detector and stored on the computer hard disk. The image is then inverted, reconstructed and processed using the processing system to obtain nanometer-resolution three-dimensional microstructure morphology images inside the specimen at each moment.

[0064] The in-situ force loading experimental apparatus provided in this embodiment is implemented by the following steps in a specific order:

[0065] 1. Align the upper and lower fixtures in the support frame 1 using the fixture alignment system 1013, the shaft positioning system 102, the upper positioning and rotating system 1011, and the lower positioning and rotating system 1012;

[0066] 2. Use the rotation axis positioning system 102 and the upper positioning and rotating system 1011 and the lower positioning and rotating system 1012 to adjust the system rotation axis to the vertical direction and to the center of the detector field of view in the horizontal direction;

[0067] 3. Using the lifting platform 12, move the center 5 of the experimental specimen to the height center of the detector field of view;

[0068] 4. Use the upper positioning and rotating system 1011 and the lower positioning and rotating system 1012 to move the specimen to the center of the detector field of view in the horizontal direction, so that the center of the specimen, the rotation axis, and the center of the field of view coincide with each other;

[0069] 5. Use the force loading system to load the experimental specimen 5, and use the upper rotating table 2 and the lower rotating table 7 to rotate the experimental specimen 5 with high precision;

[0070] 6. Use the X-ray detector of the image acquisition and reconstruction system to collect complete projection data, and use the processing system to invert, reconstruct and process the projection data

[0071] 8. Obtain the internal three-dimensional structure evolution with nanometer resolution and ultra-high precision at each moment of the specimen loading process.

[0072] The above description of the disclosed embodiments enables one skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. An in-situ force loading test instrument, characterized in that: It includes a micro-specimen loading system for clamping and force-loading the experimental specimen, and a support frame for supporting the micro-specimen loading system; The bottom of the support frame is provided with a rotation axis positioning system for supporting it and adjusting the verticality and position of the rotation axis of the CT experiment; The micro-specimen loading system includes a positioning and rotating system for clamping the experimental specimen and positioning and rotating it, a fixture alignment system for aligning the position of the positioning and rotating system, and a force loading system for mechanically loading the experiment; The positioning and rotating system comprises an upper positioning and rotating system arranged on the top of the supporting frame for adjusting and rotating the position of the experimental specimen, and a lower positioning and rotating system fixedly mounted above the fixture alignment system for adjusting and rotating the position of the experimental specimen; The fixture alignment system is provided with a first orthogonal displacement stage for adjusting the lateral position of the positioning and rotating system, and a first orthogonal tilting stage for adjusting the tilting angle of the positioning and rotating system; The shaft positioning system includes a shaft positioning tilting platform arranged up and down for rotationally adjusting the support frame, a shaft positioning displacement platform for adjusting the lateral position of the support frame, and a shaft positioning lifting platform for adjusting the height of the support frame.

2. The in-situ force loading test instrument according to claim 1, characterized in that: The upper positioning and rotating system comprises an upper rotating table mounted on the top of the supporting frame for rotating the experimental specimen. and an upper orthogonal translation stage mounted below the upper rotating stage for adjusting the position of the experimental specimen.

3. The in-situ force loading test instrument according to claim 1, characterized in that: The lower positioning and rotating system comprises a lower rotating table mounted above the fixture alignment system for rotating the experimental specimen. and a lower orthogonal translation stage mounted above the lower rotating stage for adjusting the position of the experimental specimen.

4. The in-situ force loading test instrument according to claim 1, characterized in that: The micro-specimen loading system also includes a synchronization device for synchronously controlling the rotation of the rotating table during position adjustment of the upper positioning and rotating systems and the lower positioning and rotating systems and information data collection.

5. The in-situ force loading test instrument according to claim 4, characterized in that: The force loading drive device is provided with a force sensor for monitoring its loading force and a displacement sensor for monitoring its displacement.

6. The in-situ force loading test instrument according to claim 1, characterized in that: It also includes a synchrotron radiation source or an X-ray machine that cooperates with the support frame to generate X-rays, And an X-ray detector for receiving the X-rays, and a system for performing image inversion, reconstruction and processing on the received X-rays.

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