Test method and test system

Abstract

The present invention provides improved testing of complex devices under test, particularly parallel analysis of signals of the device under test. Multiple signals of the device under test can be acquired, and characteristic parameters of the acquired signals can be determined. The determined characteristic parameters of the multiple signals can be stored. In particular, the characteristic parameters can be stored in the form of an array, a table, or a spreadsheet.

Description

Technical Field

[0001] This invention relates to a method for testing a device under test (DUT). It also relates to a test system for testing the DUT. Specifically, this invention relates to testing complex DUTs. Background Technology

[0002] Although it can be applied in principle to any electronic device, the invention and its potential problems will be described below in conjunction with a test field programmable gate array (FPGA).

[0003] Many different voltages must be supplied to many modern integrated circuits, such as FPGAs and application-specific integrated circuits (ASICs). Depending on the application, twenty or more voltages may need to be supplied to such an integrated circuit. For these circuits to operate correctly, the individual voltages must be supplied in a well-defined sequence, known as the "power-on sequence." Furthermore, in addition to the appropriate voltage levels and the correct sequence of applying each voltage, requirements such as slew rate and monotonicity must be guaranteed when supplying each voltage.

[0004] To test the operation of such complex devices that require multiple voltages with well-defined relationships, all of these voltages need to be measured, recorded, and analyzed together. However, due to the large number of voltage signals, the correct analysis of each signal, especially the correct analysis of the relationships between them, is a challenging task. For example, when displaying all the waveforms of each signal on a monitor such as an oscilloscope, it will be difficult for the user to identify the properties of each signal waveform and to determine whether the signal waveforms meet the desired requirements.

[0005] In this context, the problem this invention aims to solve is to provide an improved and universal testing method for complex devices under test. Specifically, this invention aims to provide a testing method for complex devices by analyzing a large number of signals in parallel. Summary of the Invention

[0006] This invention addresses this problem through a test method and test system having the features of the independent claims. Further advantageous embodiments are the subject of the dependent claims.

[0007] According to a first aspect, a test method for testing a device under test is provided. The test method includes: acquiring a sequence of at least two signals from the device under test; determining characteristic parameters for each signal in the acquired sequence; and storing the determined characteristic parameters in a measurement memory.

[0008] According to another aspect, a test system for testing a device under test is provided. The test system includes a processor and a measurement memory. The processor is configured to: acquire a sequence of at least two signals from the device under test; and determine characteristic parameters for each of the acquired at least two signals. The measurement memory is configured to store the determined characteristic parameters.

[0009] This invention is based on the fact that testing complex devices may require parallel analysis of a large number of signal sequences. For example, the relationships between the individual signals must be considered. For this purpose, the characteristic properties of multiple signal sequences can be considered, and when testing multiple sequences of a complex device under test, the correct timing of the characteristic parameters in the multiple signal sequences must be ensured. However, the visual representation of a large number of signal waveforms provided by conventional test equipment makes it difficult to reliably identify the correct properties of each signal waveform and the timing of signal changes.

[0010] Therefore, this invention takes into account this finding and aims to provide improved testing of complex devices under test (DUTs) through parallel analysis of a large number of signals. For this purpose, the invention is applicable to acquiring a sequence comprising multiple signals from the DUT and automatically determining characteristic parameters in the sequence with respect to these signals. Furthermore, the determined characteristic parameters in the sequence are stored for further analysis. Specifically, the stored characteristic parameters of the sequence can be provided by a measurement memory in a form that can be readily used to compare the characteristic parameters with the expected requirements of the complex DUT. In this way, the testing of complex DUTs is simplified, and the reliability of the test results is improved.

[0011] Signals can be measured using probes designed to measure electrical signals from the device under test. These probes can be of any suitable type. For example, a probe can include a measuring tip for measuring voltage at a specific location, such as a pin on an integrated circuit. However, a probe can also include any suitable sensor, such as a current sensor for measuring current. Specifically, a separate probe can be provided for each signal to be measured. As mentioned above, complex devices such as FPGAs or ASICs may require a large number of signals (especially voltages) that must be applied in a well-defined manner. Therefore, a separate probe can be used to measure each of these numerous signals. For example, each signal measured by one of a number of probes can be provided to the measurement device via a separate measurement cable.

[0012] To measure analog signals, an analog-to-digital converter (ADC) can be used. Therefore, a separate ADC can be used on each probe to convert the analog measurement signal into digital measurement data. Alternatively, the ADC can be performed by the measuring device. In this case, the analog signal can be measured by the probe and provided to the measuring device.

[0013] The measured signals, measured by multiple probes, are provided to a measuring device for processing the measured signals. As described above, if the measured signals are provided as analog signals, the analog signals can be converted into digital data by an analog-to-digital converter (ADC). For this purpose, a separate ADC can be provided for each measured signal provided by one of the multiple probes. Therefore, the number of ADCs can correspond to the number of probes used to measure the signals. Alternatively, if the measured signals have already been converted into digital data by ADCs included in the probes, the measuring device can include a digital interface for receiving the digital data from the respective probes.

[0014] The sequence of signals can be acquired, for example, by an acquisition device. For instance, a data sequence can be generated, comprising digital measurement data related to the measured signals. Specifically, recording of the signal sequence can be initiated when a predetermined trigger event has been detected. For this purpose, acquisition of the sequence of all measured signals can be triggered by a common trigger event. For example, acquisition of the sequence can be initiated when the value of a particular measured signal is detected to exceed a predetermined threshold. However, it should be understood that any other suitable trigger event is also possible. For example, a rising or falling edge, a specific pulse, or any other suitable trigger event can be used to initiate the acquisition of the sequence.

[0015] The acquired sequence of multiple signals can be a sequence characterizing the temporal relationship between the individual signals. For example, multiple signals can be combined in a way that provides information about the order of changes in each signal. Specifically, the sequence can combine the individual signals so that they are acquired based on a common time reference. For example, the acquired sequence of signals can provide information about the specific time points at which a particular attribute in each signal occurs.

[0016] The acquired sequence of measured signals can be further processed to determine characteristic parameters within the acquired sequence. For this purpose, the sequence can be processed to determine appropriate characteristic parameters. Examples of characteristic parameters will be described in more detail below. To detect characteristic parameters in the acquired sequence, the sequence data can be analyzed to detect predetermined patterns. For example, specific waveform elements, specific values, specific changes in values, etc., can be detected.

[0017] For example, a feature parameter identified in a sequence can be characterized by recognizing the corresponding timestamp information in the sequence and assigning an identifier or any other feature data to the corresponding timestamp information of the corresponding signal. For example, a feature parameter can be specified by the number of corresponding signals, the timestamp when the corresponding feature parameter occurs, and an identifier (e.g., a numeric or alphanumeric specification) used to characterize the identified feature parameter. However, it should be understood that any other suitable scheme for specifying feature parameters in a sequence is also possible.

[0018] The acquisition of a sequence and / or the determination of characteristic parameters within the sequence can be performed, for example, by one or more processors executing predetermined instructions. For this purpose, a memory may be provided, comprising instructions for instructing one or more processors to perform desired operations. For example, a processor may execute an operating system for reading instructions from memory and performing corresponding operations. However, the acquisition of any other type of sequence and the determination of characteristic parameters are also possible.

[0019] After acquiring and processing the sequence to detect feature parameters, the determined feature parameters can be stored in the measurement memory. For example, as described above, information related to the determined feature parameters in the sequence can be stored by specifying the corresponding signal, the timestamp when the feature parameter was determined, and an identifier used to specify the feature parameter. However, any other scheme can also be used to store the determined feature parameters in the sequence. Furthermore, the correlation values ​​of the signals can also be stored in association with the determined feature parameters. Alternatively, all measurement signals can be stored in the measurement memory.

[0020] The measurement memory can be, for example, random access memory. Specifically, the measurement memory can be volatile memory. However, the measurement memory can also be non-volatile memory, such as flash memory. The determined characteristic parameters, the acquired sequence data, or any other information can also be stored on a hard disk drive, solid-state drive, or any other type of storage device.

[0021] Further embodiments of the invention are the subject of the additional dependent claims, and the following description takes into account the accompanying drawings.

[0022] In a possible embodiment, determining the feature parameters includes determining the temporal relationship between at least two signals in the acquired sequence.

[0023] In possible embodiments, the method includes displaying the characteristic parameters of the acquired sequence in the form of an array, table, or spreadsheet.

[0024] In possible embodiments, the characteristic parameters may include at least one of the following parameters: minimum value, maximum value, average value, phase shift, rise time or fall time (especially slew rate), pulse width, duty cycle, period length, frequency, spectrum, waveform shape, delay between signals, or monotonicity properties. However, it should be understood that any other suitable characteristic parameters may also be determined by the signal processor of the measuring device.

[0025] In a possible embodiment, acquisition includes: acquiring a sequence of at least four signals (especially eight signals) from the device under test.

[0026] In a possible embodiment, the method includes storing the specifications of the device under test in a specification memory.

[0027] In possible embodiments, the characteristic parameters include at least one of the following: minimum value, maximum value, average value, phase shift, rise time or fall time, pulse width, duty cycle, period length, frequency, spectrum, waveform shape, delay between signals, or monotonicity property.

[0028] In a possible embodiment, the method includes associating determined characteristic parameters of the acquired signal sequence with relevant specifications of the device under test.

[0029] In a possible embodiment, the method includes displaying on a display the characteristic parameters of the acquired sequence and the associated specifications of the device under test.

[0030] In a possible embodiment, the method includes: comparing the characteristic parameters of the acquired sequence with the corresponding specifications of the device under test.

[0031] In a possible embodiment, the method includes: displaying the results of a comparison between the characteristic parameters of the acquired sequence and the corresponding specifications of the device under test.

[0032] In possible embodiments, the results of the comparison are displayed in the form of an array, table, or spreadsheet.

[0033] In a possible embodiment, the method includes generating a schematic representation of a waveform signal based on feature parameters, the specifications of the device under test, and / or the result of a comparison between the feature parameters of the acquired sequence and the corresponding specifications of the device under test.

[0034] In a possible embodiment, the measurement memory is configured to store the determined characteristic parameters of the acquired signal sequence in the form of an array, table, or spreadsheet.

[0035] By storing the characteristic parameters of a signal sequence in the above-described form, data, particularly the characteristic parameters of the signal sequence, can be stored and provided in a well-defined, structured manner. For example, the characteristic parameters can be stored in a matrix comprising multiple rows and columns. Each row can be associated with one of the determined characteristic parameters, and the columns can specify the characteristics and time points of the determined characteristic parameters. Furthermore, the matrix can include multiple columns for each acquired signal sequence. In this way, correspondences between multiple acquired signal sequences can also be identified.

[0036] In a possible embodiment, the test system may include at least eight probes for measuring signals of the device under test. However, the test system may also include at least twelve, at least sixteen, at least twenty, or even more probes.

[0037] A test system comprising numerous probes for parallel measurement of multiple electrical signals allows for the measurement and analysis of the behavior of multiple signals in complex devices under test (DUTs). Specifically, the relationships between individual signals can be measured and analyzed. By measuring a large number of signals in parallel, the relationships between all these acquired signals can be evaluated. Therefore, efficient and reliable testing of complex DUTs that process a large number of signals can be achieved.

[0038] In a possible embodiment, each of the plurality of probes is configured to measure a voltage signal. It is also possible that at least some probes can be configured to measure a current signal. Furthermore, some probes can also measure any other kind of signal.

[0039] In a possible embodiment, the testing system includes an output device. The output device can be configured to output characteristic parameters of the stored sequence. The characteristic parameters can be output, for example, in the form of an array, table, or spreadsheet.

[0040] The characteristic parameters can be provided electronically, for example, through a suitable interface. For instance, the output device may include a communication interface, such as a network interface or radio frequency interface for transmitting the characteristic parameters to another device. The other device can receive the characteristic parameters and, for example, process the received characteristic parameters for further analysis. Furthermore, the output device may include an interface to an external storage device, such as a USB stick, a secure data (SD) card, etc. In this way, data containing the acquired sequence of characteristic parameters can be copied to the external storage device. The external storage device can be removed and inserted into another device, for example, for analyzing the stored characteristic parameter data. However, any other type of output is also possible.

[0041] In a possible embodiment, the output device includes a display. The display can be configured to display characteristic parameters of the stored signal sequence. Specifically, the characteristic parameters of the signal sequence can be displayed in the form of an array, a table, or a spreadsheet.

[0042] In a possible embodiment, the test system includes a specification memory. The specification memory can be configured to store specifications of the device under test. The processor can be configured to associate determined characteristic parameters of the acquired sequence with the relevant specifications of the device under test.

[0043] For example, the specifications stored in the specification memory can include requirements that must be met by the acquired signals for the device under test (DUT) to operate correctly. Specifications can be stored in any suitable manner. Furthermore, specifications for multiple possible DUTs can be stored. Each specification can be associated with a specific DUT. For example, the DUT can be identified by a product ID, etc. When testing the DUT, the corresponding specification for that DUT can be read from the specification memory and used as a reference to compare the acquired signal sequence with the desired requirements of the corresponding DUT. In this way, the evaluation of the measured and acquired signal sequences for the corresponding test can be performed very easily. Specifically, the evaluation can be performed automatically.

[0044] In possible embodiments, the stored specifications may include at least one of the following: slew rate, particularly rising slew rate and / or falling slew rate; shape of the signal waveform; monotonicity requirements; delay between signal sequences; minimum and / or maximum values, particularly minimum and / or maximum voltage. However, it should be understood that the stored specifications may also specify any other requirements.

[0045] In a possible embodiment, the processor of the test system is configured to determine whether the characteristic parameters of the acquired sequence are within the relevant specifications of the device under test.

[0046] For this purpose, the processor can correlate the determined characteristic parameters with the corresponding specifications and compare the determined characteristic parameters with the expected values ​​of the corresponding specifications. In this way, automatic analysis of the acquired sequences can be achieved. Since the test system processes a large number of signal sequences, especially at least four, eight, or even more signal sequences in parallel, the automatic determination of characteristic parameters and the correlation between the determined characteristic parameters and the corresponding requirements of the device under test can provide a significant improvement to the analysis of the acquired measurements.

[0047] For example, the testing system can identify the correspondence between determined characteristic parameters and corresponding specifications, and assess whether the identified characteristic parameters are within the requirements according to the specifications. The results of this analysis can, for example, be stored and / or output on a display. For instance, a table can be displayed on the measurement results screen, indicating the deviations of the identified characteristic parameters from the requirements. For example, different colors can be used for characteristic parameters that meet the required specifications and those that do not. Furthermore, bar charts or continuously changing colors can be used to indicate the degree of deviation between the determined characteristic parameters and the corresponding requirements. However, it should be understood that any other schemes for analyzing the requirements of the device under test and for providing the results of automated analysis are also possible.

[0048] In a possible embodiment, the measuring device may include an oscilloscope.

[0049] For example, measurement results acquired by multiple probes can be provided to an oscilloscope, which can then perform the acquisition and analysis of the acquired sequence to determine desired characteristic parameters. Furthermore, the oscilloscope can be configured to provide results for multiple sequences as described above. However, it should be understood that any other suitable device for acquiring signal sequences and identifiers and characteristic parameters from multiple signals in the sequence is also acceptable.

[0050] Therefore, using this invention, it is now possible to perform improved and efficient testing on complex devices under test, particularly those processing a large number of signals. For example, it is possible to analyze a large number of signals supplied to and / or output by the device under test. In particular, it is even possible to analyze the input and output signals of complex devices under test in parallel. By analyzing the characteristic parameters in multiple acquired signals, the amount of information provided to the user can be reduced. In this way, the user can more easily evaluate the measurement results. Furthermore, the determination of the characteristic parameters of multiple acquired signal sequences can also be used for automated analysis of the measurement results. In this way, efficient, fast, and reliable testing of complex devices that process a large number of signals in parallel can be achieved. Attached Figure Description

[0051] To gain a more complete understanding of the invention and its advantages, reference is now made to the following description taken in conjunction with the accompanying drawings. The invention will be explained in more detail below using exemplary embodiments illustrated in the accompanying drawings, in which:

[0052] Figure 1 A block diagram illustrating an embodiment of the testing system according to the present invention is shown;

[0053] Figure 2 A block diagram showing another embodiment of the test system according to the present invention is shown;

[0054] Figure 3 A schematic diagram illustrating the display output provided by the test system according to an embodiment; and

[0055] Figure 4 A block diagram illustrating an embodiment of the test method according to an embodiment is shown.

[0056] The accompanying drawings are intended to provide a further understanding of embodiments of the invention. The drawings illustrate embodiments and, in conjunction with the description, help to explain the principles and concepts of the invention. Other embodiments and the many advantages mentioned will become apparent from the drawings. Elements in the drawings are not necessarily shown to scale.

[0057] In the accompanying drawings, unless otherwise stated, similar, functionally equivalent, and equivalently operating elements, features, and components have similar reference numerals in each case. Specific Implementation

[0058] Figure 1 A test setup with a test system 1 for testing a device under test (DUT) 100 is shown. The test system 1 may include multiple probes 10-i, a measurement device 30 with a processor 31, and a measurement memory 40. The DUT may be, for example, an FPGA, an ASIC, or any other type of complex device that processes multiple signals, such as a processor, processing system, etc. For example, the DUT may have multiple supply voltages. These multiple supply voltages may have different voltage levels. Furthermore, the multiple voltages must be provided in a specific, well-defined order. Additionally, for the DUT to operate correctly, additional requirements regarding voltage levels, signal waveforms, and signal monotonicity must be met. Furthermore, multiple output signals provided by the DUT 100 can also be tested. It should be understood that combinations of the DUT 100's input signals, supply voltages, and output signals can also be tested by the test system 1.

[0059] To test multiple signals of the device under test 100, particularly for testing multiple signals in parallel, an appropriate number of probes 10-i are provided. Each probe 10-i can measure a specific signal of the device under test 100. For example, a probe 10-i may have a connection tip for electrically connecting the probe 10-i to a specific measurement point of the device under test 100. Thus, voltage can be measured by the probe 10-i. Furthermore, the probe 10-i can also be a probe for measuring current or any other characteristic of the device under test 100. Therefore, the probe tip may have a suitable connector or sensor for measuring the desired property of the device under test 100.

[0060] Since the test system 100 is designed to analyze multiple signals of the device under test 100 in parallel, an appropriate number of probes 10-i can be provided for measuring the desired number of signals. Therefore, the test system 100 can provide at least two probes 10-i, preferably at least four or at least eight or even more probes, for example, twelve, sixteen, twenty, or any other appropriate number of probes 10-i. For example, the test system 100 may include multiple identical probes 10-i for measuring a specific property (e.g., voltage). However, it is also possible that at least some of the probes 10-i can be different. For example, a first number of probes 10-i can be provided for measuring voltage, and a second number of probes 10-i can be provided for measuring current.

[0061] When measuring analog signals using probe 10-i, the measured analog signals can be converted into digital data using an analog-to-digital converter (ADC). For example, the analog measurement signals measured by probe 10-i can be provided to ADC 20. ADC 20 may include a separate ADC for each analog measurement signal provided by one of the probes in probe 10-i. Therefore, ADC 20 can convert the analog measurement signals into digital data with a predetermined sampling rate and / or resolution. The attributes of the ADC, particularly the sampling rate and / or resolution, can be fixed. Alternatively, attributes such as sampling rate and / or resolution can be set, for example, by the measuring device 30. As described above, the ADC can be performed by a separate ADC 20, by an ADC included in probe 10-i, or by an ADC included in measuring device 30.

[0062] Accordingly, the signals measured by the multiple probes 10-i are provided to the measuring device 30 in analog form and converted into digital data by an analog-to-digital converter included in the measuring device 30. Alternatively, the measured signals are converted into digital data outside the measuring device 30 and provided to the measuring device 30 in digital form. The processor 31 of the measuring device 30 receives digital data corresponding to the multiple measured signals measured by the multiple probes 10-i and acquires a sequence of each of the measured electrical signals measured by the multiple probes 10-i. For example, the processor 31 can generate a sequence including the multiple signals provided by the probes 10-i. The acquired sequence can be constructed from the signals provided by the multiple probes 10-i. Specifically, the sequence can be acquired by considering time relationships (e.g., the order of events in the individual signals). Therefore, the acquired sequence can be used as a basis for analyzing the order or time relationship of events in the individual signals. Such events can be, for example, rising or falling edges, exceeding or falling below a predetermined threshold, specific waveform elements, etc.

[0063] The acquisition of the signal sequence by the processor 31 can be initiated upon detection of a predetermined trigger event. For example, a trigger event may include the detection of a rising edge and / or falling edge in one of the measured signals, the detection of a signal level exceeding or falling below a predetermined threshold level in one of the measured signals, or any other characteristic event. It should be understood that data acquisition can also be triggered by specifying multiple trigger events. Multiple trigger events can be associated with one or more of the measured signals. Furthermore, all measured signals can be monitored to detect a specific trigger event within the measured signals. Combined trigger events can even be specified by combining sequences of individual trigger events, particularly sequences of trigger events that must be satisfied in a predetermined order to initiate the acquisition of the signal sequence by the processor 31. Additionally, the acquisition of the sequence can also be initiated based on an external signal.

[0064] The acquired sequence can include measurement data from all relevant signals. For example, the acquired sequence could be a sequence including measurement data from all probes 10-i, where the individual measurement data elements are arranged in the correct temporal order. In a possible embodiment, the acquired sequence can be constructed using an array or matrix, where one dimension is used for time resolution and another dimension is used to arrange multiple signals. For example, the array can be formed by separate columns for each signal, and each in the entire array can include measurement data related to a specific time point. However, it should be understood that any other scheme for acquiring a sequence of multiple signals is also possible.

[0065] Processor 31 can analyze the acquired sequence. Specifically, processor 31 can process the sequence to determine characteristic parameters of the acquired sequence. For example, processor 31 can identify minimum values ​​(e.g., minimum voltage), maximum values, average values, or medians, or any other kind of statistical parameters related to the signal of the sequence. Furthermore, the sequence can be analyzed to identify rising or falling edges to determine slew rates (particularly rising and / or falling slew rates), pulse widths, duty cycles, etc. Additionally, periodic signals can be analyzed to determine period lengths, frequencies, or spectrum. Processor 31 can also be configured to analyze the waveform of the signal in the acquired sequence, for example, to determine the shape of the waveform, etc. Processor 31 can also analyze any kind of relationship between the individual signals in the sequence. For example, phase shifts or delays between signals can be analyzed. Processor 31 can also analyze, for example, the monotonicity properties of the acquired signal sequence. For example, processor 31 can detect discontinuities in the signal of the sequence. However, processor 31 can also detect any other kind of attribute or feature. When characteristic parameters in the signal sequence are determined, processor 31 can assign corresponding timestamp information to the corresponding attributes of the signals in the sequence. The acquisition of sequences and / or the analysis of sequences used to determine characteristic parameters can be performed, for example, by an oscilloscope or the like.

[0066] After determining the characteristic parameters of the acquired sequence, the determined characteristic parameters are stored in the measurement memory 40. The measurement memory 40 can be, for example, the volatile memory of the measurement device 30. However, the measurement memory 40 can also be non-volatile memory, such as flash memory, a secure data card, or a USB stick. Any other type of memory can also be used to store the data of the characteristic parameters determined by the processor 31.

[0067] The characteristic parameters of the sequence determined by processor 31 can be stored, for example, in the form of an array, table, or spreadsheet. However, any other format, particularly any other structured form for storing characteristic parameters, is also possible. For example, an array or matrix can be created, with one dimension for multiple signal sequences and another dimension for characteristic parameters or time. Characteristic parameters can be specified in any suitable form. For example, each characteristic parameter that can be determined by processor 31 can be characterized using a specific identifier (e.g., a sequence of numbers or alphanumeric characters).

[0068] In possible examples, the determined characteristic parameters can be stored in a format including: an identifier of the corresponding signal in the acquired sequence, an identifier of the determined characteristic parameter, and at least one additional element for specifying a value associated with the corresponding characteristic parameter. For example, these values ​​can be specified by determining a specific time point when the minimum, maximum, or average value is determined and by including an additional field containing the determined value. An ascending or descending transition can be characterized by specifying first time information of the start of the transition, second time information of the end of the transition, and a value representing the difference between the start and end of the transition. Alternatively, the signal value at the start of the transition and the signal value at the end of the transition can be specified. The monotonicity of the signal can be specified by identifying one or more time points when a signal discontinuity is detected. It should be understood that the foregoing examples are merely examples for explaining the invention and do not limit the scope of the invention. Any other kind of characteristic parameter and any kind of data format for specifying the detection of the characteristic parameter is possible. Specifically, any kind of scheme for storing the determined characteristic parameters in a structured form such as a matrix, array, table, or spreadsheet is possible.

[0069] Figure 2 A block diagram illustrating another embodiment of test system 1 is shown. According to... Figure 2 The test system 1 mainly corresponds to the test system 1 previously described. Therefore, in combination with Figure 1 The description also applies to... Figure 2 Examples of implementations.

[0070] As from Figure 2As can be seen, the test system 1 may also include an output device 50. The output device 50 can be configured to output data stored in the measurement memory 40. The data can be output in any suitable form. For example, the data can be output via a wired or wireless interface for transmitting data to a remote side. Additionally or alternatively, stored data relating to characteristic parameters of the signal sequence can be output locally. For example, the output device 50 may include a display 55. For example, the display 55 may be a monochrome or color display. Therefore, information about the characteristic parameters stored in the measurement memory 40 can be displayed on the display 55. The data can be displayed in the form of an array, table, or spreadsheet. However, any other suitable form for displaying data relating to characteristic parameters is also possible. Since the test system 1 acquires a sequence of signals with a large number of signals, the acquisition signal, which provides the sequence as a separate waveform for each signal, may generate a large number of waveforms. Therefore, the individual waveforms must be displayed in a relatively small size. This makes it difficult for the user to analyze the individual waveforms. Alternatively, if the individual waveforms overlap, it may be difficult to distinguish the individual waveforms even if the waveforms are displayed in different colors. Therefore, it will be almost impossible to identify small details in the displayed waveforms when the signal is displayed by waveform display. To overcome this drawback, the test system 1 in this embodiment can display data related to the characteristic parameters of the sequence by providing the corresponding information in at least part of the form of alphanumeric characters.

[0071] For example, output device 50 can output data stored in measurement memory 40 in text form or by a combination of symbols and alphanumeric characters.

[0072] Test system 1 may also include a specification memory 60. The specification memory 60 can store specifications for the device under test 100. For example, the specification memory 60 can store requirements regarding the measured signals. These specifications may include: specifications regarding minimum voltage, maximum voltage, interference (e.g., noise on the signal); specifications regarding slew rates (particularly rise and / or fall slew rates); requirements regarding delays between signals; requirements regarding phase shifts between signals; and specifications regarding the waveform or monotonicity of the signals. However, any other type of specification may also be provided. For example, the specification may be entered by a user before initiating testing of the device under test 100. Alternatively, specifications may be stored in the specification memory via wired or wireless communication between the specification memory 30 and a remote device. Specifications for multiple possible devices under test may also be stored in the specification memory 60. In this case, the user can select a set of specifications to be used when testing the device under test 100. Furthermore, the device under test 100 can be automatically identified, and an appropriate set of specifications stored in the specification memory 60 can be selected.

[0073] The measuring device 30 (specifically, the processor 31) can read appropriate specifications from the specification memory 60 and compare the signal (specifically, the determined characteristic parameters of the sequence) with the relevant specifications of the device under test 100. For this purpose, the processor 31 can associate the detected characteristic attributes of the signal in the sequence with the corresponding specifications. After matching the characteristic parameters of the signal in the sequence with the relevant specifications, it can be determined whether the attributes of the detected characteristic parameters in the sequence meet the required specifications. In this way, automatic evaluation of the acquired sequence can be performed.

[0074] Because test system 1 processes a large number of signals corresponding to the numerous electrical signals measured by probe 10-i, the automatic identification of characteristic parameters in the acquired sequences, particularly the analysis of these characteristic parameters relative to the specifications of the device under test (DUT), simplifies the testing of the DUT and improves the reliability of the test results. Specifically, the automatic evaluation of multiple test signals based on characteristic parameters enables error-free analysis of the measurements. In contrast, users cannot manually evaluate such a large number of signals and related data. Even if all measurement results are provided simply by displaying the corresponding waveforms, it is virtually impossible to perform manual analysis of the displayed waveforms.

[0075] After analyzing the characteristic parameters of multiple signals in the sequence and evaluating these parameters relative to the specifications of the device under test, the test results can be stored in the measurement memory 40 and / or output by the output device 50. Specifically, the test results can be displayed on the display 55. For example, if the determined characteristic parameters meet the relevant specifications, they can be displayed in a first form, such as by a first color. If the characteristic parameters do not meet the specifications, they can be output in another form, such as by a different color. However, any other scheme for outputting measurement results (especially characteristic parameters) is also possible.

[0076] Figure 3 A schematic example of test results related to characteristic parameters is shown. For example, a schematic diagram of waveforms can be displayed in the first part 210 of the display to illustrate the various characteristic parameters. According to... Figure 3In the example, the characteristic parameters can be related to delay or rising edge. For example, the first waveform 211 can show the first rising edge, while the second waveform 212 can show the second rising edge. This representation can be used to explain the relevant parameters to the user. In the second part 220 of the display, data related to the characteristic parameters of multiple signals of the acquired sequence can be displayed. This data can be provided, for example, in the form of a table. For example, for each signal in the sequence, the relevant parameters can be output in the corresponding column of the table. Each row of the table can be related to a specific channel, and each column of the table can be related to a specific value of the characteristic parameter. In this way, the voltage levels before and after the rising edge can be displayed. Furthermore, the timing of the rising edge can also be displayed by individual values.

[0077] However, it should be understood that, according to Figure 3 The examples provided are merely simple illustrations for understanding the invention. Any other kind of representation for displaying the characteristic parameters of the sequence in a suitable form is permissible. For example, this information can be provided by a simple table without additional schematic waveforms. Alternatively, schematic waveforms can be displayed with corresponding parameters superimposed at appropriate positions on the schematic waveforms. Any other scheme for displaying the characteristic parameters is also possible.

[0078] Figure 4 A schematic flowchart illustrating a test method for testing a device under test according to an embodiment is shown.

[0079] In step S1, sequences of at least two signals from the device under test 100 are acquired. In step S2, characteristic parameters of each signal in the acquired sequences are determined. In step S3, the determined characteristic parameters are stored in the measurement memory 40.

[0080] Step S2, which determines the characteristic parameters, may include: determining the temporal relationship between at least two signals in the acquired sequence.

[0081] The method may also include the step of displaying the characteristic parameters of the acquired sequence in the form of an array, table, or spreadsheet.

[0082] Step S1, which involves acquiring a sequence, may include acquiring a sequence of at least four (particularly eight) signals from the device under test.

[0083] The method may also include the step of storing the specifications of the device to be tested in a specification memory.

[0084] The characteristic parameters may include at least one of the following: minimum value, maximum value, average value, phase shift, rise or fall time, pulse width, duty cycle, period length, frequency, spectrum, waveform shape, delay or monotonicity properties between signals.

[0085] The method may further include the step of associating the determined characteristic parameters of the acquired signal sequence with the relevant specifications of the device under test.

[0086] The method may also include the step of displaying the characteristic parameters of the acquired sequence and the associated specifications of the device under test on a display.

[0087] The method may also include the step of comparing the feature parameters of the acquired sequence with the corresponding specifications of the device under test.

[0088] The method may further include the step of displaying the results of a comparison between the characteristic parameters of the acquired sequence and the corresponding specifications of the device under test.

[0089] The results of the comparison can be displayed in the form of arrays, tables, or spreadsheets.

[0090] The method may further include the following steps: generating a schematic representation of the waveform signal based on the characteristic parameters, the specifications of the device under test, and / or the result of a comparison between the characteristic parameters of the acquired sequence and the corresponding specifications of the device under test.

[0091] In summary, this invention relates to improved testing of complex devices under test (DUTs), and particularly to parallel analysis of signals from the DUTs. Sequences of at least two signals from the DUTs are acquired, and characteristic parameters of each signal in the acquired sequences are determined. The determined characteristic parameters are stored in a measurement memory for further analysis or for display.

[0092] While specific embodiments have been shown and described herein, those skilled in the art will recognize that various alternatives and / or equivalent implementations exist. It should be understood that one or more exemplary embodiments are merely examples and are not intended to limit the scope, applicability, or configuration in any way. Rather, the foregoing summary and detailed description will provide a convenient guide for those skilled in the art to implement at least one exemplary embodiment, and it should be understood that various changes can be made to the function and arrangement of the elements described in the exemplary embodiments without departing from the scope set forth in the appended claims and their legal equivalents. Generally, this application is intended to cover any modifications or variations of the specific embodiments discussed herein.

[0093] In the foregoing detailed description, various features have been combined in one or more examples for the purpose of simplifying this disclosure. It should be understood that the above description is intended to be illustrative rather than restrictive. It is intended to cover all substitutions, modifications, and equivalents that may be included within the scope of this invention. Many other examples will be apparent to those skilled in the art after reading the above specification.

[0094] The specific terminology used in the foregoing description is intended to provide a thorough understanding of the invention. However, it will be apparent to those skilled in the art, based on the description provided herein, that specific details are not required to practice the invention. Therefore, for purposes of illustration and description, the foregoing description of specific embodiments of the invention has been given. They are not intended to be exhaustive or to limit the invention to the precise forms disclosed; in view of the foregoing teachings, it will be apparent that many modifications and variations are possible. The embodiments were chosen and described in order to best explain the principles of the invention and its practical application, thereby enabling others skilled in the art to best utilize the invention and to adapt various embodiments with various modifications to the particular uses contemplated. Throughout the specification, the terms “comprising” and “in” are used as common English equivalents of the corresponding terms “including” and “wherein”, respectively. Furthermore, the terms “first,” “second,” and “third,” etc., are used merely as labels and are not intended to impose numerical requirements on their objects or to establish a particular order of importance of their objects.

Claims

1. A test method for testing a device under test, the test method comprising: Acquire sequences of at least two signals from the device under test; Determine the characteristic parameters of each signal in the acquired sequence; as well as The determined characteristic parameters are stored in the measurement memory. The characteristic parameters of the sequence are stored in the form of an array, table, or spreadsheet, with one dimension used for multiple signal sequences and another dimension used for the characteristic parameters.

2. The method according to claim 1, wherein, Determining the feature parameters includes: determining the temporal relationship between the at least two signals in the acquired sequence.

3. The method according to claim 1, comprising: The characteristic parameters of the acquired sequence are displayed in the form of an array, table, or spreadsheet.

4. The method according to claim 1, wherein, The acquisition includes: acquiring a sequence of at least four signals from the device under test.

5. The method according to claim 1, comprising: The specifications of the device under test are stored in the specification memory.

6. The method according to claim 5, wherein, The characteristic parameters include at least one of the following: minimum value, maximum value, average value, phase shift, rise time or fall time, pulse width, duty cycle, period length, frequency, spectrum, waveform shape, delay or monotonicity properties between signals.

7. The method according to claim 5, comprising: The determined characteristic parameters of the acquired signal sequence are correlated with the relevant specifications of the device under test.

8. The method of claim 7, comprising: The characteristic parameters of the acquired sequence and the associated specifications of the device under test are displayed on the monitor.

9. The method according to claim 5, comprising: The characteristic parameters of the acquired sequence are compared with the corresponding specifications of the device under test.

10. The method of claim 9, comprising: The results of the comparison between the characteristic parameters of the acquired sequence and the corresponding specifications of the device under test are displayed.

11. The method according to claim 10, wherein, The results of the comparison are displayed in the form of an array, table, or spreadsheet.

12. The method of claim 9, comprising: A schematic representation of the waveform signal is generated based on the comparison between the characteristic parameters, the specifications of the device under test, and / or the characteristic parameters of the acquired sequence and the corresponding specifications of the device under test.

13. A test system for testing a device under test, the test system comprising: A processor, the processor being configured to acquire a sequence of at least two signals from the device under test and determine characteristic parameters of each of the at least two acquired signals; as well as A measurement memory, used to store the determined feature parameters. The characteristic parameters of the sequence are stored in the form of an array, table, or spreadsheet, with one dimension used for multiple signal sequences and another dimension used for the characteristic parameters.

14. The testing system according to claim 13, comprising: A display for displaying the characteristic parameters of the acquired sequence in the form of an array, table, or spreadsheet.

15. The testing system according to claim 13, comprising: A specification memory, which is used to store the specifications of the device under test.

16. The testing system according to claim 15, wherein, The characteristic parameters include at least one of the following: minimum value, maximum value, average value, phase shift, rise time or fall time, pulse width, duty cycle, period length, frequency, spectrum, waveform shape, delay or monotonicity properties between signals.

17. The testing system according to claim 15, wherein, The processor is configured to associate the determined characteristic parameters of the acquired signal sequence with the relevant specifications of the device under test.

18. The test system of claim 15, wherein the processor is configured to: compare the feature parameters of the acquired sequence with the corresponding specifications of the device under test.

19. The testing system according to claim 15, comprising: A display for showing the characteristic parameters of the acquired sequence and the associated specifications of the device under test.

20. The testing system according to claim 18, comprising: A schematic representation of the waveform signal is generated based on the comparison between the characteristic parameters, the specifications of the device under test, and / or the characteristic parameters of the acquired sequence and the corresponding specifications of the device under test.

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