Pressure testing method, device, equipment and storage medium

Abstract

The present application provides a stress test method, device, equipment and storage medium, the method comprising: repeating all the following steps until the number of completed tests reaches a preset test number threshold: modifying the current option value of the BIOS option to be tested according to one of the multiple modification values ​​corresponding to the basic input and output system BIOS option to be tested in the preset configuration file; controlling the restart of the device to be tested where the BIOS option to be tested is located, and obtaining the option value of the BIOS option to be tested after the restart of the device to be tested; obtaining the test result of the BIOS option to be tested in this test according to the modification value used by the BIOS option to be tested in this test and the option value of the BIOS option to be tested after the restart of the device to be tested, and updating the number of completed tests. It can reduce the tediousness of testing and improve testing efficiency.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a pressure testing method, device, equipment and storage medium. Background Art

[0002] At present, some devices (such as servers) usually have multiple Basic Input Output System (BIOS) options. These BIOS options can provide the lowest-level and most direct hardware settings and controls for the devices. It can be seen that the stability of BIOS options will directly affect the quality of the device. Therefore, stress testing (i.e., multiple tests) of BIOS options to determine the stability of BIOS options has become a top priority.

[0003] In the prior art, when stress testing is performed on BIOS options, each test process needs to be manually performed.

[0004] However, in the prior art, a large number of tests need to be performed for a BIOS option. Therefore, if each test needs to be performed manually, it will consume a lot of manpower and material resources, resulting in a cumbersome test process for the BIOS option and low test efficiency. Summary of the invention

[0005] The present application provides a stress testing method, apparatus, device and storage medium, which can reduce the tediousness of BIOS option testing and improve the testing efficiency of BIOS options.

[0006] In a first aspect, the present application provides a stress testing method, the method comprising:

[0007] Repeat all of the following steps until the number of completed tests reaches the preset test count threshold:

[0008] Modify the current option value of the basic input and output system BIOS option to be tested according to one of the multiple modification values ​​corresponding to the basic input and output system BIOS option to be tested in the preset configuration file;

[0009] Controlling the device under test where the BIOS option under test is located to restart, and obtaining the option value of the BIOS option under test after the device under test is restarted;

[0010] According to the modified value of the BIOS option to be tested used in this test and the option value of the BIOS option to be tested after the device to be tested is restarted, the test result of the BIOS option to be tested in this test is obtained, and the number of completed tests is updated.

[0011] Further, the modifying of the current option value of the BIOS option to be tested according to one of the multiple modification values ​​corresponding to the BIOS option to be tested in the preset configuration file comprises:

[0012] According to one of the modification values ​​corresponding to the BIOS option to be tested in the preset configuration file, the option value of the BIOS option to be tested is modified through a preset interface corresponding to the BIOS option to be tested.

[0013] Further, when the BIOS option to be tested is the first BIOS option to be tested, and before modifying the current option value of the BIOS option to be tested for the first time according to one of the multiple modification values ​​corresponding to the basic input and output system BIOS option to be tested in the preset configuration file, the method further includes:

[0014] Get permission flag;

[0015] When the permission flag is the first parameter, one of the multiple modification values ​​corresponding to the basic input and output system BIOS option to be tested in the preset configuration file is executed to modify the option value of the BIOS option to be tested, wherein the first parameter is used to grant permission to modify the option value externally.

[0016] Furthermore, the method further comprises:

[0017] When the permission flag is the second parameter, a reminder message is generated and displayed to enable the user to change the permission flag from the second parameter to the first parameter according to the reminder message, wherein the second parameter is used to indicate that permission to modify option values ​​externally is not granted.

[0018] Furthermore, when the number of completed tests reaches a preset test number threshold, the method further includes:

[0019] According to the test result obtained in each test of the BIOS option to be tested, the total test result of the BIOS option to be tested is determined.

[0020] In a second aspect, the present application provides a pressure testing device, the device comprising: a modification unit, a control unit and a processing unit, wherein:

[0021] The modification unit is used to modify the current option value of the BIOS option to be tested according to one of the multiple modification values ​​corresponding to the BIOS option to be tested in the preset configuration file;

[0022] The control unit is used to control the device under test where the BIOS option under test is located to restart, and obtain the option value of the BIOS option under test after the device under test is restarted;

[0023] The processing unit is used to obtain the test result of the BIOS option to be tested in this test based on the modification value used by the BIOS option to be tested in this test and the option value of the BIOS option to be tested after the device to be tested is restarted, and to update the number of completed tests, and trigger the execution of the modification unit until the number of completed tests reaches a preset test number threshold.

[0024] Furthermore, the modification unit is specifically used to modify the option value of the BIOS option to be tested through a preset interface corresponding to the BIOS option to be tested according to a modification value among multiple modification values ​​corresponding to the BIOS option to be tested in a preset configuration file.

[0025] Furthermore, the device also includes an acquisition unit;

[0026] The acquisition unit is used to acquire a permission flag when the BIOS option to be tested is the first BIOS option to be tested and before the modification unit modifies the current option value of the BIOS option to be tested for the first time according to one of multiple modification values ​​corresponding to the basic input and output system BIOS option to be tested in a preset configuration file, and when the permission flag is a first parameter, trigger the modification unit to modify the current option value of the BIOS option to be tested according to one of multiple modification values ​​corresponding to the basic input and output system BIOS option to be tested in the preset configuration file, wherein the first parameter is used to grant permission for external modification of option values.

[0027] Furthermore, the device also includes a reminder unit;

[0028] The acquiring unit is configured to trigger the reminding unit when the permission flag is a second parameter;

[0029] The reminder unit is used to generate and display reminder information, so that the user can change the permission flag from the second parameter to the first parameter according to the reminder information, wherein the second parameter is used to indicate that the permission to modify the option value externally is not granted.

[0030] Furthermore, the processing unit is further configured to determine a total test result of the BIOS option to be tested according to the test result obtained in each test of the BIOS option to be tested when the number of completed tests reaches a preset test number threshold.

[0031] In a third aspect, the present application provides a stress testing device, including: a memory and a processor;

[0032] The memory is used to store computer programs;

[0033] The processor executes the computer program in the memory to implement any method of the first aspect.

[0034] In a fourth aspect, the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer-executable instructions, and the computer-executable instructions are used to implement any method of the first aspect when executed by a processor.

[0035] The stress test method, device, equipment and storage medium provided by the present application pre-set a configuration file, which includes multiple modification values ​​corresponding to the BIOS option to be tested, so that each time the BIOS option to be tested is tested, the current option value of the BIOS option to be tested can be automatically modified according to one of the multiple modification values ​​corresponding to the BIOS option to be tested in the configuration file, that is, each modification process in the present embodiment is automatically implemented without manual intervention, which greatly improves the overall test efficiency. In addition, when the current option value of the BIOS option to be tested is modified according to one of the multiple modification values ​​of the BIOS option to be tested in the preset configuration file, the device to be tested where the BIOS option to be tested is located is automatically controlled to restart, which also avoids manual intervention and further improves the test efficiency of the BIOS option. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0037] Figure 1 A schematic diagram of an application scenario provided for this application;

[0038] Figure 2 A schematic diagram of a process flow of a pressure testing method provided in Example 1 of the present application;

[0039] Figure 3 A schematic diagram of the process of the pressure testing method provided in Example 2 of the present application;

[0040] Figure 4 A schematic diagram of the structure of the pressure testing device provided in Example 3 of the present application;

[0041] Figure 5 A schematic diagram of the structure of a pressure testing device provided in Example 4 of the present application;

[0042] Figure 6This is a schematic diagram of the structure of the pressure testing equipment provided in Example 5 of the present application.

[0043] The above drawings show clear embodiments of the present disclosure, which will be described in more detail below. These drawings and text descriptions are not intended to limit the scope of the present disclosure in any way, but to illustrate the concepts of the present disclosure to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0044] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0045] First, let’s explain the names involved in this case:

[0046] BIOS is a set of programs fixed on a ROM chip on the computer motherboard. It stores the most important basic input and output programs, system setting information, self-test programs after powering on, and system startup programs. Its main function is to provide the most basic and direct hardware settings and control for the computer.

[0047] In the prior art, when stress testing BIOS options, each test process needs to be manually performed. However, a large number of tests need to be performed for a BIOS option, so if each test needs to be performed manually, it will consume a lot of manpower and material resources, resulting in a cumbersome test process for the BIOS option and low test efficiency.

[0048] Based on this, the present application provides a stress test method, device, equipment and storage medium, by pre-setting a configuration file, the configuration file includes multiple modification values ​​corresponding to the BIOS option to be tested, so that during the stress test process, each time the BIOS option to be tested is tested, the current option value of the BIOS option to be tested can be automatically modified according to one of the multiple modification values ​​corresponding to the BIOS option to be tested in the configuration file, without manual intervention, reducing the tediousness of the test, and greatly improving the overall test efficiency. In addition, after the current option value of the BIOS option to be tested is automatically modified according to one of the multiple modification values ​​of the BIOS option to be tested in the preset configuration file, the device to be tested where the BIOS option to be tested is located is automatically controlled to restart, which also avoids manual intervention and further improves the test efficiency of the BIOS option.

[0049] There are many application scenarios for this application, for example, Figure 1 A schematic diagram of an application scenario provided by this application, that is, this application can be applied to Figure 1 on the server shown.

[0050] The pressure testing method, device, equipment and storage medium provided in this application are described in detail below.

[0051] Figure 2 A schematic diagram of a pressure test method according to the first embodiment of the present invention is shown in FIG. Figure 2 As shown, the method includes:

[0052] Step 201: modify the current option value of the BIOS option to be tested according to one of the multiple modification values ​​corresponding to the BIOS option to be tested in the preset configuration file.

[0053] In this embodiment, a configuration file is pre-set, and the configuration file includes multiple modification values ​​corresponding to the BIOS option to be tested, so that each time the BIOS option to be tested is tested, the current option value of the BIOS option to be tested can be automatically modified according to one of the multiple modification values ​​corresponding to the BIOS option to be tested in the configuration file, that is, each modification process in this embodiment is automatically implemented without manual participation, which greatly improves the overall test efficiency. The multiple in this embodiment refers to two or more.

[0054] When modifying the current option value of the BIOS option to be tested, one of the multiple modification values ​​of the BIOS option to be tested may be determined in sequence according to the order of the multiple modification values, or may be randomly selected. In one implementation, to ensure the validity of each test, a modification value selected from the multiple modification values ​​in this test may be inconsistent with the current option value of the BIOS option to be tested.

[0055] For example, the BIOS option to be tested is "voltage", the preset test number threshold of the BIOS option to be tested is 100 times, and the initial option value of the BIOS option to be tested is "1.1V". The preset configuration file may include 100 modification values ​​of the BIOS option to be tested. Assuming that these 100 modification values ​​are all in the range of 1.2V to 10V and are arranged in order from small to large, based on this, when the BIOS option to be tested is stress tested, in each test, the corresponding modification values ​​can be selected in order from small to large according to the arrangement order of the 100 modification values ​​to modify the option value of the BIOS option to be tested.

[0056] For another example, the BIOS option to be tested is "silent mode", the preset test number threshold of the BIOS option to be tested is 100 times, and the initial option value of the BIOS option to be tested is "on", then the preset configuration file may include two modification values ​​of the BIOS option to be tested, namely "off" and "on". Based on this, when the BIOS option to be tested is stress tested, in one implementation method, in each test, the selection can be cyclically performed in the order of "off" and then "on", that is, in the first test, the modification value "off" is selected to modify the current option value of the BIOS option to be tested, in the second test, "on" is selected in sequence to modify the current option value of the BIOS option to be tested, and in the third test, "off" is selected again to modify the current option value of the BIOS option to be tested, and so on, which will not be repeated here.

[0057] It is worth noting that, each time a test is performed, a modification value is selected from a plurality of modification values ​​corresponding to the BIOS option to be tested, and is not limited to the two examples given above.

[0058] Step 202: Control the device under test where the BIOS option under test is located to restart, and obtain the option value of the BIOS option under test after the device under test is restarted.

[0059] The device under test may specifically refer to a server, a computer and other devices, which are not limited here.

[0060] In this embodiment, during each test, when the current option value of the BIOS option to be tested is modified according to one of the multiple modification values ​​of the BIOS option to be tested in the preset configuration file, the device under test where the BIOS option to be tested is located is automatically controlled to restart without human intervention. Based on this, after the device under test is restarted, the current option value of the BIOS option to be tested is obtained again (that is, the option value of the BIOS option to be tested after the device under test is restarted), so as to subsequently determine the test result of this test according to the modification value of the BIOS option to be tested used in this test and the option value of the BIOS option to be tested after the device under test is restarted.

[0061] Step 203: According to the modification value used by the BIOS option to be tested in this test and the option value of the BIOS option to be tested after the device to be tested is restarted, the test result of the BIOS option to be tested in this test is obtained, and the number of completed tests is updated, and step 201 is executed until the number of completed tests reaches the preset test number threshold.

[0062] In this embodiment, after the option value of the BIOS option to be tested is modified using the modification value, after the device to be tested where the BIOS option to be tested is located is restarted, if the option value of the BIOS option to be tested after the device to be tested is restarted is consistent with the modification value used in this test, it means that the modification is successful, and the test result of the BIOS option to be tested in this test is passed; if the option value of the BIOS option to be tested after the device to be tested is inconsistent with the modification value used in this test, it means that the modification is unsuccessful, and the test result of the BIOS option to be tested in this test is failed.

[0063] For example, if the BIOS option to be tested is "voltage", the initial option value of the BIOS option to be tested is "1.1V". Assume that during the first test, one of the modification values ​​corresponding to the BIOS option to be tested in the configuration file used is "2V", that is, according to the modification value "2V", the current option value "1.1V" of the BIOS option to be tested is modified. If after the modification and restart of the device to be tested where the BIOS option to be tested is located, the current option value of the BIOS option to be tested is "2V", then the modification is successful, that is, the first test result is passed. If after the modification and restart of the device to be tested where the BIOS option to be tested is located, the current option value of the BIOS option to be tested is "1.1V" or other non-"2V" values, then the modification is unsuccessful, that is, the first test result is not passed.

[0064] In addition, the number of completed tests needs to be updated. If this test is the first test, the number of completed tests is updated to 1. If this test is the second test, the number of completed tests is updated to 2, and so on, until the number of completed tests reaches the preset test number threshold, and the BIOS option to be tested will no longer be tested.

[0065] In this embodiment, only one BIOS option to be tested is used as an example, and for other BIOS options to be tested, the above steps can be referred to to complete the test. However, in actual applications, different BIOS options to be tested may correspond to different preset test times thresholds, so for different BIOS options to be tested, stress tests can be performed based on the corresponding preset test times thresholds.

[0066] The present application provides a stress test method, by presetting a configuration file, the configuration file includes multiple modification values ​​corresponding to the BIOS option to be tested, so that each time the BIOS option to be tested is tested, the current option value of the BIOS option to be tested can be automatically modified according to one of the multiple modification values ​​corresponding to the BIOS option to be tested in the configuration file, that is, each modification process in the present embodiment is automatically implemented without manual intervention, which greatly improves the overall test efficiency. In addition, when the current option value of the BIOS option to be tested is modified according to one of the multiple modification values ​​of the BIOS option to be tested in the preset configuration file, the device to be tested where the BIOS option to be tested is located is automatically controlled to restart, which also avoids manual intervention and further improves the test efficiency of the BIOS option.

[0067] Figure 3 A schematic diagram of the process flow of the pressure testing method provided in the second embodiment of the present application is shown in FIG. Figure 3 As shown, the method includes:

[0068] Step 301: when the BIOS option to be tested is the first BIOS option to be tested, obtain the permission flag bit, when the permission flag bit is the first parameter, execute step 302, when the permission flag bit is the second parameter, execute step 306.

[0069] In this embodiment, in order to be able to modify the option value of the BIOS option to be tested, the relevant permissions should be granted in advance. Based on this, before the first test of the first BIOS option to be tested, the permission flag can be obtained first to determine whether the permission to modify each BIOS option to be tested is available. Among them, when the permission flag is the first parameter, since the first parameter is used to indicate the permission to modify the option value externally, the following step 302 can be directly executed, that is, the test process is performed; if the permission flag is the first parameter, since it is used to indicate that the permission to modify the option value externally is not granted, step 306 must be executed first at this time, so that step 302 can be executed after the permission to modify the option value of the BIOS option to be tested is obtained.

[0070] In one implementation, the first parameter and the second parameter may both be numerical values, for example, the first parameter is 0 and the second parameter is 1.

[0071] In this embodiment, the permission identification bit can be specifically obtained from the Uefi shell Variable permission.

[0072] Step 302: According to one of the modification values ​​corresponding to the BIOS option to be tested in the preset configuration file, the option value of the BIOS option to be tested is modified through the preset interface corresponding to the BIOS option to be tested.

[0073] In this embodiment, during each test, a modification value is selected from a plurality of modification values ​​corresponding to the BIOS option to be tested included in the preset configuration file. The relevant explanation in step 201 of the first embodiment may be referred to and will not be repeated here.

[0074] In addition, when you have the permission to modify the option value of the BIOS option to be tested, in order to complete the modification of the option value of the BIOS option to be tested, a preset interface can be set for each BIOS option to be tested, so that the option value of the BIOS option to be tested can be modified through the preset interface corresponding to the BIOS option to be tested.

[0075] Step 303: Control the device under test where the BIOS option under test is located to restart, and obtain the option value of the BIOS option under test after the device under test is restarted.

[0076] In this embodiment, the explanation of step 303 may refer to the explanation of step 202 in the first embodiment, and will not be repeated here.

[0077] Step 304: Based on the modified value of the BIOS option to be tested in this test and the option value of the BIOS option to be tested after the device to be tested is restarted, the test result of the BIOS option to be tested in this test is obtained, and the number of completed tests is updated, and step 302 is executed until the number of completed tests reaches the preset test number threshold.

[0078] In this embodiment, the explanation of step 304 may refer to the explanation of step 203 in the first embodiment, and will not be repeated here.

[0079] In this embodiment, step 302 to step 304 are repeatedly executed until the number of completed tests reaches a preset test number threshold.

[0080] In addition, when multiple BIOS options need to be tested, two or more BIOS options can be tested simultaneously with reference to the above steps 302 to 304 to improve the test efficiency. Moreover, in order to facilitate the user to understand the test progress, the BIOS options that have been tested can be counted so that the user knows how many BIOS options have been tested. Moreover, it can also avoid the occurrence of false detection and missed detection.

[0081] Step 305: When the number of completed tests reaches a preset test number threshold, determine the total test result of the BIOS option to be tested according to the test result obtained in each test of the BIOS option to be tested.

[0082] In this embodiment, for the BIOS option to be tested, when the number of completed tests reaches the preset test number threshold, the total test result of the BIOS option to be tested can be determined based on the test results obtained each time. In one implementation, the total test result of the BIOS option to be tested can be determined based on the proportion of the test results indicating that the test passed in all the test results and the preset ratio threshold. Exemplarily, the BIOS option to be tested is "voltage", the preset test number threshold is 100 times, and the preset ratio threshold is 80%. Assuming that 89 of the 100 test results obtained are all test passed, the proportion of the test results indicating that the test passed in all the test results is 89%. Since 89% is greater than the preset ratio threshold of 80%, the total test result of the BIOS option to be tested is test passed.

[0083] It is worth noting that the above is only an example of determining the total test result of the BIOS option to be tested, and this case is not limited to this.

[0084] Step 306: Generate and display reminder information, so that the user can modify the permission flag from the second parameter to the first parameter according to the reminder information.

[0085] In this embodiment, when the permission flag is the second parameter, the user does not have the permission to modify the option value of the BIOS option to be tested, so a reminder message can be generated and displayed so that the user can modify the permission flag. In one implementation, a BIOS file is flashed into the device to be tested, and the BIOS file includes various BIOS options to be tested. The BIOS file has a permission flag, so that the user can modify the permission flag of the initial BIOS file stored locally according to the reminder message, and re-enter the modified BIOS file into the device to be tested to replace the BIOS file previously flashed into the device to be tested. Based on this, when the permission flag obtained later is the first parameter, step 302 is executed to test the BIOS option to be tested. Among them, the user can specifically refer to the R&D personnel who develop the BIOS option. In this embodiment, before the first test is performed on the first BIOS option to be tested, the permission flag is obtained to determine whether the permission to modify the BIOS option to be tested is available, and the test process is performed when the permission flag is the first parameter; and when the permission flag is the second parameter, a reminder message is generated and displayed in time so that the user can make modifications in time, thereby further improving the test efficiency of the BIOS option. Moreover. This embodiment also makes it compatible with BIOS options developed by different code manufacturers. In addition, the method of statistically analyzing the test results based on this embodiment also facilitates faster problem location.

[0086] Figure 4 This is a schematic diagram of the structure of the pressure testing device provided in Example 3 of the present application, such as Figure 4 As shown, the device includes: a modification unit 401, a control unit 402 and a processing unit 403, wherein:

[0087] The modifying unit 401 is used to modify the current option value of the BIOS option to be tested according to one of the multiple modification values ​​corresponding to the BIOS option to be tested in the preset configuration file.

[0088] The control unit 402 is used to control the device under test where the BIOS option is located to restart, and obtain the option value of the BIOS option under test after the device under test is restarted.

[0089] The processing unit 403 is used to obtain the test result of the BIOS option to be tested in this test according to the modification value used by the BIOS option to be tested in this test and the option value of the BIOS option to be tested after the device to be tested is restarted, and to update the number of completed tests, and trigger the execution modification unit 401 until the number of completed tests reaches a preset test number threshold.

[0090] The pressure testing device provided in this embodiment is the same as the technical solution in implementing the pressure testing method provided in any of the aforementioned embodiments, and its implementation principle and technical effects are similar, which will not be described in detail.

[0091] Figure 5 This is a schematic diagram of the structure of the pressure testing device provided in the fourth embodiment of the present application, based on the third embodiment, as shown in FIG. Figure 5 As shown,

[0092] Further, the modifying unit 401 is specifically configured to modify the option value of the BIOS option to be tested according to one of the multiple modification values ​​corresponding to the BIOS option to be tested in the preset configuration file through a preset interface corresponding to the BIOS option to be tested.

[0093] Furthermore, the device also includes an acquisition unit 501.

[0094] The acquisition unit 501 is used to obtain a permission flag when the BIOS option to be tested is the first BIOS option to be tested and before the modification unit 401 modifies the current option value of the BIOS option to be tested for the first time according to one of the multiple modification values ​​corresponding to the basic input and output system BIOS option to be tested in the preset configuration file, and when the permission flag is a first parameter, trigger the modification unit to modify the current option value of the BIOS option to be tested according to one of the multiple modification values ​​corresponding to the basic input and output system BIOS option to be tested in the preset configuration file, wherein the first parameter is used to indicate the permission granted to externally modify the option value.

[0095] Furthermore, the device also includes a reminder unit 502.

[0096] The acquisition unit 501 is used to trigger the reminder unit 502 when the permission flag is the second parameter;

[0097] The reminder unit 502 is used to generate and display reminder information, so that the user can modify the permission flag from the second parameter to the first parameter according to the reminder information, wherein the second parameter is used to indicate that the permission to modify the option value externally is not granted.

[0098] Furthermore, the processing unit 403 is further configured to determine a total test result of the BIOS option to be tested according to the test result obtained in each test of the BIOS option to be tested when the number of completed tests reaches a preset test number threshold.

[0099] The pressure testing device provided in this embodiment is the same as the technical solution in implementing the pressure testing method provided in any of the aforementioned embodiments, and its implementation principle and technical effects are similar, which will not be described in detail.

[0100] Figure 6 A schematic diagram of the structure of the pressure testing equipment provided in the fourth embodiment of the present application is shown in FIG. Figure 6 As shown, a memory 601 and a processor 602; wherein the memory 601 is used to store computer programs.

[0101] The processor 602 executes the computer program in the memory 601 to implement the technical solution of the stress testing method of any implementation method provided in the aforementioned embodiments.

[0102] The present application provides a computer-readable storage medium, in which computer-executable instructions are stored. When the computer-executable instructions are executed by a processor, the technical solution of the stress testing method of any implementation method provided in the aforementioned embodiments is implemented.

[0103] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. This application is intended to cover any variations, uses or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The specification and examples are intended to be exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0104] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A stress testing method, characterized in that: The method comprises: Repeat all of the following steps until the number of completed tests reaches the preset test count threshold: Select a modification value from a plurality of modification values ​​recorded in a preset configuration file and corresponding to a basic input / output system BIOS option to be tested and arranged in numerical order, and modify the current option value of the BIOS option to be tested through a preset interface corresponding to the BIOS option to be tested; wherein different BIOS options to be tested correspond to different preset interfaces; wherein the selected modification value is different from the current option value of the BIOS option to be tested, and in each test, the modification value is selected in sequence according to the order of the plurality of modification values; Controlling the device under test where the BIOS option under test is located to restart, and obtaining the option value of the BIOS option under test after the device under test is restarted; According to the modified value used by the BIOS option to be tested in this test and the option value of the BIOS option to be tested after the device to be tested is restarted, the test result of the BIOS option to be tested in this test is obtained, and the number of completed tests is updated; Wherein, when there are multiple BIOS options to be tested, concurrent testing is performed on the multiple BIOS options to be tested; Wherein, when the BIOS option to be tested is the first BIOS option to be tested, and before selecting a modification value for the first time from a plurality of modification values ​​corresponding to the basic input and output system BIOS option to be tested and recorded in a preset configuration file and arranged in order of numerical value, the method further comprises: Get permission flag; When the permission flag is the second parameter, a reminder message is generated and displayed, so that the user can modify the permission flag of the locally stored initial BIOS file from the second parameter to the first parameter according to the reminder message, and re-flash the modified BIOS file into the device under test to replace the BIOS file already flashed into the device under test; wherein the second parameter is used to indicate that the permission to modify the option value is not granted to the outside, and the first parameter is used to indicate that the permission to modify the option value is granted to the outside; The method further includes: when there are multiple BIOS options to be tested, counting the BIOS options that have completed the test.

2. The method according to claim 1, characterized in that The method further comprises: When the permission flag is the first parameter, the step of selecting a modification value from a plurality of modification values ​​corresponding to the basic input and output system BIOS option to be tested and arranged in order of numerical value recorded in a preset configuration file is executed, and the current option value of the BIOS option to be tested is modified through a preset interface corresponding to the BIOS option to be tested.

3. The method according to claim 1 or 2, characterized in that: When the number of completed tests reaches a preset test number threshold, the method further includes: According to the test result obtained in each test of the BIOS option to be tested, the total test result of the BIOS option to be tested is determined.

4. A pressure testing device, characterized in that: The device comprises: an acquisition unit, a modification unit, a control unit and a processing unit, wherein: The modification unit is used to select a modification value from a plurality of modification values ​​recorded in a preset configuration file and corresponding to the basic input and output system BIOS option to be tested and arranged in numerical order, and to modify the current option value of the BIOS option to be tested through a preset interface corresponding to the BIOS option to be tested; wherein different BIOS options to be tested correspond to different preset interfaces; wherein the selected modification value is different from the current option value of the BIOS option to be tested, and in each test, the modification value is selected in sequence according to the order of the plurality of modification values; The control unit is used to control the device under test where the BIOS option under test is located to restart, and obtain the option value of the BIOS option under test after the device under test is restarted; The processing unit is used to obtain the test result of the BIOS option to be tested in this test according to the modification value used by the BIOS option to be tested in this test and the option value of the BIOS option to be tested after the device to be tested is restarted, and to update the number of completed tests, and trigger the execution of the modification unit until the number of completed tests reaches a preset test number threshold; Wherein, when there are multiple BIOS options to be tested, concurrent testing is performed on the multiple BIOS options to be tested; The acquisition unit is used to acquire the permission flag when the BIOS option to be tested is the first BIOS option to be tested and before the modification unit first executes to select a modification value from a plurality of modification values ​​corresponding to the basic input and output system BIOS option to be tested and arranged in numerical order recorded in a preset configuration file; when the permission flag is a second parameter, generate and display reminder information so that the user can modify the permission flag of the locally stored initial BIOS file from the second parameter to the first parameter according to the reminder information, and re-flash the modified BIOS file into the device to be tested to replace the BIOS file already flashed into the device to be tested; wherein the second parameter is used to indicate that the permission to modify the option value is not granted to the outside, and the first parameter is used to indicate that the permission to modify the option value is granted to the outside; The processing unit is further configured to count the BIOS options that have completed the test when there are multiple BIOS options to be tested.

5. The device according to claim 4, characterized in that The acquisition unit is also used to trigger the modification unit to execute a step of selecting a modification value from multiple modification values ​​recorded in a preset configuration file and corresponding to the basic input and output system BIOS option to be tested and arranged in order of numerical value when the permission flag is the first parameter.

6. A pressure testing device, characterized in that: include: Memory and processor; The memory is used to store computer programs; The processor executes the computer program in the memory to implement the method according to any one of claims 1 to 3.

7. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions, which are used to implement the method according to any one of claims 1 to 3 when executed by a processor.

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